overview of silicon p-n junctions - west virginia...
TRANSCRIPT
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Overview of Silicon p-n
Junctions
Dr. David W. Graham
West Virginia UniversityLane Department of Computer Science and Electrical Engineering
©
2009 David W. Graham
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p-n
Junctions (Diodes)
p-n
Junctions (Diodes)•
Fundamental semiconductor device
•
In every type of transistor•
Useful circuit elements (one-way valve)
•
Light emitting diodes (LEDs)•
Light sensors (imagers)
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p-n
Junctions (Diodes)
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p-type n-type
Bring p-type and n-type material into contact
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p-n
Junctions (Diodes)
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p-type n-type
•
All the h+
from the p-type side and e-
from the n-type side undergo diffusion→ Move towards the opposite side (less concentration)
•
When the carriers get to the other side, they become minority carriers•
Recombination → The minority carriers are quickly annihilated by the large number of majority carriers
•
All the carriers on both sides of the junction are depleted from
the material leaving•
Only charged, stationary particles (within a given region)•
A net electric fieldThis area is known as the depletion region (depleted of carriers)Size of the depletion region depends on the diffusion length
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Depletion Region
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Charge Density
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p-type n-type
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Depletion Region
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The remaining stationary charged particles results in areas with
a net charge
Cha
rge
Den
sity
pn xxw +=
x
ρ(x)
qND
-qNA
xn
xp
x=0
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Electric Field•
Areas with opposing charge densities creates an E-field
•
Total areas of charge are equal (but opposite)
•
E-field is the integral of the charge density
•
Poisson’s Equation
ε
is the permittivity of Silicon
Cha
rge
Den
sity
( ) ( )0ε
ρερ
SKxx
dxdE
==
x
ρ(x)
qND
-qNA
xn
xp
x=0
Ele
ctric
Fie
ld E
x
xnxp x=0
( )w
VVxqNxqNE
dxdVE
Abin
Dp
A −−=−=−=
−=
2max εε
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7
Potential
( )xEdxd
−=ψ
•
E-field sets up a potential difference
•
Potential is the negative of the integral of the E-field
Cha
rge
Den
sity
x
ρ(x)
qND
-qNA
xn
xp
x=0
Ele
ctric
Fie
ld E
x
xnxp x=0
Pot
entia
l ψ
x
Vbi
xnxp x=0
Built-In Potential•Integrate the E-field within the depletion region•Use the Einstein Relation
mVq
kTU
nNN
qkTV
T
i
DAbi
9.25
ln 2
==
⎟⎟⎠
⎞⎜⎜⎝
⎛=
Let
Vbi
typically in the range of 0.6-0.7V
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8
Band Diagram
•
Line up the Fermi levels•
Draw a smooth curve to connect them
EC
EfEV
Band
Dia
gram
Pot
entia
l ψ
x
Vbi
xnxp x=0
Cha
rge
Den
sity
x
ρ(x)
qND
-qNA
xn
xp
x=0
Ele
ctric
Fie
ld E
x
xnxp x=0
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9
Asymmetric Doping (NA
=4ND
)
E
x
xnxp x=0
ψ
x
Vbi
xnxp x=0
x
ρ(x)
qND
-qNA
xnxp x=0
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10
p-n
Junction Band Diagram
p n
VA
EC
EfEV
p-type n-type
VA
is the applied bias
p n
Depletion Region
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11
p-n
Junction –
No Applied Bias
p n
VA
If VA
= 0
EC
EfEV
EC
EfEV
•
Any e-
or h+
that wanders into the depletion region will be swept to the other side via the E-field
•
Some e-
and h+
have sufficient energy to diffuse across the depletion region
•
If no applied voltageIdrift
= Idiff
p n
Depletion Region
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12
p-n
Junction –
Reverse Biased
p n
VA
If VA
< 0
•
Barrier is increased•
No diffusion current occurs (not sufficient energy to cross the barrier)
•
Drift may still occur•
Any generation that occurs inside the depletion region adds to the drift current
•
All current is drift current
Reverse Biased
EC
EfEV
p n
Depletion Region
Expands
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13
p-n
Junction –
Forward Biased
p n
VA
If VA
> 0
•
Barrier is reduced, so more e-
and h+
may diffuse across•
Increasing VA
increases the e-
and h+
that have sufficient energy to cross the boundary in an exponential
relationship (Boltzmann Distributions)→Exponential increase in
diffusion current•
Drift current remains the same
Forward Biased
EC
EfEV
p n
Depletion RegionShrinks
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14
p-n
Junction Diode
( )10 −= TA nUVeII
Combination of drift and generation
Diffusion Drift
qkTUT = → Thermal voltage = 25.86mV
⎩⎨⎧
=21
n
⎟⎟⎠
⎞⎜⎜⎝
⎛+=
D
i
p
p
A
i
n
n
Nn
LD
Nn
LDqAI
22
0
Cq 1910602.1 −×= A
= cross-sectional area
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15
p-n
Junction Diode( )
⎩⎨⎧
−≈−=
0
00 1
IeI
eIITA
TA
nUVnUV for VA
> 0
for VA
< 0
I
-I0VA
( )1
1
0
0
−=
−=
TA
TA
nUV
nUV
eII
eII( )
( ) ( ) ( )
( ) ( )0
0
0
lnln
lnlnln
lnln
InUVI
IeI
eII
T
A
nUV
nUV
TA
TA
+=
+=
=⎟⎟⎠
⎞⎜⎜⎝
⎛
ln(I)
ln(I0)
VA
nkTq
nUT
=1
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16
Curve Fitting Exponential Data (In MATLAB)
TA nUVeII 0≈
Curve Fitting Exponential Data (In MATLAB)
•
Given I and V (vectors of data)•
Use the MATLAB functions•polyfit –
function to fit a polynomial (find the coefficients)•polyval –
function to plot a polynomial with given coefficients and x values[A] = polyfit(V,log(I),1);% polyfit(independent_var,dependent_var,polynomial_order)% A(1) = slope% A(2) = intercept
[I_fit] = polyval(A,V);% draws the curve-fit line
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17
Size of the Depletion Region
( ) ( )
( ) ( )
( )2
1
0
21
0
21
0
2
2
2
⎥⎦
⎤⎢⎣
⎡−
+=
+=
=
⎥⎦
⎤⎢⎣
⎡−
+=
⎥⎦
⎤⎢⎣
⎡−
+=
AbiDA
DAs
pn
nA
D
AbiDAA
Dsp
AbiDAD
Asn
VVNNNN
qK
xxw
xNN
VVNNN
Nq
Kx
VVNNN
Nq
Kx
ε
ε
ε
VA
= Applied voltage= 0 under equilibrium conditions
q
= Unit of charge= 1.602x10-19C
Ks
= Semiconductor dielectric constant= Relative permittivity= 11.8 (Silicon)
ε0
= Permittivity of free space= 8.854x10-12F/m
w
= Width of depletion region
Depends on•
Doping•
Applied voltage
Depletion region extends farther into the more lightly doped side.
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18
Size of the Depletion Region
Asymmetric Doping•
One side of the p-n
junction is more heavily doped
•
Depletion region extends mostly into lightly doped side•
Common in CMOS processes
•
Ex. NA
>> ND
( )
D
A
p
n
AbiD
sn
NN
xx
VVqNKx
≈
⎥⎦
⎤⎢⎣
⎡−=
21
02 ε
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19
Reverse-Biased p-n
Junction Capacitance
•
With reverse-biased diodes, there is very small current flow (neglect)
•
(Forward-biased diodes must account for movement of charge)
•
Total charge in depletion region given by width of depletion region times concentration of immobile charge
•
Capacitance definition
•
Junction CapacitancedAC ε
=
wAKC s
J0ε=
A cross-sectional area (i.e. the semiconductor has depth (3-D))
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20
Small-Signal Reverse-Biased Capacitance
p n
VA
=0
VA
<0VA
<0xnxp
Small changes in VA
around a DC bias value•
Small change in charge (Q) around a baseline level of charge (on each side of the junction
•
Results in a “small-signal”
capacitance, Cj•
Baseline charge in the depletion region
( )
+−
+
=
⎥⎦
⎤⎢⎣
⎡−
+=
VVNN
NNqKQ AbiDA
DAs
21
02 ε on the n-type side
(charge must be offset)
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21
Small-Signal Reverse-Biased Capacitance
Small changed in charge (for VA
= 0) is the small-signal capacitance
( )
( )DAbi
DAsj
bi
A
j
DA
DA
Abi
s
Aj
NNVNNqKC
VV
CNN
NNVV
qKdVdQC
+=
+=⎥
⎦
⎤⎢⎣
⎡+−
==+
2
12
00
02
1
0
ε
ε
Cj0 Depletion capacitance per unit area at VA=0
VA
is the reverse bias here(i.e. VA
>0 for a reverse bias)
Zero-bias junction capacitance
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22
Small-Signal Reverse-Biased CapacitanceOne-Sided Junctions•
Lightly doped on one side•
Common case with substrate/well
( )
bi
Dsj
A
DA
bi
A
j
Abi
Ds
Aj
VNqKC
VNN
VV
CVVNqK
dVdQC
2
01
2
00
00
ε
ε
=
<>>
+=
−==
+
for
Smaller depletion capacitances for more lightly doped substrates
Therefore, immobile charge on each side of a reverse biased substrate
012 0 <+= Abi
Abij V
VVVCQ for
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23
Small-Signal Reverse-Biased Capacitance
• Cj
is a nonlinear capacitance•
Decreases with increasing reverse bias
VA0
Cj
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24
Large-Signal Reverse-Biased Junction Capacitance
•
Approximate with an average value•
Use two extreme values for the average
( ) ( )
⎟⎟⎠
⎞⎜⎜⎝
⎛+−+
−=∴
−−
==
−bibi
bijavj V
VVV
VVVC
C
VVVQVQ
VQC
12
12
0
12
12
112
(Average)
Rough
ballpark estimate
20j
avj
CC =−
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25
Forward-Biased Junction Capacitance•
Appreciable amount of current flowing
•
More carriers present at the edges of the depletion region
•
Therefore, total capacitance is composed of– Cj Junction Capacitance– Cd Depletion Capacitance
T
Dtd
jd
jj
djT
UIC
CC
CC
CCC
τ=
>>
≈
+=
)(typically
where
02
τt Transit time of diodeGiven parameter for a specific process
x
xt D
L 2
=τ where x
is the more heavily doped side
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26
Small-Signal Junction Resistance
Change in diode voltage as the forward-bias current changes
( )
D
Td
T
DnUV
T
nUV
DD
D
d
InUr
nUIeI
nUeI
dVd
dVdI
rTDTD
=∴
====
0011
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27
Small-Signal Equivalent Model
•
For small changes around a DC bias•
For forward-biased p-n
junctions
x
xt
T
DtdjjdjT
D
Td D
LUICCCCCC
InUr
2
02 ==≈+== ττ
rd Cj Cd
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28
Bipolar Junction Transistors (BJTs)•
Two back-to-back p-n
junctions
•
Either npn
or pnp•
Not the focus of this class
–However, they are inherent in CMOS processes (parasitically)–Can be useful in reference circuits–Can cause problems (latchup)
Emitter Base Collector
n np
•
Typically biased in “forward active”
mode–BE junction forward biased–BC junction reverse biased
![Page 29: Overview of Silicon p-n Junctions - West Virginia Universitycommunity.wvu.edu/~dwgraham/classes/ee551/slides/pn_junctions.… · p-n Junction – Forward Biased pn VA If V A > 0 •](https://reader034.vdocument.in/reader034/viewer/2022042218/5ec4973de147045b4071a62b/html5/thumbnails/29.jpg)
29
BJT Band Diagram
EC
EV
E B C
•
Virtually no current from C to B•
Exponential change in current from E to B based upon VBE
(just like forward biased diodes)
•
Current flows from E to C•
B modulates how much current flows
![Page 30: Overview of Silicon p-n Junctions - West Virginia Universitycommunity.wvu.edu/~dwgraham/classes/ee551/slides/pn_junctions.… · p-n Junction – Forward Biased pn VA If V A > 0 •](https://reader034.vdocument.in/reader034/viewer/2022042218/5ec4973de147045b4071a62b/html5/thumbnails/30.jpg)
30
BJT Equations
B
E
C
VBE+
-
IBIC
IE
B
E
CBJT Equations (Forward Active)
( )
1,
1
1
+=
−=
=
+==
==
ββα
ααβ
β
βα
α
FF
F
BC
BUV
F
SE
EFUV
sC
II
IeII
IeII
TBE
TBE
Typical Values
99.0100==
Fαβ
Almost all current is passed from E to C. Very little B current
Is
, α, β
are constants
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Designable BJT ParametersDesignable Parameters•
Emitter Area, AE•
Base Width, W•
(These may not be designable in CMOS processes)
For npn
transistor
WNDLND
WNnqDAI
Ap
pDn
A
inEs
=
=
β
2
If pnp, swap the following subscripts• n
↔ p• D ↔ A