the need for embedded intelligence in ate - ztec instruments · the need for embedded intelligence...
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The Need for Embedded Intelligence in ATE
Co-Author/Presenter: Christopher ZiomekCo-Author: Donald Jenkins
ZTEC Instruments, Inc.
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Overview
• Cost of test introduction• Intelligent instrumentation vs.
non-intelligent data acquisition• Embedded intelligence in modular ATE• Mask testing demo• Video signal analysis demo• Conclusion
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Cost of Test
• Exponential increase in electronic complexity• Little increase in testing efficiency
– Increased test instrument performance – Added complexity of comprehensive test
• Significant cost-of-ownership increase– Capital equipment expense– Development scope & complexity– Maintenance & upgrade costs
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Transistor Count inIntel Microprocessors
Source: First Monday, 2002
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Escalating Cost of Test
Relative Costs of an Integrated Circuit
0.000001
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0.0001
0.001
0.01
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Test
Source: 3MTS, San Jose, CA, 2003
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Modular Instruments
• Modular instruments well-suited to ATE– High-density instrumentation– High data transfer rates– Integrated power, cooling, software, etc.
• Non-intelligent data acquisition is NOT– Thick layer of host software– Development burden upon test engineer– Vast increase in required data throughput– Some advanced testing not possible
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Embedded Intelligence
• Provide benchtop test & measurement capabilities inside modular hardware
• Oscilloscope example:– Complete analog & trigger processing– Standard measurements– Waveform math & transformation– Multi-waveform capture– Pass/fail limit testing– Compliance mask testing
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Test System Architecture
DUT
DigitalStimulus
DigitalCapture
AnalogStimulus Analog
Capture
System Controller
Test Bus
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VXI Test Results
1.5 ms1.8 ms625.7 ms119.2 ms51.5 ms1.9 ms41.6 ms2.2 ms31.8 ms2.8 ms27.6 ms30.5 ms1
Instrument Measurement
Host PC Measurement
TestNo.
Source: ZTEC, Autotestcon, 2004
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PCI/PXI Test Results
611 ms8556 ms683 ms839 ms524 ms37 ms4
617 ms8544 ms383 ms842 ms224 ms31 ms1
Instrument Measurement
Host PC Measurement
TestNo.
Source: ZTEC, Autotestcon, 2004
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Distributed Embedded Test
• Test engineer – Focus on application– Not on standard test & measurement
• Advanced ATE examples– Compliance mask testing– Video signal analysis
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Mask Testing Demo
• Compliance testing for wired communication– Standard or non-standard serial datacom– ITU G.703 T1 test example (1.544 Mbps)
• Upper and lower waveform boundary conditions• Capture & analysis of thousands of waveforms• Intermittent failure capture & statistics
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Input Setup
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Trigger Setup
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Upper Mask Loaded (REF1)
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Lower Mask Loaded (REF2)
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Captured Pulse + Mask
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Mask Test Results
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Failed Waveform Stored
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Measurements on Failed Waveform
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Envelope (red) of Failed Waveform
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Video Signal Analysis Demo
• Video signal capture & analysis– PAL, NTSC, SECAM– User-defined, non-standard video
• Oscilloscope video frame synchronization• Standard video signal measurements
– Sync pulse width– White level– Color level
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Standard Color Bar Test Pattern
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Video Signal Introduction (Many Lines)
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Video Signal Introduction (One Line)
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Zoom in on Color Burst
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Input Setup (Color Bar Test Pattern)
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Trigger Setup
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Full Scale ~100 IRE
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Save Waveform to Ref1
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Measure Sync Pulse Width
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Measure White Level Using Cursors
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Measure Magenta Level using Cursors
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Conclusion
• Embedded intelligence in ATE– Comprehensive test solution– Faster test development– Shorter test times– Reduce total cost of test
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About ZTEC
• Located in Albuquerque, NM • Founded in 1996• Manufacturer of innovative modular
instrumentation products with a focus on PCI, PXI and VXI
• Products used in military, aerospace, commercial manufacturing, and scientific test and measurement applications
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Booth #1328
Contact Information
ZTEC Instruments7715 Tiburon St. NEAlbuquerque, NM 87109Phone: (505) 342-0132Fax: (505) 342-0222www.ztec-inc.com