shenzhen rakwireless technology co., ltd....note: this test report is prepared for the customer...

89
Note: This test report is prepared for the customer shown above and for the equipment described herein. It may not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp. This report is valid only with a valid digital signature. The digital signature may be available only under the Adobe software above version 7.0. ETSI EN 300 220-1 V3.1.1 (2017-02) ETSI EN 300 220-2 V3.1.1 (2017-02) TEST REPORT For Shenzhen Rakwireless Technology Co., Ltd. RM1007, Hangsheng Technology Building, 4th South Gaoxing Avenue, Science and Technology Park, Nanshan District, Shenzhen Model: RAK831 Report Type: Original Report Product Type: LoRa GATEWAY Report Number: RSZ170830002-22 Report Date: 2017-09-30 Reviewed By: Simon Wang RF Engineer Prepared By: Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F., West Wing, Third Phase of Wanli Industrial Building, Shihua Road, Futian Free Trade Zone, Shenzhen, Guangdong, China Tel: +86-755-33320018 Fax: +86-755-33320008 www.baclcorp.com.cn

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Page 1: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Note: This test report is prepared for the customer shown above and for the equipment described herein. It may not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp. This report is valid only with a valid digital signature. The digital signature may be available only under the Adobe software above version 7.0.

ETSI EN 300 220-1 V3.1.1 (2017-02) ETSI EN 300 220-2 V3.1.1 (2017-02)

TEST REPORT

For

Shenzhen Rakwireless Technology Co., Ltd.

RM1007, Hangsheng Technology Building, 4th South Gaoxing Avenue, Science and Technology Park, Nanshan District, Shenzhen

Model: RAK831

Report Type:

Original Report

Product Type:

LoRa GATEWAY

Report Number: RSZ170830002-22

Report Date: 2017-09-30

Reviewed By:

Simon Wang RF Engineer

Prepared By:

Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F., West Wing, Third Phase of Wanli Industrial Building, Shihua Road, Futian Free Trade Zone, Shenzhen, Guangdong, China Tel: +86-755-33320018 Fax: +86-755-33320008 www.baclcorp.com.cn

Page 2: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 2 of 89

TABLE OF CONTENTS

GENERAL INFORMATION ....................................................................................................................................... 4 

PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ..................................................................................... 4 OBJECTIVE ................................................................................................................................................................... 4 TEST METHODOLOGY .................................................................................................................................................. 4 MEASUREMENT UNCERTAINTY .................................................................................................................................... 4 TEST FACILITY ............................................................................................................................................................. 5 

SYSTEM TEST CONFIGURATION .......................................................................................................................... 6 

DESCRIPTION OF TEST CONFIGURATION ...................................................................................................................... 6 EUT EXERCISE SOFTWARE .......................................................................................................................................... 6 SPECIAL ACCESSORIES ................................................................................................................................................. 6 SUPPORT EQUIPMENT LIST AND DETAILS. ................................................................................................................... 6 EXTERNAL I/O CABLE .................................................................................................................................................. 6 BLOCK DIAGRAM OF TEST SETUP ................................................................................................................................ 7 

SUMMARY OF TEST RESULTS ............................................................................................................................... 8 

TEST EQUIPMENT LIST ........................................................................................................................................... 9 

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.2.1 - OPERATING FREQUENCY ......................................................... 10 

APPLICABLE STANDARD ............................................................................................................................................ 10 THE RESULT ............................................................................................................................................................... 10 

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.2.2 - UNWANTED EMISSIONS IN THE SPURIOUS DOMAIN ....... 11 

APPLICABLE STANDARD ............................................................................................................................................ 11 METHOD OF MEASUREMENT ...................................................................................................................................... 11 TEST DATA ................................................................................................................................................................ 12 

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.1 - EFFECTIVE RADIATED POWER............................................... 15 

APPLICABLE STANDARD ............................................................................................................................................ 15 METHOD OF MEASUREMENT ...................................................................................................................................... 15 TEST DATA ................................................................................................................................................................ 16 

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.2– MAXIMUM E.R.P. SPECTRAL DENSITY .................................. 18 

APPLICABLE STANDARD ............................................................................................................................................ 18 METHOD OF MEASUREMENT ...................................................................................................................................... 18 TEST DATA ................................................................................................................................................................ 19 

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.3 - DUTY CYCLE ................................................................................. 23 

APPLICABLE STANDARD ............................................................................................................................................ 23 METHOD OF MEASUREMENT ...................................................................................................................................... 23 TEST DATA ................................................................................................................................................................ 24 

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.4 - OCCUPIED BANDWIDTH ............................................................ 25 

APPLICABLE STANDARD ............................................................................................................................................ 25 METHOD OF MEASUREMENT....................................................................................................................................... 26 TEST DATA ................................................................................................................................................................ 27 

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.5 - TX OUT OF BAND EMISSIONS .................................................. 33 

APPLICABLE STANDARD ............................................................................................................................................ 33 METHOD OF MEASUREMENT....................................................................................................................................... 34 TEST DATA ................................................................................................................................................................ 34 

Page 3: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 3 of 89

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.6 - TRANSIENT POWER .................................................................... 52 

APPLICABLE STANDARD ............................................................................................................................................ 52 METHOD OF MEASUREMENT....................................................................................................................................... 52 TEST DATA ................................................................................................................................................................ 53 

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.8 – TX BEHAVIOUR LOW VOLTAGE CONDITIONS .................. 81 

APPLICABLE STANDARD ............................................................................................................................................ 81 METHOD OF MEASUREMENT....................................................................................................................................... 81 TEST DATA ................................................................................................................................................................ 81 

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.4.2- BLOCKING ...................................................................................... 82 

APPLICABLE STANDARD ............................................................................................................................................ 82 METHOD OF MEASUREMENT....................................................................................................................................... 82 TEST DATA ................................................................................................................................................................ 83 

EXHIBIT B - EUT PHOTOGRAPHS ....................................................................................................................... 85 

EUT – ALL VIEW ....................................................................................................................................................... 85 EUT – MAINBOARD TOP VIEW .................................................................................................................................. 85 EUT – MAINBOARD TOP SHIELDING OFF VIEW ......................................................................................................... 86 EUT – MAINBOARD BOTTOM VIEW ........................................................................................................................... 86 EUT – IC VIEW .......................................................................................................................................................... 87 EUT – ANT VIEW ....................................................................................................................................................... 87 EUT – ANT PORT VIEW ............................................................................................................................................. 88 

EXHIBIT B - TEST SETUP PHOTOGRAPHS ....................................................................................................... 89 

RADIATED SPURIOUS EMISSIONS VIEW (BELOW 1 GHZ) ........................................................................................... 89 RADIATED SPURIOUS EMISSIONS VIEW (ABOVE 1 GHZ) ........................................................................................... 89 

Page 4: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 4 of 89

GENERAL INFORMATION Product Description for Equipment under Test (EUT) The Shenzhen Rakwireless Technology Co., Ltd.’s product, model number: RAK831 (or the "EUT") in this report was a LoRa GATEWAY, which was measured approximately: 80 mm (L) * 60 mm (W) * 10 mm (H), rated with input voltage: DC 5.0V. *All measurement and test data in this report was gathered from production sample serial number: 1701996 (Assigned by BACL, Shenzhen). The EUT supplied by the applicant was received on 2017-08-30. Objective The test report is prepared on behalf of the Shenzhen Rakwireless Technology Co., Ltd. in accordance with ETSI EN 300 220-2 V3.1.1 (2017-02), short range devices (SRD) operating in the frequency range 25 MHz to 1 000 MHz; Part 2: harmonised standard covering the essential requirements of article 3.2 of Directive 2014/53/EU for non specific radio equipment. The objective is to determine the compliance of the EUT with ETSI EN 300 220-2 V3.1.1 (2017-02). Test Methodology All measurements contained in this report were conducted with ETSI EN 300 220-1 V3.1.1 (2017-02).

Measurement Uncertainty

Parameter  Flab  Maximum allow uncertainty 

Radio frequency ±0.5 ppm ±0.5 ppm 

RF output power, conducted ±1.5dB  ±1.5dB Conducted spurious emission of transmitter, valid up to 6 GHz ±1.5dB  ±3dB 

Conducted emission of receivers ±1.5dB  ±3dB 

Radiated emission of transmitter, valid up to 6 GHz ±4.88dB  ±6dB 

Radiated emission of receiver, valid up to 6 GHz ±4.88dB  ±6dB 

RF level uncertainty for a given BER ±1.5dB ±1.5dB

Occupied Bandwidth ±5%  ±5% 

Temperature ±1℃  ±2.5℃ 

Humidity ±5%  ±10% 

 

Page 5: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 5 of 89

Test Facility The test site used by Bay Area Compliance Laboratories Corp. (Shenzhen) to collect test data is located on the 6/F., West Wing, Third Phase of Wanli Industrial Building, Shihua Road, Futian Free Trade Zone, Shenzhen, Guangdong, China. Bay Area Compliance Laboratories Corp. (Shenzhen) has been accredited to ISO/IEC 17025 by CNAS (Lab code: L2408). And accredited to ISO/IEC 17025 by NVLAP (Lab code: 200707-0), the FCC Designation No. CN5001 under the KDB 974614 D01. The Federal Communications Commission has the reports on file and is listed under FCC Registration No.: 382179. The test site has been approved by the FCC for public use and is listed in the FCC Public Access Link (PAL) database. Bay Area Compliance Laboratories Corp. (Shenzhen) was registered with ISED Canada under ISED Canada Registration Number 3062B.

Page 6: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 6 of 89

SYSTEM TEST CONFIGURATION Description of Test Configuration The system was configured for testing in a test mode. EUT Exercise Software No exercise software was used. Special Accessories No special accessories. Support Equipment List and Details.

Manufacturer Description Model Serial Number

DELL Laptop E6410 N/A

Rakwireless Debug board FT2232HL N/A

DELL Adapter PA-1900-02D N/A

External I/O Cable

Cable Description Length

(m) From Port To

Unshielded Un-detachable DC Cable 1.2 Adapter Laptop

Unshielded Detachable AC Cable 1.5 AC mains Adapter

Un-shielding Detachable USB Cable 0.8 Debug board Laptop

Un-shielding Detachable flat cable 0.2 Debug board EUT

Page 7: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 7 of 89

Block Diagram of Test Setup

Non-Conductive Table 80cm above ground plant

Non-Conductive Table150cm above ground plant

EUTDebug Board

Laptop Adapter

AC Mains

1.5 Meters

1.0 Meter

Page 8: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 8 of 89

SUMMARY OF TEST RESULTS ETSI EN 300 220-2 V3.1.1 (2017-02)

Rules Description of Test Result Condition

§4.2.1 Operating frequency Compliance /

§4.2.2 Unwanted emissions in the spurious domain

Compliance /

§4.3.1 Effective radiated power Compliance /

§4.3.2 Maximum e.r.p. spectral density Compliance

Applies to EUT using annex B bands I, L.Applies to EUT using DSSS or wideband techniques other than FHSS modulation,

using annex C band X.

§4.3.3 Duty cycle Compliance Not applicable to EUT with polite spectrumaccess where permitted in annex B, table B.1

or annex C, table C.1 or any NRI.

§4.3.4 Occupied Bandwidth Compliance /

§4.3.5 Tx Out of Band Emissions Compliance Applies to EUT with OCW > 25 kHz.

§4.3.6 Transient Power Compliance /

§4.3.7 Adjacent channel power Not Applicable Applies to EUT with OCW ≤ 25 kHz.

§4.3.8 TX behaviour under Low Voltage

Conditions Compliance Applies to battery powered EUT.

§4.3.9 Adaptive Power Control Not Applicable Applies to EUT with adaptive power control

using annex C band AA.

§4.3.10 FHSS equipment Not Applicable Applies to FHSS EUT.

§4.3.11 Short term behaviour Not Applicable Applies to EUT using annex C bands Y, Z, AA, AB, AC, AD.

§4.4.1 RX sensitivity Not Applicable Applies to EUT with polite spectrum access.

§4.4.2 Blocking Compliance /

§4.5.2 Clear Channel Assessment threshold Not Applicable Applies to EUT with polite spectrum access.

§4.5.3 Polite spectrum access timing parameters Not Applicable Applies to EUT with polite spectrum access.

§4.5.4 Adaptive Frequency Agility Not Applicable Applies to EUT with AFA.

Page 9: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 9 of 89

TEST EQUIPMENT LIST

Manufacturer Description Model Serial Number Calibration Date

Calibration Due Date

Radiated Emission Test

Rohde & Schwarz EMI Test Receiver ESCI 101120 2016-12-07 2017-12-07

Sunol Sciences Horn Antenna DRH-118 A052604 2014-12-29 2017-12-28

HP Amplifier HP8447E 1937A01046 2017-05-21 2017-11-19

ESPEC Temperature & Humidity

Chamber EL-10KA 09107726 2016-11-22 2017-11-22

Sunol Sciences Bi-log Antenna JB1 A040904-2 2014-12-17 2017-12-16

BIZI  Signal Analyzer  FSEM  845987/005  2017-04-24  2018-04-24 

Anritsu Signal Generator 68369B 004114 2016-12-05 2017-12-05

COM POWER Dipole Antenna AD-100 41000 NCR NCR

Mini Pre-Amplifier ZVA-183-S+ 5969001149 2017-05-21 2018-05-21

A.H.System Horn Antenna SAS-200/571 135 2015-08-18 2018-08-17

RF Conducted Test

ESPEC Temperature & Humidity

Chamber EL-10KA 09107726 2016-11-22 2017-11-22

Long Wei DC Power Supply TPR-6420D 398363 NCR NCR

Anritsu Signal Generator 68369B 004114 2016-12-05 2017-12-05

Rohde & Schwarz  Signal Analyzer  FSIQ26  8386001028  2017-04-24  2018-04-24 

R&S  SPECTRUM ANALYZER  FSU26  200120  2016-12-05  2017-12-05 

* Statement of Traceability: Bay Area Compliance Laboratories Corp. (Shenzhen) attests that all calibrations have been performed in accordance to requirements that traceable to National Primary Standards and International System of Units (SI).

Page 10: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 10 of 89

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.2.1 - OPERATING FREQUENCY Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.1.1, the nominal operating frequency is the centre of a channel of width OCW. Limit: The manufacturer may declare either one or more operating frequencies and operating channels. Operating channel(s) shall be be entirely within operational frequency bands allowed by annexes B, C or any NRI The below information shall be recorded in the test report The Result

Note: Compliance, which is declared by the manufacturer.

Operating frequency (MHz)

Operating frequency band (MHz)

Operating channel width (kHz)

864

863~870

125 869

864 250

869

864 500

869

Value Note

Operational Frequency band or bands Declared by the manufacturer

Nominal Operating Frequency or Frequencies Declared by the manufacturer

Operating Channel width(s) - OCW Declared by the manufacturer

Page 11: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 11 of 89

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.2.2 - UNWANTED EMISSIONS IN THE SPURIOUS DOMAIN Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.9.1.

Spurious emissions are unwanted emissions in the spurious domain at frequencies other than those of the Operating Channel and its Out Of Band Domain. The relevant spurious domain is shown in Figure 7. Limit: The power of any unwanted emission in the spurious domain shall not exceed the values given in Table 19.

Method of Measurement According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.9.3.

Page 12: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 12 of 89

Test Data

Environmental Conditions

Temperature: 23 ℃

Relative Humidity: 51 %

ATM Pressure: 101.0 kPa

The testing was performed by Jacob Kong on 2017-09-20.

Test mode: Transmitting

Test result: Compliance.

Radiated spurious emissions:

Frequency (MHz)

Receiver Reading (dBµV)

Turntable Angle Degree

Rx Antenna Substituted Absolute

Level (dBm)

EN 300 220

Height (m)

Polarity(H/V)

SG Level(dBm)

Cable Loss (dB)

AntennaGain (dB)

Limit (dBm)

Margin(dB)

Test Mode: Standby

908.35 31.66 294 1.3 H -65.3 0.70 0 -66.00 -57 9.00

908.35 31.81 162 1.4 V -65.2 0.70 0 -65.90 -57 8.90

1062.34 41.45 338 1.6 H -67.1 1.60 6.90 -61.80 -47 14.80

1062.34 40.61 23 1.4 V -68.8 1.60 6.90 -63.50 -47 16.50

Page 13: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 13 of 89

Frequency (MHz)

Receiver Reading (dBµV)

Turntable Angle Degree

Rx Antenna Substituted Absolute

Level (dBm)

EN 300 220

Height (m)

Polarity(H/V)

SG Level(dBm)

Cable Loss (dB)

AntennaGain (dB)

Limit (dBm)

Margin(dB)

Test Mode: Transmitting

864MHz, 125 kHz

923.50 32.06 137 2.2 H -64.9 0.70 0 -65.60 -36 29.60

923.50 32.61 245 2.0 V -64.4 0.70 0 -65.10 -36 29.10

1728.00 45.72 206 1.4 H -61.4 1.30 9.10 -53.60 -30 23.60

1728.00 48.97 199 1.9 V -57.5 1.30 9.10 -49.70 -30 19.70

864MHz, 250 kHz

923.50 33.77 305 1.6 H -63.2 0.70 0 -63.90 -36 27.90

923.50 32.90 163 1.2 V -64.1 0.70 0 -64.80 -36 28.80

1728.00 45.44 11 1.4 H -61.6 1.30 9.10 -53.80 -30 23.80

1728.00 46.88 231 1.2 V -59.6 1.30 9.10 -51.80 -30 21.80

864MHz, 500 kHz

923.50 32.39 8 1.2 H -64.6 0.70 0 -65.30 -36 29.30

923.50 33.02 174 1.8 V -64.0 0.70 0 -64.70 -36 28.70

1728.00 44.75 224 2.5 H -62.3 1.30 9.10 -54.50 -30 24.50

1728.00 47.57 302 1.0 V -58.9 1.30 9.10 -51.10 -30 21.10

869MHz, 125 kHz

923.50 32.95 12 2.4 H -64.0 0.70 0 -64.70 -36 28.70

923.50 33.45 246 1.0 V -63.5 0.70 0 -64.20 -36 28.20

1738.00 47.52 82 1.9 H -60.0 1.30 9.10 -52.20 -30 22.20

1738.00 48.47 99 1.9 V -58.4 1.30 9.10 -50.60 -30 20.60

869MHz, 250 kHz

923.50 33.29 205 2.3 H -63.7 0.70 0 -64.40 -36 28.40

923.50 32.51 11 1.9 V -64.5 0.70 0 -65.20 -36 29.20

1738.00 58.69 360 1.2 H -48.8 1.30 9.10 -41.00 -30 11.00

1738.00 53.99 68 2.3 V -52.9 1.30 9.10 -45.10 -30 15.10

869MHz, 500 kHz

923.50 32.69 165 1.6 H -64.3 0.70 0 -65.00 -36 29.00

923.50 32.11 153 2.5 V -64.9 0.70 0 -65.60 -36 29.60

1738.00 44.11 267 1.9 H -63.0 1.30 9.10 -55.20 -30 25.20

1738.00 47.44 304 1.8 V -59.0 1.30 9.10 -51.20 -30 21.20

Page 14: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 14 of 89

Frequency (MHz)

Receiver Reading (dBµV)

Turntable Angle Degree

Rx Antenna Substituted Absolute

Level (dBm)

EN 300 220

Height (m)

Polarity(H/V)

SG Level(dBm)

Cable Loss (dB)

AntennaGain (dB)

Limit (dBm)

Margin(dB)

Test Mode: Receiving

864MHz, 125 kHz

915.62 31.23 256 2.3 H -65.8 0.70 0 -66.50 -57 9.50

915.62 32.13 129 1.9 V -64.9 0.70 0 -65.60 -57 8.60

1215.30 40.81 282 2.0 H -67.2 1.50 7.20 -61.50 -47 14.50

1215.30 40.10 174 1.4 V -67.6 1.50 7.20 -61.90 -47 14.90

864MHz, 250 kHz

915.62 32.31 98 2.1 H -64.7 0.70 0 -65.40 -57 8.40

915.62 31.80 32 2.4 V -65.2 0.70 0 -65.90 -57 8.90

1215.30 41.39 251 1.1 H -66.6 1.50 7.20 -60.90 -47 13.90

1215.30 40.48 73 1.3 V -67.2 1.50 7.20 -61.50 -47 14.50

864MHz, 500 kHz

915.62 31.39 17 1.1 H -65.6 0.70 0 -66.30 -57 9.30

915.62 32.40 260 2.1 V -64.6 0.70 0 -65.30 -57 8.30

1215.30 40.37 337 2.1 H -67.6 1.50 7.20 -61.90 -47 14.90

1215.30 41.09 45 1.2 V -66.6 1.50 7.20 -60.90 -47 13.90

869MHz, 125 kHz

915.62 31.18 262 2.1 H -65.8 0.70 0 -66.50 -57 9.50

915.62 31.90 301 1.5 V -65.1 0.70 0 -65.80 -57 8.80

1215.30 40.91 146 1.1 H -67.1 1.50 7.20 -61.40 -47 14.40

1215.30 41.15 103 1.1 V -66.5 1.50 7.20 -60.80 -47 13.80

869MHz, 250 kHz

915.62 32.13 108 2.4 H -64.9 0.70 0 -65.60 -57 8.60

915.62 31.67 349 2.3 V -65.3 0.70 0 -66.00 -57 9.00

1215.30 41.17 233 1.3 H -66.8 1.50 7.20 -61.10 -47 14.10

1215.30 40.85 357 2.3 V -66.8 1.50 7.20 -61.10 -47 14.10

869MHz, 500 kHz

915.62 31.83 127 1.3 H -65.2 0.70 0 -65.90 -57 8.90

915.62 32.51 212 1.6 V -64.5 0.70 0 -65.20 -57 8.20

1215.30 40.33 151 2.1 H -67.6 1.50 7.20 -61.90 -47 14.90

1215.30 40.89 301 2.3 V -66.8 1.50 7.20 -61.10 -47 14.10

Note: Absolute Level = SG Level - Cable loss + Antenna Gain Margin = Limit- Absolute Level

Page 15: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 15 of 89

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.1 - EFFECTIVE RADIATED POWER Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.2.1: The effective radiated power (e.r.p) is the power radiated in the direction of the maximum radiated power under specified conditions of measurements for any condition of modulation. For equipment with a permanent or temporary antenna connection it may be taken as the power delivered from that connector taking into account the antenna gain. According to ETSI EN 300 220-2 V3.1.1 (2017-02) clause 4.3.1.2: Limit: The effective radiated power shall not be greater than the value allowed in annexes B or C for the chosen operational frequency band(s). Method of Measurement According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.2.2.1: Effective Radiated Power (conducted measurement): This method applies only to EUT with a permanent external antenna connector. The transmitter shall be connected to a dummy load as described in clause 4.3.7 and the conducted power delivered shall be measured with a measurement receiver according to clause 4.3.10. In the case of non-constant envelope modulation, a peak detector shall be used. The maximum gain of the antenna to be used together with the equipment shall be declared by the manufacturer and this shall be recorded in the test report. Perp, the radiated power (e.r.p.) limit applies to the maximum measured conducted power (Pconducted ) value adjusted by the antenna gain (relative to a dipole) (Perp=Pconducted+antenna gain). The information shown in Table 7 shall be recorded in the test report.

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 16 of 89

According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.2.2.2: Effective radiated power (radiated measurement): This measurement method applies to EUT other than those measured using clause 5.2.2.1. A suitable test site shall be selected from those described in clause C.1 and the radiated power established using the procedures described in clause C.5.1 (or clause C.5.2) depending on the test site, followed by clause C.5.3. In the case of non-constant envelope modulation, a peak detector shall be used. The information shown in Table 8 shall be recorded in the test report.

Test Data

Environmental Conditions

Temperature: 23 ℃

Relative Humidity: 51 %

ATM Pressure: 101.0 kPa

The testing was performed by Jacob Kong on 2017-08-10.

Test Mode: Transmitting

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 17 of 89

Normal Condition Test Data as below:

Test with conducted measurement.

Bandwidth: 125 kHz

Test Condition Reading (dBm)

Antenna gain(dBd)

ERP (dBm)

Limit (dBm) Frequency

(MHz) Power (VDC)

864 5 -1.53 -0.15 -1.68 14

869 5 1.44 -0.15 1.29 14

Bandwidth: 250 kHz

Test Condition Reading (dBm)

Antenna gain(dBd)

ERP (dBm)

Limit (dBm) Frequency

(MHz) Power (VDC)

864 5 1.83 -0.15 1.68 14

869 5 4.57 -0.15 4.42 14

Bandwidth: 500 kHz

Test Condition Reading (dBm)

Antenna gain(dBd)

ERP (dBm)

Limit (dBm) Frequency

(MHz) Power (VDC)

864 5 6.98 -0.15 6.83 14

869 5 10.28 -0.15 10.13 14

Note:0dBD=2.15dBi

Page 18: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 18 of 89

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.2– MAXIMUM E.R.P. SPECTRAL DENSITY Applicable Standard According to ETSI EN 300 220-1 [1], clause 5.3.1 applies. Limit: The Maximum e.r.p. spectral density shall not be greater than the value allowed in annexes B or C for the chosen operational frequency band(s) Method of Measurement The test procedure shall be as follows: Connect the EUT to the spectrum analyser and use the following settings: Centre Frequency: The centre frequency of the Operating Channel under test. Span: Wide enough to cover the complete power envelope of the signal of the EUT (≥ Occupied Bandwidth). Resolution BW: 100 kHz (see note). Video BW: 100 kHz (see note). Sweep time: 1 minute. Detector: RMS. Trace Mode: Max Hold. NOTE: In case the regulatory parameter is expressed in dBm/10 kHz, RBW & VBW should be set to 10 kHz. When the trace is complete, capture the trace, for example using the "View" option on the spectrum analyser. Find the peak value of the trace and place the analyser marker on this peak. This level is recorded as the highest mean power (spectral power density) D in a 100 kHz band. Alternatively, where a spectrum analyser is equipped with a facility to measure spectral power density, this facility may be used to display the spectral power density D in dBm/100 kHz. Where the spectrum analyser bandwidth is non-Gaussian, a suitable correction factor shall be determined and applied.

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 19 of 89

The maximum e.r.p. spectral density is calculated from the above measured power density (D and the applicable antenna assembly gain "G" in dB relative to an ideal half wave dipole, according to the formula (3). If more than one antenna assembly is intended for this power setting, the gain of the antenna assembly with the highest gain shall be used.

PD = D + G (3)

The information shown in Table 9 shall be recorded in the test report.

Test Data

Environmental Conditions

Temperature: 24~26 ℃

Relative Humidity: 52~55 %

ATM Pressure: 100.3~101.5 kPa

The testing was performed by Jacob Kong on 2017-09-18. Test mode: Transmitting

Test result: Compliance

Test mode

Channel frequency

(MHz)

Reading (dBm/100kHz)

Antenna Gain (dBd)

Power Density(dBm/100kHz)

Limit (dBm/100kHz)

125kHz 864 -8.25 -0.15 -8.40 -4.5

869 -4.93 -0.15 -5.08 -4.5

Test mode

Channel frequency

(MHz)

Reading (dBm/100kHz)

Antenna Gain (dBd)

Power Density(dBm/100kHz)

Limit (dBm/100kHz)

250 kHz 864 -7.94 -0.15 -8.09 -4.5

869 -5.10 -0.15 -5.25 -4.5

Test mode

Channel frequency

(MHz)

Reading (dBm/100kHz)

Antenna Gain (dBd)

Power Density(dBm/100kHz)

Limit (dBm/100kHz)

500 kHz 864 -9.15 -0.15 -9.30 -4.5

869 -5.62 -0.15 -5.77 -4.5

Page 20: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 20 of 89

864MHz, 125 kHz Bandwidth

A

Offset 3.5 dB

LVL

Ref 28.5 dBm Att 20 dB **

20 kHz/Center 864 MHz Span 200 kHz

*

*

3DB

RBW 100 kHz

VBW 100 kHz

SWT 60 s*

*

1 RM

MAXH

-70

-60

-50

-40

-30

-20

-10

0

10

20

1

Marker 1 [T1 ]

-8.25 dBm

864.025641026 MHz

Date: 18.SEP.2017 22:29:15

864MHz, 250 kHz Bandwidth

A

Offset 3.5 dB

LVL

Ref 28.5 dBm Att 20 dB **

30 kHz/Center 864 MHz Span 300 kHz

*

*

3DB

RBW 100 kHz

VBW 100 kHz

SWT 60 s*

*

1 RM

MAXH

-70

-60

-50

-40

-30

-20

-10

0

10

20

1

Marker 1 [T1 ]

-7.94 dBm

864.012980769 MHz

Date: 18.SEP.2017 22:37:28

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 21 of 89

864MHz, 500 kHz Bandwidth

A

Offset 3.5 dB

LVL

Ref 28.5 dBm Att 20 dB **

60 kHz/Center 864 MHz Span 600 kHz

*

*

3DB

RBW 100 kHz

VBW 100 kHz

SWT 60 s*

*

1 RM

MAXH

-70

-60

-50

-40

-30

-20

-10

0

10

20

1

Marker 1 [T1 ]

-9.15 dBm

864.013461538 MHz

Date: 18.SEP.2017 22:02:31

869MHz, 125 kHz Bandwidth

A

Offset 3.5 dB

LVL

Ref 28.5 dBm Att 20 dB **

20 kHz/Center 869 MHz Span 200 kHz

*

*

3DB

RBW 100 kHz

VBW 100 kHz

SWT 60 s*

*

1 RM

MAXH

-70

-60

-50

-40

-30

-20

-10

0

10

20

1

Marker 1 [T1 ]

-4.93 dBm

868.998076923 MHz

Date: 18.SEP.2017 22:27:09

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 22 of 89

869MHz, 250 kHz Bandwidth

A

Offset 3.5 dB

LVL

Ref 28.5 dBm Att 20 dB **

30 kHz/Center 869 MHz Span 300 kHz

*

*

3DB

RBW 100 kHz

VBW 100 kHz

SWT 60 s*

*

1 RM

MAXH

-70

-60

-50

-40

-30

-20

-10

0

10

20

1

Marker 1 [T1 ]

-5.10 dBm

868.982692308 MHz

Date: 18.SEP.2017 22:35:36

869MHz, 500 kHz Bandwidth

A

Offset 3.5 dB

LVL

Ref 28.5 dBm Att 20 dB **

60 kHz/Center 869 MHz Span 600 kHz

*

3DB

RBW 100 kHz

SWT 60 s

* VBW 100 kHz

*

*

1 RM

MAXH

-70

-60

-50

-40

-30

-20

-10

0

10

20

1

Marker 1 [T1 ]

-5.62 dBm

868.984615385 MHz

Date: 18.SEP.2017 22:00:20

Page 23: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 23 of 89

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.3 - DUTY CYCLE Applicable Standard According to ETSI EN 300 220-2 V3.1.1 (2017-02) clause 4.3.3: Duty cycle applies to all transmitters except EUT with polite spectrum access (described in clause 4.5) where permitted in annex B, table B.1 or annex C, table C.1 or any NRI. Limit: The Duty Cycle at the operating frequency shall not be greater than values in annex B or C for the chosen operational frequency band(s). According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.4.1:

Unless otherwise specified, Tobs is 1 hour and the observation bandwidth Fobs is the operational frequency band. Each transmission consists of an RF emission, or sequence of RF emissions separated by intervals < TDis. An equipment may operate on several bands simultaneously (i.e. multi transmissions), Duty Cycle limit of each individual band applies to each transmission within that band. In case of a multicarrier modulation in a band, the duty cycle applies to the whole signal used for a transmission (e.g. OFDM). It has to be noted that on some bands Duty Cycle value may depend on the presence of a primary radio service. Equipment may be triggered manually, by internal timing or by external stimulus. Depending on the method of triggering the timing may be predictable or random. Method of Measurement An assessment of the overall Duty Cycle shall be made for a representative period of Tobs over the observation bandwidth Fobs. Unless otherwise specified, Tobs is 1 hour and the observation bandwidth Fobs is the operational frequency band. The representative period shall be the most active one in normal use of the device. As a guide "Normal use" is considered as representing the behaviour of the device during transmission of 99 % of transmissions generated during its operational lifetime. Procedures such as setup, commissioning and maintenance are not considered part of normal operation. Where an acknowledgement is used, the additional transmitter on-time from a message responder shall be declared only once whether included in the message initiator Duty Cycle or in the message responder Duty Cycle. NOTE: The intention of this rule is not to allow EUT to exceed the maximum duty cycle value.

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 24 of 89

Test Data

Environmental Conditions

Temperature: 23 ℃

Relative Humidity: 52 %

ATM Pressure: 101.5 kPa

The testing was performed by Jacob Kong on 2017-09-21.

Test Mode: Transmitting (Normal use state) Test result: Compliant. The duty cycle was not exceeded 0.1 % in a period of 1 hour, which was declared by the manufacturer. EUT was transmitting approximately 0.16s (maximum) at a time, so it will be restricted transmitting less than 22 times in a period of 1 hour。

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 25 of 89

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.4 - OCCUPIED BANDWIDTH Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.6: The occupied bandwidth (OBW) is the Frequency Range in which 99 % of the total mean power of a given emission falls. The residual part of the total power being denoted as β, which, in cases of symmetrical spectra, splits up into β/2 on each side of the spectrum. Unless otherwise specified, β/2 is taken as 0,5 % as described in Figure 3.

The maximum occupied bandwidth includes all associated side bands above the appropriate emissions level and the frequency error or drift under extreme test conditions. Limit: The Operating Channel shall be declared and shall reside entirely within the Operational Frequency Band. The Maximum Occupied Bandwidth at 99 % shall reside entirely within the Operating Channel defined by Flow and Fhigh.

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 26 of 89

Method of measurement According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.6.3: The spectrum analyser shall be configured as appropriate for the parameters shown in Table 12.

If the equipment is capable of producing an unmodulated carrier and the test in clause 5.7 is performed, then the OBW measurements need only be performed under normal test conditions. Any required results for Maximum OBW under extreme conditions are obtained by addition and substraction of the upper and lower frequency error results to each bandwidth measurement obtained in this test. Step 1: Operation of the EUT shall be started, on the highest operating frequency as declared by the manufacturer, with the appropriate test signal. The signal attenuation shall be adjusted to ensure that the signal power envelope is sufficiently above the noise floor of the analyser to avoid the noise signals on either side of the power envelope being included in the measurement. Step 2: When the trace is completed the peak value of the trace shall be located and the analyser marker placed on this peak. Step 3: The 99 % occupied bandwidth function of the spectrum analyser shall be used to measure the occupied bandwidth of the signal.

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 27 of 89

Test Data

Environmental Conditions

Temperature: 23 ℃

Relative Humidity: 53 %

ATM Pressure: 101.5 kPa

The testing was performed by Jacob Kong on 2017-09-18.

Test mode: Transmitting

Bandwidth (kHz)

Test Frequency

(MHz) Test Condition Result

125

864 Normal

L.V. L.T. L.V. H.T. H.V. L.T H.V. H.T Compliance

869 Normal L.V. L.T. L.V. H.T. H.V. L.T H.V. H.T Compliance

250

864 Normal L.V. L.T. L.V. H.T. H.V. L.T H.V. H.T Compliance

869 Normal

L.V. L.T. L.V. H.T. H.V. L.T H.V. H.T Compliance

500

864 Normal L.V. L.T. L.V. H.T. H.V. L.T H.V. H.T Compliance

869 Normal L.V. L.T. L.V. H.T. H.V. L.T H.V. H.T Compliance

Note:

L.V.: Low Voltage 3.3VDC L.T.: Low Temperature –20℃ N.T.: Normal Temperature +25℃

H.V.: High Voltage 5.5VDC H.T.: High Temperature +55℃ Nominal Voltage 5VDC

Test signal is DM3 in all test Condition,other recording information reflected in follow tables

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 28 of 89

Normal Condition Test Data as below:

Voltage Supply (VDC)

Temperature(℃)

Bandwidth (kHz)

Frequency(MHz)

Occupied Bandwidth

(kHz)

Frequency of

Lower point(MHz)

Frequency of

Upper point (MHz)

Limit(MHz)

5 25

125 864 130.77 863.934 864.065

Within 863 to

870

869 130.77 868.934 869.065

250 864 261.22 863.869 864.131

869 265.22 868.865 869.130

500 864 479.17 863.761 864.240

869 477.56 868.761 869.239

Extreme Condition Test Data as below: L.V. L.T.

Voltage Supply (VDC)

Temperature(℃)

Bandwidth (kHz)

Frequency(MHz)

Occupied Bandwidth

(kHz)

Frequency of

Lower point(MHz)

Frequency of

Upper point (MHz)

Limit(MHz)

3.3 -20

125 864 130.75 863.933 864.065

Within 863 to

870

869 130.77 868.934 869.066

250 864 261.20 863.869 864.132

869 265.24 868.867 869.131

500 864 479.18 863.764 864.244

869 477.57 868.763 869.239

L.V. H.T.

Voltage Supply (VDC)

Temperature(℃)

Bandwidth (kHz)

Frequency(MHz)

Occupied Bandwidth

(kHz)

Frequency of

Lower point(MHz)

Frequency of

Upper point (MHz)

Limit(MHz)

3.3 55

125 864 130.78 863.935 864.065

Within 863 to

870

869 130.77 868.934 869.065

250 864 261.20 863.867 864.132

869 265.22 868.864 869.134

500 864 479.17 863.763 864.238

869 477.56 868.762 869.240

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 29 of 89

H.V. L.T

Voltage Supply (VDC)

Temperature(℃)

Bandwidth (kHz)

Frequency(MHz)

Occupied Bandwidth

(kHz)

Frequency of

Lower point(MHz)

Frequency of

Upper point (MHz)

Limit(MHz)

5.5 -20

125 864 130.78 863.936 864.066

Within 863 to

870

869 130.79 868.934 869.065

250 864 261.25 863.871 864.133

869 265.23 868.865 869.132

500 864 479.17 863.761 864.240

869 477.55 868.763 869.240

H.V. H.T

Voltage Supply (VDC)

Temperature(℃)

Bandwidth (kHz)

Frequency(MHz)

Occupied Bandwidth

(kHz)

Frequency of

Lower point(MHz)

Frequency of

Upper point (MHz)

Limit(MHz)

5.5 55

125 864 130.76 863.935 864.065

Within 863 to

870

869 130.77 868.937 869.067

250 864 261.21 863.869 864.134

869 265.22 868.865 869.132

500 864 479.17 863.764 864.242

869 477.56 868.763 869.242

Recording as above,Highest measured OBW value as below :

Voltage Supply (VDC)

Temperature (℃) MaximumBandwidth

(kHz)

Frequency(MHz)

Occupied Bandwidth

(kHz)

Limit (MHz)

3.3-5.5 -20-55

125 864 130.78

Within 863 to

870

869 130.79

250 864 261.25

869 265.24

500 864 479.18

869 477.57

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 30 of 89

Bandwidth: 125 kHz

Low Channel

A

Offset 3.5 dB

LVL

Ref 28.5 dBm Att 20 dB*

30 kHz/Center 864 MHz Span 300 kHz

*

*

3DB

RBW 3 kHz

VBW 10 kHz

SWT 35 ms

*

1 RM

MAXH

-70

-60

-50

-40

-30

-20

-10

0

10

20

1

Marker 1 [T1 ]

-5.51 dBm

863.966826923 MHz

OBW130.769230769 kHz

T1

Temp 1 [T1 OBW]

-20.18 dBm

863.934134615 MHz

T2

Temp 2 [T1 OBW]

-19.36 dBm

864.064903846 MHz

Date: 18.SEP.2017 22:50:31

High Channel

A

Offset 3.5 dB

LVL

Ref 28.5 dBm Att 20 dB*

30 kHz/Center 869 MHz Span 300 kHz

*

*

3DB

RBW 3 kHz

VBW 10 kHz

SWT 35 ms

*

1 RM

MAXH

-70

-60

-50

-40

-30

-20

-10

0

10

20

1

Marker 1 [T1 ]

-3.07 dBm

868.966346154 MHz

OBW130.769230769 kHz

T1

Temp 1 [T1 OBW]

-16.57 dBm

868.934134615 MHz

T2

Temp 2 [T1 OBW]

-16.33 dBm

869.064903846 MHz

Date: 18.SEP.2017 22:51:31

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 31 of 89

Bandwidth: 250 kHz

Low Channel

A

Offset 3.5 dB

LVL

Ref 28.5 dBm Att 20 dB*

50 kHz/Center 864 MHz Span 500 kHz

*

*

3DB

RBW 3 kHz

VBW 10 kHz

SWT 60 ms

*

1 RM

MAXH

-70

-60

-50

-40

-30

-20

-10

0

10

20

1

Marker 1 [T1 ]

-5.38 dBm

864.107371795 MHz

OBW261.217948718 kHz

T1

Temp 1 [T1 OBW]

-19.15 dBm

863.869391026 MHz

T2

Temp 2 [T1 OBW]

-16.93 dBm

864.130608974 MHz

Date: 18.SEP.2017 22:54:27

High Channel

A

Offset 3.5 dB

LVL

Ref 28.5 dBm Att 20 dB*

50 kHz/Center 869 MHz Span 500 kHz

*

*

3DB

RBW 3 kHz

VBW 10 kHz

SWT 60 ms

*

1 RM

MAXH

-70

-60

-50

-40

-30

-20

-10

0

10

20

1

Marker 1 [T1 ]

-3.21 dBm

868.912660256 MHz

OBW265.224358974 kHz

T1

Temp 1 [T1 OBW]

-17.36 dBm

868.864583333 MHz

T2

Temp 2 [T1 OBW]

-13.74 dBm

869.129807692 MHz

Date: 18.SEP.2017 22:53:06

Page 32: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 32 of 89

Bandwidth: 500 kHz

Low Channel

A

Offset 3.5 dB

LVL

Ref 28.5 dBm Att 20 dB*

100 kHz/Center 864 MHz Span 1 MHz

*

*

3DB

RBW 10 kHz

VBW 30 kHz

SWT 40 ms

*

1 RM

MAXH

-70

-60

-50

-40

-30

-20

-10

0

10

20

1

Marker 1 [T1 ]

0.44 dBm

863.870192308 MHz

OBW479.166666667 kHz

T1

Temp 1 [T1 OBW]

-11.79 dBm

863.761217949 MHz

T2

Temp 2 [T1 OBW]

-12.77 dBm

864.240384615 MHz

Date: 18.SEP.2017 22:56:03

High Channel

A

Offset 3.5 dB

LVL

Ref 28.5 dBm Att 20 dB*

*

1 RM

MAXH

100 kHz/Center 869 MHz Span 1 MHz

*

*

3DB

RBW 10 kHz

VBW 30 kHz

SWT 40 ms

-70

-60

-50

-40

-30

-20

-10

0

10

20

1

Marker 1 [T1 ]

3.08 dBm

868.875000000 MHz

OBW477.564102564 kHz

T1

Temp 1 [T1 OBW]

-6.22 dBm

868.761217949 MHz

T2

Temp 2 [T1 OBW]

-6.02 dBm

869.238782051 MHz

Date: 18.SEP.2017 22:57:19

Page 33: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 33 of 89

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.5 - TX OUT OF BAND EMISSIONS Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.8: Two OOB domains are defined, one for OC (see Figure 5) and one for Operational Frequency band (see Figure 6). The spectrum masks for these two OOB domains may overlap.

Unwanted emissions in the Out Of Band domain are those falling in the frequency range immediately below the lower, and above the upper, frequency of the Operating Channel. The OOB domain includes both frequencies outside the Operating Channel within the Operational Frequency Band and frequencies outside the Operational Frequency Band. The relevant Out Of Band domain is shown in Figure 5 and applies within the Operational Frequency Band.

Specific limits apply at frequencies immediately above and below the Operational Frequency Band as shown in Figure 6. NOTE: flow_OFB is the lower edge of the Operational Frequency Band.

fhigh_OFB is the upper edge of the Operational Frequency Band.

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 34 of 89

Limit: The EUT emissions level in OOB domains for the Operating Channel and the Operational Frequency Band shall be less or equal to Table 15 spectrum mask.

Method of measurement According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.8.3. Test Data

Environmental Conditions

Temperature: 23 ℃

Relative Humidity: 52 %

ATM Pressure: 101.5 kPa

The testing was performed by Jacob Kong on 2017-09-19.

Test Mode: Transmitting

Normal Condition Test Data as below:

Test with conducted measurement.

Please refer to the below plots:

Page 35: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 35 of 89

OUT OF BAND for Operation Channel

Frequency Range Limit Test Result

fc - 2,5×OCW ≤ f ≤ fc - 0,5×OCW -36~0 dBm/kHz Pass

fc + 0,5×OCW ≤ f ≤ fc + 2,5×OCW 0~-36 dBm/kHz Pass

Note: f is the measurement frequency

fc is the Operating Frequency OCW is the operating channel bandwidth

864MHz, 125 kHz

A

Unit dBm

10.5 dB Offset

Ref Lvl

10.5 dBm

Ref Lvl

10.5 dBm

RF Att 10 dB

1RM1MAX

RBW 1 kHz

VBW 3 kHz

SWT 1.9 s

Center 864 MHz Span 750 kHz75 kHz/

-80

-70

-60

-50

-40

-30

-20

-10

0

-89.5

10.5

1

Marker 1 [T1]

-18.63 dBm

864.05185371 MHz

1 [T1] -18.63 dBm

864.05185371 MHz

LOC-L

LOC-H

Date: 19.SEP.2017 21:36:27

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 36 of 89

864MHz, 250 kHz

A

Unit dBm

10.5 dB Offset

Ref Lvl

10.5 dBm

Ref Lvl

10.5 dBm

RF Att 10 dB

1RM1MAX

RBW 1 kHz

VBW 3 kHz

SWT 3.8 s

Center 864 MHz Span 1.5 MHz150 kHz/

-80

-70

-60

-50

-40

-30

-20

-10

0

-89.5

10.5

1

Marker 1 [T1]

-17.88 dBm

864.10370741 MHz

1 [T1] -17.88 dBm

864.10370741 MHz

LOC-H

LOC-L

Date: 19.SEP.2017 21:48:15

864MHz, 500 kHz

A

Unit dBm

10.5 dB Offset

1RM

RBW 1 kHz

VBW 3 kHz

SWT 7.6 s

RF Att 20 dB

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

300 kHz/Center 864 MHz Span 3 MHz

1MAX

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-17.28 dBm

864.13527054 MHz

1 [T1] -17.28 dBm

864.13527054 MHz

LOC-L

LOC-H

Date: 19.SEP.2017 22:18:51

Page 37: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 37 of 89

869MHz, 125 kHz

A

Unit dBm

10.5 dB Offset

Ref Lvl

10.5 dBm

Ref Lvl

10.5 dBm

RF Att 10 dB

1RM1MAX

RBW 1 kHz

VBW 3 kHz

SWT 1.9 s

Center 869 MHz Span 750 kHz75 kHz/

-80

-70

-60

-50

-40

-30

-20

-10

0

-89.5

10.5

1

Marker 1 [T1]

-16.14 dBm

868.95716433 MHz

1 [T1] -16.14 dBm

868.95716433 MHz

LOC-H

LOC-L

Date: 19.SEP.2017 21:41:07

869MHz, 250 kHz

A

Unit dBm

10.5 dB Offset

Ref Lvl

10.5 dBm

Ref Lvl

10.5 dBm

RF Att 10 dB

1RM1MAX

Center 869 MHz Span 1.5 MHz150 kHz/

RBW 1 kHz

VBW 3 kHz

SWT 3.8 s

-80

-70

-60

-50

-40

-30

-20

-10

0

-89.5

10.5

1

Marker 1 [T1]

-16.24 dBm

869.10370741 MHz

1 [T1] -16.24 dBm

869.10370741 MHz

LOC-L

LOC-H

Date: 19.SEP.2017 21:44:42

Page 38: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 38 of 89

869MHz, 500 kHz

A

Unit dBm

10.5 dB Offset

1RM

RBW 1 kHz

VBW 3 kHz

SWT 7.6 s

RF Att 20 dB

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

1MAX

Center 869 MHz Span 3 MHz300 kHz/

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-14.81 dBm

868.94288577 MHz

1 [T1] -14.81 dBm

868.94288577 MHz

LOC-H

LOC-L

Date: 19.SEP.2017 22:26:52

Page 39: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 39 of 89

OUT OF BAND for Operation Frequency Band

Frequency Range Limit Test Result

f ≤ flow_OFB - 400 kHz -36 dBm/10kHz Pass

flow_OFB - 400 kHz ≤ f ≤ flow_OFB - 200 kHz -36 dBm/kHz Pass

flow_OFB - 200 kHz ≤ f ≤ flow_OFB -36~0 dBm/kHz Pass

fhigh_OFB ≤ f ≤ fhigh_OFB + 200 kHz -36~0 dBm/kHz Pass

fhigh_OFB + 200 kHz ≤ f ≤ fhigh_OFB + 400 kHz -36 dBm/kHz Pass

Fhigh_OFB + 400 kHz ≤ f -36 dBm/10kHz Pass

Note: f is the measurement frequency

flow_OFB is the lower edge of the Operational Frequency Band fhigh_OFB is the high edge of the Operational Frequency Band

864MHz, 125 kHz

1MAX

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RBW 1 kHz

VBW 3 kHz

SWT 1 s

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

Start 862.6 MHz Stop 863 MHz40 kHz/

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-70.07 dBm

862.82044088 MHz

1 [T1] -70.07 dBm

862.82044088 MHz

LOFB

Date: 19.SEP.2017 23:58:25

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 40 of 89

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

1MAX

Start 861.75 MHz Stop 862.6 MHz85 kHz/

RBW 10 kHz

VBW 30 kHz

SWT 21.5 ms

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-54.65 dBm

862.38707415 MHz

1 [T1] -54.65 dBm

862.38707415 MHz

LOFB

Date: 19.SEP.2017 23:57:50

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

Start 870.4 MHz Stop 871.25 MHz85 kHz/

RBW 10 kHz

VBW 30 kHz

SWT 21.5 ms

1MAX

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-55.58 dBm

871.04729459 MHz

1 [T1] -55.58 dBm

871.04729459 MHz

LOFB

Date: 19.SEP.2017 23:57:16

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 41 of 89

1MAX

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

Start 870 MHz Stop 870.4 MHz40 kHz/

RBW 1 kHz

VBW 3 kHz

SWT 1 s

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-68.48 dBm

870.39599198 MHz

1 [T1] -68.48 dBm

870.39599198 MHz

LOFB

Date: 19.SEP.2017 23:58:56

864MHz, 250 kHz

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

1MAX

Start 862.6 MHz Stop 863 MHz40 kHz/

RBW 1 kHz

VBW 3 kHz

SWT 1 s

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-68.48 dBm

862.84689379 MHz

1 [T1] -68.48 dBm

862.84689379 MHz

LOFB

Date: 19.SEP.2017 23:50:43

Page 42: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 42 of 89

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

1MAX

Start 860.5 MHz Stop 862.6 MHz210 kHz/

RBW 10 kHz

VBW 30 kHz

SWT 54 ms

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-55.75 dBm

862.09919840 MHz

1 [T1] -55.75 dBm

862.09919840 MHz

LOFB

Date: 19.SEP.2017 23:51:25

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

1MAX

Start 870.4 MHz Stop 872.5 MHz210 kHz/

RBW 10 kHz

VBW 30 kHz

SWT 54 ms

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-56.26 dBm

870.40000000 MHz

1 [T1] -56.26 dBm

870.40000000 MHz

LOFB

Date: 19.SEP.2017 23:51:56

Page 43: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 43 of 89

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

Start 870 MHz Stop 870.4 MHz40 kHz/

RBW 1 kHz

VBW 3 kHz

SWT 1 s

1MAX

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-70.07 dBm

870.01843687 MHz

1 [T1] -70.07 dBm

870.01843687 MHz

LOFB

Date: 19.SEP.2017 23:49:54

864MHz, 500 kHz

1MAX

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RBW 1 kHz

VBW 3 kHz

SWT 1 s

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

Start 862.6 MHz Stop 863 MHz40 kHz/

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-69.24 dBm

862.66332665 MHz

1 [T1] -69.24 dBm

862.66332665 MHz

LOFB

Date: 19.SEP.2017 23:48:05

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 44 of 89

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

1MAX

Start 858 MHz Stop 862.6 MHz460 kHz/

RBW 10 kHz

VBW 30 kHz

SWT 115 ms

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-57.81 dBm

860.12024048 MHz

1 [T1] -57.81 dBm

860.12024048 MHz

LOFB

Date: 19.SEP.2017 23:47:27

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

Start 870.4 MHz Stop 875 MHz460 kHz/

RBW 10 kHz

VBW 30 kHz

SWT 115 ms

1MAX

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-58.47 dBm

873.67254509 MHz

1 [T1] -58.47 dBm

873.67254509 MHz

LOFB

Date: 19.SEP.2017 23:46:52

Page 45: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 45 of 89

1MAX

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

Start 870 MHz Stop 870.4 MHz40 kHz/

RBW 1 kHz

VBW 3 kHz

SWT 1 s

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-68.48 dBm

870.05370741 MHz

1 [T1] -68.48 dBm

870.05370741 MHz

LOFB

Date: 19.SEP.2017 23:48:38

869MHz, 125 kHz

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

1MAX

Start 862.6 MHz Stop 863 MHz40 kHz/

RBW 1 kHz

VBW 3 kHz

SWT 1 s

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-70.07 dBm

862.63126253 MHz

1 [T1] -70.07 dBm

862.63126253 MHz

LOFB

Date: 19.SEP.2017 23:55:33

Page 46: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 46 of 89

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

1MAX

Start 861.75 MHz Stop 862.6 MHz85 kHz/

RBW 10 kHz

VBW 30 kHz

SWT 21.5 ms

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-54.95 dBm

862.04468938 MHz

1 [T1] -54.95 dBm

862.04468938 MHz

LOFB

Date: 19.SEP.2017 23:56:12

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

1MAX

Start 870.4 MHz Stop 871.25 MHz85 kHz/

RBW 10 kHz

VBW 30 kHz

SWT 21.5 ms

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-55.26 dBm

870.83266533 MHz

1 [T1] -55.26 dBm

870.83266533 MHz

LOFB

Date: 19.SEP.2017 23:56:39

Page 47: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 47 of 89

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

Start 870 MHz Stop 870.4 MHz40 kHz/

RBW 1 kHz

VBW 3 kHz

SWT 1 s

1MAX

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-68.48 dBm

870.21322645 MHz

1 [T1] -68.48 dBm

870.21322645 MHz

LOFB

Date: 19.SEP.2017 23:54:59

869MHz, 250 kHz

1MAX

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RBW 1 kHz

VBW 3 kHz

SWT 1 s

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

Start 862.6 MHz Stop 863 MHz40 kHz/

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-69.24 dBm

862.81643287 MHz

1 [T1] -69.24 dBm

862.81643287 MHz

LOFB

Date: 19.SEP.2017 23:53:42

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 48 of 89

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

1MAX

Start 860.5 MHz Stop 862.6 MHz210 kHz/

RBW 10 kHz

VBW 30 kHz

SWT 54 ms

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-55.10 dBm

861.54789579 MHz

1 [T1] -55.10 dBm

861.54789579 MHz

LOFB

Date: 19.SEP.2017 23:53:10

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

Start 870.4 MHz Stop 872.5 MHz210 kHz/

RBW 10 kHz

VBW 30 kHz

SWT 54 ms

1MAX

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-56.81 dBm

870.45891784 MHz

1 [T1] -56.81 dBm

870.45891784 MHz

LOFB

Date: 19.SEP.2017 23:52:33

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 49 of 89

1MAX

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

Start 870 MHz Stop 870.4 MHz40 kHz/

RBW 1 kHz

VBW 3 kHz

SWT 1 s

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-69.24 dBm

870.30541082 MHz

1 [T1] -69.24 dBm

870.30541082 MHz

LOFB

Date: 19.SEP.2017 23:54:12

869MHz, 500 kHz

10.5 dB Offset A

1RM

Unit dBm

Start 862.6 MHz Stop 863 MHz40 kHz/

RBW 1 kHz

SWT 1 s

VBW 3 kHz

1MAX

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-69.24 dBm

862.85490982 MHz

1 [T1] -69.24 dBm

862.85490982 MHz

LOFB

Date: 19.SEP.2017 23:43:43

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

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Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 30 dB

10.5 dB Offset A

1RM

Unit dBm

1MAX

Start 858 MHz Stop 862.6 MHz460 kHz/

RBW 10 kHz

VBW 30 kHz

SWT 115 ms

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-69.24 dBm

858.64529058 MHz

1 [T1] -69.24 dBm

858.64529058 MHz

LOFB

Date: 19.SEP.2017 23:42:54

1MAX

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

10.5 dB Offset A

1RM

Unit dBm

Start 870.4 MHz Stop 875 MHz460 kHz/

RBW 10 kHz

VBW 30 kHz

SWT 115 ms

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-58.24 dBm

872.53867735 MHz

1 [T1] -58.24 dBm

872.53867735 MHz

LOFB

Date: 19.SEP.2017 23:45:39

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 51 of 89

10.5 dB Offset A

1RM

Unit dBm

1MAX

Ref Lvl

5.5 dBm

Ref Lvl

5.5 dBm

RF Att 40 dB

Start 870 MHz Stop 870.4 MHz40 kHz/

RBW 1 kHz

VBW 3 kHz

SWT 1 s

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

-94.5

5.5

1

Marker 1 [T1]

-69.24 dBm

870.03046092 MHz

1 [T1] -69.24 dBm

870.03046092 MHz

LOFB

Date: 19.SEP.2017 23:44:40

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 52 of 89

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.6 - TRANSIENT POWER Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.10: Transmitter transient power is power falling into frequencies other than the operating channel as a result of the transmitter being switched on and off. Limit: The transient power shall not exceed the values given in Table 23.

Method of measurement The output of the EUT shall be connected to a spectrum analyser or equivalent measuring equipment. The measurement shall be undertaken in zero span mode. The analyser's centre frequency shall be set to an offset from the operating centre frequency. These offset values and their corresponding RBW configurations are listed in Table 24.

The used modulation shall be D-M3. The analyser shall be set to the settings of Table 25 and a measurement shall be started for each offset frequency. The EUT shall transmit at least five D-M3 test signal. The peak value shall be recorded and the measurement shall be repeated at each offset frequency mentioned in Table 24. The recorded power values shall be converted to power values measured in RBWREF by the formula in clause 4.3.10.1.

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The used modulation shall be D-M3. The analyser shall be set to the settings of Table 25 and a measurement shall be started for each offset frequency. The EUT shall transmit at least five D-M3 test signal. The peak value shall be recorded and the measurement shall be repeated at each offset frequency mentioned in Table 24. The recorded power values shall be converted to power values measured in RBWREF by the formula in clause 4.3.10.1.

Test Data

Environmental Conditions

Temperature: 23 ℃

Relative Humidity: 52 %

ATM Pressure: 101.5 kPa

The testing was performed by Jacob Kong on 2017-09-19.

Test mode: Transmitting. Please refer to the below tables and plots.

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

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864MHz, 125 kHz

Item Test Frequency

Offset From Centre Frequency

Measure Transient

Power (dBm)

RBWref/RBWmeas

(kHz)

Correct Factor(dB)

Transient Power (dBm)

Limit (dBm)

Result

Offset *1 -0.5*OCW-3kHz -26.26 1/1 0 -26.26 0 Pass

Offset *2

-OCW -39.74 1/10 -10 -49.74 0 Pass

Offset *3 -0.5*OCW-400kHz -52.07 1/100 -20 -72.07 -27 Pass

Offset *4 -0.5*OCW-1200kHz -54.39 1/300 -24.8 -79.19 -27 Pass

Offset *5

+0.5*OCW+3kHz -25.81 1/1 0 -25.81 0 Pass

Offset *6 +OCW -39.67 1/10 -10 -49.67 0 Pass

Offset *7 +0.5*OCW+400kHz -51.71 1/100 -20 -71.71 -27 Pass

Offset *8

+0.5*OCW+1200kHz -52.55 1/300 -24.8 -77.35 -27 Pass

864MHz, 250 kHz

Item Test Frequency

Offset From Centre Frequency

Measure Transient

Power (dBm)

RBWref/RBWmeas

(kHz)

Correct Factor(dB)

Transient Power (dBm)

Limit (dBm)

Result

Offset *1

-0.5*OCW-3kHz -24.14 1/1 0 -24.14 0 Pass

Offset *2

-OCW -38.86 1/30 -14.8 -53.66 0 Pass

Offset *3 -0.5*OCW-400kHz -48.90 1/100 -20 -68.9 -27 Pass

Offset *4

-0.5*OCW-1200kHz -52.46 1/300 -24.8 -77.26 -27 Pass

Offset *5

+0.5*OCW+3kHz -24.36 1/1 0 -24.36 0 Pass

Offset *6 +OCW -38.93 1/30 -14.8 -53.73 0 Pass

Offset *7 +0.5*OCW+400kHz -48.59 1/100 -20 -68.59 -27 Pass

Offset *8

+0.5*OCW+1200kHz -50.07 1/300 -24.8 -74.87 -27 Pass

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 55 of 89

864MHz, 500 kHz

Item Test Frequency

Offset From Centre Frequency

Measure Transient

Power (dBm)

RBWref/RBWmeas

(kHz)

Correct Factor(dB)

Transient Power (dBm)

Limit (dBm)

Result

Offset *1 -0.5*OCW-3kHz -29.28 1/1 0 -29.28 0 Pass

Offset *2

-OCW -51.72 1/50 -17 -68.72 -27 Pass

Offset *3 -0.5*OCW-400kHz -57.59 1/100 -20 -77.59 -27 Pass

Offset *4 -0.5*OCW-1200kHz -54.96 1/300 -24.8 -79.76 -27 Pass

Offset *5

+0.5*OCW+3kHz -27.35 1/1 0 -27.35 0 Pass

Offset *6 +OCW -50.23 1/50 -17 -67.23 -27 Pass

Offset *7 +0.5*OCW+400kHz -56.23 1/100 -20 -76.23 -27 Pass

Offset *8

+0.5*OCW+1200kHz -51.34 1/300 -24.8 -76.14 -27 Pass

869MHz, 125 kHz

Item Test Frequency

Offset From Centre Frequency

Measure Transient

Power (dBm)

RBWref/RBWmeas

(kHz)

Correct Factor(dB)

Transient Power (dBm)

Limit (dBm)

Result

Offset *1

-0.5*OCW-3kHz -23.05 1/1 0 -23.05 0 Pass

Offset *2

-OCW -37.57 1/10 -10 -47.57 0 Pass

Offset *3 -0.5*OCW-400kHz -49.41 1/100 -20 -69.41 -27 Pass

Offset *4

-0.5*OCW-1200kHz -51.36 1/300 -24.8 -76.16 -27 Pass

Offset *5

+0.5*OCW+3kHz -22.87 1/1 0 -22.87 0 Pass

Offset *6 +OCW -37.35 1/10 -10 -47.35 0 Pass

Offset *7 +0.5*OCW+400kHz -49.82 1/100 -20 -69.82 -27 Pass

Offset *8

+0.5*OCW+1200kHz -49.96 1/300 -24.8 -74.76 -27 Pass

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 56 of 89

869MHz, 250 kHz

Item Test Frequency

Offset From Centre Frequency

Measure Transient

Power (dBm)

RBWref/RBWmeas

(kHz)

Correct Factor(dB)

Transient Power (dBm)

Limit (dBm)

Result

Offset *1 -0.5*OCW-3kHz -21.55 1/1 0 -21.55 0 Pass

Offset *2

-OCW -36.21 1/30 -14.8 -51.01 0 Pass

Offset *3 -0.5*OCW-400kHz -45.11 1/100 -20 -65.11 -27 Pass

Offset *4 -0.5*OCW-1200kHz -48.82 1/300 -24.8 -73.62 -27 Pass

Offset *5

+0.5*OCW+3kHz -21.21 1/1 0 -21.21 0 Pass

Offset *6 +OCW -36.88 1/30 -14.8 -51.68 0 Pass

Offset *7 +0.5*OCW+400kHz -45.13 1/100 -20 -65.13 -27 Pass

Offset *8

+0.5*OCW+1200kHz -47.09 1/300 -24.8 -71.89 -27 Pass

869MHz, 500 kHz

Item Test Frequency

Offset From Centre Frequency

Measure Transient

Power (dBm)

RBWref/RBWmeas

(kHz)

Correct Factor(dB)

Transient Power (dBm)

Limit (dBm)

Result

Offset *1

-0.5*OCW-3kHz -25.27 1/1 0 -25.27 0 Pass

Offset *2

-OCW -43.81 1/50 -17 -60.81 -27 Pass

Offset *3 -0.5*OCW-400kHz -49.72 1/100 -20 -69.72 -27 Pass

Offset *4

-0.5*OCW-1200kHz -51.31 1/300 -24.8 -76.11 -27 Pass

Offset *5

+0.5*OCW+3kHz -24.63 1/1 0 -24.63 0 Pass

Offset *6 +OCW -43.59 1/50 -17 -60.59 -27 Pass

Offset *7 +0.5*OCW+400kHz -49.99 1/100 -20 -69.99 -27 Pass

Offset *8

+0.5*OCW+1200kHz -48.52 1/300 -24.8 -73.32 -27 Pass

Note: Correct factor=10*log (RBWref/RBWmeas)

Transient power=Absolute level + Correct factor

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

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864MHz, 125 kHz

Offset *1

Ref 28.5 dBm Att 20 dB*

Offset 3.5 dB

A

LVL

*

Center 863.9345 MHz 50 ms/

3DB

RBW 1 kHz

VBW 10 kHz

SWT 500 ms

MAXH

*1 RM

-70

-60

-50

-40

-30

-20

-10

0

10

20

1

Marker 1 [T1 ]

-26.26 dBm

428.685897 ms

D1 0 dBm

Date: 18.SEP.2017 23:05:53

Offset *2

Offset 3.5 dB

A

LVL

MAXH

3DB

RBW 10 kHz

SWT 500 ms

* VBW 100 kHz

Ref 18.5 dBm Att 10 dB*

Center 863.875 MHz 50 ms/

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-39.74 dBm

407.852564 ms

D1 0 dBm

Date: 18.SEP.2017 23:08:56

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Offset *3

Offset 3.5 dB

A

LVL

MAXH

Att 10 dB*

3DB

RBW 100 kHz

SWT 500 ms

* VBW 1 MHz

Ref 0 dBm

Center 863.5375 MHz 50 ms/

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-52.07 dBm

286.858974 ms

D1 -27 dBm

Date: 18.SEP.2017 23:11:37

Offset *4

Offset 3.5 dB

A

LVL

MAXH

Att 10 dB*Ref 0 dBm

Center 862.7375 MHz 50 ms/

3DB

RBW 300 kHz

SWT 500 ms

* VBW 3 MHz

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-54.39 dBm

16.826923 ms

D1 -27 dBm

Date: 18.SEP.2017 23:15:14

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Offset *5

Ref 28.5 dBm Att 20 dB*

Offset 3.5 dB

A

LVL

MAXH

*

Center 864.0655 MHz 50 ms/

3DB

RBW 1 kHz

VBW 10 kHz

SWT 500 ms

*1 RM

-70

-60

-50

-40

-30

-20

-10

0

10

20

1

Marker 1 [T1 ]

-25.81 dBm

157.852564 ms

D1 0 dBm

Date: 18.SEP.2017 23:06:51

Offset *6

Offset 3.5 dB

A

LVL

MAXH

Ref 18.5 dBm Att 10 dB*

*

Center 864.125 MHz 50 ms/

3DB

RBW 10 kHz

VBW 100 kHz

SWT 500 ms

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-39.67 dBm

453.525641 ms

D1 0 dBm

Date: 18.SEP.2017 23:09:37

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

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Offset *7

Offset 3.5 dB

A

LVL

MAXH

Att 10 dB*Ref 0 dBm

*

Center 864.4625 MHz 50 ms/

3DB

RBW 100 kHz

VBW 1 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-51.71 dBm

136.217949 ms

D1 -27 dBm

Date: 18.SEP.2017 23:13:06

Offset *8

Offset 3.5 dB

A

LVL

MAXH

Att 10 dB*Ref 0 dBm

*

Center 865.2625 MHz 50 ms/

3DB

RBW 300 kHz

VBW 3 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-52.55 dBm

129.807692 ms

D1 -27 dBm

Date: 18.SEP.2017 23:16:12

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

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864MHz, 250 kHz

Offset *1

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 18.5 dBm

Center 863.872 MHz 50 ms/

3DB

RBW 1 kHz

SWT 500 ms

* VBW 10 kHz

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-24.14 dBm

97.756410 ms

D1 0 dBm

Date: 18.SEP.2017 23:54:01

Offset *2

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 18.5 dBm

Center 863.75 MHz 50 ms/

3DB

RBW 30 kHz

SWT 500 ms

* VBW 300 kHz

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-38.86 dBm

204.326923 ms

D1 0 dBm

Date: 18.SEP.2017 23:51:32

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

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Offset *3

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

Center 863.475 MHz 50 ms/

3DB

RBW 100 kHz

SWT 500 ms

* VBW 1 MHz

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-48.90 dBm

52.083333 ms

D1 -27 dBm

Date: 18.SEP.2017 23:49:00

Offset *4

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

*

Center 862.675 MHz 50 ms/

3DB

RBW 300 kHz

VBW 3 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-52.46 dBm

134.615385 ms

D1 -27 dBm

Date: 18.SEP.2017 23:46:32

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 63 of 89

Offset *5

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 18.5 dBm

*

Center 864.128 MHz 50 ms/

3DB

RBW 1 kHz

VBW 10 kHz

SWT 500 ms

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-24.36 dBm

364.583333 ms

D1 0 dBm

Date: 18.SEP.2017 23:55:06

Offset *6

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 18.5 dBm

*

Center 864.25 MHz 50 ms/

3DB

RBW 30 kHz

VBW 300 kHz

SWT 500 ms

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-38.93 dBm

132.211538 ms

D1 0 dBm

Date: 18.SEP.2017 23:52:29

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 64 of 89

Offset *7

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

*

Center 864.525 MHz 50 ms/

3DB

RBW 100 kHz

VBW 1 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-48.59 dBm

54.487179 ms

D1 -27 dBm

Date: 18.SEP.2017 23:50:08

Offset *8

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

*

Center 865.325 MHz 50 ms/

3DB

RBW 300 kHz

VBW 3 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-50.07 dBm

97.756410 ms

D1 -27 dBm

Date: 18.SEP.2017 23:47:20

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 65 of 89

864MHz, 500 kHz

Offset *1

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 18.5 dBm

*

Center 863.747 MHz 50 ms/

3DB

RBW 1 kHz

VBW 10 kHz

SWT 500 ms

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-29.28 dBm

350.961538 ms

D1 0 dBm

Date: 18.SEP.2017 23:58:23

Offset *2

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

Center 863.5 MHz 50 ms/

3DB

RBW 50 kHz

SWT 500 ms

* VBW 500 kHz

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-51.72 dBm

376.602564 ms

D1 -27 dBm

Date: 19.SEP.2017 00:02:04

Page 66: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 66 of 89

Offset *3

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

Center 863.35 MHz 50 ms/

3DB

RBW 100 kHz

SWT 500 ms

* VBW 1 MHz

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-57.59 dBm

342.948718 ms

D1 -27 dBm

Date: 19.SEP.2017 00:04:35

Offset *4

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

Center 862.55 MHz 50 ms/

3DB

RBW 300 kHz

SWT 500 ms

* VBW 3 MHz

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-54.96 dBm

377.403846 ms

D1 -27 dBm

Date: 19.SEP.2017 00:07:36

Page 67: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 67 of 89

Offset *5

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 18.5 dBm

*

Center 864.253 MHz 50 ms/

3DB

RBW 1 kHz

VBW 10 kHz

SWT 500 ms

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-27.35 dBm

111.378205 ms

D1 0 dBm

Date: 19.SEP.2017 00:00:13

Offset *6

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

*

Center 864.5 MHz 50 ms/

3DB

RBW 50 kHz

VBW 500 kHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-50.23 dBm

419.871795 ms

D1 -27 dBm

Date: 19.SEP.2017 00:03:12

Page 68: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 68 of 89

Offset *7

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

*

Center 864.65 MHz 50 ms/

3DB

RBW 100 kHz

VBW 1 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-56.53 dBm

3.205128 ms

D1 -27 dBm

Date: 19.SEP.2017 00:06:07

Offset *8

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

*

Center 865.45 MHz 50 ms/

3DB

RBW 300 kHz

VBW 3 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-51.34 dBm

264.423077 ms

D1 -27 dBm

Date: 19.SEP.2017 00:08:49

Page 69: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 69 of 89

869MHz, 125 kHz

Offset *1

Offset 3.5 dB

A

LVL

Att 10 dB*Ref 18.5 dBm

MAXH

*

Center 868.9345 MHz 50 ms/

3DB

RBW 1 kHz

VBW 10 kHz

SWT 500 ms

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-23.05 dBm

286.858974 ms

D1 0 dBm

Date: 18.SEP.2017 23:28:03

Offset *2

Offset 3.5 dB

A

LVL

Att 10 dB*

3DB

RBW 10 kHz

SWT 500 ms

* VBW 100 kHz

Ref 18.5 dBm

Center 868.875 MHz 50 ms/

MAXH

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-37.57 dBm

48.076923 ms

D1 0 dBm

Date: 18.SEP.2017 23:25:54

Page 70: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 70 of 89

Offset *3

Offset 3.5 dB

A

LVL

MAXH

Att 10 dB*Ref 0 dBm

Center 868.5375 MHz 50 ms/

3DB

RBW 100 kHz

SWT 500 ms

* VBW 1 MHz

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-49.41 dBm

94.551282 ms

D1 -27 dBm

Date: 18.SEP.2017 23:23:26

Offset *4

Offset 3.5 dB

A

LVL

MAXH

Att 10 dB*Ref 0 dBm

*

Center 867.7375 MHz 50 ms/

3DB

RBW 300 kHz

VBW 3 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-51.36 dBm

289.262821 ms

D1 -27 dBm

Date: 18.SEP.2017 23:20:29

Page 71: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 71 of 89

Offset *5

Offset 3.5 dB

A

LVL

Att 10 dB*Ref 18.5 dBm

MAXH

*

Center 869.0655 MHz 50 ms/

3DB

RBW 1 kHz

VBW 10 kHz

SWT 500 ms

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-22.87 dBm

390.224359 ms

D1 0 dBm

Date: 18.SEP.2017 23:28:51

Offset *6

Offset 3.5 dB

A

LVL

Att 10 dB*Ref 18.5 dBm

MAXH

*

Center 869.125 MHz 50 ms/

3DB

RBW 10 kHz

VBW 100 kHz

SWT 500 ms

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-37.35 dBm

431.891026 ms

D1 0 dBm

Date: 18.SEP.2017 23:26:37

Page 72: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 72 of 89

Offset *7

Offset 3.5 dB

A

LVL

MAXH

Att 10 dB*Ref 0 dBm

*

Center 869.4625 MHz 50 ms/

3DB

RBW 100 kHz

VBW 1 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-49.82 dBm

262.019231 ms

D1 -27 dBm

Date: 18.SEP.2017 23:24:14

Offset *8

Offset 3.5 dB

A

LVL

MAXH

Att 10 dB*Ref 0 dBm

*

Center 870.2625 MHz 50 ms/

3DB

RBW 300 kHz

VBW 3 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-49.96 dBm

93.750000 ms

D1 -27 dBm

Date: 18.SEP.2017 23:21:38

Page 73: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 73 of 89

869MHz, 250 kHz

Offset *1

Offset 3.5 dB

A

LVL

Att 10 dB*Ref 18.5 dBm

MAXH

*

Center 868.872 MHz 50 ms/

3DB

RBW 1 kHz

VBW 10 kHz

SWT 500 ms

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-21.55 dBm

375.801282 ms

D1 0 dBm

Date: 18.SEP.2017 23:32:15

Offset *2

Offset 3.5 dB

A

LVL

Att 10 dB*Ref 18.5 dBm

MAXH

*

Center 868.75 MHz 50 ms/

3DB

RBW 30 kHz

VBW 300 kHz

SWT 500 ms

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-36.21 dBm

287.660256 ms

D1 0 dBm

Date: 18.SEP.2017 23:35:18

Page 74: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 74 of 89

Offset *3

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

*

3DB

RBW 100 kHz

VBW 1 MHz

SWT 500 msRef 0 dBm

Center 868.475 MHz 50 ms/

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-45.11 dBm

102.564103 ms

D1 -27 dBm

Date: 18.SEP.2017 23:38:45

Offset *4

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

*

Center 867.675 MHz 50 ms/

3DB

RBW 300 kHz

VBW 3 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-48.82 dBm

235.576923 ms

D1 -27 dBm

Date: 18.SEP.2017 23:41:42

Page 75: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 75 of 89

Offset *5

Offset 3.5 dB

A

LVL

Att 10 dB*Ref 18.5 dBm

MAXH

*

Center 869.128 MHz 50 ms/

3DB

RBW 1 kHz

VBW 10 kHz

SWT 500 ms

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-21.61 dBm

287.660256 ms

D1 0 dBm

Date: 18.SEP.2017 23:33:37

Offset *6

Offset 3.5 dB

A

LVL

Att 10 dB*Ref 18.5 dBm

MAXH

*

Center 869.25 MHz 50 ms/

3DB

RBW 30 kHz

VBW 300 kHz

SWT 500 ms

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-36.88 dBm

248.397436 ms

D1 0 dBm

Date: 18.SEP.2017 23:36:28

Page 76: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 76 of 89

Offset *7

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

*

Center 869.525 MHz 50 ms/

3DB

RBW 100 kHz

VBW 1 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-45.13 dBm

32.051282 ms

D1 -27 dBm

Date: 18.SEP.2017 23:40:13

Offset *8

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

*

Center 870.325 MHz 50 ms/

3DB

RBW 300 kHz

VBW 3 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-47.09 dBm

217.147436 ms

D1 -27 dBm

Date: 18.SEP.2017 23:42:39

Page 77: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 77 of 89

869MHz, 500 kHz

Offset *1

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 18.5 dBm

Center 868.747 MHz 50 ms/

3DB

RBW 1 kHz

SWT 500 ms

* VBW 10 kHz

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-25.27 dBm

403.044872 ms

D1 0 dBm

Date: 19.SEP.2017 00:25:03

Offset *2

Offset 3.5 dB

A

LVL

Att 10 dB*Ref 6 dBm

MAXH

*

Center 868.5 MHz 50 ms/

3DB

RBW 50 kHz

VBW 500 kHz

SWT 500 ms

*1 RM

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-43.81 dBm

48.878205 ms

D1 -27 dBm

Date: 19.SEP.2017 00:23:30

Page 78: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 78 of 89

Offset *3

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

Center 868.35 MHz 50 ms/

3DB

RBW 100 kHz

SWT 500 ms

* VBW 1 MHz

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-49.72 dBm

350.160256 ms

D1 -27 dBm

Date: 19.SEP.2017 00:14:52

Offset *4

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

*

Center 867.55 MHz 50 ms/

3DB

RBW 300 kHz

VBW 3 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-51.31 dBm

225.160256 ms

D1 -27 dBm

Date: 19.SEP.2017 00:11:46

Page 79: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 79 of 89

Offset *5

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 18.5 dBm

*

Center 869.253 MHz 50 ms/

3DB

RBW 1 kHz

VBW 10 kHz

SWT 500 ms

*1 RM

-80

-70

-60

-50

-40

-30

-20

-10

0

10

1

Marker 1 [T1 ]

-24.63 dBm

207.532051 ms

D1 0 dBm

Date: 19.SEP.2017 00:25:57

Offset *6

Offset 3.5 dB

A

LVL

Att 10 dB*

*

3DB

RBW 50 kHz

VBW 500 kHz

SWT 500 msRef 6 dBm

Center 869.5 MHz 50 ms/

MAXH

*1 RM

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-43.59 dBm

40.865385 ms

D1 -27 dBm

Date: 19.SEP.2017 00:22:36

Page 80: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 80 of 89

Offset *7

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

*

Center 869.65 MHz 50 ms/

3DB

RBW 100 kHz

VBW 1 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-49.99 dBm

173.878205 ms

D1 -27 dBm

Date: 19.SEP.2017 00:15:53

Offset *8

Offset 3.5 dB

A

LVL

Att 10 dB*

MAXH

Ref 0 dBm

*

Center 870.45 MHz 50 ms/

3DB

RBW 300 kHz

VBW 3 MHz

SWT 500 ms

*1 RM

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1

Marker 1 [T1 ]

-48.52 dBm

427.884615 ms

D1 -27 dBm

Date: 19.SEP.2017 00:13:26

Page 81: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 81 of 89

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.8 – TX BEHAVIOUR LOW VOLTAGE CONDITIONS Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.12: The TX behaviour under low voltage condition is the ability of the equipment to maintain its operating frequency and not produce emissions which exceed any relevant limit when the battery voltage falls below the lower extreme voltage level. Limit: The equipment shall either: a) remain in the Operating Channel OC without exceeding any applicable limits (e.g. Duty Cycle); or b) reduce its effective radiated power below the Spurious Emission limits without exceeding any applicable limits(e.g. Duty Cycle); or c) shut down, (ceasing function); as the voltage falls below the manufacturers declared operating voltage. Method of measurement Step 1: Operation of the EUT shall be started, on Operating Frequency as declared by the manufacturer, with the appropriate test signal and with the EUT operating at nominal operating voltage. The centre frequency of the transmitted signal shall be measured and noted. Step 2: The operating voltage shall be reduced by appropriate steps until the voltage reaches zero. The centre frequency of the transmitted signal shall be measured and noted. Any abnormal behaviour shall be noted. Test Data

Environmental Conditions

Temperature: 23 ℃

Relative Humidity: 53 %

ATM Pressure: 101.5 kPa

The testing was performed by Jacob Kong on 2017-09-21.

Test result: The equipment will shut down when the voltage below the manufacturers declared operating voltage.

Page 82: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 82 of 89

ETSI EN 300 220-2 V3.1.1 (2017-02) §4.4.2- BLOCKING Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.18.1. Limit: The blocking level shall be better or equal to category 3 reference limits level defined in ETSI EN 300 220-1 [1], clause 5.18.2. NOTE: After December 31st, 2018, the receiver category 3 will be withdrawn, therefore receiver category 2 will be the minimum applicable level. Method of measurement Signal generator A shall be set to an appropriate modulated test signal at the operating frequency of the EUT receiver. Signal generator B shall be unmodulated. Measurements shall be carried out at frequencies of the unwanted signal at approximately the frequency(ies) offset(s) defined in technical requirement avoiding those frequencies at which spurious responses occur. Additional measurement points may be requested by technical requirements clause. If several operational frequency bands are used by the equipment, at least one blocking measurement by bands has to be performed. Step 1: Signal generator B shall be powered off. Signal generator A shall be set to the minimum level which gives the wanted performance criterion of EUT or the reference level in Table 32, whichever is the higher The output level of generator A shall then be increased by 3 dB unless otherwise specified in technical requirement. Step 2: Signal generator B is powered on and set to operate at the nominal operating frequency - offset frequency. Signal generator B is then switched on and the signal amplitude is adjusted to the minimum level at which the wanted performance criterion is not achieved. With signal generator B settings unchanged, the receiver shall be replaced with a suitable RF power measuring equipment. The power into the measuring equipment shall be measured and noted. The blocking level is then the conducted power received from generator B at the EUT antenna connector. This can either be measured on the antenna connector for conducted test or be calculated for radiated test (see clause C.5.4). The blocking level shall be higher or equal to the blocking power level requested in the technical requirement clause. Step 3: The measurement in steps 1 to 3 shall be repeated with signal offsets at required frequencies. Step 4: The information shown in Table 44 shall be recorded in the test report for each measured signal level and unwanted signal offset.

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Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 83 of 89

For equipment using CCA whatever is the receiver category, steps 1 to 4 shall be repeated with signal generator A level adjusted +13 dB higher than in the measurements in clause 5.18.6.4 Test Data

Environmental Conditions

Temperature: 23℃

Relative Humidity: 50 %

ATM Pressure: 101.5 kPa

The testing was performed by Jacob Kong on 2017-09-21. Test result: Compliance. Note: the EUT belong to Category 3.

Bandwidth: 125 kHz

Frequency Frequency offset (MHz)

Test result (dBm)

Limit (dBm) Result

864 MHz

-2 -55.31 -80 PASS

+2 -55.25 -80 PASS

-10 -45.49 -60 PASS

+10 -44.61 -60 PASS

-43.20 -45.95 -60 PASS

+43.20 -44.89 -60 PASS

Frequency Frequency offset

(MHz) Test result

(dBm) Limit (dBm) Result

869 MHz

-2 -55.27 -80 PASS

+2 -55.31 -80 PASS

-10 -44.83 -60 PASS

+10 -45.61 -60 PASS

-43.45 -46.36 -60 PASS

+43.45 -46.82 -60 PASS

Page 84: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 84 of 89

Bandwidth: 250 kHz

Frequency Frequency offset (MHz)

Test result (dBm)

Limit (dBm)

Result

864 MHz

-2 -55.51 -80 PASS

+2 -55.39 -80 PASS

-10 -46.19 -60 PASS

+10 -45.44 -60 PASS

-43.20 -46.87 -60 PASS

+43.20 -46.85 -60 PASS

Frequency Frequency offset (MHz)

Test result (dBm)

Limit (dBm) Result

869 MHz

-2 -55.57 -80 PASS

+2 -55.72 -80 PASS

-10 -46.17 -60 PASS

+10 -45.46 -60 PASS

-43.45 -45.97 -60 PASS

+43.45 -45.73 -60 PASS

Bandwidth: 500 kHz

Frequency Frequency offset (MHz)

Test result (dBm)

Limit (dBm)

Result

864 MHz

-2 -54.57 -80 PASS

+2 -55.40 -80 PASS

-10 -45.35 -60 PASS

+10 -45.51 -60 PASS

-43.20 -46.06 -60 PASS

+43.20 -46.67 -60 PASS

Frequency Frequency offset (MHz)

Test result (dBm)

Limit (dBm) Result

869 MHz

-2 -55.20 -80 PASS

+2 -55.38 -80 PASS

-10 -45.46 -60 PASS

+10 -45.64 -60 PASS

-43.45 -46.76 -60 PASS

+43.45 -46.57 -60 PASS

Page 85: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 85 of 89

EXHIBIT B - EUT PHOTOGRAPHS

EUT – All View

EUT – Mainboard Top View

Page 86: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 86 of 89

EUT – Mainboard Top Shielding off View

EUT – Mainboard Bottom View

Page 87: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 87 of 89

EUT – IC View

EUT – Ant View

Page 88: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 88 of 89

EUT – Ant Port View

Page 89: Shenzhen Rakwireless Technology Co., Ltd....Note: This test report is prepared for the customer shown above and for the equipment described herein.It may not be duplicated or used

Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22

ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 89 of 89

EXHIBIT B - TEST SETUP PHOTOGRAPHS

Radiated Spurious Emissions View (Below 1 GHz)

Radiated Spurious Emissions View (Above 1 GHz)

*****END OF REPORT*****