designof a 0. 18pmlow-voltageswitched-current...
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Design of a 0. 1 8pm Low-Voltage Switched-Current EAModulator for Multistandard Communication Systems
R. Rodriguez-Calderon, E. Becerra-Alvarez,F. Sandoval-Ibarra
CINVESTAV-Unidad GuadalajaraAv. Cientifica 1145, 45010 Zapopan, Jalisco (M6xico)
Tel:. +52 (33) 37703700. Email: sandovalgcts-design.com
Abstract This paper presents a 1.8-V, 0.18pm CMOSreconfigurable switched-current -A modulator formultistandard (GSM, Bluetooth, WCDMA) telecom systems.The modulator topology is an expandable cascade architecturewhich can be reconfigured both at the architecture level and atthe circuit level in order to adapt the modulator performanceto the different standards with adjustable power consumption.For this purpose, programmable Class AB memory-cell arraysare used to implement the modulator loop filter. Transistor-level simulations are shown that demonstrate correct operationfor all standards, featuring 12-bit, 11-bit and 7.8-bit dynamicrange within 200-kHz, 1-MHz and 3.8-MHz bandwidth,respectively.
I. INTRODUCTION
In the last years we are witnessing an unprecedenteddevelopment of wireless communications, introducing alarge number of new applications and standards into themarket. These new standards -such as Bluetooth, IEEE802.11 and UMTS- are complementing rather than replacingthe existing ones - like for instance GSM. This trenddemands integrated low-cost, smaller and fastermultistandard radio transceivers that can be reconfigured tooperate over a variety of specifications in order to takeadvantage of the different services offered by co-existingwireless technologies [1].
The Analog-to-Digital Converter (ADC) is one of themost challenging building blocks in multistandard receiversbecause of the different sampling rates and dynamic rangesrequired to digitize the wide range of signals coming fromeach individual operation mode. One of the most importantdesign challenges consists in handling these signals withlittle adjustment made to circuit parameters and adaptivepower consumption [2]. Sigma-Delta Modulators (YAMs)are good candidates for the implementation of the ADC inmultistandard communication systems. On the one hand, thistype of ADCs has lower sensitivity to circuitry imperfectionsthan Nyquist-rate ADCs, thus making easier to include
J. M. de la RosaInstituto de Microelectr6nica de Sevilla, IMSE-CNM (CSIC)
Ed. CNM-CICA, Av. Reina Mercedes s/n, 4101241012 Sevilla, Spain
Tel. +34955056666, E-mail: jrosagimse.cnm.es
reconfigurability and programmability functions withoutsignificant performance degradation. On the other hand,YAMs trade analog accuracy by signal processing, thusfacilitating their integration in modem deep-submicron VLSItechnologies [3].
Although most reported YAMs have been implementedusing switched-capacitor (SC) circuit techniques, the need toachieve high-performance in adverse low-voltage, digital-oriented CMOS processes, has motivated exploring analogdesign techniques compatible with those technologies. Thisis the case of the switched-current (SI) technique, whichduring the last decade has been used to implement ADCs fordigital communication chips [4][5]. In addition to its obviouscompatibility with digital technologies (only MOStransistors are used), the SI technique offers severaladvantages. First, as signal carriers are currents, the signalrange is not limited by supply voltage, thus being suited tolow-voltage operation. Second, SI basic building blocks,called memory cells, are based on current mirrors. This factmakes SI circuits relatively easy to be programmed andreconfigured for different specifications [5].
This paper presents the design and electricalimplementation of a fully differential SI SAM in a 1.8-V,0.18ptm CMOS technology. The modulator topology is areconfigurable cascade architecture, which has beendesigned to cope with three different standards: GSM,Bluetooth and WCDMA. The main building block is a ClassAB memory cell which can be digitally programmed to adaptthe modulator performance to each standard with adaptivepower consumption. Full-transistor simulations demonstrate12-bit, 11-bit and 7.8-bit dinamic range within 200-kHz,1MHz and 3.8-MHz bandwidth, respectively. These figureslocate this circuit on a competitive position within the state-of-the-art SI YA modulators.
11. RECONFIGURABLE SI SAM ARCHITECTURE
In order to adapt the modulator performance to thedifferent standard specifications, a reconfigurable
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architecture is required. For the application in this paper, anexpandable cascade 2-1P topology, shown in Fig. 1, hasbeen selected. It consists of a second-order first-stagefollowed by P first-order stages which can be connected ordisconnected according to the required noise-shaping. Inaddition, analog and digital coefficients are optimizedaccording to the criteria described in [3].
In addition to reconfigure the architecture, the basicbuilding blocks that compose the modulator, i.e, thememory cells, can be also reconfigured in order to achievethe required modulator specifications with adaptative powerdissipation. For this purpose, the programmable SI memorycell shown in Fig. 2 is proposed.
Assuming that the thermal noise is the dominant sourceof error, the Signal-to-Noise Ratio (SNR) of a unitarymemory cell is given by [5],
SNR = IO logKSnT
(1)mO Ias
tgm B Ws
where snT m=hKTgml mth is a process's constant, K is the
Boltzmann's constant, T is the temperature, gm, is thememory transistor's transconductance, m, is the modulationindex, Ibias is the bias current, Cg, is the gate-sourcecapacitance, t is the clock signal on-time and BW, is thesignal bandwidth. If L cells are connected, the SNR of thewhole memory cell is given by [6]:
m2L2 j2SNR = IO log o bias
L(nS + tgml Sn BWKT 4Cg Sn
which can be written as:SNR = SNRunitary + 1O log(L)
(2)
(3)
meaning an improvement of 1 Olog(L) with respect to thecase of a unitary memory cell. Regarding other SI errorsapart from thermal noise, the performance of the unitary cellis basically the same as that of the whole cell. The rationalebehind this is that most SI errors can be expressed as a ratiobetween two electrical parameters [4]-[6], which can begenerically expressed as:
Figure 1. Reconfigurable cascade 2- 1P LA Modulator.
Vcc
I oi +)0I i - l-- _
Figure 2. Programmable SI memory cell.
(4)8, = f(g9d Igm )
f(gm, Cg )where gds is the output conductance of the memory cell. Asall parameters in (4) are equally modified by a L factorwhen L cells are connected together, the resulting error ofthe whole cell is the same as that of the unitary cell.
Therefore, by using integrators based on programmableSI memory cells, the SNR of the modulator can be increasedaccording to (3), which is true if the modulator is designedin such a way that the thermal noise power is the dominantsource of error. As an illustration, Fig. 3 shows how theSNR of 2-lIP SI -A modulators can be improved byincreasing the number of unitary cells which are connectedin the programmable-based SI SAM of Fig. 1. In thisexample, a unitary Class AB cascode memory cell like thatshown in Fig. 4 was considered, with a bias current of500ptA and circuit errors lower than 0.1%. This cell issuitable for low-voltage applications like in this paper, andit can operate at high sampling frequencies, while keepinglow values of SI errors and power consumption [7][8]. Notefrom Fig. 3 that different specifications required in somecommunication applications can be achieved by properlyselecting the oversampling ratio and the number of memorycells used in the programmable integrator.
III. CIRCUIT IMPLEMENTATION
The reconfigurable SI -A modulator described inprevious sections has been designed in a 1.8-V, 0.18ptmCMOS technology to cope with the followingspecifications:
* GSM: 12-bit resolution within 200kHz
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* Bluetooth: 11-bit resolution within 1MHz* WCDMA: 8-bit resolution within 3.8MHz
A. Architecture selectionIn order to find the best SAM architecture that fulfills the
specifications described above with the less powerconsumption, a comparative study of different cascadearchitectures has been done, considering the impact of maincircuit error mechanisms and technology parasitics.The selection procedure led us to a 1-bit, 2-1°, 2-1 and 2-
13 modulators with 2, 2 and 3 unitary cells for the GSMBluetooth and WCDMA applications, respectively. Theselected architectures were high-level sized, i.e, themodulator-level specifications were mapped onto building-block specifications using SIMSIDES [9]. The outcome ofthe sizing process is summarized in Table I. The data in thistable are the starting point for block electrical sizing.
B. Design ofthe main building blocks
One of the most important blocks in SI -A modulators isthe integrator. The main design considerations for thisblock are the signal swing, the SI errors and the samplingfrequency. For the modulator in this paper, a fullydifferential Forward Euler integrator was designed using theClass AB cascode memory cell of Fig. 4. Cascodetransistors, extrinsic gate-source capacitors and CMOS-dummy switches were used in order to reduce SI errors.
Another important building block is the comparator,which was implemented using a regenerative latch topology[10]. One of the most important limiting factors of thattopology is the mismatch error. In order to control this error,MonteCarlo simulations were done in HSPICE during thedesign process, showing a worst-case Ins resolution timeand 55ptA hysteresis, which agree with the specificationsshown in Table I.
cn
cn
14
13
12
11
10
9
8
7
6
L=1
55 10 15 20 25 30 35 40 45 50
Oversampling ratio M
Figure 3. SNR vs. Mfor a 2-12LAMxwithBW,=1MHz (Bluetooth).
-s--I
Figure 4. Class AB cascode memory cell.
TABLE I. BULDING BLOCK SPECIFICATIONSParameter Bluetooth IWCDMA GSM
INTEGRATORS
biasN 1.5mA 1.0mA 1.0mAgm 6mAIV 4mAIV 4mAIV
Cgs 3.9pF 2.6pF 2.6pF
Switch-on-resistance <100Q <100Q <100Q
COMPARATORS
Resolution time <3ns <3ns <3ns
Hysteresis <60tA <60tA <60tADACs
Resolution 1 bit 1 bit lbit
Reference Current 0.6mA 0.6mA 0.6mA
IV. SIMULATION RESULTS
In order to evaluate the performance of the modulator,fill-transistor simulations using HSPICE were done. As anillustration, Fig. 5 shows the output spectra for the differentoperation modes considering a half-scale input sinewavesignal. The effective resolution is 12 bit, 11 bit and 7.8 bitfor GSM, Bluetooth and WCDMA, respectively. Theelectrical performance is summarized in Table II showingthe main modulator figures of merit.
TABLE 11. SUMMARY OF THE LAM ELECTRICALPERFORMANCE
GSM Bluetooth WCDMA
Clock freq. 70.4MHz 70.4MHz 70.4MHz
Overs. Ratio 176 35 9
Bandwidth 200kHz 1.OMHz 3.8MHz
SNR 12bit I lbit 7.8bit
SNDR 11.5bit 10.6bit 7.7bit
THD -74dB -75dB -77dB
Power Cons. 57mW 123mW 156mW
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Cd
md7@
-d
-Cd
20
0
-20
-40
-60
-80
-100
-120I.E+04
20
-40
-60
-80
-100 /
-120
-140I.E+04
10000
0
1000 - :
100 LA ,
*110 * I1
I.E+05 I.E+06 I.E+07 I.E+08
Frequency Hz
a)
This workWCDMA
This work This workGSM Bluetooth
10 100
BW kHz
1000 10000
Figure 6. Comparison with state-of-the-art SI YAMs.
I.E+05 I.E+06 I.E+07 I.E+08
Frequency Hzb)
0
-20
-40
-60 A
-80 X
-100
-120
-140I.E+03 I.E+04 I.E+05 I.E+06 I.E+07 I.E+08
Frequency Hz
c)
Figure 5. HSPICE output spectra: a) Bluetooth, b) WCDMA, c) GSM.
If these results are confirmed by experimentalmeasurements, the presented circuit will be competitivewith the current state of the art of SI YA modulators. This isillustrated in Fig. 6, where the Figure-of-Merit (FOM)proposed in [11] was used to quantify the quality of themodulators. Note that the presented design gets the highestsignal bandwidth reported up to now for SI -A modulators.
CONCLUSIONSThis paper reported different reconfiguration strategies
for the implementation of multistandard SI YAMs. An exp-
andable cascade SAM, implemented with programmableClass AB cascode memory cells, was designed to cope withGSM/Bluetooth/WCDMA specifications. Full-transistorsimulations show 12-bit, 11-bit and 7.8-bit dynamic rangewithin 200kHz, 1MHz, and 3.8MHz, respectively. Thelayout of the circuit is currently being finished and the chipis expected to be sent for fabrication shortly. If these figuresare confirmed by experimental results, the presented circuitwill be at the edge of the state of the art on SI YAMs.
REFERENCES
[1] X. Li, and M. Ismail: "Multi-standard CMOS wireless receivers:analysis and design". Kluwer Academic Publishers, 2002.
[2] K. Gulati and H.S. Lee: "A Low-Power Reconfigurable Analog-to-Digital Converter". IEEE Journal of Solid-State Circuits, pp. 1900-1910, Dec. 2001.
[3] A. Rodriguez-Vazquez, F. Medeiro and E. Janssens (Editors):"CMOS Telecom Data Converters". Kluwer, 2003.
[4] J.M. de la Rosa, B. Perez-Verduft and A. Rodriguez-Vazquez:"Systematic Design of CMOS Switched-Current Bandpass Sigma-Delta Modulators for Digital Communication Chips". Kluwer, 2002.
[5] C. Toumazou, J. B. Hughes and N. C. Battersby, "Switched-Currentsan analogue technique for digital technology". IEE Circuits andSystems series 5, 1993.
[6] R. Rodriguez-Calderon "Design and Modeling of Switched-CurrentLA Modulators", Ph.D. Dissertation, CINVESTAV Guadalajara,Mexico, October 2005.
[7] J. B. Hughes, M. Mee and W. Donaldson, "A Low Voltage 8-bit,4OMs/s Switched-Current Pipeline Analog to digital Converter".Proc. ofISCASO], pp. 572-575.
[8] A. Worapishet, R. Sitdhikorn, J. B. Hughes, "Low-Power ComplexChannel Filtering Using Cascoded Class AB Switched-Current".Proc. ofISCAS02, pp. 453-456.
[9] J. Ruiz-Amaya, J. M. de la Rosa, F. V. Fernmndez, F. Medeiro, R. delRio, B. Perez-Verdu6 and A. Rodriguez-Vazquez: "High-LevelSynthesis of Switched-Capacitor, Switched-Current and Continuous-Time LA Modulators Using SIMULINK-Based Time-DomainBehavioral Models". IEEE Transactions on Circuits and Systems - I,pp. 1795-1810, September 2005.
[10] M. Bracey and W. Redman-White, "Design Consideration for CurrentDomain Regenerative Comparators". Proc. of 1994 Advanced A-DandD-A Conversion Techniques and their Applications, pp. 65-70.
[11] S. Rabii and B.A. Wooley, "A 1.8V Digital-Audio Sigma-DeltaModulator in 0.8[pm CMOS". IEEE Journal of Solid-State Circuits,pp. 783-796, June 1997.
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