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The top documents tagged [fewer test pins]
Adopting Multi-Valued Logic for Reduced Pin-Count Testing Baohu Li, Bei Zhang and Vishwani Agrawal Auburn University, ECE Dept., Auburn, AL 36849, USA
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Multivalued Logic for Reduced Pin Count and Multi-Site SoC Testing Baohu Li and Vishwani D. Agrawal Auburn University, ECE Dept., Auburn, AL 36849, USA
216 views