AutoEM-toolbox
NanoDefine Outreach September 20th 2017
Brussels Toni Uusimäki, Ralf Kaegi
Eawag
Typical workflow
Sample prep. Image acquisition Image analysis
Image acquisition
Toni Uusimäki, Ralf Kaegi
Achievements of NanoDefine
Image analysis Thorsten Wagner
sample prep.
drop on grid / grid on drop
CODA-CERVA
on-grid centrifugation
USN e-depo. Electrospray
AutoEM-toolbox TEM mode
Main Tab Calibrations
User Interface
Camera parameters
AutoEM-toolbox TEM mode
UI
Live PSD Live view
ParticleSizer results
3D Segmenation 3D recorded images
AutoEM-toolbox TEM mode
TEM bright field image of Au/SiO2 NPs Pixel size: 2.95 nm FOV: 3 µm
A mosaic collection of TEM images (35x10, 1.4 gb) with FOV 0.11 mm x 0.3 mm
AutoEM-toolbox STEM mode
STEM HAADF image of SiO2 NPs (ERM-FD304) Pixel size: 1.17 nm FOV: 1.2 µm
A mosaic collection of STEM images (10x5, 0.2 gb) with FOV 12 µm x 6 µm
AutoEM-toolbox STEM EDS mode
- User chooses the elements and defines Cutoff values for the peaks - The EDS spectra integrated from the SI image is smoothed and an optimized Gaussian curve is fitted to the peak - If the peak is above the cutoff value, the feret min value will be added to the PSD
AutoEM-toolbox STEM EDS mode
Au/Si NPs (5x4) FOV 5 µm x 4 µm
PSD of Au NPs
PSD of Si NPs
AutoEM-toolbox TEM EFTEM mode Thickness Map
ZLP image Unfiltered image Thickness Map t/λ
𝑡𝑡λ = ln
𝐼𝐼𝐼𝐼0
, λ = 106𝐹𝐹 𝐸𝐸0
𝐸𝐸𝑀𝑀�
𝑙𝑙𝑙𝑙 2𝐸𝐸0𝛽𝛽𝐸𝐸𝑀𝑀�
=155.5 nm,
Ref: Egerton & Chang, Ultramicroscopy 21 (1987) 231-244
𝐹𝐹 = 1+𝐸𝐸0 1022�
1+ 𝐸𝐸0511�
2, 𝐸𝐸𝑀𝑀 = 7.6𝑍𝑍𝑒𝑒𝑒𝑒𝑒𝑒0.36
λ = 𝑚𝑚𝑚𝑚𝑚𝑚𝑚𝑚 𝑓𝑓𝑓𝑓𝑚𝑚𝑚𝑚 𝑝𝑝𝑚𝑚𝑡𝑡𝑝, 𝑡𝑡 = 𝑡𝑡𝑝𝑡𝑡𝑡𝑡𝑡𝑡𝑚𝑚𝑚𝑚𝑡𝑡𝑡𝑡, 𝐼𝐼 = 𝑢𝑢𝑚𝑚𝑓𝑓𝑡𝑡𝑢𝑢𝑡𝑡𝑚𝑚𝑓𝑓𝑚𝑚𝑢𝑢 𝑡𝑡𝑚𝑚𝑚𝑚𝑖𝑖𝑚𝑚, 𝐼𝐼0= 𝑍𝑍𝑍𝑍𝑍𝑍 𝑡𝑡𝑚𝑚𝑚𝑚𝑖𝑖𝑚𝑚 𝐸𝐸0 = 𝑡𝑡𝑚𝑚𝑡𝑡𝑡𝑡𝑢𝑢𝑚𝑚𝑚𝑚𝑡𝑡 𝑚𝑚𝑚𝑚𝑚𝑚𝑓𝑓𝑖𝑖𝑒𝑒 𝑜𝑜𝑓𝑓 𝑚𝑚𝑢𝑢𝑚𝑚𝑡𝑡𝑡𝑡𝑓𝑓𝑜𝑜𝑚𝑚𝑡𝑡
AutoEM-toolbox TEM: Thickness maps
Illite NPs 3D image extracted from the Thickness Map
AutoEM-toolbox TEM EFTEM mode
Illite NPs (10x12, 2 gb) FOV 47 µm x 57 µm
PSD XY analysis
PSD 3D analysis
AutoEM-toolbox
STEM TEM
EELS
EDS Core Loss Imaging
Thickness Map
Particle Sizer
Custom Tasks
Elemental composition
Elemental composition
Elemental composition
Thickness (Z)
Size (XY)
x50 = 180 nm
AutoEM-toolbox: A little treaser
BaSO4 – TiO2
AutoEM-toolbox
STEM TEM
EELS
EDS Core Loss Imaging
Thickness Map
Particle Sizer
Custom Tasks
Elemental composition
Elemental composition
Elemental composition
Thickness (Z)
Size (XY)
www.NanoDefine.eu
This project has received funding from the European Union’s Seventh Programme for research, technological development and demonstration under grant agreement No 604347
