The information contained in this poster is subject to a government license. Duramat Workshop

Golden, Colorado October 10 and 11 (2016)

This work was supported by the U.S. Department of Energy under Contract No. DE-AC36-08-GO28308 with the National Renewable Energy Laboratory. We would like to acknowledge SuNLaMP PVQAT funding from the Department of Energy

NREL is a national laboratory of the U. S. Department of Energy, Office of Energy Efficiency and Renewable Energy, operated by the Alliance for Sustainable Energy, LLC.

NREL Testing, Measurement, and Characterization Steve Johnston, Tim Silverman, Bill Marion, Chris Deline, Peter Hacke

1. Module-scale EL imaging (c-Si)

7. Testing of coupons and modules 8. Module-integrated electronics testing

2. Module-scale EL imaging (monolithic thin-film) 3. Module-scale thermal imaging

5. Performance and Energy Rating Testbed (PERT)

6. Testing of coupons and modules

Detect broken cells with electroluminescence (EL) imaging

High-rate EL imaging during mechanical stress

Characterize nonuniformity in different wavelength ranges using EL imaging

Detect damage due to partial

shade using EL imaging

InGaAs (700 nm–1700 nm)

Si (400 nm–1100 nm)

before

after

EL images can show cracks and defects in

the module.

ILIT amplitude image

thermal image

Identify and quantify shunts using illuminated lock-in thermography (ILIT)

Image through glass or backsheet of Si modules. (Better spatial resolution with backside imaging and lock-in)

Steady-state Dark lock-in thermography

Outdoor PL imaging of c-Si in full sunlight

Indoor PL to detect partial-

shade damage in

CIGS

Zoom into this

region

Module EL image PL EL

PL shows response from device, while EL shows that series resistance is high.

4. Module-scale PL imaging •  ISO 17025 accredited outdoor PV performance measurements •  Can resolve performance differences as small as 0.5% between side-

by-side PV modules •  15-minute I-V curves, peak-power tracking, and PV module temperature

data measured with Raydec Multi-Tracer

•  Irradiance measured with Kipp & Zonen CMP-22 pyranometers

•  45 PV module capacity •  PV module powers to

350 W •  Test durations from

days to years

•  Contact: bill.marion@nrel.gov

•  Contact: steve.johnston@nrel.gov, timothy.silverman@nrel.gov •  Contact: steve.johnston@nrel.gov, timothy.silverman@nrel.gov •  Contact: steve.johnston@nrel.gov, timothy.silverman@nrel.gov

•  Contact: steve.johnston@nrel.gov, timothy.silverman@nrel.gov

Multiple environmental chambers maybeusedfordampheat,humidityfreeze,thermalcycling,etc.;withcapabili:esforin-situevalua:onbydarkI-Vmethodsformodules

Multiple Xe and UV-A- based weathering chambers arealsoavailable.Asaltfogchamberisavailableforcorrosiontes:ng.

Optical and electrical characterization LightIV,DarkIV,FTIR,massspectroscopy,andRamenspectroscopyareavailableforanalysesofdegrada:onmechanisms.Variousspectrophotometers,reflectometers,andaglossmeterexistforanalyzingop:calproper:esofmaterials.

Mechanical properties Sta:cloading,pulltesters,iceballtes:ng,andothertoolsareavailableforexaminingadhesion,creep,andothermechanicalproper:es.

Wear and durability TABER,fallingsand,andbrushtes:ngequipmentarecapabili:esfortes:ngwearanddurabilityofsurfacesandcoa:ngs.

Surface scienceAgoniometerisacapabilityavailableformeasuringcontactangles.

Non-destructive analysis tools includingacous:cmicroscopyandX-raytomographyareavailableMetallography includingpolishing(sanding,FIB),microscopy,X-rayforstudyofmetalliza:on,adhesion,interfaces,etc.

Roof-top and field test beds OTFfacilityhasextensivesystemmonitoringforambienttemperature,moduletemperature,deviceheatsinktemperature,humidity,AC&DCcurrent,monitoringRMSpower,etc.Chamber testing Applica:onofhightemperaturestress,humidityfreeze,dampheat,etc.Poweredandunpoweredtests.Power analyzers YokogawaWT500

DC power suppliesforsourcingandDCloadingofdevices

LabVIEW soXwarefordrivingtes:ng

NREL Energy Systems Integration Facility (ESIF)forlargerscaletes:ng(gridsimulators,regenera:veloading,mul:-channelpoweranalyzers) Failure Analysis Mul:pleanalysis,imaging,andmicroscopytoolsavailable

•  See also posters by David Miller, Michael Kempe

•  See also capabilities by Nick Bosco, David Miller Steve Johnston, Michael Kempe and Mowafak Al-Jassim •  See also poster by Steve Johnston