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Spectral performance for general-purpose test

OverviewThe Agilent Technologies 8657A and 8657B signal gener-ators are designed to test AM, FM, and pulsed receiversas well as components. With their exceptional analogmodulation, good spectral purity, and superb outputlevel performance, these signal generators are ideal forR&D, manufacturing, and support.

In-channel performanceMeasurement confidenceThe 8657A and B signal generators provide the spectralpurity and modulation versatility needed for RF testingof communication and navigation equipment.

Low residual FM ensures wide hum and noise test margins Hum and noise testing requires a signal generator tohave low residual FM to ensure no measurement error.The residual FM of the 8657A and B provides the testmargins you need for the most demanding hum andnoise tests.

Output level range and accuracy for sensitivity testingWith a dynamic range from +13 to –143.5 dBm, the8657A and B allow sensitivity measurements to be madeon even the most sensitive receivers. The 8657A and Bcouple this with a level accuracy of ±1 dB (typically 0.5 dB) to –127 dBm across the full temperature range of0 to 55 degrees C, to give you accurate and repeatablemeasurements every time.

Low RF leakage eliminates measurement interferenceSensitivity measurements can often be masked by RFleakage (radiated emissions). With the 8657A and B, RFleakage is reduced to a level that assures virtually nomeasurement interference.

DCFM faithfully reproduces digital signalsFor radios with digital squelching, the 8657A and B haveextremely stable dc-coupled FM (dcFM). The dc couplingof low-rate tones or digital data eliminates droop, andthe exceptional stability and center-frequency accuracywhen in dcFM mode eliminates the need to retune thesignal generator after dcFM is selected.

Pulse modulation with the 8657BHigh-performance pulse modulation (available on the8657B) will give you confidence in your radar or pulsedcarrier measurements. This includes rise/fall times of

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Out-of-channel measurements with the 8657A/BLow single-sideband phase noise for adjacent channel selectivitytestingA receiver’s ability to reject unwanted signals is meas-ured using out-of-channel tests. With its good spectralpurity, the 8657A and B make it easy to performdemanding tests such as adjacent channel selectivitymeasurements.

Adjacent channel selectivity measures a receiver’s abilityto pick out a desired signal while rejecting a strong sig-nal one channel away. To measure adjacent channelselectivity the out-of-channel signal generator must havelow single-sideband (SSB) phase noise and nonharmonicspurious content at channel spacings, otherwise the in-channel signal is masked. The exceptional phase noiseperformance of the 8657A and B provides a cost-effectivesolution for many out-of-channel tests.

General purpose and component testsOutput power to drive high-level inputsFor applications requiring high output power, the 8657Aand B can overrange beyond the +13 dBm specified out-put level to >+16 dBm for most frequencies.

DCFM for VCO simulation State-of-the-art dcFM and wide FM bandwidth make the8657A and B ideal sources for many VCO simulationapplications. For example, the 8657A or B can be used toreplace a receiver’s VCO during design.

Phase adjust to characterize phase-sensitive devicesThe 8657A and B give you the ability to adjust the phaseof the output signal in one-degree increments withrespect to a source that is locked to the same referencetimebase. This feature makes it easy to characterizephase-detector or phase-interferometer receivers duringdesign or manufacturing.

Manual tests100 nonvolatile store/recall registers save set-up timeThe 8657A and B offer as a standard feature the abilityto store 100 complete instrument states. This featuredecreases set-up time when performing repetitive testsand reduces operator errors.

Register sequencing provides semi-automationStepping through the store/recall registers is easy withthe front-panel sequence keys or the rear-panel remote-sequence connector. These features allow the user tosequence through the storage registers in any order.

Automated testsReliable output attenuatorsWith production lines requiring ever-faster throughput,test equipment must be more reliable than ever. Outputlevel cycling requires electromechanical relays to switchin and out of different attenuators to produce varyingoutput levels. The 8657A and B enhance system up-timeby using a very reliable attenuator technology. The8657A is especially dependable with its electronic atten-uator design. Instead of using mechanical relays forswitching the attenuators, the 8657A uses solid-statecomponents for setting output levels. The patenteddesign uses PIN-diode switching elements with 3 millionhours mean time between failure rate. This exceptionalreliability is backed with a 5-year warranty againstattenuator failure.

Ordering informationPlease contact your Agilent Technologies Sales andService Office for more information or visit our websiteat www.agilent.com/find/tmdir

Option Description

001 High-stability timebase002 Rear-panel connections003 Pulse modulation ( 8657B only)1BN Mil std 45662A calibration certification1BP Mil std 45622A calibration with test data907 Front handle kit908 Rack flange kit909 Rack flange kit w/ front handle910 Adds operation/calibration manual and two service manuals915 Adds service manualW30 3-year return repair serviceW32 3-year return calibration serviceW34 3-year standards compliant calibration serviceW50 5-year return repair serviceW52 5-year return calibration serviceW54 5-year standards compliant calibration service

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Technical specificationsSpecifications describe the instruments warranted per-formance and apply after a 30-minute warm-up. Allspecifications are valid over the signal generator’s entireoperating/environment range unless otherwise noted.

Supplemental characteristics (indicated by italic type) areintended to provide information useful in estimatinginstrument capability in your application by describingtypical, but not warranted, performance.

Note: The upper frequency range of the 8657A is 1.04 GHz.Specifications above 1.04 GHz apply only to the 8657B.

Frequency

Range8657A 100 kHz to 1.04 GHz8657B 100 kHz to 2.6 GHzUnderrange To 10 kHz with uncalibrated output and

modulation.Resolution8657A 10 Hz8657B 1 HzAccuracy and stability Same as timebaseSwitching speed1 0.15 Vrms into output (rear panel) 50 Ω (output of 10, 5, or 1 MHz is selec-

table via internal jumper). If external ref-erence is used, output will be the samefrequency.

External reference input Accepts any 10, 5, or 1 MHz ±0.002%) (rear panel) Frequency standard at a level

>0.15 Vrms into 50 Ω

Output

Range (dBm)8657A +13 dBm to –143.5 dBm into 50 Ω,

+10 dBm to –143.5 dBm for frequenciesfrom 100 kHz to 1 MHz

8657B +13 dBm to –143.5 dBm into 50 Ω,+10 dBm to –143.5 dBm with pulsemodulation installed at fc

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Spectral purity

SSB phase noise (in CW mode, at 20 kHz offset)0.1 to 130 MHz

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Residual AM (50 Hz to 15 kHz post-detection noise bandwidth, in CWmode)

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Center frequency accuracy in dc mode

Carrier frequency Center frequency accuracy

0.1 to 130 MHz ±500 Hz130 to 260 MHz ±125 Hz260 to 520 MHz ±250 Hz520 MHz to 1.04 GHz ±500 Hz1.04 to 2.06 GHz ±1000 Hz

Center frequency

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External modulation input

Front panel BNC, 600 Ω dc-coupled; front panel annunciators indicate 1 Vpeak signal ±5%.

Modulating signal output

Internal modulating signal is provided at the front panel BNC connector atnominally 1 V peak into a 600 Ω resistive load.

Simultaneous modulation

Internal/External AM/FM, FM/AM, AM/AM, FM/FM,AM/FM/(Pulse1)

Internal/Internal AM/FMExternal/External AM/FM

Pulse modulation (Agilent 8657B only)1

On/off ratiofc ≥130 MHz >70 dBfc ≥1.03 GHz >95 dB

Rise/fall timesfc ≥130 MHz >35 nsfc ≥1.03 GHz >50 ns

Maximum repetition rate dc to 30 MHz, typical

Level accuracy ±1.0 dB, typical

Duty cycle 0 to 100%, typical (limited by rise/falltime)

Pulse modulation input BNC, high impedance (internally selec-table to 50 ohms), can be driven directlyby TTL

Maximum input level ±15 V, typical

Nominal input threshold 1.6 V, typical

Video feedthrough 130 MHz and lev-els ≤+7 dBm (frequency switching speed typically increases by 30 ms with pulsemodulation on). Additionally, AM is unspecified with pulse modulation turned onat fc≥1.03 GHz.

2. Time delay between a change in input pulse and carrier response.

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General

Operating temperature range 0 to 55 °C

Storage temperature range –40 to +71 °C

Leakage Conducted and radiated interference iswithin the requirements of RE02 (andCE03 for the 8657B, except broadbandconducted below 70 kHz) of MIL STD461B, and FTZ 1046 (FTZ 1115 for8657B). Furthermore, RF leakage of lessthan 1.0 µV is induced in a two-turnloop, 2.5 cm in diameter, held 2.5 cmaway from the front surface. (Typicalleakage for the 8657Bis

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