uran - amtertek.com · gost 32207-2013 amtertek -development and delivery of x ray equipment uran....

Portable x-ray diffractometer for

determining residual mechanical stresses

Development and

delivery of X-ray

analytical equipmentAMTERTEK

URAN

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Determination by methods of non-destructive testing of elastic

deformations of the crystal lattice and calculation of residual and effective

mechanical stresses in parts and structures for various purposes during

their manufacture, operation and repair.

The value determined using the URAN diffractometer serves as the basis

for controlling the level of mechanical stresses in parts and products,

including large-sized ones directly at the place of their operation, in order

to determine the technical condition, and estimate the residual resource.

Necessary tool for evaluating technical

conditions of responsible structures and structures

any sizes and forms without dismantle and destruction

AMTERTEK - development and delivery of x-ray equipment

DESIGNED

URAN

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ADVANTAGES OF THE X-RAY METHOD

Direct referenceless method

High accuracy and reliability of

determination of mechanical

stresses

Technical standard for calibration

of indirect methods

EVALUATION METHOD

The principle of operation of the X-ray diffractometer is based on the

diffraction of the primary X-ray radiation generated by X-ray tubes, on the

crystal lattice of the material of the object under study and on the

registration of the diffracted X-ray radiation by the detector.

The residual stress is calculated from the strain on the crystal lattice, as

determined by X-ray diffraction.

During deformation of a polycrystalline material under the influence of an

external force, simultaneous compression and stretching occur, which

leads to three-dimensional deformation of the crystal lattice.


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As a result, the position of the diffraction maximum changes in comparison

with that without deformation. The voltage is calculated taking into account

the difference of these values.

diffraction peak shift

diffraction maximum

The shooting scheme used

in the diffractometer is the

true “Sin2Ψ” scheme. It

allows high-precision

determination of stresses in

the material, both in

magnitude and in directions

lying in the surface plane.

X-ray diffractometry method introduced in the interstate standard

GOST 32207-2013


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Determination of residual mechanical stresses of metallurgy products

Non-destructive testing of the stress-strain state of stamped products and structures

Assessment of the residual life and reliability of cast parts, turbine blades, compressors and turbines discs, springs, polycrystal plates, tanks, reactor shells, car frames, wheel sets, rails, bridges, welds, etc.

Identification of the pre-defect state of critical products, engine components

Detection of stresses caused by laser processing or welding

USING

The research in the laboratory.


Object of study – pipe

fragment

Investigated areas –

weld and near-weld area

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It is known that technological residual stresses in excess of permissible

values in products with high rigidity in the surface layer can cause cracking,

and with low rigidity - residual deformation, leading to distortion with a

corresponding loss of accuracy of shape or relative position of surfaces. At

the level of stresses within the limits of permissible values of visible

changes, it does not occur, but if the sign of operational loads coincides

with the sign of residual stresses, the product will be destroyed under loads

less than the calculated ones.

Object of study – a wheel of a railway vehicle.

Investigated areas – a disk, a disk-hub transition, a disk-rim transition, etc.

The research is conducted directly in the shop for finished products.


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In many cases, the destruction of structures made of high-strength

materials under variable loads is associated with the effect of residual

stresses (turbine and compressor blades, crankshafts, welds, etc.). Their

formation is associated with non-uniform linear or volumetric

deformations in adjacent volumes of material, aggregate or structure.

Distribution of residual stresses in the depth of the surface layer after various

operations of the technological process of processing:

1 - pre-grinding; 2 - final grinding; 3 - grinding, running; 4 - heat treatment

URAN

σ, MPa

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APPLICATION

Railway transport

Road transport

Aerospace industry

Aviation equipment

Atomic and thermal power plants

Education

Building industry, etc


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FEATURES


The composition of the diffractometer - goniometer, X-ray tube, detector,

laser sensor, control unit, software.

Goniometer combines linear guides with micron displacement and

curved guides with a different radius, which allows you to measure strain

from one point in four directions. The magnitude of the angle 2θ can be

changed manually from 104° to 160° for the analysis of alloys based on

Mn, Al, Ni, Ti, Fe, Co, etc., while re-calibration is not required. The X-ray

tube used in the diffractometer has such a small power (4W) that the

background radiation level when the operator is working does not exceed

the natural one and makes the diffractometer's operation ecologically

safe. The low power of the X-ray tube does not require the selection of

heat flux by water cooling, does not require special radiation protection

and provides a reduction in the dimensions of the goniometer with the

power supply and, accordingly, the total weight of the device.

X-ray tube is combined with a high-voltage power source.

The URAN is the representative of a new generation of portable X-ray

diffractometers, developed by specialists of AMTERTEK according to the

terms of reference issued by Vyksa Steel Works for the control and

evaluation of output at various stages of production. The compact design

of the diffractometer allows you to place it directly on large-sized

samples.

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A position-sensitive detector, proportional, sealed off with high

quantum registration efficiency, does not require the supply of a gas

mixture and cooling. The need for scanning is eliminated due to

simultaneous registration in a wide angular range - 28° through 2θ, which

significantly reduces the time taken to obtain a diffractogram and,

accordingly, the time for analysis.

Not afraid to work in an environment with high radiation, unlike

semiconductor detectors.

The laser sensor allows you to perform operational adjustment of the

diffractometer in a contactless manner on any surfaces with an accuracy

of several microns, and also to determine the normal to the surface under

investigation in seconds, using the program.

The control unit contains power sources and diffractometer controls, is

controlled from a computer via a USB interface.

The software manages all the nodes of the diffractometer, provides a

set, display of diffraction patterns, the calculation of residual stresses in

both manual and automatic mode. It has a convenient and intuitive

interface with contextual prompts. The program comes with a database of

many alloys.

The diffractometer is portable, radiation safe. The design of the

measuring system of the diffractometer allows you to determine the

deformation and mechanical stresses at any point of interest to the

complex design of the product without its destruction.

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ADVANTAGES


Interface of the program window

Research of parts of virtually any shape and size without dismantling

them, identifying a pre-defect state, the ability to predict the residual

working life of the product, express adjustment of samples on an

arbitrary working surface, low power consumption, non-destructive

analysis, ease of maintenance, use both in the laboratory and in the

workshop.

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The range of diffraction angles, 2θ 104˚ ÷ 160˚

The angular interval of simultaneous registration, 2θ 20˚

Range of inclination angles, Ψ -45˚ ÷ +45˚

Absolute error of measurement of angular positions of

diffraction peaks, θ± 0.1˚

Equivalent dose rate, not more 0,8 µSv / h

Sensor accuracy ± 9 mkm

X-ray tube target Cr (Cu, Fe optional)

X-ray tube max.power 4 W

X-ray tube cooling air

Detector

positional-sensitive

proportional,

sealed

Input supply 220 V AC / 50 Hz

Power consumption < 50 W

Dimensions (DxWxH):

goniometric device

control block765x560x545 mm

330x240x140 mm

Weight:

goniometric device

control block12 kg

3 kg

AMTERTEK

23 Pokhodnyy proezd, Off 107, Moscow, 125459 Russia.

Tel.+7 (977) 287-6340

https://amtertek.com

E-mail: [email protected]; [email protected]

TECHNICAL DETAILS

The root-mean-square deviation of the definition of diffraction angles, 2θ

± 0.04˚

URAN

uran - amtertek.com · gost 32207-2013 amtertek -development and delivery of x ray equipment uran....

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