SURAGUS GmbH | Maria-Reiche-Str. 1 | D-01109 Dresden | Germany | Phone +49 351 273 598 - 01 | Fax + 49 351 329 920 - 58 | [email protected] | www.suragus.com
CARBON FIBER MATERIALS
WAFER-BASED LAYER-SYSTEMS GLASS AND FOILS
METALS AND ALLOYS
The penetration of multiple plies enable separating multiaxial composite into individual layers.
APPLICATIONS
Quality assurance of Raw Carbon Fiber (RCF), Non-Crimp-Fabrics (NCF) or Carbon Fiber Reinforced Plastics (CFRP)
Determining fiber orientation or undulation in hidden layers
Detection of missing bundles or wrinkles Defect detection in multiple layers Displacement of fiber bundles
QUALITY ASSURANCE SYSTEMS
EddyCus® TF inline ex-vacuo
EddyCus® TF lab
EddyCus® TF inline in-vacuo
₊ Non-contact ₊ Coupling-media free ₊ Penetration of several layers ₊ Planar and slant structures (CF map 2,5D)
Determining Crack ( I )
Finger Failure ( II )
Inhomogeneities ( III )
I
II
IV
V
III
Deposition effects ( IV )
Impurities ( V )
APPLICATIONS
Backside-metallization Frontside electrodes
Doped layers and materials Other functional conductive
layers
APPLICATIONS
Mapping of surface conductivity Detection of surface flaws e.g. delamination, cracks,
impurities Evaluation of homogeneity and quality of coatings Topography, surface roughness
Float-glass/Architectural glass
Photovoltaic cells Touch screens and flat
monitors
OLED applications Smart-glass applications Transparent antistatic foil Deicing and heating
applications
APPLICATIONS
SHEET RESISTANCE MEASUREMENT, CONDUCTIVITY MAPPING & DEFECT IDENTIFICATION
BY EDDYCUS® TF MAP SERIES
Mapping of sheet resistance of thin-films on glass and foils
Mapping and characterization structured thin-films
Homogeneity mapping and error detection e.g. impurities and cracks
Sheet resistance measurement of conductive layers on non-conducting substrates
Sheet resistance measurement of multilayer systems on request (feasibility study)
Layer thickness measurement of conductive layers with nanometer resolution (sigma = constant)
Substrate thickness measurement of low- and high conductive foils
Characterization of other conductivity related parameter
MAPPING SHEET RESISTANCE & DETECTING DEFECTS BY
EDDYCUS® TF MAP SERIES
The eddy current sensor induces an electromagnetic field that is determined by the sensor characteristics and its parameterization. If a conductive object is positioned within this field eddy currents are induced within this sample. This eddy currents cause a field change that is quantified by the very sensitive sensors and referred to physical parameters by algorithms. This technology is highly useful for non-contact fully automated testing solutions for tasks that affect local electric and dielectric properties.
We offer advanced eddy current testing technology with a wide frequency range from 10 kHz to 100 MHz to achieve different sensitivities and penetrations depth. It is combined with different sensor concepts depending on the application and equipped with a user-friendly software for fast real-time evaluation.
COMPANY SURAGUS offers systems for quality assurance and process monitoring of structured and unstructured functional layers, carbon fiber materials and classic conductive materials. The used eddy current method utilizes local conductivity and its variation in test objects for the characterization of correlated quality characteristics such as thickness, sheet resistance, conductivity, homogeneity and purity or physical changes.
TECHNOLOGY
QUALITY MANAGEMENT
For a technology company, the continuous development and improvement of products and services is granted. This also applies to our quality management system. It meets the demands of the international standard DIN EN ISO 9001:2008.
EDDYCUS® MAPPING SOLUTION
EDDYCUS® SINGLE POINT AND LINE MONITORING SOLUTIONS
EddyCus® map Series
EddyCus® map 2.5D Series
Sheet resistance mapping of sprayed Silver Nanowires
Eddy Current Mapping (automated high resolution non-contact C-Scan)
4-Point Probe Measurement (manual in contact)
IN- AND OFFLINE SHEET RESISTANCE MONITORING BY
EDDYCUS® TF LAB AND INLINE SERIES
Magnetic field Eddy currents
Eddy current sensor
Sample
Defect
INTERNATIONAL SALES PARTNERS
www.costar.co.kr Korea
www.beijingec.com China
www.scientek.com.tw Taiwan
Singapore, www.gaiascience.com.sg Malaysia and Indonesia
PLEASE CONTACT US TO DISCUSS YOUR TESTING TASK.
CONTACT
SURAGUS GmbH – Sensors and Instruments Maria - Reiche - Strasse 1 D-01109 Dresden Germany +49 0351 - 273 598 01 [email protected] | www.suragus.com