trenchstop series - infineon technologies

IKA06N60T TRENCHSTOP™ Series

IFAG IPC TD VLS 1 Rev. 2.5 20.09.2013

Low Loss DuoPack : IGBT in TRENCHSTOP™ and Fieldstop technology with soft, fast recovery anti-parallel Emitter Controlled HE diode

Features

Very low VCE(sat) 1.5V (typ.)

Maximum Junction Temperature 175°C

Short circuit withstand time 5s

TRENCHSTOP™ and Fieldstop technology for 600V applications offers : - very tight parameter distribution - high ruggedness, temperature stable behavior - very high switching speed

Low EMI

Very soft, fast recovery anti-parallel Emitter Controlled HE diode

Qualified according to JEDEC1 for target applications

Pb-free lead plating; RoHS compliant

Complete product spectrum and PSpice Models : http://www.infineon.com/igbt/

Applications

Washing Machine

Inverter and Variable Speed Drive

Type VCE IC VCE(sat),Tj=25°C Tj,max Marking Code Package

IKA06N60T 600V 6A 1.5V 175C K06T60 PG-TO220-3 (FullPAK)

Maximum Ratings

Parameter Symbol Value Unit

Collector-emitter voltage, Tj ≥ 25C VC E 600 V

DC collector current, limited by Tjmax

TC = 25C

TC = 100C

IC

10

6.2

A

Pulsed collector current, tp limited by Tjmax IC p u l s 18

Turn off safe operating area, VCE = 600V, Tj = 175C, tp = 1µs - 18

Diode forward current, limited by Tjmax

TC = 25C

TC = 100C

IF

10.2

6.5

Diode pulsed current, tp limited by Tjmax IF p u l s 18

Gate-emitter voltage VG E 20 V

Short circuit withstand time2)

VGE = 15V, VCC 400V, Tj 150C tS C 5 s

Power dissipation

TC = 25C P t o t 28 W

Operating junction temperature T j -40...+175 C

Storage temperature T s t g -55...+150

Isolation voltage V i s o l 2500 Vr m s

1 J-STD-020 and JESD-022

2) Allowed number of short circuits: <1000; time between short circuits: >1s.

G

C

E

PG-TO220-3 (FullPAK)

http://www.infineon.com/igbt/



Thermal Resistance

Parameter Symbol Conditions Max. Value Unit

Characteristic

IGBT thermal resistance,

junction – case

R t h J C 5.3 K/W

Diode thermal resistance,

junction – case

R t h J C D 6.5

Thermal resistance,

junction – ambient

R t h J A 80

Electrical Characteristic, at Tj = 25 C, unless otherwise specified

Parameter Symbol Conditions Value

Unit min. typ. max.

Static Characteristic

Collector-emitter breakdown voltage V ( B R ) C E S VG E=0V, IC=0.25mA

600 - - V

Collector-emitter saturation voltage VC E ( s a t ) VG E = 15V, IC=6A

T j=25C

T j=175C

-

-

1.5

1.8

2.05

Diode forward voltage

VF VG E=0V, IF=6A

T j=25C

T j=175C

-

-

1.6

1.6

2.05

-

Gate-emitter threshold voltage VG E ( t h ) IC=0.18mA,

VC E=VG E

4.1 4.6 5.7

Zero gate voltage collector current

IC E S VC E=600V ,VG E=0V

T j=25C

T j=175C

-

-

-

-

40

700

µA

Gate-emitter leakage current IG E S VC E=0V,VG E=20V - - 100 nA

Transconductance g f s VC E=20V, IC=6A - 3.6 - S

Integrated gate resistor RG i n t none Ω

Dynamic Characteristic

Input capacitance C i s s VC E=25V,

VG E=0V,

f=1MHz

- 368 - pF

Output capacitance Co s s - 28 -

Reverse transfer capacitance C r s s - 11 -

Gate charge QG a t e VC C=480V, IC=6A

VG E=15V

- 42 - nC

Internal emitter inductance

measured 5mm (0.197 in.) from case

LE - 7 - nH

Short circuit collector current1)

IC ( S C ) VG E=15V, tS C5s VC C = 400V,

T j = 25C

- 55 - A

1)

Allowed number of short circuits: <1000; time between short circuits: >1s.



Switching Characteristic, Inductive Load, at Tj=25 C


Unit min. Typ. max.

IGBT Characteristic

Turn-on delay time td ( o n ) T j=25C, VC C=400V, I C=6A,

VG E=0/15V, rG=23 ,

L =60nH,C=40pF

L , C f rom Fig. E

Energy losses include “tail” and diode reverse recovery.

- 9.4 - ns

Rise time t r - 5.6 -

Turn-off delay time td ( o f f ) - 130 -

Fall time t f - 58 -

Turn-on energy Eo n - 0.09 - mJ

Turn-off energy Eo f f - 0.11 -

Total switching energy E t s - 0.2 -

Anti-Parallel Diode Characteristic

Diode reverse recovery time t r r T j=25C,

VR=400V, IF=6A,

diF /d t=550A/s

- 123 - ns

Diode reverse recovery charge Q r r - 190 - nC

Diode peak reverse recovery current I r r m - 5.3 - A

Diode peak rate of fall of reverse recovery current during tb

di r r /d t - 450 - A/s

Switching Characteristic, Inductive Load, at Tj=175 C


Unit min. typ. max.

IGBT Characteristic

Turn-on delay time td ( o n ) T j=175C, VC C=400V, I C=6A,

VG E=0/15V, rG=23 ,

L =60nH,C=40pF

L , C f rom Fig. E

Energy losses include “tail” and diode reverse recovery.

- 8.8 - ns

Rise time t r - 8.2 -

Turn-off delay time td ( o f f ) - 165 -

Fall time t f - 84 -

Turn-on energy Eo n - 0.14 - mJ

Turn-off energy Eo f f - 0.18 -

Total switching energy E t s - 0.335 -

Anti-Parallel Diode Characteristic

Diode reverse recovery time t r r T j=175C

VR=400V, IF=6A,

diF /d t=550A/s

- 180 - ns

Diode reverse recovery charge Q r r - 500 - nC

Diode peak reverse recovery current I r r m - 7.6 - A

Diode peak rate of fall of reverse recovery current during tb

di r r /d t - 285 - A/s



I C,

CO

LLE

CT

OR

CU

RR

EN

T

10Hz 100Hz 1kHz 10kHz 100kHz

0A

5A

10A

15A

TC=110°C

TC=80°C

I C,

CO

LLE

CT

OR

CU

RR

EN

T

1V 10V 100V 1000V

0,1A

1A

10A

DC

10µs

tp=1µs

50µs

5ms

5µs

500µs

f, SWITCHING FREQUENCY VCE, COLLECTOR-EMITTER VOLTAGE

Figure 1. Collector current as a function of switching frequency

(Tj 175C, D = 0.5, VCE = 400V,

VGE = 0/15V, rG = 23)

Figure 2. Safe operating area

(D = 0, TC = 25C,

Tj 175C;VGE=0/15V)

Pto

t, P

OW

ER

DIS

SIP

AT

ION

25°C 50°C 75°C 100°C 125°C 150°C0W

5W

10W

15W

20W

25W

I C,

CO

LLE

CT

OR

CU

RR

EN

T

25°C 75°C 125°C

0A

2A

4A

6A

8A

TC, CASE TEMPERATURE TC, CASE TEMPERATURE

Figure 3. Power dissipation as a function of case temperature

(Tj 175C)

Figure 4. Collector current as a function of case temperature

(VGE 15V, Tj 175C)

Ic

Ic



I C,

CO

LLE

CT

OR

CU

RR

EN

T

0V 1V 2V 3V

0A

3A

6A

9A

12A

15A

15V

7V

9V

11V

13V

VGE

=20V

I C,

CO

LLE

CT

OR

CU

RR

EN

T

0V 1V 2V 3V

0A

3A

6A

9A

12A

15A

15V

7V

9V

11V

13V

VGE

=20V

VCE, COLLECTOR-EMITTER VOLTAGE VCE, COLLECTOR-EMITTER VOLTAGE

Figure 5. Typical output characteristic (Tj = 25°C)

Figure 6. Typical output characteristic (Tj = 175°C)

I C,

CO

LLE

CT

OR

CU

RR

EN

T

0V 2V 4V 6V 8V 10V0A

3A

6A

9A

12A

15A

25°C

TJ=175°C

VC

E(s

at)

, C

OLLE

CT

OR

-EM

ITT

SA

TU

RA

TIO

N V

OLT

AG

E

-50°C 0°C 50°C 100°C0,0V

0,5V

1,0V

1,5V

2,0V

2,5V

3,0V

IC=6A

IC=12A

IC=3A

VGE, GATE-EMITTER VOLTAGE TJ, JUNCTION TEMPERATURE

Figure 7. Typical transfer characteristic (VCE=20V)

Figure 8. Typical collector-emitter saturation voltage as a function of junction temperature (VGE = 15V)



t, S

WIT

CH

ING

TIM

ES

0A 3A 6A 9A 12A 15A1ns

10ns

100ns

tr

td(on)

tf

td(off)

t, S

WIT

CH

ING

TIM

ES

1ns

10ns

100ns

tf

tr

td(off)

td(on)

IC, COLLECTOR CURRENT RG, GATE RESISTOR

Figure 9. Typical switching times as a function of collector current (inductive load, TJ=175°C, VCE = 400V, VGE = 0/15V, rG = 23Ω, Dynamic test circuit in Figure E)

Figure 10. Typical switching times as a function of gate resistor (inductive load, TJ=175°C, VCE = 400V, VGE = 0/15V, IC = 6A, Dynamic test circuit in Figure E)

t, S

WIT

CH

ING

TIM

ES

50°C 100°C 150°C1ns

10ns

100ns

tr

tf

td(on)

td(off)

VG

E(t

h),

GA

TE-E

MIT

T T

RS

HO

LD

VO

LT

AG

E

-50°C 0°C 50°C 100°C 150°C0V

1V

2V

3V

4V

5V

6V

min.

typ.

max.

TJ, JUNCTION TEMPERATURE TJ, JUNCTION TEMPERATURE

Figure 11. Typical switching times as a function of junction temperature (inductive load, VCE = 400V, VGE = 0/15V, IC = 6A, rG = 23Ω, Dynamic test circuit in Figure E)

Figure 12. Gate-emitter threshold voltage as a function of junction temperature (IC = 0.18mA)



E,

SW

ITC

HIN

G E

NE

RG

Y L

OS

SE

S

0A 2A 4A 6A 8A 10A0,0 mJ

0,1 mJ

0,2 mJ

0,3 mJ

0,4 mJ

0,5 mJ

0,6 mJ

Ets*

Eon

*

*) Eon

and Ets include losses

due to diode recovery

Eoff

E,

SW

ITC

HIN

G E

NE

RG

Y L

OS

SE

S

0,0 mJ

0,1 mJ

0,2 mJ

0,3 mJ

0,4 mJ

Ets*

Eon

*

*) Eon



Eoff

IC, COLLECTOR CURRENT RG, GATE RESISTOR

Figure 13. Typical switching energy losses as a function of collector current (inductive load, TJ=175°C, VCE=400V, VGE=0/15V, rG=23Ω, Dynamic test circuit in Figure E)

Figure 14. Typical switching energy losses as a function of gate resistor (inductive load, TJ=175°C, VCE = 400V, VGE = 0/15V, IC = 6A, Dynamic test circuit in Figure E)

E,

SW

ITC

HIN

G E

NE

RG

Y L

OS

SE

S

50°C 100°C 150°C0,0mJ

0,1mJ

0,2mJ

0,3mJ

0,4mJ

Ets*

Eon

*

*) Eon



Eoff

E,

SW

ITC

HIN

G E

NE

RG

Y L

OS

SE

S

200V 300V 400V 500V0,0mJ

0,1mJ

0,2mJ

0,3mJ

0,4mJ

0,5mJ

Ets*

Eon

*

*) Eon



Eoff

TJ, JUNCTION TEMPERATURE VCE, COLLECTOR-EMITTER VOLTAGE

Figure 15. Typical switching energy losses as a function of junction temperature (inductive load, VCE=400V, VGE = 0/15V, IC = 6A, rG = 23Ω, Dynamic test circuit in Figure E)

Figure 16. Typical switching energy losses as a function of collector emitter voltage (inductive load, TJ = 175°C, VGE = 0/15V, IC = 6A, rG = 23Ω, Dynamic test circuit in Figure E)



VG

E,

GA

TE-E

MIT

TE

R V

OLT

AG

E

0nC 10nC 20nC 30nC 40nC 50nC0V

5V

10V

15V

480V

120V

c,

CA

PA

CIT

AN

CE

0V 10V 20V

10pF

100pF

1nF

Crss

Coss

Ciss

QGE, GATE CHARGE VCE, COLLECTOR-EMITTER VOLTAGE

Figure 17. Typical gate charge (IC=6 A)

Figure 18. Typical capacitance as a function of collector-emitter voltage (VGE=0V, f = 1 MHz)

I C(s

c), s

hort

circu

it C

OLLE

CT

OR

CU

RR

EN

T

12V 14V 16V 18V0A

20A

40A

60A

80A

t SC,

SH

OR

T C

IRC

UIT

WIT

HS

TA

ND

TIM

E

10V 11V 12V 13V 14V0µs

2µs

4µs

6µs

8µs

10µs

12µs

VGE, GATE-EMITTETR VOLTAGE VGE, GATE-EMITETR VOLTAGE

Figure 19. Typical short circuit collector current as a function of gate-emitter voltage

(VCE 400V, Tj 150C)

Figure 20. Short circuit withstand time as a function of gate-emitter voltage (VCE=400V, start at TJ=25°C, TJmax<150°C)



Zth

JC,

TR

AN

SIE

NT

TH

ER

MA

L I

MP

ED

AN

CE

10µs 100µs 1ms 10ms 100ms 1s 10s

10-1

K/W

100K/W

single pulse

0.01

0.02

0.05

0.1

0.2

D=0.5

Zth

JC,

TR

AN

SIE

NT

TH

ER

MA

L I

MP

ED

AN

CE

10µs 100µs 1ms 10ms 100ms 1s 10s10

-2K/W

10-1

K/W

100K/W

single pulse

0.01

0.02

0.05

0.1

0.2

D=0.5

tP, PULSE WIDTH tP, PULSE WIDTH

Figure 21. IGBT transient thermal impedance (D = tp / T)

Figure 22. Diode transient thermal impedance as a function of pulse width (D=tP/T)

t rr, R

EV

ER

SE

RE

CO

VE

RY

TIM

E

200A/µs 400A/µs 600A/µs 800A/µs0ns

50ns

100ns

150ns

200ns

250ns

TJ=25°C

TJ=175°C

Qrr,

RE

VE

RS

E R

EC

OV

ER

Y C

HA

RG

E

200A/µs 400A/µs 600A/µs 800A/µs0,0µC

0,1µC

0,2µC

0,3µC

0,4µC

0,5µC

TJ=25°C

TJ=175°C

diF/dt, DIODE CURRENT SLOPE diF/dt, DIODE CURRENT SLOPE

Figure 23. Typical reverse recovery time as a function of diode current slope (VR = 400V, IF = 6A, Dynamic test circuit in Figure E)

Figure 24. Typical reverse recovery charge as a function of diode current slope (VR = 400V, IF = 6A, Dynamic test circuit in Figure E)

R , ( K / W ) , ( s )

0.381 1.867*10-2 6.53*10

-2

2.57 1.350

0.645 2.208*10-3

1.454 5.474*10-4

0.062 5.306*10-5

0.186 5.926*10-1

C1=1/R1

R1 R2

C2=2/R2

R , ( K / W ) , ( s ) 0.403 1.773*10

-2 6.53*10

-2

2.57 1.346

0.938 1.956*10-3

2.33 4.878*10-4

0.071 4.016*10-5

0.188 5.684*10-1

C1=1/R1

R1 R2

C2=2/R2



I rr, R

EV

ER

SE

RE

CO

VE

RY

CU

RR

EN

T

200A/µs 400A/µs 600A/µs 800A/µs0A

2A

4A

6A

8A

TJ=25°C

TJ=175°C

di rr

/dt,

DIO

DE

PE

AK

RA

TE

OF

FA

LL

OF

RE

VE

RS

E R

EC

OV

ER

Y C

UR

RE

NT

200A/µs 400A/µs 600A/µs 800A/µs0A/µs

-100A/µs

-200A/µs

-300A/µs

-400A/µs

-500A/µsT

J=25°C

TJ=175°C

diF/dt, DIODE CURRENT SLOPE diF/dt, DIODE CURRENT SLOPE

Figure 25. Typical reverse recovery current as a function of diode current slope (VR = 400V, IF = 6A, Dynamic test circuit in Figure E)

Figure 26. Typical diode peak rate of fall of reverse recovery current as a function of diode current slope (VR = 400V, IF = 6A, Dynamic test circuit in Figure E)

I F,

FO

RW

AR

D C

UR

RE

NT

0,0V 0,5V 1,0V 1,5V 2,0V0A

2A

4A

6A

8A

10A

25°C

TJ=175°C

VF,

FO

RW

AR

D V

OLT

AG

E

0°C 50°C 100°C 150°C0,0V

0,5V

1,0V

1,5V

2,0V

6A

IF=12A

3A

VF, FORWARD VOLTAGE TJ, JUNCTION TEMPERATURE

Figure 27. Typical diode forward current as a function of forward voltage

Figure 28. Typical diode forward voltage as a function of junction temperature



Please refer to mounting instructions

PG-TO220-3 (FullPAK)



Ir r m

90% Ir r m

10% Ir r m

di /dtF

tr r

IF

i,v

tQS

QF

tS

tF

VR

di /dtr r

Q =Q Qr r S F

+

t =t tr r S F

+

Figure C. Definition of diodes switching characteristics

p(t)1 2 n

T (t)j

11

2

2

n

n

T C

r r

r

r

rr

Figure D. Thermal equivalent circuit

Figure A. Definition of switching times

Figure B. Definition of switching losses



Published by Infineon Technologies AG 81726 Munich, Germany © 2013 Infineon Technologies AG All Rights Reserved.

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The information given in this document shall in no event be regarded as a guarantee of conditions or

characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or

any information regarding the application of the device, Infineon Technologies hereby disclaims any and all

warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual

property rights of any third party.

Information

For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. The Infineon Technologies component described in this Data Sheet may be used in life-support devices or systems and/or automotive, aviation and aerospace applications or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support, automotive, aviation and aerospace device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.

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