zo tester collin wells. original zo tester original aol circuit

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Zo Tester Collin Wells

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Page 1: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Zo Tester

Collin Wells

Page 2: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Original Zo Tester

Page 3: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Original AOL Circuit

-

++

4

3

5

1

2

U1 OPA376

V1 2.5

V2 2.5

R2 100kR1 100k

R3

100

R4

100k

C1 100u+

Vout

Vreference

Vtest

VM

Aol = 1000 (Vtest/Vreference)

Page 4: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Original AOL Circuit Limitations

• #1 DUT Zo and feedback resistor form resistor divider causing errors.

• #2 DUT is not AC Coupled causing errors in the AOL curve.

• #3 Not capable of 50Ohm Drive

Page 5: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of AOL Limitations #1• DUT Zo Causing Errors

T

VM

Vreference

Vtest

Frequency (Hz)

1 10 100 1k 10k 100k 1M 10M

Ga

in (

dB

)

-140

-120

-100

-80

-60

-40

-20

0

VM

Vtest

Vreference

This region should continue to roll off at -20dB/decade

Page 6: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

T

Computed Aol

Frequency (Hz)

1 10 100 1k 10k 100k 1M 10M

Ga

in (

dB

)

0

20

40

60

80

100

120

140

Computed Aol

Example of AOL Limitation #1• DUT Zo Causing Errors

Page 7: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

R1 100kR

4 10

0kR

3 10

0R2 100k

Ro 200

V1 1

Vtest

VM

Vreference

Vtest limitation at high frequency due to

Ro and values of R1, R2, R3, R4

Minimum Gain at High Frequency:

Vtest/V1 = 20 log (Vout) for V1 = 1

For R1=R2=R4=100k, R3=100 --> -63.53dB

Explanation of AOL Limitation #1• DUT Zo Causing Errors

Page 8: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

-

++

4

3

5

1

2

U1 OPA376

V1 2.5

V2 2.5

R2 100kR1 100k

R3

100

R4

100k

C1 100u+

Vout

Vreference

Vtest

VM

-

+

-

+VCVS1 1

Aol = 1000 (Vtest/Vreference)

Solution to AOL Limitation #1• DUT Zo Causing Errors

Page 9: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

T

VM

Vreference

Vtest

Frequency (Hz)

1 10 100 1k 10k 100k 1M 10M

Vo

ltag

e (

V)

-140

-120

-100

-80

-60

-40

-20

0

Vtest

Vreference

VM

Solution to AOL Limitation #1• DUT Zo Causing Errors

Page 10: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

T

Computed Aol

Frequency (Hz)

1 10 100 1k 10k 100k 1M 10M

Ga

in (

dB

)

-20

0

20

40

60

80

100

120

140

Computed Aol

Solution to AOL Limitation #1• DUT Zo Causing Errors

Page 11: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Solution to AOL Limitation #1• DUT Zo Causing Errors

– Actual Implementation

+Vbuffer

-Vbuffer

+Vbuffer -Vbuffer

-

++

4

3

5

1

2

U1 OPA376

V1 2.5

V2 2.5

R2 100kR1 100k

R3

100

R4

100k

C1 100u

+

Vout

Vreference

Vtest

VM

-

+ + U2 ths4631

R9 499

R10 499

R11 49.9

C4 8p

R5 49.9

V3 15 V4 -15

R6

49.9

Aol = 1000 (Vtest/Vreference)

+6dB

-6dB

Page 12: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Solution to AOL Limitation #1• DUT Zo Causing Errors

– Actual Implementation

T

Frequency (Hz)

1.00 10.00 100.00 1.00k 10.00k 100.00k 1.00M 10.00M 100.00M 1.00G

Ga

in (

dB

)

-40.00

-20.00

0.00

20.00

40.00

60.00

80.00

100.00

120.00

140.00

Page 13: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of AOL Limitation #2• DUT not AC coupled

– Even small offsets in the DUT Vcm away from (Vcc(+) - Vcc(-))/2 result in degradation of AOL at low frequencies

101

102

103

104

105

106

107

108

-40

-20

0

20

40

60

80

100

120

140

Frequency (Hz)

dB

Aol

-0.25V Offset

Page 14: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

101

102

103

104

105

106

107

108

-40

-20

0

20

40

60

80

100

120

140

Frequency (Hz)

dB

Aol

Example of AOL Limitation #2• DUT not AC coupled

– Even small offsets in the DUT Vcm away from (Vcc(+) - Vcc(-))/2 result in degradation of AOL at low frequencies

-0.5V Offset

Page 15: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

101

102

103

104

105

106

107

108

-40

-20

0

20

40

60

80

100

120

140

Frequency (Hz)

dB

Aol

Example of AOL Limitation #2• DUT not AC coupled

– Even small offsets in the DUT Vcm away from (Vcc(+) - Vcc(-))/2 result in degradation of AOL at low frequencies

-1V Offset

Page 16: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

101

102

103

104

105

106

107

108

-40

-20

0

20

40

60

80

100

120

140

Frequency (Hz)

dB

Aol

Example of AOL Limitation #2• DUT not AC coupled

– Even small offsets in the DUT Vcm away from (Vcc(+) - Vcc(-))/2 result in degradation of AOL at low frequencies

-1.5V Offset

Page 17: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

101

102

103

104

105

106

107

108

-60

-40

-20

0

20

40

60

80

100

120

140

Frequency (Hz)

dB

Aol

Example of AOL Limitation #2• DUT not AC coupled

– Even small offsets in the DUT Vcm away from (Vcc(+) - Vcc(-))/2 result in degradation of AOL at low frequencies

Railed

Page 18: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of AOL Limitation #2• DUT not AC coupled

– Although overall AC gain is “1”, DC Gain is 1+((100k+100k))/100 = ~2000V/V– Therefore any part with a Vos of >1.25mV will rail.

R2 100k

R3

100

R4

100k

Vreference

Vtest

VM

R1 100k

+

Vout

V3 1.25m

-

+

IOP1

Cap @ DC

1.25mV

2.5V

1.25V

Page 19: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Solution to AOL Limitation #2• DUT not AC coupled

– AC Couple the DUT with a 100uF capacitor. This will reduce the overall system offset to just the Vos of the DUT.

– It will require time when the system initially starts up for the cap to charge and cancel out the offset.

R2 100k

R3

100

R4

100k

Vreference

Vtest

VM

R1 100k

+

Vout

V3 1.25m

-

+

IOP1

Cap @ DC

C1 100u

1.25mV

1.25mV

1.25mV

Page 20: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of AOL Limitation #3• Not Capable of 50 Ohm Drive

High-Z Node

+Vbuffer

-Vbuffer

+Vbuffer -Vbuffer

-

++

4

3

5

1

2

U1 OPA376

V1 2.5

V2 2.5

R2 1MR1 1M

R3

1kR

4 10

k

C1 100u

+

Vout

Vreference

Vtest

VM

-

+ + U2 ths4631

R9 499

R10 499

R11 49.9

C4 8p

R5 49.9

V3 15 V4 -15

R6

49.9

C2

100u

Aol = R4/R3 (Vtest/Vreference)

+6dB

-6dB

Page 21: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Final AOL Circuit

+Vbuffer

-Vbuffer

+Vdut

-Vdut

+Vdut -Vdut

+Vbuffer -Vbuffer

+Vbuffer

-Vbuffer

-

++

4

3

5

1

2

U1 OPA376

R2 1MR1 1MC1 100u

+

Vout

VM

Vreference

R3

10k

R4

1k

C2

100u

R5 499

R6 499

-

+ + U2 ths4631

R9 499

R10 499

R11 49.9

R12 49.9

R7

49.9

V1 2.5 V2 -2.5

V3 15 V4 -15

-

+ + U3 ths4631

C4 8p

C3 8p

C5

28p

VF1

R8

49.9

C6

28p

R13 499

Aol = (R3/R4) (Vtest/Vreference)

Gain/Phase Analyzer

50R Termination +

Shunt Input Cap

+6dB

-6dB

Gain/Phase Analyzer

50R Termination +

Shunt Input Cap-6dB

+6dB

Page 22: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Final AOL Circuit ResultsT

Frequency (Hz)

100.00m 1.00 10.00 100.00 1.00k 10.00k 100.00k 1.00M 10.00M 100.00M 1.00G

Gai

n (d

B)

-60.00

-40.00

-20.00

0.00

20.00

40.00

60.00

80.00

100.00

120.00

140.00

160.00

Page 23: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Final AOL Circuit ResultsT

Frequency (Hz)

100.00m 1.00 10.00 100.00 1.00k 10.00k 100.00k 1.00M 10.00M 100.00M 1.00G

Gai

n (d

B)

-60.00

-40.00

-20.00

0.00

20.00

40.00

60.00

80.00

100.00

120.00

140.00

160.00

High-Pass Effects ofAC Coupling CapFc = 1/2πRC

Effects of DUT Cin andZo of Buffer Circuits

Page 24: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Final AOL Circuit Results

101

102

103

104

105

106

107

108

-40

-20

0

20

40

60

80

100

120

140

Frequency (Hz)

dB

Aol

Page 25: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Final AOL Circuit Limitations

Page 26: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Final AOL Circuit Limitations

Page 27: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Final AOL Circuit Limitation Partial Fix

+Vbuffer

-Vbuffer

+Vdut

-Vdut

+Vdut -Vdut

+Vbuffer -Vbuffer

+Vbuffer

-Vbuffer

-

++

4

3

5

1

2

U1 OPA376

R2 100kR1 100kC1 100u

+

Vout

VM

Vreference

R3

100k

R4

1k

C2

100u

R5 499

R6 499

-

+ + U2 ths4631

R9 499

R10 499

R11 49.9

R12 49.9

R7

49.9

V1 2.5 V2 -2.5

V3 15 V4 -15

-

+ + U3 ths4631

C4 8p

C3 8p

C5

28p

VF1

R8

49.9

C6

28p

Aol = (R3/R4) (Vtest/Vreference)

Gain/Phase Analyzer

50R Termination +

Shunt Input Cap

+6dB

-6dB

Gain/Phase Analyzer

50R Termination +

Shunt Input Cap-6dB

+6dB

False SummingJunction Gain Changed to 40dB

Change to 100k

Page 28: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Final AOL Circuit Limitation Partial Fix

Page 29: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Final AOL Circuit Results

Page 30: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Original Zout Circuit

V+

V-V-

V+

-

+ +U1: DUT

RG1

RF1

RS1

R1 50

V-

V+

C4 100u

+

Voutput

+-

C5 10u

+-

C6 10u

Vtest

Vreference

RNI1 0

I

I=Vref-Vtest

RS1

Zout=Vtest

I=

RS1Vtest

Vref-Vtest

Page 31: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Original Zout Circuit Limitations

• Not capable of 50 Ohm Drive• DUT is not AC Coupled so DC errors occur• Instrument output gets divided down by

parallel combination of 50 Ohm termination resistor and RS in series with DUT Zo.

• System noise floor corrupts low-frequency data

Page 32: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of Zout Limitation• DUT not AC Coupled

– Zout test based on the fact that both FETs in the output stage need to be biased to mid-supply with ½ Iab flowing through them.

V+

V-V-

V+

-

+ +U1: DUT

RG1

RF1

RS1

R1 50

V-

V+

C4 100u

+

Voutput

+-

C5 10u

+-

C6 10u

Vtest

Vreference

RNI1 0

I

I=Vref-Vtest

RS1

Zout=Vtest

I=

RS1Vtest

Vref-Vtest

Page 33: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Solution to Zout Limitation• DUT not AC Coupled

– AC Couple the Zout circuit with a 100uF Capacitor

+Vdut

-Vdut

C1 100u

+

Vout

R2 4.99k

R3 100k

R4 499 C2 100u

-

++

4

3

5

1

2

U1 OPA376

Page 34: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of Zout Limitation• Divided down Instrument Output

– Although this issue does not cause errors in the measurement system it does limit the amount of signal that we inject into the DUT therefore limiting the output of the test.

+Vdut

-Vdut

+

Vout

RS 75

R3 100k

R4 499 C2 100u

R1

49.9 Zout 10

-

++

DUT

Page 35: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of Zout Limitation• Divided down Instrument Output

– Although this issue does not cause errors in the measurement system it does limit the amount of signal that we inject into the DUT therefore limiting the output of the test.

RS = 80600

101

102

103

104

105

106

107

108

0

0.2

0.4

0.6

0.8

1

1.2

1.4

1.6

1.8

2

Frequency (Hz)

Out

put

Vol

tage

(V

)

Gain-Phase Analyzer Output

Page 36: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of Zout Limitation• Divided down Instrument Output

– Although this issue does not cause errors in the measurement system it does limit the amount of signal that we inject into the DUT therefore limiting the output of the test.

RS = 4990

101

102

103

104

105

106

107

108

0

0.2

0.4

0.6

0.8

1

1.2

1.4

1.6

1.8

2

Frequency (Hz)

Out

put

Vol

tage

(V

)

Gain-Phase Analyzer Output

Page 37: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of Zout Limitation• Divided down Instrument Output

– Although this issue does not cause errors in the measurement system it does limit the amount of signal that we inject into the DUT therefore limiting the output of the test.

RS = 698

101

102

103

104

105

106

107

108

0

0.2

0.4

0.6

0.8

1

1.2

1.4

1.6

1.8

2

Frequency (Hz)

Out

put

Vol

tage

(V

)

Gain-Phase Analyzer Output

Page 38: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of Zout Limitation• Divided down Instrument Output

– Although this issue does not cause errors in the measurement system it does limit the amount of signal that we inject into the DUT therefore limiting the output of the test.

RS = 80.6

101

102

103

104

105

106

107

108

0

0.2

0.4

0.6

0.8

1

1.2

1.4

1.6

1.8

2

Frequency (Hz)

Out

put

Vol

tage

(V

)

Gain-Phase Analyzer Output

Page 39: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Solution to Zout Limitation• Divided down Instrument Output

– 50 Terminate the gain/phase analyzer output and send into the input of a THS4631 high-speed amplifier.

+Vdut

-Vdut

+Vbuffer -Vbuffer

+Vbuffer

-Vbuffer

R3 100k

R4 499 C2 100u

R1 24.9

Zout 10

-

++

DUTC1 100u

+

VG1

V3 15 V4 -15

R2 499

R13 499

-

+ + U4 ths4631

C7 8p

R5 75

R6 24.9

Vtest

Vreference

+6dB

-6dB

Page 40: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Solution to Zout Limitation• Divided down Instrument Output

– 50Ohm Terminate the gain/phase analyzer output and send into the input of a THS4631 high-speed amplifier.

RS = 80600

101

102

103

104

105

106

107

108

0.5

1

1.5

2

2.5

3

Frequency (Hz)

Out

put

Vol

tage

(V

)

Gain-Phase Analyzer Output

Page 41: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Solution to Zout Limitation• Divided down Instrument Output

– 50Ohm Terminate the gain/phase analyzer output and send into the input of a THS4631 high-speed amplifier.

RS = 4990

101

102

103

104

105

106

107

108

0.5

1

1.5

2

2.5

3

Frequency (Hz)

Out

put

Vol

tage

(V

)

Gain-Phase Analyzer Output

Page 42: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Solution to Zout Limitation• Divided down Instrument Output

– 50Ohm Terminate the gain/phase analyzer output and send into the input of a THS4631 high-speed amplifier.

RS = 698

101

102

103

104

105

106

107

108

0.5

1

1.5

2

2.5

3

Frequency (Hz)

Out

put

Vol

tage

(V

)

Gain-Phase Analyzer Output

Page 43: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Solution to Zout Limitation• Divided down Instrument Output

– 50Ohm Terminate the gain/phase analyzer output and send into the input of a THS4631 high-speed amplifier.

RS = 80.6

101

102

103

104

105

106

107

108

0.5

1

1.5

2

2.5

3

Frequency (Hz)

Out

put

Vol

tage

(V

)

Gain-Phase Analyzer Output

Page 44: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of Zout Limitation• Zo Circuit not capable of 50 Ohm Drive

– 50Ohm termination on Vreference re-creates the previous problem of dividing down the input signal amplitude.

– 50Ohm on Vtest adds DC load to the DUT, which will affect Zo.

+Vdut

-Vdut

+Vbuffer -Vbuffer

+Vbuffer

-Vbuffer

R3 100k

R4 499 C2 100u

R1 24.9

Zout 10

-

++

DUTC1 100u

+

VG1

V3 15 V4 -15

R2 499

R13 499

-

+ + U4 ths4631

C7 8p

R5 75

R6 24.9

Vtest

Vreference

+6dB

-6dB

Page 45: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Solution to Zout Limitation• Zo Circuit not capable of 50 Ohm Drive

– Add THS4631 buffers to both Vreference and Vtest nodes.

+Vdut

-Vdut

+Vdut -Vdut

+Vbuffer -Vbuffer

+Vbuffer

-Vbuffer

+Vbuffer

-Vbuffer

+Vbuffer

-Vbuffer

C1 100u

+

Vout

VreferenceR5 499

R6 499

R12 49.9

R7

49.9

V1 2.5 V2 -2.5

V3 15 V4 -15

-

+ + U3 ths4631

C3 8p

C5

28p

VF1

R8

49.9

C6

28p

R1 499

R13 499

-

+ + U4 ths4631

C7 8p

-

+ + U2 ths4631

R9 499

R10 499

R11 49.9

C4 8p

R2 4.99k

R3 100k

R4 499 C2 100u

-

++

4

3

5

1

2

U1 OPA376

Gain/Phase Analyzer

50R Termination +

Shunt Input Cap

+6dB

-6dB

Gain/Phase Analyzer

50R Termination +

Shunt Input Cap-6dB

+6dB

+6dB

Page 46: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of Zout Limitation• Noise corrupts low-frequency data

– Zout = Zo/(1+AOLB) so at low frequencies when AOLB is still large Zout gets very small and when we measure using Vtest = Ibackdrive*Zout the signal is smaller than the system noise.

– Although this issue affects every part measured, there are two types of op-amps that cause the most problems, both cause issues due not being able to create a large enough voltage to measure (V=IR):

• 1 – Small I – Ultra-Low-Power Op-Amps. Since we have to backdrive with Iab/2 we are very limited on our backdrive current when the quiescent current of the part is in the <100uA.

• 2 – Small R - Power Op-Amps with very low Zo. After dividing down by Loop Gain the Zout is in the sub 1-Ohm range and we can still only backdrive with Iab/2.

Page 47: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of Zout Limitation• Noise corrupts low-frequency data

• OPA333

101

102

103

104

105

106

107

108

100

101

102

103

104

Frequency (Hz)

Impe

danc

e

Zout

101

102

103

104

105

106

107

108

-40

-20

0

20

40

60

80

100

Frequency (Hz)

dB

Aol

101

102

103

104

105

106

107

108

101

102

103

104

Frequency (Hz)

Impe

danc

e

Zo

Data hit noise floor on Zout Measurement

Data invalid for Zo calculation below 1kHz

Page 48: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of Zout Limitation• Noise corrupts low-frequency data

• OPA333

Zo does not go capacitiveUntil ~10Hz

Page 49: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

101

102

103

104

105

106

107

108

10-1

100

101

102

Frequency (Hz)

Impe

danc

e

Zout

101

102

103

104

105

106

107

108

-20

0

20

40

60

80

100

120

Frequency (Hz)

dB

Aol

101

102

103

104

105

106

107

108

100

101

102

103

104

Frequency (Hz)

Impe

danc

e

Zo

Example of Zout Limitation• Noise corrupts low-frequency data

• OPA564

Data hit noise floor on Zout Measurement

Data invalid for Zo calculation

Page 50: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Example of Zout Limitation• Noise corrupts low-frequency data

• OPA564

Zo does not go capacitiveUntil ~60Hz

Page 51: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

101

102

103

104

105

106

107

108

10-1

100

101

102

Frequency (Hz)

Impe

danc

e

Zout

101

102

103

104

105

106

107

108

-20

0

20

40

60

80

100

120

Frequency (Hz)dB

Aol

101

102

103

104

105

106

107

108

100

101

102

103

104

Frequency (Hz)

Impe

danc

e

Zo

Other Zout Issues• Data has a “hump” at the frequency where

the part runs out of Loop Gain.

OPA564Gain = 55dBF = 20kHz

Hump in data at 20kHz

Page 52: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

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Other Zout Issues• Data has a “hump” at the frequency where

the part runs out of Loop Gain.

OPA564Gain = 40dBF = 110kHz

Hump in data at 110kHz

Page 53: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Other Zout Issues• Data has a “hump” at the frequency where

the part runs out of Loop Gain.

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OPA552Gain = 42dBF = 90kHz

Hump in data at 90kHz

Page 54: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

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Other Zout Issues• Data has a “hump” at the frequency where

the part runs out of Loop Gain.

OPA344Gain = 40dBF = 10kHz

Hump in dataAt 10kHz

Page 55: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Other Zout Issues• Data has a “hump” at the frequency where

the part runs out of Loop Gain.

OPA364Gain = 46dBF = 40kHz

Hump in dataAt 40kHz

Page 56: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Areas for Future Research

• Increasing Back-Drive Current

• Measuring “DC Zo” – Marek Lis

Page 57: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Areas for Future Research• Increasing Back-Drive Current

– Still struggling to get enough “V” in the V=IR equation, so increase I and test the results.

OPA376RS – 4990I = Iab/2

Hi-F Zo= 200Ohms

Data Valid until500Hz

Page 58: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Areas for Future Research• Increasing Back-Drive Current

– Still struggling to get enough “V” in the V=IR equation, so increase I and test the results.

OPA376RS – 1150I ~ Iab/2*5

Hi-F Zo= 190Ohms

Data Valid until300Hz

Page 59: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Areas for Future Research• Increasing Back-Drive Current

– Still struggling to get enough “V” in the V=IR equation, so increase I and test the results.

OPA376RS – 576I ~ Iab/2*10

Hi-F Zo= 150Ohms

Data Valid until100Hz

Page 60: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Areas for Future Research• Increasing Back-Drive Current

– Still struggling to get enough “V” in the V=IR equation, so increase I and test the results.

OPA364RS – 3570I = Iab/2

Hi-F Zo= 200Ohms

Page 61: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Areas for Future Research• Increasing Back-Drive Current

– Still struggling to get enough “V” in the V=IR equation, so increase I and test the results.

Hi-F Zo= 180Ohms

OPA364RS – 825I ~ Iab/2*5

Page 62: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Areas for Future Research• Increasing Back-Drive Current

– Still struggling to get enough “V” in the V=IR equation, so increase I and test the results.

Hi-F Zo= 120Ohms

OPA364RS – 412I ~ Iab/2*10

Page 63: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Areas for Future Research• Issues with Increasing Back-Drive Current

– The reduction in the Zo values when the back-drive current is increased is not predictable. Unlike adding a DC load, the “AC Loaded” Zo results do not decrease at 1/(gm*I) for BJT or 1/sqrt(k*Id) for MOS.– There also does not appear to be any correlation between the decrease in Zo value from one part to the next.

Page 64: Zo Tester Collin Wells. Original Zo Tester Original AOL Circuit

Areas for Future Research• Measuring “DC Zo”

– Would be a method to get a low-frequency intercept point so we could interpolate between the areas where the current Zo tester runs into noise issues. – Method entails measuring AOL with and without a DC load and then calculating the Zo based on the difference between the two AOL values.