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E bli P Effi i D i Enabling Power Efficient Designs Apache’s Power Noise Simulation T h l i Technologies Aveek Sarkar VP of Support © 2011 ANSYS, Inc. August 25, 2011 1 Apache Design Inc, A whollyowned subsidiary of ANSYS

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E bli P Effi i D iEnabling Power Efficient DesignsApache’s Power Noise Simulation T h l iTechnologies

Aveek SarkarVP of Support

© 2011 ANSYS, Inc. August 25, 20111

Apache Design Inc, A wholly‐owned subsidiary of ANSYS

Trends in Today’s Electronic Designs

LowLow--powerpower HighHigh--speedspeedIntegrationIntegration

• Multi-VDD• Power

Gates

• Multi-VDD• Power

Gates• GHz+• Multi-Core • GHz+• Multi-Core

• IP, memories

• Mixed i l

• IP, memories

• Mixed i l• Clock

Gating• Clock

Gating• DDR3+• DDR3+signal

• Stacked diesignal

• Stacked die

Handset Mobile Processors

~ 2.5GHz+

Data Center Processors

~ 3.5GHz+

© 2011 ANSYS, Inc. August 25, 20112

Trends in Today’s Design Technologies

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Wire Re

liability

sign

 Com

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sign

 Com

plexit

sign

 Com

plexit

W

Des

Des

Des

esign   

esign   

esign   

ance

ance

ance

Package De

Package De

Package De

I/O Perform

I/O Perform

I/O Perform

© 2011 ANSYS, Inc. August 25, 20113

Impact of Increasing Design Integration

Switching

PowerPowerStandby

Noise CouplingNoise Coupling

Performance

ESD

p gp gFunctionality

ReliabilityReliability

ESD

EM

© 2011 ANSYS, Inc. August 25, 20114

Apache’s Focus Areas

Power BudgetingPower Budgeting

Low power need is ubiquitous

Energycosts

Batterylife

InterferenceEnergyefficiency

PowerPower--Induced Induced NoiseNoise

Unintentional electrical interference

Power Delivery IntegrityPower Delivery Integrity

Right place, right time, right amount

© 2011 ANSYS, Inc. August 25, 20115

Apache’s Power Flow

Architectural Level SimulationPowerArtist™

• Early power simulation• Power reduction

IC Physical Design Simulation • Design prototypingRedHawk/Totem™ • Sign‐off validation

System Integration SimulationSentinel™ / SiWave™

• SI, PI, EMI, Thermal• Co‐verification and optimization

© 2011 ANSYS, Inc. August 25, 20116

Simulation Driven Power Budgeting

Get maximum savings for the Get maximum savings for the t bl i tt bl i t

Power savings saturate here!

acceptable area impactacceptable area impact

Maximum Maximum acceptable acceptable area area impact?impact?

Power vs. Area trade-off: Min area impact for ~Max savings

Power Savings

377k instances, 350MHz, 90nm

Power SavingsArea Impact

© 2011 ANSYS, Inc. August 25, 20117

Simulation Driven Power Budgeting

RTL stage power analysisEarly prediction and design prototyping

RTL Design y p g p yp gg

Power Track power through design processPower Budgeting

p g g p

Physical Design

System I t ti

© 2011 ANSYS, Inc. August 25, 20118

Integration Consistency in power budgeting

Simulation Driven “Power Bug” Isolation

• Multi‐core (4) designr r r ( ) g• Not all four cores operational at 

any one time 

Logic

RegisterLogic

RegisterLogic

Register

• Assuming only first core is operational, rest are shut‐off

• Typically clock is shut off for 

Logic

RegisterLogic

RegisterLogic

Register

non‐active blocksLogic

RegisterLogic

RegisterLogic

Register

• But data continues to come inL i ti t b

Logic

RegisterLogic

RegisterLogic

Register

• Logic continues to burn power

PowerArtist Identified this “Power Bug”Reducing Power by 22% PowerArtist Identified this “Power Bug”Reducing Power by 22% 

© 2011 ANSYS, Inc. August 25, 20119

g yg y

Power Noise IntegrityI t f L P T h i

Multiple Voltage Islands

Impact of Low Power Techniques

Multiple Voltage Islands

• 100+ VDD/VSS domains

• No re‐distribution or plane sharing

Power Gating

• Disrupts continuity of PDN

• ‘Over‐design’ = large cost

On‐chip Voltage Regulators (LDO)

• Non‐ideal voltage supply

© 2011 ANSYS, Inc. August 25, 201110

• Stability and noise immunity

Power Noise IntegrityI t f T h l Mi tiImpact of Technology Migration

Source: Mezhiba et al. Scaling Trends of On‐Chip Power Distribution NoiseITRS, Trends in technology scaling

Higher impact of inductive noise Ldi/dtHigher drive strength devices di/dt Higher impact of inductive noise  Ldi/dtHigher drive strength devices  di/dt

But … noise margin continues to reduce 

• Reduced FMAX

• Functionality failures

• Over‐design requirements

© 2011 ANSYS, Inc. August 25, 201111

Over design requirements

RedHawk Power Noise Analysis Flow

• CAD design flow independent• Operate on industry standard formats:Design Import

PG Extraction• Only solution for on‐die ‘L’ extraction and simulation• Silicon validated down to 28nm and beyondy

• Pico‐second resolution, native multi‐domain• Best‐in‐class performanceSimulation p

Root Cause  • Enable automatic and user guided debug

Identification • Interactive ‘what‐if’ and incremental simulation

• Single step model creation out of RedHawk

© 2011 ANSYS, Inc. August 25, 201112

Single step model creation out of RedHawk• Multi‐domain, distributed and coupled

Chip Power Model 

RedHawk Power Noise Analysis Coverage

Core Noise Core ↔ I/O Core ↔ Analog

PLLnoise so rce

Scenario 3Scenario 2

guard ring

source victim

Scenario 1

• Multi‐core switching• Power gate turn‐on/off

• I/O , core SSO• Irregular bump, package

• High‐speed digital• Insufficient isolation

© 2011 ANSYS, Inc. August 25, 201113

Addressing Customer’s Market Needs

“Accurate pre‐silicon power delivery simulations are an 

essential tool to predict the 

Exploding design and 

k

impacts of tester and system 

power delivery performance on

silicon frequency andmask costs

f q y

reliability.” 

Dr. M. Pant, Lead technologist and power delivery architect, Xeon and Itanium server products

GSA Global “Electronic System Design Considerations to Meet Emerging Market Needs”

© 2011 ANSYS, Inc. August 25, 201114

Apache’s Power Tools

Architecture IP SoC Package PCB

Power Budgeting

Power Delivery Integrity

© 2011 ANSYS, Inc. August 25, 201115

Power‐Induced Noise