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TU Ilmenau Expertise & Contributions
Ilmenau University of Technology
OPV Research @ Technische Universität Ilmenau
Fundamental
Structure-Property-Relations:
Chemical (side-chain) structure,
morphology and conformation
control, charge transport,
processing additives
Technology & Processing:
Large Area Upscaling, Roll-to-
Roll Processing, Optimum
Module Design, Device
Architecture, Laser Ablation,
Efficiency, Flexibility
Stability and Imaging:
Quality Control, Degradation,
Stability and Lifetime,
Quantitative Modelling
Hoppe et al., J. Mater. Chem. 16, 45 (2006)
Nguyen et al., Adv. Funct. Mater. 17, 1071 (2007)
Troshin et al., Adv. Funct. Mater. 19, 779 (2009)
Egbe et al., Macromolecules 43, 1261 (2010)
Rathgeber et al., Polymer 52, 3819 (2011)
Kästner et al., J. Mater. Chem. 22,15987 (2012)
Singh et al., J. Poly. Sci. B 51, 943 (2013)
Kästner et al., J. Mater. Chem. A 1, 3961 (2013)
Muhsin et al., PSS A- Appl. Mater. Sci. 206, 2771 (2009)
Muhsin et al., Synthetic Metals 159, 2358 (2009)
Rösch et al., EUPVSEC Proceeding 2009 (2009)
Schoonderbeek et al., EUPVSEC Proceeding 2010 (2010)
Gevorgyan et al., Sol. Ener. Mater. Sol. Cells 95, 1398 (2011)
Hoppe et al., Sol. Ener. Mater. Sol. Cells 97, 119 (2012)
Tanenbaum et al., Sol. Ener. Mater. Sol. Cells 97, 244 (2012)
Bärenklau et al., MRS Proceedings Fall 2011 (2012)
Hoppe et al., J. Appl. Phys. 107, 014505 (2010)
Seeland et al., J. Appl. Phys.109, 064513 (2011)
Seeland et al., J. Appl. Phys.111, 024505 (2012)
Tanenbaum et al., Sol. Ener. Mater. Sol. Cells 97, 157 (2012)
Rösch et al., Sol. Ener. Mater. Sol. Cells 97, 176 (2012)
Rösch et al., Ener. & Environment. Sci. 5, 6521 (2012)
Rösch et al., Sol. Ener. Mater. Sol. Cells 111, 212 (2013)
Rösch et al., Sol. Ener. Mater. Sol. Cells 117, 59 (2013)
Klumbies et al., Sol. Ener. Mater. Sol. Cells 120, 685 (2014)
Preparation Expertise • >10 years of experience in OPV; Major interest: solution processing
• Clean-room environment for sample preparation
• Inert preparation line with evaporation & sputter chamber
• Solution processing: spin coating, doctor blading, slot-die coating
• Laser ablation for device structuring
Expertise for Degradation
• Indoor, outdoor, automated equipment
• ISOS-L1 and L2 – further under development
WG1 – Technology Scanning
• We keep our eyes open…
WG2 - Preparation
• Standard layer stack:
– Glass/ITO/PEDOT:PSS/PCDTBT:PC
BM/TiOx/Aluminum
• Glass encapsulation
• 1“ x 1“ x 2 mm
• 4 cells on each substrate
• Up to 30 subtrates to be delivered
• P3HT:PCBM, PCDTBT:PC70BM,
PBDTTT-CT:PC70BM, …
• PEDOT:PSS, metalloxides,
PEI(E), polyelectrolytes
• Conventional, inverted
• ITO-free (PH1000), …
WG3 - Degradation
Investigation of solar cell lifetime possible under the following
conditions:
(a) Indoor, constant illumination (~1 sun) @ 45°C or 65 °C
(b) Outdoor, from lab scale cells up to large industrial modules (OPAL)
(c) In the dark, @ different temperatures
• Up to 40 devices in one experiment
• Periodic IV-characterization & evaluation
• Monitoring of light intensity, temperature and rel. humidity
WG4 – Non-Destructive Characterization
• Imaging methods (ELI, PLI, DLIT, ILIT, LBIC, OM)
– PLI and ILIT is also applicable for layer stacks and films
• Optical spectroscopy (R&T, EL and PL)
– Optical modelling (to yield complex refractive index or layer thickness)
• Variable Angle Spectroscopic Ellipsometry (VASE)
– Applicable for films/layer stacks and (un)encapsulated devices
– Complex modelling
• Modelling and Simulation (ODM, MDM, FEM)
– Network models (SPICE & Co.)
– Multiphysics (FEM)
Excitation
Detection
Current Light (vis-
NIR)
Current -- LBIC
Light (vis-
NIR)
ELI PLI
Light (IR) DLIT ILIT
WG5 – Destructive Characterization
• For Solar Cells/Modules:
– (AFM,) XPS/UPS (depth profile), AES (depth profile), SEM, XRD
(Bregg-Bretano, GID-geometry)
• For Layer Stacks:
– AFM, XPS/UPS (depth profile), AES (depth profile), SEM, XRD
• For Films:
– AFM, XPS/UPS (depth profile), AES (depth profile), (SEM,) XRD
WG6 – New Device Development
• For Solar Cells/Modules:
– Charge transport layers (e.g. metalloxides)
– New active layer materials
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