IEEE NSS/MIC 2004

Electromagnetic PhysicsElectromagnetic Physics

http://cern.ch/geant4

The full set of lecture notes of this Geant4 Course is available at

http://www.ge.infn.it/geant4/events/nss2004/geant4course.html

IEEE NSS/MIC 2004

Electromagnetic packages in Electromagnetic packages in Geant4Geant4

Standard

Low Energy

Optical

Muons

Different modeling approach

Specialized according to particle type, energy scope

IEEE NSS/MIC 2004

Electromagnetic Electromagnetic physicsphysics

Multiple scattering BremsstrahlungIonisationAnnihilationPhotoelectric effect Compton scattering Rayleigh effectg conversione+e- pair productionSynchrotron radiationTransition radiationCherenkovRefractionReflectionAbsorptionScintillationFluorescenceAuger

High energy extensionsHigh energy extensions– needed for LHC experiments, cosmic ray experiments…

Low energy extensionsLow energy extensions– fundamental for space and medical applications, dark

matter and experiments, antimatter spectroscopy etc.

Alternative models for the same processAlternative models for the same process

energy loss

electrons and positrons , X-ray and optical

photons muons charged hadrons ions

All obeying to the same abstract Process interface: transparent to tracking

IEEE NSS/MIC 2004

Standard Electromagnetic PhysicsStandard Electromagnetic Physics

The training material of this section on Geant4 Standard Electromagnetic Physics has been

provided by Michel Maire (LAPP)

IEEE NSS/MIC 2004

Standard electromagnetic physics in Standard electromagnetic physics in Geant4Geant4

The model assumptions are:

The projectile has energy 1 keV

Atomic electrons are quasi-free: their binding energy is neglected (except for the photoelectric effect)

The atomic nucleus is free: the recoil momentum is neglected

Matter is described as homogeneous, isotropic, amorphous

IEEE NSS/MIC 2004

Compton scatteringCompton scattering

IEEE NSS/MIC 2004

Standard Compton scattering in Standard Compton scattering in Geant4Geant4

IEEE NSS/MIC 2004

conversionconversion

IEEE NSS/MIC 2004

Standard total cross section per atom in Standard total cross section per atom in Geant4Geant4

IEEE NSS/MIC 2004

IonisationIonisation

IEEE NSS/MIC 2004

Mean rate of energy lossMean rate of energy loss

IEEE NSS/MIC 2004

Fluctuations in energy lossFluctuations in energy loss

The model in Geant4The model in Geant4

IEEE NSS/MIC 2004

Production of Production of rays rays

2000 MeV electron, proton and in Al

IEEE NSS/MIC 2004

BremsstrahlungBremsstrahlung

Differential cross section

IEEE NSS/MIC 2004

Emission of energetic photons and Emission of energetic photons and truncated energy loss ratetruncated energy loss rate

1 MeV cut

10 keV cut

IEEE NSS/MIC 2004

LPM effectLPM effect

10 GeV e- in Pb, spectrum

LPM

IEEE NSS/MIC 2004

Multiple Coulomb scatteringMultiple Coulomb scattering

IEEE NSS/MIC 2004

Particle transport in Monte Carlo Particle transport in Monte Carlo simulationsimulation

IEEE NSS/MIC 2004

Multiple scattering in Geant4Multiple scattering in Geant4

More details in Geant4 Physics Reference Manual

IEEE NSS/MIC 2004

Cherenkov Cherenkov radiationradiation

Cherenkov emission from optical photons in Geant4

IEEE NSS/MIC 2004

Production of optical photons in detectors is mainly due to Cherenkov effect and scintillation

Processes in Processes in Geant4:Geant4:- in-flight absorption- Rayleigh scattering- medium-boundary

interactions (reflection, refraction)

Photon entering a light concentrator CTF-Borexino

Optical photonsOptical photons

IEEE NSS/MIC 2004

MuonsMuons1 keV up to 1000 PeV scale1 keV up to 1000 PeV scale simulation of ultra-high energy and cosmic ray physics High energy extensions based on theoretical models

45 GeV muons

IEEE NSS/MIC 2004

Direct e+e- pair creation by muonDirect e+e- pair creation by muon

IEEE NSS/MIC 2004

Photo Absorption Ionisation (PAI) Photo Absorption Ionisation (PAI) ModelModel

Ionisation energy loss distribution produced by pions, PAI model

3 GeV/c in 1.5 cm Ar+CH4

5 GeV/c in 20.5 m Si

Ionisation energy loss produced by charged particles in thin layersthin layers of absorbers

IEEE NSS/MIC 2004

Low Energy Electromagnetic PhysicsLow Energy Electromagnetic Physics

More information is available from the Geant4 Low Energy Electromagnetic Working Group web site

http://www.ge.infn.it/geant4/lowE/

IEEE NSS/MIC 2004

What isWhat isA package in the Geant4 electromagnetic packageA package in the Geant4 electromagnetic package– geant4/source/processes/electromagnetic/lowenergy/

A set of processes extending the coverage of electromagnetic A set of processes extending the coverage of electromagnetic interactions in Geant4 down to “interactions in Geant4 down to “low”low” energy energy– 250 eV (in principle even below this limit)/100 ev for electrons and photons– down to the approximately the ionisation potential of the interacting

material for hadrons and ions

A set of processes based on detailed modelsA set of processes based on detailed models– shell structure of the atom– precise angular distributions

Complementary to the “standard” electromagnetic packageComplementary to the “standard” electromagnetic package

IEEE NSS/MIC 2004

Overview of physicsOverview of physicsCompton scattering

Rayleigh scattering

Photoelectric effect

Pair production

Bremsstrahlung

Ionisation

Polarised Compton

+ atomic relaxation– fluorescence

– Auger effect following processes leaving

a vacancy in an atom

In progress– More precise angular distributions

(Rayleigh, photoelectric, Bremsstrahlung etc.)

– Polarised conversion, photoelectric

Development plan– Driven by user requirements– Schedule compatible with

available resources

in two “flavours” of models: • based on the Livermore LibraryLivermore Library • à la PenelopePenelope

IEEE NSS/MIC 2004

currentcurrent

statusstatus

Software ProcessSoftware Process

Public URDPublic URDFull traceability through UR/OOD/implementation/testTesting suite and testing processPublic documentation of proceduresDefect analysis and preventionetc.…

A rigorous approach to software engineering in support of a better quality of the software especially relevant in the physics domain of Geant4-

LowE EM several mission-critical applications (space, medical…)

A life-cycle model that is both iterative and incrementalSpiral approach

Huge effort invested into SPI started from level 1 (CMM) in very early stages: chaotic,

left to heroic improvisation

Collaboration-wide Geant4 software process, tailored to the specific projects

IEEE NSS/MIC 2004

User requirementsUser requirementsGEANT4 LOW ENERGY ELECTROMAGNETIC PHYSICS

GGEEAANNTT44 LLOOWW EENNEERRGGYY

EELLEECCTTRROOMMAAGGNNEETTIICC PPHHYYSSIICCSS

User Requirements Document Status: in CVS repository

Version: 2.4 Project: Geant4-LowE Reference: LowE-URD-V2.4 Created: 22 June 1999 Last modified: 26 March 2001 Prepared by: Petteri Nieminen (ESA) and Maria Grazia Pia (INFN)

User User RequirementsRequirements

Posted on the WG

web site

Elicitation through interviews and surveys useful to ensure that UR are complete and

there is wide agreement

Joint workshops with user groups

Use cases

Analysis of existing Monte Carlo codes

Study of past and current experiments

Direct requests from users to WG coordinators

Various methodologies adopted to Various methodologies adopted to capturecapture URsURs

IEEE NSS/MIC 2004

LowE processesbased on Livermore Library

IEEE NSS/MIC 2004

Photons and Photons and electronselectrons

Based on evaluated data libraries from LLNL:– EADL (Evaluated Atomic Data Library)

– EEDL (Evaluated Electrons Data Library)

– EPDL97 (Evaluated Photons Data Library) especially formatted for Geant4 distribution (courtesy of D. Cullen, LLNL)

Validity range: 250 eV - 100 GeV– The processes can be used down to 100 eV, with degraded accuracy

– In principle the validity range of the data libraries extends down to ~10 eV

Elements Z=1 to Z=100– Atomic relaxation: Z > 5 (transition data available in EADL)

different approach w.r.t. Geant4 standard e.m.standard e.m.

package

IEEE NSS/MIC 2004

Calculation of cross sectionsCalculation of cross sections

12

1221

/log

/loglog/logloglog

EE

EEEEE

iii nE

1

E1 and E2 are the lower and higher energy for which data (1 and 2) are available

ni = atomic density of the ith element contributing to the material composition

Interpolation from the data libraries:

Mean free path for a process, at energy E:

IEEE NSS/MIC 2004

PhotonsPhotons

IEEE NSS/MIC 2004

Compton scatteringCompton scattering

Energy distribution of the scattered photon according to the Klein-Nishina formula, multiplied by scattering function F(q) from EPDL97 data library

The effect of scattering function becomes significant at low energies– suppresses forward scattering

Angular distribution of the scattered photon and the recoil electron also based on EPDL97

2

0

020

220 cos42

h

h

h

h

h

hr

4

1

d

dKlein-Nishina cross section:

IEEE NSS/MIC 2004

Rayleigh scatteringRayleigh scattering

Angular distribution: F(E,q)=[1+cos2(q)]F2(q)– where F(q) is the energy-dependent form factor

obtained from EPDL97

Improved angular distribution released in 2002, further improvements foreseen

IEEE NSS/MIC 2004

Photoelectric effectPhotoelectric effectCross section– Integrated cross section (over the shells) from EPDL +

interpolation– Shell from which the electron is emitted selected according to the

detailed cross sections of the EPDL library

Final state generation– Direction of emitted electron = direction of incident photon

Deexcitation via the atomic relaxation sub-process– Initial vacancy + following chain of vacancies created

Improved angular distribution in preparation

IEEE NSS/MIC 2004

conversionconversionThe secondary e- and e+ energies are sampled using Bethe-Heitler cross sections with Coulomb correction

e- and e+ assumed to have symmetric angular distribution

Energy and polar angle sampled w.r.t. the incoming photon using Tsai differential cross section

Azimuthal angle generated isotropically

Choice of which particle in the pair is e- or e+ is made randomly

IEEE NSS/MIC 2004

Photons: mass attenuation coefficientPhotons: mass attenuation coefficient

Comparison against NIST data

LowE accuracy ~ 1%

G4 Standard

G4 LowE

NIST-XCOM

2N-L=13.1 – =20 - p=0.87

2N-S=23.2 – =15 - p=0.08

IEEE NSS/MIC 2004

Photons, evidence of shell Photons, evidence of shell effectseffects

Photon transmission, 1 m Al

Photon transmission, 1 m Pb

IEEE NSS/MIC 2004

PolarisatioPolarisationn

250 eV -100 GeV

y

O z

x

h

h A

C

Polar angle

Azimuthal angle

Polarization vector

22

0

020

220 cossin2

h

h

h

h

h

hr

2

1

d

d

More details: talk on Geant4 Low Energy Electromagnetic Physics

Other polarised processes under development

Ncossin1sincossincos 22

coskcoscossin

N

1jcossinsin

N

1iN 2'

||

sinksinsinjcosN

1'

Cross section:

Scattered Photon Polarization

10 MeV

small

large

100 keV

small

large

1 MeV

small

large

Low Energy Low Energy Polarised Polarised ComptonCompton

IEEE NSS/MIC 2004

PolarisationPolarisation

Polarisation of a non-polarised photon beam, simulation and theory

theory

simulation

Ratio between intensity with perpendicular and parallel polarisation vector w.r.t. scattering plane, linearly polarised photons

500 million events

IEEE NSS/MIC 2004

Electron BremsstrahlungElectron Bremsstrahlung

Parameterisation of EEDL data – 16 parameters for each atom

– At high energy the parameterisation reproduces the Bethe-Heitler formula

– Precision is ~ 1.5 %

Plans– Systematic verification over Z

and energy

IEEE NSS/MIC 2004

Bremsstrahlung Angular DistributionsBremsstrahlung Angular Distributions

Three LowE generators available in GEANT4 6.0 release:

G4ModifiedTsai, G4Generator2BS and G4Generator2BN

G4Generator2BN allows a correct treatment at low energies (< 500 keV)

Most stuff presented in 2003 GEANT4 Workshop Vancouver

IEEE NSS/MIC 2004

Electron ionisationElectron ionisationParameterisation based on 5 parameters for each shell

Precision of parametrisation is better then 5% for 50 % of shells, less accurate for the remaining shells

Work in progress to improve the parameterisation and the performance

IEEE NSS/MIC 2004

Electrons: Electrons: rangerange

Range in various simple and composite materials

Compared to NIST database

AlAl

G4 Standard

G4 LowE

NIST-ESTAR

IEEE NSS/MIC 2004

Geant4 validation vs. NIST Geant4 validation vs. NIST databasedatabase

All Geant4 physics models of electrons, photons, protons and compared to NIST database– Photoelectric, Compton, Rayleigh, Pair Production cross-sections

– Photon attenuation coefficients

– Electron, proton, stopping power and range

Quantitative comparison– Statistical goodness-of-fit tests

See talk on Thursday, Software & Computing sessions

IEEE NSS/MIC 2004

Electrons: dE/dxElectrons: dE/dx

Ionisation energy loss in various materials

Compared to Sandia database

More systematic verification planned

Also Fe, Ur

IEEE NSS/MIC 2004

Electrons, transmittedElectrons, transmitted20 keV electrons, 0.32 and 1.04 m Al

IEEE NSS/MIC 2004

The problem of validation: finding reliable The problem of validation: finding reliable datadata

Note: Geant4 validation Note: Geant4 validation is not always easyis not always easy

experimental data often exhibit large differences!

Backscattering low energies - Au

IEEE NSS/MIC 2004

Hadrons and ionsHadrons and ionsVariety of models, depending on – energy range– particle type– charge

Composition of models across the energy range, with different approaches– analytical– based on data reviews + parameterisations

Specialised models for fluctuations

Open to extension and evolution

IEEE NSS/MIC 2004

Algorithms encapsulated in

objects

Physics models handled through abstract classes

Hadrons and ionsHadrons and ions

Interchangeable and transparent access to data sets

Transparency of physics, clearly exposed to users

IEEE NSS/MIC 2004

Positive charged Positive charged hadronshadrons

• Bethe-Bloch model of energy loss, E > 2 MeV• 5 parameterisation models, E < 2 MeV

based on Ziegler and ICRU reviews• 3 models of energy loss fluctuations

Chemical effectChemical effect for compounds Nuclear stoppingNuclear stopping power PIXE includedPIXE included

Stopping power Z dependence for various energiesZiegler and ICRU models

Ziegler and ICRU, Si

Nuclear stopping power

Ziegler and ICRU, Fe

Density correctionDensity correction for high energy Shell correctionShell correction term for intermediate energy Spin dependentSpin dependent term

Barkas Barkas and BlochBloch terms

Straggling

IEEE NSS/MIC 2004

Bragg peak (with hadronic interactions)

The precision of the stopping power simulation for protons in the energy from 1 keV to 10 GeV is of the order of a few per cent

IEEE NSS/MIC 2004

Positive charged ionsPositive charged ions

• Scaling:

• 0.01 < < 0.05 parameterisations, Bragg peak based on Ziegler and ICRU reviews

< 0.01: Free Electron Gas Model

ion

pp m

mTT ),()( 2

ppionion TSZTS

Effective charge modelEffective charge model Nuclear stopping powerNuclear stopping power

Deuterons

IEEE NSS/MIC 2004

Models for antiprotonsModels for antiprotons > 0.5 Bethe-Bloch formula

0.01 < < 0.5 Quantum harmonic oscillator model

< 0.01 Free electron gas mode

Proton

G4 Antiproton

Antiproton from Arista et. al

Antiproton exp. data

Proton

G4 Antiproton

Antiproton from Arista et. al

Antiproton exp. data

IEEE NSS/MIC 2004

Atomic relaxationAtomic relaxation

IEEE NSS/MIC 2004

FluorescenceFluorescence

Scattered

photons

Fe lines

GaAs lines

Spectrum from a Mars-

simulant rock sample

Microscopic validation: against reference data

Experimental validation: test beam data, in collaboration with ESA Advanced Concepts & Science

Payload Division

IEEE NSS/MIC 2004

Auger effectAuger effect

New implementation, validation in progress

Auger electron emission from various materials

Sn, 3 keV photon beam,

electron lines w.r.t. published experimental results

IEEE NSS/MIC 2004

PIXEPIXE

New model based on experimental data– Parameterisation of Paul & Sacher data library for ionisation cross sections

– Uses the EADL-based package of atomic deexcitation for the generation of fluorescence and Auger secondary products

Current implementation: protons, K-shell

Coming in future: protons, L-shell and , K-shell

Example of p ionisation cross section, K shell

Geant4 parameterisation (solid line)

Experimental data

IEEE NSS/MIC 2004

Processes à la PenelopeProcesses à la PenelopeThe whole physics content of the Penelope Monte Carlo code has been re-engineered into Geant4 (except for multiple scattering)– processes for photons: release 5.2, for electrons: release 6.0

Physics models by F. Salvat et al.

Power of the OO technology:– extending the software system is easy– all processes obey to the same abstract interfaces– using new implementations in application code is simple

Profit of Geant4 advanced geometry modeling, interactive facilities etc. – same physics as original Penelope

IEEE NSS/MIC 2004

Contribution from usersContribution from users

Many valuable contributions to the validation of LowE physics from users all over the world– excellent relationship with our user community

User comparisons with data usually involve the effect of several physics processes of the LowE package

A small sample in the next slides– no time to show all!

IEEE NSS/MIC 2004

Homogeneous PhantomHomogeneous Phantom

10x10 cm215x15 cm2

10x10 cm2

Differences

15x15 cm2

Differences

Simulation of photon beams produced by a Siemens Mevatron KD2 clinical linear accelerator

Phase-space distributions interface with GEANT4 Validation against experimental data: depth dose and

profile curves

P. Rodrigues, A. Trindade, L.Peralta, J. Varela, LIP

LIP – Lisbon

Preliminary!

IEEE NSS/MIC 2004

P. Rodrigues, A. Trindade, L.Peralta, J. Varela, LIP

preliminary

Dose Calculations with 12CDose Calculations with 12C

Bragg peak localization calculated with GEANT4 (stopping powers from ICRU49 and Ziegler85) and GEANT3 in a water phantom

Comparison with GSI data

Preliminary!

IEEE NSS/MIC 2004

Uranium irradiated by electron Uranium irradiated by electron beambeam

Fig 1. Depth-dose curve for a semi-infinite uranium slab irradiated by a 0.5 MeV broad parallel

electron beam

1Chibani O and Li X A, Med. Phys. 29 (5), May 2002

Jean-Francois Carrier, Louis Archambault, Rene Roy and Luc Beaulieu

Service de radio-oncologie, Hotel-Dieu de Quebec, Quebec, CanadaDepartement de physique, Universite Laval, Quebec, Canada

The following results will be published soon. They are part of a

general Geant4 validation project for medical applications.

Preliminary!

IEEE NSS/MIC 2004

IonsIons

Independent validation at Univ. of Linz (H. Paul et al.)

Geant4-LowE reproduces the right side of the distribution precisely, but about 10-20% discrepancy is observed at lower energies

Preliminary!

IEEE NSS/MIC 2004

To learn moreTo learn moreGeant4 Physics Reference Manual

Application Developer Guide

http://www.ge.infn.it/geant4/lowE

IEEE NSS/MIC 2004

SummarySummaryOO technology provides the mechanism for a rich set of electromagnetic physics models in Geant4– further extensions and refinements are possible, without affecting

Geant4 kernel or user code

Two main approaches in Geant4:– standard

– Low Energy (Livermore Library / Penelope) each one offering a variety of models for specialised

applications

Extensive validation activity and results

More on Physics Reference Manual and web site