testingg reqq uirements - us department of...
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Testing Requirementsg q
Jeff McCullough LCJeff McCullough, LC Pacific Northwest National Laboratory
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May 15, 2008
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Testing Requirements
C it i T t P d S l T ti L b tCriteria Test Procedure Sample Size
Testing Laboratory
Luminaire Efficacy LM-79-2008 3 DOE approved 3rd Party
Minimum Light Output LM-79-2008 3 DOE approved 3rd Party Correlated Color Temperature (CCT)
LM-79-2008 3 DOE approved 3rd Party Temperature (CCT) Color Rendering Index (CRI) LM-79-2008 3 DOE approved 3rd Party Color Spatial Uniformity LM-79-2008 3 Self-Certification Color Maintenance LM 79 2008 3 Self CertificationColor Maintenance LM-79-2008 3 Self-Certification Lumen Maintenance (L70) LM-80-XX* DOE approved Device
Manufacturer In situ Temperature UL1598-2004 1 DOE approved 3rd Party or In situ Temperature Measurement Test
UL1598 2004 1 DOE approved 3 Party or UL Signatory
* In development
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Testing Requirements (cont.)
Criteria Test Sample Testing Laboratory Criteria Test Procedure
Sample Size
Testing Laboratory
In situ Temperature Measurement Test
UL1598-2004 1 DOE approved 3rd Party or UL Signatory Measurement Test UL Signatory
Power Factor ANSI C82.77-2002 3 DOE approved 3rd Party Noise 1 Self Certification Fli k 1 S lf C tifi tiFlicker 1 Self Certification
• “DOE approved” 3rd Party Test Laboratories are
• DOE is actively soliciting additional laboratories
DOE approved 3rd Party Test Laboratories are currently listed at:
www netl doe gov/ssl/CALiPER-FAQs htm www.netl.doe.gov/ssl/CALiPER FAQs.htm
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In Situ Testing Requirement
• Lumen depreciation (Life) determined by in situ temperature measurements of:
Module Array or Light Engine–Module, Array or Light Engine –Power Supply/Driver
• Testing may be conducted at the same time asTesting may be conducted at the same time as UL 1598.
• Testing conducted by independent third-party laboratory
• DOE will publish the In situ TemperatureMeasurement Test Procedure in JuneMeasurement Test Procedure in June.
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UL 1598 Environments
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General Procedure
Affi th l t h tt t LED d i /• Affix thermocouple to hottest LED device/array in the luminaire (designated by the luminaire manufacturer)manufacturer)
• Affix thermocouple to Tc or Tb Power Supply/Driver (designated by supplier)Supply/Driver (designated by supplier)
• Install luminaire in UL 1598 Test Apparatus • Allow system to reach thermal equilibriumAllow system to reach thermal equilibrium • Take readings and compare to LM-80 test data
for device and power supply manufacturer for device and power supply manufacturer warranty
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Thermal Equilibrium
• Operate the luminaire in the appropriate UL 1598 Apparatus for:1598 Apparatus for: – A minimum of 7.5 hours; or – The test has been running for a minimum of 3The test has been running for a minimum of 3
hours; and – 3 successive readings that at 15 min. intervals are
with 1°C and are not rising
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be ass su a o
Surface Ceiling Temperature Test ApparatusTemperature Test Apparatus
• ½" plywood • 2 x 6 sides • 1 x 6 ends • 2 x 4 inside supportspp• ≥ 72" above floor • ≥ 12" below ceiling ≥ 12 below ceiling • 2 layers of R-8/11
fiberglass insulationg
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Surface Wall Temperature Test ApparatusTemperature Test Apparatus
• ½" plywood • 2 x 4 supports2 x 4 supports • 1 x 4 ends • ≥ 36" above floor • ≥ 36 above floor • ≥ 12" below ceiling
1 4 i h i t l• 1 x 4 in horizontal position
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Type Non-IC Recessed Wall Temperature Test ApparatusTemperature Test Apparatus
• ½" plywood “box”
• D ≥ 8.5" • F = 6" or depthdep
of luminaire
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Type IC Recessed Wall-mounted Temperature Test ApparatusTemperature Test Apparatus
• ½" plywood “box” D ≥ 8 5" • D ≥ 8.5"
• F = 6" or depth of luminaireluminaire
• Filled with Cellulose InsulationInsulation
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• =
Type Non-IC Recessed Ceiling-mounted Temperature Test ApparatusTemperature Test Apparatus
• ½" plywood “box” • A = ½"A ½ • B > ½"
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Type IC Recessed Ceiling-mounted Temperature Test ApparatusTemperature Test Apparatus
• ½" plywoodp y“box”
• Open top • D ≥ 8.5" • Filled with
Cellulose Insulation
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Temperature Measurement Point (TMP)
• Manufacturer designated TMP correlating to LM-80 test report or power supply warranty – Module/Array
• Solder Joint Temperature Ts
• Case Temperature TCase Temperature Tc
• Board Temperature Tb
– Power Supply • Case Temperature Tc
• Could also be Tb for integral Power Supplies
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Lumen Depreciation Qualification
• Option 1: Component Performance – Applicable if:pp
• Module/Array has a current LM-80 test report • Module/Array has a designated TMP • TMP is accessible for in situ measurement • TMP is accessible for in situ measurement
– Otherwise manufacturer must use Option 2 • Option 2: Luminaire Performance Option 2: Luminaire Performance
– Entire luminaire subjected to LM-80
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Lumen Depreciation Passing Criteria
A luminaire passes if the L70 threshold (≥ 25,000 hours for indoor residential and ≥ 35,000 for all others) …
– if the in situ measured drive current is the same or lowerlower
AND– if the in situ measured TMP for the module/array isif the in situ measured TMP for the module/array is
the same or lower …than the LM-80 test report provided for thep p module/array.
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Sample LM-80 Test Report
L70
Temperature Measured in UL 1598 EnvironmentEnvironment
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Questions?
Jeff McCulloughJeff McCullough Pacific Northwest National Laboratory
(509) 375-6317(509) 375 6317 [email protected]
DOE SSL Website: www.netl.doe.gov/ssl/
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