cubesat architecturefor reliable on-orbit cots parts …
TRANSCRIPT
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CUBESAT ARCHITECTURE FORRELIABLE ON-ORBIT COTS
PARTS USE
Space Micro Inc.Cal Poly CubeSat Developers Workshop
April 2021
Dr. Dave Hansen, Dr. Bert Vermeire, Michael Jacox, Dave Strobelwww.spacemicro.com
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Outline
ØThe Threat – Space Radiation Effects♦ The Environment♦ Satellites do fail in orbit
ØThe Response ♦ Rad Hard Parts vs. COTS ♦ Hardening Techniques
ØThe Solutions - Case Studies in Radiation Hardening♦ The CubeSat Space Processor (CSP)♦ Alternative approaches
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September 18, 1941
With the score tied 0-0 in the 4th inning the broadcast was lost for 15 minutes ...
…when the broadcast resumed, the Pirates had 4 runs.
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https://eos.org/features/the-geomagnetic-blitz-of-september-1941
vs.
Irate Brooklyn fans found “little satisfaction” with the explanation that sunspots were to blame
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Radiation Induced Failures
Radiation has been an issue for satellites since the beginning of the Space Age
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Telstar I (1962) – First Satellite to fail due to radiation (Total Dose)
Hubble Space Telescope (1990) - Six status monitors fail in the South Atlantic Anomaly
Meteosat (2006) – Satellite enters safe mode after single event upset
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CubeSat Failure Rates2019 Data from Michael Swartwout (St. Louis University)
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https://sites.google.com/a/slu.edu/swartwout/
CubeSats: historically have very high failure rates; Need cost effective radiation solution.
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SOHO Satellite
Solar protons upset the imager following a solar flare
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https://sohowww.nascom.nasa.gov/bestofsoho/Movies/flares.html
Ø EIT 195Å ImagerØ Flare
♦ “White” FlashØ Coronal Mass Ejection
♦ “Scratches” on the image
♦ Due to ejected ions (mostly protons)
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Space Weather, Volume: 11, Issue: 4, Pages: 169-186, First published: 22 January 2013, DOI: (10.1002/swe.20023)
Distance from Space Micro to San Francisco
Orbit and Radiation
Radiation Belts are More Severe for Navigational Orbits
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1.E-02
1.E-01
1.E+00
1.E+01
1.E+02
1.E+03
1.E+04
1.E+05
0 30 60 90
Rate
Coe
ffic
ient
Inclination (degree)
8000 km4000 km2000 km1000 km500 km
Orbit Severity
Radiation Type and Severity Changes with Orbit
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1.E-02
1.E-01
1.E+00
1.E+01
1.E+02
1.E+03
1.E+04
1.E+05
0 30 60 90
Rate
Coe
ffic
ient
Inclination (degree)
GEO16000 km8000 km4000 km2000 km500 km
Heavy IonProton
Petersen 1998 IEEE Trans. Nucl. Science
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1.E-02
1.E-01
1.E+00
1.E+01
1.E+02
1.E+03
1.E+04
1.E+05
0 30 60 90
Rate
Coe
ffic
ient
Inclination (degree)
8000 km4000 km2000 km1000 km500 km
How Bad is it?
LEO, MEO – “Mostly” Protons = Lightly IonizingGEO – Heavy Ions = Highly Ionizing
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GEO
MEOLEO
1.E-02
1.E-01
1.E+00
1.E+01
1.E+02
1.E+03
1.E+04
1.E+05
0 30 60 90
Rate
Coe
ffic
ient
Inclination (degree)
GEO16000 km8000 km4000 km2000 km500 km
Heavy IonProton
Petersen 1998 IEEE Trans. Nucl. Science
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Part Selection
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Part Class Quality / Reliability
Radiation Cost Capability Availability
QMLV –Space Grade
QMLQ – MIL Grade
Enhanced products
Automotive
Commercial
Cost
Cheap
Quality / R
eliability
Low FIT
Screen +Test
RadiationGood Luck!
Rad Hard
Capability
Old Tech
Modern
Availability
Later
Now
Expensive
Architecture can Mitigate Risks of Lower Grade PartsBaumann SEE Symposium 2016
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The Cubesat Space Processor
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Multiple Systems, Multiple Modes of hardening
Cubesat Space Processor (CSP)
Ø Single board computer♦ Xilinx's Zynq 7020 SoC♦ reconfigurable I/O ♦ 32 Gbit NAND Flash
Ø Small form factor (1U) Ø Radiation-tolerant
C.M. Wilson, Dissertation U. Florida, 2018
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The Case Study
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Case Study Will Look at Consequences of Different Radiation Hardening Choices
Mitigation
TMRUnhardened
ECC
RH Component
Unhardened
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Memory
Ø Bit Errors♦ Manufacturing “Weak” bits♦ Radiation
• Total Dose• Single Events
Ø Device Level Failure♦ Functional Interrupt♦ Latchup
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Part Class Qual / Rel Radiation Cost Capability Availability“Space Grade” Upscreen Same $10,000 2-10 year
lag Months
Unhardened -- Same $100 Same Days
No Rad-Hard, Modern Memory
Smaller heavy ion threat in LEO/MEO missions
makes device level failure modes less
likely
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Memory – The Solutions
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Hansen et al., 2017 Radiation Effects Data WorkshopAllen et al., 2010 IEEE Trans. Nucl. Sci.
Using Modern Memory Requires Hardening by Architecture
Die
Voter
512 bytes 28 bytesData Check
Voter
Die BCHECC
Ø 95% Memory DensityØ 10-8 better upset rateØ Same Device level effects
Ø 1/3 Memory DensityØ 1/10-5 better upset rateØ Same Device level effects
Ø 1/3 Memory DensityØ 10-8 better upset rateØ 10-6 Device level effects
BCH Error Correction Code (ECC)
Triple Mode Redundancy (TMR)
TMR + ECC
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FPGA
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Part Class Qual / Rel Radiation Cost Capability Availability
Space Grade QML-VRugedized
1Mrad / No SEL
$20,000-$200,000
Old Technology 6-8 Months
Unhardened -- 30 krad / SEL LET= 15 $2000 Lower power
Better tools Weeks
Device Node SEU Rate Improvement
Virtex-II 130 nm 1.0Virtex-4 90 nm 1.5Virtex-7 28 nm 28.3
UltraScale 20 nm 52.8Virtex -5Q 65 nm 1000
Lee, SAND2017-5703C, “Commercial Field-Programmable Gate Arrays”
Available FPGAs Span a Range of Rad Requirements
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FPGAs – The Solutions
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Internal Architecture Provides Tunable Hardening but Doesn’t Address Device Level Effects
Ø 3x Resource PenaltyØ 100x better upset rateØ No Device Level Mitigation
Ø Tuneable HardnessØ Trade Upset Rate for
Resource and Dead Time Penalty
Ø No Device Level Mitigation
Internal TMR
Scrubbing
MitigatedUnmitigated
FPGA Layout
M. Wirthlin, et al., SEU Mitigation and Validation of the LEON3 Soft Processor Using Triple ModularRedundancy for Space Processing
Lee, SAND2017-5703C, “Commercial Field-Programmable Gate Arrays”
Li et al., 2013 SEE Symposium
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Watchdog Timer
Ø External to FPGA♦ Monitors FPGA “heartbeat”♦ Resets the processor to an
operational state following a “hang”
Ø Built with Rad-Hard Parts♦ SEL threshold LET=86 MeV cm2/mg♦ Cheaper than Rad-Hard FPGA
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FPGA Hardness is outsourced to External Circuitry
Mitigated with Watchdog for ARM Cores (Patent Number 7,237,148 plus ReExamination Certificate number RE42,314 C1)
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ConclusionØ The Cubesat Space Processor provides a useful case study in
how to apply architectural hardening to satellite electronicsØ Satellite radiation requirements are highly dependent on the
mission profile♦ LEO – Low dose, proton rich, short duration♦ MEO – High dose, proton rich, long duration♦ GEO – Mid dose, heavy ion rich, long duration
Ø There are a variety of different approaches to achieve circuit hardness♦ ECC♦ TMR♦ Scrubbing♦ Watchdog Timer
Ø The best approach trades reliability, cost and function.
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