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SAMSUNG FOUNDRY 32/28nm Low-Power High-K Metal Gate Logic Process and Design Ecosystem Advances in Material Science As conventional Poly/SiON reached its limits, HKMG was introduced to continue gate dielectric scaling (Tox/Tinv). The 32/28nm LP HKMG integration achieved an array of benefits and improvements over 45nm LP Poly/SiON, including: 2x gate density increase (Superior area scaling with Gate-First HKMG) >100x lower gate leakage >40% delay improvement at fixed leakage ~10x leakage reduction at fixed speed HKMG ENABLES PERFORMANCE BOOST Leakage Delay SiON/Poly-Si High-k/Metal Gate 40% delay improvement ~10x reduction in leakage ADVANCED MANUFACTURING FOR ENERGY-EFFICIENT, HIGH-PERFORMANCE MOBILE AND IT INFRASTRUCTURE COMPUTING APPLICATIONS Samsung Foundry’s 32/28nm Low-Power (LP) Gate First High-k Metal Gate (HKMG) process node offers considerable power and performance advantages to a growing spectrum of mobile and IT infrastructure computing applications. Virtually all mobile applications relying on batteries and extremely tight power budgets demand 32/28nm LP solutions. But, low-power solutions are no longer limited to mobile applications. Reducing power is now a concern across a wide set of applications such as communications, networking, servers, and data centers. GATE DENSITY

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Page 1: SAMSUNG FOUNDRY · SAMSUNG FOUNDRY 32/28nm Low-Power ... Virtually all mobile applications relying on batteries and extremely tight power budgets demand 32/28nm LP solutions. But,

SAMSUNG FOUNDRY32/28nm Low-Power High-K Metal Gate Logic Process and Design Ecosystem

Advances in Material Science

As conventional Poly/Sion reached its limits, HKMG was introduced to continue gate dielectric scaling (Tox/Tinv). The 32/28nm

LP HKMG integration achieved an array of benefits and improvements over 45nm LP Poly/Sion, including:

• 2x gate density increase (Superior area scaling with Gate-First HKMG)

• >100x lower gate leakage• >40% delay improvement at fixed leakage

• ~10x leakage reduction at fixed speed

HKMG EnabLEs PErforMancE boost

Leak

age

Delay

SiON/Poly-Si

High-k/Metal Gate

40% delayimprovement

~10x reductionin leakage

ADvANceD MANUFActURiNG FOR eNeRGY-eFFicieNt, HiGH-PeRFORMANce MObile AND it iNFRAStRUctURe cOMPUtiNG APPlicAtiONS Samsung Foundry’s 32/28nm Low-Power (LP) Gate First High-k Metal Gate (HKMG) process node offers considerable power

and performance advantages to a growing spectrum of mobile and IT infrastructure computing applications.

Virtually all mobile applications relying on batteries and extremely tight power budgets demand 32/28nm LP solutions.

But, low-power solutions are no longer limited to mobile applications. Reducing power is now a concern across a wide set

of applications such as communications, networking, servers, and data centers.

GatE DEnsity

Page 2: SAMSUNG FOUNDRY · SAMSUNG FOUNDRY 32/28nm Low-Power ... Virtually all mobile applications relying on batteries and extremely tight power budgets demand 32/28nm LP solutions. But,

Industry’s First Foundry High-K Metal Gate Technology

28nm Migration Path

Before its introduction, Samsung Foundry

invested two years of development to

fine tune its 32nm LP HKMG process

technology node. Consequently,

Samsung has achieved a full cycle of

valuable HKMG learning and high-volume

experience going into 28nm LP HKMG

process technology.

With initial emphasis on 32nm LP,

Samsung has simultaneously and

aggressively placed resources on 28nm

LP to create a remarkably simple

migration path. All design rules at 32nm

are shrinkable and can be easily migrated,

allowing any 32nm design to be 28nm

friendly. Samsung has also released all

beta models of its design kits and SPICE

models for 28nm. Leading-edge customers

can download the latest SPICE models

and design kits to start designing at 28nm.

Complete Designing Ecosystem

Samsung’s 32/28nm process nodes are

well supported by a full-featured suite

of IP libraries from ARM®, Samsung’s

primary IP library provider. The

Samsung-ARM relationship has spanned

over several previous generations and will

continue to support Samsung Foundry.

Plus, Samsung provides extensive DFM

solutions validated on its technology.

As for design flows, partnerships are

forged with leading EDA tool vendors

like Synopsys®, Cadence®, Mentor

Graphics®, and Magma®. Their design

flows are validated on Samsung’s

32/28nm technologies. The bottom line

for customers is a wide range of highly

comprehensive choices from which

to select.

ADvANceD MANUFActURiNG FOR eNeRGY-eFFicieNt, HiGH-PeRFORMANce MObile AND it iNFRAStRUctURe cOMPUtiNG APPlicAtiONS

HKMG process technology involves

two distinctly different integration

flows, namely Gate-First and Gate-

Last. In a Gate-First approach, the

transistor’s gate stack is fabricated first,

followed by the source and drain, very

much like traditional CMoS transistor

architecture. A Gate-Last process is

just the opposite, a sacrificial gate

stack is stripped away after source

and drain implantation followed by a

replacement gate fabrication. Samsung

together with its Common Platform

(CP) and International Semiconductor

Development Alliance (ISDA) partners

have defined HKMG process

technology to provide what is best

for customer.

For 32/28nm, Samsung and its

partners were the first to introduce the

Foundry HKMG strategy. At 32/28nm,

a Gate-First HKMG was selected

since the scheme has proven to meet

market and customer needs achieving

superior area scaling and preservation

of layout styles without complex

restricted design rules. Also, customers

can take advantage of a more cost-

effective HKMG process scheme due

to its compatibility with conventional

transistor gate process integration.

Moving forward to 20nm and below,

Samsung Foundry and its partners

have conducted extensive HKMG R&D

to ensure the right technologies are

deployed to the customer and market

at the right time. At 20nm, technology

challenges are different from 32/28nm

and technology primarily dominated

by sub-90nm lithography patterning

challenges so litho-dominated

restricted design rules are required to

extend 193nm Immersion Lithography.

A Gate-Last scheme has been deemed

the best for optimal strain engineering

necessary to meet performance even

for Low-Power technology. In addition,

other advanced technologies such as

middle-of-line local interconnects and

aggressive lithography RET have also

been employed and tuned to attain

superior customer design scaling at

the new node.

The appearance of all products, dates, figures, diagrams and tables are subject to change at any time, without notice. Copyright © 2011. Samsung Semiconductor, Inc. is a registered trademark of Samsung Electronics Co. Ltd. All other names and brands may be claimed as the property of others.

DS-11-Foundry Printed 03/11

Samsung Semiconductor, Inc.

3655 north First St., San Jose, CA 95134-1713 TEL: 408-544-4000 FAX: 408-544-4950www.samsung.com/us/business/foundry