c-sam analysis report - nanolab technologies · csam analysis and results a total of xxx units were...

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C-SAM Analysis Report Job#: ORD - xxxxx Part type: xxx Lot Number: xxx Package type: xxx Quantity: xxx Prepared by: xxx Reviewed by: xxx E-mail: [email protected] Date: xxx Nanolab Technologies , 1708 McCarthy Blvd , Milpitas, California, 95035 USA Tel: (408) 433-3320 Fax: (408) 433-3321 SonoScan C-SAM

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Page 1: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

C-SAM Analysis Report

Job#: ORD - xxxxx Part type: xxx

Lot Number: xxx Package type: xxx

Quantity: xxx

Prepared by: xxx Reviewed by: xxx

E-mail: [email protected] Date: xxx

Nanolab Technologies , 1708 McCarthy Blvd , Milpitas, California, 95035 USA Tel: (408) 433-3320 Fax: (408) 433-3321

SonoScan

C-SAM

Page 2: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

CSAM Analysis and Results

A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope on _____________.

Transducer(s) used: 25 MHz Standard

50 MHz – only if anomalies are found at 25 MHz

Results:

Die surface delamination: xxx

Die attach delamination: xxx

Lead frame delamination: xxx

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C-SAM

Page 3: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

CSAM Gating

Gate starts here, tracking top surface

Top surface signal detected here to start wait time for flaw detection

First gate start

First gate end

Resin

surface

echo

Die echo Echoes originated from die bottom

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C-SAM

Page 4: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

MC Die Top Die Attach + Lead Frame

25 MHz probe focused on die top allows viewing of all 3 layers, MC, Die Top and Die Attach/Lead Frame (as shown)

Identification of QFN layers with 25 MHz probe

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C-SAM

Page 5: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

Die Circuit Surface/Encapsulant Number Affected: xxx Average % xxx %

Location: Corner Edge Center

Die/Die Attach Number Affected: xxx Average % xxx %

Location: Corner Edge Center

Encapsulant/Substrate Number Affected: xxx Average % xxx %

Location: Corner Edge Center

Device cracks present? Yes No

Package cracks present? Yes No

Mold compound voids present? Yes No

Paddle / Device tilt present? Yes No

CSAM Results - Delamination

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C-SAM

Page 6: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

C-SAM Inspection Results

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C-SAM

Page 7: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

Sample Tray - As Received

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Comment: xxx

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C-SAM

Page 8: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

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Comment: xxx

Sample Tray - As Received SonoScan

C-SAM

Page 9: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

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Comment: xxx

Die Top SonoScan

C-SAM

Page 10: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

Die Top Failure - Device XX

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Comment: xxx

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C-SAM

Page 11: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

Die Top: A-Scan

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Comment: xxx

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C-SAM

Page 12: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

Die Attach

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Comment: xxx

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C-SAM

Page 13: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

Die Attach Failure – Device XX

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Comment: xxx

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C-SAM

Page 14: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

Lead Frame

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Comment: xxx

SonoScan

C-SAM

Page 15: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

Lead Frame Failure - Device XX

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Comment: xxx

SonoScan

C-SAM

Page 16: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

Through Scan

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Comment: xxx

SonoScan

C-SAM

Page 17: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

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xxx

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SonoScan

C-SAM

Page 18: C-SAM Analysis Report - Nanolab Technologies · CSAM Analysis and Results A total of xxx units were examined in C-mode and in the Through-Scan mode using the SonoScan Acoustic Microscope

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xxx

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SonoScan

C-SAM