R&D Plan in FY2003R&D Plan in FY2003

Vertex Detector SubgroupVertex Detector SubgroupY. SugimotoY. Sugimoto11 Apr. 200311 Apr. 2003

Activity in FY2002Activity in FY2002 Development of CPCI ADCDevelopment of CPCI ADC

Design has been completedDesign has been completed Modules will delivered in this summerModules will delivered in this summer

Radiation Damage StudyRadiation Damage Study High energy (150MeV) electron irradiation at High energy (150MeV) electron irradiation at

Tohoku Univ. Tohoku Univ. Sr-90 irradiation at KEKSr-90 irradiation at KEK 6x106x101010 /cm /cm22 electrons irradiated in both cases electrons irradiated in both cases 150MeV electrons have x3 (not x10) larger 150MeV electrons have x3 (not x10) larger

effecteffect

Activity Plan in FY2003Activity Plan in FY2003 CCD Radiation Damage StudyCCD Radiation Damage Study Development of CPCI ADC Development of CPCI ADC Study of Thin CCD WaferStudy of Thin CCD Wafer Study of Diffusion in Epitaxial LayerStudy of Diffusion in Epitaxial Layer SimulationSimulation

CCD Radiation Damage CCD Radiation Damage StudyStudy

Irradiation of HE electronsIrradiation of HE electrons 1 shift x 4 machine times ( up to 101 shift x 4 machine times ( up to 101212/cm/cm22)) More accurate and reliable dose monitorMore accurate and reliable dose monitor

Irradiation of Sr-90 Irradiation of Sr-90 Same dose as HE electron irradiationSame dose as HE electron irradiation Reliable comparison with HE irradiationReliable comparison with HE irradiation

CCD Radiation Damage Study CCD Radiation Damage Study (Cont.)(Cont.)

Study of characteristics of irradiated CCDsStudy of characteristics of irradiated CCDs IIdd vs. Temp vs. Temp Flat-band Voltage ShiftFlat-band Voltage Shift CTI vs. TempCTI vs. Temp CTI vs. Readout frequencyCTI vs. Readout frequency CTI vs. Fat-zero chargeCTI vs. Fat-zero charge CTI vs. clock pulse width/heightCTI vs. clock pulse width/height xx vs. dose vs. dose E-dependence of items listed aboveE-dependence of items listed above Annealing/anti-annealingAnnealing/anti-annealing

Development of CPCI ADCDevelopment of CPCI ADC Get CPCI ADC Modules from Get CPCI ADC Modules from

companycompany Planned in AugustPlanned in August

CCD Timing CircuitCCD Timing Circuit Use FPGAUse FPGA Generate drive pulses for CCD (TTL) and clock Generate drive pulses for CCD (TTL) and clock

pulses for CPCI ADC (LVDS)pulses for CPCI ADC (LVDS) Construction of CPCI DAQ systemConstruction of CPCI DAQ system

CPCI DAQ SystemCPCI DAQ System ExampleExampleCompact PCI Crate (6U)

ADC CPU

C

ard

Gbit HubHost PC with Gbit NIC

Study of Thin CCD WaferStudy of Thin CCD Wafer MotivationMotivation

CCDs have ~20CCDs have ~20m thick sensitive regionm thick sensitive region Should be thinned to ~20Should be thinned to ~20m if mechanical strengtm if mechanical strengt

h is ensuredh is ensured Sample WafersSample Wafers

Picture frame type ---- No goodPicture frame type ---- No good Honeycomb/SHOJI type will be studiedHoneycomb/SHOJI type will be studied

Strength calculation with ANSISStrength calculation with ANSIS If OK, make sample wafersIf OK, make sample wafers

Sample WaferSample Wafer Honeycomb TypeHoneycomb Type Shouji TypeShouji Type

Average thicknAverage thickn

essess

　　 = 76= 76mm = 100= 100m (inm (in

cludeingcludeing edge)edge)

Study of Diffusion in Epi-LayerStudy of Diffusion in Epi-Layer Diffusion of electrons in Diffusion of electrons in

Epi. LayerEpi. Layer Key of excellent spatial reKey of excellent spatial re

solution for CCD & CMOS solution for CCD & CMOS pixel sensorspixel sensors

Takes time to diffuse Takes time to diffuse d = sqrt(Dt)d = sqrt(Dt) d ~ 6d ~ 6m @ t=10nsm @ t=10ns May not work at TESLAMay not work at TESLA

Measure charge spread Measure charge spread as a function of timeas a function of time

SimulationSimulation Simulation studies concerning Vertex det.Simulation studies concerning Vertex det.

Background study using Full Simulator (JIM, JUPITEBackground study using Full Simulator (JIM, JUPITER) -- Sugimoto, AsoR) -- Sugimoto, Aso

Physics study using Quick Simulator -- G.B. YuPhysics study using Quick Simulator -- G.B. Yu Physics and Detector study using Full SimulatorPhysics and Detector study using Full Simulator

Future dream in FY2004~Future dream in FY2004~ Custom made CCDs withCustom made CCDs with

> 20MHz readout speed> 20MHz readout speed Multiple readout nodesMultiple readout nodes Notch structureNotch structure Charge injection capabilityCharge injection capability Readout by ASIC with multi-channel CDSs, Amplifiers, AReadout by ASIC with multi-channel CDSs, Amplifiers, A

DCs, and a MultiplexerDCs, and a Multiplexer Things to do in 2003 Things to do in 2003

Technical design of the prototype CCD ( with HPK)Technical design of the prototype CCD ( with HPK) Try to get \ -- Japan-US, KAKENHI, etc.Try to get \ -- Japan-US, KAKENHI, etc.