usability of published see data munir shoga the radiation group, inc. 8/30/07
TRANSCRIPT
Bibliography of Author
• Graduated from Rutgers Univ and hold MS & Ph.D degs. in Elec. Engg (solid state devices)
• I was the SEU guy at Hughes / Boeing for ~ 20 years• From part to system level, I assessed all space programs at
Hughes/Boeing for 18 years ( > 50 programs)• Have over 40 publications & presentations in SEE and other
semiconductor devices• Tested or supported over 2000 hours of beam time SEE testing
parts and, some more, doing FXR & TID testing• Holds four patents and two pending• Two Boeing awards for technical excellence
Where can I find Test Data?
• Own data on C:\, D:\, flash memory cards, CDs, on one of laptops / PCs, in the office or at work, or on somebody else’s PC, etc.
• In various conference and none conference journals and proceedings
• Various internet websites and databases
Doing Your Job
• You may have– To do unit analysis of some 20 parts or many
units on a system– You may have to design space hardware– Planning for a SEE test– You may need to perform rate prediction– May not have sufficient budget– Program schedule does not allow a test
How to get data?
• Search all PC hardware• E-mail or call colleagues at work or in other
companies• Search all available journals and proceedings• Search the internet (vendors and other available
databases), etc.• Do own testing
Can I use published data?
• Bias, temperature, frequency, or operating conditions are different than the published test data
• The test data is old?
• Did the part process / design change?
• Is there a vendor or fab location change?
• Is there sufficient data?
How useful is the Data?
• Will the data answer my questions:– Upset (SEU) characteristics– Transient (SET) characteristics– Latchup, burnout, gate rupture, SEFI, stuck
bit, etc.
• Do I need to do more testing?
When to use published data?
• For critical applications you MUST test to your operational bias conditions, orbital conditions, and program requirements - You may use published data when writing your test plan
• For Non-Critical applications you may:– Use the data – Use transient (SET) characteristics in your design
• If you do not have budget to test
• If schedule does not allow for a test
• You may use the data but with a good engineering judgment
Introducing Single Event Effects Database Software
• Tow versions are available now for MS Windows:
– SEE PRO 2007 for desktop– SEE NET PRO, a Client – Server (for the
enterprise)
SEE PRO & SEE NET PRO
• Contains all published data, 1983 - 2007
• Presented in a powerful & easy to search software interface
• Two versions: desktop and Client – Server for the Enterprise
• Updates every 6-months
SEE PRO cont’d
• It contains 24 years of test data (heavy ion, proton, and neutron)
• It has either a data set of cross sections vs. LET/Energy or just the LET Threshold and saturated cross section
• Data collected from conference proceedings, journals, and various Internet web sites
• Within minutes you can get useful part’s data
SEE PRO cont’d
• Enterprise access to the data• Has e-mail address of most testers and hence one can
e-mail the tester for a report or row data • Any one with credentials can add data, reports, etc• Very important: for companies with many individuals
conducting tests and have lots of data, this is one place for every one to save their data and reports
• If some one leaves the company you know that all his test data and reports are in SEE PRO
Who is it for?
• For aerospace and avionic companies' survivability and design engineers
• Manufacturers building units and boards for space an avionics
• For consultants supporting space systems
• For component manufacturers to find out their parts SEE performance and their competition’s
• For researchers to investigate trends in technology, function, operational characteristics, etc.
Conclusion
• SEE PRO / SEE NET PRO– Reduce cost of searching SEE test data– Helps in planning new SEE testing– Helps design engineers in their part’s
selection– A place to organize all your SEE test data and
reports– Updates will be made every 6-months
Future Database
• Complete suite of radiation effects. It will contain:– TID data– Displacement damage– FXR data– Material database
Contact Information
Munir Shoga
The Radiation Group, Inc.
30251 Golden Lantern # 413
Laguna Niguel, CA 92677
Phone: (562) 858-0942
Fax: (949) 215-1620
E-Mail: [email protected]
www.SEUdata.com