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The top documents of debdeep

Froth Flotation
Froth Flotation
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Processes Encountered in Plastic Industries
Processes Encountered in Plastic Industries
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Polarization Effects in Semiconductors || Theoretical Approach to Polarization Effects in Semiconductors
Polarization Effects in Semiconductors || Theoretical Approach to Polarization Effects in Semiconductors
214 views
Polarization Effects in Semiconductors || Polarization in GaN Based Heterostructures and Heterojunction Field Effect Transistors (HFETs)
Polarization Effects in Semiconductors || Polarization in GaN Based Heterostructures and Heterojunction Field Effect Transistors (HFETs)
223 views
Polarization Effects in Semiconductors || Polarization in Wide Bandgap Semiconductors and their Characterization by Scanning Probe Microscopy
Polarization Effects in Semiconductors || Polarization in Wide Bandgap Semiconductors and their Characterization by Scanning Probe Microscopy
213 views
Partial bitstream protection for low-cost FPGAs with physical unclonable function, obfuscation, and dynamic partial self reconfiguration
Partial bitstream protection for low-cost FPGAs with physical unclonable function, obfuscation, and dynamic partial self reconfiguration
219 views
Boosting Profiled Cache Timing Attacks With A Priori Analysis
Boosting Profiled Cache Timing Attacks With A Priori Analysis
215 views
[IEEE 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Tokyo, Japan (2011.09.29-2011.09.29)] 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography -
[IEEE 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Tokyo, Japan (2011.09.29-2011.09.29)] 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography -
220 views
Mobility in semiconducting graphene nanoribbons: Phonon, impurity, and edge roughness scattering
Mobility in semiconducting graphene nanoribbons: Phonon, impurity, and edge roughness scattering
212 views
[IEEE 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Los Alamitos, CA, USA (2013.08.20-2013.08.20)] 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography
[IEEE 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Los Alamitos, CA, USA (2013.08.20-2013.08.20)] 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography
214 views
Polarization Effects in Semiconductors ||
Polarization Effects in Semiconductors ||
212 views
Electronic transport properties of top-gated epitaxial-graphene nanoribbon field-effect transistors on SiC wafers
Electronic transport properties of top-gated epitaxial-graphene nanoribbon field-effect transistors on SiC wafers
212 views
A comparative study of efficacy of cultured versus non cultured melanocyte transfer in the management of stable vitiligo
A comparative study of efficacy of cultured versus non cultured melanocyte transfer in the management of stable vitiligo
213 views
Performance enhancement of InAlN/GaN HEMTs by KOH surface treatment
Performance enhancement of InAlN/GaN HEMTs by KOH surface treatment
212 views
Tunnel-injection quantum dot deep-ultraviolet light-emitting diodes with polarization-induced doping in III-nitride heterostructures
Tunnel-injection quantum dot deep-ultraviolet light-emitting diodes with polarization-induced doping in III-nitride heterostructures
213 views
[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - On-line testing
[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - On-line testing
212 views
Plasma MBE growth conditions of AlGaN/GaN high-electron-mobility transistors on silicon and their device characteristics with epitaxially regrown ohmic contacts
Plasma MBE growth conditions of AlGaN/GaN high-electron-mobility transistors on silicon and their device characteristics with epitaxially regrown ohmic contacts
218 views
[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Novel logic devices based
[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Novel logic devices based
214 views
Threshold Voltage Control in $\hbox{Al}_{0.72} \hbox{Ga}_{0.28}\hbox{N/AlN/GaN}$ HEMTs by Work-Function Engineering
Threshold Voltage Control in $\hbox{Al}_{0.72} \hbox{Ga}_{0.28}\hbox{N/AlN/GaN}$ HEMTs by Work-Function Engineering
217 views
[IEEE 21st International Conference on VLSI Design (VLSID 2008) - Hyderabad, India (2008.01.4-2008.01.8)] 21st International Conference on VLSI Design (VLSID 2008) - Power Attack Resistant
[IEEE 21st International Conference on VLSI Design (VLSID 2008) - Hyderabad, India (2008.01.4-2008.01.8)] 21st International Conference on VLSI Design (VLSID 2008) - Power Attack Resistant
212 views