a106: integration & scaling -...
TRANSCRIPT
Tim Grüne
Advanced Macromolecular Structure Determination
Integration & ScalingTim Grüne
Dept. of Structural Chemistry, University of Göttingen
March 2011
http://shelx.uni-ac.gwdg.de
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Overview
• mathematical reminder: vectors, matrices
• Data Integration
– Determination of spot intensity
– Application of the Ewald sphere
– Determination of the resolution cut-off
• Data Scaling
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Vectors: Scalar Product
There are two common products of vectors: the scalar (or inner) product and the cross (or
wedge) product.
a
b
γ
The scalar product
a · b = a1b1 + a2b2
= ‖a‖‖b‖ cos γ
of two vectors a and b is a number (and not a vec-
tor).
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Vectors: Scalar Product
γb sin( )
b
1
If one of the two vectors has unit length, the scalar
product is the length of the orthogonal projection of
the other onto the unit vector.
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Vectors: Scalar Product
b
e1
e2
The scalar product can be used to decompose a
vector into basis vectors: If e1 and e2 are mutually
orthogonal unit vectors, one can express b as
b = (b · e1)e1 + (b · e2)e2 (1)
Everything about the scalar product shown here in two dimensions can be generalised to
three and more dimensions.
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Vectors: Cross Product
The cross (or wedge) product is specific to three dimensions.
The cross product between two vectors a and b results in a new
vector a× b = c, which is perpendicular to both a and b.
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Vectors: Cross Product
The cross (or wedge) product is specific to three dimensions.
The length of c equals the area of the parallelogram between a
and b.
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Vectors: Scalar and Cross Product
The (appropriate) combination of scalar and cross product equals the volume of the box
spanned by three vectors a, b, and c,
V = |c · (a× b)|
This is true, whether or not c is the cross product of a and b
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Matrices
Objects have coordinates, i.e. numbers that act like an address. Coordinates are bound to a
coordinate system which consists of an origin and directions.
6
3Coordinates of X: 3 steps forwards,
6 steps to the right.
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Matrices
As we changes the coordinate system, e.g. by turning left, the coordinates change, too.
φ
6.7
−0.4
Coordinates of X: -0.4 steps forwards,
6.7 steps to the right.
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Matrices
We can calculate the new coordinates of X after we turned left by an angle of φ with the help
of a rotation matrix: Xforward, newXright, new
=
cosφ − sinφsinφ cosφ
Xforward, oldXright, old
in the previous example where φ = 30◦:−0.40
6.70
=
0.866 −0.50.5 0.866
36
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Matrices
Matrix operations are the mathematical abstraction of e.g.
• rotations of observer or objects
• certain deformations
• projections (like virtual 3D landscapes onto the computer screen)
All symmetry operations can be expressed by a combination of a matrix multiplication and a
vector addition.
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General Positions
The International Tables Volume A [3] list all 230 space groups. The symmetry operations for
each space group can be read off the list of general positions.
E.g. the four general positions of P41 are:
(1) x, y, z (2) x, y, z + 12 (3) y, x, z + 1
4 (4) y, x, z + 34
Let’s extract the matrix operation for the third general position.
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General Positions
We are looking for a (“deformation”) matrix A =( a11 a12 a13a21 a22 a23a31 a32 a33
)and a translation vector T =(
t1t2t3
), such that
yx
z + 14
=
a11 a12 a13a21 a22 a23a31 a32 a33
xyz
+
t1t2t3
So the first entry reads
−y = a11x+ a12y + a13z + t1
and one sees immediately that
a11 = 0 a12 = −1 a13 = 0 t1 = 0
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General Positions
The second entry reads
x = a21x+ a22y + a23z + t2
⇒ a21 = 1 a22 = 0 a23 = 0 t2 = 0
and finally for the last row
z +1
4= a31x+ a32y + a33z + t3
⇒ a31 = 0 a32 = 0 a33 = 1 t3 =1
4
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General Positions
Putting it all together, the 41 screw axis in P41 can be described asx′
y′
z′
=
0 −1 01 0 00 0 1
xyz
+
0014
This means, for every atom in the crystal (with coordinates (x, y, z)), there is the same type
of atom (with the same chemical environment) at position A( xyz
)+ T =
yx
z+14
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Two Notes
1. Applying this symmetry operator twice gives
A
yx
z+14
+ T =
xy
z+12
i.e. the second symmetry operator listed in the International Tables.
2. 0 = cos 90◦ and 1 = sin 90◦, i.e. the matrix A represents a rotation
of φ = 90◦ (about the z-axis) as one would expect for a four-fold screw
axis.
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Data Processing
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Data Processing
The refinement of an X-ray structure usually assumes that the data stem from and idealised
crystal and instrument.
Simulated idealised Insulin crystal with0.1◦ mosaicity; Courtesy Kay Diederichs;
The data stored from an X-ray experiment (the mtz-file used
in refinement) contains
h, k, l, F, σF
or
h, k, l, I, σI
but no information about the actual data collection experiment
(e.g. shape of crystal, wavelength, detector properties, . . . ).
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Perfect Experiments
Properties of perfect crystals from a perfect experiment
• no background
• no disorder and distortions
• perfect spot shape
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Data Processing
Misfocused beam Poorly diffracting crystal
Sources of Errors
• Beam/ beamline
• Crystal imperfections
• Detector (overloads,
noise)
Courtesy N. Sanshvili, S. Corcoran;
APS Chicago
The goal of data processing (aka data integration) and data scaling is to “convert” the exper-
imental measurement into an idealised experiment.
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Ideal Experiment
The data of the idealised experiment are the reflections, consisting of
1. Miller-Indices (hkl)
2. Intensities I(hkl)
3. standard deviations σI(hkl)
The unit cell dimensions and the space group are parameters for the experiment.
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Cell Parameters and Spot Prediction
Spot predictions of Lysozyme with
correct cell
a = b = 78.5Å c = 36.7Å
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Cell Parameters and Spot Prediction
Spot predictions of Lysozyme with in-
correct cell (by 2 Å)
a = b = 76.5Å c = 34.7Å
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Understanding a Diffraction Experiment
A reflection on a diffraction image carries two different kinds of information:
1. Diffraction Geometry: the position of the spots on the detector
2. Spot intensity.
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Laue Conditions
The diffraction geometry is explained by the Laue Conditions.
Only the unit cell vectors ~a, ~b, ~c and the scattering vector ~S(hkl) = ~Sout(hkl) − ~Sin are
necessary to determine where on the detector reflections occur, namely if and only if there is
are integers h, k, l, so that the Laue Conditions are fulfilled:
~S(hkl) · ~a = h
~S(hkl) ·~b = k
~S(hkl) · ~c = l~Sin
~S out(hkl) ~S
(hkl) D
etec
tor
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The Ewald Sphere Construction
The Ewald Sphere Construction is a geometric interpretation of the Laue Condition and a lot
easier to understand.
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Ewald Sphere Construction
(0,0) (1,0)(−3,0)
(1,1)
~
-
-
-
-
-
-
-
-
-
-
-
-
X-r
ayso
urce
~a∗~b∗
Reciprocal Lattice:
~a∗ =~b× ~c
(~a×~b) · ~c~b∗ =
~c× ~a(~a×~b) · ~c
~c∗ =~a×~b
(~a×~b) · ~c
Lattice points at:
h~a∗+ k~b∗+ l~c∗
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Ewald Sphere Construction
|~Sin| = 1/λ~
-
-
-
-
-
-
-
-
-
-
-
-
X-r
ayso
urce
Ewald Sphere:
Place a sphere with
radius 1/λ touching
lattice origin and its
centre aligned with
the X-ray source.
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Ewald Sphere Construction
(0, −2)
(−1, 2)
(−5, −3)
(−7, −1)
~S(−1,2,0)~
-
-
-
-
-
-
-
-
-
-
-
-
X-r
ayso
urce
Laue Conditions:
All lattice points on
surface fulfil Laue
Equations.
The scattering vector
S belonging to a re-
flection (hkl) points
from the origin to the
lattice point
h~a∗+ k~b∗+ l~c∗
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Ewald Sphere Construction
De
tecto
r
(0, −2)
(−1, 2)
(−5, −3)
2θ
2θ′
(−7, −1)
~
-
-
-
-
-
-
-
-
-
-
-
-
X-r
ayso
urce
Those reflections which hit the detector are recorded as spots.
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Ewald Sphere Construction
Dete
cto
r~
-
-
-
-
-
-
-
-
-
-
-
-
X-r
ayso
urce
Crystal rotation = Lattice rotation = More spots recorded
(Rot. axis perpendicular to slide)
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Indexing
The Laue Conditions and the Ewald Sphere Construction predict the spot positions on a
detector given the crystal unit cell and the crystal orientation.
The first step of an X-ray experiment has to invert this prediction:
Find the crystal unit cell dimension and crystal orientation based on the detected
diffraction pattern.
This is called indexing and is based on strong reflections which are detected easily and
reliably.
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Indexing
Each spot on the detector corresponds to a reflection and thus a reciprocal lattice point ~p∗i .
The back-transfer from spot to reciprocal lattice point depends on [1]:
1. (Xi, Yi) coordinates of spot on the detector
2. (X0, Y0) origin of the detector
3. The X-ray wavelength λ
4. ∆ distance between crystal and detector
5. Orientation of the crystal when the spot was detected relative to its initial position
(rotation angle).
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Indexing
A macromolecular crystal produces a few hundred strong reflections within 5–10 frames.
Indexing consists of:
1. Find strong spots
2. Calculate lattice points p∗ for each spot
3. Determine reciprocal unit cell vectors ~a∗,~b∗, and ~c∗ so that as
many of the p∗ can be expressed as
~p∗ = h~a∗+ k~b∗+ l~c∗
The fact that the Miller-indices (hkl) must be integers imposes a strong restriction on finding
the reciprocal unit cell. Otherwise ~a∗, ~b∗, and ~c∗ could not be determined reliably.
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Indexing
The last three quantities, λ, ∆, and the crystal rotation angle, are usually know with high
accuracy.
The spot coordinates are determined by the integration software and depend mostly on the
crystal quality (at least for macromolecular crystals).
The detector origin is the most sensitive parameter and often the “culprit” when indexing fails.
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Finding the Detector Origin
There are two simple tricks to determine the detector origin (X0, Y0):
1) ice rings collect an images without your crystal at the same settings with ice (water) in the
loop in order produce ice rings.
Image of a lysozyme crystal with ice rings (courtesy
T. Beck).
The origin of the beam corresponds to the centre of any of
the ice rings. E.g. the program mosflm allows to fit these
rings to determine their centre.
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Finding the Detector Origin
There are two simple tricks to determine the detector origin (X0, Y0):
2) test crystal collect a data set from a test crystal (lysozyme or insulin) with known param-
eters and integrate the data.
It is actually good practice to do this first thing, whenever one collects data at a synchrotron
to make sure that one understands the system and that the beam line is properly set up.
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Refinement of Experimental Parameters
The experimental parameters
• Unit cell dimensions and orientation
• Beam direction
• Crystal-to-detector distance
• Crystal rotation axis
• Detector origin
are refined during data processing with the determined spots.
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Refinement of Experimental Parameters
Lattice symmetry reduces the number of parameters, e.g. in a tetragonal lattice |~a| = |~b|
The data processing step can therefore be stabilised by imposing the lattice symmetry during
integration.
Data integration programs only “look” at the detector positions where spots are predicted from
the experimental parameters. Their proper determination is therefore substantial for a good
data set.
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Spot Intensities
The main purpose of data integration aka data processing: determination of the spot intensi-
ties.
There are two different classes of spots which are treated differently:
• Strong spots and
• Weak spots
The difference is mostly due to the presence of noise in the data.
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Spot & Background Noise
Inte
ns
ity
Detector Pixel
noiseideal reflection
sum = data
• “ideal” spot: Gaussian curve
• even for “perfect” crystal: noise on the
detector
• measured: sum of noise and spot
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Strong Spots
3D profile Numeric values per pixel
Dark: spot area
Light: background area
1. Sum up pixel values in spot area2. Calculate average background from flat area3. Substract background per counted pixel
Strong spots: real spot area large, background cancels completely → summation re-
sults in correct intensity.
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Integration
Weak Spots
3D profile Numeric cross-section
520
540
560
580
600
620
640
0 10 20 30 40 50 60 70 80 90 100
Ph
oto
n C
ou
nts
Detector Pixel
Spot area difficult to distinguish from background
Small area: significant variation in background, summation gives incorrect result.
Solution: Profile Fitting
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Profile Fitting
1. Calculate an expected spot shape from strong spots
2. Scale the shape at the calculated spot position to the pixel
values found there
3. Subtract the average background
The last item is the reason why there are measurements with negative intensity (so-called
counting errors). Even though they physically do not make sense, they contain important
information [2].
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Profile Fitting — HKL2000
HKL2000
• 2D - process one frame after the other
• for each (predicted) spot, consider disc around spot
• spot profile from strong spots within circle
Main Window of HKL2000 with spot
predictions and radius for profile fitting
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HKL2000 — adjusting integration box
Default Adjusted
• Too small spot area
• Background boxes overlap with other spots
• Rrim = 4.2%, I/σI = 42.2
• Increased spot size
• Decreased box size for background
• Rrim = 4.1%, I/σI = 47.7
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Profile Fitting — Mosflm
Mosflm
• 2D - process one frame after the other
• divide frame into 3× 3 or 5× 5 squares
• Average strong spots within each square→ arbitrary profile
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Profile Fitting — XDS
XDS
• 3D - collect spots over several frames
• divide frame into 3× 3
• Fit strong spots within each square to 3D Gaussian curve
• Fit weak spots to this Gaussian
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XDS — Example of Cross Section***** RUN-AVERAGE OF PROFILE # 1 *****
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 2 0 0 0 0 0 0 0 5 10 5 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 2 4 2 0 0 0 0 0 0 12 23 11 2 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 2 0 0 0 0 0 0 0 6 10 5 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 2 0 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 0 3 2 0 0 0 0 0 0 2 5 3 0 0 0 0 0 0 0 3 2 0 0 0
0 0 2 15 28 13 2 0 0 0 0 3 23 43 19 3 0 0 0 0 2 16 29 13 2 0 0
0 0 4 36 67 30 5 0 0 0 0 6 54100 43 6 0 0 0 0 4 38 68 30 5 0 0
0 0 2 16 30 15 3 0 0 0 0 3 22 43 21 4 0 0 0 0 2 15 30 15 3 0 0
0 0 0 2 4 2 0 0 0 0 0 0 3 6 3 0 0 0 0 0 0 2 4 3 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 6 10 5 0 0 0 0 0 0 0 2 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 13 23 11 2 0 0 0 0 0 2 4 2 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 5 10 6 0 0 0 0 0 0 0 2 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
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Resolution Cut-Off
One consequence of profile fitting: Processing programs will integrate noise when the reso-
lution cut-off is set too high.
Including the noise is going to negatively influence the “real” data.
Therefore it is important to set the resolution limit during the integration instead of e.g. cutting
the poor quality part after integration.
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Data Scaling
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Data Scaling
After data processing, reflection intensities must be scaled:
Some reflections have theoretically identical intensity, but differ experimentally.
Identical intensities are expected from
• Friedel Pairs (|F (hkl)| = |F (hkl)|)
• Symmetry equivalents (|F (hkl)| = |F (A(hkl))| with symmetry operator A)
• Multiple measurements of identical reflections
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Equivalent Reflections
Reflections which are theoretically identical are called equivalent reflections.
E.g. in space group P41 the reflections (123) and0 −1 01 0 00 0 1
123
=
−213
(with the matrix A from the beginning of this lecture) are equivalent.
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Data Scaling
Reasons for deviations from equality:
• non-spherical crystal
• Detector properties
• Detector settings
I ∝ V
Ph
osp
ho
r L
aye
r
De
tecto
r
Syste
m
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Merging
Scaling also usually merges the data:
1. Determine average intensity for equivalent reflections
2. Replace all equivalent reflections with average
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Averaging Equivalent Reflections
I
Outlier, e.g obscured by beam stop
Intensities of a set of equivalent reflections.
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Averaging Equivalent Reflections
I
Method 1: Weighted Mean,
〈I〉 =∑wiIi∑wi
where wi =1
σ2i (Ii)
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Averaging Equivalent Reflections
I
Method 1: Weighted Mean,
〈I〉 =∑wiIi∑wi
where wi =1
σ2i (Ii)
〈I〉
Problem: Outlier with small I will have small σ(I) and
therefore large weight w and dominate 〈I〉
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Averaging Equivalent Reflections
I
Method 2: Unweighted Mean,
〈I〉 =∑IiN
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Averaging Equivalent Reflections
I
Method 2: Unweighted Mean,
〈I〉 =∑IiN
〈I〉
Better, but outliers still affect mean. After rejection of “out-
liers”, mean is falsified.
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Averaging Equivalent Reflections
I
〈I〉
Method 3: Use median as mean (same number of obser-
vations above and below median).
Better. Robust method even with poor error estimates
σ(I).
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Averaging Equivalent Reflections
I
〈I〉
Method 4: Iterative improvement of weights,
〈I〉 =∑wiIi∑wi
where (specific to SADABS)
wi =
(1−ti)2
σ2(Ii)+g·〈I〉2ti < 1
0 ti > 1 (outlier rejection)
and
ti =(Ii − 〈I〉)2
σ2(Ii) + 0.25 〈I〉2
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Averaging Equivalent Reflections
I
〈I〉
Method 4: Iterative improvement of weights,
〈I〉 =∑wiIi∑wi
Robust & resistant to outliers: Itera-
tive weight determination is common
to most scaling programs. Outliers
(large ti) are strongly downweighted,
but not completely rejected. 0
1
Ii = <I> 1
ti
wi ∝ (1−ti)2
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Integration and Scaling Programs
In order to use scaling programs which “don’t belong” to the corresponding integration pro-
gram, conversions are required. This gas become relatively simple recently. The following
scheme is not complete, and misses e.g. “d*trek”.
XDS HKL2000 SAINTMOSFLM
SCALA SCALEPACK SADABSCORRECT
(built−in to XDS)
x2sad
xds2sad
scalepack2mtzpointle
ss
Saint/Sadabs are only commercially available in conjunction with an X-ray machine from
Bruker-AXS. Unfortunately, Saint (in combination with Twinabs) is the only program to prop-
erly treat twinned data (to the lecturer’s knowledge).
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Radiation Damage
Crystals exposed to X-rays suffer from radiation damage especially from (high intensity) syn-
chrotron radiation.
Radiation damage increases disorder, therefore high-resolution reflections are too weak com-
pared to low-resolution reflections.
This can be corrected for by amplifying the high-resolution reflections:
I → I ∗ eB sin2 θ/λ2with B = (1− x)B0 + xB1
x is proportional to the frame number (0 for the first image and 1 for the last).
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Scaling as Error Diagnostics
Most scaling programs (notably SCALA and SADABS) print a lot of information about the
input data which allows to
• Recognize bad frames (e.g. underexposed frames)
⇒ exclude single frames
• Crystal slippage or poor centring
⇒ Re-collect data
• Radiation damage
⇒ cut data after a certain frame
• Bad detector areas
⇒ mask out area
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Acknowledgement
The section about scaling was derived from a lecture kindly provided by G. M. Sheldrick
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References
1. W. Kabsch, Integration, scaling, space-group assignment and post-refinement, Acta Crys-
tallogr. (2010), D66, pp. 133–144
2. S. French, K. Wilson, On the Treatment of Negative Intensity Observations, Acta Crystal-
logr. (1978), A34, pp. 517–525
3. T. Hahan (ed.), International Tables for Crystallography, Vol. A, Union of Crystallography
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