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Chapter 7 102
CHAPTER 7
ELECTRICAL PROPERTIES OF ZnO DOPED
MAGESIUM ALUMIUM SILICATE
GLASS-CERAMICS
Chapter 7 103
CHAPTER 7
ELECTRICAL PROPERTIES OF ZnO DOPED
MAGNESIUM ALUMINUM SILICATE GLASS-CERAMICS
The effect of ZnO doping on structural, dielectric and electrical properties of magnesium
aluminum silicate (MAS) glass-ceramic has been investigated in this chapter.
7.1 MATERIAL PREPARATION
In the process of investigation on the doping effect of ZnO in MAS glass-ceramic, the
compositions studied were represented by the general formula (18.5 – x) MgO-xZnO-
16.5Al2O3-47.5SiO2-9.5K2O-8B2O3 with x = 0.0, 0.1 wt.%, 0.3 wt.% and 0.5 wt.%. The
components SiO2 (99.9 %), Al2O3 (99.9 %), MgO (99.9 %); KO (99.9 %); B2O3 (99.9 %)
and ZnO (99.9 %) in proper weight percentages were thoroughly mixed in agate mortar for
2 h, including wet mixing in acetone media for 1 h. The mixture was then calcined at 950
oC for 6 h. 7 wt.% MgF2 was added to the calcined charge and was pulverized using agate
mortar and pestle for 2 h. Finely milled charge was seasoned in 5% H3PO4 acid solution in
acetone medium for a period up to 72 h. Cylindrical pellets of diameter 12 mm and
thickness 3 mm were prepared in a hydraulic press using 80 MPa pressure. Those were then
sintered using a two-step heating program. In the first step, the compact was heated up to
670-700 oC for 2- 4 h to ensure good nucleation and to initiate crystal growth. These pellets
were then sintered with optimized temperature and time (1000 oC, 3 h) in air atmosphere.
The bulk densities and apparent porosities of the sintered samples were measured by
Archimedes method (i.e. immersion in deionised water).
Chapter 7 104
7.2 MATERIAL CHARACTERIZATION
7.2.1 X-ray diffraction
Figure 7.1 shows the X-ray diffraction patterns of the samples sintered at 1000 oC. The
XRD analysis of the samples revealed that the predominant crystalline phases were found
to be Magnesium Silicate Fluoride and Cordierite, together with minor traces of Phlogopite
and Sapphirine. Addition of small amounts of ZnO does not impede the formation of
Cordierite and Magnesium Silicate Fluoride. Thus, the basic structure of the sample
remains unchanged when doped with ZnO.
Fig. 7.1 XRD patterns of ZnO doped MAS glass-ceramics
The measured bulk densities of the samples sintered at 1000 oC are shown in Fig. 7.2. Bulk
densities of the samples increased with ZnO content and is found to be maximum for x =
0.5 wt% ZnO doped MAS glass-ceramics as shown in Fig. 7.2.
Chapter 7 105
Fig. 7.2 Bulk density of the MAS glass-ceramics doped with xZnO (x = 0.0, 0.1, 0.3 and
0.5) sintered at 1000 oC.
7.2.2 Scanning electron microscopy
Figure 7.3 shows the microstructures of samples with different ZnO content sintered at
1000 oC. The micrographs show that the percentage of ZnO addition affects the
microstructure. From picture (a), it can be seen that the specimen was not dense and the
grain did not grow for 0.0 wt% ZnO doped MAS glass-ceramics. Picture (b), picture (c)
and picture (d) show that the grain size increased with the increase of ZnO addition due to
the liquid phase effect resulting from addition of ZnO. It is seen that the porosity decreased
with increasing ZnO content and the sample with 0.5 wt% ZnO has the lowest porosity
compared to others. This result corresponds to the relative density of samples as shown in
Fig. 7.2. When the ZnO content increased to 0.5 wt%, the grains of samples were in close
contact and there was little porosity, which is consistent with the result of bulk densities.
Fig (c) and (d) shows plate-like microstructure with some needle like grains.
Chapter 7 106
Fig. 7.3 SEM micrographs of the samples with different ZnO contents sintered at 1000 oC.
(a) 0 wt%, (b) 0.1 wt%, (c) 0.3 wt%, (d) 0.5 wt%
7.3 DIELECTRIC STUDIES
Figure 7.4 shows the variation of relative dielectric constant (εr) and dielectric loss (tanδ)
with ZnO content at 1 MHz at room temperature. The dielectric constant of the sample
strongly depends on its density [75]. The relative dielectric constant generally increases on
increasing ZnO concentration. From Fig. 7.4, it is evident that x = 0.5 possesses highest
dielectric constant, which may be due to its high density and low apparent porosity. From
Fig. 7.4, it is observed that tanδ decreases on increasing ZnO content, which may be
attributed to the porosity decrease owing to the increase in bulk density. From Fig. 7.4, it is
evident that 0.5 wt% ZnO doped MAS glass ceramic also possesses low dielectric loss.
Chapter 7 107
Fig. 7.4 Variation of relative dielectric constant (εr) and dielectric loss (tanδ) with ZnO
contents at room temperature.
The variation of relative dielectric constant (εr) and dielectric loss (tanδ) of all the samples
with temperature at 10 kHz is shown in Fig. 7.5(a) and (b) respectively. Both density and
the type of phase play a significant role in the dielectric constant of the samples. The
dielectric constant shows the same tendency of the bulk density. It is understood that higher
density will lead to higher dielectric constant owing to lower porosity. It is observed that,
initially, the value of εr increases with rise in temperature for all the samples. The peak
value of dielectric constant (εr) increases with increase in concentration of ZnO (x = 0.3 and
x = 0.5) in MAS glass-ceramic as compared to the pure one. The broadening of dielectric
peaks may be attributed to the disorder present in the systems. XRD analysis of the samples
revealed that no additional phases are formed in ZnO doped MAS glass-ceramics as
compared to the pure one. This suggests that increase in density would be responsible for
the variation in dielectric constant of samples. ZnO doped MAS glass-ceramics exhibit
interfacial or space charge polarization arising from the differences amongst the
conductivity of various phases. Due to the presence of phases of different conductivity,
motion of charge carriers occurs readily through one phase but is interrupted when it
arrives at the boundary of other phases. This causes a build-up of charge at the interface,
Chapter 7 108
which corresponds to a large polarization and high value of effective dielectric constant.
The increase of εr at higher temperatures may be due to weakening of binding force
between the ions leading to mobile ion contribution.
The dielectric loss (tanδ) is another parameter, which makes it possible to distinguish
between samples of different compositions. Density also plays an important role in
controlling the dielectric loss. Dielectric loss of the samples decreased subsequently with
increasing ZnO content. This might be due to the fact that the density of the samples
increased with increasing ZnO content. It is clear from Fig. 7.5(b) that the dielectric loss is
found to be minimum for x = 0.5, due to its high bulk density. The rapid increase of
dielectric loss at higher temperatures may be due to space charge polarization. It is found
that tanδ increases with increasing temperature because of fast movement of the ions in the
glass network and their increased response to an electric field with increasing temperature.
In addition, the high loss factor of ZnO doped MAS glass-ceramic at higher temperatures is
due to the large glass content and to the high mobility of alkali (K+) and F
- ions. It is clear
that the sample with 0.5 wt% ZnO has the best dielectric property, since; it possesses the
lowest dielectric loss.
Fig. 7.5 Variation in (a) εr and (b) tanδ of ZnO doped MAS glass-ceramics with
temperature at 10 kHz for different x.
Chapter 7 109
7.4 IMPEDANCE ANALYSIS
Figure 7.6 shows the complex impedance plots (Z′ vs Z′′) of ZnO doped MAS glass-
ceramics at different temperatures over a wide range of frequency (100 Hz – 5 MHz). The
Nyquist plots of all samples show a depressed semicircular arc whose center lies below the
real (Z′) axis. The nature of the plots confirms the presence of non-Debye and
polydispersive relaxation process in the samples. The shape of our plots suggests that the
impedance has contribution from the bulk (grain) as well as grain boundary at high
temperatures. From the graph it is clear that as the temperature increases intercept along the
real (Z′) axis shifts towards the origin indicating the increase in bulk conductivity of the
materials. The effect of ZnO concentration in the impedance plots of MAS glass-ceramic is
clearly seen in Fig. 7.7. Figure 7.7 shows the impedance plot as a function of composition
at 400 oC. It is observed that as the ZnO concentration increases the bulk resistance
increases. It is observed that the grain boundary contribution decreases for x = 0.5 wt%
ZnO doped MAS glass-ceramic. The impedance data were analyzed in order to obtain the
bulk resistance (Rb), and bulk capacitance (Cb) of the samples. The value of Rb can be
obtained from the intercept on the Z′ axis, the variation of which with ZnO concentration at
400 oC is shown in Fig. 7.8. It is evident from Fig. 7.8 that the bulk resistance (Rb)
increases with an increase in ZnO concentration and is found to be maximum for 0.5 wt%
ZnO doped MAS glass-ceramic. These values were used to calculate the bulk capacitance
(Cb) using the relation ωmaxRbCb = 1, where ωmax (=2πfmax) is the angular frequency at the
maxima of the semicircle. The variation of Cb with ZnO concentration at 400 oC is shown
in Fig. 7.8 [inset]. It is clear that the bulk capacitance (Cb) increases with increase in ZnO
concentration and is found to be maximum for 0.5 wt% ZnO doped MAS glass-ceramic.
Chapter 7 110
Fig. 7.6 Nyquist plots of ZnO doped MAS glass-ceramics at four different temperatures
Fig. 7.7 Comparison of Nyquist plots of ZnO doped MAS glass-ceramics at 400 oC
Chapter 7 111
Fig. 7.8 Variation of Rb and Cb (inset) with ZnO concentration at 400 oC
Figure 7.9 shows the variation of imaginary part of impedance [Z′′] with frequency at four
different temperatures for ZnO doped MAS glass-ceramics. The curves show that the value
of Z′′ reaches maximum value of Z′′max at all temperatures. The average peak position
regularly changes towards the higher frequency side on increasing temperature for all the
samples. The Z′′ spectra are broadened on the low frequency side of the maximum peak
showing a departure from the ideal Debye-like behavior. The asymmetric peaks imply the
existence of electrical processes in the samples with spread of relaxation time. Furthermore,
as the temperature increases the magnitude of Z′′ decreases, the effect being more
pronounced at the peak position. The shift of the peak towards higher frequency on
increasing the temperature is due to the reduction in the bulk resistivity of all the samples.
The effect of increase of ZnO concentration on the electrical behavior of the samples can
clearly be seen in terms of variation in the magnitude of Z′′, peak broadening and
asymmetry.
Chapter 7 112
Fig. 7.9 Variation of imaginary part of impedance (Zʹʹ) of ZnO doped MAS glass-ceramic
as a function of frequency for different ZnO concentrations at different temperatures.
7.5 MODULUS STUDIES
Figure 7.10 show the variation of imaginary part of electric modulus (M′′) of ZnO modified
MAS glass-ceramics with frequency at different temperatures. The frequency region below
the M′′ peak indicates the range in which charge carriers are mobile over long distances. In
the frequency range (≥ peak frequency), the charge carriers are spatially confined to
potential wells and free to drift within the wells. It is observed that the maxima M′′max shifts
Chapter 7 113
towards higher frequencies with a rise in temperature. The observed M′′ peaks of the plots
are related to conductivity relaxation of the materials. Figure 7.11 shows that the height and
broadening of the modulus peak appear to decrease with an increase in ZnO concentration.
The decrease in the M′′ peak height on increasing x suggests an enhancement in the
capacitance value of the sample (Fig. 7.8) on substitution of Zn in the compound [66]. This
observation appears to be in good agreement with the complex impedance spectrum, and is
expected to cause an increase in the dielectric properties of the materials.
Fig. 7.10 Variation of imaginary part of modulus (M′′) with frequency of (a) 0.0 wt% (b)
0.1 wt% (c) 0.3 wt% and (d) 0.5 wt% ZnO doped MAS glass-ceramic at selected
temperatures
Chapter 7 114
Fig. 7.11 Variation of imaginary part of modulus (M′′) with frequency for different ZnO
concentrations at 400 oC and 450
oC [inset]
The impedance and modulus spectroscopic plots (Z′′ and M′′ versus frequency f) are
complementary to each other. As suggested by Sinclair and West [76], a combined plot of
imaginary modulus (M′′) and impedance (Z′′) as a function of frequency is useful to detect
the effect of the smallest capacitance and large resistance. It is advantageous to plot Z′′ and
M′′ versus frequency simultaneously. This helps us in distinguishing whether the relaxation
process is due to short range or long-range movement of charge carriers. If the process is
long range, then the peak in M′′ versus frequency and Z′′ versus frequency will occur at the
same frequency and if the process is localized these peaks will occur at different
frequencies. Fig.7.12 shows the impedance and modulus plots (Z′′ and M′′ versus
frequency f) of ZnO doped MAS glass-ceramics for different ZnO concentrations at a
particular temperature (450 oC). This figure exhibits appreciable mismatch between the Z′′
and M′′ peaks for different ZnO concentrations. Even though Zn has been substituted at the
Mg sites, the mismatch between the peaks of Z′′ and M′′ frequency plots are observed for
all compositions. The existence of an appreciable separation between these peaks suggests
Chapter 7 115
the presence of localized movement of charge carriers (via hopping type mechanism) and
departure from an ideal Debye-like behavior [77] for all ZnO modified MAS glass-
ceramics. The broad and asymmetric peaks of all the samples irrespective of ZnO
concentrations suggest the existence of a distribution of relaxation times.
Fig. 7.12 Variation in Z′′ and M′′ with frequency at a particular temperature for different x.
Figure 7.13 shows the variation of most probable relaxation time (determined from the
position of the loss peak in the Zʹʹ or M′′ versus ln(f) plots) with inverse of absolute
temperature (i.e., τ versus 103/T) for different ZnO concentrations at high temperature
region. The graph follows the Arrhenius relation, τ = τoexp (-Ea/KBT) (where τo pre-
exponential factor, Ea activation energy, KB Boltzmann constant and T absolute
temperature). The activation energy (Ea) values obtained from the impedance (Z′′) spectrum
represents the localized conduction (i.e., dielectric relaxation) and that obtained from the
Chapter 7 116
modulus (M′′) spectrum represents nonlocalized conduction (i.e., long range conduction).
The relaxation time is thermally activated process and the activation energy values of the
samples obtained from the Z′′ spectra (Fig. 7.13(a)) are found to be in the range of 0.62 eV
to 1.05 eV. The Ea values of the samples calculated from the impedance spectrum
decreases with the increase of ZnO content and is found to be minimum for x = 0.5 wt%
ZnO doped MAS glass-ceramic. When Zn2+
is substituted at the Mg2+
sites, there may be a
change in the concentration of oxygen vacancies due to the variable oxidation states of Mg
and Zn in MAS glass-ceramic. With the increase in Zn concentration, there may be an
increase in oxygen vacancies leading to an increase in the number of conducting electrons.
So the activation energy decreases with an increase in Zn concentration. This change in
behavior indicates the participation of Zn ions in the relaxation and conductivity process.
With the help of modulus plot, variation of most probable conduction relaxation time (τ)
with temperature is shown in Fig. 7.13(b). The values of Ea obtained from the M′′ spectra
are found to be in the range of 0.37 eV to 0.78 eV which is similar to those for ionic
conductivity and oxygen vacancy migration. It is clear that the activation energy of x = 0.5
wt% ZnO doped MAS glass-ceramic (calculated from impedance and modulus spectrum) is
equal and this suggests that the nature of species taking part in both localized and
nonlocalized conductions is same.
Chapter 7 117
Fig. 7.13 Variation of relaxation time (τ) obtained from (a) Z′′ spectra and (b) M′′ spectra of
samples with temperatures for x=0, 0.1, 0.3 and 0.5
7.6 CONDUCTIVITY STUDIES
The frequency dependence of ac conductivity, σ (ω), at various temperatures for all samples
is shown in Figure 7.14. The pattern of conductivity spectrum shows low-frequency plateau
and high-frequency dispersion (for x = 0.1 wt.%, 0.3 wt.% and 0.5 wt.%) with a change in
slope at x = 0.0 wt.%. At low frequency, the conductivity shows a flat response which
corresponds to the dc part of the conductivity. It is clear from the graphs that the flat region
increases with the increase in temperature. The attainment of low-frequency plateau in the
material was found to be more pronounced at higher concentration of ZnO. The decrease in
bulk resistance of all the samples with increase in temperature is also evidenced in the plot
since the conductivity increases with rise in temperature. The higher values of conductivity
at higher temperatures are possibly due to the movement of mobile ions. Although an
enhancement in the conductivity with the ZnO doping is evident in Fig. 7.14, the origin of
the enhancement is not clear at present. ZnO doped samples have higher density which may
contribute to the conductivity increase. It may be due to the easy migration of K+ and F
-
ions through the ZnO doped MAS glass-ceramics. The explanation of the enhancement,
Chapter 7 118
however, is still controversial and further study is needed to elucidate the conductivity
enhancement mechanism. At higher frequencies, the conductivity starts increasing and a
remarkable dispersion has been observed. It is clearly seen that the frequency at which the
dispersion becomes predominant shifts towards higher frequency regions as the
temperature increases. The conductivity dispersion, suggests that the electrical conduction
of the compounds is a thermally activated process which obeys the Jonscher’s law,
σac = σ0 + Bωn, where σ0 is the dc conductivity at a particular temperature, B is the
temperature dependent constant and n is the power law exponent which generally lies
between 0 and 1. The exponent n represents the degree of interaction between the mobile
ions.
The variation in exponent n as a function of temperature is represented in Fig. 7.15.
It is well-known that the mechanism of conductivity in any material can be understood
from the temperature dependent behavior of n. The decrease in the value of n with the
increase in temperature suggests that the charge transport between localized states takes
place due to hopping over the potential barriers. This suggests that the conductivity
behavior of ZnO doped MAS glass-ceramics can be explained using the correlated barrier
hopping (CBH) model.
Chapter 7 119
Fig. 7.14 Variation of ac conductivity of samples with frequency at different temperatures
Fig. 7.15 Variation of n as a function of temperature for all the samples
The temperature dependence of DC conductivity shown in Fig. 7.16 for all the samples
obeys Arrhenius relation. The activation energies for all the compositions are calculated
and listed in Table 7.1. It is observed that the activation energy is higher in ZnO doped
samples compared to the pure one. The conductivity of ZnO doped MAS glass-ceramic is
appreciably greater than that of pure MAS glass-ceramic. It is also observed that the
enhancement in conductivity is three to four orders within the composition range studied as
shown in Table 7.1 at 500 oC. It is worth noting that the activation energies for long range
Chapter 7 120
conduction and dc conduction are in close agreement. It suggests that similar energy
barriers are involved in both the long range and dc conduction processes. It is observed that
for x = 0.5 wt% ZnO doped MAS glass-ceramics; the activation energies for relaxation
process and dc conduction are in close agreement. It suggests that similar energy barriers
are involved in both the relaxation and conduction processes of 0.5 wt% ZnO doped MAS
glass-ceramics.
Fig. 7.16 Variation of σ dc with inverse of absolute temperature of all the samples at high
temperature
Table 7.1 DC conductivity and activation energy of ZnO doped MAS glass-ceramic
x
Ea (eV) σ (Ω-1
m-1
) at 500 oC
x = 0.0
x = 0.1
x = 0.3
x = 0.5
0.58
0.75
0.72
0.67
1.93 × 10-7
1.57 × 10-3
1.01 × 10-3
7.22 × 10-4
Chapter 7 121
7.7 CONCLUSIONS
The polycrystalline ZnO doped MAS glass-ceramics were prepared via sintering route.
Addition of ZnO can greatly improve the dielectric properties of MAS glass-ceramic. The
porosity is an important factor affecting the dielectric loss of the samples. The dielectric
constant of the samples was determined by the dual action of the density and the type of
crystalline phase. The dielectric constant increases and the dielectric loss decreases
significantly as the ZnO concentration increases. From the dielectric studies, one may
assume 0.5 wt% ZnO doped MAS glass-ceramic sample as a good dielectric material since
it possesses low dielectric loss. The electrical parameters such as the bulk resistance (Rb)
and bulk capacitance (Cb) were obtained using complex impedance spectroscopy. The bulk
resistance (Rb) decreases with a rise in temperature for all the compositions under study. It
is observed that as the ZnO concentration increases the bulk resistance increases. It is clear
that the bulk capacitance (Cb) increases with increase in ZnO concentration and is expected
to cause enhancement in the dielectric properties of the material with increase in ZnO
concentration. The Jonscher’s power law formalism was used to analyze the ac
conductivity. The conductivity increases with the increase in ZnO concentration. This may
be due to the easy migration of K+ and F
- ions in the ZnO doped MAS glass-ceramics. The
temperature dependence of DC conductivity obeys Arrhenius behavior for all the samples
under study. It is observed that similar energy barriers are involved in both the relaxation
and conduction processes of 0.5 wt% ZnO doped MAS glass-ceramics. The activation
energy associated with the dielectric relaxation determined from the electric modulus
spectra was found to be close to that of the activation energy for dc conductivity.