velo module metrology
DESCRIPTION
VELO Module Metrology. John Carroll. Alignment in X & Y. Module Metrology. Relative alignments between R and Phi sensors measured on Smartscope (Sms) and CMM show reasonable agreement. Module Metrology. Differences of the above show that Smartscope and CMM - PowerPoint PPT PresentationTRANSCRIPT
VELO Module Metrology
John Carroll
John Carroll – VELO Midterm
review
Alignment in X & Y
John Carroll – VELO Midterm
review
Module Metrology
Si-Si Alignment
-0.060
-0.050
-0.040
-0.030
-0.020
-0.010
0.000
0.010
0.020
0.030
1 3 5 7 9 11 13 15 17 19 21 23
Production Sequence
mm
Sms dX
Sms dY
CMM dX
CMM dY
Relative alignments between R and Phi sensorsmeasured on Smartscope (Sms) and CMM showreasonable agreement
John Carroll – VELO Midterm
review
Smartscope - CMM differences
-0.020
-0.015
-0.010
-0.005
0.000
0.005
0.010
0.015
0.020
1 3 5 7 9 11 13 15
Production Sequence
mm
dX(Smartscope-CMM)
dY(Smartscope-CMM)
Module Metrology
Differences of the above show that Smartscope and CMMagree to +-10 microns, apart from 3 modules (M30,M32,M37)
John Carroll – VELO Midterm
review
Module Metrology
Absolute R Si centre
-0.020
-0.010
0.000
0.010
0.020
0.030
0.040
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
Production sequence
mm LHCb Y
LHCb X
Absolute positions of centre of Si from CMMfor R LHCb x is within 20 micron toleranceLHCb y still needs to be reduced
John Carroll – VELO Midterm
review
Absolute P Si centre
-0.06
-0.04
-0.02
0
0.02
0.04
0.06
0.08
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
Production sequence
mm LHCb Y
LHCb X
Module Metrology
John Carroll – VELO Midterm
review
Relative rotations
-0.150
-0.100
-0.050
0.000
0.050
0.100
0.150
0.200
1 3 5 7 9 11 13 15 17 19 21 23
Prodcution Sequence
mra
d
R-P relative rotationSmartscope
R-P relative rotationCMM
Module Metrology
John Carroll – VELO Midterm
review
d(Rot) Smartscope-CMM
-0.150
-0.100
-0.050
0.000
0.050
0.100
0.150
0.200
1 3 5 7 9 11 13 15
Production Sequence
mra
d d(Rot) Smartscope-CMM
Module Metrology
John Carroll – VELO Midterm
review
Si Rotations from nominal
-0.400
-0.300
-0.200
-0.100
0.000
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
Production Sequence
mra
d Rotation R
Rotation P
Module Metrology
Absolute R and P rotations from CMM. Show a systematic offset from zero of -0.24 mrad. with a standard deviation of 0.06 mrad. Need to bring the systematic down towards zero.
John Carroll – VELO Midterm
review
Silicon AlignmentAverage STD
R to Phi alignment (X,Y) -0.001,-0.003 0.007,0.016
R absolute (X,Y) -0.002,0.016 0.008,0.010
R to Phi rotation (mrad) 0.041 0.044
R absolute (mrad) -0.238 0.059
Module Metrology
John Carroll – VELO Midterm
review
Pedestal Mounts
Module Metrology
John Carroll – VELO Midterm
review
Alignment in Z
John Carroll&
Girish Patel
Module Metrology
John Carroll – VELO Midterm
review
Module Metrology
Top Metrology
-2-1.8-1.6-1.4-1.2
-1-0.8-0.6-0.4-0.2
00.20.40.60.8
11.21.41.61.8
22.22.42.62.8
20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38
Module No
mm
Zmin
Zmax
delZ
Mean tilt
Separation
John Carroll – VELO Midterm
review
Separation
2.1
2.15
2.2
2.25
2.3
2.35
2.4
2.45
2.5
2.55
20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38
Module No
mm
Module Metrology
John Carroll – VELO Midterm
review
Mod met
delt Z
0
0.05
0.1
0.15
0.2
0.25
0.3
20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38
Module No
Twist
John Carroll – VELO Midterm
review
Variation in Tilt
-0.6
-0.4
-0.2
0
0.2
0.4
0.6
20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38
Module No
Mean Tilt
Module Metrology
John Carroll – VELO Midterm
review
Top of Silicon EnvelopeAverage STD
Separation envelope 2.29 0.1
Twist mm 0.02 0.25
Tilt mm 0.08 0.06
Forward edge 1.16 0.27
Rearward edge -1.12 0.23
------------------------------------------------------------------
Envelope Nominal Worst case
Forward 1.15 1.767
Backward -1.15 -1.654
Module Metrology
John Carroll – VELO Midterm
review
Module Metrology
Proposed Constraint System