terra spacecraft - nasa · jorquera, c., c.j. bruegge, v.g. duval (1992). evaluation of high...

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Multi-angle Imaging SpectroRadiometer (MISR) Calibration and Test Program Carol J. Bruegge Jet Propulsion Laboratory California Institute of Technology A presentation to the National Science Foundation November 4, 1998 Terra Spacecraft EOS MISR

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Page 1: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

eter (MISR)am

ndation

Multi-angle Imaging SpectroRadiomCalibration and Test Progr

Carol J. BrueggeJet Propulsion Laboratory

California Institute of Technology

A presentation to the National Science FouNovember 4, 1998

Terra SpacecraftEOS MISR

Page 2: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

l Investigator

d testpolarization, BRF

l data analysisl facility designting

chamberies

software

ACKNOWLEDGMENTS

David Diner MISR/ AirMISR PrincipaTerry Reilly Project ManagerValerie Duval Calibration EngineerCarlos Jorquera Photodiode assembly anNadine Chrien Radiometric model,

analysisBarbara Gaitley Radiometric and spectraGhobie Saghri Radiometric and spectraDaniel Preston Filters/ flight camera tesTeré Smith Integration and testEric Hochberg Optical CharacterizationRobert Korechoff MTF, focus, special studDavid Haner Spectralon BRF testingBrian Chafin In-flight data processing

Page 3: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

ctral Polarizationdata fidelity

t video

OUTLINE

The MISR/ AirMISR instrumentsDetector-based calibration

Manufacture of the laboratory and flight standardsTraceability to Système International UnitsNIST verification (EOS round-robin experiment)

Test program"Optical Characterization Chamber": MTF, PSF, focus"Radiometric Characterization Chamber": Radiometric, SpeInstrument level tests: image verification, camera pointing,

Special studiesOut-of-band spectral response, focal-plane scattering, offse

In-flight calibrationOn-board calibrator, vicarious calibrationReconciling multiple calibrations

Data productsThe Ancillary Radiometric Product

Page 4: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

T.P. Ackerman, R. Davies, S.A.W. Gerstl,). Multiangle Imaging SpectroRadiometer6, 1072-1087.

ia, M.A. Hernandez, C.G. Kurzweil, W.C.lti-angle SpectroRadiometer (AirMISR): 1339-1349.H.R. Gordon (1998). Techniques for thens. Geosci. Rem. Sens., Vol. 36, pp. 1212-

erg (1998). MISR prelaunch instrument. 1186-1198.mos. and Oceanic Tech., Vol.13 (2), 286-

Multi-angle Imaging SpectroRadiometer

ncertainties for the Multi-angle Imagingbserving System Platforms, Proc. SPIE

PUBLICATIONS LIST(SELECT PAPERS)

Complete publication list is available via the Internethttp://www-misr.jpl.nasa.gov ==> Publications

IEEE’98 EOS Special issueBruegge, et. al. See Calibration Overview.Diner, D.J., J.C. Beckert, T.H. Reilly, C.J. Bruegge, J.E. Conel, R. Kahn, J.V. Martonchik,

H.R. Gordon, J-P. Muller, R. Myneni, R.J. Sellers, B. Pinty, and M.M. Verstraete (1998(MISR) description and experiment overview. IEEE Trans. Geosci. Rem. Sens., Vol. 3

D.J. Diner, L.M. Barge, C.J. Bruegge, T.G. Chrien, J.E. Conel, M.L. Eastwood, J.D. GarcLedeboer, N.D. Pignatano, C.M. Sarture, and B.G. Smith (1998). The Airborne Muinstrument description and first results. IEEE Trans. Geosci. Rem. Sens., Vol. 36, pp.

Martonchik, J.V., D.J. Diner, R. Kahn, T.P. Ackerman, M.M. Verstraete, B. Pinty, andretrieval of aerosol properties over land and ocean using multi-angle imaging. IEEE Tra1227.

Calibration overviewBruegge, C.J., V.G. Duval, N.L. Chrien, R.P. Korechoff, B.J. Gaitley, and E.B. Hochb

calibration and characterization results. IEEE Trans. Geosci. Rem. Sens., Vol. 36, ppBruegge, C.J., D.J. Diner, and V.G. Duval (1996). The MISR calibration program. J. of At

299.Bruegge, C.J., V.G. Duval, N.L. Chrien, and D.J. Diner (1993). Calibration Plans for the

(MISR). Metrologia,30 (4), 213-221.Chrien, N.C.L., C.J. Bruegge, and B.R. Barkstrom (1993). Estimation of calibration u

SpectroRadiometer (MISR) via fidelity intervals. InSensor Systems for the Early Earth O1939, April, 114-125.

Page 5: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

con photodiodes for calibration in the 4004.ter standards for NASA’s Earth Observing

otodiode standards for use in the MISR in-

ak, and M. Pavlov, "Initial results of thenference issue: New Developments and

s a diffuse reflectance standard for in-flight

amination analysis of Spectralon diffuse

, and M. Pavlov (1998). Intercomparison ofnsmissive materials, San Diego, 20-21 July.on’s bidirectional reflectance for in-flightn, and Processing of Remotely Sensed

Uncertainty Tabulations for the Retrievalin Optical Radiometry (NEWRAD ’97),

PUBLICATIONS, CONT.

PhotodiodesJorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency sili

nm to 900 nm spectral region. In Infrared Technology XVIII. Proc. SPIE 1762, 135-14Jorquera, C.R., V.G. Ford, V.G. Duval, and C.J. Bruegge (1995). State of the art radiome

System. Aerospace Applications Conference, 5-10Feb, Snowmass, CO.Jorquera, C.R., R. Korde, V.G. Ford, V.G. Duval, C.J. Bruegge (1994). Design of new ph

flight calibrator. IGARSS ’94, 8-12Aug, Pasadena, Ca.

Diffuse panel studiesT. R. O'Brian, E. A. Early, B. C. Johnson, J. J. Butler, C. J. Bruegge, S. Biggar, P. Spy

bidirectional reflectance characterization round-robin in support of EOS AM-1," CoApplications in Optical Radiometry (NEWRAD ’97), Metrologia, in preparation.

Bruegge, C.J., A.E. Stiegman, R.A. Rainen, A.W. Springsteen (1993). Use of Spectralon acalibration of earth-orbiting sensors. Opt. Eng.32(4), 805-814.

Stiegman,A.E., C.J. Bruegge, A.W. Springsteen (1993). Ultraviolet stability and contreflectance material. Opt. Eng.32(4), 799-804.

Barnes, P.Y., E.A. Early, B. Johnson, J.J. Butler, C.J. Bruegge, S.F. Biggar, P.R. Spyakreflectance measurements. In SPIE 3425, Optical Diagnostic methods for inorganic tra

Flasse, S.P., M.M. Verstraete, B. Pinty, and C.J. Bruegge (1993). Modeling Spectralcalibration of Earth-orbiting sensors. In Recent Advances inSensors, Radiometric CalibratioData, Proc. SPIE1938, April, 100-108.

In-flight calibrationC.J. Bruegge, N. L. Chrien, R. A. Kahn, J. V. Martonchik, David Diner (1998). Radiometric

of MISR Aerosol Products. Conference issue: New Developments and ApplicationsMetrologia..

Page 6: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISRulti-angle Imaging SpectroRadiometer. In

g SpectroRadiometer (MISR)," inEarth

ance testing of the Multi-angle Imagingly, 23-26 September 1996.elopment and test status. InAdvanced andptember.ntical Spectroscopic Techniques andust.f MISR lenses and cameras. InOpticalPIE, VOL. 2830 Denver, CO, 5-9

eration Satellites. Spectroradiometer focal-TO/ SPIE Vol. 2538, pp. 104-116, 25-28

calibration of the MISR linear detectors.

the Earth Observing System Multi-angle Nebraska, 27-31 May.

PUBLICATIONS, CONT.

Chrien, N.L. and C.J. Bruegge (1996). Out-of-band spectral correction algorithm for the MEarth Observing System. Proc. SPIE2820, Denver, Co, 5-9 August.

Testing reportsC.J. Bruegge and D.J. Diner, "Instrument verification tests on the Multi-angle Imagin

Observing Systems II, SPIE3117, San Diego, CA, 28-29 July 1997.Bruegge, C.J., N.L. Chrien, B.J. Gaitley, and R.P. Korechoff (1996). Preflight perform

SpectroRadiometer cameras. In Satellite Remote Sensing III, Proc. SPIE2957, Taormina, ItaBruegge, C.J., V.G. Duval, N.L. Chrien, and R. P. Korechoff (1995). MISR instrument dev

Next-Generation Satellites. Proc. EUROPTO/ SPIE2538, 92-103, Paris, France, 25-28 SeHochberg, E.B., and N.C. L. Chrien (1996). Lloyds mirror for MTF testing of MISR CCD. IOp

Instrumentation for Atmospheric SpaceResearch II. Proc. SPIE2830, Denver, CO, 5-9 AugHochberg, E.B., M.L. White, R.P. Korechoff, C.A. Sepulveda (1996). Optical testing o

Spectroscopic Techniques and Instrumentation for Atmospheric SpaceResearchII. Proc. SAugust.

Korechoff, R.P, D.J. Diner, D.J. Preston, C.J. Bruegge (1995). In Advanced and Next-Genplane design considerations: lessons learned from MISR camera testing. EUROPSeptember.

Korechoff, R., D. Kirby, E. Hochberg, C. Sepulveda, and V. Jovanovic (1996). DistortionIn Earth Observing System. Proc. SPIE2820, Denver, Co, 5-9 August.

IFRCC/ Level 1B1Bruegge, C.J., R.M. Woodhouse, D.J. Diner (1996). In-flight radiometric calibration plans for

Imaging SpectroRadiometer. IEEE/IGARSS, Paper No. 96.1028, Lincoln,

Page 7: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

may cause a delay MOPITT

MISR OVERVIEW

Platform: Terra (EOS-AM1)Launch: No earlier than August 27, 1999

- recent TITAN IV/CENTAUR and DELTA III launch failures Other EOS-AM1 instruments: MODIS, CERES, ASTER, and

MISR capabilities: Multi-angle global view of earth- 9 cameras pointing nadir to ±70°- 4 spectral bands 446, 558, 672, and 866 nm- global coverage every 9 days- on-board pixel averaging (275 m - 1.1 km)- average data rate 3.3 Mb/sec

AEROSOLS SURFACE

CLOUDS

MISR

Page 8: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

EARTH-VIEW GEOMETRY
Page 9: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

198819933, 1993ry 10, 1994er 6, 1994 27-28, 1995

t 1994-August 1995t 1995-August 1996r 1996

1997

98

DEVELOPMENT TIMELINE

• Proposal submitted July 15,• Preliminary design review (PDR) May 25,

- Calibration peer review May 2- Preflight calibration plans Janua

• Critical design review (CDR) Decemb- Calibration peer review II March

• Calibrate cameras- Engineering model Augus- Calibrate flight cameras (10) Augus

• Instrument thermal vacuum testing Decembe• MISR arrives at spacecraft integrator May 26, • Develop in-flight calibration processing 1998

capability• Original launch date June 19

Page 10: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

s submitted toNov 1995

MISR productsonalibrated multi-angle

s (room reserved ineras)

mbaled to nine view-

esign, shortest focal

0 - 40 nm)response measuredres

AIRMISRINSTRUMENT HERITAGE

• Original proposal “Low-cost Airborne MISR Simulator” wathe EOS Project Scientist (Dr. Michael King, GSFC) on 10

• Objectives for AirMISR- collect MISR-like data sets in support of the validation of - underfly EOS-AM1 MISR to verify its radiometric calibrati- enable scientific research utilizing high quality, well-c

imaging data- enable the exploration of measurement enhancement

instrument reserved as technology testbed for future cam• MISR inheritance

- implementation features a single pushbroom camera, giangle positions during a 15 minute data acquisition run

- camera comprised of a MISR brassboard lens (“A” lens dlength), and MISR engineering model focal plane

- spectral bands at 446, 558, 672, and 866 nm (widths of 2- spectral, radiometric, and point-spread-function (PSF)

using MISR-developed laboratories and analysis procedu

Page 11: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

Da-70.5

DATA ACQUISITION

Df/ Da

Cf/ Ca

9.0

km

11.4 km

34.2 km

Bf/ Ba

Af/ AaAn

Ca-60.0

Ba-45.6

Aa-26.1

An0.0

Df

Cf

Bf Af

26.5

km

Page 12: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISRN

40)

e

ngixels

PERFORMANCE COMPARISO

Parameter MISR AirMISR

Absoluteuncertainty

3% (1σ) 3% (1σ)

Number ofdetectorelements

9 camera x 4bands x 1504pixels (~53,000)

4 bands x 150pixels (~600

Worst detectorelements

10% < responseloss < 1%

40%< responsloss

Number ofdetectoranomalies

~12 ~20 in blue~ 20 in green

SNR > 900 same, excludianomalour p

Spectral out-of-band

<2% 4% in Band 3

Page 13: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

Preflight:

In-flight:

laboratory standardsprovide measure ofintegrating sphere output

flight standardsprovide measure ofdiffuser-reflectedsunlight

tandards establishto ±3% (1σ; ρeq=1.0)

t reflects bestment responsivity

DAAC

Level 1B productproduction using

recent ARP

Level 2science products

s

CALIBRATION PLAN

• Detector-based sradiometric scale uncertainty

Mission duration

Det

ecto

r re

spon

se

+++++

◊◊++

++ +++ + + +

++ +

+

◊ Overflight campaigns(semi-annual)

+ On-Board Calibrator(monthly)

• Multiple methodologies reducesystematic errors

• System design:- temporal stability achieved through

radiation resistant components,contamination control, and flightUV blockers , lens shades, and cover

- polarization insensitivity achievedthrough optical design

- stray-light control within camerascalibrator subsystems

• Radiance producestimate of instru

MISR teamgeneration ofradiometriccoefficients

SCF

Monthly updateto ARP

Page 14: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISRIC

0%ge detection

t signal ρeq=100%

signal ρeq=100%between calibrations

cy (HQE) and

MISR REQUIRES RADIOMETRCALIBRATION AND STABILITY

SCIENCE REQUIREMENTS (68% CONFIDENCE)

• Absolute radiometric uncertainty: ±3% at signal ρeq=10- Required for accurate albedo and aerosol retrievals, chan

• Relative angle-to-angle radiometric uncertainty: ±1% a- Required for accurate determination of angular signatures

• Stability (maximum change): 0.5%/ 1 month; 2%/ 1 year at- Required to maintain radiometric accuracy during intervals

RAMIFICATIONS FOR INSTRUMENT

• High accuracy on-board calibrator

• Detector-based calibration using high quantum efficienradiation resistant (PIN architecture) diodes

• High stability detectors, filters, and lenses

• Polarization insensitivity

• High signal-to-noise ratio

Page 15: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

h out-of-band

logy) to avoid

er absorption

ument

MISR REQUIRES SPECTRALUNIFORMITY AND STABILITY

RAMIFICATIONS FOR INSTRUMENT

• Interference filter and blocker designs to provide higrejection

• High stability filter coatings (Ion Assisted Deposition technoneed for on-board spectral calibrator

• Gaussian band profiles to provide polarization insensitivity

REQUIREMENT RATIONALE

Accuracy - Optimizes science- Avoids solar Fraunhofer lines and atmospheric wat- Provides synergism with other instruments

Knowledge - Necessary to avoid radiometric error

Uniformity - Minimizes complexity of science algorithms- Achieves consistent retrieval across the scene

Stability - Eliminates need for on-board calibration within instr- Achieves consistent retrieval with time

Page 16: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISRN

very lax calibration

ation requirements

etectors

bility (protected from

y techniques (1 µm

tindependent devices

DETECTOR-BASED CALIBRATIO

• MISR has stringent calibration requirements- Remote sensing systems flown prior to 1990 had

requirements- Landsat program did not provide radiance data products- SPOT requires absolute calibration to only 10%- Conversely, MISR has very stringent (3%) absolute calibr- Detector-based calibration elected to meet this challenge- Literature reports accuracies of 0.5%, using filtered trap d

• Building flight detectors no easy task- assembly hermetically sealed to allow focal plane sta

humidity, contaminants, filter shifts)- light-trap manufactured from using ceramic subcarriers- precision apertures manufactured using photolithograph

tolerance)- radiation testing required, simulating on-orbit environmen- radiometric response verified by consistency checks with

(laboratory standards and wedge standards)

Page 17: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

An

Ca

Cf

AaBa

Af

Bf

HQE1-4

N-PIN

Da-PIN

Df-PIN

G-PIN

ON-BOARD CALIBRATOR

Da

Df

An

Aa

Ba

Ca

Af

Bf

Cf

Df

67.5°

Stoweddiffuse panel

Deployeddiffuse panel

Da

Page 18: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

E

Es)

camera view anglesdation permissable)

)

lysis considering the

IN-FLIGHT RADIOMETRICCALIBRATION

On-Board Calibrator (OBC)

• High quantum efficiency (HQE) diodes- Detector-based radiometric standard for the instrument- Configured in light-trap arrangement to give near 100% Q

• Radiation resistant PIN diodes- Secondary detector standard (longer lifetime than the HQ

• Deployable Spectralon diffuse panels- Relative BRF needed to transfer diode measurements into- Absolute reflectance knowledge unnecessary (slow degra

• Mechanized goniometer diode (G-PIN)- Verifies BRF stability of diffuse panels

Radiometric calibration- Acquire monthly OBC data (6 minute interval at each pole- Conduct semi-annual overflight field campaigns- Calibration coefficients computed from a time trend ana

preflight, OBC, and overflight measurements

Page 19: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

luminum tray between

owth without distortion

y will be customized if

n to be wiped with 200

in dry nitrogen purgedmples. Spectralon will

48 hours.

SPECTRALON DESIGN

Panel design- Panel difficult to frame, as Spectralon grows 0.29” beyond a

survival temperatures -65 to 80°C.- Panel design has feet protruding into frame to allow thermal gr

and survive launch loads without yielding (yields at 200 psi).- Spectralon can only be machined to a tolerance of 0.005”. Tra

necessary upon Spectralon delivery.Handling specifications

- During manufacture all surfaces to contact resin or Spectraloproof reagent grade Ethyl Alcohol.

- During transport within Labsphere or to JPL material storedaluminum transportation container with 9 integral witness sabe housed in EM or PF container for BRDF testing.

- Following machining material baked out at 10-6 torr, 90°C for

2.8”

0.28”

20.55”

Page 20: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

ose

n versus discharge damage (done)

edures (done)tries

)ned)

articulate contamination

SPECTRALONFLIGHT QUALIFICATION

Test Purp

Charge arcing evaluation Frame/ housing configuratio

Process verification tests Cleaning and handling procBRDF study at in-orbit geomePolarizationSolar absorptance/ emittance

Environmental exposure testsBRDF data will be acquired before and after to

evaluate stability

UV/ vacuum (repeat)HumidityThermal vacuum cyclingCharged particle, proton (doneAtomic oxygen (analyses plan

Mechanical and physical property testing Tension strengthCompression strengthModulusDeformation under loadFlexural

Vibration testing Launch vibration loads with pevaluation

Page 21: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISRSPECTRALON

HEMISPHERIC BRF

Page 22: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

Earth(day side)

e)

nator

lightirection

IN-FLIGHT CALIBRATION:MISSION PLAN

North pole deploy

Night calibration

Sunrise (on panel)

Goniometer

Clear atmosphere

Panel stow

(1.0 min)

(1 min)

(1.3 min)

(2 min)

(3.3 min)

(0.25 min)

Earth(night sid

Termi

Fd

• North Pole: panel deployed for aftand nadir camera calibration

• One minute of night calibration• Varying irradiance at sunrise• Clear atmosphere interval is

uncontaminated by Earthatmos (200 km solar tangent)

• Window end whenDf data collectionbegins

Page 23: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

on

EOS CALIBRATION PANEL

• Membership- EOS project office lead- NIST representatives (Carol Johnson, Joe Rice)- Calibration scientist for each of 5 instrument teams- Calibration specialists:

Vicarious calibration, Phil Slater, Univ. of ArizonaLunar studies, Hugh Kieffer, US Geological Survey

• Workshops (1 or 2 times a year)• Peer reviews (2 reviews per instrument)• Round-robin experiments

- Radiometric (integrating sphere output verification)- Diffuse panel bi-directional reflectance function comparis

Page 24: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

tion must be NIST

to standards held at

e International (SI)urrent, voltage, and

ll understood in the

n to NIST-traceablerobin experiments

TRACEABILITY

- EOS contractual agreement reads that MISR calibratraceable

- In-house design does not come with a pedigree traceableNIST

- MISR detector standards are traceable to the Systèmradiance scale via traceable protocols of measuring cdistances

- The internal quantum efficiency of these devices is weliterature

- Verifications of our scale were provided by comparisolamps, and participation in EOS/ NIST sponsored round-

Page 25: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

ting sphere output.lute requirement.l

ral instruments.MISRds.

line

AUGUST 1994ROUND ROBIN

• Various transfer radiometers compared MISR integraResults give confidence in ability to achieve 3%(1σ) abso

• Additionally, filter transmittance was measured by seveCary establishes radiometric scale of Laboratory Standar

Wavelength (nm)

Radiometer 550 650 666

MISR 0.4%

UofA -1.% -0.8%

NRLM 0.9%

Wavelength (nm)

Filter λc, 500 687 748

MISR Cary baseline baseline base

JPL Beckman +1.3% -0.1% -1.7%

UofA Optronics +5.0% +11.0%

GSFC Perkins andElmer

+1.2%

Page 26: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

AUGUST 1996ROUND ROBIN
Page 27: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISRNTSM

NIST VS JPL BRDF MEASUREMESPECTRALON SAMPLE, 632.8 N

Page 28: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

Thermal vacuumcalibration

Systemverification &shipping tests

Calibrationverification

eat for 9 cameras

peat for EM, protoflight

PREFLIGHT CALIBRATIONTEST FLOW

Subsystem verifications

Optics

Cameraelectronics

Mechanisms

Analogelectronics

Structures

Command &Data

Cameraassembly

Cameraverifications

Assembly levelverifications

Calibrate plate/

Diode/ goniometerassembly

mechanismsassembly

Nine camera/optics bench

assembly

Flight

RadiometricmodelComponent

parameters

qualificationtesting

Rep

Re

Page 29: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

YUIOPL

BNM,.

cterization Chambere, monochromator spectral calibration,cation

HIGH BAY FACILITY

QWERTYUIOPASDFGHJKL

ZXCVBNM,.QWERT

ASDFGHJK

ZXCV

50x100 ft layoutx 30 ft heightClass 10,000 cleanroom

Optical Characterization ChamberFeatures: Pinhole target, camera gimbalTests: EFT. MTF, PSF, Distortion, saturation

Radiometric CharaFeatures: 1.65 m spherTests: Radiometric and

polarization verifi

Ground Support Equiment room

Page 30: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

Vacuumchamber

Camera

GSE &sphere controller

RADIOMETRIC CALIBRATIONFACILITY

Powersupplies

• 65” Sphere• 30 x 9” Exit port

QWERTYUIOPASDFGHJKL

ZXCVBNM,.

• 12” externalsphere withvariable aperture

• 4’ working distance

Page 31: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

ident radiance

are linear, except at

atic

iances and quadratic, upon completion of

, averaged over bothW m-2 sr-1 µm-1]:

amera output digitalients; DNo is the DNaverage over the first

MISR CALIBRATION EQUATION

• MISR will be calibrated in-flight by a regression of incagainst output DN.- Preflight data analysis has shown that the cameras

extremely low inputs (scene reflectance < 5%).- The use of a linear or non-linear equation, e.g. the quadr

has been investigated. This equation is linear at high radat small radiances. This latter equation will be baselinedthe current study.

- Lλ is the sensor band-averaged spectral incident radiancein-and-out-of-band wavelengths and reported in units of [

- R is the relative pixel spectral response; DN is the cnumber; G0, G1, and G2 are the pixel response coefficoffset, unique for each line of data, as determined by aneight "overclock" pixel elements.

DN DNo– Go G1L λ G2L λ2

+ +=

L λLsource∫ ℜλ λd

ℜλ λd∫-----------------------------------=

Page 32: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR:

RADIOMETRIC CALIBRATION

CAMERA OUTPUT DN

Page 33: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

MEASURED CAMERA SNR
Page 34: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

MEASURED CAMERASATURATION LEVELS
Page 35: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

ONSE PROFILE:

resolution, 0.5 nmositionm resolution, 5 nmositionsludes focal-plane100 nm, and Codeo 400 nm.

0 to 900 nm

NG:f an integratingromator exit slit.y of illumination from several nm to

nm.

SPECTRAL CALIBRATION

Monochromator

Order SortingFilters

Optical Rail

Thermal-VacuumChamber

Baffle

Dark Tent

TOP VIEW

Chamber window

Xenon

Grating

CameraSupport

Electronics

Camera

COMPOSITE RESP

Integratingsphere

• In-band at 2.6 nm sampling, 7 field p

• Out-band at 19.5 nsampling, 3 field p

• Spectral model insmeasurements to 1V lens model 365 t

• Measured data 40

IMPROVED TESTI• Obtained by use o

sphere at monochSpectral uniformitimproved reducedseveral tenths of

Page 36: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

to cover 10 -4

365 nm to 1100

00 nm)ntegration time (while

measurements

SPECTRAL RESPONSEFUNCTION DETERMINATION

• Separate in- and out-band measurements allowed ussensitivity range

• In-band spectral response measurements:- 400 to 900 nm wavelength range- 2.6 nm spectral resolution- 0.5 nm sampling

• Out-band spectral response measurements:- 400 to 900 nm wavelength range- 19.6 nm spectral resolution- 10 nm sampling

• Radiometric model utliized to extend response region fromnm.- lens model using CODE V at 5 field positions.- focal plane measurements of quantum efficiency (350-11- analog-to-digital gain using camera response to varying i

viewing the integrating sphere)• Both measured and band-averaged spectral response

published within the ARP

Page 37: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

MEASURED SPECTRAL

PARAMETERS

Page 38: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

en successfully analysis

rtion, PSF), RCC, hot and cold

the missionight failures noteddful of pixels. Only 8rmity exceeding 10%ented camerauccessful test

lowing ground

when needed. No

51 pixels PSF, 20

y.entify affected pixels.

SUMMARY

• MISR testing of 10 cameras (9 flight and 1 spare) has becompleted after 1 year development and 1 year testing and

• 6 weeks per camera required to provide OCC (EFL, disto(radiometric, spectral calibration, polarization verification)margin, dynamics, and magnetics testing.

• Several verification failures appear to have little impact on - swath overlap meets requirements, though camera bores- response uniformity meets requirement for all but a han

pixel zones (4 pixel block) out of 13,536 have a local unifo• Several verification failures result from unprecend

specifications, driven by 3 % radiometric requirement. Sprogram allows mission objectives to be met, folprocessing- out-of-band errors can be reduced from 4% to 0.5%

correction necessary for Band 1, or bright targets- PSF deconvolution requires minimal processing: 1D,

iterations (no FFT required)• Saturation appears to affect many pixels within the line arra

- Saturation unlikely on orbit. Data Quality Indicators will id

Page 39: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISRRMS

Status

er Fixed

etween Fixed

eld toge

Fixed

filter Improved flightperformance

ion in Improved flightperformance

ature Fixed

d and New designbreadboarded

g or Options beinginvestigated

EM CAMERAS INVALUABLE FODIAGNOSING / FIXING PROBLE

Problem Cause Solution

White light leaks in filter Bondlines between bands Masks added to filt

Interference fringes in flat-field data

Fabry-Perot interferencebetween CCD and filter

Increase spacing bfilter and CCD

Spurious signal in CCD Illumination of siliconaround CCD bond pads

Addition of light shifocal plane packa

Insufficient out-of-bandrejection

Spattering in filter coatings Higher quality flightSpatter side down

Low-level “halo” aroundpoint-source image

Reflection between CCDand filter

See above. Correctdata processing ifneeded

Excess power needed tocool CCD to -10°C

Thermal leaks Focal plane temperchanged to -5°C

Complex assemblyprocedure to achieverepeatable focus

Lens to camera headinterface flanges

Interface redesignesimplified

Low-level inter-bandelectrical crosstalk(0.07%)

Suspected inadequategrounding

Additional groundincorrection in dataprocessing

Page 40: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

SATURATION BLOOMING
Page 41: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

to be cause of

95). In Advanced andfocal-plane designng. EUROPTO/ SPIE

FOCAL PLANE SCATTERING

• Filter scatter sites and CCD/ filter reflections determinedfinite width PSF and out-of-band performance, see:- Korechoff, R.P, D.J. Diner, D.J. Preston, C.J. Bruegge (19

Next-Generation Satellites. Spectroradiometerconsiderations: lessons learned from MISR camera testiVol. 2538, pp. 104-116, 25-28 September.

Page 42: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

CCD

Filter

Window

Lens

d budget

ast target budget and

FOCAL PLANE SCATTERING

Spectral cross-talk

Ghost imagery

80% reflectivealuminum mask

25% reflectivemask (topand bottom)

Component of 1% out-of-ban

Component of 2% delta contrMTF specification

Page 43: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISRSrder to assess

shes an absolute andolar-reflecting diffuser to verify there is no

monthly.

tive-calibration of the

into the coefficient less with time.der to achieve

MULTIPLE IN-FLIGHTCALIBRATION METHODOLOGIE

• MISR will make use of four calibration methodologies, in ocalibration uncertainty and reduce systematic errors.- On-Board Calibrator (OBC) hardware are used to establi

relative calibration for each pixel. The OBC consists of spanels (Spectralon), detector standards, and a goniometedegradation in the reflectance shape. Data are acquired

- Vicarious calibration (VC) can be one of three types:1) High-altitude sensor (e.g. AirMISR) VC2) Surface-radiance VC3) Surface reflectance VC

- Histogram equalization statistics are used to provide a relapixels within an array.

- Trend analysis are used to fold other calibration dataalgorithm (e.g. preflight). Retrospective data are weighted

• A weighting algorithm will combine the multiple data in orthe most accurate sensor calibration.

Page 44: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

TRACEABILITY

QUALITY ASSES.

LEV. 1B1 RAD.PROD. VALIDTN• Sensor cross-comp.• Desert scenes• Lunar observ.

CALIBRATION INTEGRITY

DATA

SCENE RAD.ERRORS

NOISE STUDIES

• Contrast target• Spectral content

• Polarization

ANOMOLIES

• Pixel non-uniform.

CHARACTERIZATION

LEGEND

Other Input oractivity Output

IFRCC PROGRAM ELEMENTS

LEVEL 1AACQUIRE MISRCALIBRATIONMODE DATA

ACQUIRE MISRLOCAL MODE

DATAARP

• Radiometric calib.

MISR PREFLGTRADIOMETRICCALIBRATION

SCENE STUDIES• PSF• Spectral in-band

RAD. SCALINGALGORITHM

RADIANCECONDITIONING

ALGORITHM

coefficients and

• SNR• Pixel nonunif.

• Spectral param.

uncertainties

• PSF

UPDATED PARAMS.

STATIC PARAMS.

• Fields-of-view

LEVEL 1B1 ALGORITHMS

MISSION OPS

PREFLIGHT

IN-FLGT RAD.CALIBRATION

CAL TREND

HISTOGRAM EQ

VICARIOUS CAL.

OBCWEIGHT

scaling

• Quality thresholds

IFRCCactivity

Page 45: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

arameters

ctions (7x36),ons (1 per band),

1B1 and Level 2

preflight

librationnd Detector Data

ntrol limits used

ARP STRUCTURES

File name Description

PreflightCharacterization Data

• preflight instrument characterization p• unlikely to be modified once delivered• measured pixel spectral response fun

standardized spectral response functiinstantaneous fields-of-view

Preflight Calibration Data • input to DAAC processes• unlikely to be modified once delivered• spectral descriptors relevant to Level

standard products• band weighted solar irradiances

In-flight Calibration Data • parameters updated monthly on-orbit• at-launch values are initialized by the

calibration data• radiometric calibration coefficients, ca

uncertainties, signal-to-noise ratios, aQuality Indicators.

Configuration Parameters • threshold parameters and process coby DAAC processes

Page 46: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

ncident radiancesry pixel

weighted less)rds (HQE, PIN nadir,

oefficients, in case of

ultiple determinations

certainty

ARPGEN PROCESSING CODE

• Data conditioning- Resamples photodiode data to CCD data time acquisition- Removes corrupt data

• Regression- Regresses CCD DN data against photodiode measured i- Quadratic fit produces G0, G1, and G2 coefficients for eve- Data weighted inversely by the DN variances (noisy data- Process repeated using 3 independent on-board standa

PIN at closest view angle to camera being calibrated)• Coefficient trending

- Uses historical coefficients and present coefficient- Performs a quadratic fit to the data- Reported coefficient comes from fit. This smooths gain c

noise in the retrieval• Coefficient weighting

- Final coefficients come from a weighted average of the m(vicarious and 3 detector standards)

- Weighting is inversely proportional to the methodology un

Page 47: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

iode radiancesal variances

detector data quality

ARPGEN PROCESSING(CONT.)

• Performance summary- SNR computed from residuals of CCD DN against photod- sliding window does local fit of the data, to determine loc- SNR used to update radiometric uncertainty tables- CCD element response uniformity updated as part of

metric

Page 48: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

Level 1B1(MIS02)

physical parameters

mevel 2oducts

Image enhancement viaPSF deconvolution

RADIOMETRIC SCALINGAND CONDITIONING

Radiance Radianceconditioningscaling

Instrument DNs Radiance (W m -2 µm-1 sr -1)

Resampling and projection toSpace Oblique Mercator

grid

Geo-rectified and registeredradiances

Level 1A

Level 1B2

(MIS01)

(MIS03)

Out-bandcorrection

Geo

soLepr

Page 49: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISRUCT

ve a band-averaged

ating for focal-plane

mments

ally-scaled dataic resampling

4 bands reported in Ancillary Product

spec.); 1 (reduced accu-usable for science);)

LEVEL 1B1 RADIOMETRIC PROD

RADIANCE SCALING

- Radiometric calibration coefficients are used to retriespectral radiance. Total-band response is included.

RADIANCE CONDITIONING

- PSF deconvolution to sharpen the image, compensscattering;

- A standardized spectral response function is assumed.

Parametername

UnitsHorizontal

Sampling (Coverage)Co

Radiance W m-2 µm-1

sr-1250 m nadir, 275 m off-

nadir, or averages per thecamera configuration(Global)

• Radiometric• No geometr• 9 cameras,• Uncertainty

Radiometric

Data Qual.Indicator

None Same as above • 0 (withinracy), 2 (un3(unusable

Page 50: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

1B pixel. These

at. in red band)

tric errortric error; else DQI =2

)tric error

tric error; else DQI=2

evel 1B2 resampleweighting

ull

alf

one

one

DATA QUALITY INDICATORS(DQI)

• Data Quality Indicators (DQI) are assigned to each Levelare assigned the values:

• Saturation blooming (Note: in average mode pixel is sat. if s- DQI=0 if no. saturated pixels (nsat)=0- else DQI=1 if specific pixel under test has < 0.5% radiome- else DQI=1 if specific pixel under test has < 3.0% radiome

• Video offset uncertainty- DQI=0 if line average DN less than threshold (~12,000 DN- else DQI=1 if specific pixel under test has < 0.5% radiome- else DQI=1 if specific pixel under test has < 0.5% radiome

DQIvalue

significanceError component

radiance uncertaintycontribution

L

0 within specification None f

1 reduced accuracy 1-3% h

2 unusable for science 3-50% n

3 unusable >50% n

Page 51: Terra Spacecraft - NASA · Jorquera, C., C.J. Bruegge, V.G. Duval (1992). Evaluation of high quantum efficiency silicon photodiodes for calibration in the 400 nm to 900 nm spectral

MISR

DQIlue

lse

lse

lse

DATA QUALITY INDICATORS(DQI), CONT.

• Detector anomaly- Values can be predetermined and stored in ARP- SNR used as DQI criteria

- Detector response uniformity used as DQI criteria

SNR DDQI value

>100 0, else

>90 1, else

> 10 2, else

3

Uniformity,4x4 average

mode

DDQIvalue

Uniformity,2x2 average

mode

Dva

<10% 0, else <10% 0, e

<15% 1, else <15% 1, e

<50% 2, else <50% 2, e

3 3