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1 X-Ray Powder Diffraction and Rietveld Refinement : An Overview Akhilesh Tripathi, PhD Rigaku Americas Corp. The Woodlands TEXAS

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  • 1

    X-Ray Powder Diffraction and

    Rietveld Refinement : An

    Overview

    Akhilesh Tripathi, PhD

    Rigaku Americas Corp.

    The Woodlands

    TEXAS

  • Fundamentals of X-Ray diffraction

    Properties of X-rays

    Crystals & X-ray diffraction

    Powder X-ray diffraction methods

    X-ray diffractometer

  • X-Rays and Crystals Why use X-Rays for crystal structure

    determination

    4.913

    around 0.1nm 1around several hundred nm

    With the naked eye,

    we can see colors and shapes of

    objects.

    We can see

    atoms with X-

    rays.

    Non-destructive

    Accurate atomic distance determination

    Simple instrumentation

  • Properties of X-rays

  • What are X-rays?

    X-rays are short wavelength electromagnetic waves.

    Wilhelm Conrad Roentgen discovered X-Rays in 1895

    10-2 1 102 104 106 108 1010 1012

    10-3 10-1 101 103 105 107 109 1011 nm

    Micro waveShort wave

    Long waveinfrared

    visible lightUltraviolet

    Soft X-Rays

    Gamma

    Rays

    Hard X-Rays

  • Properties of X-rays

    X-Rays are a type of electromagnetic wave.

    -rays are generated by nuclear reactions.

    X-Rays are generated by energy transitions that happen when electrons hit a target.

    An X-ray has a dual wave-particle character.

    As a wave motion: showing the diffraction phenomenon.

    As a particle: behaving as a particle that has an energy inversely proportional to its wavelength.

    E 12.4E energykeVwavelength

  • Properties of X-rays

    Fluorescent behavior

    Emitting visible light: scintillation counter( NaI.)

    Ionization behavior

    Generating positive and negative ions:proportional

    counter, position sensitive proportional counter.

    The refractive index is nearly equal to 1

    Not focused through a lens by refraction.

    Showing total reflection at very small incident angles.

    High penetrating power

    Going through many materials due to high energy.

  • Generation of X-rays

    X-rays are generated when electrons accelerated by high voltage from the filament bombard a target.Cu is commonly used for the target material.

    Almost all of the energy from the electrons is transformed into heat, and a small amount of the energy into X-rays.

    High voltage

    Filament TargetX-rays

    Electrons

    Generation efficiency 1.110-9ZV Cu 0.1%Zatomic number of a target material applied voltage

    V

  • Principle of X-ray Generation

    Characteristic X-rays are produced when an outer orbital electron falls into a vacancy in the K-shell created when high speed electrons eject an inner electron.

    L1

    K

    K1

    K2

    L-shell

    electron -shell electron

    shell

    shell shell

    0

    1

    2

    3

    4

    5

    6

    7

    8

    0. 3 0. 5 0. 7 0. 9

    Mo

    K K

    Wavelength()

  • Absorption coefficient

    When X-rays pass through a thickness X cm , the

    intensity of the X-rays decrease from I0 to I.

    Linear absorption coefficientcm-1/Mass absorption coefficient cm2/g Density (g/cm3)

    II0 expx Beer-Lambert formula

    I0 I

    x cm

  • Mass absorption coefficient of compounds

    The Mass absorption coefficient of a compound, mixture, or liquid that consists of more than two elements is calculated as below.

    /WA/AWB/B WAWB AB weight percent of elementWAWB1

    ex. :TiO2 CuKTi/200 atomic weight47.9O/11.5 atomic weight16.0

    /TiO2 124.547.9200 16.0211.5

    47.916.02 47.916.02

  • 12

    X-ray & materials interaction

    X-raysTransmission x-rays

    (EXAFS, XANES)

    Scattered x-rays

    (XRD, XRR, SAXS)

    Fluorescent x-rays

    (XRF)

    Electrons (XPS)

    Heat

    Analysis techniques using x-rays as the incident beam

    1. Introduction

  • 13

    Diffraction condition

    Incident x-ray

    Scattered x-ray

    dhkl

    ...)3,2,1(,sin2 == nnd hkl

  • Interference

    In phase constructive

    Out of phase destructive

  • Crystals & X-ray diffraction

  • What is a crystal

    A crystal is defined as a solid composed of atoms

    arranged in a periodic pattern in three

    dimensions.

  • Unit cell

    The ideal crystal has the atomic arrangement in a

    pattern periodic in three dimensions.

    The smallest repeating unit is called a unit cell.

    A unit

    cell

    Primitive

    unit cell

    Non-primitive

    unit cell

  • Lattice constants

    c

    a

    b

  • cubic abc primitive 90 body-centered

    face-centered

    tetragonal abc primitive 90 body-centered

    orthorhombic abc primitive 90 body-centered

    base-centered face-centered

    rhombohedral abc primitive trigonal or 90hexagonal abc primitive

    90 120

    monoclinic abc primitive 90 base-centered

    triclinic abc primitive 90

  • Miller indices

    The lattice plane is defined by the three integer

    numbers (h k l), which are called miller indices.

    The distance between two lattice planes is called a

    lattice spacing.

    Miller index (hkl)

    Lattice plane

    1/h

    1/l

    1/kb/k

    a/h

    c/l

  • Miller indices

    c/l (2/3)

    b/k (1/2)

    a/h (2/3)a/h (0/0)

    b/k (1/1)

    c/l (0/0)

    (343)

    (010)

    a

    b

    c

  • Examples of the Miller indices

    a

    b

    c

    (111) (110) (010)

    (010)

    Lattice planes and lattice spacing

  • Examples of the Miller indices

  • Powder X-ray diffraction method

  • The principle of the Powder X-ray

    Diffraction

    The PXD covers powder crystals or polycrystalline

    aggregates.

    2

    2

    Incident X-ray

    Debye ring

    Powder sample

  • 26

    What does a powder really means?

    Single Oriented Random

  • Crystalline size & debye ring

    very small

    Less than 0.1m

    Preferred orientation

    small

    10mbig

    50mSingle crystal

  • Measured data

    0

    2040

    6080

    100120

    140

    15 25 35 45 55 65 75 85

    2 ( )

  • 29

    Diffraction by crystalline materials

    Small crystallitesLarge crystallites

    Random powderAmorphous

    Para-crystal (type 1) Para-crystal (type 2)

  • 30

    Diffraction pattern

    Diffraction angle 2

    Inte

    nsity

    Gas

    Liquid

    Amorphous

    Crystal

    Diffraction angle 2

    Inte

    nsity

    Diffraction angle 2

    Inte

    nsity

  • X-ray Diffractometer

  • Key Components

    X-ray

    Wavelength

    Intensity

    Optics

    Geometry,

    Monochromator, etc.

    Sample

    Crystal structure,

    Crystal quality, etc.

    Detector

    Energy resolution

    Efficiency

  • Instrument

    Goniometer

    sample

    counter

    X-ray Generator

    Water Supply

    X-ray Tube

    High Voltage Generator

    Display

    Data output

    electronic circuit

    panel

    Control/Data

    Processing Unit

    Computer

  • Detector

    Interactions between X-rays and some materials are

    used to detect diffracted x-rays.

    Position Sensitive Proportional Counter

    Solid State Detector

    Scintillation Counter

    Imaging Plate

    Photosensitivity Photofilm

    Scintillation effect

    Ionization effect

  • Scintillation counter

    This is the counter which uses a luminescent material called the scintillator.

    X-ray

    anode

    BeNaI crystal

    Photomultiplier tube

    photocathode

    pulse

    lightphotomultipliers

    electron

  • 2sample

    X-ray diffractionX-ray source

    counter

    Incident X-ray

    Principle of Focusing method

    Bragg-Brentano focusing method

    Well-known optical system that shows high intensity and peak resolution.

    - The X-ray source, the sample, and the receiving slit must

    be on the focusing circle.

    - The sample must be equidistant from the source and the

    receiving slit.

    - The 2- scanning mechanism is needed.

  • Diffraction Pattern

  • 38

    Anatomy of diffraction pattern

    - Sample -

    Peak positions

    d values > Phase ID

    Lattice parameter

    d shift > Residual stress

    Solid solution

    Peak positions

    d values > Phase ID

    Lattice parameter

    d shift > Residual stress

    Solid solution

    Intensity vs. Orientation

    Preferred orientation

    Fiber structure

    Pole figure

    Intensity vs. Orientation

    Preferred orientation

    Fiber structure

    Pole figureFWHM

    Crystal quality

    Crystallite size

    Lattice distortion

    FWHM

    Crystal quality

    Crystallite size

    Lattice distortion

    Scattering Angle [deg.]

    Inte

    nsity

    Integrated Int.

    of amorphous

    Integrated Int.

    of crystal

    > Qualitative analysis

    Integrated Int.

    of amorphous

    Integrated Int.

    of crystal

    > Qualitative analysis

    Crystallinity

  • 39

    Peak positions

    Wavelength

    Systematic errors

    Peak positions

    Wavelength

    Systematic errors

    Intensity vs. Orientation

    Irradiati