attribute measurement systems analysis using a binary random

67
Attribute Attribute Measurement Measurement Systems Systems Analysis using A Binary Random Analysis using A Binary Random Effects Model Effects Model Vahid PARTOVI NIA Chair of Statistics Swiss Federal Institute of Technology Collaboration with: G.H. Shahkar and S.M.M. Tabatabaey Ferdowsi University of Mashhad

Upload: others

Post on 12-Sep-2021

2 views

Category:

Documents


0 download

TRANSCRIPT

Page 1: Attribute Measurement Systems Analysis using A Binary Random

AttributeAttribute MeasurementMeasurement SystemsSystemsAnalysis using A Binary Random Analysis using A Binary Random

Effects ModelEffects Model

Vahid PARTOVI NIAChair of Statistics

Swiss Federal Institute of Technology

Collaboration with: G.H. Shahkar and S.M.M. Tabatabaey

Ferdowsi University of Mashhad

Page 2: Attribute Measurement Systems Analysis using A Binary Random

Overview

IntroductionManual Method for Attribute Measurement Systems AnalysisA Binary Random Effects ModelComparison on a sample data

Page 3: Attribute Measurement Systems Analysis using A Binary Random

History

Why “attribute” measurement systems are importantHow we started the research

Page 4: Attribute Measurement Systems Analysis using A Binary Random

What is an Attribute Measurement System ?

Page 5: Attribute Measurement Systems Analysis using A Binary Random

Some Examples

Page 6: Attribute Measurement Systems Analysis using A Binary Random
Page 7: Attribute Measurement Systems Analysis using A Binary Random

Types of Measurement Systems

Measurement Systems

Variable Attribute

Ruler

Calliper

X-Meter Visual Inspection Go-Nogo Gages

Page 8: Attribute Measurement Systems Analysis using A Binary Random

Properties of a Good Measurement System

RepeatabilityReproducibilityUnbiasednessNo Trend in ErrorSensitivity to The Real State

Page 9: Attribute Measurement Systems Analysis using A Binary Random

Repeatability

101525

Page 10: Attribute Measurement Systems Analysis using A Binary Random
Page 11: Attribute Measurement Systems Analysis using A Binary Random

101525

Page 12: Attribute Measurement Systems Analysis using A Binary Random
Page 13: Attribute Measurement Systems Analysis using A Binary Random

101525

Page 14: Attribute Measurement Systems Analysis using A Binary Random

251510

Reproducibility

Page 15: Attribute Measurement Systems Analysis using A Binary Random

251510

Page 16: Attribute Measurement Systems Analysis using A Binary Random

251510

Page 17: Attribute Measurement Systems Analysis using A Binary Random

251510

Page 18: Attribute Measurement Systems Analysis using A Binary Random

251510

251510

251510

251510

Page 19: Attribute Measurement Systems Analysis using A Binary Random

An R&R Measurement System

251510

251510

251510

251510

Page 20: Attribute Measurement Systems Analysis using A Binary Random
Page 21: Attribute Measurement Systems Analysis using A Binary Random

251510

251510

251510

251510

Page 22: Attribute Measurement Systems Analysis using A Binary Random
Page 23: Attribute Measurement Systems Analysis using A Binary Random

251510

251510

251510

251510

Page 24: Attribute Measurement Systems Analysis using A Binary Random

Bias

81220

10

15

25

Page 25: Attribute Measurement Systems Analysis using A Binary Random

Linearity

8 1220

10

15

25

= -2= -3= -5

REAL

2624222018161412108

ERR

OR

-1.5

-2.0

-2.5

-3.0

-3.5

-4.0

-4.5

-5.0

-5.5

REAL

2624222018161412108

Abso

lute

Err

op

5.5

5.0

4.5

4.0

3.5

3.0

2.5

2.0

1.5

Page 26: Attribute Measurement Systems Analysis using A Binary Random

251510

251510

251510

251510

25

15

10

An Ideal Measurement System

Page 27: Attribute Measurement Systems Analysis using A Binary Random

251510

251510

251510

251510

17

12

8

17128

17128

17128

17128

Page 28: Attribute Measurement Systems Analysis using A Binary Random

251510

251510

251510

251510

25

15

10

Page 29: Attribute Measurement Systems Analysis using A Binary Random

251510

251510

251510

251510

17

12

8

17128

17128

17128

17128

Page 30: Attribute Measurement Systems Analysis using A Binary Random

A Real Measurement System

231711

261412

22148

25139

25

15

10

Page 31: Attribute Measurement Systems Analysis using A Binary Random

An Ideal Attribute Measurement System

CORRECTCORRECT

CORRECTCORRECT

CORRECTCORRECT

CORRECTCORRECT

CORRECT

CORRECT

Page 32: Attribute Measurement Systems Analysis using A Binary Random

An Ideal Attribute Measurement System

FAILEDCORRECT

FAILEDCORRECT

FAILEDCORRECT

FAILEDCORRECT

FAILED

FAILED

FAILEDFAILED

FAILEDFAILED

FAILEDFAILED

FAILEDFAILED

Page 33: Attribute Measurement Systems Analysis using A Binary Random

An Ideal Attribute Measurement System

FAILEDCORRECT

FAILEDCORRECT

FAILEDCORRECT

FAILEDCORRECT

FAILED

CORRECT

Page 34: Attribute Measurement Systems Analysis using A Binary Random

A Real Attribute Measurement System

CORRECTCORRECT

FAILEDCORRECT

FAILEDFAILED

CORRECTFAILED

FAILED

CORRECT

Page 35: Attribute Measurement Systems Analysis using A Binary Random

Measures of Agreement

Page 36: Attribute Measurement Systems Analysis using A Binary Random

Measures of Inter-rater Agreement

CORRECT

FAILED

CORRECT

FAILED

?

?

FALIEDCORRECT

To

tal

FA

LIE

DC

OR

RE

CT

A+B+C+D=N

A2

B+DA1

A+C

B2

C+DDC

B1

A+BBA

Rate

r B

TotalRater A

E

EO

ppp

−−

=1

κ

NCA

NBApE

+=

NApO =

Page 37: Attribute Measurement Systems Analysis using A Binary Random

Agreement Based on Chance

FailedCorrect

To

tal

FailedC

orrect

N=100A2

50A1

50

B2

502525

B1

502525

Rate

B

TotalRater A

0=κ

Page 38: Attribute Measurement Systems Analysis using A Binary Random

Almost Perfect Agreement

FailedCorrect

To

tal

FailedC

orrect

N=100A2

1A1

99

B2

110

B1

99099

Rate

B

TotalRater A

99.0=κ

Page 39: Attribute Measurement Systems Analysis using A Binary Random

Almost Perfect Disagreement

FailedCorrect

To

tal

FailedC

orrect

N=100A2

99A1

1

B2

101

B1

99990

Rate

B

TotalRater A

99.0−=κ

Page 40: Attribute Measurement Systems Analysis using A Binary Random

Inadequacy of Kappa in Marginally Unbalanced Cross tabs and An Alternative

Chance Based Measure

FailedCorrect

To

tal

FailedC

orrect

N=100A2

54A1

46

B2

51456

B1

49940

Rate

B

TotalRater A

FailedCorrect

To

tal

FailedC

orrect

N=100A2

15A1

85

B2

1055

B1

901080

Rate

B

TotalRater A

32.0=κ 7.0=κ

Page 41: Attribute Measurement Systems Analysis using A Binary Random

Manual Methodology 3rd EditionDesignDesign

3 Appraiser3 RepeatsTotally 50 Correct and Failed Parts

DecisionDecisionBetween Appraiser’s Agreement (3 Cross tabs)Agreement of Appraisers with Real Status of Parts (3 Cross tabs)Effectiveness’ Homogeneity (3 Confidence Intervals)

Page 42: Attribute Measurement Systems Analysis using A Binary Random

A Practical Example

Kappa0.863

976Correct

344Failed

CorrectFailedAppr. AAppr.B

Kappa0.776

927Correct

843Failed

CorrectFailedAppr. AAppr. C

Kappa0.788

945Correct942Failed

CorrectFailedAppr. BAppr.C

Kappa0.879

975Correct345Failed

CorrectFailedAppr. AREF

Page 43: Attribute Measurement Systems Analysis using A Binary Random

Continue

Kappa0.923

1002Correct

345Failed

CorrectFailedAppr. BREF

Kappa0.774

939Correct

642Failed

CorrectFailedAppr. CREF

0.690.820.74LCL0.800.900.84Score

0.910.980.94UCLAppr.A Appr.B Appr.C

http://www.carwin.co.uk/qs/english/msaamend.htm

Page 44: Attribute Measurement Systems Analysis using A Binary Random

Inadequacies of Manual Method

Kappa is not a reliable measure of agreement The error of decision is unknownSeems by adding appraisers it highly inflates type I error of overall decisionSeems to be Inconsistent!

Page 45: Attribute Measurement Systems Analysis using A Binary Random

Simulation Structure 1

Appraiser 3

Appraiser 2

Appraiser 1

Ppppppppp25Failed

Ppppppppp25Correct

321321321nState

Page 46: Attribute Measurement Systems Analysis using A Binary Random

p

Em

piric

al P

roba

bilit

y of

Rej

ecte

d M

easu

rem

ent S

yste

ms

0.5 0.6 0.7 0.8 0.9

0.0

0.2

0.4

0.6

0.8

1.0

ManualDeterministic

Page 47: Attribute Measurement Systems Analysis using A Binary Random

Simulation Structure 2

Appraiser 3

Appraiser 2

Appraiser 1

ppppppppp5Failed

ppppppppp45Correct

321321321nState

Page 48: Attribute Measurement Systems Analysis using A Binary Random

p

Em

piric

al P

roba

bilit

y of

Rej

ecte

d M

easu

rem

ent S

yste

ms

0.5 0.6 0.7 0.8 0.9

0.0

0.2

0.4

0.6

0.8

1.0

ManualDeterministic

Page 49: Attribute Measurement Systems Analysis using A Binary Random

Simulation Structure 3

Appraiser 3

Appraiser 2

Appraiser 1

0.850.85p0.850.85p0.850.85p100Failed

0.850.85p0.850.85p0.850.85p900Correct

321321321nState

Page 50: Attribute Measurement Systems Analysis using A Binary Random

P

Em

piric

al P

roba

bilit

y of

Rej

ecte

d M

easu

rem

ent S

yste

ms

0.5 0.6 0.7 0.8 0.9

0.0

0.2

0.4

0.6

0.8

1.0

DeterministicManual

Page 51: Attribute Measurement Systems Analysis using A Binary Random

Binary Random Effects Model( )( )ijiijiij

ijijijk

ROgRO

Biny

++= − µµ

µµ1,|

,1~|

ijikijijiijk ROyROy ,|,| ′⊥

ijiiij OyOy || ** ′⊥

**** ii yy ′⊥

( ) ( )[ ]( )[ ]( )∏ ∫∏ ∫

= = +++

++=

O

i

R

ijP

n

iO

n

jRn

ijiji

ijiji dFdFyROyRO

L1 1 .

.

exp1exp

µµ

θ

Page 52: Attribute Measurement Systems Analysis using A Binary Random

Approximated Likelihood

( )( ) ( )

( ) ( )( )[ ]( ) ( )( )[ ]( )

∑∑∏∑

=

===

⎪⎪

⎪⎪

⎪⎪

⎪⎪

+++

++∝

O

P

RRO

n

in

ijRO

ijRO

R

nqn

u

n

jO

nqn

v

yuRvO

yuRvO

uwvw

1

.00

.00

0

11

0

1

22exp1

22explog~

σσµ

σσµθl

Page 53: Attribute Measurement Systems Analysis using A Binary Random

Binary Threshold Model and Its Interpretation in the Nested Model

Logistic Standard~,|iid

ijiijk ROz

).,0(~

),,0(~

,,|

2

2

Rij

Oi

ijkijiijiijk

NR

NO

ROROz

σ

σ

ε++=

µ>ijkz 1=ijky

µ≤ijkz 0=ijky

Page 54: Attribute Measurement Systems Analysis using A Binary Random

R&R Measure

( ) ( )3

222 πσσεµ ++=+++= ROijkijiijk ROVarzVar

( )3

2π=ijkzVarR&R

Non R&R

ijkijiijiijk ROROz ε++=,|

3

3& 222

2

πσσ

π

++=

RO

RR

Page 55: Attribute Measurement Systems Analysis using A Binary Random

Empirical P-Value

⎟⎟⎟

⎜⎜⎜

⎛=

2

1

θ

θθ L

⎩⎨⎧ =

0θ0θ

1

1

f::

1

0

HH

⎟⎟⎟⎟

⎜⎜⎜⎜

=

2ML

1ML

ML

θ

θθ

ˆ

ˆˆ L

⎟⎟⎟

⎜⎜⎜

=

==

2ML2

1

θθ

0θθ

ˆL

D

mD ( )

( )

( ) ⎟⎟⎟⎟

⎜⎜⎜⎜

=m2ML

m1ML

mML

θ

θθ

ˆ

ˆˆ L

( )( )B

ValueP 1MLm1ML θθ ˆˆ# f

=−

Page 56: Attribute Measurement Systems Analysis using A Binary Random

Parametric Bootstrap Confidence Intervals

⎟⎟⎟

⎜⎜⎜

⎛=

2

1

θ

θθ L

⎟⎟⎟⎟

⎜⎜⎜⎜

=

2ML

1ML

ML

θ

θθ

ˆ

ˆˆ L

D ( )

( )

( ) ⎟⎟⎟⎟

⎜⎜⎜⎜

=m2ML

m1ML

mML

θ

θθ

ˆ

ˆˆ L

mD

Page 57: Attribute Measurement Systems Analysis using A Binary Random

Fitting sample data

19.0Value-P Empirical =

10 G.H. Quadrature NodesB=10000

90 % CIParameter

µ

ORσ

( )37.3,47.2

( )48.0,0

( )1.1,0

82.0=RR

Page 58: Attribute Measurement Systems Analysis using A Binary Random

Slice likelihood

X Angle = 240 X Angle = 330

X Angle = 60 X Angle = 150

( )RO σσ ,

Page 59: Attribute Measurement Systems Analysis using A Binary Random

0.1 0.2 0.3 0.4 0.5 0.6SIGMA.O

0.2

0.6

1.0

1.4

SIG

MA

.R

-97.7 -97.5

-97.5

-97.3

-97.3

-97.2

-97.2

-97.0

-97.0

-96.8 -96.6

-96.4

Page 60: Attribute Measurement Systems Analysis using A Binary Random

One Dimensional Slice

stvec.sigmaO

mar

vec

0.02 0.04 0.06 0.08 0.10

-96.

249

-96.

247

-96.

246

-96.

244

Page 61: Attribute Measurement Systems Analysis using A Binary Random

One Dimensional Slice

stvec.sigmaR

mar

vec

0.2 0.4 0.6 0.8 1.0 1.2 1.4

-98.

5-9

8.0

-97.

5-9

7.0

-96.

5

Page 62: Attribute Measurement Systems Analysis using A Binary Random

One Dimensional Slice

stvec.mu

mar

vec

0 1 2 3 4 5 6

-130

-120

-110

-100

µ

Page 63: Attribute Measurement Systems Analysis using A Binary Random

Bootstrapped Distribution

-0.962784-0.351539

0.2597060.870951

1.4821972.093442

2.7046873.315932

3.9271784.538423

5.149

h0.mu.bre

0.0

0.2

0.4

0.6

0.8

1.0

1.2

µ̂

Page 64: Attribute Measurement Systems Analysis using A Binary Random

Bootstrapped Distribution

0.0000000.275758

0.5515150.827273

1.1030311.378788

1.6545461.930303

2.2060612.481819

2.757

h0.sigmaO.bre

0

1

2

3

4

5

Oσ̂

Page 65: Attribute Measurement Systems Analysis using A Binary Random

Bootstrapped Distribution

0.0000000.281217

0.5624340.843651

1.1248691.406086

1.6873031.968520

2.2497372.530954

2.8121

h0.sigmaRO.bre

0.0

0.5

1.0

1.5

2.0

2.5

Rσ̂

Page 66: Attribute Measurement Systems Analysis using A Binary Random

Summary

We discussed good properties of measurement systemsWe applied a model and responded to requirementsWe showed how Bootstrapping methods could be used where we have lack of small sample theory in GLMMs.

Page 67: Attribute Measurement Systems Analysis using A Binary Random

Thanks to

Meeting Organizers Anthony C. Davison