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Interconnect Reliability Testing

by

Dr. John W. Sofia

Analysis Tech

Phone: (781) 245-7825Fax: (781) 246-6257

Email: info@analysistech.com Website: www.analysistech.com

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Trends in Electronic Interconnects• Larger numbers of interconnects / signals

• Smaller (less robust) mechanical size interconnects

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Trends in System Costs• Decreasing cost-performance ratio

• Increasing cost of system failure to end user

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Major Causes of Electronic Failures

Reynell, M. 1990

Source: U.S. Air Force Avionics Integrity Program

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Event Detectors:Test Systems for Interconnect Reliability Measurement

• Solder joints

• Separable connectors

• Crimp interconnects

• All advanced interconnects

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Joint Failure Mechanism:Solder Joint Stress / Strain from Thermal Cycles

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Joint Failure Mechanism:Solder Joint Stress / Strain from Vibration

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Event Detector Applications:

• Interconnect design and development

• Product evaluation for reliability

• Process control and quality monitoring

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Event Detector Application Industries

• Telecomunications:Motorola, Lucent, Ericson, Nokia, …

• Automotive: Ford, Chrysler, General Motors, …

• Computer: Intel, Sun, IBM, AMD, Compaq, …

• Aerospace Boeing, Lockheed, Rockwell,

Hughes

• Medical:Medtronic, …

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Event Detector Features

• 100% continuous electrical monitoring

• Conforms to testing standards: (Stds: IPC-785, ASTM)

• Sensitive to very short duration events

• Ignores environmental noise (EMI, RFI)

• Easy long-term unattended operation

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Event Detector System Schematic

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Scanning–Channel System Schematic

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Event Detector Resolution

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Scanning-Channel System Resolution

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STD Event Detector Sensitivity / Noise Spectrum

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Comparison of High / Low ComplianceEvent Detector Modes

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Gaussian Distribution Plot

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Failure Distribution Plot

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Weibull Plot

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Temperature Cycle Plot

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Temperature Cycle Plot With Failures