introduction to focused test, inc. - primetech | home data sheet.pdfintroduction to focused test,...
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![Page 1: Introduction to Focused Test, Inc. - Primetech | Home Data Sheet.pdfIntroduction to Focused Test, Inc. Presented to: Chen Goldner Primetech, Israel. July 2014 . ... • Microsoft -](https://reader035.vdocument.in/reader035/viewer/2022062311/5aeefa7b7f8b9ac57a8cb06f/html5/thumbnails/1.jpg)
COMPANY CONFIDENTIAL
Introduction to Focused Test, Inc.
Presented to:
Chen Goldner
Primetech,
Israel.
July 2014
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COMPANY CONFIDENTIAL
Company Overview Focused Test Inc. founded in August 2006
Corporate HQ in Boulder Colorado, USA
– Applications Engineering in San Jose California
Incorporated Focused Test Philippines Inc (FTPI) in 2010
– Asia Applications, Development Engineering and Logistics support
– Support team: four engineers based in Makati, Metro Manila
Mission:
– To apply focused technology to testing of Power Discretes, Power IC’s and Smart Modules
– Provide customers a significant advantage in cost of test reduction compared to general purpose analog IC test platforms
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COMPANY CONFIDENTIAL
FTI Executive Management Mike Morter - Chairman of the Board
• Siliconix, Attain, AOT, HP,TMT
• Co founder of TMT, designer of ASL 1000
• Hardware design/applications
Peter Hancock - President
• Schlumberger, TMT, Credence, Eagle, Best Electronics
• Sales and marketing
Gordon Leak - Director, Engineering
• Siliconix, Rolm, Octel, TMT, Credence
• Co founder of TMT, designer of ASL 1000
• Hardware design/applications
Noah Katz - Director, Operations
• Phoenix Engineering
• Operations/finance/logistics
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COMPANY CONFIDENTIAL
FTI 1000 Key Features and Benefits
Tester per Channel Board Architecture
Flexible Configuration for all Device Applications
Floating Power Instruments
– Very Scalable for Multisite/Multidie Test
– Zero Multisite Test Time Overhead
– Integrated DC and AC Mosfet Tests
– Channel Boards for Discrete and IC test
– Open Source Code Function Library
– Smart Module Capable
– Very High Power Density
– Very High Voltage instruments
– Lowest Cost of Test for Power Devices
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COMPANY CONFIDENTIAL
Focused Test - Target Devices
Discretes – Mosfets
– GaN and SiC Power Transistors
– Bipolar Transistors
– Zener Diodes
– TVS
Power Management IC’s/Smart Power Modules – Regulators (PWM, LDO etc)
– Motor/Solar Controllers
– Audio IC’s
– IGBTs
– Thyristors/SCR
– Sidactor/Trisil
– Diodes
– Rectifiers
– Battery Chargers
– Drivers (Mosfet, LED etc)
– Temperature Management
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COMPANY CONFIDENTIAL
Focused Test Product Line Up
FTI 1000
– Power Discrete
– Intelligent Power – IC + FET
– PMIC, LED Driver, Temperature Management IC
FTI 3000
– Zener Diode Burn-in and Test
FTI 8000 – launch date TBD
– Advanced Mixed Signal
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COMPANY CONFIDENTIAL
Europe Support
UK, Ireland and Scandinavia
– Inseto Ltd., Andover, UK
Italy
– Telephone contacts with ST Catania by Elexind, Milan,
but no contract yet signed.
France
– To be announced
CE Mark Certification– completed October 2008
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COMPANY CONFIDENTIAL
FTI 1000 Customer Base
Aerospace
Device
Manufacturers
Subcontractor
Bourns
Installed Base >65 Systems
Mitsumi
Analog Power Inc. Avogy, Inc.
Cirtek Electronics
USiC
6
Adamant
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COMPANY CONFIDENTIAL
Typical FTI 1000 Installations
Mosfet UIL, Rg, DC
Testing with TSK Prober
Mosfet UIL, Rg, DC testing with
SRM handler
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COMPANY CONFIDENTIAL
FTI 3000:
Zener Diode Burn-In and Test
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COMPANY CONFIDENTIAL
FTI 3000 Diode String Control Block Diagram:
Shows one Diode String only. Each Board drives a total of 5 Diode Strings
Vmeas
0-400V
Isource/
Vf meas
0-10mA
+
-
External
Power
Supply
Control Diode
Floating Ground
1
2
5
3
4
Isource
Vz meas
0-2.5A
Gnd
Floating Ground
In Heat Mode switch 5 is closed and all others
open. Switch 6 is also closed to measure
voltage at end of string
In Temp Measure Mode switch 5 is open and
switches 1,2,3 and 4 are closed. 2-3 ms
duration.
In Vz Measure Mode switch 3 and 4 are open
and switches 1,2 and 5 are closed
Modes of Operation
6
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COMPANY CONFIDENTIAL
FTI 3000 System Block Diagram
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COMPANY CONFIDENTIAL
FTI 1000 Test Head Compact, Small Foot-Print Tester-per-Board Architecture
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COMPANY CONFIDENTIAL
FTI 1000 Mosfet/IGBT/Diode
DC Channel Board with Modules
DC Channel Board
AC Channel Board
Test H
ead D
C_A
C M
UX
•FPGA Controller
•CAP Bank
•USB Support
•Relay Tree S
ou
rce/D
rain
/Ga
te_A
nalo
g c
ha
nn
els
Data Cable
Handler/Prober
Com
pute
r
USB
Cables
Module 1 DVsd/SCM/SOA/
Quad VI
Module 4 High Power
100A pulsed ( exp to 200A)
Module 3
High Voltage
1,200V ( exp to 3.6kV)
Module 2 Low Leakage
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COMPANY CONFIDENTIAL
FTI 1000 AC Channel Board with Modules
for AC plus DC Tests
AC Channel Board
DC Channel Board
Dual D
ie M
UX
- DX
M
•FPGA Controller
•CAP Bank
•USB Support
•Relay Tree
•Digitizer
Data Cable
Handler/Prober
Com
pute
r
USB
Cables
Module 1
Module 4 CAP Charger
Module 3
Rg Module
Module 2 Pulse Generator
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COMPANY CONFIDENTIAL
FTI 1000: Mosfet/IGBT DC Tests
Test
Category
DC Tests Low Leakage
Module 2
Hi Power
Module 3
Hi V Source
Module 4
Delta Vsd
Module 1
ON Tests Rdson, Idon,
Vgs, Gfs
OFF Tests Igss, Idss
Diode Test Vsd
Gate Zener
Test
BVgso
Breakdown
Test
BVdss
Thermal
Impedance
Delta Vsd
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COMPANY CONFIDENTIAL
FTI 1000: New Features introduced in 2014
High Power SOA test option
GaN and SiC Devices
– GaN Current Collapse /Dynamic Rdson test
Next Generation Rg Instrument
– Low Cg Mosfets to 100pF
– Improved Resonance Algorithm for shorter Test Times
Multidie Wafer Sort
Smart Power MDM’s
– IC + FET
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COMPANY CONFIDENTIAL
GaN Current Collapse Test
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COMPANY CONFIDENTIAL
Current Collapse Test Sequence
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COMPANY CONFIDENTIAL
Current Collapse/Dynamic Rdson
at Vds=10V
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COMPANY CONFIDENTIAL
Current Collapse Rdson Test
at Vds=400V
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COMPANY CONFIDENTIAL
FTI 1000: Diode/TVS Tests Test Name Test
Symbol
Surge
Current
Module
Slot 1
Delta Vf
Heating
Module
Slot 1
Low
Leakage
Module
Slot 2
High
Power
Module
Slot 3
High
Voltage
Module
Slot 4
Dual
Channel
Digitizer
Slot 5
Forward
Voltage
Vfm
Reverse
Current
Ir
Breakdown
Voltage
Vbr
Thermal
Impedance
Zθjx
Delta Vf DVf
Surge
Current
I surge
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COMPANY CONFIDENTIAL
MIL STD 750 Diode Tests
DC Tests: V(br), Vf and Ir
Surge Current Tests – Half Sine, Pulse (8.3ms, 10/1000 and others)
Peak Reverse Power Test – Provides 20 uS Pulse to 1,600V using Internal Inductors
Noise Density Test – Programmable filter response and frequency
– Three different filter types
Dynamic Impedance Test (Zzt, Zzk)
Thermal Impedance Test Zθjx Method 3101 – Heating current up to 20A continuous
– Programmable Measurement Delay Time • typical 10-100us
– Zθjx = k (Vf1-Vf2) ºC/W
Iheat x Vf3
Thermal Resistance Rθjc and Rθja – Constant Power applied up to 150W
– Wait for Thermal Equilibrium
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COMPANY CONFIDENTIAL
FTI 1000: Mosfet AC Tests
AC Tests TMU
On AC Channel
Board
Digitizer Pulse GEN
Module 2
CAP
Charger
Module 3
Rg
Module 4
Inductor
Module 10uH, 100uH,
300uH, 1mH,
3mH, 10mH
Rg/Cg
Qg, Qgs, Qgd
Timing
Avalanche
(UIL/UIS)
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COMPANY CONFIDENTIAL
Gate Charge Test Method High Accuracy I Source (for Gate) – Pulse Gen Module
– Ranges 25mA, 2.5mA, 250μA, 25μA
– Full CAL performed with External Standard
Dual Digitizer – 25MHz @ 12 bits (for Gate and Drain Signal Capture) – Hi Z Input (doesn’t load down Gate)
Fixture Calibration – Typical Fixture has Qg~3nC, but this can be calibrated out for very low Qg
measurements
High Speed V to I Supply 60V, 100A for Drain Conditions – CAP Charger Module
Resistive Load Mode – Resistor ladder + CAP Supply - CAP Charger
• 0.5Ω Steps from 0.5Ω to 2kΩ Load for Voltages up to 800V
– Constant Current Limiter Module for High Compliance Voltage Devices
Current Source Mode – For Voltages to 70V
Qg Turn-Off Test Method option available
Multiple Methods to give Optimum Determination of Miller Points: – Double Differential
– Change of Slope
– Intersecting Lines • Drain Waveform
• Gate Waveform
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COMPANY CONFIDENTIAL
Gate Charge (Qg) Scope Display:Line Intersect Method
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COMPANY CONFIDENTIAL
UIL/UIS Scope Display
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COMPANY CONFIDENTIAL
UIL/UIS Setup and Datalog
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COMPANY CONFIDENTIAL
Inductor Box for UIL/UIS Test
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COMPANY CONFIDENTIAL
Small Signal Series Resonance (SSSR) Technique
Cg range 100pF to 14nF
Rg range 0.2 Ω to 20 Ω
Rg accuracy 5% for Rg>1Ω, Cg> 100pF
Frequency range 200kHz to 4MHz
DC level shift +/- 10 V
Three Inductor Values: 10µH, 22µH and 47µH
Rg 3.0 Instrument Specifications
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COMPANY CONFIDENTIAL
At resonance the AC impedance of the LC is zero
– L from Inductor Chooser
– C from DUT Cg
Rg is calculated by:
a) digitizing the current waveform
b) compare with Zero Ohm and 5 Ohm Resistance
c) solve for Rg
Rg measurement through Standard DUT
Connections
Rg Test Method
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COMPANY CONFIDENTIAL
Advantages of
Rg Series Resonance Method
Phase Shift Resonance Detection gives
Shorter Test Times
Less Sensitive to Cable/Fixture Capacitance
Current Pulse at Resonance helps eliminate
Gate Bond Defects
Gate Bias Voltage Programmable +/- 10V
Low Cost
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COMPANY CONFIDENTIAL
Gate Capacitance vs. Bias Voltage
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COMPANY CONFIDENTIAL
Rg vs. Bias Voltage
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COMPANY CONFIDENTIAL
FTI 1000 with Mosfet TMU
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COMPANY CONFIDENTIAL
TMU Test Waveform
Overall Pulse Width 1us
VDS = 30V
VGS = 10V
Time 200ns / div
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COMPANY CONFIDENTIAL
TMU: TD(on) Test
Vgs @ 2V/ div
Turn on Tests
VDS = 30V
VGS = 10V
Time 5ns / div
TD(on) = 2.995ns
Trise = 2.995ns
Vds @ 5V/ div
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COMPANY CONFIDENTIAL
TMU: TD(off) Test
Turn off Tests
VDS = 30V
VGS = 10V
Time 5ns / div
TD(off) = 6.745ns
Trise = 13.620ns
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COMPANY CONFIDENTIAL
Manual Test Station
Tests Diodes and Mosfets
Safety Cover
DUT Fixture Interface
pA Leakage Instrument
Diode Orientation
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COMPANY CONFIDENTIAL
Tester-per Channel Board Architecture
Low Base System Overhead/Cost – No system backplane – adds cost/reduces UPH
Single Board System for Engineering or Single Site Test
Multisite System created by adding Channel Boards
Test Programs automatically scale across Multiple Channel Boards and Test Sites
Highly Scalable Architecture
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COMPANY CONFIDENTIAL
FTI 1000 2 Site Index Parallel Example:
Mosfet Test with Turret Handler
Feeder
Good Bad
FTI 1000 AC-Rg,Ciss,Qg,UIL AC Channel Board with Digitizer
Pulse GEN Module
CAP Bank Module
Rg Module
FTI 1000 DC DC Channel Board
Low Leakage/Source Module
High Voltage Module
High Power Module
Inductor Box 6 Programmable Values
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COMPANY CONFIDENTIAL
FTI 1000 4 Site Index Parallel Example:
Mosfet Test with Turret Handler
Feeder
Good Bad
FTI 1000 DC-DeltaVsd DC Channel Board
Low Leakage/Source Module
DVsd Module
FTI 1000 AC- UIL,Qg,Rg AC Channel Board
Pulse GEN Module
CAP Bank Module
Digitizer
FTI 1000 DC_Final Test DC Channel Board
Low Leakage/Source Module
High Voltage Module
High Power Module
Inductor Box 6 Programmable Values
FTI 1000 DC_QA DC Channel Board
Low Leakage/Source Module
High Voltage Module
High Power Module
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COMPANY CONFIDENTIAL
FTI 1000 5-Site Index-Parallel Test:
DVsd, DC, UIL, Qg, Rg, Cg/Ciss
Feeder
Good Bad
FTI 1000 DC-DeltaVsd DC Channel Board
Low Leakage/Source Module
DVsd Module
FTI 1000 AC- UIL/Qg AC Channel Board
Pulse GEN Module
CAP Bank Module
Digitizer
FTI 1000 DC1 DC Channel Board
Low Leakage/Source Module
High Voltage Module
High Power Module
Inductor Box 6 Programmable Values
FTI 1000 DC2 DC Channel Board
Low Leakage/Source Module
High Voltage Module
High Power Module
FTI 1000 AC- Rg/Ciss AC Channel Board
Pulse GEN Module
Rg Module
Digitizer
Turret Handler
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COMPANY CONFIDENTIAL
Multi-Die Wafer Sort and Lead Frame
Mosfet Test Solutions • Multi Die Module (MDM) converts FTI 1000 to x4, x8 and
x16 DC and AC Mosfet test
• Each MDM has four Nano Ammeters
• Dedicated Nano Ammeter per die
• Quad VI (QVI) provides a dedicated VI per DUT
• High Voltage Isolation Relay per channel
isolates shorted die so other die can still be measured accurately.
• Dedicated amplifier for Rds measure per channel
• Multidie Rdson/Ids max: 100A; BV max: 1kV
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COMPANY CONFIDENTIAL
FTI 1000 testing Quad Die on
TEL P8 Prober
MDM
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COMPANY CONFIDENTIAL
FTI 1000 Multidie with Multi Die
Module (MDM) on P8 Prober:
MDM
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COMPANY CONFIDENTIAL
FTI 1000: Quad Die Module:
4, 8, 12 and 16 Die Wafer Test DC Tests High
Power
Source
High
Voltage
Source
Quad VI KFET Solid
State
Switches
NanoAmmeters
(<40uA fs)
High/Low
Sense Bus
Rdson, Idon,
Vsd
Adjacent Die
-Low Rdson
Vgs, BVgso
Igss
BVdss, Idss
Gfs
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COMPANY CONFIDENTIAL
FTI Studio Software Architecture
Dot Net based Open System Software
– Multi-threaded Structure enables Efficient Multisite Testing
• True Parallel and Index Parallel Testing,
– Open System Architecture
• Easy to add/build New GUI Tools with Plug-n-Play
– FTI Studio uses Industry Standard Software where possible
• National Instruments – ‘Measurement Studio’
• Microsoft - ‘Visual Studio’, Windows o/s
• XML
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COMPANY CONFIDENTIAL
Test Program Development with FTI Studio:
Open Source Architecture
C# Programming Language
– High Reliability
– Simple Coding similar to C or C++
– Allows Plug-n-Play and User Extensions to Tester
Extensive Discrete and IC Test Function Library
– Open-Source Test Function Library
– Extensive library of common test functions
– Set Up Screens allow easy Device Test Program
Development
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COMPANY CONFIDENTIAL
Easy Test Program Generation using
Discrete Test Function Library
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COMPANY CONFIDENTIAL
High Power SOA Option for FTI 1000
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COMPANY CONFIDENTIAL
High Power SOA Option for FTI 1000
DIGITAL CONTROL / SIGNAL MEASUREMENT / POWER
REGULATION
AC TO DC POWER CONVERSION
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COMPANY CONFIDENTIAL
Focused Test New Product Road Map:2014 Rg version 3.0
Shorter Test Time
lower Cg range: 100pF min.
Kelvin Contact Resistance Correction
Multidie Test for x4, x8 and x16 Die
DC Multidie: 1kV, 30A max
UIL Serial Die: 100A, with Crowbar Protection (Fairchild only)
Rg – Serial Die
Power Management IC/Smart Module/DrMOS Test for FTI 1000
Digital Instrument – 8 channels, 100 MHz Data Rate
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COMPANY CONFIDENTIAL
Focused Test New Product Road Map:2015
High Current UIL Board
UIL to 300A; 1,500V
UIL Short Circuit/Crowbar Protection for wafer sort
Operates with Existing AC Channel Board
Next Generation AC Channel Board for IGBT’s:
UIL to 100A; 2,500V
Qg to 100A; 1,200V
Production version of SOA option
High Sample Rate Digitizer
for trr, Qrr, Qoss, Eon/off, dV/dt