rf power field effect transistors - nxp.com · par = 9.8 lateral n-channeldb @ 0.01% probability on...
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MRFE6S9201HR3 MRFE6S9201HSR3
1RF Device DataFreescale Semiconductor
RF Power Field Effect TransistorsN-Channel Enhancement-Mode Lateral MOSFETs
Designed for broadband commercial and industrial applications withfrequencies up to 1000 MHz. The high gain and broadband performance ofthese devices make them ideal for large -signal, common-source amplifierapplications in 28 volt base station equipment.
• Typical Single -Carrier N-CDMA Performance: VDD = 28 Volts, IDQ =1400 mA, Pout = 40 Watts Avg., f = 880 MHz, IS-95 CDMA (Pilot, Sync,Paging, Traffic Codes 8 Through 13). Channel Bandwidth = 1.2288 MHz,PAR = 9.8 dB @ 0.01% Probability on CCDF.
Power Gain � 20.8 dBDrain Efficiency � 31.3%Device Output Signal PAR � 8.1 dB @ 0.01% Probability on CCDFACPR @ 750 kHz Offset � -46.5 dBc in 30 kHz Channel Bandwidth
• Capable of Handling 10:1 VSWR, @ 32 Vdc, 880 MHz, Pout = 270 W CW(2 dB Input Overdrive from Rated Pout), Designed for Enhanced Ruggedness
Features• 100% PAR Tested for Guaranteed Output Power Capability• Characterized with Series Equivalent Large-Signal Impedance Parameters
• Internally Matched for Ease of Use• Greater Negative Gate-Source Voltage Range for Improved Class C
Operation• Qualified Up to a Maximum of 32 VDD Operation• Integrated ESD Protection• RoHS Compliant• In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel.
Table 1. Maximum Ratings
Rating Symbol Value Unit
Drain-Source Voltage VDSS -0.5, +66 Vdc
Gate-Source Voltage VGS -6.0, +10 Vdc
Storage Temperature Range Tstg - 65 to +150 °C
Case Operating Temperature TC 150 °C
Operating Junction Temperature (1,2) TJ 225 °C
Table 2. Thermal Characteristics
Characteristic Symbol Value (2,3) Unit
Thermal Resistance, Junction to CaseCase Temperature 85°C, 197 W CWCase Temperature 75°C, 40 W CW
RθJC0.340.33
°C/W
1. Continuous use at maximum temperature will affect MTTF.2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access
MTTF calculators by product.3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes - AN1955.
Document Number: MRFE6S9201HRev. 1, 12/2008
Freescale SemiconductorTechnical Data
MRFE6S9201HR3MRFE6S9201HSR3
880 MHz, 40 W AVG., 28 VSINGLE N-CDMA
LATERAL N-CHANNELRF POWER MOSFETs
CASE 465A-06, STYLE 1NI-780S
MRFE6S9201HSR3
CASE 465-06, STYLE 1NI-780
MRFE6S9201HR3
© Freescale Semiconductor, Inc., 2007-2008. All rights reserved.
2RF Device Data
Freescale Semiconductor
MRFE6S9201HR3 MRFE6S9201HSR3
Table 3. ESD Protection Characteristics
Test Methodology Class
Human Body Model (per JESD22-A114) 1B (Minimum)
Machine Model (per EIA/JESD22-A115) A (Minimum)
Charge Device Model (per JESD22-C101) IV (Minimum)
Table 4. Electrical Characteristics (TC = 25°C unless otherwise noted)
Characteristic Symbol Min Typ Max Unit
Off Characteristics
Zero Gate Voltage Drain Leakage Current(VDS = 66 Vdc, VGS = 0 Vdc)
IDSS � � 10 μAdc
Zero Gate Voltage Drain Leakage Current(VDS = 28 Vdc, VGS = 0 Vdc)
IDSS � � 1 μAdc
Gate-Source Leakage Current(VGS = 5 Vdc, VDS = 0 Vdc)
IGSS � � 10 μAdc
On Characteristics
Gate Threshold Voltage(VDS = 10 Vdc, ID = 400 μAdc)
VGS(th) 1.5 2.2 3 Vdc
Gate Quiescent Voltage(VDD = 28 Vdc, ID = 1400 mAdc, Measured in Functional Test)
VGS(Q) 2.25 2.9 3.75 Vdc
Drain-Source On-Voltage(VGS = 10 Vdc, ID = 4.11 Adc)
VDS(on) 0.1 0.21 0.35 Vdc
Dynamic Characteristics (1)
Reverse Transfer Capacitance(VDS = 28 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Crss � 2.3 � pF
Output Capacitance(VDS = 28 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Coss � 90 � pF
Input Capacitance(VDS = 28 Vdc, VGS = 0 Vdc ± 30 mV(rms)ac @ 1 MHz)
Ciss � 480 � pF
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 1400 mA, Pout = 40 W Avg. N-CDMA, f = 880 MHz,Single-Carrier N-CDMA, 1.2288 MHz Channel Bandwidth Carrier. ACPR measured in 30 kHz Channel Bandwidth @ ±750 kHz Offset.PAR = 9.8 dB @ 0.01% Probability on CCDF.
Power Gain Gps 19.5 20.8 22.5 dB
Drain Efficiency ηD 29 31.3 � %
Output Peak-to-Average Ratio @ 0.01% Probability on CCDF PAR 7.7 8.1 � dB
Adjacent Channel Power Ratio ACPR � -46.5 -45 dBc
Input Return Loss IRL � -16 -9 dB
1. Part is internally matched on input.
(continued)
MRFE6S9201HR3 MRFE6S9201HSR3
3RF Device DataFreescale Semiconductor
Table 4. Electrical Characteristics (TC = 25°C unless otherwise noted) (continued)
Characteristic Symbol Min Typ Max Unit
Typical Performances (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 1400 mA, 865-900 MHz Bandwidth
Video Bandwidth @ 200 W PEP Pout where IM3 = -30 dBc(Tone Spacing from 100 kHz to VBW)ΔIMD3 = IMD3 @ VBW frequency - IMD3 @ 100 kHz <1 dBc (bothsidebands)
VBW� 10 �
MHz
Gain Flatness in 35 MHz Bandwidth @ Pout = 40 W Avg. GF � 0.19 � dB
Average Deviation from Linear Phase in 35 MHz Bandwidth @ Pout = 200 W CW
Φ � 0.461 � °
Average Group Delay @ Pout = 200 W CW, f = 880 MHz Delay � 11.66 � ns
Part - to-Part Insertion Phase Variation @ Pout = 200 W CW, f = 880 MHz, Six Sigma Window
ΔΦ � 14.97 � °
Gain Variation over Temperature(-30°C to +85°C)
ΔG � 0.011 � dB/°C
Output Power Variation over Temperature(-30°C to +85°C)
ΔP1dB � 0.39 � dBm/°C
4RF Device Data
Freescale Semiconductor
MRFE6S9201HR3 MRFE6S9201HSR3
Figure 1. MRFE6S9201HR3(HSR3) Test Circuit Schematic
Z1 0.227″ x 0.065� MicrostripZ2 0.938″ x 0.065� MicrostripZ3 0.492″ x 0.065� MicrostripZ4 0.046″ x 0.300″ MicrostripZ5 0.094″ x 0.300″ MicrostripZ6 0.141″ x 0.546″ x 0.300″ TaperZ7 0.076″ x 0.734″ x 0.546″ TaperZ8 0.023″ x 0.780″ x 0.734″ TaperZ9 0.170″ x 0.780″ Microstrip
Z1
RF
INPUT
C1
C43
Z2 Z3 Z4 Z5 Z7
Z12
C9
C8
C11 C38
C39
RF
OUTPUT
Z6
Z13 Z17 Z18 Z19 Z20 Z25
C4
B1
VBIAS
C20 C29 C31 C42 C26
VSUPPLY++
Z9
R4C2
R2
C14 C17
C10 C13 C16
C19
C18
C24
C22
Z21 Z22 Z23 Z24
Z10
+
Z11
R1
C6 C7
Z8
B2
R3C3
+
C5
DUT
Z26
C32C25C23
C21
C15
C12
Z16
C41
C40
Z15Z14
C30 C28 C27
C44 C46 C37 C33 C45
++
C36 C35 C34
Z10, Z11 0.853″ x 0.100″ MicrostripZ12 0.084″ x 0.780″ MicrostripZ13 0.086″ x 0.780″ MicrostripZ14 0.035″ x 0.780″ x 0.709″ TaperZ15 0.093″ x 0.709″ x 0.499″ TaperZ16 0.131″ x 0.499″ x 0.286″ TaperZ17 0.047″ x 0.365″ MicrostripZ18 0.054″ x 0.365″ Microstrip
Z19 0.020″ x 0.365″ MicrostripZ20 0.097″ x 0.065″ MicrostripZ21, Z22 0.050″ x 0.065″ MicrostripZ23 0.305″ x 0.065″ MicrostripZ24 0.456″ x 0.065″ MicrostripZ25 0.357″ x 0.065″ MicrostripZ26 0.340″ x 0.065″ MicrostripPCB Taconic RF-35, 0.030″, εr = 3.5
MRFE6S9201HR3 MRFE6S9201HSR3
5RF Device DataFreescale Semiconductor
Table 5. MRFE6S9201HR3(HSR3) Test Circuit Component Designations and ValuesPart Description Part Number Manufacturer
B1, B2 Short RF Beads 2743019447ROP50 Fair -Rite
C1, C4, C5, C20, C39, C44 33 pF Chip Capacitors ATC100B330JT500XT ATC
C2, C3 10 μF, 50 V Tantalum Capacitors T491C106K050AT Kemet
C6, C32, C38, C43 0.6-4.5 pF Variable Capacitors, Gigatrim 27271SL Johanson
C7, C12, C13, C14, C15, C16,C17, C25
3.3 pF Chip Capacitors ATC600F3R3BT250XT ATC
C8, C9 4.7 pF Chip Capacitors ATC600F4R7BT250XT ATC
C10, C11 15 pF Chip Capacitors ATC100B6R8JT500XT ATC
C18, C19, C21, C22, C23, C24 1.0 pF Chip Capacitors ATC600F1R0BT250XT ATC
C26, C45 470 μF, 63 V Electrolytic Capacitors EKMG630ELL331MJ20S United Chemi-Con
C27, C34 1.2K pF Chip Capacitors ATC100B1R2BT500XT ATC
C28, C35 20K pF Chip Capacitors ATC200B203MT50XT ATC
C29, C31, C37, C46 10 μF, 50 V Chip Capacitors GRM55DR61H106KA88B Murata
C30, C36 0.047 pF, 50 V Chip Capacitors C1825C473J5RAC Kemet
C33, C42 22 μF, 50 V Tantalum Capacitors T491C226K050AT Kemet
C40, C41 5.6 pF Chip Capacitors ATC600F5R6BT250XT ATC
R1, R2 12 Ω, 1/4 W Chip Resistors CRCW120612R0FKEA Vishay
R3, R4 1 KΩ, 1/4 W Chip Resistors CRCW12061001FKEA Vishay
Figure 2. MRFE6S9201HR3(HSR3) Test Circuit Component Layout
CU
T O
UT
AR
EA
MRFE6S9201H/HSRev. 0
B1
R4
C2
C1
C4 R1
C7
C6
C9R2
C8
C43C5
C3
R3B2
C45
C34 C35 C36
C37
C46
C33C44C11
C38C32
C39
C27
C28 C30C31
C26
C42
C29
C20
C10
C40
C41
C12
C15
C13
C14
C16
C17
C18
C19
C21C23
C22
C24
C25
6RF Device Data
Freescale Semiconductor
MRFE6S9201HR3 MRFE6S9201HSR3
TYPICAL CHARACTERISTICS
Gps
, PO
WE
R G
AIN
(dB
)
IRL,
IN
PU
T R
ET
UR
N L
OS
S (
dB)
AC
PR
(dB
c), A
LT1
(dB
c)
−25
0
−5
−10
−15
960800
IRL
Gps
ACPR
f, FREQUENCY (MHz)
Figure 3. Single-Carrier N-CDMA Broadband Performance @ Pout = 40 Watts Avg.
940920900880860840820
12
22
21
20
19
18
17
16
−65
40
35
30
25
−40
−45
−50
−55
η D,
DR
AIN
EF
FIC
IEN
CY
(%
)
ηD
VDD = 28 Vdc, Pout = 40 W (Avg.)IDQ = 1400 mA, N−CDMA IS−95 PilotSync, Paging, Traffic Codes 8 Through 13
15
14
13
20
−60 −20ALT1
Gps
, PO
WE
R G
AIN
(dB
)
IRL,
IN
PU
T R
ET
UR
N L
OS
S (
dB)
AC
PR
(dB
c), A
LT1
(dB
c)
−25
0
−5
−10
−15
960800
IRL
Gps
ACPR
f, FREQUENCY (MHz)
Figure 4. Single-Carrier N-CDMA Broadband Performance @ Pout = 84 Watts Avg.
940920900880860840820
12
22
21
20
19
18
17
16
50
30
20
−30
−40
−45
−50
−55η D
, D
RA
IN
EF
FIC
IEN
CY
(%
)ηD
15
14
13
−35
−60
−20ALT1
Figure 5. Two-Tone Power Gain versusOutput Power
100
23
1
IDQ = 2100 mA
Pout, OUTPUT POWER (WATTS) PEP
700 mA
1050 mA
22
21
20
10 400
Gps
, PO
WE
R G
AIN
(dB
)
19
18
Figure 6. Third Order Intermodulation Distortionversus Output Power
−10
1
IDQ = 700 mA
Pout, OUTPUT POWER (WATTS) PEP
1050 mA
100
−20
−30
−40
400−70
−50
10
INT
ER
MO
DU
LAT
ION
DIS
TO
RT
ION
(dB
c)
IMD
, T
HIR
D O
RD
ER
VDD = 28 Vdc, Pout = 84 W (Avg.)IDQ = 1400 mA, N−CDMA IS−95 PilotSync, Paging, Traffic Codes 8 Through 13
1400 mA
1750 mA
VDD = 28 Vdc, f1 = 880 MHz, f2 = 880.1 MHz
Two−Tone Measurements
−60
VDD = 28 Vdc, f1 = 880 MHz, f2 = 880.1 MHz
Two−Tone Measurements
1750 mA1400 mA
2100 mA
40
MRFE6S9201HR3 MRFE6S9201HSR3
7RF Device DataFreescale Semiconductor
TYPICAL CHARACTERISTICS
Figure 7. Intermodulation Distortion Productsversus Output Power
Pout, OUTPUT POWER (WATTS) PEP
IMD
, IN
TE
RM
OD
ULA
TIO
N D
IST
OR
TIO
N (
dBc)
0
1 100
−40
10
−20
−60
7th Order
VDD = 28 Vdc, IDQ = 1400 mA
f1 = 880 MHz, f2 = 880.1 MHz
Two−Tone Measurements
5th Order
3rd Order
400
Figure 8. Intermodulation Distortion Productsversus Tone Spacing
TWO−TONE SPACING (MHz)
10
−60
IM3−U
−20
−40
1 100
IMD
, IN
TE
RM
OD
ULA
TIO
N D
IST
OR
TIO
N (
dBc)
−50
−30IM3−L
IM5−U
IM5−L
IM7−L
−10
Figure 9. Pulsed CW Output Power versusInput Power
63
Pin, INPUT POWER (dBm)
Actual
Ideal62
Pou
t, O
UT
PU
T P
OW
ER
(dB
m)
29
P6dB = 54.86 dBm (306.2 W)
VDD = 28 Vdc, Pout = 200 W (PEP), IDQ = 1400 mA
Two−Tone Measurements
(f1 + f2)/2 = Center Frequency of 880 MHz
−80
−100
IM7−U
61
60
59
58
57
56
55
54
53
52
5130 31 32 33 34 35 36 37 38 39 40
VDD = 28 Vdc, IDQ = 1400 mA, Pulsed CW
12 μsec(on), 1% Duty Cycle, f = 880 MHz
P3dB = 54.18 dBm (261.82 W)
P1dB = 53.21 dBm
(209.41 W)
Figure 10. Single-Carrier N-CDMA ACPR, ALT1, PowerGain and Drain Efficiency versus Output Power
0 −90
Pout, OUTPUT POWER (WATTS) AVG.
70 −20
40
−40
30
−50
20
−60
10
10
−70
ηD
Gps TC = −30�C
ACPR
η D, D
RA
IN E
FF
ICIE
NC
Y (
%),
Gps
, PO
WE
R G
AIN
(dB
)
VDD = 28 Vdc, IDQ = 1400 mA
f = 880 MHz, N−CDMA IS−95 (Pilot
Sync, Paging, Traffic Codes 8
Through 13)
ALT
1, C
HA
NN
EL
PO
WE
R (
dBc)
AC
PR
, A
DJA
CE
NT
CH
AN
NE
L P
OW
ER
RA
TIO
(dB
c)
1 100 300
25�C
85�C
−30�C
25�C
85�C
50
60
−80
−30
25�C85�C
ALT1
8RF Device Data
Freescale Semiconductor
MRFE6S9201HR3 MRFE6S9201HSR3
TYPICAL CHARACTERISTICS
400
16 0
70
Pout, OUTPUT POWER (WATTS) CW
Figure 11. Power Gain and Drain Efficiencyversus CW Output Power
VDD = 28 Vdc
IDQ = 1400 mA
f = 880 MHz
TC = −30�C25�C
85�C
10
23
22
21
20
19
50
40
30
20
10
η D, D
RA
IN E
FF
ICIE
NC
Y (
%)
Gps
ηD
Gps
, PO
WE
R G
AIN
(dB
)
100
−30�C
25�C85�C
18
17
1
60
Figure 12. Power Gain versus Output Power
Pout, OUTPUT POWER (WATTS) CW
VDD = 24 V
Gps
, PO
WE
R G
AIN
(dB
)
35018
22
0
19
20
21
IDQ = 1400 mA
f = 880 MHz
50 100 200
28 V 32 V
150 250 300
250
108
90
TJ, JUNCTION TEMPERATURE (°C)
Figure 13. MTTF versus Junction Temperature
This above graph displays calculated MTTF in hours when the device
is operated at VDD = 28 Vdc, Pout = 40 W Avg., and ηD = 31.3%.
MTTF calculator available at http://www.freescale.com/rf. Select
Software & Tools/Development Tools/Calculators to access MTTF
calculators by product.
107
106
105
110 130 150 170 190
MT
TF
(H
OU
RS
)
210 230
MRFE6S9201HR3 MRFE6S9201HSR3
9RF Device DataFreescale Semiconductor
N-CDMA TEST SIGNAL
10
0.0001
100
0
PEAK−TO−AVERAGE (dB)
Figure 14. Single-Carrier CCDF N-CDMA
10
1
0.1
0.01
0.001
2 4 6 8
IS−95 CDMA (Pilot, Sync, Paging, Traffic Codes 8
Through 13) 1.2288 MHz Channel Bandwidth
Carriers. ACPR Measured in 30 kHz Bandwidth @
±750 kHz Offset. ALT1 Measured in 30 kHz
Bandwidth @ ±1.98 MHz Offset. PAR = 9.8 dB @
0.01% Probability on CCDF.
PR
OB
AB
ILIT
Y (
%)
.................
... ....... ......... ...... .................................
.
.......
...
......... ..... .............. ..... ... ... ..... . .... ..... .. ...
.
............ ..........................................
............... ........... ....... .........................
....... .... ......... ........... ... ... ... .......................
....................... .... .. .................... ..... .... ................... . ... ..... .... .... .. ....... ......... .. ... ... .. . ....... ... .......... .... .. ..
... .................. .. ... .
.............. .... ................................................................................. ... .... .....
... .............. ... ... ... ...................... .. ..... ........................ ....... .............. .
.............................. ...........................................................
.... ....... ............................ ....... ......................... ......... ................... .... .........
.....
......
....
..
..
..
....
....
..... ... ... .............. ...... ... ... .... .. ... .......... .. .... ... ................ ...... .....
.........................
..
..............
.
............
.
. ................. ..... . ...
........
...................................................
...
−60
−110
−10
(dB
)
−20
−30
−40
−50
−70
−80
−90
−100
+ACPR in 30 kHzIntegrated BW
1.2288 MHzChannel BW
2.90.7 2.21.50−0.7−1.5−2.2−2.9−3.6 3.6
f, FREQUENCY (MHz)
Figure 15. Single-Carrier N-CDMA Spectrum
−ACPR in 30 kHzIntegrated BW
−ALT1 in 30 kHzIntegrated BW
+ALT1 in 30 kHzIntegrated BW
10RF Device Data
Freescale Semiconductor
MRFE6S9201HR3 MRFE6S9201HSR3
Zload
Zsource
Zo = 5 Ω
f = 980 MHz
f = 820 MHz
f = 820 MHz
f = 980 MHz
VDD = 28 Vdc, IDQ = 1400 mA, Pout = 40 W Avg.
fMHz
Zsource�
Zload�
820 3.28 - j3.94 0.78 + j0.24
840 3.12 - j3.93 0.81 + j0.36
860 2.85 - j3.73 0.83 + j0.51
880 2.58 - j3.39 0.82 + j0.70
900 2.44 - j2.98 0.83 + j0.98
920 2.43 - j2.87 1.02 + j1.60
940 2.31 - j2.66 4.12 + j1.11
960 2.17 - j2.54 1.49 - j0.66
980 1.91 - j2.39 0.90 - j0.26
Zsource = Test circuit impedance as measured from gate to ground.
Zload = Test circuit impedance as measured from drain to ground.
Figure 16. Series Equivalent Source and Load Impedance
Zsource
Zload
Input
Matching
Network
Device
Under
Test
Output
Matching
Network
MRFE6S9201HR3 MRFE6S9201HSR3
11RF Device DataFreescale Semiconductor
PACKAGE DIMENSIONS
CASE 465-06ISSUE GNI-780
MRFE6S9201HR3
NOTES:1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M−1994.2. CONTROLLING DIMENSION: INCH.3. DELETED4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY
FROM PACKAGE BODY.
DIM MIN MAX MIN MAX
MILLIMETERSINCHES
A 1.335 1.345 33.91 34.16
B 0.380 0.390 9.65 9.91
C 0.125 0.170 3.18 4.32
D 0.495 0.505 12.57 12.83
E 0.035 0.045 0.89 1.14
F 0.003 0.006 0.08 0.15
G 1.100 BSC 27.94 BSC
H 0.057 0.067 1.45 1.70
K 0.170 0.210 4.32 5.33
N 0.772 0.788 19.60 20.00
Q .118 .138 3.00 3.51
R 0.365 0.375 9.27 9.53
STYLE 1:PIN 1. DRAIN
2. GATE 3. SOURCE
1
3
2
D
G
K
C
E
H
S
FS 0.365 0.375 9.27 9.52
M 0.774 0.786 19.66 19.96
aaa 0.005 REF 0.127 REF
bbb 0.010 REF 0.254 REF
ccc 0.015 REF 0.381 REF
Q2X
MAMbbb B MT
MAMbbb B MT
B
B(FLANGE)
SEATINGPLANE
MAMccc B MT
MAMbbb B MT
A A(FLANGE)
T
N (LID)
M (INSULATOR)
MAMaaa B MT
(INSULATOR)
R
MAMccc B MT
(LID)
CASE 465A-06ISSUE HNI-780S
MRFE6S9201HSR3
NOTES:1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M−1994.2. CONTROLLING DIMENSION: INCH.3. DELETED4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY
FROM PACKAGE BODY.
DIM MIN MAX MIN MAX
MILLIMETERSINCHES
A 0.805 0.815 20.45 20.70
B 0.380 0.390 9.65 9.91
C 0.125 0.170 3.18 4.32
D 0.495 0.505 12.57 12.83
E 0.035 0.045 0.89 1.14
F 0.003 0.006 0.08 0.15
H 0.057 0.067 1.45 1.70
K 0.170 0.210 4.32 5.33
M 0.774 0.786 19.61 20.02
R 0.365 0.375 9.27 9.53
STYLE 1:PIN 1. DRAIN
2. GATE5. SOURCE
1
2
D
K
C
E
H
F3
U(FLANGE)
4X
Z(LID)
4X
bbb 0.010 REF 0.254 REF
ccc 0.015 REF 0.381 REF
aaa 0.005 REF 0.127 REF
S 0.365 0.375 9.27 9.52
N 0.772 0.788 19.61 20.02
U −−− 0.040 −−− 1.02
Z −−− 0.030 −−− 0.76
MAMbbb B MT
B
B(FLANGE)
2X
SEATING
PLANE
MAMccc B MT
MAMbbb B MT
A A(FLANGE)
T
N (LID)
M (INSULATOR)
MAMccc B MT
MAMaaa B MT
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12RF Device Data
Freescale Semiconductor
MRFE6S9201HR3 MRFE6S9201HSR3
PRODUCT DOCUMENTATION
Refer to the following documents to aid your design process.
Application Notes
• AN1955: Thermal Measurement Methodology of RF Power Amplifiers
Engineering Bulletins• EB212: Using Data Sheet Impedances for RF LDMOS Devices
REVISION HISTORY
The following table summarizes revisions to this document.
Revision Date Description
0 Sept. 2007 • Initial Release of Data Sheet
1 Dec. 2008 • Updated Typical Performance Full Frequency Band to f = 880 MHz to match production test, p. 1
• Updated Part Numbers in Table 5, Component Designations and Values, to latest RoHS compliant partnumbers, p. 5
MRFE6S9201HR3 MRFE6S9201HSR3
13RF Device DataFreescale Semiconductor
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Document Number: MRFE6S9201HRev. 1, 12/2008