XRF in the hands of scientists

EPSILON 1 ACADEMIA

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Looking for a flexible, yet simple-to-use, analytical instrument for research and education?The Epsilon 1 X-ray fluorescence spectrometer is an ideal addition to any institution’s analytical equipment. It is capable of simple element identification and quantification up to more sophisticated analyses. It can serve to introduce students to an analytical technique widely used in industry for production and quality control, but often neglected in the classroom. If you want to liven up your college and university classes or enhance your serious cutting-edge research, the Epsilon 1 is an easy-to-operate, compact and X-ray safe instrument without the need for additional chemicals.

Epsilon 1 can be used for educating students in lab practicals and for research activities in a variety of disciplines, for example: chemistry, geology, archeology, environmental sciences, material sciences and forensics. Epsilon 1 allows screening and quantification by XRF for an unlimited number of applications for many types of samples. With little to no sample preparation, bulk samples can be quantified across the periodic table.

Epsilon 1’s software has the flexibility to perform basic to more sophisticated analyses; such as determinations of layer thickness and composition of metals and coatings. Or carry out cluster analysis based on PCA (Principal Component Analysis) of spectral X-ray fingerprints of a wide variety of materials e.g. drugs, coins, animal feed and much more.

The instrument is pre-calibrated with Omnian, Malvern Panalytical’s market-leading standardless analysis package, used on the more advanced instruments. As an out-of-the-box solution Omnian can be used to analyze a wide variety of sample compositions from sodium to americium across the periodic table.

Malvern Panalytical has a strong reputation for safe and high-end X-ray instrumentation. Epsilon 1 is built using our market-leading technology with superior quality, worldwide service and application support. Application training courses and expertise are available on request.

THE TOTAL SOLUTION CONSISTS OF

• An Epsilon 1 XRF instrument with flexible user software• Factory pre-calibration for Omnian standardless

analysis• A validation sample• A starting kit for preparing the first 100 liquid cups for

liquid and loose powder analysis

RESEARCH AND EDUCATIONFlexible elemental analysis

Validation samplePreparation tool Liquid cupsSample preparation foils

2

4

Easy sample preparation

Simple to operate

READY FOR ANY SAMPLE

Liquids, loose powders and solids

Enter sample name and push ’measure’ button.Place your sample for measurement.

CONVENIENT RESULTS VIEWING

MEASURE IN YOUR OWN LANGUAGETen most common languages are available for the operator:

测量 Measure 測定 Mesurer Messung Mesure Zmierzyć Medida Измерить Médir

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Epsilon 1 can handle a large variety of sample types, weighing a few 100 milligrams, to larger bulk samples: solids, pressed powders, loose powders, liquids, fused beads, slurries, granules, films and coatings. Also large and irregularly shaped objects with maximum dimensions of 15 x 12 x 10 cm (W x D x H) can be analyzed.

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CLOSE-UPSThe Epsilon 1 is a fully integrated energy dispersive XRF analyzer consisting of a spectrometer, built-in computer and analysis software. Powered by the latest advances in excitation and detection technology, the Epsilon 1 is a star performer in the low-cost benchtop instrument class. A well-designed optical path, a wide range of excitation capabilities ranging from 7 to 50 kV for light and heavier elements and a highly sensitive SDD detector system contribute to the Epsilon 1’s uniqueness.

Self-contained systemBuilt-in computer running Microsoft Windows 10 with a powerful CPU and 120 GB hard drive ensures flexibility to store and handle thousands of results.

Repeatability for yearsA low-drift X-ray tube and a handy drift correction routine give compliant results for years without the need for time-consuming re-calibration.

Maximum sensitivityThe thin-window Ag anode X-ray tube, designed and manufactured by Malvern Panalytical, ensures high quality and sensitivity. The selection of Ag anode material is ideal for the accurate quantification of P, S and Cl without interference of possible line overlaps in the XRF spectrum, leading to more reliable results. The 50 kV X-ray tube and generator are ideal for exciting heavier elements, resulting in faster analysis times.

Spillage protectionIn order to shield the delicate heart of the system from spillage, a protection foil is in place. In case of spillage, the foil can be replaced easily by the operator.

Economical footprintCompact design with a built-in computer and touchscreen reduces the requirement of valuable lab space to less than 0.15 m2.

Easy operationHigh-resolution (1024 x 768), 10.4” LCD touchscreen for easy walk-up and operation.

Liven up your lecturesUSB and network connections for use of standard computer peripherals enable extended use, application development, seated operator or overhead projection during lectures.

Best accuracyHighly concentrated samples can cause detector saturation resulting in lower accuracy or longer measuring times. Epsilon 1 uses the latest in silicon drift technology in combination with the fastest electronics (1.5Mcps @ 50% dead time) to handle these highly concentrated samples without any loss of accuracy or increased measuring times.

Atmospheric variationsLow-energy X-ray photons characteristic of sodium, magnesium, aluminium, silicon, phosphorus and sulfur are sensitive to air-pressure and temperature variations. Built-in temperature and air-pressure sensors compensate for these atmospheric variations, ensuring excellent results whatever the weather.

Sample positioning Highly repeatable sample positioning reduces sample-to-sample variations.

Safety guaranteedEpsilon 1 complies with the latest Machinery Directive, CSA, IEC, EMC, Vollschutz norms and standards for protection and radiation safety to guarantee a safe instrument for the operator.

H

Na

K

Rb

Fr

Li

He

Ne

Ar

Kr

Xe

Cs

Ra

Ba

Be

Mg

Ca

Sr

Sc

Y

Ti

Zr

V

Nb

Cr

Mo

Mn

Tc

Fe

Ru

Co

Rh

Ni

Pd

Cu

Ag

Zn

Cd ITe

Ga Ge As Se Br

Al Si P S Cl

B C N O F

In Sn Sb

RnAtPoBiPbTlHgAuPtIrOsReWTaHf

La Ce Pr Nd Pm Sm Eu Gd Tb Dy Ho Er Tm Yb Lu

Ac Th Pa U LrNoMdFmEsCfBkCm

RgDsMtHsBhSgDbRf

AmPuNp

Z

Z

1

1.008

11

22.990

19

39.098

37

85.47

87

(223)

3

6.941

2

4.003

10

20.180

18

39.948

36

83.80

54

131.29

55

132.905

88

226.02

56

137.33

4

9.012

12

24.31

20

40.08

38

87.62

21

44.96

39

88.906

22

47.88

40

91.22

23

50.94

41

92.91

24

52.00

42

95.94

25

54.94

43

(98)

26

55.85

44

101.1

27

58.93

45

102.95

28

58.69

46

106.4

29

63.55

47

107.87

30

65.39

48

112.41

53

126.90

52

127.60

31

69.72

32

72.61

33

74.92

34

78.96

35

79.904

13

26.98

14

28.09

15

30.974

16

32.066

17

35.453

5

10.81

6

12.011

7

14.007

8

15.999

9

18.998

49

114.82

50

118.71

51

121.75

86

(222)

85

(210)

84

(209)

83

208.98

82

207.21

81

204.38

80

200.59

79

196.97

78

195.08

77

192.2

76

190.2

75

186.2

74

183.85

73

180.95

72

178.49

57

138.91

58

140.12

59

140.91

60

144.24

61

(145)

62

150.36

63

151.97

64

157.25

65

158.93

66

162.50

67

164.93

68

167.26

69

168.96

70

173.04

71

174.97

89

(227)

90

232.04

91

231.04

92

238.03

103

(260)

102

(259)

101

(258)

100

(257)

99

(252)

98

(251)

97

(247)

96

(247)

111

(281)

110

(281)

109

(278)

108

(270)

107

(270)

106

(269)

105

(270)

104

(267)

OgTsLvMcFlNhCn118

(294)

117

(293)

116

(293)

115

(289)

114

(289)

113

(286)

112

(285)

95

(243)

94

(244)

93

237.05

L

A

L

A

Possible to analyze with Epsilon 1

Not possible to analyze with Epsilon 1

ADVANTAGES OF XRF

• Unmatched analytical precision and accuracy compared to other analytical techniques

• Quickquantificationmethod

• Simple, fast and safe sample preparation

• Non-destructive analysis

• Wide analytical concentration range (ppm – %) reducing the necessity for dilution and associated errors

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ROBUST AND FLEXIBLE QUANTIFICATION OF ANY SAMPLEFor characterization and analysis of samples where the composition is unknown, or in situations where certified standards that match specific sample characteristics are not available, Malvern Panalytical’s Omnian package is an ideal solution.

Important applications include sample quantification, screening, failure analysis, troubleshooting, as well as the comparison of different materials. The following data show some representative results obtained using Epsilon 1 with Omnian standardless analysis.

Low alloy steel• SS 402 standard• Iron (Fe) as balance

SS 402

Element Certified conc.(wt %)

Measured conc.(wt %)

Si 0.27 0.29 P 0.006 0.007 S 0.023 0.040 V 0.22 0.23 Cr 0.55 0.58 Mn 0.19 0.23Ni 0.73 0.74 Cu 0.23 0.23 Mo 0.16 0.15

Polyethylene• 4 mm thick NIST 2855 level II standard• CH2 as balance

NIST 2855 level II

Element Certified conc.(ppm)

Measured conc.(ppm)

Si 186.7 215.2P 22.0 17.1S 21.0 21.7Ca 37.6 34.2Ti 10.4 10.2Cr 2.4 4.4Zn 415 466.7

Pharmaceutical excipient• Cellulose standard, prepared as 5 g pressed pellet• C6H10O5 as balance

PharmaCAT PGM-QC

Element Certified conc.(ppm)

Measured conc.(ppm)

Ru 50 50Rh 50 48Pd 50 49Ir 50 59Pt 50 58

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Pass/Fail analysis

FINGERPRINT

The FingerPrint option is available for material characterization and PASS/FAIL analysis. It is ideal for material testing when analysis speed is important but the actual composition is not of interest.

FingerPrint generally involves little to no sample preparation and the unknown sample is compared against a library of standards or other in-house samples. Then the closest match is reported with a level of uncertainty.Principal components analysis (PCA) in combination with cluster analysis are powerful tools to investigate materials by setting up automated fingerprinting applications. With this tool also 3D graphical visualization of the data set is possible.

Advanced algorithms perform all the hard work. PASS/FAIL criteria can be set up according to different approaches that give flexibility in tailoring a fingerprinting method.

The Stratos module features an algorithm which enables simultaneous determination of chemical composition and thickness of layered materials. The software provides a rapid, simple and non-destructive means of analyzing coatings, surface layers and multi-layered structures.

Accurate results are achieved by using conventional bulk standards, or reference samples whose composition and layer structure differ from those of the unknowns.

This solves one of the biggest issues of multi-layer analysis: acquiring expensive certified multi-layer standards that match the production samples.

Moreover, accuracy can be further improved by adding in-type standards to the main calibration by using Adaptive Sample Characterization (ASC). The Virtual Analyst in the software can model the fluorescent response of the sample based on a nominal sample definition and gives the optimal settings for analysis.

ENHANCE YOUR RESEARCHOMNIAN ADVANTAGES

The right result every time• Advanced technology for

robust results• Precise results for almost any sample

using the default setup• Accuracy and detection enhancement

with ASC and selected peak measurements

Easy to use• Scaleable from routine

to advanced usage• Easy data retrieval

Problem solving power for your analytical challenges• Quantitative analysis • Batch and materials control• Quick screening• R&D analysis tool• Failure analysis• Comparative analysis

FINGERPRINT

STRATOS

The Epsilon 1 software consists of two user levels with explicit functionality:1. Operation mode - for simple operation and convenient results viewing2. Advanced mode - for full flexibility and access to all features in the software. In this software mode, an unlimited number

of applications can be created.

Two software options are available to further enhance the capabilities of Epsilon 1: FingerPrint and Stratos modules.

Multi-layer analysis

STRATOS

10

Grovewood Road, Malvern, Worcestershire, WR14 1XZ, United Kingdom

Tel. +44 1684 892456Fax. +44 1684 892789

Lelyweg 1, 7602 EA Almelo, The Netherlands

Tel. +31 546 534 444Fax. +31 546 534 598

info@malvernpanalytical.comwww.malvernpanalytical.com

MALVERN PANALYTICAL

WHY CHOOSEMALVERN PANALYTICAL? Malvern Panalytical provides the global training, service

and support you need to continuously drive your analytical processes at the highest level. We help you increase the return on your investment with us, and ensure that as your laboratory and analytical needs grow, we are there to support you.

Our worldwide team of specialists adds value to your business processes by ensuring applications expertise, rapid response and maximum instrument uptime.

• Local and remote support• Full and flexible range of support agreements• Compliance and validation support• Onsite or classroom-based training courses• e-Learning training courses and web seminars• Sample and application consultancy

We are global leaders in materials characterization, creating superior, customer-focused solutions and services which supply tangible economic impact through chemical, physical and structural analysis.

Our aim is to help you develop better quality products and get them to market faster. Our solutions support excellence in research, and help maximize productivity and process efficiency.

Malvern Panalytical is part of Spectris, the productivity-enhancing instrumentation and controls company. www.spectris.com

SERVICE & SUPPORT

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