EPSILON 4FOOD & ENVIRONMENT

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TRUST YOUR PRODUCT QUALITY

Analyze accurately and frequently

Growing populations increase the need for a better handling of our earth’s resources. The Epsilon 4, an energy dispersive X-ray fluorescence (EDXRF) spectrometer, is a powerful analytical tool that can obtain useful elemental information to maximize crop growth and ensure product and environmental safety.

Epsilon 4’s value for Food & Environment

• Suitableforwiderangeofsampletypes:airfilters,liquids, powders

• Low cost of ownership

• Lowinfrastructuralrequirements,idealforat-lineanalysis

• Ready for any sample using standardless solution Omnian

• Simple,fastandsafesamplepreparation

• Non-destructiveanalysis

• AnalysisfromCarbontoAmericium,fromsub-ppm’sto100wt%concentrations

ISO18227,ISO15309andASTMC1255

Animal FeedControl nutrients in animal feed accurately to keep cattle healthy and minimize manure greenhouse gasses. Nutrient quality analysis

Frequent and accurate analysis during production processes, for example the addition of nutrients in milk powder, ensures product quality and consistency

Thelatestadvancesinexcitationanddetectiontechnology in Epsilon 4 opens possibilities for challenging applications that are traditionally performed by ICP and AAS.SwitchingfromICPtoEDXRFsignificantlyreducestheuseofconsumables,utilitiesandtime.DiscoverhowelementalanalysiswithEpsilon4addsvaluetothefoodproduction process.

Soil & Fertilizer analysisAnalyze the soil and match fertilizers to optimize growth conditions for crops. Also assuretherearenotoxicelementsaffectingthe crops. Total salt concentration

analysis (Na, Cl, K)Derive NaCl content in food in one measurement.

Toxic element screeningUse Epsilon 4's high sensitivity to screen for toxic elements in raw materials and food products.

Air QualityMonitor the elemental composition of particle matter in ambient air, while complying to international norms

EPAIO3.3,EN14902,HJ829-2017

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ACCURATE AND NORM COMPLIANT TRACE ANALYSIS AIR FILTERS AND SOILS

Table 1. Accuracy and repeatability results obtained by measuring a soil standard GSS8 five times, consecutively.

Epsilon4canaccuratelyquantifymanyelementsdowntotracelevelconcentrationsaccordingtostringentinternationaltestmethodsandnorms,likeEPAIO-3.3forparticlesonairfilters.Belowaretwoapplicationexamplesthatdemonstratetheanalytical capability of Epsilon 4.

Elemental analysis of air filters according to US EPA method IO-3.3Detectionlimitsareanimportantmeasureofaninstrument’sperformance.Thedetectionlimits(LLD)forthisapplicationwerecalculatedfrom20replicatemeasurementsofablanksampleandarebasedon1sigma(asspecifiedinmethodIO-3.3). Figure 1showsacomparisonbetweentheLLDvaluesreportedintheEPAmethodandtheLLDvaluesobtainedbyEpsilon4,in45minutes.AllLLDvaluesaresmallerthantheEPAlimits.

Elemental analysis of nutrients and toxic elements in soilsTwenty-sixcertifiedsoilsamples,measuredaspressedpellets,wereusedfortheapplicationset-upofEpsilon4.Totesttheaccuracyandprecisionofthemethod,oneChinesesoilstandardGSS8wasmeasuredfivetimesconsecutively.Thecertifiedandaveragemeasuredconcentrations,togetherwiththestandarddeviations,arepresentedinTable 1,demonstratingexcellentaccuracyandprecision,in30minutesmeasuringtime.

Elements & Compounds

Certified values

(mg/kg)

Results ±std dev(mg/kg)

Elements & Compounds

Certified values

(mg/kg)

Results ±std dev(mg/kg

Elements & Compounds

Certified values

(mg/kg)

Results±std dev (mg/kg)

Na2O (%) 1.72 1.33 ± 0.02 Fe2O (%) 4.48 4.35 ± 0.01 Nb 15 14.2 ± 0.1MgO (%) 2.38 2.28 ± 0.01 Co 12.7 12.2 ± 0.1 Mo 1.16 1.06 ± 0.08Al2O3 (%) 11.92 12.10 ± 0.02 Ni 31.5 31.1 ± 0.4 Cd 0.13 < 1SiO2 (%) 58.60 54.84 ± 0.05 Cu 24.3 22.0 ± 0.3 Sn 2.8 2.0 ± 0.3P2O5 (%) 0.18 0.18 ± 0.01 Zn 68 59.6 ± 0.3 Sb 1.04 1.1 ± 0.4SO3 (%) 0.03 0.05 ± 0.01 Ga 14.8 16.9 ± 0.2 Ba 480 499 ± 2K2O (%) 2.42 2.35 ± 0.01 As 12.7 12.6 ± 0.2 Ce 66 60 ± 6CaO (%) 8.27 8.30 ± 0.01 Br 2.6 2.6 ± 0.1 W 1.7 1.9 ± 0.3

Ti 3837 3625 ± 4 Rb 96 95.5 ± 0.1 Pb 21 19.1 ± 0.2V 81.4 83.1 ± 1.4 Sr 236 227.3 ± 0.2 Bi 0.3 1.1 ± 0.1Cr 68 72.1 ± 0.8 Y 26 24.6 ± 0.1 Th 11.8 11.7 ± 0.4

MnO (%) 0.08 0.08 ± 0.01 Zr 229 227.7 ± 0.5 U 2.7 11.5 ± 0.4

0.1

1.0

10.0

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LLD

NG

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Epsilon 4 EPA LLDs

Figure 1. Comparison between the LLDs obtained using the Epsilon 4 and the required LLDs of the EPA 10-3.3 method

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Combining the latest excitation and detection technology and smart design, the analytical performance of Epsilon 4 approaches that of more powerful and floor-standing spectrometers. Selective excitation and careful matching of the X-ray tube output to the capabilities of the detection system underlie the system’s outstanding performance.

Reduce helium consumptionThehighperformanceofEpsilon4enablesmanyapplicationstobeoperatedinairatmosphere,withoutlongeroverheadtimeandcostsinvolvedforheliumormaintenanceofvacuumsystem.Whenmeasuringinair,low-energyX-rayphotonscharacteristicofsodium,magnesiumandaluminum,aresensitivetovariationsinair-pressureandtemperature.Built-intemperatureandair-pressuresensorscompensatefortheseenvironmentalvariations,ensuringexcellentresultswhatevertheweather.

Calibrated for yearsAlow-driftX-raytubeandanautomaticdriftcorrectionsystemgivecompliantresultsforyearswithouttheneedforre-calibration.Thisresultsinamoreefficientuseofthesystem and less cost of calibration maintenance.

Online remote support IntheunlikelyeventoftheEpsilon4needingspecialistattention,anon-linediagnosticfacilityisavailableinthelocalservicecenters.Problemscanbediagnosed,andinmanyinstancescorrected,directlyon-line.Thissignificantlyreducessystemdowntimeandcutsmaintenance costs to a minimum.

Accurate resultsOuruniquehigh-performance,metal-ceramicX-raytube,specificallydesignedandmanufacturedforEpsilon4,ensureshighqualityandreliableresults.Flexiblevoltagesettingsfrom4.0to50kVandamaximumcurrentsettingupto3.0mAcanbeusedtodefineapplication-specificexcitationconditionsthatoptimizetheperformanceacross the periodic table.

Ultimate light-elemental performanceWiththeoptionalSDDUltradetector,Epsilon4enablesultra-lightelementanalysisofevencarbon,nitrogenandoxygen.

Quality results through mature softwareAccurate and precise results are obtained through advancedspectrumprocessingandstate-of-the-artcorrectionandquantificationalgorithms.

Safety guaranteedEpsilon4complieswiththelatestMachineryDirective,CSA,IEC,EMC,Vollschutznormsandstandardsforprotection and radiation safety to guarantee a safe instrument for the operator.

Unattended operationTheuniquecombinationofa10-positionremovablesample changer with spinner enables the automatic processing of sample batches without the need for operator attention. Continuous rotation of the sample duringmeasurementminimizesanyerrorscausedbynon-homogeneityorsurfaceirregularitieswithinindividualsamplesandprovidesmoreaccurateresults.Automatictransferofdatatoacentrallocationgivesyouaccesstothe latest results.

Fast and sensitiveFastmeasurementsareachievedbyusingthelatestsilicondriftdetectortechnologythatproducessignificantlyhigher intensities.

Uniquedetectorelectronicsenablealinearcountratecapacitytoover1,500,000 cps(with50%deadtime)anda count rate independent resolution typically better than 135eVforbetterseparationofanalyticallinesinthespectrum.ThisallowstheEpsilon4spectrometertorunatfullpowerand therefore realizes a much higher sample throughput compared to traditional EDXRF benchtop instruments.

THE POWER OF BENCHTOP XRF SYSTEMS

Ten times higher intensities for arscenic obtained with Epsilon 4, in comparison with its predecessor Epsilon 3XLE

Epsilon 4 - Highly flexible analytical tools suitable for a wide range of applications:

• 10-watt version - used for elemental analysis (F - Am) in areas from R&D through to process control

• 15-watt version - used for higher sample throughput with improved and extended light element capabilities (C - Am)

• 15-watt version – used for higher sample throughput in challenging environments (F – Am)

H

Na

K

Rb

Fr

Li

He

Ne

Ar

Kr

Xe

Cs

Ra

Ba

Be

Mg

Ca

Sr

Sc

Y

Ti

Zr

V

Nb

Cr

Mo

Mn

Tc

Fe

Ru

Co

Rh

Ni

Pd

Cu

Ag

Zn

Cd ITe

Ga Ge As Se Br

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Possible with Epsilon 4 and optional detector

Not possible to analyze with Epsilon 4

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FAST, REPRODUCIBLE ANALYTICAL METHOD

TAILORED SOLUTIONS THROUGH EXPERTISEExperienced Malvern Panalytical staff work in close cooperation with you to provide not only training but also tailored analytical programs and procedures, balancing throughput and accuracy while minimizing set-up and running costs.

AccesstotherightcalibrationsamplesiskeyinXRF.MalvernPanalyticalhelpsinobtainingorcreatingthestandardsyouneed.Weprovidetotalsolutionsincludingstandardsforseveralkeyapplications.Wecanalsogeneratesuitesofin-housestandardsbycertifyingyourmaterialsthroughourISO17025certifiedlaboratory.

Compared to other analytical techniques XRF requires little or no sample preparation

XRF is an ideal means of determining the chemical compositionofallkindsofmaterials.MeasurementsinEpsilon4arecarriedoutdirectlyonthesolidmaterial(orliquid)withlittletonosamplepreparation.Thereisnoneedforanydilutionordigestionand therefore no disposal of chemical waste.

Epsilon4spectrometerscanhandlealargevarietyofsampletypesweighingfromafewmilligramstolargerbulksamples. Samples can be measured as:• Solids• Pressed powders• Loose powders• Liquids• Fused beads• Slurries• Granules• Filters• Films and coatings

Our aim is to make Epsilon 4 an essential part of your elemental analysis

Theaddedvalueforyouiswhatdrivesus:• Thelargestsupportnetworkintheindustry• Trainingprogramscustomizedtoyourneeds• Reference materials • Certified reference materials (CRMs) • Synthetic reference materials tailored to your

requirements• Analyticalservices • Certify your samples through our ISO 17025 certified laboratory• Consultancy • Norm compliance • Laboratory information management • Process automation • standard operating procedures • Interlaboratory standardization

LIQUIDS SOLIDS AIR FILTERS POWDERS

Samplepreparation,althoughtypicallystraightforwardforXRF,isanimportantfactorintheoverallanalyticalprecision and accuracy. Sample preparation needs to be quick,robustandreproducible,andthechoiceofsamplepreparationtechniquestartswithyourrequirementsandmaterials.

CombineXRFwiththeanalyticalsolutionsMalvernPanalyticaloffers,likenearinfraredspectroscopy,particlesizeanalysisandX-raydiffraction.Ourexpertscanadviseyouwhichapproachsuitsbestgivenyourmaterialtypesandanalyticalrequirements.

TapintoourknowledgenetworkthroughourglobalExpertiseCenterstooptimizeyourcompleteanalyticalprocess,includingsamplepreparationmethodsandequipment.

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ENHANCE YOUR ANALYSIS THROUGH SOFTWARE OPTIONSFiveindustrysoftwareoptionsareavailabletofurtherenhancethecapabilitiesofEpsilon4:Omnian,Stratos,Oil-Trace,EnhancedDataSecurityandFingerPrint.

Thesededicatedoptionsaddnewfunctionaldimensionstobenchtopspectrometryandtakethehardworkoutofregulatory compliance.

Elemental screening

OMNIANOur powerful Omnian software is ideal when there is no conventionalcalibrationestablishedformaterialsthatrequireanalysis.Whenfacedwithnon-routinesamplesormaterialsforwhichtherearenocertifiedreferencematerials,Omnianprovidesexcellentinsightintotheelemental composition. Designedtoprovidefastandreliablequantification,Omnian’sadvancedfundamentalparameters(FP)algorithmautomatically deals with the analytical challenges posed by samplesofwidelydifferingtypes.

Enhanced data security

AUDIT TRAILSOFTWARE

Pass/Fail analysis

FINGERPRINT?OMNIAN OIL-TRACE STRATOS FINGERPRINT DATA SECURITY

! ?OMNIAN OIL-TRACE STRATOS FINGERPRINT DATA SECURITY

!

?OMNIAN OIL-TRACE STRATOS FINGERPRINT DATA SECURITY

!

TheenhanceddatasecuritysoftwareoptionisdesignedforGMPandGLPenviroments,andenablestheusertocomplywithFDA21CFRPart11.Thesoftwareincludeseveryfeaturerequiredtosatisfythestrictenvironmentalprotocols,likemultiplesecuritylevels,loginwithuseridentification,reportingofdateandtime,resultsstoring,extensiveaudittrailsandLIMSintegration

FingerPrintisamaterialtypeconfirmationroutinethatuses a rapid statistical analysis of the spectrum for a simple PASS/FAIL answer. Spectra used for the FingerPrint routinecanalsobeusedforconventionalcompositionaldetermination for a more complete diagnostic analysis.

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www.panalytical.com/epsilon4

MALVERN PANALYTICALGrovewoodRoad,Malvern,Worcestershire,WR141XZ,United Kingdom

Tel.+441684892456Fax.+441684892789

Lelyweg1,7602EAAlmelo,Netherlands

Tel.+31546534444Fax.+3154534598

info@malvernpanalytical.comwww.malvernpanalytical.com

WHY CHOOSEMALVERN PANALYTICAL?

SERVICE & SUPPORT MalvernPanalyticalprovidestheglobaltraining,serviceandsupportyouneedtocontinuouslydriveyouranalyticalprocessesatthehighestlevel.Wehelpyouincreasethereturnonyourinvestmentwithus,andensurethatasyourlaboratoryandanalyticalneedsgrow,wearetheretosupport you.

Ourworldwideteamofspecialistsaddsvaluetoyourbusinessprocessesbyensuringapplicationsexpertise, rapidresponseandmaximuminstrumentuptime.

• Local and remote support• Fullandflexiblerangeofsupportagreements• Complianceandvalidationsupport• Onsiteorclassroom-basedtrainingcourses• e-Learningtrainingcoursesandwebseminars• Sample and application consultancy

Wearegloballeadersinmaterialscharacterization,creatingsuperior,customer-focusedsolutionsandserviceswhichsupplytangibleeconomicimpactthroughchemical,physical and structural analysis.

Ouraimistohelpyoudevelopbetterqualityproductsandgetthemtomarketfaster.Oursolutionssupportexcellenceinresearch,andhelpmaximizeproductivityandprocessefficiency.

MalvernPanalyticalispartofSpectris,theproductivity-enhancinginstrumentsandcontrols company. www.spectris.com