HALT/HASS and Accelerated Testing
Durability Growth through
HALT/HASS and Accelerated Testing
Elite Electronic Engineering
HALT/HASS and Accelerated Testing
Topics Covered
Review Your Requirements
Overview of Accelerated Stress Testing
HALT
HALT Equipment, Test Methods, Expectations
HASS
Other Accelerated Tests
Summary
Q&A
HALT/HASS and Accelerated Testing
Test Requirements & Goals
Is Testing Desired by Manufacturer to
Reduce Cost of Development,
Manufacturing, and Warranty Obligations?
Mandated by Manufacturer’s Client?
What are your expectations and goals for
this testing?
HALT/HASS and Accelerated Testing
New Product Development Testing Screens
Qualitative Testing
Qualification
Testing Qual Retest
Quantitative Testing Manufacturing
Screen
New
Product
HALT, HAST, ESD,
Power Cycle, EMI RTCA DO-160
MIL-810,
SAE J1455
Temp, Vibration, Shock,
Waterproofness,
Altitude, Humidity
HASS Analysis
Phase
Development
Phase
HALT/HASS and Accelerated Testing
Quantitative Testing
.95 .80
.98
.65
.98
Reliability Block Diagrams
=0.73
Success Run Testing
Test to Failure- Weibull
HALT/HASS and Accelerated Testing
Which Tests To Run
Input from all departments
Determine failure modes (FMEA)
Consider complete life cycle of product
Suggest stresses that will precipitate failures Maximum Stress vs Time Dependent
Develop test plan
Execute test
HALT/HASS and Accelerated Testing
Time Dependent Failure Mechanisms
Loss of signal Silicon Diffusion Temperature
Power Failure Dielectric Breakdown Electric Field
Loss of signal Electromigration Temperature & Power Cycling
Intermittent Output Corrosion & Oxidation of
Fractures
Humidity, Voltage, Temperature
Loss of signal Dendrite Growth Humidity, Temperature
Water Intrusion Seal Leaks Pressure
Cracked Solder
Joint
Fatigue Thermal cycling & vibration
Failure Mechanism Accelerating Factors Failure Mode
HALT/HASS and Accelerated Testing
HALT Testing (Qualitative)
Highly Accelerated Life Testing (HALT)
Temperature and Thermal Shock (60C/min)
Vibration 6 axis simultaneous (6 DOF)
Very high stress levels to achieve time compression & quickly find the weakest links.
Additional stresses likely to precipitate flaws can be used as a part of the HALT/HASS program.
power cycling, voltage /electrical stress
HALT/HASS and Accelerated Testing
HALT Testing
Design Optimization Provide data to designers for risk assessment
Weak links- opportunity to improve the product before the design is “locked in”.
Build in lifetimes of use in its field environment, “very large margins”.
Proactive technique focusing on the mode and mechanism of failure, not on the specifications or the level of stress.
No pass/fail criteria HALT specification. Some HALT specifications describe a “common method”
Product Comparisons Side-by-side evaluation of various products and product revisions under similar
extreme stress
HASS Endpoints Large margins enables the use of high levels of stress in the HASS screen. Leave
several if not many lifetimes of use remaining in the product.
Enables the use of HASS to quickly detect any slippage that might occur in the manufacturing process.
HALT/HASS and Accelerated Testing
HALT Testing
HALT/HASS and Accelerated Testing
HALT Testing
Halt Chamber
Workspace 42”x42”x40”
Heating & Cooling
-100C to +200C
>60C/min depending
on product loading and
temperature range
HALT/HASS and Accelerated Testing
HALT Testing
Heating
Elements
Nichrome
Coils
FLA 135A
Min Service
175A
460VAC 3ph
Airflow
4,000CFM
HALT/HASS and Accelerated Testing
HALT Testing
LN2 Cooling
4.5GPM
30 PSIG
HALT/HASS and Accelerated Testing
HALT Testing
RS Vibration Table Multi-axis repetitive shock
3 linear, 3 rotational Axes
2Hz-10,000Hz
Up to 60GRMS
(depending on loading)
Table Size 30” x 30”
Payload up to 400lbs
(reduced vibration amplitude)
Compressed Air
90PSIG, 48CFM
HALT/HASS and Accelerated Testing
HALT Testing
RS Impactors
HALT/HASS and Accelerated Testing
HALT Testing
HALT/HASS and Accelerated Testing
HALT Testing
HALT PSD
1.E-06
1.E-05
1.E-04
1.E-03
1.E-02
1.E-01
1.E+00
1.E+01
1.0E+00 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05
Frequency (Hz)G^
2/H
z
HALT/HASS and Accelerated Testing
HALT Testing
Ckt board resonant frequencies
Components on PWB
Chip capacitors and die bond wires
HALT/HASS and Accelerated Testing
Feb 11, 2005 10:23:11
Demand: 6.061 G
Control: 6.06 G
Level 1) 100%
Level Time: 0:05:00
Total Time: 0:05:22
Output: 0 V RMS
End of Test
Ice Corporation (33141)
De-Icing Control Unit (9510 Rev T)
Y Axis sn: C350-00057-SAC
20 2000100 1000
-31x 10
-21x 10
-11x 10
Demand
Control
Frequency (Hz)
Acc
eler
atio
n (G
²/H
z)
Acceleration Profile
RS vs. ED
HALT/HASS and Accelerated Testing
RS vs. ED
ED (Electrodynamic Vibration) Controllable Vibration Spectra
5Hz-2000Hz
Single Axis
2” Displacement
RS Random Only
6 Axis
30Hz-10,000Hz
10x -15x higher peak accel vs. ED
HALT/HASS and Accelerated Testing
STEP 1: Pre-HALT Planning
Discuss product with multi-functional team
Develop test plan
Bench test to confirm operation before starting HALT
Steps Involved with HALT
HALT/HASS and Accelerated Testing
HALT Process
STEP 2: Preparing for the HALT
Setup
Design appropriate vibration fixture
Tune chamber proportional & integral parameters
Configure air flow for maximum product temperature
change rate
Apply thermocouples and accelerometers to device
under test
Setup functional test equipment
HALT/HASS and Accelerated Testing
HALT Process
STEP 3: Thermal Step Stressing Cold
Begin at ambient
Step down in 5°C or 10°C increments
Use caution as fundamental limit is approached
Approximate dwell time of 10 minutes at each temperature
Allow sufficient time to run functional tests
Find and fix failures
Verify operation of thermal safeties
Disable safeties to determine actual operating & destruct limits
Continue until fundamental limit of technology is reached
Practice continuous failure monitoring
HALT/HASS and Accelerated Testing
HALT Process
STEP 4: Thermal Step Stressing Hot
Begin at ambient
Step up in 5°C or 10°C increments
Use caution as fundamental limit is approached
Approximate dwell time of 10 minutes at each temperature
Allow sufficient time to run functional tests
Find and fix failures
Verify operation of thermal safeties
Disable safeties to determine actual operating & destruct limits
Continue until fundamental limit of technology is reached
Practice continuous failure monitoring
HALT/HASS and Accelerated Testing
Limits Encountered in HALT
Stress
Lower
Operating
Limit
Margin
Operating
Product
Specs
Lower
Destruct
Limit
Destruct Margin
Upper
Operating
Limit
Margin
Operating
Upper
Destruct
Limit
Destruct Margin
Data from Gregg Hobbs of Hobbs Engineering
HALT/HASS and Accelerated Testing
HALT Process
STEP 5: Rapid Thermal Cycling
Transition temperature at maximum product temperature change
rates
Select temperatures 5°C inside upper and lower operational limits
Reduce change rate by 10°C/min if product cannot withstand
maximum rate
Continue thermal cycling until operating limit (°C/min) is found
Continue cycling for a minimum of 10 minutes
Apply functional testing and continuous failure monitoring
Depending on the product or application, this step is sometimes
omitted
HALT/HASS and Accelerated Testing
HALT Process
STEP 6: Vibration Step Stress
Understand how product responds to vibration input
Vibration is stepped-up in increments, normally 3-5
Grms on the product
Dwell time of 10 minutes at each level is typically
sufficient
Start dwell once product reaches vibration set point
Continue until operational or destruct limit is found
Apply additional product stresses during process
HALT/HASS and Accelerated Testing
HALT Process
STEP 7: Combined Environments
Develop thermal profile
Use established thermal operating limits, dwell times and change
rates
Incorporate functional tests and continuous failure monitoring
Begin with constant vibration level of approximately 3-5 Grms
Step up in 3-5 Grms increments upon completion of each thermal cycle
Use tickle vibration when higher Grms levels are reached
Add 3-5 Grms tickle to determine if failures were precipitated at high G level but only detectable at lower G level
HALT/HASS and Accelerated Testing
Suggested HALT Process Per GMW 8287
HALT/HASS and Accelerated Testing
The Product Determines the Stress
Power Cycling
Output Loading
Voltage/Electrical Stresses
Humidity (HAST)
Pressure
Altitude
Corrosion
Other Stresses
HALT/HASS and Accelerated Testing
HALT Process
STEP 8: Lessons Learned
Determine root cause of all failures that occurred
Meet with design engineers to discuss HALT results
Management cost justification & risk assessment
Determine and implement corrective action
Perform Verification HALT
Insure problems are fixed and new problems were not introduced
Periodically evaluate product as it is subjected to engineering changes
HALT/HASS and Accelerated Testing
HALT Testing
Other considerations Quantity of Samples
Product Improvement
Preparation for HASS/HASA
Comparison Testing
Fixturing
Stimulation vs. Simulation
Product and Fixture Weight
Test Uniformity
Lower
Operating
Limit
Margin
Operating
HALT/HASS and Accelerated Testing
HALT Testing
Cross Table Uniformity
69.364.0
45.2
60.065.5
136.3
130.0
93.3
128.4
136.1
17.9
12.9
10.8
14.7
16.3
0.0
20.0
40.0
60.0
80.0
100.0
120.0
140.0
160.0
1 2 3 4 5
Table Location
25 &
55 G
rms I
np
ut
Scale
0.0
5.0
10.0
15.0
20.0
25.0
5
Grm
s I
np
ut
Scale
25 Grms Input55 Grms Input5 Grms Input
HALT/HASS and Accelerated Testing
HALT Testing
Response Level
Test Location Control Level Grms- X Grms-Y Grms-Z Mean
1 5 21.2 19.2 13.4 17.9
1 25 79.8 73.0 55.0 69.3
1 MAX (55) 158.1 138.3 112.6 136.3
2 5 14.2 14.6 9.8 12.9
2 25 73.3 68.4 50.3 64.0
2 MAX (55) 150.1 134.2 105.6 130.0
3 5 10.5 13.8 8.1 10.8
3 25 42.6 55.6 37.3 45.2
3 MAX (55) 85.5 113.6 80.7 93.3
4 5 16.6 17.4 10.1 14.7
4 25 68.1 67.5 44.5 60.0
4 MAX (55) 145.3 140.3 99.7 128.4
5 5 19.1 18.4 11.3 16.3
5 25 77.1 69.5 50.0 65.5
5 MAX (55) 157.4 140.5 110.5 136.1
1 5 20.5 17.9 12.1 16.8
1 25 75.1 72.3 51.9 66.4
1 MAX (55) 158.1 140.7 112.8 137.2
HALT/HASS and Accelerated Testing
HALT Testing
HALT/HASS and Accelerated Testing
HALT Testing
HALT/HASS and Accelerated Testing
HALT Testing
HALT/HASS and Accelerated Testing
HALT Testing
HALT/HASS and Accelerated Testing
HALT Testing
Failure Analysis Services
HALT/HASS and Accelerated Testing
HALT Testing
“SEM photographs showing and overall view (top, ~40x) and a typical
closer view (bottom, ~800x) showing some surface debris but no
damage to the integrated circuit from sample D4.”
Failure Analysis Services
HALT/HASS and Accelerated Testing
HALT Testing
HALT/HASS and Accelerated Testing
Component Selection
Did vendor perform HALT AND HASS?
Use to verify products operating limits.
Use to select most robust product.
Vendor Selection
If subcontracting, vendor needs to meet your
standards (Halt and Hass equipment, should
be the same.)
Other Uses of HALT
HALT/HASS and Accelerated Testing
HASS- Highly Accelerated Stress Screening
HASS is used as a production quality screen
quickly identify any weaknesses that might enter the
product due to changes or malfunctions in the
manufacturing process.
Each weakness detected, represents an opportunity
to take corrective action prior to shipping large
quantities of flawed product.
The screen is “tuned” so that it detects weak product
while still leaving several, if not many lifetimes of
field use in the shipped product.
HALT/HASS and Accelerated Testing
HASS Testing
HASS- 100% Production Screening
HASA- 1-10% Production Auditing
Safety of of HASS
Repeat screen a minimum of 20 times
Assuming remove less than 5% life
Failures after less than 10 times, too harsh
Re-HALT- Confirm margins
HALT/HASS and Accelerated Testing
Other Accelerated Stress Testing
Acceleration Factors
Temperature
Arrhenius Model
Humidity
Arrhenius-Peck Model
Vibration
Miner Criteria
Voltage
Inverse Power Law
Product Life Cycling
CALT Testing
Test to Failure & Apply Weibull Analysis
HALT/HASS and Accelerated Testing
Product Life Cycling
Calibrated Accelerated Life Testing (CALT)
Suggest primary fatigue mechanism
Simulate loads at three stress levels
90% of foolish load (first test)
80% of first test load
Third stress level
Depends on first two and ultimate life
Test all units to failure
Plot S-N curve, Determine AF’s
Generate Weibull Plot
HALT/HASS and Accelerated Testing
Product Life Cycling
Accelerated Life Testing
•“Accelerated Testing: Statistical
Models, Test Plans, and Data Analysis”
•By Wayne Nelson
•CALT GMW 8758
•Example
Automatic Lubricating System
HALT/HASS and Accelerated Testing
CALT Test Example
•Simulate loads
at three stress
levels
•Monitor test
counting cycles
to failure
HALT/HASS and Accelerated Testing
CALT Test Example Stress Cycles To Failure
36 3121
36 1075
36 629
36 9452
31 11386
31 1104
31 6624
31 1577
25 11044
25 15405
25 19257
25 28723
Pump S-N Curve
y = 3050953219559.39x-5.93
100
1000
10000
100000
10 100Applied Stress (PSI)C
ycle
s t
o F
ailu
re
•Collect Failure Data
•Plot and determine Inverse
Power Relationship
•AF = (Saccel/Snormal)b
Determine AF's
Condition
High Stress
Mid Stress
Confirm Stress
Normal Stress
Accel Factor
180
74
21
Stress Value (PSI)
36
31
25
15 N/A
HALT/HASS and Accelerated Testing
CALT Test Example
Stress Level Test Stress Accel Factor Rank
High (IG) 3121 180 9
High (IG) 1075 180 4
High (IG) 629 180 2
High (PP) 9452 180 12
Medium (PP) 11386 74 11
Medium (IG) 1104 74 1
Medium (PP) 6624 74 8
Medium (IG) 1577 74 3
Confirm (PP) 11044 21 5
Confirm (PP) 15405 21 6
Confirm (PP) 19257 21 7
Confirm (PP) 28723 21 10
Cycles at Normal
Stress
560979
193224
113059
1698933
398246
594009
843189
81757
490540
116785
228397
318585
Median Rank
5.61
13.60
21.67
29.76
37.85
45.95
54.05
62.12
70.24
78.33
86.40
94.39
81757
228397
594009
843189
1698933
Sorted Least to Most (Resort these numbers for each
change to spreadsheet)
318585
398246
490540
560979
113059
116785
193224
Sort and apply median ranks
Generate Weibull Plot
HALT/HASS and Accelerated Testing
CALT Test Example
Weibull Plot
•Obtain distribution parameters
•Reliability metrics
•B1, B10
•Reliability vs life
•Reliability Block Diagrams
ReliaSoft Weibull++ 7 - www.ReliaSoft.com
Probability - Weibull
Time, (t)
Unre
liabi
lity,
F(t)
10000.000 1.000E+7100000.000 1000000.0001.000
5.000
10.000
50.000
90.000
99.000Probability-Weibull
Data 1Weibull-2PRRX SRM MED FMF=12/S=0
Data PointsProbability Line
Steve LayaElite Electronic Engineering6/12/20084:58:49 PM
HALT/HASS and Accelerated Testing
HAST Testing
Accelerated Humidity Testing
•HAST (Highly Accelerated
Stress Testing)
•JESD22-A110 B
•Compress 1000 Hour 85/85
Humidity to 96 Hours
•High Temperatures may
stimulate uncorrelated failures
•Arrhenius-Peck Accelerated
Model for Temperature
Humidity
HALT/HASS and Accelerated Testing
HAST Testing
“…Photographs showing environmental damage to the solder
joints of A8.”
HALT/HASS and Accelerated Testing
Instrumentation & Data Acquisition
Yokagawa DL708 Scope
Ten Systems In-House
4, 8, and 16 Channel
LeCroy Digital Storage Scopes
1.5GHz Bandwidth, 8GS/s, 16M data points
Seven Systems In-House
400MHz, 500Mhz scopes
Agilent 34970A Data Acquisition System 120 Single Ended or 60 Differential Input
AC/DC, Volts, Amps, Frequency, Ohms
HALT/HASS and Accelerated Testing
Advanced Material Center
Materials Testing and Failure Analysis
Physical Testing
Thermal Testing
Chemical Testing
Light & Appearance
Exposure Testing
Product Comparisons
Location: Ottawa, Illinois
www.amc-testlabs.com
HALT/HASS and Accelerated Testing
Advanced Material Center
Physical Testing
Tensile
Tear
Dart
Flextural
Friction
Surface Tension
Specific Gravity
Density
COF
HALT/HASS and Accelerated Testing
Advanced Material Center
Thermal Analysis
Differential Scanning Calorimeter
(DSC)
Melt range
Purity
Thermal Mechanical Analyzer (TMA)
Expansion/Contraction
Thermal Gravimetric Analyzer (TGA)
Thermal degradation
Ash
HALT/HASS and Accelerated Testing
Materials Engineering Incorporated
Complete Metallurgical Laboratory Failure Analysis
Analysis of Processing Problems
Contamination Identification
Engineering Support/Consulting
Laboratory Testing
Specialized Testing
Litigation Support and Expert Testimony
Location: Virgil, Illinois
www.materials-engr.com
HALT/HASS and Accelerated Testing
Materials Engineering Incorporated
Complete Metallurgical Laboratory
Scanning Electron Microscope (SEM) with EDS
OES Chemical Composition
Metallography and Microscopy
Microhardness and Hardness
Electrical Conductivity
Density/Specific Gravity
Surface Roughness (Ra)
Pressure and Torque Testing
Specialized Product and Component Testing
ISO 17025 Accredited by A2LA
HALT/HASS and Accelerated Testing
Other Tests to Failure
HALT/HASS and Accelerated Testing
Other Tests to Failure
HALT/HASS and Accelerated Testing
Durability Growth to HALT HASS
Any Questions?
Thank You!