use of fel off-axis zone plate spectrometer to measure relative k by the pinhole/centroid method
DESCRIPTION
Use of FEL Off-Axis Zone Plate Spectrometer to measure relative K by the Pinhole/Centroid method. LCLS Beam-Based Undulator K Measurements Workshop November 14, 2005. Baseline Diagnostics. Start of Experimental Hutches. 5 mm diameter collimators. Windowless Ion Chamber. Diagnostic Package. - PowerPoint PPT PresentationTRANSCRIPT
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Use of FEL Off-Axis Zone Plate Spectrometer to measure relative K by the Pinhole/Centroid method
LCLS Beam-Based Undulator K Measurements Workshop
November 14, 2005
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Baseline Diagnostics
SolidAttenuator
Gas Attenuator
High-EnergySlit
Start of Experimental
Hutches
5 mm diameter
collimators
Muon Shield
FEL Offset mirror
system
TotalEnergy
CalorimeterWFOV Direct
Imager
Scanning Spectrometer / Indirect Imager
mirrors
Windowless Ion
Chamber
Windowless Ion
Chamber
e-
Diagnostic Package
NFOV Direct Imager
FEL Spectrometer and Direct Imager in 2nd Hutch of NEH
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
8.26 keV Transmission Grating
31021
NE
E
P = 200 nmN = 500
D = 100 m
Sputter-sliced SiC / B4C multilayer
33 m thick
Beam100 m
Interference Function
Single Slit Diffraction Pattern
Observed Intensity
angle
mDP
3750
mD 5
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Sputter-Sliced SiC/B4C Grating
SiCB4C
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Sputtered-sliced multilayer gratings as high bw Sputtered-sliced multilayer gratings as high bw spectrometersspectrometers
5-m-thick Mo/Si multilayer (d=200 Å) on Si wafer substrate. Thinned and polished to a 10- m-thick slice
SEM image of Mo/Si multilayer
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Parabolic wave calculation shows > 10 nm thick gratings with 2 nm
periods do not work
diffraction peaks in far-field no diffraction peaks in far-field
2 nm period
10 nm2 nm
period
50 nm
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Long grating acts like a coupled waveguide
10 nm long grating shows some cross coupling in near-field
50 nm (or longer) shows complete cross coupling in
near-field
Parabolic wave calculations by Jeffrey S. Kallman
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
200 nm period x 33 microns works
diffraction peaks in far-field
200 nm period
33 m
Waveguide coupling limits us to periods > 200 nm
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Spectrometer location in FEE to measure Spontaneous Radiation
Thick Slit
Be mirrors1 & 2
Attenuators
SiC Mirror 1
Put camera here
SiC Mirror 2
5 mm dia. Collimator 1
2.5 m DiagnosticsPackage Contains Grating and Variable Slit
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Position of Spontaneous Spectrometer
Optic Camera
5 m
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
FEE Schematic with Transmission Grating Spectrometer
SolidAttenuator
Gas Attenuator
ThickSlit
Start of Experimental
Hutches
5 mm diameter
collimators
Muon Shield
FEL Offset mirrors
Grating
WFOV Direct Imager
Spectrometer Imager
Windowless gas
detectors
Variable Slit
e-
Diagnostic Package
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
1st Order DiffractionPeaks
4 mm
FEL Transmission Grating Spectrometer
Thick Slit5 cm Ta
capped with 1 cm B4C
YAG Scintillator50 microns thick
Thin Adjustable Slit1 mm Ta
Very high energy photons go through everything
50-100 micron1 mm
6 m
TransmissionGrating200 nm Period100 micron Aperture
5 m
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Monte Carlo Generation of Photons from Near-Field
CalculationsPhotons are aimed at Sven’s near field distributions…
… but allowed to reflect off of the vacuum pipe or get absorbed in the breaks
Slits, gratings and scintillator placed in beam
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Grating
P = 200 nm
Number of P = 500
Distance = 5 m
8.26 keV FEL Only
10000 photons
FEL ~ 160 m FWHM
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Diffracted angle micro R
Diffraction angle, 4,0002,0000-2,000-4,000
Events
/ 1
00
2,200
2,000
1,800
1,600
1,400
1,200
1,000
800
600
400
200
0
Simulated Scattering angle for photons through grating
Rad
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
5 m downstream of grating
Final XY zomm in
Final x, mm54.543.532.521.510.50-0.5-1-1.5-2-2.5-3-3.5-4-4.5
Fin
al y
, mm
5
4
3
2
1
0
-1
-2
-3
-4
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Shadow of optic defines center
Final XY double zoom
Final x, micron2001000-100
Fin
al y
, mic
ron
200
100
0
-100
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
First order peaks are 100 microns across for FEL
Spectra
Final x, micron4,0002,0000-2,000-4,000
Fin
al y
, mic
ron
4,400
4,200
4,000
3,800
3,600
Distance E/E
/P*f 3750 m 1
Pixel Size 10 m 2.7x10-3
1/N 7.5 m 2x10-3
Aperture 100 m 2.7x10-2
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Off-Axis Zone Plate Spectrometer
Zone plate axis
Beam Axis
l > l0
l < l0
l = l0
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Off-Axis Zone plateFocal Length 4.643 m
Offset 3750 microns
50 and 100 m aperture
Distance = 5 m
Starting Zone 20204, 185 nm
Ending Zone 21296, 181 nm
8.26 keV FEL Only
10000 photons
FEL ~ 160 m FWHM
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Scintillator Image
Final XY zomm in
Final x, mm543210-1-2-3-4
Fin
al y
, mm
4
2
0
-2
-4
Spectra
Final x, micron4,0002,0000-2,000-4,000
Fin
al y
, mic
ron
4,400
4,200
4,000
3,800
3,600
Spectra
Final x, micron4,0002,0000-2,000-4,000
Fin
al y
, m
icro
n -3,600
-3,800
-4,000
-4,200
-4,400
Positive
Negative
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Scintillator Image around 5% Bw
Resolution is 2.36*4.8 microns/4092 microns = 3 x 10-3 = 23 eV
Spectra 5% bw
Final y, micron-4,050-4,100-4,150-4,200
Eve
nts
/ 2 m
icro
n
30
25
20
15
10
5
0
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
50 micron aperture diffraction
Spectra 5% bw
Final y, micron-4,000-4,100-4,200
Eve
nts
/ 2 m
icro
n
20
15
10
5
0
Resolution is 2.36*7.9 microns/4092 microns = 5 x 10-3 = 38 eV
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Wavelength calibration
Spectra 5% bw
Final y, micron-4,000-4,100-4,200
Eve
nts
/ 2 m
icro
n
30
25
20
15
10
5
0
= 0.149942 nm
= -4091 m
Spectra 5% bw
Final y, micron-4,000-4,100-4,200
Eve
nts
/ 2 m
icro
n
30
25
20
15
10
5
0
= 0.151113 nm
= -4124 m
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
First Undulator Segment
1st undulator segment emits
Thick slit 1 mm wide
1 x 1 mm single undulator distribution simulated from 7.5 to 8.5 keV
Thin slits forming crossed 100 m apertures in x and y
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Initial photon position and energyFirst Segment
Initial Z
z, meter200150100500
Eve
nts
/ 2 m
eter
5,000,000
4,000,000
3,000,000
2,000,000
1,000,000
0
Source Energy Distribution
E, KeV8
Eve
nts
/ 0.0
05 K
eV
600,000
500,000
400,000
300,000
200,000
100,000
0
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Zero order peak, First Segment
Final XY double zoom
Final x, micron2001000-100
Fin
al y
, m
icro
n
200
100
0
-100
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Area near first order
First Segment
Final XY zomm in
Final x, mm543210-1-2-3-4
Fin
al y
, mm
4
2
0
-2
-4
Spectra
Final x, micron4,0002,0000-2,000-4,000
Fin
al y
, mic
ron
4,400
4,200
4,000
3,800
3,600
Spectra
Final x, micron4,0002,0000-2,000-4,000
Fin
al y
, mic
ron
-3,600
-3,800
-4,000
-4,200
-4,400
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
First Segment Normalization
• Sven’s near-field calculation– 2 x 2 mm
– 8.0 to 8.5 keV
– 79 nC
– 0.034 J
– 2.553 x 107 Photons
• Simulation– 107 Photons simulated
– 31 nC
• Scale Monte Carlo by x 2.553 for full pulse
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Spectra of nominal First Segment
1403 photons in simulation
=> 3600 ± 100 in a 79 nC pulse
Fitted centroid: = - 4088.81 ± 0.07
m
Spectra 5% bw
Final y, micron-4,000-4,100-4,200
Events
/ 2
mic
ron 80
60
40
20
0
Need at least x 200 more photons!
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Spectra of First Segment Detuned by 10-3
1427 photons in simulation
=> 3600 ± 100 in a 79 nC pulse
Fitted centroid: = - 4095.87 ± 0.07
m
Spectra 5% bw
Final y, micron-4,000-4,100-4,200
Eve
nts
/ 2 m
icro
n 80
60
40
20
0
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Spectra of First Segment Detuned by 10-4
1468 photons in simulation
=> 3700 ± 100 in a 79 nC pulse
Fitted centroid: = - 4089.19 ± 0.07
m
Spectra 5% bw
Final y, micron-4,000-4,100-4,200
Even
ts / 2
mic
ron 80
60
40
20
0
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Last Undulator Segment
Last undulator segment emits
Thick slit 1 mm wide
Thin slits forming crossed 42 m apertures in x and y
1 x 1 mm single undulator distribution simulated from 7.5 to 8.5 keV
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Initial photon position and energy
Source Energy Distribution
E, KeV8
Eve
nts
/ 0.
005
KeV
500,000
400,000
300,000
200,000
100,000
0
Initial Z
z, meter150100500
Even
ts /
2 m
eter
5,000,000
4,000,000
3,000,000
2,000,000
1,000,000
0
Last Segment
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Zero order peak, Last Segment
Final XY double zoom
Final x, micron2001000-100
Fin
al y
, m
icro
n200
100
0
-100
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Area near first order
Final XY zomm in
Final x, mm543210-1-2-3-4
Fin
al y
, m
m
4
2
0
-2
-4
Spectra
Final x, micron4,0002,0000-2,000-4,000
Fin
al y
, m
icro
n
4,400
4,200
4,000
3,800
3,600
Spectra
Final x, micron4,0002,0000-2,000-4,000
Fin
al y,
mic
ron
-3,600
-3,800
-4,000
-4,200
-4,400
Last Segment
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Spectra of nominal Last Segment
Spectra 5% bw
Final y, micron-4,050-4,100-4,150-4,200
Eve
nts
/ 2
mic
ron
25
20
15
10
5
0
303 photons in simulation
=> 3300 ± 200 in a 79 nC pulse
Fitted centroid: = - 4088.0 ± 0.3
m
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Last Segment Normalization
• Sven’s near-field calculation– 2 x 2 mm– 8.0 to 8.5 keV– 79 nC– 0.1437 J– 1.090 x 108 Photons
• Simulation– 107 Photons simulated – 7.2 nC
• Scale Monte Carlo by x 10.9 for full pulse
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Spectral Measurements Summary
Fit Centroid
m
Spectral Shift, E/E
From Last Nominal
x 10 -4
From First Nominal
x 10 -4
Last Nominal - 4088.0 ± 0.3 0 ± 1 -2.0 ± 0.8
First Nominal - 4088.81 ± 0.07 2.0 ± 0.8 0.0 ± 0.2
First detuned 10-3
- 4095.87 ± 0.07 19.3 ± 0.8 17.3 ± 0.2
First detuned 10-4
- 4089.19 ± 0.07 2.9 ± 0.8 0.9 ± 0.2
K
K
K
K
K
K
7.1
22
2
2
1
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Expected variations in 1
u
K
2
2
1 2
21K
K
7.1
1
e
e
T
T
2
1
On axis: Effect of changing K But
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Simulation of Last segment full spectra, full angular distribution
Source Energy distribution
E, KeV1050
Even
ts /
0.1
KeV
35,000
30,000
25,000
20,000
15,000
10,000
5,000
0
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Last Segment Full Field Normalization
• Sven’s near-field calculation– 120 x 40 mm– 0.0 to 24687.8 keV– 79 nC– 0.4845 J– 5.274 x 1010 Photons
• Simulation– 107 Photons simulated – 0.015 nC
• Scale Monte Carlo by x 5274 for full pulse
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Observed in scintillator, Last segment, full field
Final XY
Final x, mm3020100-10-20
Fin
al y
, mm
30
20
10
0
-10
-20
Final XY zomm in
Final x, mm543210-1-2-3-4
Fin
al y
, mm
4
2
0
-2
-4
One simulated photon = 5274 real photonsWe expect a signal of 3300 real photons here
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Thin scintillator reduces background by x 7 ± 3
Spectra 5% bw
Final y, micron-4,000-4,100-4,200
Events
/ 2
mic
ron
1
0.8
0.6
0.4
0.2
0
Spectra in Scintillator
Final y, micron-4,000-4,100-4,200
Eve
nts
/ 2 m
icro
n
1
0.8
0.6
0.4
0.2
0
All photons7 photons in simulation37000 ± 14000 in a 79 nC pulse
Photons stopping in scintillator1 photons in simulation5300 ± 5300 in a 79 nC pulse
Conclude backgrounds of 5300 ± 5300 in a 79 nC pulse
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Summary
• Investigated 100 micron aperture FEL Transmission Grating for use in measuring K
• Sensitivities are roughly at the limit of what is needed
• Signal level is too low by at least a factor of 200. • More aperture, say 1.4 x 1.4 mm would help. Larger
focal distance would allow larger periods• Signal:Backgrounds with thin scintillator are at least
1:1• Beam stability and pointing (relative to the 100
micron aperture) will be an issue that is not investigated here
R. M. [email protected] November 14, 2005
UCRL-PRES-XXXXXX
LCLS Beam-Based Undulator K
Measurements Workshop
Monte Carlo used for design of Single Shot 30-70 keV Spectrometer
50
60
70
80
90
100
110
0 100 200 300 400 500
Pxl distance
Sm K40.1 keV
Sm K45.4 keV
E1E2
No filter
25 m Sm filter
Straight-thru bkg
W/SiC bilayers
d = 2 nm
B=0.45 deg
Reflectivity @40 keV > 90% LCLS Monte-
Carlo Simulation