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Advanced Calculator

User’s Manual

Software Version 2.10

DMTA‐20039‐01EN [U8778541] — Revision A

August 2012



Olympus NDT, 48 Woerd Avenue, Waltham, MA 02453, USA

© 2012 Olympus NDT, Inc. All rights reserved. No part of this publication may be

reproduced, translated, or distributed without the express written permission of Olympus NDT, Inc.

This document

was

prepared

with

particular

attention

to

usage

to

ensure

the

accuracy of the information contained therein, and corresponds to the version of the product manufactured prior to the date appearing on the title page. There

could, however, be some differences between the manual and the product if the

product was modified thereafter.

The information contained in this document is subject to change without notice.

Software version

2.10Part number: DMTA‐20039‐01EN [U8778541]

Revision AAugust 2012

Printed in Canada

All brands are trademarks or registered trademarks of their respective owners and

third party

entities.



DMTA‐20039‐01EN [U8778541], Rev. A, August 2012

Table of Contents iii

Table of Contents

1. Introduction .................................................................................................. 51.1 About the Advanced Calculator User Interface ..................................................... 51.2 About the Menu Bar ................................................................................................... 6

1.2.1 File Menu Commands ..................................................................................... 61.2.2 Help Menu Commands ................................................................................... 7

1.3 About the Supported File Formats ........................................................................... 8

2. Phased Array Technique ............................................................................. 92.1 Physical Principles ...................................................................................................... 9

2.1.1 Beam Angle Control ...................................................................................... 102.1.2 Beam Focus Control ....................................................................................... 12

2.2 Phased Array Applications ..................................................................................... 122.2.1 Sectorial and Depth Scanning ...................................................................... 13

2.2.2

Linear

Electronic

Scanning

...........................................................................

15

3. The UT Probe Tab ...................................................................................... 173.1 Acquisition Unit Area .............................................................................................. 193.2 Connection Area ....................................................................................................... 193.3 Probe Area ................................................................................................................. 203.4 Part Area .................................................................................................................... 213.5 Material Area ............................................................................................................. 223.6 Wedge Area ............................................................................................................... 23

4. The 1‐D Linear Arrays Tab ....................................................................... 274.1 Generic Conventions ................................................................................................ 27

4.1.1 Probe Conventions ......................................................................................... 274.1.2 Wedge Conventions ....................................................................................... 344.1.3 Conventions Related to the Part .................................................................. 38

4.2 1‐D Linear Array Tab Description .......................................................................... 44




iv Table of Contents

4.2.1 Acquisition Unit Area .................................................................................... 454.2.2 Scan Type Area ............................................................................................... 454.2.3 Beam Angles Selection Area ......................................................................... 46

4.2.4

Focal Points

Selection

Area

...........................................................................

484.2.5 Elements Selection Area ................................................................................ 52

4.2.6 Connection Area ............................................................................................. 534.2.7 Probe Area ....................................................................................................... 554.2.8 Part Area .......................................................................................................... 584.2.9 Material Area .................................................................................................. 594.2.10 Wedge Area ..................................................................................................... 60

4.3 Creating a Static Beam .............................................................................................. 63

4.4 Creating Depth Beams ............................................................................................. 674.5 Creating Sectorial Beams ......................................................................................... 704.6 Creating Linear Beams ............................................................................................. 824.7 Saving a Calculator Setup File (.xcal) ..................................................................... 864.8 Saving a Beam File (.law) ......................................................................................... 874.9 Creating a DDF Law ................................................................................................. 884.10 Saving a DDF Law File (.pac) .................................................................................. 92

5. The 1‐D Annular Arrays Tab ................................................................... 935.1 Generic Conventions ................................................................................................ 93

5.1.1 Conventions Related to the Probe ............................................................... 935.1.2 Important Remark Concerning the Delay Calculation ............................. 95

5.2 Description ................................................................................................................. 965.2.1 Acquisition Unit Area .................................................................................... 97

5.2.2

Scan Area

.........................................................................................................

975.2.3 Beam Angles Selection Area ......................................................................... 98

5.2.4 Focal Points Selection Area ........................................................................... 985.2.5 Elements Selection Area .............................................................................. 1005.2.6 Probe Area ..................................................................................................... 1015.2.7 Annular Array Radius Dialog Box ............................................................ 1035.2.8 Part Area ........................................................................................................ 1045.2.9 Material Area ................................................................................................ 1045.2.10 Wedge Area ................................................................................................... 105

5.3 Creating Depth Beams for Annular Arrays ........................................................ 106

6. The 2‐D Matrix Array Tab ...................................................................... 109

7. The Beam Display Info. Tab .................................................................. 113

8.

The Elements

Info.

Tab

...........................................................................

119




Table of Contents v

9. The AFiSiMO Tab .................................................................................... 1219.1 Creating Acoustic Field Simulations .................................................................... 1229.2 Verifying the AFiSiMO Availability ..................................................................... 124

10. Using the Databases ................................................................................ 12510.1 Probe Database ........................................................................................................ 12610.2 Material Database ................................................................................................... 12810.3 Wedge Database ...................................................................................................... 130

Appendix A: Theoretical Considerations on Law Delay Accuracy ...... 133

Appendix B: Dynamic Depth Focusing (DDF) ........................................ 135

Appendix C: Description of the .law File Format .................................... 139C.1 Conventions ............................................................................................................. 139C.2 General Format ....................................................................................................... 140

C.2.1 Format ............................................................................................................ 140

C.2.2

Example .........................................................................................................

140C.3 Object Description .................................................................................................. 141

C.3.1 General Parameters ...................................................................................... 141C.3.2 Law Parameters ............................................................................................ 141

Appendix D: Description of the .pac file format ..................................... 149D.1 Conventions ............................................................................................................. 149D.2 General format ........................................................................................................ 150

D.2.1 Format ............................................................................................................ 150D.2.2 Example of .pac File for Non‐DDF Laws .................................................. 150D.2.3 Example of .pac File for DDF Laws ........................................................... 151

D.3 Object Description .................................................................................................. 153D.3.1 General Parameters ...................................................................................... 153D.3.2 Law Parameters ............................................................................................ 153D.3.3 Element Parameters ..................................................................................... 156

D.3.4 DDF Parameters ........................................................................................... 160




vi Table of Contents




List of Abbreviations vii

List of Abbreviations

AFiSiMO acoustic field simulation moduleDDF dynamic depth focusingED electronic delayEMAT electro‐magnetic acoustic trans‐

ducerFT flight timeGD global delayHEX hexadecimalID inside diameter

LD law delayLW longitudinal wavesOD outside diameterOPD optical path differencePA phased arraySW shear wavesUT ultrasonic testingVC volume correctedWD wedge delay




viii List of Abbreviations




Important Information — Please Read Before Use 1

Important Information — Please Read Before Use

Intended Use

The Advanced Calculator software is designed to calculate phased array probe

element delays to be used with Olympus instruments for nondestructive ultrasonic

inspections of industrial and commercial materials. The Advanced Calculator

software also

performs

acoustic

field

and

beams

simulation.

Instruction Manual

This instruction manual contains essential information on using this Olympus

product safely and effectively. Before using this product, thoroughly review this

instruction manual,

and

use

the

product

as

instructed.

Keep this instruction manual in a safe, accessible location.

Safety Symbols

The following safety symbols might appear on the instrument and in the instruction

manual:

General warning symbol:

This symbol is used to alert the user to potential hazards. All safety messages that follow this symbol shall be obeyed to avoid possible harm.




2 Important Information — Please Read Before Use

High voltage warning symbol:

This symbol is used to alert the user to potential electric shock hazards greater

than 1,000 volts. All safety messages that follow this symbol shall be obeyed to

avoid possible harm.

Safety Signal Words

The following safety symbols might appear in the documentation of the instrument:

The DANGER signal word indicates an imminently hazardous situation. It calls

attention to a procedure, practice, or the like, which, if not correctly performed or

adhered to, could result in death or serious personal injury. Do not proceed beyond a

DANGER

signal

word

until

the

indicated

conditions

are

fully

understood

and

met.

The WARNING signal word indicates a potentially hazardous situation. It calls

attention to a procedure, practice, or the like, which, if not correctly performed or

adhered to, could result in death or serious personal injury. Do not proceed beyond a

WARNING signal word until the indicated conditions are fully understood and met.

The CAUTION signal word indicates a potentially hazardous situation. It calls

attention to an operating procedure, practice, or the like, which, if not correctly

performed

or

adhered

to,

could

result

in

minor

or

moderate

personal

injury,

material

damage, particularly to the product, destruction of part or all of the product, or loss of data. Do not proceed beyond a CAUTION signal word until the indicated conditions are

fully understood and met.




Important Information — Please Read Before Use 3

Notes Signal Words

The following safety symbols could appear in the documentation of the instrument:

The IMPORTANT signal word calls attention to a note that provides important information, or information essential to the completion of a task.

The NOTE signal word calls attention to an operating procedure, practice, or the like, which requires special attention. A note also denotes related parenthetical information that is useful, but not imperative.

The TIP

signal

word

calls

attention

to

a type

of

note

that

helps

you

apply

the

techniques and procedures described in the manual to your specific needs, or

provides hints on how to effectively use the capabilities of the product.

Warranty Information

Olympus guarantees

your

Olympus

product

to

be

free

from

defects

in

materials

and

workmanship for a specific period, and in accordance with conditions specified in the

Olympus NDT Terms and Conditions available at http://www.olympus‐

ims.com/en/terms/.

The Olympus warranty only covers equipment that has been used in a proper manner, as described in this instruction manual, and that has not been subjected to

excessive abuse, attempted unauthorized repair, or modification.

Inspect materials thoroughly on receipt for evidence of external or internal damage

that might have occurred during shipment. Immediately notify the carrier making the

delivery of any damage, because the carrier is normally liable for damage during

shipment. Retain packing materials, waybills, and other shipping documentation

needed in order to file a damage claim. After notifying the carrier, contact Olympus

for assistance with the damage claim and equipment replacement, if necessary.

http://www.olympus-ims.com/en/terms/








4 Important Information — Please Read Before Use

This instruction manual explains the proper operation of your Olympus product. The

information contained herein is intended solely as a teaching aid, and shall not be

used in any particular application without independent testing and/or verification by

the operator or the supervisor. Such independent verification of procedures becomes

increasingly important as the criticality of the application increases. For this reason, Olympus makes no warranty, expressed or implied, that the techniques, examples, or

procedures described herein are consistent with industry standards, nor that they

meet the requirements of any particular application.

Olympus reserves the right to modify any product without incurring the

responsibility for modifying previously manufactured products.

Technical Support

Olympus is firmly committed to providing the highest level of customer service and

product support. If you experience any difficulties when using our product, or if it fails to operate as described in the documentation, first consult the user’s manual, and

then, if

you

are

still

in

need

of

assistance,

contact

our

After

‐Sales

Service.

To

locate

the

nearest service center, visit the Service Centers page at: http://www.olympus‐

ims.com.

http://www.olympus-ims.com/








Introduction 5

1. Introduction

This document describes the user interface and the various features of the Advanced

Calculator. You can use this tool to generate and visualize ultrasonic beams with

various types of conventional (UT) probes, phased array (PA) probes, and wedges. The Advanced Calculator saves the individual element delays in a text file formats. You can import these files in TomoView for use with the supported acquisition units. You can also directly import the .law files in the OmniScan portable phased array

system.

You can use the Advanced Calculator as a standalone software or launch it from

TomoView.

This document also provides guidelines on how to use the Advanced Calculator to

generate ultrasonic beams for various typical phased array probe configurations.

1.1 About the Advanced Calculator User Interface

The Advanced Calculator user interface includes a menu bar and a selection of tabs at the top of the screen (see Figure 1‐1 on page 5). The menu bar is simple. It provides

file related and help related commands. The first five tabs regroup parameters related

to a specific type of probe. The last three tabs present graphically rendered illustration

and probe element information.

Figure 1‐1 The menu bar and the available tabs




6 Chapter 1

A button bar is available at the bottom of the Advanced Calculator window (see

Figure 1‐2 on page 6).

Figure 1‐2

The button

bar

The presence of some Advanced Calculator user interface elements depends on

whether you launched the Advanced Calculator from TomoView or as a standalone

software.

1.2 About the Menu Bar

The Advanced

Calculator

menu

bar

contains

two

menus:

File

and

Help.

1.2.1 File Menu Commands

The File menu contains the following commands:

Load

Used to open the Open dialog box in which you can select a calculator setup file to load (.cal or .xcal format).

Save As

Used to open the Save As dialog box in which you can select the name, location, and format (.xcal, .pac, or .law) of the file to which you save the calculator data. This creates one .law file for each group. The file contains delays to be applied for

all ultrasonic beams.

Progress bar To exit the program

(equivalent of File > Exit)

To save data in .xcal, .pac, or .law files (equivalent of File > Load)

To load data from .xcal or .cal files (equivalent of File > Load)

To build illustrations




Introduction 7

Export elementary law

This command includes a submenu with two items (Delay and No Delay). Both

submenu commands are used to open the Save As dialog box in which you can

select the

name

and

location

of

a .law

file

in

which

to

save

ultrasonic

beam

data,

respectively, with or without the delay data. This creates one .law file for each

ultrasonic beam in the current group. Each .law file contains one beam per

element used in the aperture.

Run AFiSiMO Batch

Used to open a Browse dialog box in which you can select a folder containing one

or more calculator setup files (.xcal format). The Advanced Calculator then

performs the AFiSiMO simulations for all configurations stored in the .xcal files in the selected folder. The generated simulation data is saved in the .xcal files.

Preferences

Used to open the Preferences dialog box in which you can select the

measurement units (Metric or US Cust.) used in the Advanced Calculator user

interface.

ExitUsed to terminate the execution of the Advanced Calculator program.

1.2.2 Help Menu Commands

The Help menu contains the following commands:

Advanced Calculator

Help

Used to open the Advanced Calculator online help.

About Advanced Calculator

Used to open the About Advanced Calculator dialog box that contains the

Advanced Calculator version, option, and copyright information.




8 Chapter 1

1.3 About the Supported File Formats

The Advanced Calculator can open and save data using the file formats described in

Table 1 on page 8 and open the legacy file formats described in Table 2 on page 8.

Table 1 File formats supported by the Advanced Calculator

File type Extension File content

Calculator setup .xcal Extended Advanced Calculator setup file

Calculator setup .law Calculated ultrasonic beam parameters also

readable by the OmniScan. Refer to Appendix C on page 139 for details.

Calculator setup .pac Calculated ultrasonic beam parameters. Refer to Appendix D on page 149 for details.

Table 2 Legacy file format supported by the Advanced Calculator

File type Extension File content

Calculator setup .cal Advanced Calculator setup file

DMTA 20039 01EN [U8778541] R A A t 2012




Phased Array Technique 9

2. Phased Array Technique

This section describes the main concepts of a phased array inspection and the phased

array data views.

Phased array technology allows the generation of an ultrasonic beam with the

possibility of modifying the ultrasonic beam parameters such as angle, focal distance, and focal spot size with software. Furthermore, this ultrasonic beam can be

multiplexed over a large array, thus creating a movement of the ultrasonic beam along

the array.

These

capabilities

open

a series

of

new

possibilities.

For

example,

it

is

possible to quickly vary the angle of the ultrasonic beam to scan a part or weld

without moving the probe itself. Phased array capabilities also allow the replacement of multiple probes, and mechanical scanning devices. Inspecting a part or weld with a

variable‐angle ultrasonic beam also improves detection, regardless of the defect orientation, while optimizing signal‐to‐noise ratio.

2.1 Physical Principles

To generate an ultrasonic beam, the various probe elements are pulsed at slightly

different times. By precisely controlling the delays between the probe elements, ultrasonic beams of various angles, focal distances, and focal spot sizes can be

produced. As shown in Figure 2‐1 on page 10 , the echo from the desired focal point hits the various transducer elements with a computable time shift. The echo signals

received at each transducer element are time‐shifted before being summed together. The resulting sum is an A‐scan that emphasizes the response from the desired focal point and attenuates various other echoes from other points in the material.

DMTA 20039 01EN [U8778541] Rev A August 2012




10 Chapter 2

Figure 2‐1

Emitting and

receiving

in

a phased

array

system

A phased array probe is typically a one‐ or two‐dimensional array of small transducer

elements. To control the ultrasonic beam characteristics, the excitation pulse is applied

at different times to the various elements of the probe.

The

phased

array

probe

is

composed

of

multiple

elements

that

allow

ultrasonic

beam

angle control (see section 2.1.1 on page 10) and ultrasonic beam focus control (see

section 2.1.2 on page 12).

2.1.1 Beam Angle Control

Beam angle control involves the production of a wave front. As shown in Figure 2‐2

on page 11 ,

simultaneous

firing

of

all

elements

of

a linear

multielement

probe

produces a series arc circle waves, one from each transducer element. As all wave

fronts are at the same distance from their respective emitter, the resulting wave front, or envelope, is parallel to the transducer plane. This, in fact, is very similar to pulsing

a single element transducer of the same size.

Acquisition Unit

Acquisition Unit

Phased Array

Unit

Phased Array

Unit

Probes

Flaw

Emitting

Receiving

Trig.

Pulses Incident wave front

Reflected wave frontEcho signals

Flaw

DMTA‐20039‐01EN [U8778541] Rev A August 2012



DMTA 20039 01EN [U8778541], Rev. A, August 2012


Figure 2‐2 Ultrasonic wave front of a linear array

The phased

array

unit

allows

the

pulsing

of

the

various

elements

in

a sequential

manner with a small and precisely controlled time delay between each element. Sequential firing of the various transducer elements produces a series of arc circle

waves. The resulting envelope is a wave front, which is no longer parallel to the

transducer surface but propagates at an angle (see Figure 2‐3 on page 11). It is

possible to adjust the pulse delays to produce any desired wave‐front angle.

Figure 2‐3

Ultrasonic beam

angle

control

of

a linear

array

Delay

Transducer Array

Wave Front

Delay

Transducer Array

Wave Front

Angle




M A 0039 0 EN [U8 85 ], ev. A, August 0

12 Chapter 2

2.1.2 Beam Focus Control

When generating a focused beam, the delays are adjusted so that all individual wave

fronts stay in phase along the path leading to the desired focal point, while canceling

each other out at all other points. By accurately controlling the pulse delays, it is

possible to focus the beam at a desired point (see Figure 2‐4 on page 12).

Figure 2‐4 Ultrasonic beam focusing of a linear array

For beam

angle

control

and

beam

focus

control,

signals

received

by

every

element

are

time‐synchronized by the phased array system prior to summing the various

responses.

2.2 Phased Array Applications

The ultrasonic

beam

generated

by

a phased

array

probe

is

treated

as

an

ordinary

ultrasonic beam by the TomoView ultrasonic visualization and analysis software, and

as such can be used to generate all the regular data views (A‐scan views, B‐scan

views, volumetric views, etc.).

Phased array also offers the possibility of performing inspections with various angles

and focal lengths. It provides hardware and software tools for different application

types.

Delay

Transducer Array

Focal Point




g


The application types that you can select in the Advanced Calculator dialog box are:

• Sectorial scanning

• Depth scanning

• Linear electronic scanning

2.2.1 Sectorial and Depth Scanning

The sectorial scanning of the phased array signal is obtained by applying several beams in sequence at each X‐Y coordinate of the inspected area.

For a particular X‐Y position of the inspection sequence, an array of elements is used

to deflect the ultrasound beam without moving the probe. The scanning can be done

along a horizontal axis (see Figure 2‐5 on page 13), at different depths in the material (see Figure 2‐6 on page 14), or for a combination of these two modes.

Figure 2‐5 Sectorial scanning of X‐axis using phased array deflection

F1 F2 F3 F4 F5

X Movement

Y Movement

Beams:




14 Chapter 2

Figure 2‐6 Scanning at different depths

For certain applications, a conventional UT inspection would require a number of different transducers. A single phased array probe can be made to sequentially

produce the various angles and focal points required by the application (see


Figure 2‐7

Ultrasonic beam

angle

control

and

focusing

of

a linear

array

F1

F2

F3

F4

X Movement

Y Movement

Beams

Delay

Transducer Array

Focal Point

Angle





2.2.2 Linear Electronic Scanning

For large phased array probes containing a high number of elements, the phased

array unit can apply the same beam to different sets of elements. By moving the beam

along a transducer array, the scanning of an inspection axis is realized electronically

without any need for physical displacement of the transducer (see Figure 2‐8 on

page 15).

Figure 2‐8 Electronic scanning along an axis

In Figure 2‐8 on page 15 , a focused beam is created using a few of the many

transducer elements of a long phased array probe. The beam is then shifted (or

multiplexed) to the other elements to perform a high‐speed scan of the part with no

transducer movement along scanning axis. More than one scan can be performed with various inspection angles.

641

16

Scanning Direction

Active Group




16 Chapter 2




The UT Probe Tab 17

3. The UT Probe Tab

The UT Probe tab provides parameters to define a single‐element conventional probe

and the wedge used to perform acoustic field simulation in the AFiSiMO tab.

The UT Probe tab is enabled only when you start the Advanced Calculator as a

standalone software.




18 Chapter 3

The UT Probe tab is divided into nine areas (see Figure 3‐1 on page 18). A few areas

are not applicable to this tab and are therefore empty or disabled. A description of the

applicable areas follows.

Figure 3‐1 The 1‐D Linear array tab




The UT Probe Tab 19

3.1 Acquisition Unit Area

Figure 3‐

2

The

Acquisition

Unit

area

The Acquisition Unit area (Figure 3‐2 on page 19) contains only one drop‐down

combo box used to select the type of acquisition unit for which you want to create

beams. The drop‐down combo box is available only when no acquisition unit is

connected to the computer. The acquisition unit is automatically detected when it communicates with the computer.

3.2 Connection Area

Figure 3‐3 The Connection area

The Connection area (see Figure 3‐3 on page 19) contains the following elements:

Pulser and Receiver

When using only one probe, always set the value of these parameters to 1.

Use these parameters when connecting two UT probes for measurement in a

symmetric configuration.




20 Chapter 3

3.3 Probe Area

Figure 3‐4 The Probe area

The Probe area contains the following (see Figure 3‐4 on page 20):

Probe database

The drop‐down combo box allows you to select a probe from the probe database.

Load from database button

Allows you to load a probe configuration from the probe database.

Save in database button

Allows

you

to

save

the

active

probe

configuration

in

the

probe

database.

Delete from database button

Allows you to delete a probe configuration from the probe database.

Probe scan offset

Defines the distance between the center of the element and the scan‐axis origin.




The UT Probe Tab 21

Probe index offset

Defines the distance between the front of the wedge and the index‐axis origin.

Probe skew angle

For angle beam probes, defines the skew angle of the probe. The Probe skew

angle is defined as the angle between the projected beam angle and the scan‐axis. It can have values between 0° and 360°, and is positive when turning from the

positive scan‐axis towards the positive index‐ axis.

Probe frequency

Defines the probe frequency.

Length / Diameter

Defines the length or diameter of the element.

Width

Defines the width of a rectangular element.

Circular probe

Select when the probe element is circular.

3.4 Part Area

Figure 3‐5 The Part area for flat part

The Part area (see Figure 3‐5 on page 21) contains the following:

TypeDefines the part type supported by the Advanced Calculator:

Plate: flat part.

Pipe OD: cylindrical part inspected from the outside diameter.

Pipe ID: cylindrical part inspected from the inside diameter.




22 Chapter 3

Thickness (mm)

Defines the thickness of the part to be displayed on the Beam Display Info. tab.

Radius (mm)

Defines the radius of the cylindrical part. For a Pipe OD part, this value

represents the outer radius (inner radius + thickness). For Pipe ID part, the radius

represents the inner radius.

3.5 Material Area

Figure 3‐6

The Material

area

for

flat

part

Material database

Allows the use of the Material database:


Allows you to load a material configuration from the material database.


Allows you to save the active material configuration in the material database.


Allows you to delete a material configuration from the material database.

Sound velocity area

Defines the sound velocities in the material to be inspected for the available wave

types (Longitudinal [compression] or Transverse [shear]) waves (m/s).

Density

Defines the density of the selected material.


A i



The UT Probe Tab 23

Attenuation

Used to set the ultrasonic attenuation for the selected material. Note that attenuation is frequency dependent.

3.6 Wedge Area

Figure 3‐7

The Wedge

area

The Wedge area (see Figure 3‐7 on page 23) contains the following:

Wedge database

Allows the use of the Wedge database:


Allows you to load a wedge configuration from the wedge database.


Allows you to save the active wedge configuration in the wedge database.




24 Chapter 3


Allows you to delete a wedge configuration from the wedge database.

Wedge angle

Defines the wedge angle in degrees. The Wedge angle is the angle between the

element surface (when it is fixed on the wedge) and the surface of the part (or the

tangential plane to the surface of the part in the case of a cylindrical geometry). It is obtained by a rotation around the secondary axis of the probe, and can have

values between 0° and 89.9°.

Sound velocity

Defines the sound velocity in the wedge.

Height at the middle of the first element

Defines the height of the middle of the element, relative to the material surface.

For cylindrical part, the height is measured relative to the flat surface obtained by

drawing a line between the contact points of the wedge, and is always positive.

Primary axis offset of the middle of the first element

Defines the offset of the middle of the element along the primary axis, relative to

the back of the wedge. The offset is always measured along a straight line, and

normally has positive values.

Secondary axis offset of the middle of the first element

Defines the offset of the middle of the element along the secondary axis, relative

to the left side of the wedge. The offset is always measured along a straight line,

and normally has positive values.

Primary axis position of wedge reference

Defines the primary axis position of the wedge reference relative to the

mechanical reference. The offset is always measured along the part surface and is

positive along the positive scan‐axis direction.

Secondary axis position of wedge reference

Defines the secondary axis position of the wedge reference relative to the

mechanical reference. The offset is always measured along the part surface and is

positive along the positive index‐axis direction.

Wedge length

The Wedge length is defined as the actual length of the wedge.

For a cylindrical part with a curvature along primary axis, the wedge length

represents the distance between the contact points of the wedge.


Wedge width



The UT Probe Tab 25

Wedge width

The Wedge width is defined as the actual width of the wedge.

For a cylindrical part with a curvature along secondary axis, the wedge width

represents the

distance

between

the

contact

points

of

the

wedge.




26 Chapter 3




The 1‐D Linear Arrays Tab 27

4. The 1-D Linear Arrays Tab

This section presents the 1‐D linear arrays and describes the 1‐D

Linear

array tab.

4.1 Generic Conventions

You should consider generic conventions regarding probe, wedge, and part geometry

to generate beams for 1‐D linear arrays in the most efficient and accurate way. Generic

conventions exist on aspects such as orientations and positive directions of axes, reference points and signs of offsets, and definition and signs of angles.

4.1.1 Probe Conventions

Axis definition

The axis convention for a 1‐D

Linear

array as described in section 4.2 on page 44 (see

Probe area), is illustrated in Figure 4‐1 on page 28.




28 Chapter 4

Figure 4‐1 Probe axis definition

Refracted angle

The refracted angle of the ultrasound beam is defined as the angle between the central ray of the ultrasound beam in the material and the normal on the surface at the

entrance point of the central ray (see Figure 4‐2 on page 28 and Figure 4‐3 on page 29). The refracted angle can have values between –89.9° and 89.9°.

Figure 4‐2 Refracted angle on flat part

Secondary axis

Primary

axis S e c o n d a r y a x i s w i d t h

Primary axis pitch

Refracted angle





Figure 4‐3 Refracted angle on pipe part

Skew angle

The total skew angle is the sum of two components: the beam skew angle (for definition, see section 4.2.3 on page 46) and the probe skew angle (for definition, see section 4.2.7

on page 55). In both cases, the TomoView conventions are used. The skew angle can

have values between 0° and 359.9°.

Beam skew angle

Since the 1‐D linear array as no skewing capability, only a beam skew angle different from 0° can be obtained when using a wedge with a roof angle.

The beam skew angle is defined as the angle between the ultrasound beam (central ray) projection on the scanning surface and the primary axis of the array. The beam skew

angle can have values between –179.9° and 179.9°, and it has a positive value when

turning from

the

positive

primary

axis

towards

the

positive

secondary

axis.

An example of a beam skew angle going from 70° to 110° with a resolution of 10° is

illustrated in Figure 4‐4 on page 30.

Refracted angle




30 Chapter 4

Figure 4‐4 Example of a beam skew angle

Probe skew angle

The probe skew angle is defined as the angle between the primary axis of the probe and

the scan‐axis. It can have values between 0° and 360°, and is positive when turning

from the positive scan‐axis towards the positive index‐axis.

Examples of different probe skew angles, between 0° to 135°, are illustrated in

Figure 4‐5 on page 31 to Figure 4‐8 on page 32.

110°

100°

90°80°

70°





Figure 4‐5 Example of a probe skew angle equal to 0°

Figure 4‐6

Example of

a probe

skew

angle

equal

to

45°

Primary

axis

Probe skew angle = 0°

Primary axis






32 Chapter 4

Figure 4‐7 Example of a probe skew angle equal to 90°

Figure 4‐8

Example of

a probe

skew

angle

equal

to

135°

Primary axis

Primary axis



Total skew angle




The combination of a probe skew angle of 90° and a beam skew angle of 15°, resulting

in a total skew angle of 152.51°, is illustrated in Figure 4‐9 on page 33.

Figure 4‐9 Total skew angle

Primary axis


Beam skew angle = 15°

Skew angle = 152.51°


4.1.2 Wedge Conventions



34 Chapter 4

In the Advanced Calculator, the different rotations, which define the wedge , roof , and

squint angles are performed in such a way that they are independent. This is

mathematically possible because the rotations are performed around adequate axes (not necessarily Scan, Index, and Usound). Consequently, the chronology of the

rotations is not important. The value specified for each angle will be correctly applied.

Wedge angle

The wedge angle is the angle between the primary axis of the probe (when it is fixed on

the

wedge)

and

the

surface

of

the

component

(or

the

tangential

plane

to

the

surface

of

the component in the case of a cylindrical geometry). It is obtained by a rotation

around the secondary axis of the probe, and can have values between 0° and 89.9°.

Figure 4‐10 on page 34 gives an example of a wedge with a wedge angle and no roof angle.

Figure 4‐10 Wedge angle definition

Primary axis

Secondary

axis Wedge angle > 0


Roof angle

Th f l i h i l d h i i f h b d h




The roof angle is the rotation angle around the primary axis of the probe, and can have

values between –89.9° and 89.9°. For a probe skew of 0°, a positive roof angle will generate beams with total skew angles between 0° and 180°.

Figure 4‐11 on page 35 gives an example of a wedge with a positive roof angle and no

wedge angle.

Figure 4‐11 Roof angle definition

For pitch‐and‐catch configurations, the probe separation and the squint angle parameters must be appropriately set.

Secondary axis

Primary

axis Roof angle > 0


Probe separation

The probe separatio defines the spacing (center to center distance) bet een the first



36 Chapter 4

The probe separation defines the spacing (center‐to‐center distance) between the first element of the transmitters array and the first element of the receivers array (see


Figure 4‐12 Probe separation

Squint angle

The squint angle is defined as half the angle between the primary axes of transmitter

and receiver arrays. A symmetrical rotation is automatically applied to the receiving

array. The squint angle can have values between –89.9° and 89.9°, and a positive

squint angle means that the primary axes of the arrays cross in front of the arrays (see


Probe separation





Figure 4‐13 Squint angle definition

Position of the probe relative to the wedge

In the Wedge area of the Advanced Calculator, the values for the Primary axis

position of wedge reference (mm) and Secondary axis position of wedge reference

(mm) parameters are adjusted so that the probe is correctly positioned relative to the

wedge. In the example shown in Figure 4‐14 on page 38 , the front of the wedge is at zero on the index‐axis and the center of the wedge is at zero on the scan‐axis.

For standard flat wedges, in the Wedge area of the Advanced Calculator, do not change the values of the Primary axis position of wedge reference and the Secondary

axis position

of

wedge

reference

parameters

(see

section 4.2.10

on

page 60)

Primary axis

Squint angle > 0°

ultrasound -axis




38 Chapter 4

Figure 4‐14 Wedge reference positions

4.1.3 Conventions Related to the Part

In

order

to

increase

the

flexibility

with

regards

to

selection

of

reference

points,

the

Advanced Calculator considers two different reference points:

• The wedge reference point is the intrinsic reference point used by the calculator and

is always located at the rear‐left corner of the wedge. The probe is then positioned

with regards to the wedge reference by specifying the Primary axis offset of the

middle of the first element parameter and the Secondary axis offset of the

middle of the first element parameter (for definition, see section 4.2.10 on

page 60).• The mechanical reference point is an arbitrary reference point that can be used by the

operator to define the position of the intrinsic wedge reference relative to an

alternative wedge reference (for example, the front of the wedge) or a reference

point on a scanning mechanism. The wedge reference is positioned with regards

to the mechanical reference by specifying the Primary axis position of wedge

reference parameter or the Secondary axis position of wedge reference

parameter (for

definition,

see

section 4.2.10

on

page 60).

In

the

visualization

of

the


considered configurations on the Beam Display Info. tab, the mechanical reference

is always positioned at the origin.




• When using Primary axis position of wedge reference and/or Secondary axis

position of wedge reference values different from zero, the Advanced Calculator

takes these values into account for the scan and/or index offset values in the Beam

Information area of the Beam Display Info. tab.

Examples for flat and cylindrical parts are illustrated in Figure 4‐15 on page 40 , Figure 4‐16 on page 41 , and Figure 4‐17 on page 42.

Flat part

For standard probes and wedges, to correctly position the wedge and the probe

relative to the part, enter proper values in the Probe scan offset (mm) and Probe

index offset (mm) parameters in the Probe area of the Advanced Calculator (see

section 4.2.7 on page 55).

For custom wedges, refer to Figure 4‐15 on page 40 to understand the physical meaning of the various Advanced Calculator parameters.


Primary axis position of wedge



40 Chapter 4

Figure 4‐15 Flat part: offset definition

reference > 0 Wedge reference

Secondary axis

position of wedge

reference < 0

Primary axis offset of the middle of the first

element > 0

Mechanical reference

Secondary axis offset of the middle

of the first element > 0




Cylindrical part




Figure 4‐16 Pipe OD with a curvature along the primary axis: offset definition



Secondary axis

position of wedge

reference < 0

Primary axis offset of the middle of the first element > 0


Secondary axis offset of the middle of

the first element > 0


element (measured along a straight line)

Height at the middle of

the first element

Distance between contact points (wedge length)





42 Chapter 4

Figure 4‐17 Pipe ID with a curvature along the primary axis: offset definition

For cylindrical parts (Pipe OD or Pipe ID), it is important to notice that the wedge is, by definition, considered as centered on the center of the pipe.


Secondary axis

position of wedge

reference < 0


element > 0


Secondary axis offset of the middle of the firstelement > 0

Primary axis offset of the middleof the first element (measured

along a straight line)

Height at the middle

of the first element

Distance between contact points (wedge

length)


Similar conventions apply to a Pipe OD and Pipe ID with a curvature along secondary

axis , with a difference that the Distance between contact points represents the wedge width.




i


4.2 1-D Linear Array Tab Description



44 Chapter 4

The 1‐D Linear array tab is divided into ten areas (see Figure 4‐18 on page 44).

Figure 4‐18 The 1‐D Linear array tab


4.2.1 Acquisition Unit Area




Figure 4‐19 The Acquisition Unit area


combo box used to select the type of acquisition unit for which you want to create

beams. The beam calculation uses a slightly different compensation gain for each

acquisition unit type. The drop‐down combo box is available only when no

acquisition unit is connected to the computer. The acquisition unit is automatically

detected when it communicates with the computer.

4.2.2 Scan Type Area

Figure 4‐20

The

Scan

area

The Scan Type area (Figure 4‐20 on page 45) contains the following:

Type

Selects the type of beams to be generated:

• Sectorial: the refracted or inspection angle varies (see section 2.2.1 on page 13

and section 4.5 on page 70).

• Linear: the primary aperture travels along the array (see section 2.2.2 on

page 15 and section 4.6 on page 82).

• Depth: the focusing depth of the ultrasound beam varies (see section 2.2.1 on

page 13 and section 4.4 on page 67).


• Static: the refracted angle, the focusing depth, and the primary aperture are

fixed values (generates a single beam) [see section 4.3 on page 63].



46 Chapter 4

4.2.3 Beam Angles Selection Area

Figure 4‐21 The Beam angles selection area

The Beam Angles Selection area (see Figure 4‐21 on page 46) contains the following:

Primary steering angle (deg)

Is the angle between the central ray of the beam generated at the probe surface

and the normal on the wedge surface in contact with the probe. It is generated by

electronic steering of the array probe and determines the resulting incident angle

() in

the

wedge,

used

to

calculate

the

refracted

angle

of

the

ultrasound

beam

to

be generated according to Sell’s law (see Figure 4‐22 on page 47). The Primary

steering angle can have values between –89.9° and 89.9°, and a “0” value

generates the nominal angle defined by the wedge parameters.

For Sectorial beams: the three Primary steering angle spin boxes are used to set the first and last primary steering angles, and the angular primary steering angle

resolution between two consecutive beams.

For Linear , Depth , and Static beams: only the Start box can be modified to set the

primary steering angle of the ultrasound beam to be used to generate the beams.

Not applicable for pitch‐and‐catch configurations.

Secondary steering angle (deg)

Not applicable for a 1‐D linear array.


Refracted angle (deg)

Defines the refracted angle of the ultrasound beam to be generated. The refracted

angle of the ultrasound beam is defined as the angle between the central ray of the




ultrasound beam in the material and the normal on the incidence plane. The

refracted angle () is calculated using the probe incidence angle (), sound velocity in the wedge, and sound velocity in the material according to Snell’s law

(see Figure 4‐22 on page 47).

Figure 4‐22 Refracted angle

The refracted angle can have values between –89.9° and 89.9°.

For Sectorial beams: the three Refracted angle spin boxes are used to set the first and last refracted angles, and the angular refracted angle resolution between two

consecutive beams.

For Linear , Depth , and Static beams: only the Start box can be modified to select the refracted angle of the ultrasound beam to be generated by the beams.

Beam skew angle (deg)

Defines the skew angle of the ultrasound beam to be generated. This skew angle

is defined as the angle between the ultrasound beam (central ray) projection on

the scanning surface and the primary axis of the array. The Beam skew

angle can

have values between –179.9° and 179.9°, and, has a positive value when turning

from the positive primary axis towards the positive secondary axis. The Beam

skew angle value does not take into account the probe skew angle described in

the Probe area (see Figure 4‐4 on page 30).

sin

sin-----------

Sound velocity in wedge

Sound velocity in material---------------------------------------------------------------=

β

α


For Sectorial beams: the three Beam skew angle spin boxes are used to set the

first and last skew angles, and the angular beam skew angle resolution between

two consecutive beams.



48 Chapter 4

For Linear , Depth , and Static beams: only the Start box can be modified to set the

beam skew angle of the ultrasound beam to be generated by the beams.


Process angles button

Calculates the values of the primary steering angle, refracted angle, and/or beam

skew angle associated with the beam angle selection.

4.2.4 Focal Points Selection Area

Figure 4‐23 The Focal points selection area

The Focal Points Selection area (see Figure 4‐23 on page 48) contains the following:

Focusing type

Selects the type of focusing of the beams to be generated:

• True depth: all beams are focused at a constant true‐depth value (see

Figure 4‐24 on page 50). For cylindrical part, the true‐depth value is defined

as the depth in the cylindrical geometry.

• Half path: all beams are focused at a constant half‐path (distance) value (see



• Projection: all beams are focused on a given vertical plane (see Figure 4‐26 on

page 51); this option is not applicable for depth laws, for DDF (dynamic

depth focusing) laws, and for pitch‐and‐catch configurations.

F l l ll b f d d fi d f l l (




• Focal plane: all beams are focused on a user‐defined focal plane (see

Figure 4‐27

on

page 51);

this

option

is

not

applicable

for

depth

laws,

DDF

laws, and for pitch‐and‐catch configurations.

• Auto: the focalization depth is automatically calculated in order to have the

transmitter and the receiver focused at the same point in space. The

focalization is thus made at the geometrical intersection of the transmitter and

the receiver central rays (see Figure 4‐28 on page 52). This option is only

applicable for pitch‐and‐catch configurations.

DDFWhen this check box is selected, the dynamic depth focusing (DDF) algorithm is

applied on the beams for the considered Reception focus position (depth or half‐path).


Focal plane position

Defines the focalization plane:

• Projection: the first Offset box is used to define the position, in scan or in

index (depending on the skew angle of the probe) of the vertical focal plane

(see Figure 4‐26 on page 51).

• Focal plane: the Offset and Depth boxes are used to set the two points (in

scan or index, and in depth) defining the focal plane (see Figure 4‐27 on

page 51).Emission focus position (mm)

Defines the desired focusing position (depth or half‐path) of the ultrasound beam

to be generated.

For Depth beams: the three boxes are used to set the initial (Start) and final (Stop) desired focusing position (depth or half‐path) of the ultrasound beam to be

generated and the resolution.

Reception focus position (mm)

Defines the desired focusing position (depth or half‐path) (applied delay) for the

received signal.

When the DDF check box is selected, both boxes are used to set the initial (Start) and final (Stop) desired focusing position (depth or half‐path) at reception.


When the DDF check box is not selected, the Emission focus position is equal to

the Reception focus position.



50 Chapter 4

Figure 4‐24 True depth focalization

Figure 4‐25 Half‐path focalization

true-depth = 50 mm

half-path = 50 mm


Projection = 75 mm




Figure 4‐26 Projection focalization

Figure 4‐27 Focal plane focalization

(95 Scan, 75 Usound)

(75 Scan, 12 Usound)




52 Chapter 4

Figure 4‐28 Autofocalization for pitch‐and‐catch configuration

4.2.5 Elements Selection Area

Figure 4‐29 The Elements selection area

The Elements Selection area (see Figure 4‐29 on page 52) contains the following:


Improved resolution

This check box appears when Linear is selected in the Scan area and can only be

selected when the Resolution of the Pulser parameter is set to 1.

Wh th I d l ti h k b i l t d f h b t b




When the Improved resolution check box is selected, for each beam to be

generated with the defined Active aperture , another beam will be generated with

“Active aperture + 1” elements.

Therefore, the element step (Resolution) between two beams is reduced to

1/2 element.

Pulser

Sets the first element of the active pulser group.

For Linear beams: the three boxes define the elements that are used during the

scan.

Start

Sets the first element of the first group of active elements (aperture).

Stop

Sets the first element of the last group of active elements (aperture).

Resolution

Sets the increment (in number of elements) for linear beams.

Receiver

Sets the first element of the active receiver group.

Primary axis aperture

Sets the number of elements used simultaneously to generate beams.

4.2.6 Connection Area

Figure 4‐30 The Connection area

The Connection area (see Figure 4‐30 on page 53) contains the following:


Pulser and Receiver

When using only one probe, always set the value of these parameters to 1.

Use these parameters when connecting two phased array probes to a splitter box

(such as the OMNI A ADP05 shown in Figure 4 31 on page 54) for measurement



54 Chapter 4

(such as the OMNI‐A‐ADP05 shown in Figure 4‐31 on page 54) for measurement in a symmetric configuration. In this case, you need to separately calculate the

beams for each probe using the same values for all parameters of the Advanced

Calculator except for the Pulser connection and Receiver connection parameters. For a given probe, the Pulser connection and Receiver connection parameters

must have the same value. If you are working with 128‐element probes, the value

can be between 1 and 64 for the first probe and between 65 and 128 for the second

probe (see Figure 4‐31 on page 54).

In the case of TOFD probes, you need to connect the pulser and receiver on different connectors and note the element numbers used in the respective parameters.

Figure 4‐31 Example of Pulser and Receiver connection parameter configuration

for two

128

‐element

probes

connected

to

an

OMNI

‐A

‐ADP05

splitter

box


4.2.7 Probe Area




Figure 4‐32 The Probe area

The Probe area contains the following (see Figure 4‐32 on page 55):

Probe database

The drop‐down combo box allows you to select a probe from the probe database.


Allows you to load a probe configuration from the probe database.


Allows you to save the active probe configuration in the probe database.


Allows you to delete a probe configuration from the probe database.

Probe scan offset

Defines the distance between the center of the first element and the scan‐axis

origin. Clicking the button on the same line brings the information window

shown

in

Figure 4‐

33

on

page 56.




56 Chapter 4

Figure 4‐33 Definition of the probe scan offset

Probe index offset

Defines the distance between the front of the wedge and the index‐axis origin. Clicking on the same line brings the information window shown in Figure 4‐34

on page 57.





Figure 4‐34 Definition of the probe index offset

Probe skew angle

Defines the skew angle of the probe. The Probe skew

angle is defined as the angle

between the primary axis of the probe and the scan‐axis. It can have values

between 0° and 360°, and is positive when turning from the positive scan‐axis

towards the positive index‐axis (see Figure 4‐8 on page 32).

Probe frequency


Number of

elements

on

primary

axis

Defines the number of elements on the primary axis of the current probe (see


Primary axis pitch

Defines the spacing (center‐to‐center distance) between consecutive probe

elements on the primary axis of the probe (see Figure 4‐1 on page 28).


Secondary axis width

Defines the width of the elements (see Figure 4‐1 on page 28).

Pitch and Catch

Allows the creation of a pitch‐and‐catch side‐by‐side probe configuration.



58 Chapter 4

Allows the creation of a pitch and catch side by side probe configuration.

Reverse primary axis

Inverts the order of the element numbers in the calculation of the beams.

Probe separation

Defines the spacing (center‐to‐center distance) between the first element of the

transmitters array and the first element of the receivers array (see Figure 4‐12 on

page 36).

This

option

is

only

applicable

for

pitch‐

and‐

catch

configurations.Squint angle

Defines the squint angle of the transmitter and the receiver array. The Squint angle is defined as half the angle between the primary axes of transmitter and

receiver arrays. A symmetrical rotation is automatically applied to the receiving

array. Squint angle can have values between –89.9° and 89.9°, and a positive

squint angle means that the primary axes of the array cross in front of the arrays

(see Figure 4‐13 on page 37). Only applicable for pitch‐and‐catch configurations.

4.2.8 Part Area



TypeDefines the part type supported by the Advanced Calculator:

Plate: flat part.

Pipe OD: cylindrical part inspected from the outside diameter.

Pipe ID: cylindrical part inspected from the inside diameter.


Thickness (mm)


Radius (mm)

Defines the radius of the cylindrical part. For a Pipe OD part, this value




y p p p ,represents the outer radius (inner radius + thickness). For Pipe ID part, the radius

represents the inner radius.

4.2.9 Material Area

Figure 4‐36 The Material area for flat part

Material database







Allows you to delete a material configuration from the material database.

Sound

velocity area



Density



Attenuation

Used to set the ultrasonic attenuation for the selected material.

4.2.10 Wedge Area



60 Chapter 4

Figure 4‐37 The Wedge area


Wedge database



Allows you

to

load

a wedge

configuration

from

the

wedge

database.


Allows you to save the active wedge configuration in the wedge database.


Allows you to delete a wedge configuration from the wedge database.


Footprint

Defines the footprint of the wedge. For a Plate part, the footprint is set to Flat. For

a cylindrical part, the footprint has to be selected from: Curvature along primary

axis or Curvature along secondary axis.

d l




Wedge angle

Defines the wedge angle in degrees. The Wedge angle is the angle between the

primary axis of the probe (when it is fixed on the wedge) and the surface of the

component (or the tangential plane to the surface of the component in the case of a cylindrical geometry). It is obtained by a rotation around the secondary axis of the probe, and can have values between 0° and 89.9° (see Figure 4‐10 on page 34).

Roof

angleDefines the roof angle in degrees. The Roof angle is defined as the rotation angle

around the primary axis of the probe, and can have values between –89.9° and

89.9°. For a probe skew of 0°, a positive roof angle will generate beams with total skew angles between 0° and 180° (see Figure 4‐11 on page 35).

Sound velocity



Defines the height of the middle of the first element, relative to the material surface (see Figure 4‐15 on page 40).

For cylindrical part, the height is measured relative to the flat surface obtained by

drawing a line between the contact points of the wedge, and is always positive

(see Figure 4‐16 on page 41 , Figure 4‐17 on page 42).


Defines the offset of the middle of the first element along the primary axis, relative to the back of the wedge (see Figure 4‐15 on page 40). The offset is always

measured along a straight line, and normally has positive values.

Secondary axis offset of the middle of the first element

Defines the offset of the middle of the first element along the secondary axis,

relative to the left side of the wedge (see Figure 4‐15 on page 40). The offset is

always measured along a straight line, and normally has positive values.

Primary axis position of wedge reference

Defines the primary axis position of the wedge reference relative to the

mechanical reference (see Figure 4‐15 on page 40). The offset is always measured

along the part surface and is positive along the positive scan‐axis direction.


Secondary axis position of wedge reference

Defines the secondary axis position of the wedge reference relative to the

mechanical reference (see Figure 4‐15 on page 40). The offset is always measured

along the part surface and is positive along the positive index‐axis direction.

W d l th Di t b t t t i t ( d l th)



62 Chapter 4

Wedge length or Distance

between

contact

points

(wedge

length)

The Wedge length is defined as the actual length of the wedge.

For a cylindrical part with a curvature along primary axis, the wedge length

represents the distance between the contact points of the wedge (see Figure 4‐16

on page 41 , Figure 4‐17 on page 42).

Wedge width or Distance between contact points (wedge width)

The Wedge width is defined as the actual width of the wedge.

For a cylindrical part with a curvature along secondary axis, the wedge width

represents the distance between the contact points of the wedge.


4.3 Creating a Static Beam

A Static beam is used to generate, with a phased array probe, an ultrasound beam

similar to the one obtained by a conventional probe. The refracted angle, the focusing

depth and the primary aperture cannot be modified; they are fixed A single beam is




depth, and the primary aperture cannot be modified; they are fixed. A single beam is

generated.

To illustrate the use of the calculator for creating a Static beam for a 1‐D linear array

probe, the following typical application is given as an example:

Example 1: single array, flat part, probe parallel to scan-axis

The following configuration is considered:

• Single 1‐D linear array probe, with the following characteristics: nominal frequency 5 MHz, 32 elements, pitch 1 mm, and width of the elements 10 mm

• A Rexolite wedge with the following characteristics: wedge angle 36°, no roof angle, wedge velocity 2330 m/s, height at the middle of the first element 12 mm, primary axis offset of the first element 9 mm

• A flat carbon steel part with a wall‐thickness of 50 mm

• The probe is oriented parallel to the scanning axis (skew 0°), and the rear end of the probe is positioned at 75 mm from the scan‐axis reference (0‐point).

• The probe generates a shear‐wave beam in pulse‐echo mode at a 60° refracted

angle, focusing at a true‐depth of 30 mm; all 32 elements of the probe are used to

generate the beam.

In order to generate this Static beam, the input parameters must be set as shown in

Figure 4‐38 on page 65.

Attention should be paid to the setting of the following parameters:

• Height of the middle of the first element: 12 mm, as mentioned previously.

• Primary axis offset of the first element: 9 mm, as mentioned previously.

• Secondary

axis

offset

of

the

first

element: 15 mm,

in

order

to

position

the

probe

in the middle of the wedge with a width of 30 mm

• Primary axis position of wedge reference: –75 mm, in order to position the rear

end of the wedge at a distance of 75 mm from the scan‐axis zero reference

(mechanical reference point)


• Secondary axis position of wedge reference: –15 mm, in order to position the

middle of the wedge at the rear end of index‐axis zero reference (mechanical reference point)

Also, note that the database has been used to save probe, wedge, and material

parameters (see

section 10

on

page 125)



64 Chapter 4

parameters (see section 10 on page 125).





Figure 4‐38 Static Beam: input parameters

Graphical and numerical information concerning the generated law can be found on

the corresponding Beam Display Info. tab (see Figure 4‐39 on page 66).




66 Chapter 4

Figure 4‐39 Static beam: visualization


4.4 Creating Depth Beams

Depth beams are used to generate, at a fixed refracted angle and with a fixed primary

aperture, a set of ultrasound beams that focus at different depths.

T ill t t th f th l l t f ti D th b f 1 D li




To illustrate the use of the calculator for creating Depth beams for a 1‐D linear array

probe, the following typical application is given as an example:

Example 1: single array, flat part, probe perpendicular to scan-axis




• A flat carbon steel part with a wall thickness of 100 mm

• The probe

is

oriented

perpendicular

to

the

scanning

axis

(skew

90°),

and

the

rear

end of the probe is positioned at 75 mm from the index‐axis reference (0‐point).

• The probe generates shear‐wave beams in pulse‐echo mode at a refracted angle of 45°, focusing between a true‐depth distance of 20 mm to 80 mm with a depth

resolution of 10 mm; all 32 elements of the probe are to be used to generate the

beam.

In order to generate this set of Depth beams, the input parameters must be set as

shown in Figure 4‐40 on page 68.




• Secondary axis offset of the first element: 15 mm, in order to position the probe

in the

middle

of

the

wedge

with

a width

of

30 mm


end of the wedge at a distance of 75 mm from the index‐axis zero reference


middle of the wedge at the rear end of scan‐axis zero reference

Also, note that the database has been used to save probe, wedge, and material parameters (see section 10 on page 125).




68 Chapter 4

Figure 4‐40 Depth beams: input parameters

Graphical and numerical information concerning the generated laws can be found on






Figure 4‐41 Depth beams: visualization


4.5 Creating Sectorial Beams

Sectorial beams are used to generate, at a fixed focusing distance and with a fixed

primary aperture, a set of ultrasound beams with different inspection angles

(refracted angles and/or skew angles).



70 Chapter 4

To illustrate the use of the calculator for creating a set of Sectorial beams for 1‐D

linear array probes, various typical applications are given as examples.





• A flat carbon steel part with a wall thickness of 50 mm

• The probe is oriented perpendicular to the scanning axis (skew 90°), and the rear


• The probe generates shear‐wave beams in pulse‐echo mode at refracted angles

from 40° to 70° with a resolution of 5°, focusing at a constant half‐path distance of 40 mm; all 32 elements of the probe are to be used to generate the beam.

In order to generate this set of Sectorial beams, the input parameters must be set as






in

the

middle

of

the

wedge

with

a

width

of

30 mm• Primary axis position of wedge reference: –70 mm, in order to position the rear









Figure 4‐42 Sectorial beams: input parameters for sectorial sweep on a flat part






72 Chapter 4

Figure 4‐43 Sectorial beams: visualization of sectorial sweep on a flat part


Example 2: single array, flat part, probe parallel to scan-axis, “Lateral scan”



• A Rexolite wedge with the following characteristics: no wedge angle, roof angle




31°, wedge velocity 2330 m/s, height at the middle of the first element 12 mm, primary axis offset of the first element 9 mm


• The probe is used to generate shear‐wave beams at refracted angles of approximately 45°, skewed from at least –30° to +30° relative to the orientation

perpendicular to

the

scan

‐axis,

and

focusing

at

a constant

depth

of

35 mm;

all

32 elements of the probe are to be used to generate the beams.

• The probe itself is oriented parallel to the scanning axis (skew 0°), and the probe is

positioned so that the focal points coincide approximately with the index‐axis

reference (0‐point), and that the centre beam is aimed at the scan‐axis reference.

• This type of configuration is often called a “lateral scan” mode, and can be used to

improve detection of misoriented (skewed) flaws.

In order to generate this set of sectorial beams, the input parameters must be set as


Attention should be paid to the following parameters:

• The beam angles are selected using the Primary steering angle as the input parameter. In the case of a lateral scan with a linear array probe, this is the most

efficient

way

to

define

the

angles,

since

the

refracted

angle

changes

from

53.4°

down to 45.6° and back to 53.4°.





• Primary axis position of wedge reference: –25 mm, in order to position the centre

beam focal point end at the scan‐axis reference


focal point locus at the index‐axis reference





74 Chapter 4

Figure 4‐44 Sectorial beams: input parameters for “Lateral scan” on a flat part







Figure 4‐45 Sectorial beams: visualization of “lateral scan” on a flat part

Example 3: dual array, flat part, probe parallel to scan-axis



• Dual 1‐D linear array probe (pitch‐and‐catch), with the following characteristics: nominal frequency 2.25 MHz, 2 × 16 elements, pitch 1.7 mm, width of the

elements 6.6 mm

• The probe contains two identical Rexolite wedges with the following

characteristics: wedge angle 19.2°, roof angle 4.7°, wedge velocity 2330 m/s, height at the middle of the first element 5.4 mm, primary axis offset of the first element 7.9 mm; probe separation 15 mm, squint angle 6°



76 Chapter 4

; p p , q g


• The probe is oriented parallel to the scanning axis (skew 0°), and the rear end of the probe is positioned at 50 mm from the scan‐axis reference (0‐point).

• The probe generates compression wave beams in pitch‐and‐catch mode at

refracted angles

from

45°

to

70°

with

a resolution

of

5°;

all

16 elements

of

the

transmitter and receiver arrays are used to generate the beams. The focalization

depth is automatically calculated to focus the transmitter and the receiver at the

same position. The focalization is therefore made at the geometrical intersection

of the transmitter and the receiver.

In order to generate this set of sectorial beams, the input parameters must be set as



• Height of the middle of the first element: 5.4 mm, as mentioned previously.

• Primary axis offset of the first element: 7.9 mm, as mentioned previously.

• Secondary axis offset of the first element: 5 mm, in order to position the probe in

the middle of the wedge with a width of 10 mm

• Primary axis

position

of

wedge

reference:

–50 mm,

in

order

to

position

the

rear

end of the wedge at a distance of 50 mm from the scan‐axis zero reference

• Secondary axis position of wedge reference: –12.5 mm, in order to position the

symmetrical line between the transmitter and the receiver array at the index‐axis

zero reference






Figure 4‐46 Sectorial beams: input parameters for a pitch‐and‐catch configuration






78 Chapter 4

Figure 4‐47 Sectorial beams: visualization of a pitch‐and‐catch configuration


Example 4: single array, pipe OD, probe perpendicular to pipe axis

The following configuration is considered:• Single 1‐D linear array probe, with the following characteristics: nominal

frequency 5 MHz, 32 elements, pitch 1 mm, and width of the elements 10 mm

• A Rexolite wedge with the following characteristics: wedge angle 36°, no roof angle, wedge velocity 2330 m/s, height at the middle of the first element 9 mm,




primary axis offset of the first element 7 mm, curvature along primary axis, distance between contact points 80 mm

• A pipe inspected from the outside diameter (Pipe OD) in carbon steel with an

outside radius of 150 mm and a wall‐thickness of 25 mm

• The probe

is

oriented

parallel

to

the

scanning

axis

(skew

0°)

and

perpendicular

to

the pipe axis. The rear end of the probe is positioned at 40 mm from the scan‐axis

reference (0‐point).

• The probe generates shear‐wave beams in pulse‐echo mode at refracted angles

from 35° to 55° with a resolution of 5°, focusing at a constant cylindrical depth of 25 mm (focusing on the back wall of the pipe); all 32 elements of the probe are to

be used to generate the beam.

In order to generate this set of sectorial beams, the input parameters must be set as shown in Figure 4‐48 on page 80.




• Secondary

axis

offset

of

the

first

element: 20 mm,

in

order

to

position

the

probe



end of the wedge at a distance of 40 mm from the scan‐axis zero reference, and to

position the centre of the pipe at the scan‐axis zero reference


middle of the wedge at the index‐axis zero reference





80 Chapter 4

Figure 4‐48 Sectorial beams: input parameters for sectorial sweep on a pipe part







Figure 4‐49 Sectorial beams: visualization of sectorial sweep on a pipe part


4.6 Creating Linear Beams

Linear beams are used to generate ultrasonic beams at a fixed refracted angle and a

fixed focusing distance, but with a primary aperture traveling along the array, thus

generating the

same

beams

with

a different

set

of

active

elements.

By

moving

the

beam along a transducer array, the scanning along an inspection axis is realized

electronically without any need to physically displace the transducer (see Figure 4‐50



82 Chapter 4

y y p y y p gon page 82).

Figure 4‐50 Electronic scanning along an axis

To illustrate the use of the calculator for creating Linear beams for a 1‐D linear array

probe, the following typical application is given as an example.




• A Rexolite wedge with the following characteristics: wedge angle 36°, no roof

angle, wedge velocity 2330 m/s, height at the middle of the first element 12 mm, primary axis offset of the first element 9 mm




641

16

Scanning Direction

Active Group


• The probe generates shear‐wave beams in pulse‐echo mode at a refracted angle of 55°, focusing at a constant half‐path distance of 50 mm. 16 elements of the probe

are used to generate the beams.

In order to generate this set of Linear beams, the input parameters must be set as

shown

in

Figure 4‐

51

on

page 84.Attention should be paid to the setting of the following parameters:








• Primary axis

position

of

wedge

reference: –100 mm, in order to position the rear








84 Chapter 4

Figure 4‐51 Linear beams: input parameters







Figure 4‐52 Linear beams: visualization


4.7 Saving a Calculator Setup File (.xcal)

To save a calculator setup file (.xcal)

1. Enter the

parameters

of

the

beams

to

be

generated.

2. On the menu, select File > Save As or click Save As at the bottom of the Advanced

Calculator dialog box.

I h A d l b



86 Chapter 4

3. In the Save As dialog box:

a) Select the folder where you want to save the .xcal file.

b) Enter an appropriate file name.

c) In the Save as type drop‐down box, select Extended Calculator Setup Files

(*.xcal).

d) Click Save (see Figure 4‐53 on page 86).

Figure 4‐53 The Save As dialog box

The Calculator Setup File contains only the parameter values and settings entered in

the Advanced Calculator; it does not contain the generated beams (the delays to be

programmed in the instrument).


4.8 Saving a Beam File (.law)

You can import the beam configuration created with the Advanced Calculator into an

OmniScan. This is done by first saving the Advanced Calculator configuration to a

beam file

(.law),

and

then

importing

the

beam

file

into

the

OmniScan.

To save a beam file (.law)




1. Enter the parameters of the beams to be generated

2. On the menu, select File > Save As or click Save As at the bottom of the Advanced


3. In the

Save

As

dialog

box:

a) Select the folder where the .law file has to be saved.


c) In the Save as type drop‐down box, select Law Files (*.law).


Figure 4‐54

The

Save

As

dialog

box

If you try to save a .law file containing DDF beams, a message box appears,

mentioning that DDF law files are not supported. You need to save DDF beams in a .pac file format (for details, see section 4.10 on page 92).

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4.9 Creating a DDF Law

DDF beams are used to generate an ultrasonic beam that has the capability to

dynamically change the focusing depth of the received signals (see Appendix B on

page 135), allowing

a better

depth

resolution

than

standard

focusing.



88 Chapter 4

DDF is supported by all FOCUS LT models as well as by OmniScan instruments

equipped of a 32:128 PA module and connected TomoView.

It is important to notice that DDF can only give the expected result if the requested

focal point is before the natural focal point determined by the frequency and by the

effective aperture of the probe. Information concerning the Primary Aperture Near‐field Depth and the Secondary Aperture Near‐field Depth displayed on the Element Info tab can be used to correctly determine the focalization range on which DDF

beams can be adequately used.

To illustrate the use of the calculator for creating a DDF beam for a 1‐D linear array








• The probe

generates

shear

‐wave

beams

in

pulse

‐echo

mode

at

a refracted

angle

of

40°, focusing in emission at a true‐depth distance of 50 mm and in reception

between a true‐depth distance of 10 mm to 90 mm; all 32 elements of the probe

are to be used to generate the beam.

In order to generate this set DDF beam, the input parameters must be set as shown in

Figure 4‐55 on page 90.

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in the middle of the wedge with a width of 30 mm• Primary axis position of wedge reference: –70 mm, in order to position the rear







Also, note that the database has been used to save probe, wedge, and material

parameters (see

section 10

on

page 125).

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90 Chapter 4

Figure 4‐55 DDF beam: input parameters

Graphical and numerical information concerning the generated law can be found on


DMTA‐20039

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Emission focusing depth




Figure 4‐56 DDF beam: visualization

Reception focussing depth range

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4.10 Saving a DDF Law File (.pac)

To save a DDF law file (.pac)

1. Enter

the

parameters

of

the

beams

to

be

generated2. On the menu, select File > Save As or click Save As at the bottom of the Advanced


3. In the Save As dialog box:



92 Chapter 4

g

a) Select the folder where you want to save the .pac file.


c) In the Save as type drop‐down box, select Phased Array Control files (*.pac).


Figure 4‐57 The Save As dialog box

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5. The 1-D Annular Arrays Tab



The 1‐D Annular Arrays Tab 93

This section presents the 1‐D annular arrays and describes the 1‐D Annular array tab.

5.1 Generic Conventions

To generate beams for 1‐D annular arrays in the most efficient and accurate way, the

operator should take into account the generic conventions regarding the probe

wedge.

5.1.1 Conventions Related to the Probe

Fresnel annular array

When a Fresnel type annular array is used, only the First radius (R1) and the Spacing

between elements (S) (see section 5.2.6 on page 101) must be specified. Based on

these values, the internal and external radiuses of the successive elements are

calculated according to the following formula:

A Fresnel type annular array is characterized by the fact that all elements have the

same surface

(same

area)

and

are

separated

by

a constant

distance

(see

Figure 5

‐1 on

page 94).

R 12 R 1

ext2R 1

int2 – R N

ext2R N

int2 – = =

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E4

E3

E2



94 Chapter 5

Figure 5‐1 Fresnel annular array

The central element is always positioned at the zero point of the scan‐axis and of the

index‐axis.

Custom annular array

When a Custom type annular array is used the internal radius (Rnint) and the external

radius (Rnext) of each element must be specified (see Probe area). Based on these values,

the distance between each element is calculated.

A Custom type annular array can have different radii and a variable spacing between

consecutive elements

(see

Figure 5

‐2 on

page 95).

E1

R2

int

R2

ext

S

S

S

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E4

E3

E2

E R1

ext




Figure 5‐2 Custom annular array

The central element is always positioned at the 0‐point in scan and in index.

5.1.2 Important Remark Concerning the Delay CalculationFor both Fresnel type and Custom type annular arrays, the delay for each element is

calculated at the radius Ricalc , for which the following statement is true: half of the

surface of the element is within this radius and half of the surface of the element is

outside of this radius. Mathematically, this is expressed as follows:

E1

R2

int

R3

int

R4

int

R4

ext

R2

ext

1

R3

ext

R iext2

R icalc2

– R icalc2

R iint2

– =

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5.2 Description

The 1‐D Annular array tab is divided into seven areas (see Figure 5‐3 on page 96).



96 Chapter 5

Figure 5‐3 The 1‐D Annular array tab

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5.2.1 Acquisition Unit Area




Figure 5‐4 The Acquisition Unit area


combo box for the selection of the type of acquisition unit for which you want to

create beams. The beam calculation uses slightly different compensation gain for each

acquisition unit type. The drop‐down combo box is available only when no

acquisition unit is connected to the computer. The acquisition unit is automatically

detected when it communicates with the computer.

5.2.2 Scan Area

Figure 5‐5 The Scan Type area

The Scan area (see Figure 5‐5 on page 97) contains the following:

Type

Selects the type of beams to be generated:

• Depth: the focusing depth of the ultrasound beam varies.

• Static: the focusing depth of the ultrasound beam is fixed (generates a single

beam).

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5.2.3 Beam Angles Selection Area



98 Chapter 5

Figure 5‐6 The Beam angles selection area

The Beam angles selection area (see Figure 5‐6 on page 98) is not applicable for the

1‐D annular array option, since only beams for ultrasound beams at 0° (longitudinal waves) are considered.

5.2.4 Focal Points Selection Area

Figure 5‐7 The Focal points selection area

The Focal points selection area (see Figure 5‐7 on page 98) contains the following:

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Focusing type

Selects the type of focusing of the beams to be generated:

• True depth: all beams are focused at a constant true‐depth value. For a

cylindrical part, the true‐depth value is defined as the depth in the cylindrical geometry.

• Half path: all beams are focused at a constant half‐path (distance) value.

• Projection: all beams are focused on a given vertical plane; this option is not applicable for depth laws, for DDF laws, and for pitch‐and‐catch

configurations.




configurations.

• Focal plane: all beams are focused on a user‐defined focal plane (see

Figure 4‐27 on page 51); this option is not applicable for depth laws, DDF

laws, and

for

pitch

‐and

‐catch

configurations.

DDF

When this check box is selected, the dynamic depth focusing algorithm is applied

on the beams for the considered Reception focus position (depth).

Focal plane position (mm)

Not applicable for a 1‐D annular array.

Emission focus

depth

(mm)

Defines the desired focusing depth of the ultrasound beam to be generated.

For Depth beams: the three boxes are used to set the initial (Start) and final (Stop) desired focusing depth of the ultrasound beam to be generated and to set its

resolution.

Reception focus depth (mm)

Defines the desired focusing depth (applied delay) for the received signal.

When the DDF check box is selected, both boxes are used to set the initial (Start) and final (Stop) desired focusing depth at reception.

When the DDF check box is selected along with Depth beams, the initial (Start) and final (Stop) focusing depth at reception is automatically calculated (but not displayed) as follows:

• Start:

Reception focus depth = Emission focus depth – Resolution

• Stop:

Reception focus depth = Emission focus depth + Resolution

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When the DDF check box is not selected, the Emission focus position is equal to

the Reception focus position.

5.2.5 Elements Selection Area



100 Chapter 5

Figure 5‐8 The Elements selection area

The Elements selection area (see Figure 5‐8 on page 100) contains the following:

Pulser

Sets the first element of the active pulser group.

Receiver

Sets the first element of the active receiver group.

Primary axis aperture

Sets the number of elements used simultaneously to generate beams.

DMTA‐20039

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5.2.6 Probe Area




Figure 5‐9 The Probe area for annular arrays

The Probe area (see Figure 5‐9 on page 101) contains the following:

Probe database

Allows the use of the Probe database:

Load

from

database

Allows one to load a probe configuration from the probe database.

Save in database

Allows one to save the active probe configuration in the probe database.

Delete from database

Allows one to delete a probe configuration from the probe database.

Probe skew angle (deg)

Defines the skew angle of the probe. The probe skew angle is always 0° for a 1‐D

annular array, since it only generates ultrasound beams at 0°.

DMTA‐20039

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Probe frequency (MHz)


Number of elements on primary axis

Defines the number of elements on the primary axis (radial) of the current probe.

First radius

(mm)

Defines the radius of the central element. Only applicable for Fresnel type annular

arrays (see Figure 5‐1 on page 94).

Space between elements (mm)



102 Chapter 5

Defines the space between two consecutive elements [that is, the distance between

the external radius of the nth element to the internal radius of the (n+1)th

element].

Only applicable

for

Fresnel

type

annular

arrays

(see

Figure 5

‐1 on

page 94).

Radius button

Opens the Annular Array Radius dialog box (see Figure 5‐10 on page 103), which

allows the creation of a Custom annular array.

When a Fresnel type annular array is used, the dialog box gives the possibility to

verify the radius of each element.

Fresnel option button

Defines a Fresnel type annular array, characterized by the fact that each element has the same surface (same area) and is separated by a constant distance (see


Custom option button

Defines a Custom type annular array, with arbitrary radii and a variable spacing

between consecutive

elements

(see

Figure 5

‐2 on

page 95).

DMTA‐20039

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5.2.7 Annular Array Radius Dialog Box




Figure 5‐10 The Annular Array Radius dialog box

The Annular Array Radius dialog box (see Figure 5‐10 on page 103) contains the

following:

Load button

Opens a standard Open dialog box, allowing one to load a text file (.txt file) containing the internal and external radius of each element.

Save button

Opens a standard Save As dialog box, allowing one to save the internal and the

external radius of each element in a text file (.txt file).

It is important to note that the internal and external radii of a Custom annular array defined in the Annular

Array

Radius dialog box are not saved in the .xcal

file.

OK button

Applies the defined radius.

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Cancel button

Closes the Annular Array Radius dialog box.

5.2.8 Part Area



104 Chapter 5



Type

Defines the part type supported by the Advanced Calculator:

Plate: flat part.

Thickness (mm)


5.2.9 Material Area

Figure 5‐12 The Material area for flat part

Material database




DMTA‐20039

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Allows you

to

delete

a material

configuration

from

the

material

database.

Sound velocity area



D it




Density


Attenuation

Used to set the ultrasonic attenuation for the selected material.

5.2.10 Wedge Area

Figure 5‐13 The Wedge area for annular arrays


Wedge database


Load from database

Allows one to load a wedge configuration from the wedge database.

DMTA‐20039

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Save in database

Allows one to save the active wedge configuration in the wedge database.

Delete from database

Allows one

to

delete

a wedge

configuration

from

the

wedge

database.

Sound velocity (m/s)


Height at the middle of the central element (mm)



106 Chapter 5

Defines the height at the middle of the central element, relative to the material surface.

5.3 Creating Depth Beams for Annular Arrays

Depth beams are used to generate a set of ultrasound beams that focus at different depths.

To illustrate

the

use

of

the

calculator

for

creating

Depth

beams

for

a 1‐D

annular

array


Example 1: Fresnel annular array


• Single 1‐D annular array probe, Fresnel type with the following characteristics:

nominal frequency 5 MHz, 16 elements, first radius 5 mm, and spacing between elements 2 mm

• A Rexolite wedge with the following characteristics: wedge velocity 2330 m/s, height at the middle of the central element 10 mm


• The probe generates compression wave beams in pulse‐echo mode at 0°, focusing

between a true‐depth distance of 10 mm to 90 mm with a depth resolution of 10 mm; all 16 elements of the probe are to be used to generate the beam.

In order to generate this set of Depth beams, the input parameters must be set as


DMTA‐20039

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Note that the database has been used to save probe, wedge, and material parameters

(see section 10 on page 125).




Figure 5‐14 Fresnel annular array: Depth beam input parameters

DMTA‐20039

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108 Chapter 5

Figure 5‐15 Fresnel annular array: Depth beam visualization

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6. The 2-D Matrix Array Tab



The 2‐D Matrix Array Tab 109

This section describes how to create beams when inspecting parts using a 2‐D matrix

probe.Sectorial beams are used to generate, at a fixed focusing distance and with a fixed

primary aperture, a set of ultrasound beams of different inspection angles (refracted

angles and/or skew angles).

The following is an example of configuration of sectorial beams.

The probe, part, and wedge parameters are as follows:

• Two 2‐D matrix probe 5 MHz, 16 elements organized as follows: 4 elements on

the primary axis and 4 on the secondary axis. The primary and secondary axis

pitches are 2 mm. The probe configuration is of the type 1 (as defined in the

Advanced Calculator).

• The part is a flat steel part having a thickness of 50 mm. The sound velocity in the

part is 3200 m/s.

• A wedge, having a sound velocity of 2330 m/s, is angled at 30°. The height at the

middle of the first element is 4 mm and the primary axis offset of the first element is 3 mm. The secondary axis offset of the first element is also 3 mm. The wedge is

12 mm long and 12 mm wide.

The inspection parameters are as follows:

• The inspection is done in the pulse‐echo mode, using longitudinal waves.

• The ultrasound unit is true‐depth and the beam is focused at 10 mm.

• The probe motion is parallel to the scanning axis (skew 0°).

• The steering angles ranges from –10 ° to 10 ° in steps of 2 ° on both primary and

secondary axes.

• The aperture uses all the elements of the probe.

DMTA‐20039

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Figure 6‐1 on page 110 presents the parameters to be entered to create the linear

beams.



110 Chapter 6

Figure 6‐1 Example of parameters of sectorial beams for a 2‐D matrix probe

DMTA‐20039

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The result can be examined in the graphic representation on the Beam Display Info. tab (see Figure 6‐2 on page 111).



The 2‐D Matrix Array Tab 111

Figure 6‐2 Graphic representation of the sectorial beams for a 2‐D matrix probe

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112 Chapter 6

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7. The Beam Display Info. Tab

The Beam Display Info tab (see Figure 7 1 on page 114) can be used to verify and



The Beam Display Info. Tab 113

The Beam Display Info. tab (see Figure 7‐1 on page 114) can be used to verify and

validate the inputs and the resulting beams for any of the supported array types. In

addition to a graphical representation of the defined probe, wedge, and part, it also

provides detailed numerical information for each of the created delay laws: position

of beam exit point and focal point, beam refracted angle and skew angle, etc.

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114 Chapter 7

Figure 7‐1 The Beams Display Info tab

The Beam

Display

Info. tab

(see

Figure 7

‐1 on

page 114)

contains

the

following:

VC‐Top (C)

This volume corrected view is a two‐dimensional (2‐D) graphical representation

of the top view of the defined probe and part. One of the axes is the scan‐axis, and

the other is the index‐axis. The defined probe and wedge can be displayed along

with the ray tracing of the beams.

DMTA‐20039

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VC‐Side (B)

This volume corrected view is a 2‐D graphical representation of the side of the

defined probe and part. One of the axes is the scan‐axis, and the other is the

ultrasound (Usound) axis. The defined probe and wedge can be displayed along


VC‐End (D)

This volume corrected view is a 2‐D graphical representation of the end of the

defined probe and part. One of the axes is the index‐axis, and the other is the

ultrasound (Usound) axis. The defined probe and wedge can be displayed along


3‐D




3‐D

This view

is

a 3‐D

representation

of

the

defined

probe,

wedge,

and

part.

The Top View button automatically readjusts the zoom and repositions the pane

content in order to get a representation from the top of the part.

The Side View button automatically readjusts the zoom and repositions the pane

content in order to get a representation from the side of the part.

The End View button automatically readjusts the zoom and repositions the pane

content in

order

to

get

a representation

from

the

end

of

the

part.

In the 3‐D Visualization view:

• Click and drag to rotate the 3‐D model.

• Right‐click and drag to move the 3‐D model.

• Click the wheel button and drag to zoom in or out of the view.

Fit

Image

to

Pane ( )

This button simultaneously un‐zooms the content of the four views.

Current beam

Identifies the current beam.

Sectorial laws, depending on the Beam angle selection , are identified as follows:

Sectorial A: angle

Sectorial St: steering angle

Sectorial Sk: skew angle

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Linear laws are identified as follows:

Linear L: 1‐16 , where 1 and 16 represent the first and the last element used to

generate the law

Depth laws are identified as follows:

Depth D:

45 ,

where

45

represents

the

focalization

depth

Static laws are identified as follows:

Static A: 30 , where 30 represents the refracted angle

Beam information

Indicates the beam Exit point and Focal point in Cartesian coordinates (Scan ,



116 Chapter 7

p p (Index , and Usound) and, for cylindrical coordinates (Circumferential , Axial , and

Depth) for the current beam.

Angle information

Indicates the Refr. Angle (refracted angle), the total Skew angle (beam skew angle

+ probe skew angle), the Primary , and the Secondary Steering angle of the current beam.

Display options

Allows one to display the following options:

• Wedge (wire frame) or solid wedge

• Probe (wire frame) or solid probe

• Part

• Element numbers

• Focal

point• Focal point locus

• Rebound path

• Weld center

The user‐defined options are saved upon closing the calculator.

Color

Allows one

to

define

the

color

of

the

following

components:

• Wedge

• Part

• Element

• Beam

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The user‐defined colors are saved upon closing the calculator.

Near‐Field information

Indicates the Primary Aperture Near‐Field Depth and the Secondary Aperture

Near‐Field Depth.




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118 Chapter 7

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8. The Elements Info. Tab

The Elements Info. tab presents lists for the pulser and the receiver elements (see

h l h l l d d l f h l



The Elements Info. Tab 119

Figure 8‐1 on page 120). The lists contain the calculated delays for each element number for the beam selected in the Current

Beam area.

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120 Chapter 8

Figure 8‐1 Example of the Element Info. tab

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9. The AFiSiMO Tab

The Acoustic Field Simulation Module (AFiSiMO) is available as an option in the

Advanced Calculator It is used to simulate spatially diffracted fields in 2 D or 3 D



The AFiSiMO Tab 121

Advanced Calculator. It is used to simulate spatially diffracted fields in 2‐D or 3‐D. This component is particularly useful when defining new inspection techniques.

With this module you can:

• Validate inspection settings

• Measure beam width

• Display LW (longitudinal waves) and SW (shear waves)

• Simulate cylindrically focused probes

• Support linear and conventional UT probes

The AFiSiMO tab presents a large graphical visualization view, view selection

buttons, and simulation parameters (see Figure 9‐1 on page 122).

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View selection

buttons



122 Chapter 9

Figure 9‐1

Example of

the

AFiSiMO

tab

9.1 Creating Acoustic Field Simulations

The following procedure describes how to create acoustic field simulations.

When you want to create acoustic field simulations for several configurations, consider using the batch processing by selecting File > Run AFiSiMo Batch on the

menu (see section 1.2.1 on page 6 for details).

To create an acoustic field simulation

1. Use the appropriate Advanced Calculator tab (UT Probe , 1‐D Linear array , or 2‐D

Matrix Array) to define the probe, wedge, part, and inspection parameters that you want to simulate.

buttons

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2. Click Draw at the bottom of the tab. The Advanced Calculator calculates the beams as defined by your parameters.

3. In the AFiSiMO tab:

a) In the Simulation Settings area, select the type of simulation that you want to

perform. The available choices are:

• Preview: to calculate a 2‐D simulation with predefined start, stop, and resolution values using the fast algorithm.

• 2‐D: to calculate the simulated acoustic field on a two‐dimension plane.

• 3‐D: to calculate the simulated acoustic field for volume.

b) Set the values for the Start , Stop , and Resolution parameters to determine the

scope of the simulation.



The AFiSiMO Tab 123

c) Select the

Fast

algorithm check

box

to

reduce

the

calculation

time.

d) Select the Active beam only check box to limit the simulation to the beams

selected under Active. Clear the check box to perform the simulation on all beams.

e) Click Generate.

4. When the simulation calculation is complete, use the view selection buttons to

visualize the simulation results in various 2‐D and 3‐D (see Figure 9‐2 on

page 123).

Figure 9‐2 Example of 2‐D and 3‐D simulation visualizations

5. With the 2‐D view selection button selected, in the visualization view:

• Click, drag, and release to zoom to the drawn area.

• Use the ruler and zoom bars to zoom in and out.

• Click the zoom out button ( ) to restore a full model view.

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6. With the 3‐D view selection button selected, in the visualization view:

• Click and drag to rotate the 3‐D model.

• Right‐click and drag to move the 3‐D model.

• Click the wheel button and drag to zoom in or out of the view.

7. After generating a 3‐D simulation, the controls in the 3‐D Clipping area are

enabled, allowing you to visualize planes of the 3‐D simulation:

• Click and drag the any of the sliders to move the respective plane in the 3‐D

view.

• Select one of the sliders, set the Speed and click the play button ( ) to

start an animation of the plane movement.



124 Chapter 9

9.2 Verifying the AFiSiMO Availability

The AFiSiMO is an optional feature that needs to be purchased separately. Contact your local Olympus representative for more information.

To verify the AFiSiMO availability

1. When using the Advanced Calculator with TomoView, start TomoView.

2. In the Start Selection dialog box, verify that Acoustic Field Simulation: Enabled

appears in the Add On area (see Figure 9‐3 on page 124).

Figure 9‐3 The TomoView Startup Selection dialog box with the enabled AFiSiMO

add on

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10. Using the Databases

The Advanced Calculator uses a database to store the information related to the

probes, the material and the wedges. The database file is located in a folder under the



Using the Databases 125

p g

Advanced Calculator folder. The default location is:

[Installation Folder]\TomoView29\Database

The Advanced Calculator installer creates the following files in the database folder:

UtDatabase.mdb

Active database file containing factory default information used by the Advanced

Calculator.

UtDatabase‐InstallationBackUp‐xxxx.tmp.mdb

If a previous version of the Advanced Calculator was installed, a copy of the

existing UtDatabase.mdb is created with this name, where xxxx is an

automatically generated unique ID for the file. Rename this file to

UtDatabase.mdb if you want to restore the content of the database as it was for

the previous

version

of

the

Advanced

Calculator.

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10.1 Probe Database

The Probe database allows you to save and to load a user‐defined probe

configuration.

To save a probe configuration in the Probe database

1. Enter the probe parameters with an appropriate probe name (see Figure 10‐1 on

page 126).



126 Chapter 10

Figure 10‐

1

Probe

parameters

2. Click (Save in database button), and then click OK (see Figure 10‐2 on

page 127).

The probe configuration is automatically saved in the Probe database.

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Figure 10‐2 Saving with the Probe Configuration dialog box

To load a probe configuration from the Probe database

1. In the Advanced Calculator , click (Load from database button).

2. In the Probe Configuration dialog box, select the desired probe configuration, and then click OK.

The probe configuration is automatically loaded from the Probe database.

To delete a probe configuration from the Probe database

1. In the Advanced Calculator , click (Delete from database button).

2. In the Probe Configuration dialog box, select the probe configuration that you

want to delete, and then click Delete.

3. Click OK to close the dialog box (see Figure 10‐3 on page 128).

The probe configuration is automatically deleted from the Probe database.

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128 Chapter 10

Figure 10‐3 Deleting with the Probe Configuration dialog box

10.2 Material Database

The Material database allows you to save and to load a user‐defined material configuration.

To save a material configuration in the Material database

1. Enter the material parameters with an appropriate material name (see Figure 10‐4

on page 128).

Figure 10‐4 Material parameters


page 129).


The probe configuration is automatically saved in the Material database.




Figure 10‐5 Saving with the Material Configuration dialog box

To load a material configuration from the Material database


2. In the Material Configuration dialog box, select the desired material configuration, and then click OK.

The material configuration is automatically loaded from the Material database.

To delete a material configuration from the Material database


2. In the Material Configuration dialog box, select the material configuration that you want to delete, and then click Delete.


The material configuration is automatically deleted from the Material database.




130 Chapter 10

Figure 10‐6 Deleting from the Material Configuration dialog box

10.3 Wedge Database

The Wedge database allows you to save and to load a user‐defined wedge

configuration.

To save a wedge configuration in the Wedge database

1. Enter the wedge parameters with an appropriate wedge name (see Figure 10‐7 on

page 131).





Figure 10‐7 Wedge parameters


page 131).

The wedge configuration is automatically saved in the Wedge database.

Figure 10‐8 Saving with the Wedge Configuration dialog box


To load a wedge configuration from the Wedge database


2. In the Wedge Configuration dialog box, select the desired wedge configuration, and then click OK.

The wedge configuration is automatically loaded from the Wedge database.

To delete a wedge configuration from the Wedge database


2. In the Wedge Configuration dialog box, select the wedge configuration that you

want to delete, and then click Delete.

3 Click OK to close the dialog box (see Figure 10 9 on page 132)



132 Chapter 10


The wedge configuration is automatically deleted from the Wedge database.

Figure 10‐9 Deleting with the Wedge Configuration dialog box


Appendix A: Theoretical Considerations on Law Delay

Accuracy

The Advanced

Calculator

calculates

beam

delays

to

electronically

generate

an

lt i b f hi h th ti f i F t f f th id d



Theoretical Considerations on Law Delay Accuracy 133

The Advanced Calculator calculates beam delays to electronically generate anultrasonic probe for which the active surface is a Fermat surface for the considered

focal point in the material. This means that the rays from the individual elements

(centre points) of the probe to the focal point should have equal flight times (FT). The

errors are therefore expressed in time units, typically nanoseconds (ns). This approach

is very similar to the optical path difference (OPD) parameter, expressed in number of wavelengths, used for quantitative assessment of the quality of optical systems

(lenses, etc.).

In optics, it is assumed that a system with a maximum OPD error, smaller than a

quarter of the wave length, generates a “sensibly” perfect image (see Warren J. Smith, Modern Optical Engineering , Chapter 11 “Image Evaluation,” 1966, McGraw Hill). This

criterion is called the Rayleigh Limit, and is used for evaluation of aberrations (errors) in precision optics (microscopes, telescopes…).

When

applying

this

criterion

to

the

calculation

of

beam

delays

for

ultrasonic

array

probes, a maximum difference of a quarter of a wavelength can be allowed, compared

to an ideal Fermat surface. For typical probe frequencies used in nondestructive

testing, the criterion yields the following allowable maximum delay differences:

• For a 10 MHz probe: 25 nanoseconds

• For a 5 MHz probe: 50 nanoseconds

• For a 2.25 MHz probe: 111 nanoseconds

For comparison purposes, a delay difference of 50 nanoseconds is equivalent to a

mechanical accuracy of 0.06 mm (0.0025 in.) in the fabrication of the wedge, or an

accuracy of approximately 0.1 degree for the wedge angle.




134 Appendix A


Appendix B: Dynamic Depth Focusing (DDF)

In the case of conventional focused probes (and also standard focusing), the focusing

is restricted to the region around the focal point, a region known as the depth of field.

The depth of field is inversely proportional to the square of the array aperture at a

i f l di



Dynamic Depth Focusing (DDF) 135

p y p p q y pgiven focal distance.

The advantage of the phased array probe over a conventional focused transducer is its

capability to change the position of the depth of field by using different delays (focal laws) and then obtain a depth of field at different depths.

However, for the working range of a given phased array transducer, one beam is

requested for each position of the depth of field. This involves one pulse/receive

operation for each depth of field. To reduce the number of beams needed to cover a

large thickness range with a constant depth of field position at different depths, the

dynamic depth focusing (DDF) technique is introduced. The term “dynamic depth

focusing” stands for dynamically changing the focusing depth at reception of the

signals. At the emission of the beam, this technique behaves exactly as standard

focusing: a given beam is applied to the elements of a phased array probe. This yields

a focused

beam

with

a given

focal

depth

at

emission.

During

reception

(see

Figure B

‐1

on page 136), a large number of beams are applied in real time using time‐dependent delays to produce only one resulting A‐scan. Knowing the propagation speed and the

element positions, the time of reception of a given signal source is known for each

element. At the time corresponding to the reception of the signal coming from point F1, the delay law L1 is applied. L2 is applied at the time corresponding to the

reception of the signal coming from point F2. For clarity reasons only two laws are

drawn in Figure B‐1 on page 136 , in reality a large number of laws are applied.


L 1 L 2

F1

F2

Time

Time dependent delay



136 Appendix B

Figure B‐1 Dynamic depth focusing at reception

Using phased array results in a significant increase of the depth of field while only

one pulse/receive operation is needed. In practice, the obtained beam corresponds to

the convolution

of

the

emitted

beam

with

separate

“focused

beams”

at

reception.

Figure B‐2 on page 136 shows this principle for a conventional focused probe or a

phased array probe. Figure B‐3 on page 137 shows this principle for DDF.

Figure B‐2 Standard focusing: convolution of transmitted and received beam

Reception Pulse echoTransmission


ReceptionPulse

echoTransmission

Acquisition time



Dynamic Depth Focusing (DDF) 137

Figure B‐3 Dynamic depth focusing: resulting beam by convolution

The choice of the transmitted beam (focal point and shape) will influence the resulting

beam.




138 Appendix B


Appendix C: Description of the .law File Format

This appendix describes the .law file format. This file is a text file, used to create

specific beam configurations. These files can be loaded directly in TomoView or in the

OmniScan.



Description of the .law File Format 139

The use of the .law file format supposes that the user has good background

knowledge of phased array technology in general, and of the hardware and software

in particular.

C.1 Conventions

The following conventions are used in the file format description:

< >

Parameter delimiter

[ ]

Optional parameter

crlf

Carriage return and line feed

sep

<space> 1 <tab>

JSpecifies to repeat the content between the braces (depending on the number of laws and elements).

Normal characters (example N_Elements): represent a number.

Bold italic characters (example DDF ): represent a keyword.


Underlined characters (example G_Delay): represent TomoView parameters which

can also be redefined in the UT Settings of TomoView without changing the law

formation.

Italic characters (example Frequency): represent not used parameters.

C.2 General Format

C.2.1 Format

<Version> <sep> <N_Laws> [<Max_Channels>] <crlf>

J{<N_ActiveElements> <sep> <Frequency > <sep> <Cycles> <sep> <SumGain> <sep>

<Mode> <sep> <Filter> <sep> <R_Angle> <sep> <S_Angle> <sep> <T_First> <sep><R_First> <sep> <Scan_Offset> <sep> <Index_Offset> <sep> <G_Delay> <sep>



140 Appendix C

<F_Depth> <sep> <M_Velocity> <crlf>

J{<E_number> <sep> <FL_Gain> <sep> <T_Delay> <sep> <R_Delay> <sep> <Amplitude>

<sep> < P_width > <crlf>}}

C.2.2 Example

An example of a .law file containing two beams using 10 elements, as generated by

the TomoView Advanced Calculator, is given hereunder:

V5.0 2

10 1000 1 24 1 0 400 0 1 1 20304 0 14829 38303 3230

1 0 564 564 180 50

2 0 517 517 180 50

3 0 466 466 180 504 0 411 411 180 50

5 0 352 352 180 50

6 0 289 289 180 50

7 0 223 223 180 50

8 0 153 153 180 50

9 0 78 78 180 50

10 0 0 0 180 50

10 1000 1 24 1 0 500 0 1 1 22350 0 15314 32139 3230

1 0 168 168 180 502 0 162 162 180 50

3 0 153 153 180 50

4 0 140 140 180 50

5 0 125 125 180 50

6 0 107 107 180 50

7 0 85 85 180 50


8 0 60 60 180 50

9 0 32 32 180 50

10 0 0 0 180 50

C.3 Object Description

C.3.1 General Parameters

This section includes parameters that are related to the .law file format.

Version

<V> <number> <ʹ.ʹ> <number>.

N_LawsThe total number of beams defined in the file.




Max_Channels

Not applicable in version V5.0

C.3.2 Law Parameters

This section includes parameters that are related to the beams defined in the law file.

N_ActiveElements

The number of active elements used to generate the given beam. The number

shall be between 1 and 32 and shall fit to the limits of the hardware.

Frequency

Used for EMAT (electro‐magnetic acoustic transducer) only. Pulse train frequency

for the given law. The figure is given in kilohertz (kHz) and may vary between

300 kHz and 2000 kHz.

Cycles

Used for EMAT only. The number of cycles in the pulse train for the given law. The figure may vary between 1 and 15.

SumGain

Gain working range, expressed in decibels (dB), for a given law. The value is

calculated according to the following formula:

Sum gain = 44 – [20 * Log(N)]where N is the number of active elements used.


In TomoView, the Sum gain can be modified on the Receiver tab of the UT

Settings dialog box (see Figure C‐1 on page 142).

Figure C‐1 The Sum gain on the Receiver tab of the UT Settings dialog box

ModeThe inspection mode for the given law:0 T/R (diff l d i l )



142 Appendix C

0 = T/R (different pulser and receiver elements), or

1 = Pulse‐echo (same pulser and receiver elements)

Filter

Specifies the filter applied at reception.0 = no filter (0.5–20 MHz)

1 = 0.5–5 MHz2 = 2–10 MHz3 = 5–15 MHzIn TomoView, the Filter can be modified on the Pulser/Receiver tab of the UT


Figure C‐2 The Filters area of the Pulser/Receiver tab of the UT Settings dialog box

R_AngleThe refracted angle for the given law expressed in tenths of degrees. This figure

shall be between 0 and 900 (positive sign).In TomoView, the Refracted angle can be modified on the Probe tab of the UT

Settings (see Figure C‐3 on page 143).


S_Angle

The skew angle for the given law expressed in tenths of degrees (number between

0 and 3599, positive sign).In TomoView, the Skew angle can be modified on the Probe tab of the UT


Figure C‐3 The Refracted angle on the Probe tab of the UT Settings dialog box

T Fi t1




T_First1

Specifies the number of the first pulser ( first pulser hardware connection) that will be used for transmission. This number must be between 1 and the maximum

allowed by the hardware (for instance, 16, 32, 64, 128, …) or by the probe array. In TomoView, the First element can be modified on the Transmitter tab of the UT

Settings dialog

box

(see

Figure C

‐4 on

page 143).

Figure C‐4 The First element on the Transmitter tab of the UT Settings dialog box

R_First2

Specifies the number of the first receiver ( first receiver hardware connection)

that will be used at reception. This number must be between at 1 and the maximum allowed by the hardware (for instance, 16, 32, 64, 128, …) or by the

1.It is important to notice that if this parameter is redefined in the UT settings of TomoView, then the

wedge delay calculated by the TomoView Advanced Calculator will be incorrect.2.Idem.It is important to notice that if this parameter is redefined in the UT settings of TomoView, then

the wedge delay calculated by the TomoView Advanced Calculator will be incorrect.


probe array. In TomoView, the first receiver can be modified on the Receiver tab of the UT


Figure C‐5 The First element on the Receiver tab of the UT Settings dialog box

Scan_Offset



144 Appendix C

The Scan axis offset of the exit point for the given law relative to the mechanical reference point, expressed in micrometers.In TomoView, the Scan Offset can be modified on the Probe tab of the UT


Index_OffsetThe Index axis offset of the exit point for the given law, relative to the mechanical reference point, expressed in micrometers.In TomoView, the Index Offset can be modified on the Probe tab of the UT


Figure C‐6 The Scan axis offset on the Probe tab of the UT Settings dialog box

G_Delay

Specifies the global delay (GD) expressed in nanoseconds (ns).GD = ED + WD + LDED: electronic delay. This delay is proper to the hardware and typically 1700 for

the FOCUS and Tomoscan III PA systems.WD: total wedge delay (transmission and reception).


LD: law delay (global delay introduced by the specified law).In TomoView, the Wedge delay can be modified on the Probe tab of the UT


Figure C‐7 The Wedge delay on the Probe tab of the UT Settings dialog box

F_DepthFocusing true depth expressed in micrometers.




M_Velocity

Specifies the propagation velocity in the material, expressed in meters per second

(m/s).In TomoView, the Sound velocity can be modified on the Probe tab of the UT


Element parameters

Parameters that are related to individual elements used in a defined beam.

E_number

The number identifying the individual element of the phased array probe relative

to the first pulser and to the first receiver (see T_First and R_First). All numbers

shall be consecutive (1, 2, 3, …). Non active elements shall be disabled by setting

the delay to 65535 (see T_Delay and R_Delay).

FL_Gain

Beam Gain. The gain applied for the considered beam expressed in decibels (dB). Admitted range: 0–80. Elements of the same beam must have the same focal law

gain.For .law files generated in offline mode (that is, without phased array equipment

connected), this

parameter

has

the

default

value 0.In TomoView, the Beam gain can be modified on the General tab of the UT

Settings dialog box (see Figure C‐8 on page 146). Make sure that All laws check

box is cleared before modifying the focal law gain.


Figure C‐8 The Focal law gain on the General tab of the UT Settings dialog box

T_Delay

Specifies the transmission delay for the specified active element. The delay is

expressed in nanoseconds and must be between 0 and 25600. The transmission is deactivated when 65535 is used.



146 Appendix C

R_Delay

Specifies the reception delay for the specified active element. The delay is

expressed in nanoseconds and must be between 0 and 25600. The reception is

deactivated when 65535 is used.

AmplitudeThe excitation amplitude for the specified active element, expressed in volts

(range: 50–200). The value shall be the same for all defined elements and defined

beams.For .law files generated in offline mode (that is, without phased array equipment connected), this parameter has the default value 180.In TomoView, the Voltage can be modified on the Pulser/Receiver tab of the UT

Settings dialog

box

(see

Figure C

‐9 on

page 147).

P_width

The pulse width applied to the specified active element, expressed in

nanoseconds (range: 50–500). The value shall be the same for all defined elements

and beams used in the same law file.For .law files generated in offline mode (that is, without phased array equipment connected), this parameter has the default value 50.

In TomoView, the Pulse width can be modified on the Pulser/Receiver tab of the

UT Settings dialog box (see Figure C‐9 on page 147).


Figure C‐9 The Voltage on the Pulser/Receiver tab of the UT Settings dialog box



148 Appendix C


Appendix D: Description of the .pac file format

This appendix describes the .pac file format. This file is a text file, used to create

specific DDF law configurations that cannot be done in TomoView.

The use of the .pac file format supposes that the user has good background

knowledge of phased array technology in general and of the hardware and software

i ti l



Description of the .pac file format 149

in particular.

The .pac file format should ONLY be used to save DDF beams. It is strongly recommended not to change any parameters in the .pac file.

D.1 Conventions

The following conventions are used in the file format description.

< >

Parameter delimiter

[ ]

Optional parameter

crlf

Carriage return and line feed

sep

<space> 1 <tab>


J

Specifies to repeat the content between the accolades (depending on the number

of laws and elements).

Normal characters (example N_Elements): represent a number.

Bold italic characters (example DDF ): represent a keyword or an abbreviation.

Underlined characters (example G_Delay): represent Tomoview parameters which

can also be re‐defined in the UT Settings of TomoView without changing the law

formation.

Italic characters (example Frequency): represent not used parameters.

D.2 General format

D 2 1 F t



150 Appendix D

D.2.1 Format

<Version><crlf>

PT <space><PodType>,<N-MaxActiveElements><crlf>

J{DF <Law_number_S>,<N_ActiveElements>,<Type>,<P_width>,<Burst>,<Mode>,<SumGain>,<R_Angle>,<S_Angle>,<Scan_Offset>,

<Index_Offset>,<G_Delay>,<F_Depth>,<M_Velocity><crlf>

J{<E_number>/<FL_Gain>,<Amplitude>,<Filter>,<T_Delay>,<R_Delay>

<T_element_number>,< R_element_number ><crlf>}

J{DD <space><Dyn_start>,<Dyn_nbr>,<Dyn_div><crlf>

EF <Law_number_E><crlf>}}

PD <Selfifo>,<Swpdel><crlf>

FD <#Module>,<Dynamic_Hex>

DS <0>,<T_LawNumber>

LS <T_LawNumber>

D.2.2 Example of .pac File for Non-DDF Laws

An example of a .pac file for non‐DDF laws, containing two beams using 10 elements

(the same configuration as described in Appendix C on page 139), as generated by the

TomoView Advanced Calculator is given hereunder:

V2.1


PT Focus,32

DF1,10,1,50,1,1,24,400,0,20304,0,14829,38303,3230

DF1/0,180,0,564,564,1,1

DF2/0,180,0,517,517,2,2

DF3/0,180,0,466,466,3,3

DF4/0,180,0,411,411,4,4

DF5/0,180,0,352,352,5,5

DF6/0,180,0,289,289,6,6

DF7/0,180,0,223,223,7,7

DF8/0,180,0,153,153,8,8

DF9/0,180,0,78,78,9,9

DF10/0,180,0,0,0,10,10

EF1

DF2,10,1,50,1,1,24,500,0,22350,0,15314,32139,3230

DF1/0,180,0,168,168,1,1

DF2/0,180,0,162,162,2,2

DF3/0,180,0,153,153,3,3DF4/0,180,0,140,140,4,4

DF5/0,180,0,125,125,5,5

DF6/0,180,0,107,107,6,6




DF7/0,180,0,85,85,7,7

DF8/0,180,0,60,60,8,8

DF9/0,180,0,32,32,9,9

DF10/0,180,0,0,0,10,10

EF2

DS0,2LS2

D.2.3 Example of .pac File for DDF Laws

An example of a .pac file for DDF laws, containing two beams using 8 elements, as

generated by the TomoView Advanced Calculator is given hereunder:

V2.1

PT Focus,32

DF1,8,1,50,1,1,26,400,900,0,–50812,14095,50000,3230

DF1/0,180,0,438,438,1,1

DF2/0,180,0,385,386,2,2

DF3/0,180,0,328,330,3,3

DF4/0,180,0,269,271,4,4

DF5/0,180,0,206,208,5,5

DF6/0,180,0,141,142,6,6

DF7/0,180,0,72,73,7,7

DF8/0,180,0,0,0,8,8

DD F7AD,FFF0,81EF

EF1

DF2,8,1,50,1,1,26,450,900,0,–49832,14341,50000,3230

DF1/0,180,0,280,280,1,1

DF2/0,180,0,248,248,2,2


DF3/0,180,0,213,214,3,3

DF4/0,180,0,176,177,4,4

DF5/0,180,0,136,137,5,5

DF6/0,180,0,93,95,6,6

DF7/0,180,0,48,49,7,7

DF8/0,180,0,0,0,8,8

DD F72A,FFEE,01EF

EF2

PD 400,fffe

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000FD 1,0000

FD 1,0000

FD 1,0000



152 Appendix D

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000

FD 1,0000

DS0,2

LS2


D.3 Object Description

D.3.1 General Parameters

This section includes parameters that are related to the .pac file format.

Version

<V> <number> <ʹ.ʹ> <number>:V2.1 is the only version supporting the FOCUS LT pod family.

N_MaxActiveElements

PT <PodType>,<N_MaxActive|Elements>:Focus or FOCUS LT. Type used for DDF only.

Identifies the total number of active elements, allowed by the hardware, that could be used to generate the beam. The number is 16, 32, or 64.




D.3.2 Law Parameters

This section includes parameters that are related to the beams defined in the .pac file.

Law_number_S<DF><Law_number>:Indicates the current focal law number

N_ActiveElements

The number of active elements used to generate the given beam. The number

shall be between 1 and 64 and shall fit to the limits of the hardware.

Type:Defines the kind of element:1 = for PiezoThe value should always be set to 1.

P_width

The pulse width applied to the specified active element, expressed in

nanoseconds

(range:

50–500).

The

value

shall

be

the

same

for

all

defined

elements

and beams used in the same law file.For .pac files generated in offline mode (that is, without phased array equipment connected), this parameter has the default value 50.In TomoView, the Pulse width can be modified on the Pulser/Receiver tab of the

UT Settings dialog box (see Figure D‐1 on page 154).


Figure D‐1 The Pulser area of the Pulser/Receiver tab of the UT Settings dialog box

Burst

Defines the number of burst:The value should always be set to 1.

Mode

The inspection mode for the given law: 0 = T/R (different pulser and receiver elements), or 1 =. Pulse‐echo (same pulser and receiver elements).



154 Appendix D

elements), or 1 . Pulse echo (same pulser and receiver elements).

SumGain

Gain working range, expressed in dB, for a given law. The value is calculated

according to the following formula:

Sum gain = 44 – [20 * Log(N)]where N is the number of active elements used.In TomoView, the Sum gain can be modified on the Receiver tab of the UT

Settings dialog box (see Figure D‐2 on page 154).

Figure D‐2 The Sum gain on the Receiver tab of the UT Settings dialog box

R_Angle

The refracted angle for the given law expressed in tenths of degrees. This figure

shall be between 0 and 900 (positive sign).


In TomoView, the Refracted angle can be modified on the Probe tab of the UT

Settings dialog box (Figure D‐3 on page 155).

S_Angle

The skew angle for the given law expressed in tenths of degrees (number between

0 and 3599, positive sign).In TomoView, the Skew angle can be modified on the Probe tab of the UT

Settings (see Figure D‐3 on page 155).

Figure D‐3 The Refracted angle on the Probe tab of the UT Settings dialog box




Scan_Offset

The Scan axis offset of the exit point for the given law relative to the mechanical reference point, expressed in micrometers.

In TomoView, the Scan Offset can be modified on the Probe tab of the UT


Figure D‐4 The Scan axis offset on the Probe tab of the UT Settings dialog box

Index_Offset:

The Index axis offset of the exit point for the given law, relative to the mechanical

reference point,

expressed

in

micrometers.In TomoView, the Index Offset can be modified on the Probe tab of the UT



G_Delay

Specifies the global delay (GD) expressed in nanoseconds (ns).GD = ED + WD + LDED: electronic delay. This delay is proper to the hardware and typically 1700 for

the FOCUS and Tomoscan III PA systems.WD: total wedge delay (transmission and reception).

LD: law

delay

(global

delay

introduced

by

the

specified

law).

In TomoView, the Wedge delay can be modified on the Probe tab of the UT


Figure D‐5 The Wedge delay on the Probe tab of the UT Settings dialog box



156 Appendix D

F_Depth

Focusing

true

depth

expressed

in

micrometers.M_Velocity

Specifies the propagation velocity in the material, expressed in meters per second

(m/s).In TomoView, the Sound velocity can be modified on the Probe tab of the UT


D.3.3 Element Parameters

This section includes parameters that are related to individual elements used in a

defined beam.

E_number

<DF><E_number>:

The number identifying the individual element of the phased array probe relative to the pulser and to the receiver number (see T_element_number and

R_element_number). All numbers shall be consecutive (1, 2, 3, …). Non active

elements shall be disabled by setting the delay to 65535 (see T_Delay and

R_Delay).


FL_Gain

Focal Law Gain. The gain applied for the considered focal law expressed in

decibels (dB). Admitted range: 0–80. Elements of the same focal law must have

the same focal law gain.For .pac files generated in offline mode (that is, without phased array equipment connected), this parameter has the default value 0.

In TomoView,

the

Beam

gain

can

be

modified

on

the

General

tab

of

the

UT

Settings dialog box (see Figure D‐6 on page 157). Make sure that All laws is

cleared before modifying the focal law gain.




Figure D‐6 The Focal law gain on the General tab of the UT Settings dialog box

Amplitude

The excitation amplitude for the specified active element, expressed in volts

(range: 50–200). The value shall be the same for all defined elements and defined

beams.For .pac files generated in offline mode (that is, without phased array equipment connected), this parameter has the default value 180.In TomoView, the Voltage can be modified on the Pulser/Receiver tab of the UT


Figure D‐7 The Voltage on the Pulser/Receiver tab of the UT Settings dialog box


Filter

Specifies the filter applied at reception.0 = no filter (0.5–20 MHz)1 = 0.5–5 MHz2 = 2–10 MHz3 = 5–15 MHz

In TomoView,

the

Filter

can

be

modified

on

the

Pulser/Receiver

tab

of

the

UT


Figure D‐8 The Filters area of the Pulser/Receiver tab of the UT Settings dialog box



158 Appendix D

T_Delay

Specifies the transmission delay for the specified active element. The delay is

expressed in nanoseconds and must be between 0 and 25600. The transmission is


R_Delay

Specifies the reception delay for the specified active element. The delay is

expressed in nanoseconds and must be between 0 and 25600. The reception is


T_element_number1

Specifies the number of the current pulser ( current pulser hardware connection) that will be used for transmission. This number must be between 1 and the

maximum allowed by the hardware (for instance, 16, 32, 64, 128, …) or by the

probe array.In TomoView, the first pulser can be modified on the Transmitter tab of the UT


1.It is important to notice that if this parameter is re‐defined in the UT settings of TomoView, the

wedge delay calculated by the TomoView Advance PA Calculator will be incorrect.


Figure D‐9 The First element on the Transmitter tab of the UT Settings dialog box

R_element_number1

Specifies the number of the current receiver ( current receiver hardware

connection) that will be used at reception. This number must be between at 1 and

the maximum allowed by the hardware (for instance, 16, 32, 64, 128 …) or by the

probe array.In TomoView, the first receiver can be modified on the Receiver tab of the UT





g g ( g p g )

Figure D‐10 The First element on the Receiver tab of the UT Settings dialog box

Law_number_E

<EF><Law_number>:Indicates the end of the definition of the current focal number.

T_LawNumber

Indicates the total beams defined in the .pac file.

1.Idem.


D.3.4 DDF Parameters

This section includes parameters that are related to the dynamic depth focusing

algorithm.

Dyn_start

Indicates

the

start

point

from

where

the

dynamic

depth

focusing

should

be

applied. The value is expressed in hexadecimal.

Dyn_nbr

Indicates the number of sliding steps used in the dynamic depth focusing

algorithm. The value is expressed in hexadecimal.

Dyn_div

Indicates the

divider

of

the

sliding

step

used

in

the

dynamic

depth

focusing

algorithm. The value is expressed in hexadecimal. Maximum 2 bytes. Higher two

bytes are reserved for special bit field settings. Bit fields do not have the same

meaning for Tomoscan III and FOCUS LT pods.



160 Appendix D

For the

Tomoscan

III,

the

values

of

Dyn_start,

Dyn_nbr,

and

Dyn_div

are

expressed

as

a negative count. For example, a Dyn_start of 0x0004 is expressed as 0xFFFB. For the

FOCUS LT, the values are expressed normally. For example, a Dyn_start of 0x0004 is

expressed as 0x0004.

Selfifo

Activates the dynamic depth focusing in the hardware chip.

Wpdel

Initial value of the delays before the dynamic depth focusing algorithm is applied. The value is expressed in hexadecimal.

#Module

Number of module to be programmed.

Dynamic_HEXDefines the value in hexadecimal of the dynamic shift that must be applied.


List of Figures

Figure 1‐1 The menu bar and the available tabs ................................................................ 5Figure 1‐2 The button bar ...................................................................................................... 6

Figure 2‐

1 Emitting

and

receiving

in

a

phased

array

system

........................................

10Figure 2‐2 Ultrasonic wave front of a linear array ........................................................... 11Figure 2‐3 Ultrasonic beam angle control of a linear array ............................................ 11Figure 2‐4 Ultrasonic beam focusing of a linear array .................................................... 12Figure 2‐5 Sectorial scanning of X‐axis using phased array deflection 13



List of Figures 161

Figure 2 5 Sectorial scanning of X axis using phased array deflection ........................ 13Figure 2‐6 Scanning at different depths ............................................................................ 14Figure 2‐7 Ultrasonic beam angle control and focusing of a linear array .................... 14Figure 2‐8 Electronic scanning along an axis ................................................................... 15

Figure 3‐1 The 1‐D Linear array tab ................................................................................... 18Figure 3‐2 The Acquisition Unit area ................................................................................ 19Figure 3‐3 The Connection area .......................................................................................... 19Figure 3‐4 The Probe area .................................................................................................... 20Figure 3‐5 The Part area for flat part .................................................................................. 21Figure 3‐6 The Material area for flat part .......................................................................... 22Figure 3‐7 The Wedge area .................................................................................................. 23

Figure 4‐1 Probe

axis

definition

..........................................................................................

28

Figure 4‐2 Refracted angle on flat part .............................................................................. 28Figure 4‐3 Refracted angle on pipe part ............................................................................ 29Figure 4‐4 Example of a beam skew angle ........................................................................ 30Figure 4‐5 Example of a probe skew angle equal to 0° ................................................... 31Figure 4‐6 Example of a probe skew angle equal to 45° ................................................. 31Figure 4‐7 Example of a probe skew angle equal to 90° ................................................. 32Figure 4‐8 Example of a probe skew angle equal to 135° ............................................... 32Figure 4‐9 Total skew angle ................................................................................................ 33Figure 4‐10 Wedge angle definition ..................................................................................... 34Figure 4‐11 Roof angle definition ......................................................................................... 35Figure 4‐12 Probe separation ................................................................................................ 36Figure 4‐13 Squint angle definition ...................................................................................... 37


Figure 4‐14 Wedge reference positions ................................................................................ 38Figure 4‐15 Flat part: offset definition ................................................................................. 40Figure 4‐16 Pipe OD with a curvature along the primary axis: offset definition .......... 41Figure 4‐17 Pipe ID with a curvature along the primary axis: offset definition ............ 42Figure 4‐18 The 1‐D Linear array tab ................................................................................... 44Figure 4‐19 The Acquisition Unit area ................................................................................. 45

Figure 4‐

20 The

Scan

area

......................................................................................................

45Figure 4‐21 The Beam angles selection area ....................................................................... 46Figure 4‐22 Refracted angle ................................................................................................... 47Figure 4‐23 The Focal points selection area ........................................................................ 48Figure 4‐24 True depth focalization ..................................................................................... 50Figure 4‐25 Half‐path focalization ....................................................................................... 50Figure 4‐26 Projection focalization ....................................................................................... 51Figure 4‐27 Focal plane focalization ..................................................................................... 51

Figure 4‐28 Autofocalization for pitch‐and‐catch configuration ..................................... 52Figure 4‐29 The Elements selection area ............................................................................. 52Figure 4‐30 The Connection area .......................................................................................... 53Figure 4‐31 Example of Pulser and Receiver connection parameter configuration for



162 List of Figures

two 128‐element probes connected to an OMNI‐A‐ADP05 splitter box ... 54Figure 4‐32 The Probe area .................................................................................................... 55Figure 4‐33 Definition of the probe scan offset .................................................................. 56

Figure 4‐34 Definition

of

the

probe

index

offset

................................................................

57

Figure 4‐35 The Part area for flat part .................................................................................. 58Figure 4‐36 The Material area for flat part .......................................................................... 59Figure 4‐37 The Wedge area .................................................................................................. 60Figure 4‐38 Static Beam: input parameters ......................................................................... 65Figure 4‐39 Static beam: visualization ................................................................................. 66Figure 4‐40 Depth beams: input parameters ...................................................................... 68Figure 4‐41 Depth beams: visualization .............................................................................. 69Figure 4‐42 Sectorial beams: input parameters for sectorial sweep on a flat part ......... 71Figure 4‐43 Sectorial beams: visualization of sectorial sweep on a flat part .................. 72Figure 4‐44 Sectorial beams: input parameters for “Lateral scan” on a flat part .......... 74Figure 4‐45 Sectorial beams: visualization of “lateral scan” on a flat part ..................... 75Figure 4‐46 Sectorial beams: input parameters for a pitch‐and‐catch configuration .... 77Figure 4‐47 Sectorial beams: visualization of a pitch‐and‐catch configuration ............. 78Figure 4‐48 Sectorial beams: input parameters for sectorial sweep on a pipe part ...... 80

Figure 4‐49 Sectorial beams: visualization of sectorial sweep on a pipe part ................ 81Figure 4‐50 Electronic scanning along an axis .................................................................... 82Figure 4‐51 Linear beams: input parameters ...................................................................... 84Figure 4‐52 Linear beams: visualization .............................................................................. 85Figure 4‐53 The Save As dialog box ..................................................................................... 86Figure 4‐54 The Save As dialog box ..................................................................................... 87


Figure 4‐55 DDF beam: input parameters .......................................................................... 90Figure 4‐56 DDF beam: visualization .................................................................................. 91Figure 4‐57 The Save As dialog box ..................................................................................... 92Figure 5‐1 Fresnel annular array ........................................................................................ 94Figure 5‐2 Custom annular array ....................................................................................... 95Figure 5‐3 The 1‐D Annular array tab ............................................................................... 96

Figure 5‐

4 The

Acquisition

Unit

area

................................................................................

97Figure 5‐5 The Scan Type area ............................................................................................ 97Figure 5‐6 The Beam angles selection area ....................................................................... 98Figure 5‐7 The Focal points selection area ........................................................................ 98Figure 5‐8 The Elements selection area ........................................................................... 100Figure 5‐9 The Probe area for annular arrays ................................................................. 101Figure 5‐10 The Annular Array Radius dialog box ......................................................... 103Figure 5‐11 The Part area for flat part ................................................................................ 104

Figure 5‐12 The Material area for flat part ........................................................................ 104Figure 5‐13 The Wedge area for annular arrays ............................................................... 105Figure 5‐14 Fresnel annular array: Depth beam input parameters ............................... 107Figure 5‐15 Fresnel annular array: Depth beam visualization ....................................... 108Fi 6 1 E l f t f t i l b f 2 D t i b 110



List of Figures 163

Figure 6‐1 Example of parameters of sectorial beams for a 2‐D matrix probe .......... 110Figure 6‐2 Graphic representation of the sectorial beams for a 2‐D matrix probe ... 111Figure 7‐1 The Beams Display Info tab ........................................................................... 114

Figure 8‐1 Example

of

the

Element

Info.

tab

..................................................................

120Figure 9‐1 Example of the AFiSiMO tab ......................................................................... 122

Figure 9‐2 Example of 2‐D and 3‐D simulation visualizations .................................... 123Figure 9‐3 The TomoView Startup Selection dialog box with the enabled AFiSiMO

add on ................................................................................................................ 124Figure 10‐1 Probe parameters ............................................................................................. 126Figure 10‐2 Saving with the Probe Configuration dialog box ....................................... 127Figure 10‐3 Deleting with the Probe Configuration dialog box .................................... 128Figure 10‐4 Material parameters ........................................................................................ 128Figure 10‐5 Saving with the Material Configuration dialog box ................................... 129Figure 10‐6 Deleting from the Material Configuration dialog box ............................... 130Figure 10‐7 Wedge parameters ........................................................................................... 131Figure 10‐8 Saving with the Wedge Configuration dialog box ..................................... 131Figure 10‐9 Deleting with the Wedge Configuration dialog box .................................. 132Figure B‐1 Dynamic depth focusing at reception ........................................................... 136

Figure B‐2 Standard focusing: convolution of transmitted and received beam ........ 136Figure B‐3 Dynamic depth focusing: resulting beam by convolution ........................ 137Figure C‐1 The Sum gain on the Receiver tab of the UT Settings dialog box ............. 142Figure C‐2 The Filters area of the Pulser/Receiver tab of the UT Settings

dialog box ......................................................................................................... 142Figure C‐3 The Refracted angle on the Probe tab of the UT Settings dialog box ....... 143


Figure C‐4 The First element on the Transmitter tab of the UT Settings dialog box . 143Figure C‐5 The First element on the Receiver tab of the UT Settings dialog box ....... 144Figure C‐6 The Scan axis offset on the Probe tab of the UT Settings dialog box ........ 144Figure C‐7 The Wedge delay on the Probe tab of the UT Settings dialog box ........... 145Figure C‐8 The Focal law gain on the General tab of the UT Settings dialog box ..... 146Figure C‐9 The Voltage on the Pulser/Receiver tab of the UT Settings dialog box .... 147Figure D‐1 The Pulser area of the Pulser/Receiver tab of the UT Settings

dialog box .......................................................................................................... 154Figure D‐2 The Sum gain on the Receiver tab of the UT Settings dialog box ............. 154Figure D‐3 The Refracted angle on the Probe tab of the UT Settings dialog box ....... 155Figure D‐4 The Scan axis offset on the Probe tab of the UT Settings dialog box ........ 155Figure D‐5 The Wedge delay on the Probe tab of the UT Settings dialog box ........... 156Figure D‐6 The Focal law gain on the General tab of the UT Settings dialog box ..... 157Figure D‐7 The Voltage on the Pulser/Receiver tab of the UT Settings dialog box .... 157

Figure D‐8 The Filters area of the Pulser/Receiver tab of the UT Settings

dialog box .......................................................................................................... 158Figure D‐9 The First element on the Transmitter tab of the UT Settings dialog box . 159Figure D‐10 The First element on the Receiver tab of the UT Settings dialog box ....... 159



164 List of Figures


List of Tables

Table 1 File formats supported by the Advanced Calculator ......................................... 8Table 2 Legacy file format supported by the Advanced Calculator .............................. 8



List of Tables 165




166 List of Tables


Index

Numerics

1‐D Annular array 93creating depth beams 106tab description 96

1‐D Annular Arraysgeneric conventions 93

1‐D Annular arraystab description 96

angle, probe skew 21, 30, 57angle, refracted 28angle, roof 35, 61

angle, skew 29angle, squint 36, 58angle, total skew 33angle, wedge 24, 34, 61Annular Array Radius dialog box 103



Index 167

tab description 961‐D Linear Array tab

description 441‐D Linear array tab 18, 441‐D linear arrays 27

creating a DDF law 88creating a static beam 63creating depth beams 67creating linear beams 82creating sectorial beams 70description 44generic conventions 27saving a beam file 87saving a calculator setup file 86saving a DDF law file 92

2‐D matrix beams 109sectorial 109

A

acoustic field simulation, creating 122

acquisition unit 97Acquisition Unit area 19AFiSiMO availability

verifying 124AFiSiMO tab 121angle, beam skew 29

annular array, Custom 94annular array, Fresnel 93appendixes

description of the .law file format 139description of the .pac file format 149theoretical considerations on law delay

accuracy 133applications of a phased array system 12

depth scanning 13linear electronic scanning 15sectorial scanning 13

areasBeam angles selection 46, 98Elements selection 19, 52, 53, 100Filters 142, 158Focal points 48Focal points selection 98Material 22, 59, 104Part 21, 58, 104

Probe 101Pulser 154Scan 45, 97Wedge 23, 60, 105

array, Custom annular 94array, Fresnel annular 93


axis definition, probe 27

B

beam angle control 10Beam angles selection area 46, 98Beam Display Info. tab 114 beam file, saving 87

beam

focus

control

12 beam skew angle 29 beam visualization 113 beam, static

creating 63 beams

2‐D matrix probes 109sectorial

2‐D matrix probe 109 beams, creating depth 67

1‐D annular arrays 106 beams, creating linear 82 beams, creating sectorial 70

C

description of the .pac file format 149conventions related to the part 38conventions related to the probe

1‐D annular arrays 931‐D linear arrays 27axis definition 27 beam skew angle 29

Fresnel annular

array

93

probe skew angle 30refracted angle 28skew angle 29total skew angle 33

conventions related to the wedge 34probe separation 36roof angle 35

squint angle

36wedge angle 34

conventions, generic1‐D annular arrays 93

conventions related to the probe 93delay calculation 95



168 Index

C

calculation, delay 95calculator setup file, saving 86

compensation gain 97concepts, phased array See phased array

techniqueconfiguration, material

deleting 129loading 129saving 128

configuration, probe


configuration, wedgedeleting 132loading 132saving 130

Connection area 19

control, beam angle 10control, beam focus 12conventional focused probe, dynamic depth

focusing (DDF) 135conventions

description of the .law file format 139

delay calculation 951‐D linear arrays 27

conventions related to the part 38

conventions related

to

the

probe

27conventions related to the wedge 34

creating a DDF law 88creating a static beam 63creating acoustic field simulation 122creating depth beams 67

1‐D annular arrays 106creating linear beams 82

creating sectorial

beams

70Custom annular array 94

cylindrical part 41

D

Data files.cal 8.xcal 8

database file 125database folder 125databases, using

material database 128Probe database 126Wedge database 130

DDF law file, saving 92


DDF law, creating 88DDF See dynamic depth focusingdefinition, probe axis 27deflection 13delay calculation 95Delete from material database dialog box 130Delete from Probe database dialog box 128

Delete from

Wedge

database

dialog

box

132

deletingmaterial configuration 129probe configuration 127wedge configuration 132

depth beams, creating 671‐D annular arrays 106

depth of field 135

depth scanning

13description of the .law file format 139

conventions 139example 140general format 140object description 141

examples.law file 140.pac file

DDF laws 151non‐DDF laws 150

F

file, database 125Files

.cal 8

.xcal 8files

.lawdescription of the format 139example 140format 140object description 141saving 87

.pacdescription of the format 149example 150, 151



Index 169

object desc iptio

description of the .pac file format 149conventions 149

example 150,

151general format 150

object description 153dialog boxes

Annular Array Radius 103delete from material database 130Delete from Probe database 128Delete from Wedge database 132

Save As

86,

87,

92save in material database 129

Save in Probe database 127Save in Wedge database 131

documentpart number iipublishing date iirevision ii

dynamic

depth

focusing

(DDF)

135conventional focused probe 135phased array probe 135

E

Elements Info. tab 119Elements selection area 19, 52, 53, 100

format 150object description 153saving 92

.xcalsaving 86

Filters area 142, 158flat part 39flight time (FT) 133Focal points selection area 48, 98focusing techniques

dynamic depth focusing (DDF) 135folder, database 125format

.law file 140

.pac file 150Fresnel annular array 93FT (flight time) 133

G

General tabBeam gain 157 beam gain 146

generic conventions1‐D annular arrays 93

conventions related to the probe 93


delay calculation 951‐D linear arrays 27

conventions related to the part 38conventions related to the probe 27conventions related to the wedge 34

I

introduction 5introduction to phased array technique 9

L

lateral scan mode 73.law file

description of the format 139example 140format 140

object description 141saving 87

law file, saving a DDF 92law file, saving a focal 87law, creating a DDF 88law Snell’s 47

office address iitechnical support 4

OPD (optical path difference) 133optical path difference (OPD) 133

P

.pac filedescription of the format 149example 150, 151format 150object description 153saving 92

partconventions related to the ~ 38cylindrical ~ 41flat ~ 39

Part area 21, 58, 104phased array principle, dynamic depth

focusing (DDF) 135phased array probe, dynamic depth focusing

(DDF) 135h d h



170 Index

law, Snell s 47length, wedge 24, 62Limit, Rayleigh 133

linear beams, creating 82linear electronic scanning 15loading

material configuration 129probe configuration 127wedge configuration 132

M

Material area

22,

59,

104

material configurationdeleting 129loading 129saving 128

Material database 22material database, using 128mechanical reference point 38

mode, lateral

scan

73

O

object description.law file 141.pac file 153

Olympus

phased array technique 9applications 12

depth scanning 13linear electronic scanning 15sectorial scanning 13

introduction 9physical principles 9

beam angle control 10 beam focus control 12

physical principles of phased array technique 9 beam angle control 10 beam focus control 12

point, mechanical reference 38point, wedge reference 38Probe area 20, 101probe configuration


Probe database, using 126probe separation 36probe skew angle 21, 30, 57Probe tab

Refracted angle 143, 155Scan axis offset 144, 155


Wedge delay 145, 156probe, conventional focused

dynamic depth focusing (DDF) 135probe, conventions related to the

1‐D annular arrays 931‐D linear arrays 27axis definition 27

beam skew

angle

29Custom annular array 94

Fresnel annular array 93probe skew angle 30refracted angle 28skew angle 29total skew angle 33

probe, phased array

dynamic depth

focusing

(DDF)

135probes

2‐D matrix 109Pulser area 154Pulser/Receiver tab

Filters area 142, 158

saving a beam file 87saving a calculator setup file 86saving a DDF law file 92Scan area 45, 97scan mode, lateral 73scanning, depth 13scanning, linear electronic 15

scanning, sectorial

13sectorial

beams for a 2‐D matrix probe 109sectorial beams, creating 70sectorial scanning 13separation, probe 36setup file, saving a calculator 86skew angle 29

beam ~ 29probe ~ 21, 30, 57

total ~ 33Snell’s law 47software version iisound velocity, wedge 24, 61



Index 171

Pulser area 154Voltage 147, 157

RRayleigh Limit 133Receiver tab

First element 144, 159Sum gain 142, 154

reference point, mechanical 38reference point, wedge 38refracted angle 28roof angle 35, 61

S

safetysignal words 2symbols 1

Save As dialog box 86, 87, 92Save in Material database dialog box 129

Save in Probe database dialog box 127Save in Wedge database dialog box 131saving

material configuration 128probe configuration 126wedge configuration 130

squint angle 36static beam, creating 63

support information

4

T

tabs1‐D Annular Array 96

description 961‐D Linear Array

description 441‐D Linear array 18, 44Beam Display Info. 114General

Beam gain 146, 157Probe

Refracted angle 143, 155Scan axis offset 144, 155Wedge delay 145, 156

Pulser/Receiver

Filters area 142, 158Pulser area 154Voltage 147, 157

ReceiverFirst element 144, 159Sum gain 142, 154


TransmitterFirst element 143, 159

UT Probedescription 18

technical support 4theoretical considerations on law delay

accuracy 133

total skew

angle

33trademark disclaimer ii

Transmitter tabFirst element 143, 159

U

using the databases 125material database 128Probe database 126Wedge database 130

UT Probedescription 18

UT Probe tab 17description 18

visualization, beam 113

W

warranty information 3wedge

angle 24, 34, 61length 24, 62reference point 38sound velocity 24, 61width 25, 62

Wedge area 23, 60, 105wedge configuration


Wedge database, using 130wedge, conventions related to the

probe separation 36roof angle 35squint angle 36wedge angle 34

width wedge 25 62



172 Index

V

velocity, wedge sound 24, 61

verifying AFiSiMO availability 124

width, wedge 25, 62

X

.xcal files, saving 86

dmta-20039-01en_rev_a--advanced_calculator_210--user.pdf

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