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The top documents tagged [detector applications]
1962 First CMM DEA (Italy) Ahmed CHERIF CERN Metrology lab. CLIC TECHNICAL COMMITTEE – 03.05.2011 EDMS : EDMS : 1146912
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How it works and some results Gerardo Claps INFN – Laboratori Nazionali di Frascati F. Murtas, A. Pietropaolo, L. Quintieri, G. Celentano, A. Vannozzi
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Anl Optical
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Interconnect Reliability Testing
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