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CTK Co., Ltd. 386-1, Ho-dong, Cheoin-gu, Yongin-si, Gyeonggi-do, 449-100, Korea
Tel: +82-31-339-9970 Fax: +82-31-339-9855 www.e-ctk.com
Test Report No.: 2009120070 Date: December 29, 2009
Page 1 of 58
This Report shall not be reproduced except in full without the written approval of CTK Form No.: CTK-RF-EC-EN55022&EN50130-4(Rev.4.5)
EMC TEST REPORT For CE Test Report No. : 2009120070 Date of Issue : December 29, 2009 Model/Type No. : SCD-2020P, SCD-2040P and SCD-2021P Kind of Product : CCD Camera Applicant : SAMSUNG TECHWIN CO., LTD. Applicant Address : #145-3, Sangdaewon 1-Dong, Jungwon-Gu, Sungnam-Shi,
Kyonggi-Do, Korea Manufacturer : 1. SAMSUNG TECHWIN CO., LTD. 2. TIANJIN SAMSUNG TECHWIN OPTO-ELECTRONICS CO., LTD. Manufacturer Address : 1. #42 Seongju-Dong, Changwon-Shi, Kyungsangnam-Do, Korea 2. #No. 11 Wei Liu road Micro-electronic industrial park Teda Tianjin China Contact Person : Mr. Young-Soon, Choi (Manager) Telephone : +82-31-740-8731 Received Date : December 21, 2009 Test period : Start : December 22, 2009 End : December 28, 2009 Test Results : In Compliance Not in Compliance The test results presented in this report relate only to the object tested. Tested by Reviewed by
Hye-Young, Lee EMC Test Engineer
James Hong EMC Technical Manager
Date: December 29, 2009 Date: December 29, 2009
CTK Co., Ltd. 386-1, Ho-dong, Cheoin-gu, Yongin-si, Gyeonggi-do, 449-100, Korea
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REPORT REVISION HISTORY
Date Revision Page No December 29, 2009 Original Issued (2009120070) All
This report shall not be reproduced except in full, without the written approval of CTK Co., Ltd. This document may be altered or revised by CTK Co., Ltd. personnel only, and shall be noted in the revision section of the document. Any alteration of this document not carried out by CTK Co., Ltd. will constitute fraud and shall nullify the document.
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TABLE OF CONTENTS REPORT REVISION HISTORY..........................................................................................2 1.0 General Product Description ...............................................................................4 1.1 Model Differences .............................................................................................4 1.2 Device Modifications .........................................................................................4 1.3 EUT Configuration(s).........................................................................................5 1.4 Test Software...................................................................................................6 1.5 EUT Operating Mode(s) .....................................................................................6 1.6 Configuration ...................................................................................................7 1.7 Calibration Details of Equipment Used for Measurement .........................................8 1.8 Test Facility......................................................................................................8 1.9 Laboratory Accreditations and Listings .................................................................8 2.0 Emissions Test Regulations.................................................................................9 2.1 Conducted Voltage Emissions ........................................................................... 10 2.2 Radiated Electric Field Emissions....................................................................... 11 2.3 Harmonic Current Emissions ............................................................................ 12 2.4 Voltage Fluctuations and Flicker........................................................................ 13 3.0 Immunity Test Regulations............................................................................... 14 3.1 Criteria for compliance .................................................................................... 15 3.2 Electrostatic Discharge .................................................................................... 17 3.3 Radiated Electromagnetic Fields........................................................................ 19 3.4 Fast Transients Bursts ..................................................................................... 22 3.5 Slow High Energy Voltage Surge ....................................................................... 24 3.6 Conducted Disturbance.................................................................................... 27 3.7 Mains Supply Voltage Variations........................................................................ 30 3.8 Mains Supply Voltage Dips and Short Interruptions.............................................. 31 APPENDIX A - Test Setup Photos and Configuration ......................................................... 33
Conducted Voltage Emissions ................................................................................. 33 Radiated Electric Field Emissions............................................................................. 34 Voltage Fluctuations and Flicker .............................................................................. 35 Electrostatic Discharge .......................................................................................... 36 Radiated Electromagnetic Fields.............................................................................. 37 Fast Transients Bursts ........................................................................................... 38 Slow High Energy Voltage Surge ............................................................................. 39 Conducted Disturbance.......................................................................................... 40 Mains Supply Voltage Dips and Short Interruptions.................................................... 41
APPENDIX B – TEST DATA ........................................................................................... 42 Conducted Voltage Emissions (for EUT Input Power : 12 Vdc)...................................... 42 Conducted Voltage Emissions (for EUT Input Power : 24 Vac)...................................... 44 Radiated Electric Field Emissions (for EUT Input Power : 12 Vdc) ................................. 46 Radiated Electric Field Emissions (for EUT Input Power : 24 Vac) ................................. 47 Harmonic Current Emissions and Voltage Fluctuations and Flicker ................................ 48
APPENDIX C – EUT Photographs ................................................................................... 52 EUT External Photographs...................................................................................... 53 EUT Internal Photographs ...................................................................................... 54 PCB .................................................................................................................... 55
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1.0 General Product Description 1.0.1 Tested Equipment
Unless otherwise indicated, all tests were conducted on Model SCD-2020P.
Tests performed on Model SCD-2020P were considered to be representative of Model(s) SCD-2040P and SCD-2021P.
1.0.2 Equipment Size, Mobility and Identification
Dimensions: Approx. 107.6(φ) by 83.7(H) mm inch Mobility: Hand-held Table-top Built-in Traveling Stationary Serial No.: Prototype
1.0.3 Electrical Ratings
EUT Input: 12 Vdc, 24 Vac
Output: -
1.0.4 Test Voltage & Frequency
Unless indicated otherwise on the individual data sheet or test results, the test voltage and frequency was as indicated below.
Voltage: 230 Vac Frequency: 50 Hz
1.0.5 Clock & Other Frequencies Utilized 28.6363 MHz
1.1 Model Differences
Model name Focal Lenth SCD-2020P 3.7 mm SCD-2040P 8.0 mm SCD-2021P 3.7 mm(Basic LENS) + 8.0 mm(Option LENS)
* The model SCD-2020P is tested.
1.2 Device Modifications The following modifications were necessary for compliance:
Not applicable
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1.3 EUT Configuration(s) See Appendix A for individual test set-up configuration(s). The following peripheral devices and/or interface cables were connected during the measurement: [EUT Input Power : 12 Vdc]
Peripheral Devices
Device Manufacturer Model No. Serial No. CCTV MONITOR HITRON SYSTEMS INC. CVM1574FNKR CM7110021 SWITCHING ADAPTER Dee Van Electronics(ShenZhen)Co., Ltd. DSA-60W-12 1 12048 3707
Cable Description
# Description Ferrite Core
Length (m) Other Details
1 SWITCHING ADAPTER Power Cable, Unshielded No 1.8 Connect to AC power 2 EUT DC Input Cable, Unshielded Yes 1.8 Between a SWITCHING ADAPTER and the EUT 3 CCTV MONITOR Power Cable, Unshielded No 1.8 Connect to AC power 4 BNC Cable, Shielded Yes 3.6 Between a CCTV MONITOR and the EUT
[EUT Input Power : 24 Vac]
Peripheral Devices
Device Manufacturer Model No. Serial No. CCTV MONITOR HITRON SYSTEMS INC. CVM1574FNKR CM7110021 AC/AC Adaptor Dream Electronic Co., Ltd. STA-230 -
Cable Description
# Description Ferrite Core
Length (m) Other Details
1 AC/AC Adaptor Power Cable, Unshielded No 1.8 Connect to AC power 2 EUT AC Input Cable, Unshielded Yes 2.6 Between an AC/AC Adaptor and the EUT 3 CCTV MONITOR Power Cable, Unshielded No 1.8 Connect to AC power 4 BNC Cable, Shielded Yes 3.6 Between a CCTV MONITOR and the EUT
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1.4 Test Software EMC Test V 1.0 Display Test Patterns – V1.5
Ping.exe Not applicable
1.5 EUT Operating Mode(s) Equipment under test was operated during the measurement under the following conditions:
Standby Scrolling ‘H’ Display circles pattern Read / Write Practice operation – Monitoring the EUT’s video signal.
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1.6 Configuration [EUT Input Power : 12 Vdc]
[EUT Input Power : 24 Vac]
AC Power
SWITCHING ADAPTER
EUT (SCD-2020P)
CCTV MONITOR
AC Power
AC/AC Adaptor
EUT (SCD-2020P)
CCTV MONITOR
3
1
4
2
1
2
3
4
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1.7 Calibration Details of Equipment Used for Measurement Test equipment and test accessories are calibrated on regular basis. The maximum time between calibrations is one year or what is recommended by the manufacturer, whichever is less. All test equipment calibrations are traceable to the Korea Research Institute of Standards and Science (KRISS), therefore, all test data recorded in this report is traceable to KRISS.
1.8 Test Facility The measurement facility is located at 386-1, Ho-dong, Cheoin-gu, Yongin-si, Gyeonggi-do, 449-100, Korea. The sites are constructed in conformance with the requirements of ANSI C63.7, ANSI C63.4 and CISPR Publication 22.
1.9 Laboratory Accreditations and Listings
Country Agency Scope of Accreditation Logo USA FCC 3 & 10 meter Open Area Test Sites and one
conducted site to perform FCC Part 15/18 measurements.
93250
JAPAN VCCI 10 meter Open Area Test Site and one conducted site.
R-948, C-986
KOREA KCC EMI (10 meter Open Area Test Site and two conducted sites) EMS (ESD, RS, EFT/Burst, Surge, CS, Magnetic, Dips and interruptions)
No. 51, KR0025
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2.0 Emissions Test Regulations The emissions tests were performed according to following regulations:
EMC – Directive 2004/108/EC
EN 61000-6-3:2007
EN 61000-6-4:2007
EN 55011:2007 +A2:2007 Group 1 Group 2 Class A Class B
EN 55013:2001 +A1:2003 +A2:2006
EN 55014-1:2006
EN 55015:2006
EN 61204-3:2000 Class A Class B
EN 61131-2:2003
EN 61326-1:2006 Class A Class B
EN 55022:2006 Class A Class B
EN 61000-3-2:2006
EN 61000-3-3:1995 +A1:2001 +A2:2005
VCCI V-3/2008.04 Class A Class B
AS/NZS CISPR22:2006 Class A Class B
FCC Part 15 Subpart B Class A Class B
CISPR 22:2006 Class A Class B
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2.1 Conducted Voltage Emissions Test Date December 22, 2009 Test Location Shielded Room Test Equipment
Name of Equipment Manufacturer Model No. Serial No. Due Date Field Strength Meter Rohde & Schwarz ESHS30 828144/002 2010-02-27 LISN EMCO 3825/2 9607-2575 2010-08-07 LISN EMCO 3825/2 9409-2246 2010-08-07 Field Strength Meter Rohde & Schwarz ESHS30 862024/001 2010-03-04 LISN Rohde & Schwarz ESH3-Z5 100207 2010-12-15 LISN EMCO 3825/2 9206-1971 2010-12-16
Frequency Range of Measurement
150 kHz to 30 MHz Instrument Settings IF Band Width: 9 kHz Test Results The requirements are:
MET (for EUT Input Power: 12 Vdc) Frequency
(MHz) Measured Data
(dBuV) Margin (dB)
Remark
16.77 38.7 34.3 Quasi-peak
MET (for EUT Input Power: 24 Vac) Frequency
(MHz) Measured Data
(dBuV) Margin (dB)
Remark
0.34 56.5 9.5 Average
NOT MET Frequency
(MHz) Measured Data
(dBuV) Margin (dB)
Remark
NOT APPLICABLE Remarks
See Appendix B for test data.
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2.2 Radiated Electric Field Emissions Test Date December 22, 2009 Test Location Testing was performed at a test distance of 10 meter Open Area Test Site Test Equipment
Name of Equipment Manufacturer Model No. Serial No. Due Date Field Strength Meter Rohde & Schwarz ESVS30 826638/008 2010-08-10 ULTRA Broadband Antenna Rohde & Schwarz HL562 361324/014 2011-11-18 Biconical Antenna EMCO 3110 9202-1510 2010-05-07 Log-periodic Antenna EMCO 3146 9607-4567 2010-05-07 AMPLIFIER Sonoma Instrument Co. 310 291721 2010-05-07
Frequency Range of Measurement 30 MHz to 1 GHz Instrument Settings IF Band Width: 120 kHz Test Results The requirements are: MET (for EUT Input Power: 12 Vdc)
Frequency (MHz)
Measured Data (dBuV)
Margin (dB)
Remark
100.25 23.2 16.8 Quasi-peak
MET (for EUT Input Power: 24 Vac) Frequency
(MHz) Measured Data
(dBuV) Margin (dB)
Remark
459.15 30.4 16.6 Quasi-peak
NOT MET Frequency
(MHz) Measured Data
(dBuV/m) Margin (dB)
Remark
NOT APPLICABLE Remarks See Appendix B for test data.
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2.3 Harmonic Current Emissions Test Date Not Applicable
Test Location Shielded Room
Test Equipment
Name of Equipment Manufacturer Model No. Serial No. Due Date Universal Power Analyzer Voltech PM6000 200006700362 2010-10-30 AC POWER SOURCE Schaffner NSG1007-3-240 54350 2010-03-31
Classification Of Equipment for Harmonic Current Emissions Class A Class B Class C Class D Test Results
[EUT Input Power: 12 Vdc]
MET NOT MET NOT APPLICABLE
[EUT Input Power: 24 Vac]
MET NOT MET NOT APPLICABLE Remarks
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2.4 Voltage Fluctuations and Flicker Test Date December 28, 2009
Test Location Shielded Room
Test Equipment
Name of Equipment Manufacturer Model No. Serial No. Due Date Universal Power Analyzer Voltech PM6000 200006700362 2010-10-30 AC POWER SOURCE Schaffner NSG1007-3-240 54350 2010-03-31
Test Results The requirements are:
[EUT Input Power: 12 Vdc] MET NOT MET NOT APPLICABLE
[EUT Input Power: 24 Vac]
MET NOT MET NOT APPLICABLE Remarks
See Appendix B for test data.
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3.0 Immunity Test Regulations
The immunity tests were performed according to following regulations:
EMC – Directive 2004/108/EC
EN 61000-6-1:2007
EN 61000-6-2:2005
EN 50130-4:1995 +A1:1998 +A2:2003
EN 61204-3:2000 Low severity level – residencial, commecial or light-industrial environments High severity level – industrial environment
EN 55014-2:1997 +A1:2001
EN 55024:1998 +A1:2001 +A2:2003
EN 60601-1-2:2007
EN 61326-1:2006
EN 61000-4-2:1995 +A1:1998 +A2:2001 EN 61000-4-3:2006 EN 61000-4-4:2004 EN 61000-4-5:2006 EN 61000-4-6:2007 EN 61000-4-8:1993 +A1:2001 EN 61000-4-11:2004
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3.1 Criteria for compliance Criteria for compliance was based on the following guidelines:
Test Item Criteria for compliance Electrostatic Discharge There shall be no damage, malfunction or change of status due to the
conditioning. Flickering of an indicator during the application of the discharges is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. The EUT shall meet the acceptance criteria for the functional test, after the conditioning.
Radiated Electromagnetic Fields
There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change, and no such flickering of indicators occurs at a field strength of 3 V/m. For components of CCTV systems, where the status is monitored by observing the TV picture, then deterioration of the picture is allowed at 10 V/m, providing. a) there is no permanent damage or change to the EUT (e.g. no corruption of
memory or changes to programmable settings etc.); b) at 3 V/m, any deterioration of the picture is so minor that the system
could still be used; and c) there is no observable deterioration of the picture at 1 V/m.
For components with radio links, it is accepted that communications via the radio link may not be possible during the conditioning within the transmitter and receiver exclusion bands defined in the relevant part of ETSI EN 301 489 for that type of radio link equipment. If the EUT is designed to detect and indicate this loss of communication, then this indication is permitted, providing it is in accordance with the manufacturer’s specification. It may be necessary to use appropriate filters to ensure that failures out of the exclusion bands are not due to harmonics generated by the test system. The EUT shall meet the acceptance criteria for the functional test, after the conditioning.
Fast Transients Bursts There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of the bursts is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. The EUT shall meet the acceptance criteria for the functional test, after the conditioning.
Slow High Energy Voltage Surge
There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of the surges is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. The EUT shall meet the acceptance criteria for the functional test, after the conditioning.
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Conducted Disturbance
There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change, and no such flickering of indicators occurs at Uo = 130 dBuV. For components of CCTV systems, where the status is monitored by observing the TV picture, then deterioration of the picture is allowed at Uo = 140 dBuV, providing: a) there is no permanent damage or change to the EUT (e.g. no corruption of
memory or changes to programmable settings etc.); b) at Uo = 130 dBuV, any deterioration of the picture is so minor that the
system could still be used, and; c) there is no observable deterioration of the picture at Uo = 120 dBuV.
The EUT shall meet the acceptance criteria for the functional test, after the
conditioning.
Mains Supply Voltage Variations
There shall be no damage, malfunction or change of status due to the different supply voltage conditions. The EUT shall meet the acceptance criteria for the functional test, during the conditioning.
Mains Supply Voltage Dips and Short Interruptions
There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. The EUT shall meet the acceptance criteria for the functional test, after the conditioning.
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3.2 Electrostatic Discharge
Reference Standard EN 61000-4-2:1995 +A1:1998 +A2:2001
Test Date December 28, 2009 Test Location EMS-ESD: Shielded Room Test Equipment
Name of Equipment Manufacturer Model No. Serial No. Due Date ESD Simulator Noiseken ESS-2000 0199C02387 2010-04-16 ESD Gun Noiseken TC-815R ESS0898829 2010-04-16
Test Specifications Discharge Factor: ≥ 1 s Discharge Impedance: 330 ohm / 150 pF Kind of Discharge: Air, Contact (direct and indirect) Polarity: Positive and Negative
Number of Discharge: ≥ 10 at all locations Discharge Voltage: Contact Air HCP VCP 2 kV 2 kV 2 kV 2 kV 4 kV 4 kV 4 kV 4 kV 6 kV 6 kV 6 kV 6 kV 8 kV 8 kV 8 kV 8 kV 15 kV 15 kV 15 kV 15 kV Notes: HCP: Horizontal coupling plane VCP: Vertical coupling plane Test Data
Test Conditions: Temperature: 19 °C Relative Humidity: 41 % Atmospheric Pressure: 1005 mbar
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Location of Discharge:
Test Results MET Required Performance Criteria
NOT MET Required Performance Criteria Remarks
During the contact ± 6 kV test on the BNC port white dots appeared.
Air
Contact
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3.3 Radiated Electromagnetic Fields
Reference Standard EN 61000-4-3:2006
Test Date December 28, 2009 Test Location EMS-RS: Fully anechoic chamber Test Equipment
Name of Equipment Manufacturer Model No. Serial No. Due Date Power Meter Agilent E4418B MY45104818 2010-03-31 Control Unit System Controller Noiseken NA25MF1G2010 A00148 N/A Power Sensor HP 8482A US37293310 2010-08-10 BAND 1 Power Amplifier Noiseken NA25MF1G2010 A00148 2010-05-13 BAND 2 Power Amplifier Noiseken NA25MF1G2010 A00148 2010-05-13 P.S. UNIT Power Supply Noiseken NA25MF1G2010 A00148 N/A RF AMPLIFIER Noiseken NA1GF3G50 A70540 2010-05-13 Signal Generator R&S SML03 103171 2010-12-11 Bilog Antenna Schaffner-Chase CBL6111C 2551 N/A Double Ridged Broadband Horn Antenna SCHWARZBECK MESS BBHA 9120 E BBHA 9120 E 337 N/A
Test Specifications Antenna Polarization: Horizontal & vertical unless indicated otherwise Antenna Distance: 3 m Field Strength: 1 V/m 3 V/m 10 V/m Frequency Range: 27 MHz to 500 MHz 80 MHz to 2 GHz 26 MHz to 1 GHz Modulation: AM, 80 %, 1 kHz sine wave
PM, 1 Hz (0.5 s ON : 0.5 s OFF) Frequency step: 1 % step # of Sides Radiated: 4 6
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Test Data
AM, 80 %, 1 kHz sine wave
Dwell Time: 3 s at 1 V/m
Observation Side Exposed Horizontal Vertical
Front No any function degraded No any function degraded Right No any function degraded No any function degraded Back No any function degraded No any function degraded Left No any function degraded No any function degraded Top No any function degraded No any function degraded
Bottom No any function degraded No any function degraded
Dwell Time: 3 s at 3 V/m Observation
Side Exposed Horizontal Vertical Front No any function degraded No any function degraded Right No any function degraded No any function degraded Back No any function degraded No any function degraded Left No any function degraded No any function degraded Top No any function degraded No any function degraded
Bottom No any function degraded No any function degraded
Dwell Time: 3 s at 10 V/m Observation
Side Exposed Horizontal Vertical Front The horizontal line noise appeared The horizontal line noise appeared Right The horizontal line noise appeared The horizontal line noise appeared Back The horizontal line noise appeared The horizontal line noise appeared Left The horizontal line noise appeared The horizontal line noise appeared Top The horizontal line noise appeared The horizontal line noise appeared
Bottom The horizontal line noise appeared The horizontal line noise appeared
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PM, 1 Hz (0.5 s ON : 0.5 s OFF)
Dwell Time: 3 s at 1 V/m
Observation Side Exposed Horizontal Vertical
Front No any function degraded No any function degraded Right No any function degraded No any function degraded Back No any function degraded No any function degraded Left No any function degraded No any function degraded Top No any function degraded No any function degraded
Bottom No any function degraded No any function degraded Dwell Time: 3 s at 3 V/m
Observation Side Exposed Horizontal Vertical
Front No any function degraded No any function degraded Right No any function degraded No any function degraded Back No any function degraded No any function degraded Left No any function degraded No any function degraded Top No any function degraded No any function degraded
Bottom No any function degraded No any function degraded
Dwell Time: 3 s at 10 V/m Observation
Side Exposed Horizontal Vertical Front The horizontal line noise appeared The horizontal line noise appeared Right The horizontal line noise appeared The horizontal line noise appeared Back The horizontal line noise appeared The horizontal line noise appeared Left The horizontal line noise appeared The horizontal line noise appeared Top The horizontal line noise appeared The horizontal line noise appeared
Bottom The horizontal line noise appeared The horizontal line noise appeared Note: “Blank” = Not performed Test Conditions: Temperature: 19 °C Relative Humidity: 40 % Atmospheric Pressure: 1005 mbar Test Results MET Required Performance Criteria
NOT MET Required Performance Criteria Remarks See above observations in tables.
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3.4 Fast Transients Bursts
Reference Standard EN 61000-4-4:2004
Test Date December 28, 2009 Test Location EMS-EFT: Shielded Room Test Equipment
Name of Equipment Manufacturer Model No. Serial No. Due Date Fast Transient Noise Simulator Noiseken FNS-AX II 7079B00212 2010-07-07 Capacitive Coupling Clamp Noiseken 15-00001A - N/A
Test Specifications Pulse Amplitude & Polarity: ± 0.5 kV ± 1.0 kV
(Power Lines) ± 2.0 kV Pulse Amplitude & Polarity: ± 0.25 kV ± 0.5 kV (Signal Lines) ± 1.0 kV
Burst Period: 300 ms 2 s Repetition Rate: 5 kHz Duration of Test Voltage: ≥ 1 min
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Test Data Input a.c. power ports – Coupling/Decoupling Network used
OBSERVATIONS (±) Burst (kV) Mode of Application
0.5 L1 & L2 & PE The white dots appeared
OBSERVATIONS (±) Burst (kV) Mode of Application
1.0 L1 & L2 & PE The white dots appeared
OBSERVATIONS (±) Burst (kV) Mode of Application
2.0 L1 & L2 & PE The white dots appeared
Signal ports and telecommunication ports – Coupling Clamp used
OBSERVATIONS (±) Burst (kV) Mode of Application
0.25 BNC No any function degraded
OBSERVATIONS (±) Burst (kV) Mode of Application
0.5 1.0 BNC The white dots appeared
Note: “Blank” = Not performed Test Conditions: Temperature: 19 °C Relative Humidity: 35 % Atmospheric Pressure: 1005 mbar Test Results MET Required Performance Criteria
NOT MET Required Performance Criteria Remarks See above observations in tables.
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3.5 Slow High Energy Voltage Surge
Reference Standard EN 61000-4-5:2006
Test Date December 28, 2009 Test Location EMS-Surge: Shielded Room Test Equipment
Name of Equipment Manufacturer Model No. Serial No. Due Date Lightning Surge Simulator Noiseken LSS-6030 0189E00251 2010-08-18 TELECOM LINES INJECTION UNIT Noiseken LSS-INJ6401TEL LSS0961027 - INTERCONNECTION LINE UNIT Noiseken LSS-INJ6400SIG LSS0961028 -
Test Specifications Power Lines
Source Impedance: 12 Ω for common mode and 2 Ω for differential mode
Surge Amplitude: Common Mode 0.5, 1.0 & 2.0 kV
Differential Mode 0.5 & 1.0 kV Number of Surges: 5 surges per angle Angle: 0°, 90°, 180°, 270° (input a.c. power port) Polarity: Positive & Negative Repetition Rate: 1 surge per min
Signal Lines (Unshielded) Source Impedance: 42 Ω for common mode
Surge Amplitude: Common Mode 0.5 & 1.0 kV
Number of Surges: 5 Surges per mode
Polarity: Positive & Negative
Repetition Rate: 1 surge per min
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Signal Lines (Shielded)
Source Impedance: 2 Ω for common mode
Surge Amplitude: Common Mode 0.5 & 1.0 kV
Number of Surges: 5 Surges per mode
Polarity: Positive & Negative
Repetition Rate: 1 surge per min Test Data
Power Lines Line to Earth – Common Mode
OBSERVATIONS (±) Surge (kV) Mode of Application
0.5 1.0 2.0 L1 to PE No any function degraded L2 to PE No any function degraded
Line to Line – Differential Mode
OBSERVATIONS (±) Surge (kV) Mode of Application
0.5 1.0 L1 to L2 No any function degraded L2 to L1 No any function degraded
Signal Lines (Unshielded)
Line to Earth – Common Mode OBSERVATIONS (±) Surge (kV) Mode of Application
0.5 1.0
Signal Lines (Shielded)
Line to Earth – Common Mode OBSERVATIONS (±) Surge (kV) Mode of Application
0.5 1.0 BNC No any function degraded
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Note: “Blank” = Not performed Test Conditions: Temperature: 19 °C Relative Humidity: 37 % Atmospheric Pressure: 1005 mbar Test Results MET Required Performance Criteria
NOT MET Required Performance Criteria Remarks See above observations in tables.
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3.6 Conducted Disturbance
Reference Standard EN 61000-4-6:2007
Test Date December 24, 2009 Test Location EMS-CS: Shielded Room Test Equipment
Name of Equipment Manufacturer Model No. Serial No. Due Date Power Sensor Agilent E9304A MY41497499 2010-08-18 RF Power Amplifier Schaffner-Chase CBA954815 1011 2010-09-03 Power Sensor HP 8482A US37293309 2010-07-10 Signal Generator HP 8657D 3332A00555 2010-08-18 Function Generator HP 33120A US36009168 2010-08-18 Attenuator BIRD 100-A-FFN-06 9933 2010-08-10 RF-SYNTHESIZER/AMPLIFIER Schaffner NSG2070-1 1068 2010-12-16 Attenuator Schaffner INA2070-1 2068 2010-12-16 CDN Noiseken NCDN-M2-32A 2001 2010-12-14 CDN Noiseken NCDN-M3-32A 2016 2010-12-14 CDN Noiseken NCDN-T2 2001 2010-12-14 CDN Noiseken NCDN-T4 2002 2010-12-14 CDN Noiseken NCDN-T8 2015 2010-12-14 CDN Noiseken NCDN-C1-50-BNC 2001 2010-12-14 CDN FCC NCDN-M2-16A 091360 2010-07-29 CDN FCC NCDN-M2-16A 091361 2010-07-29 CDN FCC NCDN-M3-16A 091362 2010-07-29 EM Clamp Noiseken NEM-23 540 2010-06-18
Test Specifications Frequency range: 150 kHz to 100 MHz 10 kHz to 30 MHz 150 kHz to 230 MHz 10 kHz to 100 MHz Voltage Level: 1 Vrms 3 Vrms 10 Vrms Modulation: AM, 80 %, 1 kHz sine wave PM, 1 Hz (0.5 s ON : 0.5 s OFF) Frequency step: 1 % step
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Test Data
AM, 80 %, 1 kHz sine wave
Dwell Time: 3 s at 1 V
Coupling Location (Line Stressed) Coupling Method Observation
Input a.c. power port CDN(M3) No any function degraded BNC CDN(BNC) No any function degraded
Dwell Time: 3 s at 3 V
Coupling Location (Line Stressed) Coupling Method Observation
Input a.c. power port CDN(M3) The horizontal line noise appeared BNC CDN(BNC) The horizontal line noise appeared
Dwell Time: 3 s at 10 V
Coupling Location (Line Stressed) Coupling Method Observation
Input a.c. power port CDN(M3) The horizontal line noise appeared BNC CDN(BNC) `
PM, 1 Hz (0.5 s ON : 0.5 s OFF)
Dwell Time: 3 s at 1 V Coupling Location (Line Stressed) Coupling Method Observation
Input a.c. power port CDN(M3) No any function degraded BNC CDN(BNC) No any function degraded
Dwell Time: 3 s at 3 V
Coupling Location (Line Stressed) Coupling Method Observation
Input a.c. power port CDN(M3) The horizontal line noise appeared BNC CDN(BNC) The horizontal line noise appeared
Dwell Time: 3 s at 10 V
Coupling Location (Line Stressed) Coupling Method Observation
Input a.c. power port CDN(M3) The horizontal line noise appeared BNC CDN(BNC) `
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Notes: CDN = Coupling Decoupling Network EMC = Electro Magnetic Clamp “blank” = Not performed Test Conditions: Temperature: 19 °C Relative Humidity: 37 % Atmospheric Pressure: 1006 mbar Test Results MET Required Performance Criteria
NOT MET Required Performance Criteria Remarks See above observations in tables.
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3.7 Mains Supply Voltage Variations
Reference Standard EN 50130-4:1995 +A1:1998 +A2 :2003 Test Date December 28, 2009 Test Location Shielded Room Test Equipment
Name of Equipment Manufacturer Model No. Serial No. Due Date Constant Voltage Constant Frequency NewTech CVCF 3 kW 4269 N/A
Test Specifications Supply voltage max.: Unom + 10 % Supply voltage min. : Unom - 15 % Unom = Nominal mains voltage (230 Vac) Test Data Input a.c. power ports
Mode of Application Observation Supply voltage max. (253 Vac) No any function degraded
Supply voltage min. (195.5 Vac) No any function degraded Test Conditions: Temperature: 18 °C Relative Humidity: 43 % Atmospheric Pressure: 1005 mbar Test Results MET Required Performance Criteria
NOT MET Required Performance Criteria Remarks
See above observations in tables.
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3.8 Mains Supply Voltage Dips and Short Interruptions
Reference Standard EN 61000-4-11:2004
Test Date December 28, 2009 Test Location EMS-Voltage dip: Shielded Room Test Equipment
Name of Equipment Manufacturer Model No. Serial No. Due Date EMC Test Instrument SCHAFFNER BEST PLUS SC2697A012 2010-03-31
Test Specifications & Observations/Remarks Voltage Dips and Short Interruptions Test Level Duration [in period/ms (50 Hz)] Observation 0 %Ut 0.5 /10 No any function degraded (100 % dip) 1.0 /20 No any function degraded
5.0 /100 No any function degraded 10 /200
25 /500 50 /1000
250 /5000 40 %Ut 0.5 /10 No any function degraded (60 % dip) 1.5 /30 No any function degraded
5.0 /100 10 /200 No any function degraded
25 /500 50 /1000
70 %Ut 0.5 /10 No any function degraded
(30 % dip) 1.5 /30 No any function degraded 5.0 /100
10 /200 No any function degraded 25 /500
50 /1000
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Test Conditions: Temperature: 18 °C Relative Humidity: 43 % Atmospheric Pressure: 1005 mbar Test Results MET Required Performance Criteria
NOT MET Required Performance Criteria Remarks See above observations in tables.
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APPENDIX A - Test Setup Photos and Configuration Conducted Voltage Emissions
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Radiated Electric Field Emissions
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Voltage Fluctuations and Flicker
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Electrostatic Discharge
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Radiated Electromagnetic Fields
[ 80 MHz to 1GHz]
[ Above 1GHz]
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Fast Transients Bursts
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Slow High Energy Voltage Surge
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Conducted Disturbance
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Mains Supply Voltage Dips and Short Interruptions
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APPENDIX B – TEST DATA Conducted Voltage Emissions (for EUT Input Power : 12 Vdc)
Limit Reading Result Margin Limit Reading Result Margin
[MHz] LISN Cable [dBuV] [dBuV] [dBuV] [dB] [dBuV] [dBuV] [dBuV] [dB]
16.73 0.5 0.1 N 73.0 37.6 38.2 34.8 60.0 24.3 24.9 35.1
16.77 0.7 0.1 H 73.0 37.9 38.7 34.3 60.0 24.8 25.6 34.4
16.78 0.5 0.1 N 73.0 38.1 38.7 34.3 60.0 24.6 25.2 34.8
16.85 0.7 0.1 H 73.0 37.0 37.8 35.2 60.0 24.3 25.1 34.9
16.86 0.5 0.1 N 73.0 37.8 38.4 34.6 60.0 24.6 25.2 34.8
16.99 0.5 0.1 N 73.0 37.0 37.6 35.4 60.0 24.4 25.0 35.0
0.2 0.1 H 79.0 34.5 34.8 66.0 32.5 32.8
0.2 0.1 H 79.0 34.6 34.9 66.0 32.2 32.5
0.2 0.1 H 79.0 55.7 56.0 66.0 (0.3)
0.2 0.1 H 79.0 (0.3) 66.0 (0.3)
0.2 0.1 H 79.0 (0.3) 66.0 (0.3)
0.2 0.1 H 79.0 (0.3) 66.0 (0.3)
0.2 0.1 H 79.0 (0.3) 66.0 (0.3)
0.2 0.1 H 79.0 (0.3) 66.0 (0.3)
0.2 0.1 H 79.0 (0.3) 66.0 (0.3)
0.2 0.1 H 79.0 (0.3) 66.0 (0.3)
H : HOT, N : NEUTRAL
Average
FactorFrequency
Correction
Line
Quasi-peak
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[HOT]
[NEUTRAL]
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Conducted Voltage Emissions (for EUT Input Power : 24 Vac)
Limit Reading Result Margin Limit Reading Result Margin
[MHz] LISN Cable [dBuV] [dBuV] [dBuV] [dB] [dBuV] [dBuV] [dBuV] [dB]
0.17 0.1 0.1 N 79.0 62.6 62.8 16.2 66.0 55.3 55.5 10.5
0.34 0.1 0.1 N 79.0 60.2 60.4 18.6 66.0 56.3 56.5 9.5
0.35 0.1 0.1 N 79.0 60.3 60.5 18.5 66.0 50.9 51.1 14.9
0.51 0.1 0.1 N 73.0 59.4 59.6 13.4 60.0 46.6 46.8 13.2
0.52 0.1 0.1 N 73.0 56.7 56.9 16.1 60.0 50.1 50.3 9.7
0.69 0.1 0.1 N 73.0 53.3 53.5 19.5 60.0 44.2 44.4 15.6
0.2 0.1 H 79.0 34.5 34.8 66.0 32.5 32.8
0.2 0.1 H 79.0 34.6 34.9 66.0 32.2 32.5
0.2 0.1 H 79.0 55.7 56.0 66.0 (0.3)
0.2 0.1 H 79.0 (0.3) 66.0 (0.3)
0.2 0.1 H 79.0 (0.3) 66.0 (0.3)
0.2 0.1 H 79.0 (0.3) 66.0 (0.3)
0.2 0.1 H 79.0 (0.3) 66.0 (0.3)
0.2 0.1 H 79.0 (0.3) 66.0 (0.3)
0.2 0.1 H 79.0 (0.3) 66.0 (0.3)
0.2 0.1 H 79.0 (0.3) 66.0 (0.3)
H : HOT, N : NEUTRAL
Average
FactorFrequency
Correction
Line
Quasi-peak
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[HOT]
[NEUTRAL]
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Radiated Electric Field Emissions (for EUT Input Power : 12 Vdc)
[MHz] [dBuV/m] [m] Antenna Cable Amp. Gain [dBuV/m] [dBuV/m] [dB]
44.57 41.5 V 1.0 11.3 2.1 31.9 40.0 23.0 17.0
100.25 42.0 V 1.2 9.8 3.2 31.8 40.0 23.2 16.8
400.96 37.9 H 2.8 13.9 6.6 31.9 47.0 26.5 20.5
459.15 38.4 H 2.6 15.1 7.1 31.9 47.0 28.7 18.3
488.25 34.9 H 2.5 15.6 7.4 32.1 47.0 25.8 21.2
514.93 34.8 V 2.3 15.9 7.5 32.1 47.0 26.1 20.9
2.8 V 2.3 #N/A #N/A #N/A 40.0 #N/A
H 2.5 #N/A #N/A #N/A 40.0 #N/A
H 2.2 #N/A #N/A #N/A 40.0 #N/A
V 2.4 #N/A #N/A #N/A 40.0 #N/A
V 2.8 #N/A #N/A #N/A 40.0 #N/A
H 1.7 #N/A #N/A #N/A 40.0 #N/A
V #N/A #N/A #N/A 40.0 #N/A
V #N/A #N/A #N/A 40.0 #N/A
V #N/A #N/A #N/A 40.0 #N/A
V #N/A #N/A #N/A 40.0 #N/A
V #N/A #N/A #N/A 40.0 #N/A
V #N/A #N/A #N/A 40.0 #N/A
V #N/A #N/A #N/A 40.0 #N/A
#N/A #N/A #N/A 40.0 #N/A
Result = Reading + Antenna + Cable - Amp.Gain
H : Horizontal, V : Vertical
MarginCorrection
FactorFrequency Reading
Pol.Height Limits Result
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Tel: +82-31-339-9970 Fax: +82-31-339-9855 www.e-ctk.com
Test Report No.: 2009120070 Date: December 29, 2009
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Radiated Electric Field Emissions (for EUT Input Power : 24 Vac)
[MHz] [dBuV/m] [m] Antenna Cable Amp. Gain [dBuV/m] [dBuV/m] [dB]
214.26 40.7 H 3.5 8.3 4.7 31.8 40.0 21.9 18.1
228.89 39.0 H 3.5 9.0 5.0 31.8 40.0 21.2 18.8
371.00 37.9 H 3.3 13.2 6.4 31.9 47.0 25.6 21.4
400.93 40.8 H 2.7 13.9 6.6 31.9 47.0 29.4 17.6
444.69 35.0 H 2.6 14.7 6.9 31.9 47.0 24.7 22.3
459.15 40.1 H 2.5 15.1 7.1 31.9 47.0 30.4 16.6
2.8 V 2.3 #N/A #N/A #N/A 40.0 #N/A
H 2.5 #N/A #N/A #N/A 40.0 #N/A
H 2.2 #N/A #N/A #N/A 40.0 #N/A
V 2.4 #N/A #N/A #N/A 40.0 #N/A
V 2.8 #N/A #N/A #N/A 40.0 #N/A
H 1.7 #N/A #N/A #N/A 40.0 #N/A
V #N/A #N/A #N/A 40.0 #N/A
V #N/A #N/A #N/A 40.0 #N/A
V #N/A #N/A #N/A 40.0 #N/A
V #N/A #N/A #N/A 40.0 #N/A
V #N/A #N/A #N/A 40.0 #N/A
V #N/A #N/A #N/A 40.0 #N/A
V #N/A #N/A #N/A 40.0 #N/A
#N/A #N/A #N/A 40.0 #N/A
Frequency ReadingPol.
Height Limits Result
Result = Reading + Antenna + Cable - Amp.Gain
H : Horizontal, V : Vertical
MarginCorrection
Factor
CTK Co., Ltd. 386-1, Ho-dong, Cheoin-gu, Yongin-si, Gyeonggi-do, 449-100, Korea
Tel: +82-31-339-9970 Fax: +82-31-339-9855 www.e-ctk.com
Test Report No.: 2009120070 Date: December 29, 2009
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Harmonic Current Emissions and Voltage Fluctuations and Flicker
Flicker Test Summary per EN/IEC61000-3-3 (Run time)
[EUT Input Power : 12 Vdc]
CTK Co., Ltd. 386-1, Ho-dong, Cheoin-gu, Yongin-si, Gyeonggi-do, 449-100, Korea
Tel: +82-31-339-9970 Fax: +82-31-339-9855 www.e-ctk.com
Test Report No.: 2009120070 Date: December 29, 2009
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Tel: +82-31-339-9970 Fax: +82-31-339-9855 www.e-ctk.com
Test Report No.: 2009120070 Date: December 29, 2009
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Flicker Test Summary per EN/IEC61000-3-3 (Run time)
[EUT Input Power : 24 Vac]
CTK Co., Ltd. 386-1, Ho-dong, Cheoin-gu, Yongin-si, Gyeonggi-do, 449-100, Korea
Tel: +82-31-339-9970 Fax: +82-31-339-9855 www.e-ctk.com
Test Report No.: 2009120070 Date: December 29, 2009
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Tel: +82-31-339-9970 Fax: +82-31-339-9855 www.e-ctk.com
Test Report No.: 2009120070 Date: December 29, 2009
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APPENDIX C – EUT Photographs
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Test Report No.: 2009120070 Date: December 29, 2009
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EUT External Photographs
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Tel: +82-31-339-9970 Fax: +82-31-339-9855 www.e-ctk.com
Test Report No.: 2009120070 Date: December 29, 2009
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EUT Internal Photographs
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Tel: +82-31-339-9970 Fax: +82-31-339-9855 www.e-ctk.com
Test Report No.: 2009120070 Date: December 29, 2009
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PCB
CTK Co., Ltd. 386-1, Ho-dong, Cheoin-gu, Yongin-si, Gyeonggi-do, 449-100, Korea
Tel: +82-31-339-9970 Fax: +82-31-339-9855 www.e-ctk.com
Test Report No.: 2009120070 Date: December 29, 2009
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CTK Co., Ltd. 386-1, Ho-dong, Cheoin-gu, Yongin-si, Gyeonggi-do, 449-100, Korea
Tel: +82-31-339-9970 Fax: +82-31-339-9855 www.e-ctk.com
Test Report No.: 2009120070 Date: December 29, 2009
Page 57 of 58
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CTK Co., Ltd. 386-1, Ho-dong, Cheoin-gu, Yongin-si, Gyeonggi-do, 449-100, Korea
Tel: +82-31-339-9970 Fax: +82-31-339-9855 www.e-ctk.com
Test Report No.: 2009120070 Date: December 29, 2009
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