reliability issues for photovoltaic modules (presentation) · funded by department of energy...

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Reliability Issues for Photovoltaic Reliability Issues for Photovoltaic Modules Sarah Kurtz National Renewable Energy Laboratory National Renewable Energy Laboratory Golden, CO Funded by Department of Energy NREL/PR-520-46481 ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ Sarah Kurtz PV Reliability Page 1 October 15, 2009 NREL is a national laboratory of the U.S. Department of Energy, Office of Energy Efficiency and Renewable Energy, operated by the Alliance for Sustainable Energy, LLC.

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Page 1: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Reliability Issues for PhotovoltaicReliability Issues for Photovoltaic ModulesSarah Kurtz

National Renewable Energy LaboratoryNational Renewable Energy LaboratoryGolden, CO

Funded by Department of EnergyNREL/PR-520-46481

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 1October 15, 2009

NREL is a national laboratory of the U.S. Department of Energy, Office of Energy Efficiency and Renewable Energy, operated by the Alliance for Sustainable Energy, LLC.

Page 2: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Outline

• Solar – a huge success, but still a long way to go• Key approaches to solar electricityy y

• Solar thermal• Crystalline silicon• Thin film – amorphous silicon CdTe CIGS• Thin film – amorphous silicon, CdTe, CIGS• Concentrator – low- and high-concentration approaches

• Importance of reliability to success of solar• Reliability issues specific to each approach

• Silicon – strong performance; continuous improvement; quantitative predictionsquantitative predictions

• Thin film – uniform, large-area deposition for product development and sensitivity to moisture; metastabilities

• Concentrator product development; simultaneous

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 2October 15, 2009

• Concentrator – product development; simultaneous optimization of multiple components

Page 3: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Growth of photovoltaic (PV) industry

Tons of Si passes

Area of Si passes

Tons of Si passes microelectronics

2006

microelectronics2001

0.01%-0.1% of electricity now comes from PV - extrapolates to > 5% in 2020

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 3October 15, 2009

competitive with conventional electricity for 0.1% - 1% of market; more in futureRogol, PHOTON International August 2007, p 112.

3

Page 4: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Growth of PV industry

Annual replacement of electricity capacity for 20 yr cycle

100

ped

Annual new electricity capacity 1996-2006*

10

of P

V s

hip

If we can maintain the

1

GW

If we can maintain the currentgrowth rate, PV will reach majormilestones in less than 10 yrs

If we can maintain the current growth rate, PV will reach major milestones in < 10 yrs

20202015201020052000Y

milestones in less than 10 yrsmilestones in < 10 yrs

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 4October 15, 2009

Year*www.eia.doe.gov/emeu/international/electricitycapacity.html (4012-2981 GW)/10 yr

Page 5: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Solar energy is abundantConvenient truth: small area can supply our energy needsConvenient truth: small area can supply our energy needs

5-6 kWh/sq m/dayAt 10%

efficiency, y,area needed

for US electricity

>10 kWh/sq m/day>10 kWh/sq m/day

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 5October 15, 2009

Sunlight reaching earth in 1 hour is enough to power the world for 1 year

Page 6: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Solar thermal electricParabolic trough is the primary technology todayResurgence of interest~ 400 MW installedCurrently generates ~ 0.01% of US electricityyCan generate electricity into the evening & use fuel into the night

80

60

r in

US

Solar thermalParabolic trough

40

20com

plet

ed/y

r20

0

MW

c

20052000199519901985

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 6October 15, 2009

Year4 GW planned in US by 2014

Page 7: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

64 MW S l i P b li64 MW Solargenix Parabolic Trough Plant in Nevada -

2007

1-MW Arizona Trough Plant – near Tucson AZ 2006

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 7October 15, 2009

Tucson, AZ - 2006

Page 8: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 8October 15, 2009

8

Page 9: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Three key approaches to photovoltaic (PV) panels

Two strategies to reduce semiconductor material

Conventional approach

FrontSolar cell

2. Thin film

Back 1. Silicon

Reduce cost by reducing use

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 9October 15, 2009

3. Concentratorof semiconductor

Page 10: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Many technology choices

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 10October 15, 2009

10

Page 11: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

One “winner” or many technologies?

Nickel cadmium Nickel metal hydrideAlkaline Nickel metal hydridea e

Lithi i

Lead acid

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 11October 15, 2009

Lithium ion

LithiumDifferent technologies for different applications

Page 12: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Cost of electricity: two or three parts2 O ti d i t

6

5

1. Initial price (estimates*) 2. Operation and maintenance- Fuel cost (Coal PV - Operation (Coal PV - Maintenance (Coal PV s

($/W

)

5

4

3st ($

/W)

e es

timat

es

PV is already competitive for peak power in some locations3

2

1

Initi

al c

os

3. Total electricity generated- Capacity factor (Coal PV es

of p

rice

1

0Old coal New coal Clean coal PV

p y ( Coal ~100%; PV ~ 25%)- Life of plant (Coal PV

*Fortnightly’s SPARK, p. 10, May 2008

Exa

mpl

e

Upfront costs for PV and coal plants are converging Ongoing costs are less for PV

o g y s S , p 0, ay 008

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 12October 15, 2009

Operation only during daylight hours increases cost by ~X4 Key remaining question is life of PV plant (30 years?)

Page 13: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Importance of reliability & durability1 01.0

0.8

cost

Performance of good system

0.6

man

ce o

r c Performance of systems with problems

0.4

ativ

e pe

rfor

O ti d i t t O&M t0.2

0.0

Rel

a Operation and maintenance costs for systems with problems

O&M costs for good system

Cost of solar electricity depends on degradation, lifetime, & ongoing costs

2520151050

Year

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 13October 15, 2009

Those paying for upfront investment want guarantee of system life

Page 14: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

How to satisfy the investor?

Historically, degradation & failure mechanisms have been found in the field that were not found in accelerated testing

Predictive models need to be validated with field data

Big challenge: How can we give 30-year predictions for degradation & failure rates when the product has only been in the field for 1-2 years?

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 14October 15, 2009

Page 15: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Silicon modules

SiliconSGlass

Si module cross section

EVA

EVA

Backsheet

Silicon cell Tab

Common encapsulation materialsEVA Ethylene vinyl acetateEVA - Ethylene vinyl acetatePET - polyethylene terephthalatePVF - poly vinyl fluoride

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 15October 15, 2009

Page 16: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

History of Si module qualification test: JPL (Jet Propulsion Lab) Block buys

Test I II III IV V

Year 1975 1976 1977 1978 1981

Th l 100 l 50 l 50 l 50 l 200 lThermal Cycle (°C)

100 cycles-40 to +90

50 cycles-40 to +90

50 cycles-40 to +90

50 cycles-40 to +90

200 cycles-40 to +90

Humidity 70 C, 90%RH, 68 hr

5 cycles40 C 90%RH

5 cycles40 C 90%RH

5 cycles54 C 90%RH

10 cycles85 C 85%RH68 hr 40 C, 90%RH

to 23 C40 C, 90%RH to 23 C

54 C, 90%RH to 23 C

85 C, 85%RH to -40 C

Hot spots - - - - 3 cells, 100 hrshrs

Mechanical load

- 100 cycles ± 2400 Pa

100 cycles ± 2400 Pa

10000 cyc. ± 2400 P

10000 cyc. ± 2400 Pa

H il 9 i t 10 i tHail - - - 9 impacts 3/4” - 45 mph

10 impacts 1” - 52 mph

NOCT - - - Yes Yes

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 16October 15, 2009

High pot - < 15 µA 1500 V

< 50 µA 1500 V

< 50 µA 1500 V

< 50 µA 2*Vs+1000

Page 17: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

JPL Block buys led to dramatic improvementsO t d l i d (Whi l 1993)• One study claimed (Whipple, 1993):• Pre-Block V: 45% module failure rate

P t Bl k V 0 1% d l f il t• Post-Block V: <0.1% module failure rate• Studies of c-Si modules show that module failures

ll (i t d i t h t i l )are small (inverters dominate when cost is low)Unscheduled maintenance costs

69%

Currently, most reports imply that c-Si module failures are

dominated by improperInverters

dominated by improper installation, lightning strikes,

critters, etc. 21%

System

PV

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 17October 15, 2009

(Prog. PV 2008; 16:249) 10%

Page 18: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Today’s qualification standards are similar to JPLare similar to JPL

IEC 61215 - Crystalline silicon design qualification includes 18 test procedures pThermal cycling - 200 cycles -40°C to +85°CHumidity freeze - 10 cycles +85°C, 85% RH to -40°CD h t 1000 h t +85°C 85% RHDamp heat - 1000 hrs at +85°C, 85% RHWet leakage current - Wet insulation resistance X area >

40 MΩm2 at 500 V or system voltageRequirement is typically to retain 95% of original power

production

IEC 61646 (thin film) and IEC62108 (CPV) IEC 61646 (thin film) and IEC62108 (CPV) are similar

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 18October 15, 2009

www.iec.ch

Page 19: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Silicon modules – remaining challenges

New materials (reduce cost, improve performance) – will these have same reliability?y

Continued quality assurance (e.g. impurities in Si give light-induced degradation)

Arcing, grounding, power conditioning, other system-related problems

Confident, long-term, quantitative predictions

Typical degradation rates are 0-1%/yr (difficult to measure); field failure rates are often < 0.1%/yr

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 19October 15, 2009

Proven module does not guarantee new products

Page 20: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Past success does not guarantee future success

C-Si

Thin filmThin film70%

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 20October 15, 2009

20About two-thirds of degradation rates are measured as < 1%/yr33rd PVSC, TamizhMani, 2008

Page 21: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Measurement of degradation rates takes years

12001.0

0 9-0.14%/yrDC power

1000

g (W

)

0.9

0.8

Inverte

inverterreplacedinverterreplaced

p

800

ower

ratin

g

0.7

er efficiency

inverterefficiency

600

Po

0.6

y

ASE Americas Si modules

400 0.52003 2005 2007

Xantrex Suntie 2500

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 21October 15, 2009

Need precise measurement of irradiance, temperature, etc. 21

Time

Page 22: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Thin-film approaches on the market

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 22October 15, 2009

CuIn(Ga)Se CdTe Amorphous silicon

Page 23: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Thin-film approach

• First Solar (Toledo, OH) - 5th biggest PV company in world in 2007p y

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 23October 15, 2009

Page 24: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Thin-film structures

Glass

CdTe uses superstrate

Glass for protection

CuInGaSe uses substrate

Glass

ITO or TCO

Glass for protection

CdS

CdT

ZnO or TCO

CdSNot to scaleCdTe

MetalCuInGaSe

scale

Molybdenum

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 24October 15, 2009

Glass for strength Glass

Page 25: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Monolithic module integration

5 x 120 µm

Conductor

Device

Conductor

ContactCell

( )

ContactCell

(I ti )

Active Cell

+(Inactive)(Inactive)

–w

Glass

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 25October 15, 2009

Page 26: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Hurdle for thin films: uniformity of deposition

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 26October 15, 2009

Page 27: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Hurdle for thin films: uniformity of interconnections

5 x 120 µm

Conductor

Device

Conductor

ContactCell

( )

ContactCell

(I ti )

Active Cell

+(Inactive)(Inactive)

–w

Glass

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 27October 15, 2009

Page 28: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Module metastability: Reversible vs irreversible changes

• Amorphous silicon degrades in light and recovers when annealed in the darkCIGS d CdT h t i t• CIGS and CdTe can show transients

9Rated efficiency

9

8

%)

June 2003

JulyJuly

Jan 20090.2 kWh/m

2Jan 2009

0.2 kWh/m2

0.25 kWh/m2

start test0.25 kWh/m

2

start test

7

6Effi

cien

cy (%

July2008

Dec2008Dec

2008

July2008 2.75 kWh/m

2

tested same day2.75 kWh/m

2

tested same day

3.15 kWh/m2

tested next day3.15 kWh/m

2

tested next day

50°Covernight

50°Covernight

0°C0°C As high as 6

5

tested next daytested next dayovernight

0 Covernight

CIGS d l CIGS no exposure

30% metastability

has been observed

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 28October 15, 2009

4CIGS modulesCIGS 3-year exposure in Florida

Page 29: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Damp heat can cause degradation ZnO (and other transparent conductors) react

with moisture, causing increase in series i tresistance

CuInGaSe may react with moistureT t C d ti O idTransparent Conductive Oxides

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 29October 15, 2009

Page 30: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Many possible failure mechanisms

• CdTe has shown instability of back contact (diffusion?)( )

• Edge seal may allow water into glass/glass module• Partial shunts or conducting diodes may be seen at

scribe lines or other defected areas• Adhesion to glass can be problem

Role of sodium is important in CuInGaSe modules• Role of sodium is important in CuInGaSe modules, but sodium can move

• Currently, the biggest effort with CuInGaSe is to try to y, gg yput it on a flexible substrate – requires excellent barrier coating unless cell can be hardened to moisture

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 30October 15, 2009

moisture

Page 31: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Range of concentrator approaches

Amonix JX Crystals

High concentration Low concentration

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 31October 15, 2009

• 35% - 40% cells• 400X – 1500 X

• 15% - 25% cells• 2X – 100 X

Page 32: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

CPV challenges – many interactions

CPV can fail in many ways, but it can be difficult to understand where the problem is and to fix the pproblem without creating a new problem

• Tracking – optics must be aligned with the sun• Optics – durability can be problem, soiling; optics

affect rest of system• Cell – must be encapsulated, but not affected by

UV; size of cell affects rest of system• Heat sink – must be electrically isolated, but

excellent thermal contact

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 32October 15, 2009

• Modularity may be benefit!

Page 33: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

UV transmission

Analysis of transmitted optical spectrum enabling accelerated testing of CPV designs

SPIE 2009 David Miller, et al

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 33October 15, 2009

Page 34: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Bonds to heat sink and optics

Optic Optical bond with 100% Transmission50 W/sq cmElectrical

Cell

H t i k

contactSmall T (<10°C)Electrical isolation

Heat sink No voidsT cycle OK

• Borrowing experience from power electronics and DBC (direct bonded copper) makes this a smaller

IR image of void in die attach

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 34October 15, 2009

issue• Intense UV may be a substantial problem, but optics may not transmit UV

Bosco 34th PVSC

Page 35: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Concentrators – reliability challenges

• Wide variety of designs• Qualification test is not well established• Qualification test is not well established• Companies spend time developing their own

l t d t t t d d taccelerated tests to speed product development cycles

• Very few companies have heritage with field testing

• Everyone wants to bring a product to market immediately

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 35October 15, 2009

y

Page 36: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Concentrator technology

CreativeCreative optical designs?designs?

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 36October 15, 2009

Page 37: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Summary

• Solar is growing rapidly and could become a i ifi t f l t i it ithi 10 20significant source of electricity within 10-20 yrs

• Silicon modules are performing well in the field; reliability testing of new designs is still importantreliability testing of new designs is still important

• CdTe and CuInGaSe modules are sensitive to moisture, so must be carefully sealed; only

h Si d l il bl i fl ibl famorphous Si modules are available in flexible form• Concentrator PV is in product development stage, but

is benefiting from expertise in other industriesis benefiting from expertise in other industries• In general, PV industry can benefit from the reliability

testing experience of the microelectronics industry

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 37October 15, 2009

Let’s work together to help PV grow!

Page 38: Reliability Issues for Photovoltaic Modules (Presentation) · Funded by Department of Energy NREL/PR-520-46481 Sarah Kurtz ASTR 2009 Oct 7 – Oct 9, Jersey City, NJ PV Reliability

Planet powered by renewable energygy

By year 2100 or before?Thank you for your attention!y y

Thank you to :yDave AlbinGlenn AlersNick BoscoJoe del CuetoChris Deline

GEd GelakSteve GlickPeter HackeDirk JordanMike KempeTom MoriconeTom MoriconeBill MarionDavid MillerMatt MullerJohn PernJose Rodriguez

ASTR 2009 Oct 7 – Oct 9, Jersey City, NJSarah KurtzPV Reliability Page 38October 15, 2009

gBill SekulicRyan SmithKent TerwilligerDavid Trudell