shenzhen rakwireless technology co., ltd....note: this test report is prepared for the customer...
TRANSCRIPT
Note: This test report is prepared for the customer shown above and for the equipment described herein. It may not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp. This report is valid only with a valid digital signature. The digital signature may be available only under the Adobe software above version 7.0.
ETSI EN 300 220-1 V3.1.1 (2017-02) ETSI EN 300 220-2 V3.1.1 (2017-02)
TEST REPORT
For
Shenzhen Rakwireless Technology Co., Ltd.
RM1007, Hangsheng Technology Building, 4th South Gaoxing Avenue, Science and Technology Park, Nanshan District, Shenzhen
Model: RAK831
Report Type:
Original Report
Product Type:
LoRa GATEWAY
Report Number: RSZ170830002-22
Report Date: 2017-09-30
Reviewed By:
Simon Wang RF Engineer
Prepared By:
Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F., West Wing, Third Phase of Wanli Industrial Building, Shihua Road, Futian Free Trade Zone, Shenzhen, Guangdong, China Tel: +86-755-33320018 Fax: +86-755-33320008 www.baclcorp.com.cn
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 2 of 89
TABLE OF CONTENTS
GENERAL INFORMATION ....................................................................................................................................... 4
PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) ..................................................................................... 4 OBJECTIVE ................................................................................................................................................................... 4 TEST METHODOLOGY .................................................................................................................................................. 4 MEASUREMENT UNCERTAINTY .................................................................................................................................... 4 TEST FACILITY ............................................................................................................................................................. 5
SYSTEM TEST CONFIGURATION .......................................................................................................................... 6
DESCRIPTION OF TEST CONFIGURATION ...................................................................................................................... 6 EUT EXERCISE SOFTWARE .......................................................................................................................................... 6 SPECIAL ACCESSORIES ................................................................................................................................................. 6 SUPPORT EQUIPMENT LIST AND DETAILS. ................................................................................................................... 6 EXTERNAL I/O CABLE .................................................................................................................................................. 6 BLOCK DIAGRAM OF TEST SETUP ................................................................................................................................ 7
SUMMARY OF TEST RESULTS ............................................................................................................................... 8
TEST EQUIPMENT LIST ........................................................................................................................................... 9
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.2.1 - OPERATING FREQUENCY ......................................................... 10
APPLICABLE STANDARD ............................................................................................................................................ 10 THE RESULT ............................................................................................................................................................... 10
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.2.2 - UNWANTED EMISSIONS IN THE SPURIOUS DOMAIN ....... 11
APPLICABLE STANDARD ............................................................................................................................................ 11 METHOD OF MEASUREMENT ...................................................................................................................................... 11 TEST DATA ................................................................................................................................................................ 12
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.1 - EFFECTIVE RADIATED POWER............................................... 15
APPLICABLE STANDARD ............................................................................................................................................ 15 METHOD OF MEASUREMENT ...................................................................................................................................... 15 TEST DATA ................................................................................................................................................................ 16
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.2– MAXIMUM E.R.P. SPECTRAL DENSITY .................................. 18
APPLICABLE STANDARD ............................................................................................................................................ 18 METHOD OF MEASUREMENT ...................................................................................................................................... 18 TEST DATA ................................................................................................................................................................ 19
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.3 - DUTY CYCLE ................................................................................. 23
APPLICABLE STANDARD ............................................................................................................................................ 23 METHOD OF MEASUREMENT ...................................................................................................................................... 23 TEST DATA ................................................................................................................................................................ 24
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.4 - OCCUPIED BANDWIDTH ............................................................ 25
APPLICABLE STANDARD ............................................................................................................................................ 25 METHOD OF MEASUREMENT....................................................................................................................................... 26 TEST DATA ................................................................................................................................................................ 27
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.5 - TX OUT OF BAND EMISSIONS .................................................. 33
APPLICABLE STANDARD ............................................................................................................................................ 33 METHOD OF MEASUREMENT....................................................................................................................................... 34 TEST DATA ................................................................................................................................................................ 34
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
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ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.6 - TRANSIENT POWER .................................................................... 52
APPLICABLE STANDARD ............................................................................................................................................ 52 METHOD OF MEASUREMENT....................................................................................................................................... 52 TEST DATA ................................................................................................................................................................ 53
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.8 – TX BEHAVIOUR LOW VOLTAGE CONDITIONS .................. 81
APPLICABLE STANDARD ............................................................................................................................................ 81 METHOD OF MEASUREMENT....................................................................................................................................... 81 TEST DATA ................................................................................................................................................................ 81
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.4.2- BLOCKING ...................................................................................... 82
APPLICABLE STANDARD ............................................................................................................................................ 82 METHOD OF MEASUREMENT....................................................................................................................................... 82 TEST DATA ................................................................................................................................................................ 83
EXHIBIT B - EUT PHOTOGRAPHS ....................................................................................................................... 85
EUT – ALL VIEW ....................................................................................................................................................... 85 EUT – MAINBOARD TOP VIEW .................................................................................................................................. 85 EUT – MAINBOARD TOP SHIELDING OFF VIEW ......................................................................................................... 86 EUT – MAINBOARD BOTTOM VIEW ........................................................................................................................... 86 EUT – IC VIEW .......................................................................................................................................................... 87 EUT – ANT VIEW ....................................................................................................................................................... 87 EUT – ANT PORT VIEW ............................................................................................................................................. 88
EXHIBIT B - TEST SETUP PHOTOGRAPHS ....................................................................................................... 89
RADIATED SPURIOUS EMISSIONS VIEW (BELOW 1 GHZ) ........................................................................................... 89 RADIATED SPURIOUS EMISSIONS VIEW (ABOVE 1 GHZ) ........................................................................................... 89
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 4 of 89
GENERAL INFORMATION Product Description for Equipment under Test (EUT) The Shenzhen Rakwireless Technology Co., Ltd.’s product, model number: RAK831 (or the "EUT") in this report was a LoRa GATEWAY, which was measured approximately: 80 mm (L) * 60 mm (W) * 10 mm (H), rated with input voltage: DC 5.0V. *All measurement and test data in this report was gathered from production sample serial number: 1701996 (Assigned by BACL, Shenzhen). The EUT supplied by the applicant was received on 2017-08-30. Objective The test report is prepared on behalf of the Shenzhen Rakwireless Technology Co., Ltd. in accordance with ETSI EN 300 220-2 V3.1.1 (2017-02), short range devices (SRD) operating in the frequency range 25 MHz to 1 000 MHz; Part 2: harmonised standard covering the essential requirements of article 3.2 of Directive 2014/53/EU for non specific radio equipment. The objective is to determine the compliance of the EUT with ETSI EN 300 220-2 V3.1.1 (2017-02). Test Methodology All measurements contained in this report were conducted with ETSI EN 300 220-1 V3.1.1 (2017-02).
Measurement Uncertainty
Parameter Flab Maximum allow uncertainty
Radio frequency ±0.5 ppm ±0.5 ppm
RF output power, conducted ±1.5dB ±1.5dB Conducted spurious emission of transmitter, valid up to 6 GHz ±1.5dB ±3dB
Conducted emission of receivers ±1.5dB ±3dB
Radiated emission of transmitter, valid up to 6 GHz ±4.88dB ±6dB
Radiated emission of receiver, valid up to 6 GHz ±4.88dB ±6dB
RF level uncertainty for a given BER ±1.5dB ±1.5dB
Occupied Bandwidth ±5% ±5%
Temperature ±1℃ ±2.5℃
Humidity ±5% ±10%
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 5 of 89
Test Facility The test site used by Bay Area Compliance Laboratories Corp. (Shenzhen) to collect test data is located on the 6/F., West Wing, Third Phase of Wanli Industrial Building, Shihua Road, Futian Free Trade Zone, Shenzhen, Guangdong, China. Bay Area Compliance Laboratories Corp. (Shenzhen) has been accredited to ISO/IEC 17025 by CNAS (Lab code: L2408). And accredited to ISO/IEC 17025 by NVLAP (Lab code: 200707-0), the FCC Designation No. CN5001 under the KDB 974614 D01. The Federal Communications Commission has the reports on file and is listed under FCC Registration No.: 382179. The test site has been approved by the FCC for public use and is listed in the FCC Public Access Link (PAL) database. Bay Area Compliance Laboratories Corp. (Shenzhen) was registered with ISED Canada under ISED Canada Registration Number 3062B.
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 6 of 89
SYSTEM TEST CONFIGURATION Description of Test Configuration The system was configured for testing in a test mode. EUT Exercise Software No exercise software was used. Special Accessories No special accessories. Support Equipment List and Details.
Manufacturer Description Model Serial Number
DELL Laptop E6410 N/A
Rakwireless Debug board FT2232HL N/A
DELL Adapter PA-1900-02D N/A
External I/O Cable
Cable Description Length
(m) From Port To
Unshielded Un-detachable DC Cable 1.2 Adapter Laptop
Unshielded Detachable AC Cable 1.5 AC mains Adapter
Un-shielding Detachable USB Cable 0.8 Debug board Laptop
Un-shielding Detachable flat cable 0.2 Debug board EUT
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
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Block Diagram of Test Setup
Non-Conductive Table 80cm above ground plant
Non-Conductive Table150cm above ground plant
EUTDebug Board
Laptop Adapter
AC Mains
1.5 Meters
1.0 Meter
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 8 of 89
SUMMARY OF TEST RESULTS ETSI EN 300 220-2 V3.1.1 (2017-02)
Rules Description of Test Result Condition
§4.2.1 Operating frequency Compliance /
§4.2.2 Unwanted emissions in the spurious domain
Compliance /
§4.3.1 Effective radiated power Compliance /
§4.3.2 Maximum e.r.p. spectral density Compliance
Applies to EUT using annex B bands I, L.Applies to EUT using DSSS or wideband techniques other than FHSS modulation,
using annex C band X.
§4.3.3 Duty cycle Compliance Not applicable to EUT with polite spectrumaccess where permitted in annex B, table B.1
or annex C, table C.1 or any NRI.
§4.3.4 Occupied Bandwidth Compliance /
§4.3.5 Tx Out of Band Emissions Compliance Applies to EUT with OCW > 25 kHz.
§4.3.6 Transient Power Compliance /
§4.3.7 Adjacent channel power Not Applicable Applies to EUT with OCW ≤ 25 kHz.
§4.3.8 TX behaviour under Low Voltage
Conditions Compliance Applies to battery powered EUT.
§4.3.9 Adaptive Power Control Not Applicable Applies to EUT with adaptive power control
using annex C band AA.
§4.3.10 FHSS equipment Not Applicable Applies to FHSS EUT.
§4.3.11 Short term behaviour Not Applicable Applies to EUT using annex C bands Y, Z, AA, AB, AC, AD.
§4.4.1 RX sensitivity Not Applicable Applies to EUT with polite spectrum access.
§4.4.2 Blocking Compliance /
§4.5.2 Clear Channel Assessment threshold Not Applicable Applies to EUT with polite spectrum access.
§4.5.3 Polite spectrum access timing parameters Not Applicable Applies to EUT with polite spectrum access.
§4.5.4 Adaptive Frequency Agility Not Applicable Applies to EUT with AFA.
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
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TEST EQUIPMENT LIST
Manufacturer Description Model Serial Number Calibration Date
Calibration Due Date
Radiated Emission Test
Rohde & Schwarz EMI Test Receiver ESCI 101120 2016-12-07 2017-12-07
Sunol Sciences Horn Antenna DRH-118 A052604 2014-12-29 2017-12-28
HP Amplifier HP8447E 1937A01046 2017-05-21 2017-11-19
ESPEC Temperature & Humidity
Chamber EL-10KA 09107726 2016-11-22 2017-11-22
Sunol Sciences Bi-log Antenna JB1 A040904-2 2014-12-17 2017-12-16
BIZI Signal Analyzer FSEM 845987/005 2017-04-24 2018-04-24
Anritsu Signal Generator 68369B 004114 2016-12-05 2017-12-05
COM POWER Dipole Antenna AD-100 41000 NCR NCR
Mini Pre-Amplifier ZVA-183-S+ 5969001149 2017-05-21 2018-05-21
A.H.System Horn Antenna SAS-200/571 135 2015-08-18 2018-08-17
RF Conducted Test
ESPEC Temperature & Humidity
Chamber EL-10KA 09107726 2016-11-22 2017-11-22
Long Wei DC Power Supply TPR-6420D 398363 NCR NCR
Anritsu Signal Generator 68369B 004114 2016-12-05 2017-12-05
Rohde & Schwarz Signal Analyzer FSIQ26 8386001028 2017-04-24 2018-04-24
R&S SPECTRUM ANALYZER FSU26 200120 2016-12-05 2017-12-05
* Statement of Traceability: Bay Area Compliance Laboratories Corp. (Shenzhen) attests that all calibrations have been performed in accordance to requirements that traceable to National Primary Standards and International System of Units (SI).
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
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ETSI EN 300 220-2 V3.1.1 (2017-02) §4.2.1 - OPERATING FREQUENCY Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.1.1, the nominal operating frequency is the centre of a channel of width OCW. Limit: The manufacturer may declare either one or more operating frequencies and operating channels. Operating channel(s) shall be be entirely within operational frequency bands allowed by annexes B, C or any NRI The below information shall be recorded in the test report The Result
Note: Compliance, which is declared by the manufacturer.
Operating frequency (MHz)
Operating frequency band (MHz)
Operating channel width (kHz)
864
863~870
125 869
864 250
869
864 500
869
Value Note
Operational Frequency band or bands Declared by the manufacturer
Nominal Operating Frequency or Frequencies Declared by the manufacturer
Operating Channel width(s) - OCW Declared by the manufacturer
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 11 of 89
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.2.2 - UNWANTED EMISSIONS IN THE SPURIOUS DOMAIN Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.9.1.
Spurious emissions are unwanted emissions in the spurious domain at frequencies other than those of the Operating Channel and its Out Of Band Domain. The relevant spurious domain is shown in Figure 7. Limit: The power of any unwanted emission in the spurious domain shall not exceed the values given in Table 19.
Method of Measurement According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.9.3.
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
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Test Data
Environmental Conditions
Temperature: 23 ℃
Relative Humidity: 51 %
ATM Pressure: 101.0 kPa
The testing was performed by Jacob Kong on 2017-09-20.
Test mode: Transmitting
Test result: Compliance.
Radiated spurious emissions:
Frequency (MHz)
Receiver Reading (dBµV)
Turntable Angle Degree
Rx Antenna Substituted Absolute
Level (dBm)
EN 300 220
Height (m)
Polarity(H/V)
SG Level(dBm)
Cable Loss (dB)
AntennaGain (dB)
Limit (dBm)
Margin(dB)
Test Mode: Standby
908.35 31.66 294 1.3 H -65.3 0.70 0 -66.00 -57 9.00
908.35 31.81 162 1.4 V -65.2 0.70 0 -65.90 -57 8.90
1062.34 41.45 338 1.6 H -67.1 1.60 6.90 -61.80 -47 14.80
1062.34 40.61 23 1.4 V -68.8 1.60 6.90 -63.50 -47 16.50
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
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Frequency (MHz)
Receiver Reading (dBµV)
Turntable Angle Degree
Rx Antenna Substituted Absolute
Level (dBm)
EN 300 220
Height (m)
Polarity(H/V)
SG Level(dBm)
Cable Loss (dB)
AntennaGain (dB)
Limit (dBm)
Margin(dB)
Test Mode: Transmitting
864MHz, 125 kHz
923.50 32.06 137 2.2 H -64.9 0.70 0 -65.60 -36 29.60
923.50 32.61 245 2.0 V -64.4 0.70 0 -65.10 -36 29.10
1728.00 45.72 206 1.4 H -61.4 1.30 9.10 -53.60 -30 23.60
1728.00 48.97 199 1.9 V -57.5 1.30 9.10 -49.70 -30 19.70
864MHz, 250 kHz
923.50 33.77 305 1.6 H -63.2 0.70 0 -63.90 -36 27.90
923.50 32.90 163 1.2 V -64.1 0.70 0 -64.80 -36 28.80
1728.00 45.44 11 1.4 H -61.6 1.30 9.10 -53.80 -30 23.80
1728.00 46.88 231 1.2 V -59.6 1.30 9.10 -51.80 -30 21.80
864MHz, 500 kHz
923.50 32.39 8 1.2 H -64.6 0.70 0 -65.30 -36 29.30
923.50 33.02 174 1.8 V -64.0 0.70 0 -64.70 -36 28.70
1728.00 44.75 224 2.5 H -62.3 1.30 9.10 -54.50 -30 24.50
1728.00 47.57 302 1.0 V -58.9 1.30 9.10 -51.10 -30 21.10
869MHz, 125 kHz
923.50 32.95 12 2.4 H -64.0 0.70 0 -64.70 -36 28.70
923.50 33.45 246 1.0 V -63.5 0.70 0 -64.20 -36 28.20
1738.00 47.52 82 1.9 H -60.0 1.30 9.10 -52.20 -30 22.20
1738.00 48.47 99 1.9 V -58.4 1.30 9.10 -50.60 -30 20.60
869MHz, 250 kHz
923.50 33.29 205 2.3 H -63.7 0.70 0 -64.40 -36 28.40
923.50 32.51 11 1.9 V -64.5 0.70 0 -65.20 -36 29.20
1738.00 58.69 360 1.2 H -48.8 1.30 9.10 -41.00 -30 11.00
1738.00 53.99 68 2.3 V -52.9 1.30 9.10 -45.10 -30 15.10
869MHz, 500 kHz
923.50 32.69 165 1.6 H -64.3 0.70 0 -65.00 -36 29.00
923.50 32.11 153 2.5 V -64.9 0.70 0 -65.60 -36 29.60
1738.00 44.11 267 1.9 H -63.0 1.30 9.10 -55.20 -30 25.20
1738.00 47.44 304 1.8 V -59.0 1.30 9.10 -51.20 -30 21.20
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 14 of 89
Frequency (MHz)
Receiver Reading (dBµV)
Turntable Angle Degree
Rx Antenna Substituted Absolute
Level (dBm)
EN 300 220
Height (m)
Polarity(H/V)
SG Level(dBm)
Cable Loss (dB)
AntennaGain (dB)
Limit (dBm)
Margin(dB)
Test Mode: Receiving
864MHz, 125 kHz
915.62 31.23 256 2.3 H -65.8 0.70 0 -66.50 -57 9.50
915.62 32.13 129 1.9 V -64.9 0.70 0 -65.60 -57 8.60
1215.30 40.81 282 2.0 H -67.2 1.50 7.20 -61.50 -47 14.50
1215.30 40.10 174 1.4 V -67.6 1.50 7.20 -61.90 -47 14.90
864MHz, 250 kHz
915.62 32.31 98 2.1 H -64.7 0.70 0 -65.40 -57 8.40
915.62 31.80 32 2.4 V -65.2 0.70 0 -65.90 -57 8.90
1215.30 41.39 251 1.1 H -66.6 1.50 7.20 -60.90 -47 13.90
1215.30 40.48 73 1.3 V -67.2 1.50 7.20 -61.50 -47 14.50
864MHz, 500 kHz
915.62 31.39 17 1.1 H -65.6 0.70 0 -66.30 -57 9.30
915.62 32.40 260 2.1 V -64.6 0.70 0 -65.30 -57 8.30
1215.30 40.37 337 2.1 H -67.6 1.50 7.20 -61.90 -47 14.90
1215.30 41.09 45 1.2 V -66.6 1.50 7.20 -60.90 -47 13.90
869MHz, 125 kHz
915.62 31.18 262 2.1 H -65.8 0.70 0 -66.50 -57 9.50
915.62 31.90 301 1.5 V -65.1 0.70 0 -65.80 -57 8.80
1215.30 40.91 146 1.1 H -67.1 1.50 7.20 -61.40 -47 14.40
1215.30 41.15 103 1.1 V -66.5 1.50 7.20 -60.80 -47 13.80
869MHz, 250 kHz
915.62 32.13 108 2.4 H -64.9 0.70 0 -65.60 -57 8.60
915.62 31.67 349 2.3 V -65.3 0.70 0 -66.00 -57 9.00
1215.30 41.17 233 1.3 H -66.8 1.50 7.20 -61.10 -47 14.10
1215.30 40.85 357 2.3 V -66.8 1.50 7.20 -61.10 -47 14.10
869MHz, 500 kHz
915.62 31.83 127 1.3 H -65.2 0.70 0 -65.90 -57 8.90
915.62 32.51 212 1.6 V -64.5 0.70 0 -65.20 -57 8.20
1215.30 40.33 151 2.1 H -67.6 1.50 7.20 -61.90 -47 14.90
1215.30 40.89 301 2.3 V -66.8 1.50 7.20 -61.10 -47 14.10
Note: Absolute Level = SG Level - Cable loss + Antenna Gain Margin = Limit- Absolute Level
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 15 of 89
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.1 - EFFECTIVE RADIATED POWER Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.2.1: The effective radiated power (e.r.p) is the power radiated in the direction of the maximum radiated power under specified conditions of measurements for any condition of modulation. For equipment with a permanent or temporary antenna connection it may be taken as the power delivered from that connector taking into account the antenna gain. According to ETSI EN 300 220-2 V3.1.1 (2017-02) clause 4.3.1.2: Limit: The effective radiated power shall not be greater than the value allowed in annexes B or C for the chosen operational frequency band(s). Method of Measurement According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.2.2.1: Effective Radiated Power (conducted measurement): This method applies only to EUT with a permanent external antenna connector. The transmitter shall be connected to a dummy load as described in clause 4.3.7 and the conducted power delivered shall be measured with a measurement receiver according to clause 4.3.10. In the case of non-constant envelope modulation, a peak detector shall be used. The maximum gain of the antenna to be used together with the equipment shall be declared by the manufacturer and this shall be recorded in the test report. Perp, the radiated power (e.r.p.) limit applies to the maximum measured conducted power (Pconducted ) value adjusted by the antenna gain (relative to a dipole) (Perp=Pconducted+antenna gain). The information shown in Table 7 shall be recorded in the test report.
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 16 of 89
According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.2.2.2: Effective radiated power (radiated measurement): This measurement method applies to EUT other than those measured using clause 5.2.2.1. A suitable test site shall be selected from those described in clause C.1 and the radiated power established using the procedures described in clause C.5.1 (or clause C.5.2) depending on the test site, followed by clause C.5.3. In the case of non-constant envelope modulation, a peak detector shall be used. The information shown in Table 8 shall be recorded in the test report.
Test Data
Environmental Conditions
Temperature: 23 ℃
Relative Humidity: 51 %
ATM Pressure: 101.0 kPa
The testing was performed by Jacob Kong on 2017-08-10.
Test Mode: Transmitting
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 17 of 89
Normal Condition Test Data as below:
Test with conducted measurement.
Bandwidth: 125 kHz
Test Condition Reading (dBm)
Antenna gain(dBd)
ERP (dBm)
Limit (dBm) Frequency
(MHz) Power (VDC)
864 5 -1.53 -0.15 -1.68 14
869 5 1.44 -0.15 1.29 14
Bandwidth: 250 kHz
Test Condition Reading (dBm)
Antenna gain(dBd)
ERP (dBm)
Limit (dBm) Frequency
(MHz) Power (VDC)
864 5 1.83 -0.15 1.68 14
869 5 4.57 -0.15 4.42 14
Bandwidth: 500 kHz
Test Condition Reading (dBm)
Antenna gain(dBd)
ERP (dBm)
Limit (dBm) Frequency
(MHz) Power (VDC)
864 5 6.98 -0.15 6.83 14
869 5 10.28 -0.15 10.13 14
Note:0dBD=2.15dBi
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 18 of 89
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.2– MAXIMUM E.R.P. SPECTRAL DENSITY Applicable Standard According to ETSI EN 300 220-1 [1], clause 5.3.1 applies. Limit: The Maximum e.r.p. spectral density shall not be greater than the value allowed in annexes B or C for the chosen operational frequency band(s) Method of Measurement The test procedure shall be as follows: Connect the EUT to the spectrum analyser and use the following settings: Centre Frequency: The centre frequency of the Operating Channel under test. Span: Wide enough to cover the complete power envelope of the signal of the EUT (≥ Occupied Bandwidth). Resolution BW: 100 kHz (see note). Video BW: 100 kHz (see note). Sweep time: 1 minute. Detector: RMS. Trace Mode: Max Hold. NOTE: In case the regulatory parameter is expressed in dBm/10 kHz, RBW & VBW should be set to 10 kHz. When the trace is complete, capture the trace, for example using the "View" option on the spectrum analyser. Find the peak value of the trace and place the analyser marker on this peak. This level is recorded as the highest mean power (spectral power density) D in a 100 kHz band. Alternatively, where a spectrum analyser is equipped with a facility to measure spectral power density, this facility may be used to display the spectral power density D in dBm/100 kHz. Where the spectrum analyser bandwidth is non-Gaussian, a suitable correction factor shall be determined and applied.
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 19 of 89
The maximum e.r.p. spectral density is calculated from the above measured power density (D and the applicable antenna assembly gain "G" in dB relative to an ideal half wave dipole, according to the formula (3). If more than one antenna assembly is intended for this power setting, the gain of the antenna assembly with the highest gain shall be used.
PD = D + G (3)
The information shown in Table 9 shall be recorded in the test report.
Test Data
Environmental Conditions
Temperature: 24~26 ℃
Relative Humidity: 52~55 %
ATM Pressure: 100.3~101.5 kPa
The testing was performed by Jacob Kong on 2017-09-18. Test mode: Transmitting
Test result: Compliance
Test mode
Channel frequency
(MHz)
Reading (dBm/100kHz)
Antenna Gain (dBd)
Power Density(dBm/100kHz)
Limit (dBm/100kHz)
125kHz 864 -8.25 -0.15 -8.40 -4.5
869 -4.93 -0.15 -5.08 -4.5
Test mode
Channel frequency
(MHz)
Reading (dBm/100kHz)
Antenna Gain (dBd)
Power Density(dBm/100kHz)
Limit (dBm/100kHz)
250 kHz 864 -7.94 -0.15 -8.09 -4.5
869 -5.10 -0.15 -5.25 -4.5
Test mode
Channel frequency
(MHz)
Reading (dBm/100kHz)
Antenna Gain (dBd)
Power Density(dBm/100kHz)
Limit (dBm/100kHz)
500 kHz 864 -9.15 -0.15 -9.30 -4.5
869 -5.62 -0.15 -5.77 -4.5
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 20 of 89
864MHz, 125 kHz Bandwidth
A
Offset 3.5 dB
LVL
Ref 28.5 dBm Att 20 dB **
20 kHz/Center 864 MHz Span 200 kHz
*
*
3DB
RBW 100 kHz
VBW 100 kHz
SWT 60 s*
*
1 RM
MAXH
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-8.25 dBm
864.025641026 MHz
Date: 18.SEP.2017 22:29:15
864MHz, 250 kHz Bandwidth
A
Offset 3.5 dB
LVL
Ref 28.5 dBm Att 20 dB **
30 kHz/Center 864 MHz Span 300 kHz
*
*
3DB
RBW 100 kHz
VBW 100 kHz
SWT 60 s*
*
1 RM
MAXH
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-7.94 dBm
864.012980769 MHz
Date: 18.SEP.2017 22:37:28
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 21 of 89
864MHz, 500 kHz Bandwidth
A
Offset 3.5 dB
LVL
Ref 28.5 dBm Att 20 dB **
60 kHz/Center 864 MHz Span 600 kHz
*
*
3DB
RBW 100 kHz
VBW 100 kHz
SWT 60 s*
*
1 RM
MAXH
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-9.15 dBm
864.013461538 MHz
Date: 18.SEP.2017 22:02:31
869MHz, 125 kHz Bandwidth
A
Offset 3.5 dB
LVL
Ref 28.5 dBm Att 20 dB **
20 kHz/Center 869 MHz Span 200 kHz
*
*
3DB
RBW 100 kHz
VBW 100 kHz
SWT 60 s*
*
1 RM
MAXH
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-4.93 dBm
868.998076923 MHz
Date: 18.SEP.2017 22:27:09
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 22 of 89
869MHz, 250 kHz Bandwidth
A
Offset 3.5 dB
LVL
Ref 28.5 dBm Att 20 dB **
30 kHz/Center 869 MHz Span 300 kHz
*
*
3DB
RBW 100 kHz
VBW 100 kHz
SWT 60 s*
*
1 RM
MAXH
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-5.10 dBm
868.982692308 MHz
Date: 18.SEP.2017 22:35:36
869MHz, 500 kHz Bandwidth
A
Offset 3.5 dB
LVL
Ref 28.5 dBm Att 20 dB **
60 kHz/Center 869 MHz Span 600 kHz
*
3DB
RBW 100 kHz
SWT 60 s
* VBW 100 kHz
*
*
1 RM
MAXH
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-5.62 dBm
868.984615385 MHz
Date: 18.SEP.2017 22:00:20
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 23 of 89
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.3 - DUTY CYCLE Applicable Standard According to ETSI EN 300 220-2 V3.1.1 (2017-02) clause 4.3.3: Duty cycle applies to all transmitters except EUT with polite spectrum access (described in clause 4.5) where permitted in annex B, table B.1 or annex C, table C.1 or any NRI. Limit: The Duty Cycle at the operating frequency shall not be greater than values in annex B or C for the chosen operational frequency band(s). According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.4.1:
Unless otherwise specified, Tobs is 1 hour and the observation bandwidth Fobs is the operational frequency band. Each transmission consists of an RF emission, or sequence of RF emissions separated by intervals < TDis. An equipment may operate on several bands simultaneously (i.e. multi transmissions), Duty Cycle limit of each individual band applies to each transmission within that band. In case of a multicarrier modulation in a band, the duty cycle applies to the whole signal used for a transmission (e.g. OFDM). It has to be noted that on some bands Duty Cycle value may depend on the presence of a primary radio service. Equipment may be triggered manually, by internal timing or by external stimulus. Depending on the method of triggering the timing may be predictable or random. Method of Measurement An assessment of the overall Duty Cycle shall be made for a representative period of Tobs over the observation bandwidth Fobs. Unless otherwise specified, Tobs is 1 hour and the observation bandwidth Fobs is the operational frequency band. The representative period shall be the most active one in normal use of the device. As a guide "Normal use" is considered as representing the behaviour of the device during transmission of 99 % of transmissions generated during its operational lifetime. Procedures such as setup, commissioning and maintenance are not considered part of normal operation. Where an acknowledgement is used, the additional transmitter on-time from a message responder shall be declared only once whether included in the message initiator Duty Cycle or in the message responder Duty Cycle. NOTE: The intention of this rule is not to allow EUT to exceed the maximum duty cycle value.
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 24 of 89
Test Data
Environmental Conditions
Temperature: 23 ℃
Relative Humidity: 52 %
ATM Pressure: 101.5 kPa
The testing was performed by Jacob Kong on 2017-09-21.
Test Mode: Transmitting (Normal use state) Test result: Compliant. The duty cycle was not exceeded 0.1 % in a period of 1 hour, which was declared by the manufacturer. EUT was transmitting approximately 0.16s (maximum) at a time, so it will be restricted transmitting less than 22 times in a period of 1 hour。
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 25 of 89
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.4 - OCCUPIED BANDWIDTH Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.6: The occupied bandwidth (OBW) is the Frequency Range in which 99 % of the total mean power of a given emission falls. The residual part of the total power being denoted as β, which, in cases of symmetrical spectra, splits up into β/2 on each side of the spectrum. Unless otherwise specified, β/2 is taken as 0,5 % as described in Figure 3.
The maximum occupied bandwidth includes all associated side bands above the appropriate emissions level and the frequency error or drift under extreme test conditions. Limit: The Operating Channel shall be declared and shall reside entirely within the Operational Frequency Band. The Maximum Occupied Bandwidth at 99 % shall reside entirely within the Operating Channel defined by Flow and Fhigh.
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 26 of 89
Method of measurement According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.6.3: The spectrum analyser shall be configured as appropriate for the parameters shown in Table 12.
If the equipment is capable of producing an unmodulated carrier and the test in clause 5.7 is performed, then the OBW measurements need only be performed under normal test conditions. Any required results for Maximum OBW under extreme conditions are obtained by addition and substraction of the upper and lower frequency error results to each bandwidth measurement obtained in this test. Step 1: Operation of the EUT shall be started, on the highest operating frequency as declared by the manufacturer, with the appropriate test signal. The signal attenuation shall be adjusted to ensure that the signal power envelope is sufficiently above the noise floor of the analyser to avoid the noise signals on either side of the power envelope being included in the measurement. Step 2: When the trace is completed the peak value of the trace shall be located and the analyser marker placed on this peak. Step 3: The 99 % occupied bandwidth function of the spectrum analyser shall be used to measure the occupied bandwidth of the signal.
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 27 of 89
Test Data
Environmental Conditions
Temperature: 23 ℃
Relative Humidity: 53 %
ATM Pressure: 101.5 kPa
The testing was performed by Jacob Kong on 2017-09-18.
Test mode: Transmitting
Bandwidth (kHz)
Test Frequency
(MHz) Test Condition Result
125
864 Normal
L.V. L.T. L.V. H.T. H.V. L.T H.V. H.T Compliance
869 Normal L.V. L.T. L.V. H.T. H.V. L.T H.V. H.T Compliance
250
864 Normal L.V. L.T. L.V. H.T. H.V. L.T H.V. H.T Compliance
869 Normal
L.V. L.T. L.V. H.T. H.V. L.T H.V. H.T Compliance
500
864 Normal L.V. L.T. L.V. H.T. H.V. L.T H.V. H.T Compliance
869 Normal L.V. L.T. L.V. H.T. H.V. L.T H.V. H.T Compliance
Note:
L.V.: Low Voltage 3.3VDC L.T.: Low Temperature –20℃ N.T.: Normal Temperature +25℃
H.V.: High Voltage 5.5VDC H.T.: High Temperature +55℃ Nominal Voltage 5VDC
Test signal is DM3 in all test Condition,other recording information reflected in follow tables
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 28 of 89
Normal Condition Test Data as below:
Voltage Supply (VDC)
Temperature(℃)
Bandwidth (kHz)
Frequency(MHz)
Occupied Bandwidth
(kHz)
Frequency of
Lower point(MHz)
Frequency of
Upper point (MHz)
Limit(MHz)
5 25
125 864 130.77 863.934 864.065
Within 863 to
870
869 130.77 868.934 869.065
250 864 261.22 863.869 864.131
869 265.22 868.865 869.130
500 864 479.17 863.761 864.240
869 477.56 868.761 869.239
Extreme Condition Test Data as below: L.V. L.T.
Voltage Supply (VDC)
Temperature(℃)
Bandwidth (kHz)
Frequency(MHz)
Occupied Bandwidth
(kHz)
Frequency of
Lower point(MHz)
Frequency of
Upper point (MHz)
Limit(MHz)
3.3 -20
125 864 130.75 863.933 864.065
Within 863 to
870
869 130.77 868.934 869.066
250 864 261.20 863.869 864.132
869 265.24 868.867 869.131
500 864 479.18 863.764 864.244
869 477.57 868.763 869.239
L.V. H.T.
Voltage Supply (VDC)
Temperature(℃)
Bandwidth (kHz)
Frequency(MHz)
Occupied Bandwidth
(kHz)
Frequency of
Lower point(MHz)
Frequency of
Upper point (MHz)
Limit(MHz)
3.3 55
125 864 130.78 863.935 864.065
Within 863 to
870
869 130.77 868.934 869.065
250 864 261.20 863.867 864.132
869 265.22 868.864 869.134
500 864 479.17 863.763 864.238
869 477.56 868.762 869.240
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 29 of 89
H.V. L.T
Voltage Supply (VDC)
Temperature(℃)
Bandwidth (kHz)
Frequency(MHz)
Occupied Bandwidth
(kHz)
Frequency of
Lower point(MHz)
Frequency of
Upper point (MHz)
Limit(MHz)
5.5 -20
125 864 130.78 863.936 864.066
Within 863 to
870
869 130.79 868.934 869.065
250 864 261.25 863.871 864.133
869 265.23 868.865 869.132
500 864 479.17 863.761 864.240
869 477.55 868.763 869.240
H.V. H.T
Voltage Supply (VDC)
Temperature(℃)
Bandwidth (kHz)
Frequency(MHz)
Occupied Bandwidth
(kHz)
Frequency of
Lower point(MHz)
Frequency of
Upper point (MHz)
Limit(MHz)
5.5 55
125 864 130.76 863.935 864.065
Within 863 to
870
869 130.77 868.937 869.067
250 864 261.21 863.869 864.134
869 265.22 868.865 869.132
500 864 479.17 863.764 864.242
869 477.56 868.763 869.242
Recording as above,Highest measured OBW value as below :
Voltage Supply (VDC)
Temperature (℃) MaximumBandwidth
(kHz)
Frequency(MHz)
Occupied Bandwidth
(kHz)
Limit (MHz)
3.3-5.5 -20-55
125 864 130.78
Within 863 to
870
869 130.79
250 864 261.25
869 265.24
500 864 479.18
869 477.57
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 30 of 89
Bandwidth: 125 kHz
Low Channel
A
Offset 3.5 dB
LVL
Ref 28.5 dBm Att 20 dB*
30 kHz/Center 864 MHz Span 300 kHz
*
*
3DB
RBW 3 kHz
VBW 10 kHz
SWT 35 ms
*
1 RM
MAXH
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-5.51 dBm
863.966826923 MHz
OBW130.769230769 kHz
T1
Temp 1 [T1 OBW]
-20.18 dBm
863.934134615 MHz
T2
Temp 2 [T1 OBW]
-19.36 dBm
864.064903846 MHz
Date: 18.SEP.2017 22:50:31
High Channel
A
Offset 3.5 dB
LVL
Ref 28.5 dBm Att 20 dB*
30 kHz/Center 869 MHz Span 300 kHz
*
*
3DB
RBW 3 kHz
VBW 10 kHz
SWT 35 ms
*
1 RM
MAXH
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-3.07 dBm
868.966346154 MHz
OBW130.769230769 kHz
T1
Temp 1 [T1 OBW]
-16.57 dBm
868.934134615 MHz
T2
Temp 2 [T1 OBW]
-16.33 dBm
869.064903846 MHz
Date: 18.SEP.2017 22:51:31
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 31 of 89
Bandwidth: 250 kHz
Low Channel
A
Offset 3.5 dB
LVL
Ref 28.5 dBm Att 20 dB*
50 kHz/Center 864 MHz Span 500 kHz
*
*
3DB
RBW 3 kHz
VBW 10 kHz
SWT 60 ms
*
1 RM
MAXH
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-5.38 dBm
864.107371795 MHz
OBW261.217948718 kHz
T1
Temp 1 [T1 OBW]
-19.15 dBm
863.869391026 MHz
T2
Temp 2 [T1 OBW]
-16.93 dBm
864.130608974 MHz
Date: 18.SEP.2017 22:54:27
High Channel
A
Offset 3.5 dB
LVL
Ref 28.5 dBm Att 20 dB*
50 kHz/Center 869 MHz Span 500 kHz
*
*
3DB
RBW 3 kHz
VBW 10 kHz
SWT 60 ms
*
1 RM
MAXH
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-3.21 dBm
868.912660256 MHz
OBW265.224358974 kHz
T1
Temp 1 [T1 OBW]
-17.36 dBm
868.864583333 MHz
T2
Temp 2 [T1 OBW]
-13.74 dBm
869.129807692 MHz
Date: 18.SEP.2017 22:53:06
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 32 of 89
Bandwidth: 500 kHz
Low Channel
A
Offset 3.5 dB
LVL
Ref 28.5 dBm Att 20 dB*
100 kHz/Center 864 MHz Span 1 MHz
*
*
3DB
RBW 10 kHz
VBW 30 kHz
SWT 40 ms
*
1 RM
MAXH
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
0.44 dBm
863.870192308 MHz
OBW479.166666667 kHz
T1
Temp 1 [T1 OBW]
-11.79 dBm
863.761217949 MHz
T2
Temp 2 [T1 OBW]
-12.77 dBm
864.240384615 MHz
Date: 18.SEP.2017 22:56:03
High Channel
A
Offset 3.5 dB
LVL
Ref 28.5 dBm Att 20 dB*
*
1 RM
MAXH
100 kHz/Center 869 MHz Span 1 MHz
*
*
3DB
RBW 10 kHz
VBW 30 kHz
SWT 40 ms
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
3.08 dBm
868.875000000 MHz
OBW477.564102564 kHz
T1
Temp 1 [T1 OBW]
-6.22 dBm
868.761217949 MHz
T2
Temp 2 [T1 OBW]
-6.02 dBm
869.238782051 MHz
Date: 18.SEP.2017 22:57:19
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 33 of 89
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.5 - TX OUT OF BAND EMISSIONS Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.8: Two OOB domains are defined, one for OC (see Figure 5) and one for Operational Frequency band (see Figure 6). The spectrum masks for these two OOB domains may overlap.
Unwanted emissions in the Out Of Band domain are those falling in the frequency range immediately below the lower, and above the upper, frequency of the Operating Channel. The OOB domain includes both frequencies outside the Operating Channel within the Operational Frequency Band and frequencies outside the Operational Frequency Band. The relevant Out Of Band domain is shown in Figure 5 and applies within the Operational Frequency Band.
Specific limits apply at frequencies immediately above and below the Operational Frequency Band as shown in Figure 6. NOTE: flow_OFB is the lower edge of the Operational Frequency Band.
fhigh_OFB is the upper edge of the Operational Frequency Band.
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 34 of 89
Limit: The EUT emissions level in OOB domains for the Operating Channel and the Operational Frequency Band shall be less or equal to Table 15 spectrum mask.
Method of measurement According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.8.3. Test Data
Environmental Conditions
Temperature: 23 ℃
Relative Humidity: 52 %
ATM Pressure: 101.5 kPa
The testing was performed by Jacob Kong on 2017-09-19.
Test Mode: Transmitting
Normal Condition Test Data as below:
Test with conducted measurement.
Please refer to the below plots:
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 35 of 89
OUT OF BAND for Operation Channel
Frequency Range Limit Test Result
fc - 2,5×OCW ≤ f ≤ fc - 0,5×OCW -36~0 dBm/kHz Pass
fc + 0,5×OCW ≤ f ≤ fc + 2,5×OCW 0~-36 dBm/kHz Pass
Note: f is the measurement frequency
fc is the Operating Frequency OCW is the operating channel bandwidth
864MHz, 125 kHz
A
Unit dBm
10.5 dB Offset
Ref Lvl
10.5 dBm
Ref Lvl
10.5 dBm
RF Att 10 dB
1RM1MAX
RBW 1 kHz
VBW 3 kHz
SWT 1.9 s
Center 864 MHz Span 750 kHz75 kHz/
-80
-70
-60
-50
-40
-30
-20
-10
0
-89.5
10.5
1
Marker 1 [T1]
-18.63 dBm
864.05185371 MHz
1 [T1] -18.63 dBm
864.05185371 MHz
LOC-L
LOC-H
Date: 19.SEP.2017 21:36:27
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 36 of 89
864MHz, 250 kHz
A
Unit dBm
10.5 dB Offset
Ref Lvl
10.5 dBm
Ref Lvl
10.5 dBm
RF Att 10 dB
1RM1MAX
RBW 1 kHz
VBW 3 kHz
SWT 3.8 s
Center 864 MHz Span 1.5 MHz150 kHz/
-80
-70
-60
-50
-40
-30
-20
-10
0
-89.5
10.5
1
Marker 1 [T1]
-17.88 dBm
864.10370741 MHz
1 [T1] -17.88 dBm
864.10370741 MHz
LOC-H
LOC-L
Date: 19.SEP.2017 21:48:15
864MHz, 500 kHz
A
Unit dBm
10.5 dB Offset
1RM
RBW 1 kHz
VBW 3 kHz
SWT 7.6 s
RF Att 20 dB
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
300 kHz/Center 864 MHz Span 3 MHz
1MAX
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-17.28 dBm
864.13527054 MHz
1 [T1] -17.28 dBm
864.13527054 MHz
LOC-L
LOC-H
Date: 19.SEP.2017 22:18:51
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 37 of 89
869MHz, 125 kHz
A
Unit dBm
10.5 dB Offset
Ref Lvl
10.5 dBm
Ref Lvl
10.5 dBm
RF Att 10 dB
1RM1MAX
RBW 1 kHz
VBW 3 kHz
SWT 1.9 s
Center 869 MHz Span 750 kHz75 kHz/
-80
-70
-60
-50
-40
-30
-20
-10
0
-89.5
10.5
1
Marker 1 [T1]
-16.14 dBm
868.95716433 MHz
1 [T1] -16.14 dBm
868.95716433 MHz
LOC-H
LOC-L
Date: 19.SEP.2017 21:41:07
869MHz, 250 kHz
A
Unit dBm
10.5 dB Offset
Ref Lvl
10.5 dBm
Ref Lvl
10.5 dBm
RF Att 10 dB
1RM1MAX
Center 869 MHz Span 1.5 MHz150 kHz/
RBW 1 kHz
VBW 3 kHz
SWT 3.8 s
-80
-70
-60
-50
-40
-30
-20
-10
0
-89.5
10.5
1
Marker 1 [T1]
-16.24 dBm
869.10370741 MHz
1 [T1] -16.24 dBm
869.10370741 MHz
LOC-L
LOC-H
Date: 19.SEP.2017 21:44:42
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 38 of 89
869MHz, 500 kHz
A
Unit dBm
10.5 dB Offset
1RM
RBW 1 kHz
VBW 3 kHz
SWT 7.6 s
RF Att 20 dB
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
1MAX
Center 869 MHz Span 3 MHz300 kHz/
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-14.81 dBm
868.94288577 MHz
1 [T1] -14.81 dBm
868.94288577 MHz
LOC-H
LOC-L
Date: 19.SEP.2017 22:26:52
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 39 of 89
OUT OF BAND for Operation Frequency Band
Frequency Range Limit Test Result
f ≤ flow_OFB - 400 kHz -36 dBm/10kHz Pass
flow_OFB - 400 kHz ≤ f ≤ flow_OFB - 200 kHz -36 dBm/kHz Pass
flow_OFB - 200 kHz ≤ f ≤ flow_OFB -36~0 dBm/kHz Pass
fhigh_OFB ≤ f ≤ fhigh_OFB + 200 kHz -36~0 dBm/kHz Pass
fhigh_OFB + 200 kHz ≤ f ≤ fhigh_OFB + 400 kHz -36 dBm/kHz Pass
Fhigh_OFB + 400 kHz ≤ f -36 dBm/10kHz Pass
Note: f is the measurement frequency
flow_OFB is the lower edge of the Operational Frequency Band fhigh_OFB is the high edge of the Operational Frequency Band
864MHz, 125 kHz
1MAX
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RBW 1 kHz
VBW 3 kHz
SWT 1 s
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
Start 862.6 MHz Stop 863 MHz40 kHz/
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-70.07 dBm
862.82044088 MHz
1 [T1] -70.07 dBm
862.82044088 MHz
LOFB
Date: 19.SEP.2017 23:58:25
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 40 of 89
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
1MAX
Start 861.75 MHz Stop 862.6 MHz85 kHz/
RBW 10 kHz
VBW 30 kHz
SWT 21.5 ms
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-54.65 dBm
862.38707415 MHz
1 [T1] -54.65 dBm
862.38707415 MHz
LOFB
Date: 19.SEP.2017 23:57:50
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
Start 870.4 MHz Stop 871.25 MHz85 kHz/
RBW 10 kHz
VBW 30 kHz
SWT 21.5 ms
1MAX
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-55.58 dBm
871.04729459 MHz
1 [T1] -55.58 dBm
871.04729459 MHz
LOFB
Date: 19.SEP.2017 23:57:16
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 41 of 89
1MAX
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
Start 870 MHz Stop 870.4 MHz40 kHz/
RBW 1 kHz
VBW 3 kHz
SWT 1 s
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-68.48 dBm
870.39599198 MHz
1 [T1] -68.48 dBm
870.39599198 MHz
LOFB
Date: 19.SEP.2017 23:58:56
864MHz, 250 kHz
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
1MAX
Start 862.6 MHz Stop 863 MHz40 kHz/
RBW 1 kHz
VBW 3 kHz
SWT 1 s
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-68.48 dBm
862.84689379 MHz
1 [T1] -68.48 dBm
862.84689379 MHz
LOFB
Date: 19.SEP.2017 23:50:43
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 42 of 89
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
1MAX
Start 860.5 MHz Stop 862.6 MHz210 kHz/
RBW 10 kHz
VBW 30 kHz
SWT 54 ms
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-55.75 dBm
862.09919840 MHz
1 [T1] -55.75 dBm
862.09919840 MHz
LOFB
Date: 19.SEP.2017 23:51:25
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
1MAX
Start 870.4 MHz Stop 872.5 MHz210 kHz/
RBW 10 kHz
VBW 30 kHz
SWT 54 ms
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-56.26 dBm
870.40000000 MHz
1 [T1] -56.26 dBm
870.40000000 MHz
LOFB
Date: 19.SEP.2017 23:51:56
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 43 of 89
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
Start 870 MHz Stop 870.4 MHz40 kHz/
RBW 1 kHz
VBW 3 kHz
SWT 1 s
1MAX
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-70.07 dBm
870.01843687 MHz
1 [T1] -70.07 dBm
870.01843687 MHz
LOFB
Date: 19.SEP.2017 23:49:54
864MHz, 500 kHz
1MAX
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RBW 1 kHz
VBW 3 kHz
SWT 1 s
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
Start 862.6 MHz Stop 863 MHz40 kHz/
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-69.24 dBm
862.66332665 MHz
1 [T1] -69.24 dBm
862.66332665 MHz
LOFB
Date: 19.SEP.2017 23:48:05
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 44 of 89
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
1MAX
Start 858 MHz Stop 862.6 MHz460 kHz/
RBW 10 kHz
VBW 30 kHz
SWT 115 ms
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-57.81 dBm
860.12024048 MHz
1 [T1] -57.81 dBm
860.12024048 MHz
LOFB
Date: 19.SEP.2017 23:47:27
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
Start 870.4 MHz Stop 875 MHz460 kHz/
RBW 10 kHz
VBW 30 kHz
SWT 115 ms
1MAX
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-58.47 dBm
873.67254509 MHz
1 [T1] -58.47 dBm
873.67254509 MHz
LOFB
Date: 19.SEP.2017 23:46:52
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 45 of 89
1MAX
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
Start 870 MHz Stop 870.4 MHz40 kHz/
RBW 1 kHz
VBW 3 kHz
SWT 1 s
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-68.48 dBm
870.05370741 MHz
1 [T1] -68.48 dBm
870.05370741 MHz
LOFB
Date: 19.SEP.2017 23:48:38
869MHz, 125 kHz
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
1MAX
Start 862.6 MHz Stop 863 MHz40 kHz/
RBW 1 kHz
VBW 3 kHz
SWT 1 s
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-70.07 dBm
862.63126253 MHz
1 [T1] -70.07 dBm
862.63126253 MHz
LOFB
Date: 19.SEP.2017 23:55:33
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 46 of 89
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
1MAX
Start 861.75 MHz Stop 862.6 MHz85 kHz/
RBW 10 kHz
VBW 30 kHz
SWT 21.5 ms
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-54.95 dBm
862.04468938 MHz
1 [T1] -54.95 dBm
862.04468938 MHz
LOFB
Date: 19.SEP.2017 23:56:12
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
1MAX
Start 870.4 MHz Stop 871.25 MHz85 kHz/
RBW 10 kHz
VBW 30 kHz
SWT 21.5 ms
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-55.26 dBm
870.83266533 MHz
1 [T1] -55.26 dBm
870.83266533 MHz
LOFB
Date: 19.SEP.2017 23:56:39
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 47 of 89
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
Start 870 MHz Stop 870.4 MHz40 kHz/
RBW 1 kHz
VBW 3 kHz
SWT 1 s
1MAX
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-68.48 dBm
870.21322645 MHz
1 [T1] -68.48 dBm
870.21322645 MHz
LOFB
Date: 19.SEP.2017 23:54:59
869MHz, 250 kHz
1MAX
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RBW 1 kHz
VBW 3 kHz
SWT 1 s
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
Start 862.6 MHz Stop 863 MHz40 kHz/
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-69.24 dBm
862.81643287 MHz
1 [T1] -69.24 dBm
862.81643287 MHz
LOFB
Date: 19.SEP.2017 23:53:42
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 48 of 89
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
1MAX
Start 860.5 MHz Stop 862.6 MHz210 kHz/
RBW 10 kHz
VBW 30 kHz
SWT 54 ms
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-55.10 dBm
861.54789579 MHz
1 [T1] -55.10 dBm
861.54789579 MHz
LOFB
Date: 19.SEP.2017 23:53:10
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
Start 870.4 MHz Stop 872.5 MHz210 kHz/
RBW 10 kHz
VBW 30 kHz
SWT 54 ms
1MAX
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-56.81 dBm
870.45891784 MHz
1 [T1] -56.81 dBm
870.45891784 MHz
LOFB
Date: 19.SEP.2017 23:52:33
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 49 of 89
1MAX
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
Start 870 MHz Stop 870.4 MHz40 kHz/
RBW 1 kHz
VBW 3 kHz
SWT 1 s
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-69.24 dBm
870.30541082 MHz
1 [T1] -69.24 dBm
870.30541082 MHz
LOFB
Date: 19.SEP.2017 23:54:12
869MHz, 500 kHz
10.5 dB Offset A
1RM
Unit dBm
Start 862.6 MHz Stop 863 MHz40 kHz/
RBW 1 kHz
SWT 1 s
VBW 3 kHz
1MAX
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-69.24 dBm
862.85490982 MHz
1 [T1] -69.24 dBm
862.85490982 MHz
LOFB
Date: 19.SEP.2017 23:43:43
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 50 of 89
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 30 dB
10.5 dB Offset A
1RM
Unit dBm
1MAX
Start 858 MHz Stop 862.6 MHz460 kHz/
RBW 10 kHz
VBW 30 kHz
SWT 115 ms
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-69.24 dBm
858.64529058 MHz
1 [T1] -69.24 dBm
858.64529058 MHz
LOFB
Date: 19.SEP.2017 23:42:54
1MAX
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
10.5 dB Offset A
1RM
Unit dBm
Start 870.4 MHz Stop 875 MHz460 kHz/
RBW 10 kHz
VBW 30 kHz
SWT 115 ms
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-58.24 dBm
872.53867735 MHz
1 [T1] -58.24 dBm
872.53867735 MHz
LOFB
Date: 19.SEP.2017 23:45:39
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 51 of 89
10.5 dB Offset A
1RM
Unit dBm
1MAX
Ref Lvl
5.5 dBm
Ref Lvl
5.5 dBm
RF Att 40 dB
Start 870 MHz Stop 870.4 MHz40 kHz/
RBW 1 kHz
VBW 3 kHz
SWT 1 s
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
-94.5
5.5
1
Marker 1 [T1]
-69.24 dBm
870.03046092 MHz
1 [T1] -69.24 dBm
870.03046092 MHz
LOFB
Date: 19.SEP.2017 23:44:40
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 52 of 89
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.6 - TRANSIENT POWER Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.10: Transmitter transient power is power falling into frequencies other than the operating channel as a result of the transmitter being switched on and off. Limit: The transient power shall not exceed the values given in Table 23.
Method of measurement The output of the EUT shall be connected to a spectrum analyser or equivalent measuring equipment. The measurement shall be undertaken in zero span mode. The analyser's centre frequency shall be set to an offset from the operating centre frequency. These offset values and their corresponding RBW configurations are listed in Table 24.
The used modulation shall be D-M3. The analyser shall be set to the settings of Table 25 and a measurement shall be started for each offset frequency. The EUT shall transmit at least five D-M3 test signal. The peak value shall be recorded and the measurement shall be repeated at each offset frequency mentioned in Table 24. The recorded power values shall be converted to power values measured in RBWREF by the formula in clause 4.3.10.1.
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 53 of 89
The used modulation shall be D-M3. The analyser shall be set to the settings of Table 25 and a measurement shall be started for each offset frequency. The EUT shall transmit at least five D-M3 test signal. The peak value shall be recorded and the measurement shall be repeated at each offset frequency mentioned in Table 24. The recorded power values shall be converted to power values measured in RBWREF by the formula in clause 4.3.10.1.
Test Data
Environmental Conditions
Temperature: 23 ℃
Relative Humidity: 52 %
ATM Pressure: 101.5 kPa
The testing was performed by Jacob Kong on 2017-09-19.
Test mode: Transmitting. Please refer to the below tables and plots.
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 54 of 89
864MHz, 125 kHz
Item Test Frequency
Offset From Centre Frequency
Measure Transient
Power (dBm)
RBWref/RBWmeas
(kHz)
Correct Factor(dB)
Transient Power (dBm)
Limit (dBm)
Result
Offset *1 -0.5*OCW-3kHz -26.26 1/1 0 -26.26 0 Pass
Offset *2
-OCW -39.74 1/10 -10 -49.74 0 Pass
Offset *3 -0.5*OCW-400kHz -52.07 1/100 -20 -72.07 -27 Pass
Offset *4 -0.5*OCW-1200kHz -54.39 1/300 -24.8 -79.19 -27 Pass
Offset *5
+0.5*OCW+3kHz -25.81 1/1 0 -25.81 0 Pass
Offset *6 +OCW -39.67 1/10 -10 -49.67 0 Pass
Offset *7 +0.5*OCW+400kHz -51.71 1/100 -20 -71.71 -27 Pass
Offset *8
+0.5*OCW+1200kHz -52.55 1/300 -24.8 -77.35 -27 Pass
864MHz, 250 kHz
Item Test Frequency
Offset From Centre Frequency
Measure Transient
Power (dBm)
RBWref/RBWmeas
(kHz)
Correct Factor(dB)
Transient Power (dBm)
Limit (dBm)
Result
Offset *1
-0.5*OCW-3kHz -24.14 1/1 0 -24.14 0 Pass
Offset *2
-OCW -38.86 1/30 -14.8 -53.66 0 Pass
Offset *3 -0.5*OCW-400kHz -48.90 1/100 -20 -68.9 -27 Pass
Offset *4
-0.5*OCW-1200kHz -52.46 1/300 -24.8 -77.26 -27 Pass
Offset *5
+0.5*OCW+3kHz -24.36 1/1 0 -24.36 0 Pass
Offset *6 +OCW -38.93 1/30 -14.8 -53.73 0 Pass
Offset *7 +0.5*OCW+400kHz -48.59 1/100 -20 -68.59 -27 Pass
Offset *8
+0.5*OCW+1200kHz -50.07 1/300 -24.8 -74.87 -27 Pass
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 55 of 89
864MHz, 500 kHz
Item Test Frequency
Offset From Centre Frequency
Measure Transient
Power (dBm)
RBWref/RBWmeas
(kHz)
Correct Factor(dB)
Transient Power (dBm)
Limit (dBm)
Result
Offset *1 -0.5*OCW-3kHz -29.28 1/1 0 -29.28 0 Pass
Offset *2
-OCW -51.72 1/50 -17 -68.72 -27 Pass
Offset *3 -0.5*OCW-400kHz -57.59 1/100 -20 -77.59 -27 Pass
Offset *4 -0.5*OCW-1200kHz -54.96 1/300 -24.8 -79.76 -27 Pass
Offset *5
+0.5*OCW+3kHz -27.35 1/1 0 -27.35 0 Pass
Offset *6 +OCW -50.23 1/50 -17 -67.23 -27 Pass
Offset *7 +0.5*OCW+400kHz -56.23 1/100 -20 -76.23 -27 Pass
Offset *8
+0.5*OCW+1200kHz -51.34 1/300 -24.8 -76.14 -27 Pass
869MHz, 125 kHz
Item Test Frequency
Offset From Centre Frequency
Measure Transient
Power (dBm)
RBWref/RBWmeas
(kHz)
Correct Factor(dB)
Transient Power (dBm)
Limit (dBm)
Result
Offset *1
-0.5*OCW-3kHz -23.05 1/1 0 -23.05 0 Pass
Offset *2
-OCW -37.57 1/10 -10 -47.57 0 Pass
Offset *3 -0.5*OCW-400kHz -49.41 1/100 -20 -69.41 -27 Pass
Offset *4
-0.5*OCW-1200kHz -51.36 1/300 -24.8 -76.16 -27 Pass
Offset *5
+0.5*OCW+3kHz -22.87 1/1 0 -22.87 0 Pass
Offset *6 +OCW -37.35 1/10 -10 -47.35 0 Pass
Offset *7 +0.5*OCW+400kHz -49.82 1/100 -20 -69.82 -27 Pass
Offset *8
+0.5*OCW+1200kHz -49.96 1/300 -24.8 -74.76 -27 Pass
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 56 of 89
869MHz, 250 kHz
Item Test Frequency
Offset From Centre Frequency
Measure Transient
Power (dBm)
RBWref/RBWmeas
(kHz)
Correct Factor(dB)
Transient Power (dBm)
Limit (dBm)
Result
Offset *1 -0.5*OCW-3kHz -21.55 1/1 0 -21.55 0 Pass
Offset *2
-OCW -36.21 1/30 -14.8 -51.01 0 Pass
Offset *3 -0.5*OCW-400kHz -45.11 1/100 -20 -65.11 -27 Pass
Offset *4 -0.5*OCW-1200kHz -48.82 1/300 -24.8 -73.62 -27 Pass
Offset *5
+0.5*OCW+3kHz -21.21 1/1 0 -21.21 0 Pass
Offset *6 +OCW -36.88 1/30 -14.8 -51.68 0 Pass
Offset *7 +0.5*OCW+400kHz -45.13 1/100 -20 -65.13 -27 Pass
Offset *8
+0.5*OCW+1200kHz -47.09 1/300 -24.8 -71.89 -27 Pass
869MHz, 500 kHz
Item Test Frequency
Offset From Centre Frequency
Measure Transient
Power (dBm)
RBWref/RBWmeas
(kHz)
Correct Factor(dB)
Transient Power (dBm)
Limit (dBm)
Result
Offset *1
-0.5*OCW-3kHz -25.27 1/1 0 -25.27 0 Pass
Offset *2
-OCW -43.81 1/50 -17 -60.81 -27 Pass
Offset *3 -0.5*OCW-400kHz -49.72 1/100 -20 -69.72 -27 Pass
Offset *4
-0.5*OCW-1200kHz -51.31 1/300 -24.8 -76.11 -27 Pass
Offset *5
+0.5*OCW+3kHz -24.63 1/1 0 -24.63 0 Pass
Offset *6 +OCW -43.59 1/50 -17 -60.59 -27 Pass
Offset *7 +0.5*OCW+400kHz -49.99 1/100 -20 -69.99 -27 Pass
Offset *8
+0.5*OCW+1200kHz -48.52 1/300 -24.8 -73.32 -27 Pass
Note: Correct factor=10*log (RBWref/RBWmeas)
Transient power=Absolute level + Correct factor
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 57 of 89
864MHz, 125 kHz
Offset *1
Ref 28.5 dBm Att 20 dB*
Offset 3.5 dB
A
LVL
*
Center 863.9345 MHz 50 ms/
3DB
RBW 1 kHz
VBW 10 kHz
SWT 500 ms
MAXH
*1 RM
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-26.26 dBm
428.685897 ms
D1 0 dBm
Date: 18.SEP.2017 23:05:53
Offset *2
Offset 3.5 dB
A
LVL
MAXH
3DB
RBW 10 kHz
SWT 500 ms
* VBW 100 kHz
Ref 18.5 dBm Att 10 dB*
Center 863.875 MHz 50 ms/
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-39.74 dBm
407.852564 ms
D1 0 dBm
Date: 18.SEP.2017 23:08:56
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 58 of 89
Offset *3
Offset 3.5 dB
A
LVL
MAXH
Att 10 dB*
3DB
RBW 100 kHz
SWT 500 ms
* VBW 1 MHz
Ref 0 dBm
Center 863.5375 MHz 50 ms/
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-52.07 dBm
286.858974 ms
D1 -27 dBm
Date: 18.SEP.2017 23:11:37
Offset *4
Offset 3.5 dB
A
LVL
MAXH
Att 10 dB*Ref 0 dBm
Center 862.7375 MHz 50 ms/
3DB
RBW 300 kHz
SWT 500 ms
* VBW 3 MHz
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-54.39 dBm
16.826923 ms
D1 -27 dBm
Date: 18.SEP.2017 23:15:14
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 59 of 89
Offset *5
Ref 28.5 dBm Att 20 dB*
Offset 3.5 dB
A
LVL
MAXH
*
Center 864.0655 MHz 50 ms/
3DB
RBW 1 kHz
VBW 10 kHz
SWT 500 ms
*1 RM
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-25.81 dBm
157.852564 ms
D1 0 dBm
Date: 18.SEP.2017 23:06:51
Offset *6
Offset 3.5 dB
A
LVL
MAXH
Ref 18.5 dBm Att 10 dB*
*
Center 864.125 MHz 50 ms/
3DB
RBW 10 kHz
VBW 100 kHz
SWT 500 ms
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-39.67 dBm
453.525641 ms
D1 0 dBm
Date: 18.SEP.2017 23:09:37
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 60 of 89
Offset *7
Offset 3.5 dB
A
LVL
MAXH
Att 10 dB*Ref 0 dBm
*
Center 864.4625 MHz 50 ms/
3DB
RBW 100 kHz
VBW 1 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-51.71 dBm
136.217949 ms
D1 -27 dBm
Date: 18.SEP.2017 23:13:06
Offset *8
Offset 3.5 dB
A
LVL
MAXH
Att 10 dB*Ref 0 dBm
*
Center 865.2625 MHz 50 ms/
3DB
RBW 300 kHz
VBW 3 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-52.55 dBm
129.807692 ms
D1 -27 dBm
Date: 18.SEP.2017 23:16:12
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 61 of 89
864MHz, 250 kHz
Offset *1
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 18.5 dBm
Center 863.872 MHz 50 ms/
3DB
RBW 1 kHz
SWT 500 ms
* VBW 10 kHz
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-24.14 dBm
97.756410 ms
D1 0 dBm
Date: 18.SEP.2017 23:54:01
Offset *2
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 18.5 dBm
Center 863.75 MHz 50 ms/
3DB
RBW 30 kHz
SWT 500 ms
* VBW 300 kHz
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-38.86 dBm
204.326923 ms
D1 0 dBm
Date: 18.SEP.2017 23:51:32
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 62 of 89
Offset *3
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
Center 863.475 MHz 50 ms/
3DB
RBW 100 kHz
SWT 500 ms
* VBW 1 MHz
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-48.90 dBm
52.083333 ms
D1 -27 dBm
Date: 18.SEP.2017 23:49:00
Offset *4
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
*
Center 862.675 MHz 50 ms/
3DB
RBW 300 kHz
VBW 3 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-52.46 dBm
134.615385 ms
D1 -27 dBm
Date: 18.SEP.2017 23:46:32
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 63 of 89
Offset *5
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 18.5 dBm
*
Center 864.128 MHz 50 ms/
3DB
RBW 1 kHz
VBW 10 kHz
SWT 500 ms
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-24.36 dBm
364.583333 ms
D1 0 dBm
Date: 18.SEP.2017 23:55:06
Offset *6
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 18.5 dBm
*
Center 864.25 MHz 50 ms/
3DB
RBW 30 kHz
VBW 300 kHz
SWT 500 ms
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-38.93 dBm
132.211538 ms
D1 0 dBm
Date: 18.SEP.2017 23:52:29
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 64 of 89
Offset *7
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
*
Center 864.525 MHz 50 ms/
3DB
RBW 100 kHz
VBW 1 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-48.59 dBm
54.487179 ms
D1 -27 dBm
Date: 18.SEP.2017 23:50:08
Offset *8
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
*
Center 865.325 MHz 50 ms/
3DB
RBW 300 kHz
VBW 3 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-50.07 dBm
97.756410 ms
D1 -27 dBm
Date: 18.SEP.2017 23:47:20
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 65 of 89
864MHz, 500 kHz
Offset *1
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 18.5 dBm
*
Center 863.747 MHz 50 ms/
3DB
RBW 1 kHz
VBW 10 kHz
SWT 500 ms
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-29.28 dBm
350.961538 ms
D1 0 dBm
Date: 18.SEP.2017 23:58:23
Offset *2
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
Center 863.5 MHz 50 ms/
3DB
RBW 50 kHz
SWT 500 ms
* VBW 500 kHz
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-51.72 dBm
376.602564 ms
D1 -27 dBm
Date: 19.SEP.2017 00:02:04
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 66 of 89
Offset *3
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
Center 863.35 MHz 50 ms/
3DB
RBW 100 kHz
SWT 500 ms
* VBW 1 MHz
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-57.59 dBm
342.948718 ms
D1 -27 dBm
Date: 19.SEP.2017 00:04:35
Offset *4
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
Center 862.55 MHz 50 ms/
3DB
RBW 300 kHz
SWT 500 ms
* VBW 3 MHz
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-54.96 dBm
377.403846 ms
D1 -27 dBm
Date: 19.SEP.2017 00:07:36
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 67 of 89
Offset *5
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 18.5 dBm
*
Center 864.253 MHz 50 ms/
3DB
RBW 1 kHz
VBW 10 kHz
SWT 500 ms
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-27.35 dBm
111.378205 ms
D1 0 dBm
Date: 19.SEP.2017 00:00:13
Offset *6
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
*
Center 864.5 MHz 50 ms/
3DB
RBW 50 kHz
VBW 500 kHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-50.23 dBm
419.871795 ms
D1 -27 dBm
Date: 19.SEP.2017 00:03:12
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 68 of 89
Offset *7
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
*
Center 864.65 MHz 50 ms/
3DB
RBW 100 kHz
VBW 1 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-56.53 dBm
3.205128 ms
D1 -27 dBm
Date: 19.SEP.2017 00:06:07
Offset *8
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
*
Center 865.45 MHz 50 ms/
3DB
RBW 300 kHz
VBW 3 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-51.34 dBm
264.423077 ms
D1 -27 dBm
Date: 19.SEP.2017 00:08:49
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 69 of 89
869MHz, 125 kHz
Offset *1
Offset 3.5 dB
A
LVL
Att 10 dB*Ref 18.5 dBm
MAXH
*
Center 868.9345 MHz 50 ms/
3DB
RBW 1 kHz
VBW 10 kHz
SWT 500 ms
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-23.05 dBm
286.858974 ms
D1 0 dBm
Date: 18.SEP.2017 23:28:03
Offset *2
Offset 3.5 dB
A
LVL
Att 10 dB*
3DB
RBW 10 kHz
SWT 500 ms
* VBW 100 kHz
Ref 18.5 dBm
Center 868.875 MHz 50 ms/
MAXH
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-37.57 dBm
48.076923 ms
D1 0 dBm
Date: 18.SEP.2017 23:25:54
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 70 of 89
Offset *3
Offset 3.5 dB
A
LVL
MAXH
Att 10 dB*Ref 0 dBm
Center 868.5375 MHz 50 ms/
3DB
RBW 100 kHz
SWT 500 ms
* VBW 1 MHz
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-49.41 dBm
94.551282 ms
D1 -27 dBm
Date: 18.SEP.2017 23:23:26
Offset *4
Offset 3.5 dB
A
LVL
MAXH
Att 10 dB*Ref 0 dBm
*
Center 867.7375 MHz 50 ms/
3DB
RBW 300 kHz
VBW 3 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-51.36 dBm
289.262821 ms
D1 -27 dBm
Date: 18.SEP.2017 23:20:29
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 71 of 89
Offset *5
Offset 3.5 dB
A
LVL
Att 10 dB*Ref 18.5 dBm
MAXH
*
Center 869.0655 MHz 50 ms/
3DB
RBW 1 kHz
VBW 10 kHz
SWT 500 ms
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-22.87 dBm
390.224359 ms
D1 0 dBm
Date: 18.SEP.2017 23:28:51
Offset *6
Offset 3.5 dB
A
LVL
Att 10 dB*Ref 18.5 dBm
MAXH
*
Center 869.125 MHz 50 ms/
3DB
RBW 10 kHz
VBW 100 kHz
SWT 500 ms
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-37.35 dBm
431.891026 ms
D1 0 dBm
Date: 18.SEP.2017 23:26:37
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 72 of 89
Offset *7
Offset 3.5 dB
A
LVL
MAXH
Att 10 dB*Ref 0 dBm
*
Center 869.4625 MHz 50 ms/
3DB
RBW 100 kHz
VBW 1 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-49.82 dBm
262.019231 ms
D1 -27 dBm
Date: 18.SEP.2017 23:24:14
Offset *8
Offset 3.5 dB
A
LVL
MAXH
Att 10 dB*Ref 0 dBm
*
Center 870.2625 MHz 50 ms/
3DB
RBW 300 kHz
VBW 3 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-49.96 dBm
93.750000 ms
D1 -27 dBm
Date: 18.SEP.2017 23:21:38
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 73 of 89
869MHz, 250 kHz
Offset *1
Offset 3.5 dB
A
LVL
Att 10 dB*Ref 18.5 dBm
MAXH
*
Center 868.872 MHz 50 ms/
3DB
RBW 1 kHz
VBW 10 kHz
SWT 500 ms
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-21.55 dBm
375.801282 ms
D1 0 dBm
Date: 18.SEP.2017 23:32:15
Offset *2
Offset 3.5 dB
A
LVL
Att 10 dB*Ref 18.5 dBm
MAXH
*
Center 868.75 MHz 50 ms/
3DB
RBW 30 kHz
VBW 300 kHz
SWT 500 ms
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-36.21 dBm
287.660256 ms
D1 0 dBm
Date: 18.SEP.2017 23:35:18
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 74 of 89
Offset *3
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
*
3DB
RBW 100 kHz
VBW 1 MHz
SWT 500 msRef 0 dBm
Center 868.475 MHz 50 ms/
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-45.11 dBm
102.564103 ms
D1 -27 dBm
Date: 18.SEP.2017 23:38:45
Offset *4
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
*
Center 867.675 MHz 50 ms/
3DB
RBW 300 kHz
VBW 3 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-48.82 dBm
235.576923 ms
D1 -27 dBm
Date: 18.SEP.2017 23:41:42
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 75 of 89
Offset *5
Offset 3.5 dB
A
LVL
Att 10 dB*Ref 18.5 dBm
MAXH
*
Center 869.128 MHz 50 ms/
3DB
RBW 1 kHz
VBW 10 kHz
SWT 500 ms
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-21.61 dBm
287.660256 ms
D1 0 dBm
Date: 18.SEP.2017 23:33:37
Offset *6
Offset 3.5 dB
A
LVL
Att 10 dB*Ref 18.5 dBm
MAXH
*
Center 869.25 MHz 50 ms/
3DB
RBW 30 kHz
VBW 300 kHz
SWT 500 ms
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-36.88 dBm
248.397436 ms
D1 0 dBm
Date: 18.SEP.2017 23:36:28
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 76 of 89
Offset *7
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
*
Center 869.525 MHz 50 ms/
3DB
RBW 100 kHz
VBW 1 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-45.13 dBm
32.051282 ms
D1 -27 dBm
Date: 18.SEP.2017 23:40:13
Offset *8
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
*
Center 870.325 MHz 50 ms/
3DB
RBW 300 kHz
VBW 3 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-47.09 dBm
217.147436 ms
D1 -27 dBm
Date: 18.SEP.2017 23:42:39
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 77 of 89
869MHz, 500 kHz
Offset *1
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 18.5 dBm
Center 868.747 MHz 50 ms/
3DB
RBW 1 kHz
SWT 500 ms
* VBW 10 kHz
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-25.27 dBm
403.044872 ms
D1 0 dBm
Date: 19.SEP.2017 00:25:03
Offset *2
Offset 3.5 dB
A
LVL
Att 10 dB*Ref 6 dBm
MAXH
*
Center 868.5 MHz 50 ms/
3DB
RBW 50 kHz
VBW 500 kHz
SWT 500 ms
*1 RM
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-43.81 dBm
48.878205 ms
D1 -27 dBm
Date: 19.SEP.2017 00:23:30
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 78 of 89
Offset *3
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
Center 868.35 MHz 50 ms/
3DB
RBW 100 kHz
SWT 500 ms
* VBW 1 MHz
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-49.72 dBm
350.160256 ms
D1 -27 dBm
Date: 19.SEP.2017 00:14:52
Offset *4
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
*
Center 867.55 MHz 50 ms/
3DB
RBW 300 kHz
VBW 3 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-51.31 dBm
225.160256 ms
D1 -27 dBm
Date: 19.SEP.2017 00:11:46
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 79 of 89
Offset *5
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 18.5 dBm
*
Center 869.253 MHz 50 ms/
3DB
RBW 1 kHz
VBW 10 kHz
SWT 500 ms
*1 RM
-80
-70
-60
-50
-40
-30
-20
-10
0
10
1
Marker 1 [T1 ]
-24.63 dBm
207.532051 ms
D1 0 dBm
Date: 19.SEP.2017 00:25:57
Offset *6
Offset 3.5 dB
A
LVL
Att 10 dB*
*
3DB
RBW 50 kHz
VBW 500 kHz
SWT 500 msRef 6 dBm
Center 869.5 MHz 50 ms/
MAXH
*1 RM
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-43.59 dBm
40.865385 ms
D1 -27 dBm
Date: 19.SEP.2017 00:22:36
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 80 of 89
Offset *7
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
*
Center 869.65 MHz 50 ms/
3DB
RBW 100 kHz
VBW 1 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-49.99 dBm
173.878205 ms
D1 -27 dBm
Date: 19.SEP.2017 00:15:53
Offset *8
Offset 3.5 dB
A
LVL
Att 10 dB*
MAXH
Ref 0 dBm
*
Center 870.45 MHz 50 ms/
3DB
RBW 300 kHz
VBW 3 MHz
SWT 500 ms
*1 RM
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
1
Marker 1 [T1 ]
-48.52 dBm
427.884615 ms
D1 -27 dBm
Date: 19.SEP.2017 00:13:26
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 81 of 89
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.3.8 – TX BEHAVIOUR LOW VOLTAGE CONDITIONS Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.12: The TX behaviour under low voltage condition is the ability of the equipment to maintain its operating frequency and not produce emissions which exceed any relevant limit when the battery voltage falls below the lower extreme voltage level. Limit: The equipment shall either: a) remain in the Operating Channel OC without exceeding any applicable limits (e.g. Duty Cycle); or b) reduce its effective radiated power below the Spurious Emission limits without exceeding any applicable limits(e.g. Duty Cycle); or c) shut down, (ceasing function); as the voltage falls below the manufacturers declared operating voltage. Method of measurement Step 1: Operation of the EUT shall be started, on Operating Frequency as declared by the manufacturer, with the appropriate test signal and with the EUT operating at nominal operating voltage. The centre frequency of the transmitted signal shall be measured and noted. Step 2: The operating voltage shall be reduced by appropriate steps until the voltage reaches zero. The centre frequency of the transmitted signal shall be measured and noted. Any abnormal behaviour shall be noted. Test Data
Environmental Conditions
Temperature: 23 ℃
Relative Humidity: 53 %
ATM Pressure: 101.5 kPa
The testing was performed by Jacob Kong on 2017-09-21.
Test result: The equipment will shut down when the voltage below the manufacturers declared operating voltage.
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 82 of 89
ETSI EN 300 220-2 V3.1.1 (2017-02) §4.4.2- BLOCKING Applicable Standard According to ETSI EN 300 220-1 V3.1.1 (2017-02) clause 5.18.1. Limit: The blocking level shall be better or equal to category 3 reference limits level defined in ETSI EN 300 220-1 [1], clause 5.18.2. NOTE: After December 31st, 2018, the receiver category 3 will be withdrawn, therefore receiver category 2 will be the minimum applicable level. Method of measurement Signal generator A shall be set to an appropriate modulated test signal at the operating frequency of the EUT receiver. Signal generator B shall be unmodulated. Measurements shall be carried out at frequencies of the unwanted signal at approximately the frequency(ies) offset(s) defined in technical requirement avoiding those frequencies at which spurious responses occur. Additional measurement points may be requested by technical requirements clause. If several operational frequency bands are used by the equipment, at least one blocking measurement by bands has to be performed. Step 1: Signal generator B shall be powered off. Signal generator A shall be set to the minimum level which gives the wanted performance criterion of EUT or the reference level in Table 32, whichever is the higher The output level of generator A shall then be increased by 3 dB unless otherwise specified in technical requirement. Step 2: Signal generator B is powered on and set to operate at the nominal operating frequency - offset frequency. Signal generator B is then switched on and the signal amplitude is adjusted to the minimum level at which the wanted performance criterion is not achieved. With signal generator B settings unchanged, the receiver shall be replaced with a suitable RF power measuring equipment. The power into the measuring equipment shall be measured and noted. The blocking level is then the conducted power received from generator B at the EUT antenna connector. This can either be measured on the antenna connector for conducted test or be calculated for radiated test (see clause C.5.4). The blocking level shall be higher or equal to the blocking power level requested in the technical requirement clause. Step 3: The measurement in steps 1 to 3 shall be repeated with signal offsets at required frequencies. Step 4: The information shown in Table 44 shall be recorded in the test report for each measured signal level and unwanted signal offset.
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 83 of 89
For equipment using CCA whatever is the receiver category, steps 1 to 4 shall be repeated with signal generator A level adjusted +13 dB higher than in the measurements in clause 5.18.6.4 Test Data
Environmental Conditions
Temperature: 23℃
Relative Humidity: 50 %
ATM Pressure: 101.5 kPa
The testing was performed by Jacob Kong on 2017-09-21. Test result: Compliance. Note: the EUT belong to Category 3.
Bandwidth: 125 kHz
Frequency Frequency offset (MHz)
Test result (dBm)
Limit (dBm) Result
864 MHz
-2 -55.31 -80 PASS
+2 -55.25 -80 PASS
-10 -45.49 -60 PASS
+10 -44.61 -60 PASS
-43.20 -45.95 -60 PASS
+43.20 -44.89 -60 PASS
Frequency Frequency offset
(MHz) Test result
(dBm) Limit (dBm) Result
869 MHz
-2 -55.27 -80 PASS
+2 -55.31 -80 PASS
-10 -44.83 -60 PASS
+10 -45.61 -60 PASS
-43.45 -46.36 -60 PASS
+43.45 -46.82 -60 PASS
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 84 of 89
Bandwidth: 250 kHz
Frequency Frequency offset (MHz)
Test result (dBm)
Limit (dBm)
Result
864 MHz
-2 -55.51 -80 PASS
+2 -55.39 -80 PASS
-10 -46.19 -60 PASS
+10 -45.44 -60 PASS
-43.20 -46.87 -60 PASS
+43.20 -46.85 -60 PASS
Frequency Frequency offset (MHz)
Test result (dBm)
Limit (dBm) Result
869 MHz
-2 -55.57 -80 PASS
+2 -55.72 -80 PASS
-10 -46.17 -60 PASS
+10 -45.46 -60 PASS
-43.45 -45.97 -60 PASS
+43.45 -45.73 -60 PASS
Bandwidth: 500 kHz
Frequency Frequency offset (MHz)
Test result (dBm)
Limit (dBm)
Result
864 MHz
-2 -54.57 -80 PASS
+2 -55.40 -80 PASS
-10 -45.35 -60 PASS
+10 -45.51 -60 PASS
-43.20 -46.06 -60 PASS
+43.20 -46.67 -60 PASS
Frequency Frequency offset (MHz)
Test result (dBm)
Limit (dBm) Result
869 MHz
-2 -55.20 -80 PASS
+2 -55.38 -80 PASS
-10 -45.46 -60 PASS
+10 -45.64 -60 PASS
-43.45 -46.76 -60 PASS
+43.45 -46.57 -60 PASS
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 85 of 89
EXHIBIT B - EUT PHOTOGRAPHS
EUT – All View
EUT – Mainboard Top View
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 86 of 89
EUT – Mainboard Top Shielding off View
EUT – Mainboard Bottom View
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 87 of 89
EUT – IC View
EUT – Ant View
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 88 of 89
EUT – Ant Port View
Bay Area Compliance Laboratories Corp. (Shenzhen) Report No.: RSZ170830002-22
ETSI EN 300 220-1 V3.1.1 (2017-02), ETSI EN 300 220-2 V3.1.1 (2017-02) Page 89 of 89
EXHIBIT B - TEST SETUP PHOTOGRAPHS
Radiated Spurious Emissions View (Below 1 GHz)
Radiated Spurious Emissions View (Above 1 GHz)
*****END OF REPORT*****