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    IRF5305HEXFETPower MOSFET

    PD - 91385B

    Fifth Generation HEXFETs from International Rectifier

    utilize advanced processing techniques to achieveextremely low on-resistance per silicon area. This benefit,combined with the fast switching speed and ruggedizeddevice design that HEXFET Power MOSFETs are wellknown for, provides the designer with an extremely efficientand reliable device for use in a wide variety of applications.

    The TO-220 package is universally preferred for allcommercial-industrial applications at power dissipation

    levels to approximately 50 watts. The low thermal resistanceand low package cost of the TO-220 contribute to its wide

    acceptance throughout the industry.

    Parameter Max. Units

    ID@ TC= 25C Continuous Drain Current, VGS@ -10V -31

    ID@ TC= 100C Continuous Drain Current, VGS@ -10V -22 A

    IDM Pulsed Drain Current -110

    PD @TC= 25C Power Dissipation 110 W

    Linear Derating Factor 0.71 W/C

    VGS Gate-to-Source Voltage 20 V

    EAS Single Pulse Avalanche Energy 280 mJ

    IAR Avalanche Current -16 A

    EAR Repetitive Avalanche Energy 11 mJ

    dv/dt Peak Diode Recovery dv/dt -5.0 V/ns

    TJ Operating Junction and -55 to + 175

    TSTG Storage Temperature Range

    Soldering Temperature, for 10 seconds 300 (1.6mm from case )

    C

    Mounting torque, 6-32 or M3 srew 10 lbfin (1.1Nm)

    Absolute Maximum Ratings

    Parameter Typ. Max. Units

    RJC Junction-to-Case 1.4

    RCS Case-to-Sink, Flat, Greased Surface 0.50 C/W

    RJA Junction-to-Ambient 62

    Thermal Resistance

    VDSS= -55V

    RDS(on)= 0.06

    ID= -31A

    TO-220AB

    Advanced Process Technology Dynamic dv/dt Rating 175C Operating Temperature Fast Switching P-Channel Fully Avalanche Rated

    Description

    3/3/00

    S

    D

    G

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    Parameter Min. Typ. Max. Units Conditions

    IS Continuous Source Current MOSFET symbol

    (Body Diode)

    showing the

    ISM Pulsed Source Current integral reverse

    (Body Diode)

    p-n junction diode.

    VSD Diode Forward Voltage -1.3 V TJ= 25C, IS= -16A, VGS= 0V

    trr Reverse Recovery Time 71 110 ns TJ= 25C, IF= -16A

    Qrr Reverse RecoveryCharge 170 250 nC di/dt = -100A/s

    Source-Drain Ratings and Characteristics

    Parameter Min. Typ. Max. Units Conditions

    V(BR)DSS Drain-to-Source Breakdown Voltage -55 V VGS= 0V, ID= -250A

    V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient -0.034 V/C Reference to 25C, ID= -1mA

    RDS(on) Static Drain-to-Source On-Resistance 0.06 VGS= -10V, ID= -16A

    VGS(th) Gate Threshold Voltage -2.0 -4.0 V VDS= VGS, ID= -250A

    gfs Forward Transconductance 8.0 S VDS= -25V, ID= -16A

    -25A

    VDS= -55V, VGS= 0V

    -250 VDS= -44V, VGS= 0V, TJ= 150C

    Gate-to-Source Forward Leakage 100 VGS= 20V

    Gate-to-Source Reverse Leakage -100nA

    VGS= -20V

    Qg Total Gate Charge 63 ID= -16A

    Qgs Gate-to-Source Charge 13 nC VDS= -44V

    Qgd Gate-to-Drain ("Miller") Charge 29 VGS= -10V, See Fig. 6 and 13 td(on) Turn-On Delay Time 14 VDD= -28V

    tr Rise Time 66 ID= -16A

    td(off) Turn-Off Delay Time 39 RG= 6.8

    tf Fall Time 63 RD= 1.6, See Fig. 10

    Between lead,

    6mm (0.25in.)

    from package

    and center of die contact

    Ciss Input Capacitance 1200 VGS= 0V

    Coss Output Capacitance 520 pF VDS= -25V

    Crss Reverse Transfer Capacitance 250 = 1.0MHz, See Fig. 5

    nH

    Electrical Characteristics @ TJ= 25C (unless otherwise specified)

    LD Internal Drain Inductance

    LS Internal Source Inductance

    IGSS

    ns

    4.5

    7.5

    IDSS Drain-to-Source Leakage Current

    Repetitive rating; pulse width limited by

    max. junction temperature. ( See fig. 11 ) ISD -16A, di/dt -280A/s, VDD V(BR)DSS,

    TJ 175C

    Notes:

    VDD = -25V, starting TJ = 25C, L = 2.1mH

    RG = 25, IAS = -16A. (See Figure 12)

    Pulse width 300s; duty cycle2%.

    -31

    -110

    A

    S

    D

    G

    S

    D

    G

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    Fig 4.Normalized On-ResistanceVs. Temperature

    Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics

    Fig 3. Typical Transfer Characteristics

    1

    10

    10 0

    1 0 0 0

    0.1 1 10 10 0

    D

    DS

    2 0 s P U L S E W I D THT = 25Cc A

    -I

    ,D

    rain-to-Source

    C

    urrent(A)

    -V , Drain-to-Source Vol tage (V)

    VGS

    TOP - 15V

    - 10V - 8.0V

    - 7.0V - 6.0V

    - 5.5V - 5.0V

    BOTTOM - 4.5V

    -4.5V

    1

    10

    10 0

    1000

    0.1 1 10 100

    D

    D S

    A

    -I

    ,Drain-to-Source

    Current(A)

    -V , Drain-to-Source Vol tage (V)

    VGS

    TOP - 15V

    - 10V

    - 8.0V

    - 7.0V

    - 6.0V

    - 5.5V

    - 5.0V

    BOTTOM - 4.5V

    -4 .5V

    2 0 s P U L S E W I D T HT = 175CC

    1

    10

    10 0

    4 5 6 7 8 9 1 0

    T = 25CJ

    T = 175CJ

    A

    V = -25V2 0 s P U L S E W ID TH

    DS

    G S-V , Gate- to-Source Vol tage (V)

    D

    -I

    ,Drain-to-Source

    Current

    (A)

    0. 0

    0. 5

    1. 0

    1. 5

    2. 0

    -60 -40 -20 0 2 0 4 0 6 0 8 0 1 0 0 12 0 1 4 0 1 6 0 1 80

    JT , Junct ion Tem perature (C)

    R

    ,

    Drain-to-Source

    On

    Resistance

    DS(on)

    (Norm

    alized)

    A

    I = -27A

    V = -10V

    D

    G S

    J J

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    Fig 8. Maximum Safe Operating Area

    Fig 6. Typical Gate Charge Vs.Gate-to-Source Voltage

    Fig 5. Typical Capacitance Vs.Drain-to-Source Voltage

    Fig 7. Typical Source-Drain DiodeForward Voltage

    0

    50 0

    1000

    1500

    2000

    2500

    1 10 100

    C,

    Capacitance

    (pF)

    A

    V = 0 V , f = 1 M H zC = C + C , C S H O R T E DC = CC = C + C

    G S

    iss gs gd ds

    r ss gd

    oss ds gdC is s

    C os s

    C rs s

    D S-V , Drain-to-Sourc e Voltage (V)

    0

    4

    8

    12

    16

    20

    0 10 20 30 40 50 60

    Q , Tota l Gate Charge (nC)G

    A

    FO R TEST C IRCUITS E E F I G U R E 1 3

    V = -44V

    V = -28V

    I = -16A

    GS

    -V

    ,G

    ate-to-Source

    Voltage

    (V)

    D

    D S

    D S

    10

    10 0

    1 0 0 0

    0.4 0.8 1.2 1.6 2.0

    T = 25CJ

    V = 0 VG S

    SD

    SD

    A

    -I

    ,Reverse

    Drain

    Current(

    A)

    -V , Source- to -Dra in Vo l tage (V)

    T = 175CJ

    1

    10

    10 0

    1000

    1 10 100

    O PERA TIO N IN THIS AREA L IMITED B Y R DS(on)

    100s

    1m s

    10m s

    A

    T = 25 CT = 175CSingle Pulse

    C

    J

    DS-V , Drain-to-Source Vol tage (V)

    D-I

    ,Drain

    Current(A)

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    Fig 10a. Switching Time Test Circuit

    Fig 10b. Switching Time Waveforms

    Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case

    Fig 9. Maximum Drain Current Vs.Case Temperature

    VDS

    -10V

    Pulse Width 1 sDuty Factor 0.1 %

    RD

    VGS

    VDD

    RG

    D.U.T.

    VDS

    90%

    10%

    VGS

    td(on) tr td(off) tf

    +

    -

    25 50 75 100 125 150 1750

    5

    10

    15

    20

    25

    30

    35

    T , Case Temperature ( C)

    -I

    ,DrainCurrent(A)

    C

    D

    0.01

    0.1

    1

    10

    0.00001 0.0001 0.001 0.01 0.1

    Notes:

    1. Duty factor D = t / t

    2. Peak T = P x Z + T1 2

    J DM thJC C

    P

    t

    t

    DM

    1

    2

    t , Rectangular Pulse Duration (sec)

    ThermalResponse

    (Z

    )

    1

    thJC

    0.010.02

    0.05

    0.10

    0.20

    D = 0.50

    SINGLE PULSE(THERMAL RESPONSE)

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    Fig 13b. Gate Charge Test CircuitFig 13a. Basic Gate Charge Waveform

    Fig 12c. Maximum Avalanche EnergyVs. Drain Current

    QG

    QGS QGD

    VG

    Charge

    -10V

    D.U.T. VDS

    IDIG

    -3mA

    VGS

    .3F

    50K

    .2F12V

    Current Regulator

    Same Type as D.U.T.

    Current Sampling Resistors

    +

    -

    0

    10 0

    20 0

    30 0

    40 0

    50 0

    60 0

    70 0

    25 50 75 100 125 150 175

    J

    E

    ,

    Single

    Pulse

    Avalanche

    Energy(m

    J)

    AS

    A

    Start ing T , Junc tion Tem perature (C)

    V = -25V

    ITOP -6 .6A -11AB O T T O M - 1 6 A

    D D

    D

    Fig 12b. Unclamped Inductive Waveforms

    Fig 12a. Unclamped Inductive Test Circuit

    tp

    V (BR)DSS

    IA S

    R G

    IA S

    0 . 01tp

    D.U.T

    LV D S

    +

    -

    VDD

    D R I V E RA

    - 2 0 V

    15 V

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    Peak Diode Recovery dv/dt Test Circuit

    P.W.Period

    di/dt

    Diode Recoverydv/dt

    Ripple 5%

    Body Diode Forward Drop

    Re-AppliedVoltage

    ReverseRecoveryCurrent

    Body Diode ForwardCurrent

    VGS=10V

    VDD

    ISD

    Driver Gate Drive

    D.U.T. ISD Waveform

    D.U.T. VDS Waveform

    Inductor Curent

    D =P.W.

    Period

    +

    -

    +

    +

    +-

    -

    -

    RGVDD

    dv/dt controlled by RG ISDcontrolled by Duty Factor "D" D.U.T. - Device Under Test

    D.U.TCircuit Layout Considerations Low Stray Inductance Ground Plane Low Leakage Inductance Current Transformer

    * Reverse Polarity for P-Channel** Use P-Channel Driver for P-Channel Measurements

    *

    VGS*

    **

    [ ]

    [ ]

    ***VGS= 5.0V for Logic Level and 3V Drive Devices

    [ ] ***

    Fig 14. For P-Channel HEXFETS

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    L EAD ASSIGN MEN TS

    1 - GATE

    2 - D R AIN

    3 - SOU R C E

    4 - D R AIN

    - B -

    1 .32 ( .052)1.22 ( .048)

    3X0.55 ( .022)0.46 ( .018)

    2.92 ( .115)2.64 ( .104)

    4.69 ( .185)4.20 ( .165)

    3X0.93 ( .037)0.69 ( .027)

    4.06 ( .160)3.55 ( .140)

    1.15 ( .045) MI N

    6.47 ( .255)6.10 ( .240)

    3.78 ( .149)3.54 ( .139)

    - A -

    10.54 ( .415)10.29 ( .405)2.87 ( .113)

    2.62 ( .103)

    15.24 ( .600)14.84 ( .584)

    14.09 ( .555)13.47 ( .530)

    3X1.40 ( .055)1.15 ( .045)

    2.54 ( .100)

    2X

    0.36 ( .014) M B A M

    4

    1 2 3

    N O T E S :

    1 D IMEN SION IN G & TOL ER AN C IN G PER AN SI Y1 4 .5 M, 1 9 8 2 . 3 OU TL IN E C ON FOR MS TO JED EC OU TL IN E TO-2 2 0 AB.

    2 C ON TR OL L IN G D IMEN SION : IN C H 4 H EATSIN K & L EAD MEASU R E MEN TS D O N OT IN C L U D E BU R R S.

    P A R T N U M B E RI N T E R N A T I O N A L

    RECTIF IER L O G O

    EXAMP L E : THIS IS AN IRF1 0 1 0W I T H A S S E M B L YL O T C O D E 9 B 1 M

    A S S E M B L Y

    L O T C O D E

    D A T E C O D E

    ( Y Y W W )

    Y Y = Y E A R

    W W = W E E K

    9 2 4 6

    IRF1 0 1 0

    9 B 1 M

    A

    Part Marking Information

    TO-220AB

    Package OutlineTO-220AB Outline

    Dimensions are shown in millimeters (inches)

    WORLD HEADQUARTERS:233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331

    IR GREAT BRITAIN:Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020IR CANADA:15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200

    IR GERMANY:Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590IR ITALY:Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111

    IR FAR EAST:K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086IR SOUTHEAST ASIA:1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 221 8371

    IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673, Taiwan Tel: 886-2-2377-9936http://www.irf.com/ Data and specifications subject to change without notice. 4/99

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    Note: For the most current drawings please refer to the IR website at:

    http://www.irf.com/package/