a 1.8 v low power 5 gbps pmos-based lvds output driver with good return loss performance
TRANSCRIPT
A 1.8 V low power 5 Gbps PMOS-based LVDS output driverwith good return loss performance
Hazem W. Marar • Khaldoon Abugharbieh •
Abdel-Karim Al-Tamimi
Received: 23 July 2013 / Revised: 25 October 2013 / Accepted: 3 November 2013 / Published online: 19 November 2013
� Springer Science+Business Media New York 2013
Abstract This paper presents a novel design topology of
a 5 Gbps PMOS-based low voltage differential signaling
(LVDS) voltage mode output driver. The topology is
designed to meet the requirements of low power con-
sumption and high data rates applications. The driver
consists of an output stage and a pre-driver stage where the
driver’s swing and common-mode output voltage are set.
The pre-driver and the output stage consume only
13.1 mW of power at 5 Gbps speed while operating from a
1.8 V voltage supply. Further, the design achieved -21 dB
return loss performance at DC. The driver was extracted
and simulated using Mentor Graphics CAD tools and
implemented in 180 nm CMOS technology. The output
signal is fully compliant with the LVDS standard output
swing and common-mode voltage specifications.
Keywords Low-voltage-differential-signaling
(LVDS) � Low power � Transmit driver � High speed
1 Introduction
With the recent rapid increase in high-speed applications
and the ever-increasing performance demands on commu-
nication systems, higher data rates and processing speeds
are required. In the past, high-speed transmission was
achieved by parallel processing and pipelining. However,
with the increasing challenges related to the complexity
and cost for the IC packaging and the printed circuit boards
fabrication, design engineers are required to focus on
enhancing the performance of serial signal transmission.
Nevertheless, as the speed of data transmission increases,
challenges related to signal integrity and power consump-
tion become more significant. When transmitting data at
high speed along a communication channel, the signal will
suffer from attenuation and reflection. Therefore, the bit
error rate of the system may increase to un-acceptable
levels. To overcome this problem, most of the present high-
speed data transmission topologies consume a significant
amount of power to meet the minimum signal integrity
requirements.
One popular high-speed and low power standard used
for point-to-point short-range data transmission is low
voltage differential signaling (LVDS) [1–4]. It is defined in
two separate industry standards: the generic electrical layer
standard ANSI/TIA/EIA-644-1995 created by the tele-
communication industry association—electronic industry
association [1] and the IEEE 1596.3-1996 specific standard
that is based on the physical layer defined for the scalable
coherent interface (SCI) [2]. As in most point-to-point data
communication systems, an LVDS data transfer system
consists of a transmitter, a receiver, and a transmission
media. Per the standard, the transmitter’s output signal
should have a common-mode voltage between 1.125 and
1.375 V, and an amplitude swing between 250 and 450 mV
[1–5]. These relatively low voltage swing requirements
enable LVDS to consume less power compared to other
signaling standards. Since data is sent differentially, the
LVDS standard combines the ability to deliver high data
rates while consuming low power with high noise immu-
nity and low electromagnetic interference (EMI) [3–5].
Further, the standard increases the interface’s tolerance to
H. W. Marar (&) � K. Abugharbieh
Electrical Engineering Department, Princess Sumaya University
for Technology, Amman, Jordan
e-mail: [email protected]
H. W. Marar � A.-K. Al-Tamimi
Computer Engineering Department, Yarmouk University, Irbid,
Jordan
123
Analog Integr Circ Sig Process (2014) 79:1–13
DOI 10.1007/s10470-013-0224-6
ground mismatch between the transmitter and the receiver
[4, 5]. Therefore, these properties enable LVDS based ICs
to deliver data in high frequencies while offering accept-
able signal-to-noise ratios.
To maintain the integrity of the transmitter’s output
signal and to minimize its return loss throughout the media
channel, the transmit driver needs to provide an internal
differential impedance (ZTx) that matches the transmission
line differential impedance (2 9 Zo). The single-ended line
impedance (Zo) is typically designed to be 50 X [5].
Equation 1 describes the differential return loss throughout
the media channel in dB. The return loss is a measure of the
signal that is reflected back to the source, when a signal is
incident at the beginning of the channel.
Return loss ðdBÞ ¼ 20 log2� Zo � ZTxj j2� Zo þ ZTx
� �ð1Þ
If a transmit driver impedance, ZTx, is matched to 100 X,
the return loss defined in Eq. (1) should be (-?). This
means that no portion of the signal is reflected back to the
transmitter. However, practically, having a return loss
performance below -15 dB is considered acceptable in
most wire-line integrated circuits [6].
Since NMOS devices are faster [7], most current LVDS
transmit drivers use them to improve the transmission
speed. NMOS and PMOS FETs differ in the voltages that
turn on the device and the elements used to dope the sili-
con. Mainly, semiconductor materials such as silicon are
not good conductors. Therefore, to improve conductivity,
they should be doped with other elements that contain extra
electrons like Phosphorous (n-type) or elements missing
electrons (holes) like Boron (p-type). Having an n-type
source and drain, NMOS devices need a positive voltage at
the gate to repel the holes from the body and form a
channel. On the other hand, PMOS devices need a low
voltage at the gate to repel the electrons from the body and
form a p-type channel between the source and the drain [7].
Having the mobility of the electrons twice the holes, a
PMOS device should be designed to have twice the size of
an NMOS device to get the same current. Despite that, the
proposed driver uses a PMOS-based architecture. As sim-
ulation results will show, a PMOS-based topology will
address supply voltage headroom issues. This paper intro-
duces a novel topology of a low power PMOS-based
voltage mode LVDS output driver. The driver can operate
from a 1.8 V supply while supporting switching speeds up
to 5 Gbps. The driver can be used for high-speed serial data
transmission while consuming low power.
This paper is organized as follows: section II illustrates
the basic method of operation of common LVDS transmit
drivers. Section III describes the operation and signal flow
of the proposed design and its methodology. Simulation
results of the driver are demonstrated in section IV. Section
V concludes the paper and compares the proposed design
performance to other published work.
2 LVDS transmit drivers
LVDS is considered a popular differential signaling standard
and is widely used in low-power high-speed industrial
applications [1–4]. The standard was created to address data
communications, and server and computer peripherals. For
example, LVDS is extensively used in multimedia applica-
tions for transmitting video data from graphical processing
units to the flat panel displays in laptops and digital cameras
[8]. Further, LVDS is widely used in high performance
analog-to-digital converters (ADCs) where very high sam-
pling rate is required [9]. In general, LVDS transmit drivers
are either current mode drivers or voltage mode drivers [5].
Figure 1 illustrates the simplified schematic of each type.
2.1 Current mode drivers
In general, current mode drivers consume relatively high
power [5, 11]. However, they are simple to design and
often result in good performance in terms of speed and
signal reflection. This is due to the fact that current mode
drivers use linear resistors to match the driver impedance to
the channel impedance [5, 11]. Therefore, current mode
drivers are less prone to ringing and switching spikes. As
shown in Fig. 1a, NMOS and PMOS devices are used as
switches to switch the current from one leg to another. To
have an LVDS compliant output signal, the driver needs to
supply a current ILoad through the external load resistance,
RLoad. Equation 2 illustrates the output voltage swing of
current mode drivers.
Current mode output voltage swing ¼ RLoad � ILoad
¼ 100� ILoad ð2Þ
Further, the driver has an internal linear 100 X resistor
implemented in parallel with RLoad for transmission line
impedance matching. Therefore, the driver also needs to
provide another current, ILoad, through the 100 X internal
resistor. As a result, current mode drivers consume a
minimum of twice the load current. Since they need to
fully switch twice the load current, MOS devices need to
have large sizes. This will cause the pre-driver stage to
consume significant power, since it is driving a large output
stage gate capacitance [10].
2.2 Voltage mode drivers
Voltage mode drivers consume less power [5]. However,
due to the fact that field effect transistors (FETs) are used
2 Analog Integr Circ Sig Process (2014) 79:1–13
123
as matching devices, the system suffers from non-linear
behavior during signal switching. This might affect the
system’s performance and speed. As seen in Fig. 1b,
NMOS and PMOS devices operate in the linear region and
switch current from one leg to another. For transmission
line impedance matching, each MOS device must be sized
to have an internal 50 X resistance to provide a 100 Xdifferential internal termination impedance. Due to having
a series combination of resistors, the output voltage swing
of voltage mode drivers can be calculated as shown in Eq.
(3).
Voltage mode output voltage swing
¼ ðVHigh � VLowÞ � RLoad
50þ RLoad þ 50¼ ðVHigh � VLowÞ
2ð3Þ
Ideally, consuming only ILoad, voltage mode drivers
consume half the power of current mode drivers. However,
voltage mode drivers are harder to design since the
impedance of the MOS devices is affected by several
factors like temperature and process variations. In addition,
the FET impedance will exhibit non-linear behavior as the
signal amplitude changes. This will likely cause signal
reflection and result in sub-optimal signal integrity. During
the last decade, several designs and topologies were
presented to address high-speed data transfer while
consuming low power. In [12–14], a pre-emphasis circuit
is introduced to improve the matching properties of the
driver and to compensate for high frequencies. In [12], a
current mode transmit driver is presented. The driver
includes a pre-emphasis circuit used to compensate for the
attenuation of limited bandwidth of the media channel.
Further, a closed-loop negative feedback circuit is
proposed to provide means of stability for the common
mode voltage. Figure 2 illustrates a simplified schematic of
the LVDS driver and the pre-emphasis circuit presented in
[12].
As seen in Fig. 2, the signal flow due to the input signals
(Vin?, Vin-) and the delayed signals (Vind?, Vind-) are
controlled by an enable signal (Pre_EN). Further, a pre-
emphasis circuit is added to the normal current mode
LVDS driver to enable high-speed transmission. At run-
time, the original and the delayed signals become the same
logic state for a short period during which the pre-emphasis
circuit supplies additional current to the main driver circuit.
This excess current contributes in generating the needed
voltage swing and thus improves the driver’s speed per-
formance. As a result, the driver was able to provide
2 Gbps speed while running from a 3.3 V supply.
Having two pairs of MOS devices with a PMOS current
source, a typical LVDS driver is considered a bridged-
switched current sources driver that works well for supply
voltages above 2.5 V. However, due to the finite on-resis-
tance of the MOS devices, the driver might run into supply
headroom issues if operated from lower power supplies.
Therefore, in [15], a new double current source (DCS)
LVDS topology is presented to address headroom issues.
The DCS design replaced the upper PMOS current
source in the normal LVDS driver with two PMOS current
sources. Therefore, the driver is able to run using a 1.8 V
supply. However, to maintain the same voltage swing, the
current sources are doubled and the size of the transistors
must be increased.
Fig. 1 Common topologies for
LVDS transmit drivers.
a Current mode driver.
b Voltage mode driver
Analog Integr Circ Sig Process (2014) 79:1–13 3
123
In [16], a current mode LVDS driver, with built-in self-
detection functions, is presented. The functions include
frequency and duty-cycle detection units to monitor and
maintain the transmitter’s output signal to be within the
standard specifications. However, adding these units
requires more power. The driver uses a 3.3 V supply
voltage while supporting data rates up to 1.3 Gbps.
As the transmission speed increases, the effect of the
driver parasitics becomes more significant and hence the
signal might suffer from spikes and glitches. To overcome
this problem, a charge/discharge circuit that consists of a
combination of capacitors is presented in [17]. This solu-
tion helped in suppressing the switching noise and stabi-
lizing the driver’s output signal. Therefore, the driver is
able to support switching speeds up to 2.2 Gbps while
operating from a 1.8 V supply.
To maintain the LVDS standard common mode voltage
regardless environment variations, the previous designs
included a common mode feedback circuit that controls the
amount of current passing through the driver, hence con-
trolling the output signal specifications. This is achieved by
comparing the output common mode voltage to a 1.25 V
reference voltage. However, this reference voltage might
be also affected by the environment variations. In [18], a
band-gap reference source is introduced to generate a
temperature independent reference voltage.
All these topologies helped in improving the driver’s
ability to deliver high data rates while using a single
transmitter. However, in [19], a multi-channel architecture
is presented. The design included several LVDS transmit-
ters with a pre-emphasis circuit controlled via a multiplexer
to improve transmit driver’s speed and throughput. How-
ever, adding the multiplexer and the controlling circuits
caused the driver to consume more power. Therefore, the
driver is able to provide 3.125 Gbps while consuming
48 mW. Other designs presented different interfacing cir-
cuits and topologies to allow LVDS to communicate over a
variety of media channels. In [20, 21] two current mode
LVDS transmit drivers are interfaced with optical fiber
channels to allow high-speed communication.
This proposed design is a low power and high-speed
voltage mode transmit driver. As simulation results will
show, the driver achieves good signal integrity perfor-
mance and low power operation while supporting high
switching speeds. The implementation and design meth-
odology of the driver is discussed in the next section.
3 Proposed driver
To minimize power consumption, voltage mode driver
architecture is used. Figure 3 shows a simplified schematic
of the proposed driver and the signal flow through it. As
illustrated in the figure, the new design consists of a pre-
driver stage and an output stage. The pre-driver stage con-
trols the output signal characteristics like the common-mode
Fig. 2 LVDS driver with pre-
emphasis circuit in [12]
4 Analog Integr Circ Sig Process (2014) 79:1–13
123
voltage and the amplitude swing, while the output stage
ensures the integrity of the output signal. RLoad is an
external resistor through which the current ILoad passes
creating the differential output swing. LPackage, CPad, and
CBoard represent the parasitic inductance and capacitance of
the chip and the board.
3.1 Generating the pre-driver output swing
and common-mode voltage
The pre-driver stage, to which the input signals are applied,
consists of a P-type MOSFET differential pair with a
resistive load. At high frequencies, having low capacitance
at the pre-driver is important to minimize power con-
sumption [10]. Therefore, the differential pair PMOS
devices (Q1, Q2) were designed with a relatively small
channel width. Depending on the input signal, Q1 and Q2
are switched passing the current IPre through one leg only.
This current will create a voltage drop across one of the
pre-driver resistors, RPre. Equation 4 describes the output
voltage swing of the pre-driver stage.
VOut�Pre ¼ IPre � RPre ð4Þ
Source followers at the output stage (Q3, Q4) have high
input impedance Zin(Q3,Q4). Therefore, the pre-driver’s load
is equal to RPre in parallel with Zin(Q3,Q4) and is dominated
by RPre. This will minimize the amount of power consumed
by the pre-driver, since it is not driving highly capacitive
switches at the output stage. This is a significant advantage
over current mode drivers where pre-drivers drive large
gate capacitance of the output stage. Further, to help
achieve a good margin for the common-mode voltage over
operating environment variations, the pre-driver has a
variable programmable resistor, RCOM. The resistor is used
to help set the common-mode voltage of the pre-driver
stage and the output stage to be within the LVDS standard
specifications. To make it programmable, the resistor,
RCOM, is implemented using a group of parallel NMOS
devices controlled by an external signal as shown in Fig. 4.
Depending on the value of RCOM, the common-mode
voltage of the entire driver is shifted by IPre � RCOM .
Fig. 3 Proposed LVDS driver
Fig. 4 Common-mode voltage variable resistor, RCOM
Fig. 5 Small signal half-circuit model for output voltage
Analog Integr Circ Sig Process (2014) 79:1–13 5
123
Equation 5 describes the common-mode voltage of the pre-
driver stage.
VCM�Pre ¼ IPre � RCOM þIPre
2� RPre ð5Þ
3.2 Generating the output voltage swing
The output stage shown in Fig. 3 consists of two PMOS
devices (Q5, Q6), two internal termination resistors Rterm,
and two PMOS source follower (Q3, Q4). The output dri-
ver employs a positive feedback technique that minimizes
power consumption. In this technique, the pre-driver con-
trols the switching of the output stage source followers
(Q3, Q4). This eliminates the need for any additional
switching circuitry. Therefore, Q3 and Q4 will consume a
maximum current of ILoad when fully switched. Further, the
output signals from the source followers (VZ, VY) control
the switching of the PMOS devices (Q5, Q6). These PMOS
devices will be in saturation and switch the load current
ILoad from one leg to the other. The current will create a
voltage drop across the load resistance, RLoad.
Figure 5 shows the small signal half-circuit model of the
proposed driver as seen from the load resistance, RLoad. The
pre-deriver output swing, described in Eq. (4), is modeled
as a pulse voltage source connected to the output imped-
ance of the source follower (Q3, Q4). Since Q5 and Q6 are
in saturation, their output resistance is high and should not
affect the circuit. However, since the source-follower out-
put impedance, 1/gm3,4, is not much smaller than Rterm and
RLoad, it should be taken into account.
For the output signal to be LVDS compliant, the single
ended voltage swing should be between 125 and 225 mV
[1–4]. Equation 6 describes the half circuit output voltage,
VOUT, across the half circuit load resistance, RLoad/2.
VOUT ¼RLoad
2� ðIPre � RPreÞ
RLoad
2þ Rterm þ 1
gm3;4
¼ RLoad
2� ILoad ð6Þ
Since the load current, ILoad, is used to achieve the
needed output voltage swing, it cannot be reduced much.
However, to minimize the power consumption, the pre-
driver current, IPre, may be optimized. Equation 7
illustrates the pre-driver current with common-mode
input signals. The equation shows that IPre can be a
fraction of the load current. Therefore, by making RPre
Fig. 6 Single-ended internal impedance
Fig. 7 Pre-driver output signals
6 Analog Integr Circ Sig Process (2014) 79:1–13
123
Fig. 8 Output stage signals
Analog Integr Circ Sig Process (2014) 79:1–13 7
123
large, the system can be designed to consume very low
power at the pre-driver stage compared to other driver
topologies.
IPre¼WQ1;Q2
L
lpCox
2
� �VDD� IPre�RSpre�
VDD
2� Vtp
�� ��� �2
¼ILoad� RLoad
2þRtermþ 1
gm3;4
� �RPre
ð7Þ
3.3 Generating the output common-mode voltage
For the output signal to be LVDS compliant, the common-
mode voltage should be between 1.125 V and 1.375 V [1–
5]. The output signal common-mode voltage for the pro-
posed driver, shown in Fig. 3, is determined by the sum of
voltage drops along the path from RLoad to the pre-driver
common-mode resistor, RCOM. Equation 8 describes the
common-mode voltage of the output stage.
VCOM ¼ IPre
RPre
2þ RCOM
� �þ VSGðQ3;Q4Þ þ VRterm þ
RLoad
2
� ILoad
ð8Þ
As noted in equation 8, the output common-mode
voltage does not significantly rely on the possibly
varying supply source VDD. Using a PMOS-based
topology that uses the ground, 0 V, as a reference, allows
the system to utilize the full voltage range. This is a major
advantage over other topologies where the common-mode
voltage is limited by the headroom of the supply source
voltage. This allows using a 1.8 V supply and still
maintaining LVDS common mode characteristics.
Moreover, as illustrated in the simulation results, the
design is able to withstand a 3 % variation in the supply
voltage while having the output signal compliant with the
LVDS standard.
3.4 Proposed design immunity to external factors
To increase the design robustness and to decrease its
dependency on process, voltage, and temperature (PVT)
variations, two programmable resistors (RSpre, RSout) are
used to control the amount of current passing through the pre-
driver and the output stage, respectively. Using resistors to
control the current flow throughout the driver minimizes the
supply voltage headroom issues. This is because the resistors
will exhibit less voltage drop than the traditional current
sources. Since it has the ability to control the amount of
current, the driver is capable of sustaining the output dif-
ferential voltage swing within the standard specifications
(250–450 mV) [1–5]. RSpre and RSout, are constructed using
a group of parallel PMOS devices. Using an external signal,
the PMOS devices are controlled to provide the proper
impedance which will adjust the amount of current passing
through the pre-driver and the output stage, if needed.
3.5 Achieving 50 X single-ended internal impedance
To minimize signal reflection and maximize its integrity,
the driver’s differential output impedance should be mat-
ched to the transmission line differential impedance,
100 X. The internal single-ended output impedance of the
proposed driver is illustrated in Fig. 6. Since most of the
current will flow though one leg only, the other branch will
have high-impedance devices that have minor effect on the
driver’s impedance.
Equation 9 describes the single-ended internal imped-
ance of the driver.
ZChip ¼ SLPackage þ1
SCPad
==Rterm þ 1
gm3;4
1� gm5;6
gm3;4
==ro5;6
!ð9Þ
The single-ended output stage internal impedance
described in Eq. (9) should be matched to 50 X. This
means that the signal at the end of the channel will exhibit
Fig. 9 Output signal common-mode voltage
8 Analog Integr Circ Sig Process (2014) 79:1–13
123
a minimal amount of reflection. If the driver internal
impedance is properly matched, the output stage swing
described in Eq. (6) would be half the pre-driver swing
described in Eq. (4). The following section illustrates the
simulations results that verify the compliancy of the
proposed driver with the LVDS standard specifications.
4 Simulations results
The new driver was designed and extracted using Mentor
Graphics CAD tools and was implemented in 180 nm
CMOS technology. Using a supply voltage of 1.8 V, the
driver was simulated using a 5 Gbps PBRS7 input source
Fig. 10 Extracted single-ended (OUT, OUTB) eye-diagram. a TT Corner at 50 �C, 1.8 V supply. b SS corner at 125 �C, 1.75 V supply. c FF
corner at -40�, 1.85 V supply. d Slow MOSFET, fast R, 125 �C, 1.75 V. e Fast MOSFET, slow R, -40 �C, 1.85 V
Analog Integr Circ Sig Process (2014) 79:1–13 9
123
to verify the output differential voltage swing, common-
mode voltage, and the pre-driver’s signals.
The PMOS devices used have a channel length of 0.18 lm
and a channel width of 35 and 100 lm for the pre-driver
stage and the output stage source followers, respectively.
Figure 7 shows the pre-driver output swing along with the
pre-driver’s current consumption. The pre-driver circuit
consumes only 1.8 mA, therefore burning only 3.2 mW.
Simulated at 50 �C with a typical process, the differential
output swing of the pre-driver stage is about 700 mV.
Figure 8 shows the output stage signals at 50 �C with a
typical process corner. The differential output signal swing
Table 1 Simulation results summary
Simulation setup Output voltage
swing (mV)
Common-mode
voltage (V)
Typical corner at 50 �C,
1.8 V supply
350 1.17
Slow corner at 125 �C,
1.75 V supply
300 1.14
Fast corner at -40�,
1.85 V supply
450 1.23
Table 2 Simulation results on different packages
Package parameters Eye opening
amplitude (mV)
Eye width
(psec)
LPackage = 0 nH, CBoard = 500 fF 300 200
LPackage = 1 nH, CBoard = 500 fF 320 200
LPackage = 2 nH, CBoard = 500 fF 350 200
LPackage = 3 nH, CBoard = 500 fF 375 185
LPackage = 4 nH, CBoard = 500 fF 375 180
LPackage = 5 nH, CBoard = 500 fF 375 180
LPackage = 3 nH, CBoard = 100 fF 375 195
LPackage = 3 nH, CBoard = 300 fF 375 185
LPackage = 3 nH, CBoard = 1 pF 320 180
Fig. 11 Extracted single-ended (OUT, OUTB) with different loading
configurations. a Typical corner, LPackage = 3 nH, CBoard = 100 fF.
b Typical corner, LPackage = 3 nH, CBoard = 1 pF. c Typical corner,
LPackage = 1 nH, CBoard = 500 fF. d Typical corner, LPackage =
5 nH, CBoard = 500 fF
10 Analog Integr Circ Sig Process (2014) 79:1–13
123
across the load resistance, RLoad, is about 350 mV, which is
fully compliant with the LVDS standard. Comparing the
voltage swings of Figs. 7 and 8, the output stage voltage
swing is almost 50 % of the pre-driver swing. This indi-
cates the output stage is properly matched to 50 X which is
equal to RLoad/2. As a result, signal reflection is minimized.
Further, the current flowing through Q5 is about 5 mA
which is comparable to the load current, ILoad. This means
that most of the current is used to generate the needed
output voltage swing, which minimizes the output stage
power consumption. It should be noted that Q3 and Q4
never reach a zero current state. This is necessary to
maintain proper impedance termination. As a result, the
output stage consumes only 9.9 mW. This is a significant
power saving compared to current mode topologies where
the output stage current is at least twice the load current.
As mentioned earlier, to be LVDS compliant, the com-
mon-mode voltage should be between 1.125 and 1.375 V [1–
5]. Figure 9 shows the output signal common-mode voltage.
The signal is clearly within the LVDS standard. Further, the
common-mode voltage ripple is less than 50 mV. This
reduces the EMI and crosstalk during data transmission.
Figure 10 shows the eye diagram of the differential
output of the driver running at different process corners and
operating environments at 5 Gbps date rate. As the figure
illustrates, the eye width is about 200 ps and the differ-
ential eye height is greater than 500 mVppd in all cases.
Therefore, the system is able to sustain the LVDS
requirements under different conditions with a 3 % varia-
tion in the supply voltage. Simulations take into account
the package inductance (3 nH), the pads capacitance
(100 fF), the chip-to-board capacitance (150 fF), and the
extracted layout metal parasitic elements.
Table 1 lists the design output signal specifications based
on the previous eye measurements. The results show that
the driver is fully compliant with the LVDS standard and is
able to operate under all operating environment conditions.
To further demonstrate the robustness of the design, the
driver was simulated with multiple package and board loading
configurations. Figure 11 plots the output signal with selected
LPackage and CBoard values. Table 2 lists the eye opening
amplitude and eye width for nine different package and board
loading configurations. While the slope and shape of the signal
changes, the eye opening and width are acceptable.
Figure 12 shows the differential return loss performance
of the system. The figure shows that the driver is well
terminated and achieves -21 dB differential return loss at
DC. The return loss performance of the system degrades as
the frequency increases since the effect of the parasitic
capacitance and inductance, shown in Fig. 3, becomes
Table 3 Simulation results summary
Design attribute Value
Speed 5 Gbps
Supply voltage 1.75–1.85 V
Technology 180 nm CMOS
Total current (pre-driver?output stage) 7.3 mA
Output swing amplitude 300–400 mV
Common-mode voltage 1.14–1.23 V
Return loss at DC -21 dB
Fig. 12 Differential return loss performance
Fig. 13 Proposed driver layout
Analog Integr Circ Sig Process (2014) 79:1–13 11
123
more significant at higher frequencies. Although using an
NMOS based topology will not work due to running into
supply headroom issues, Fig. 12 shows the return loss
performance if an NMOS based topology is used. Com-
paring the results, it is shown that using an NMOS based
topology will not affect the return loss performance sig-
nificantly. It should be noted that the Rterm resistors in
Fig. 3 will shield the capacitance effect of devices in the
output stage source followers like Q3 and Q4.
Figure 13 shows the layout of the new design topology
using 180 nm technology. Applying compact layout design
techniques and having a symmetrical design allowed
reducing the circuit total area and minimizing the metal
parasitic resistance and capacitance.
Table 3 provides a summary of the new design topology
simulation results. The results show the total current con-
sumption of the driver along with the driver’s output signal
specifications.
5 Conclusions
In this paper, a PMOS-based low power 5 Gbps voltage
mode LVDS driver with a positive feedback mechanism in
the output stage is presented. The minimum amplitude
swing is 300 mV with a common-mode voltage of 1.14 V
which are compliant with the LVDS standard. Both the
output swing and the common-mode voltage are set in the
pre-driver. Power consumption is reduced by using a PMOS
based topology that does not require a high supply voltage.
Moreover, implementing a pre-driver along with source
followers that utilize the driver load current in the output
stage eliminates the need for any extra current to switch the
source followers which saves power. Further, the design
achieves a -21 dB differential return loss performance at
DC and is implemented using 180 nm CMOS technology.
Previous designs that includes designing a DCS topology
[13], adding a control unit to monitor the frequency and
duty cycle of the output signal [14], and designing a multi-
channel transmitter [18] intended to achieve high speed data
transmission while consuming low power. Simulation
results, using Mentor Graphics CAD tools, show that the
proposed design consumes only 13.1 mW of at-speed
power from a 1.8 V supply. Table 4 lists a comparison with
other published work that demonstrates the power and
speed efficiency of the newly proposed design topology.
References
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Table 4 Performance
comparison with published
work
Work Technology Supply
(V)
Speed
(Gbps)
Power
consumption
(mW)
Year of
publication
[13] CMOS 0.18 lm 1.9 2.5 14.4 2009
[14] CMOS 0.13 lm 3.3/1.5 1.5 80 2011
[15] CMOS 0.35 lm 1.8 1.4 23 2005
[15] CMOS 0.35 lm 1.8 1.2 12.8 2005
[16] CMOS 0.35 lm 3.3 1.3 29.4 2012
[17] CMOS 0.35 lm 1.8 2.2 23 mW for
output stage
2010
[18] CMOS 0.18 lm 1.8 1.8 11.6 2010
[19] CMOS 0.18 lm 3.3/1.8 3.125 48 2010
[20] CMOS 0.18 lm 3.3 2 21 2011
[22] CMOS 0.18 lm 3.3 5 17.8 2012
This work
(simulation results)
CMOS 0.18 lm 1.8 5 13.1 2013
12 Analog Integr Circ Sig Process (2014) 79:1–13
123
11. National semi conductors. (2002). LVDS owner’s manual. A
general design guide for national’s low voltage differential sig-
naling (LVDS) and bus LVDS products (2nd ed.).
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(2011). LVDS driver design for high speed serial link in 0.13 lm
CMOS technology. In Computational Problem-Solving (ICCP),
2011 International Conference on (pp. 145–148, 21–23).
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output driver circuit in 0.18 m CMOS technology. IEEE Journal
of Solid-State Circuits, 44(2), 538–548.
14. Wei, X., Li, P., & Wang, Y. (2011). Regular paper A LVDS
transmitter with low-jitter PLL and pre-emphasis for serial link.
Journal of Electrical Systems, 7(3), 373–381.
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Low-voltage low-power LVDS drivers. IEEE journal of solid-
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detection functions for off-chip transmission. Journal of Analog
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17. Hua, C., & Ping, L. (2010). A novel 2.2 Gbps LVDS driver
circuit design based on 0.35 lm CMOS. Journal of Semicon-
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18. Kleczek, R. (2010). The design of low power 11.6 mW high speed
1.8 Gb/s stand-alone LVDS driver in 0.18-lm CMOS. In Mixed
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Hazem W. Marar is a Lab
Instructor and teaching assistant
at Princess Sumaya University
for Technology, Jordan. He
received his M.Sc. degree in
Embedded Systems Design from
Yarmouk University, Jordan, the
B.Sc. degree in Computer/Elec-
trical Engineering from Princess
Sumaya University for Technol-
ogy, Jordan. His research inter-
ests are in the area of system IC
design, microprocessors, and on-
chip-communication.
Khaldoon Abugharbieh received
a B.S.E.E. degree from Arizona
State University in 1994 and an
M.S.E.E. degree from Stanford
University in 1996. He received a
Ph.D. degree in electrical engi-
neering from Santa Clara Uni-
versity in 2009. From 1995 to
1999, he worked on programma-
ble logic devices and data com-
munication products with Cypress
Semiconductor. In1999,he joined
the RF Group in DataPath Sys-
tems, which was later acquired by
LSI Logic Corporation, where he
worked on consumer-product mixed-signal system-on-chips. In 2006, he
joined National Semiconductor Corporation High Speed Signal Division.
Dr. Abugharbieh also worked at Xilinx Corporation SerDes Technology
Group as senior design manager. He worked on RF-class voltage-
controlled oscillators, phase lock loops, data converters, and high-speed
and low-power I/Os. He is presently a faculty member in Princess Sumaya
University for Technology electrical engineering department in Amman,
Jordan. His research interests include high-performance analog- and
mixed-signal ICs. Dr. Abugharbieh holds eight issued US patents and has
authored and co-authored twelve technical refereed journal and confer-
ence publications.
Abdel-Karim Al-Tamimi is an
Assistant Professor in the Com-
puter Engineering Department at
Yarmouk University, Jordan. He
received his Master and Ph.D.
degrees in Computer Engineer-
ing from Washington University
in St. Louis in 2007 and 2010,
respectively. His research inter-
ests include computer networks,
multimedia networks and appli-
cations, modeling and simula-
tion, and computer security.
Analog Integr Circ Sig Process (2014) 79:1–13 13
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