vlsi testing lecture 14: built-in self-test

Copyright 2005, Agrawal & Bushnell Lecture 14: BIST 1

VLSI Testing

Lecture 14: Built-In Self-Test

VLSI Testing

Lecture 14: Built-In Self-Test

Dr. Vishwani D. AgrawalJames J. Danaher Professor of Electrical and

Computer EngineeringAuburn University, Alabama 36849, USA

[email protected]://www.eng.auburn.edu/~vagrawal

IIT Delhi, Aug 26, 2013, 2:30-3:30PM

mailto:[email protected]

http://www.eng.auburn.edu/~vagrawal


ContentsContents Definition of BIST Pattern generator

LFSR Response analyzer

MISR Aliasing probability

BIST architectures Test per scan Test per clock Circular self-test Memory BIST

Summary


Define Built-In Self-TestDefine Built-In Self-Test Implement the function of automatic test

equipment (ATE) on circuit under test (CUT). Hardware added to CUT:

Pattern generation (PG) Response analysis (RA) Test controller

CUT

StoredTest

Patterns

Storedresponses

PinElectronics

Comparatorhardware

Test control HW/SW

ATE

PG

RA

CUT

Go/No-go signature

Tes

t co

ntr

ol

log

icCK

BISTEnable


Pattern Generator (PG)Pattern Generator (PG)

RAM or ROM with stored deterministic patterns Counter Pseudorandom pattern generator

Feedback shift register Cellular automata


Pseudorandom IntegersPseudorandom Integers

0

5

1

3

7

6 2

4

Start

+3

Sequence: 2, 5, 0, 3, 6, 1, 4, 7, 2 . . .

0

5

1

3

7

6 2

4

Start

+2

Sequence: 2, 4, 6, 0, 2 . . .

Xk = Xk-1 + 3 (modulo 8) Xk = Xk-1 + 2 (modulo 8)

Maximum length sequence: 3 and 8 are relative primes.


Pseudo-Random Pattern Generation

Pseudo-Random Pattern Generation

Standard Linear Feedback Shift Register (LFSR)

Produces patterns algorithmically – repeatable

Has most of desirable random # properties

May not cover all 2n input combinations

Long sequences needed for good fault coverage

either hi = 0, i.e., XOR is deleted or hi = Xi

Initial state (seed): X0, X1, . . . , Xn-1

must not be 0, 0, . . . , 0


Matrix Equation for Standard LFSR

Matrix Equation for Standard LFSR

X0 (t + 1)

X1 (t + 1)...

Xn-3 (t + 1)

Xn-2 (t + 1)

Xn-1 (t + 1)

10...00

h1

01...00

h2

00...001

……

………

00...10

hn-2

00...01

hn-1

X0 (t)

X1 (t)...

Xn-3 (t)

Xn-2 (t)

Xn-1 (t)

=

X (t + 1) = Ts X (t) (Ts is companion matrix)


LFSR Implements a Galois Field

LFSR Implements a Galois Field

Galois field (mathematical system): Multiplication by X same as right shift of LFSR Addition operator is XOR ( )

Ts companion matrix: 1st column 0, except nth element which is always 1

(X0 always feeds back) Rest of row n – feedback coefficients hi Remaining identity matrix means a right shift

Near-exhaustive (maximal length) LFSR Cycles through 2n – 1 states (excluding all-0)


LFSR PropertiesLFSR Properties Must not initialize to all 0’s – hangs

If X is initial state, LFSR progresses through states

X, Ts X, Ts2 X, Ts

3 X, …

Matrix period:

Smallest k such that Tsk = I

k = LFSR cycle length

Maximum length k = 2n-1, when feedback (characteristic)

polynomial is primitive

Example: 1 + X+ X3

Characteristic polynomial:

1 + h1 x + h2 X2 + … + hn-1 Xn-1 + Xn


LFSR: 1 + X + X3LFSR: 1 + X + X3

D QX2

D QX1

D QX0

X2 X1 X0

CK

RESET

000

100 001

110 010

111 101

011

RESET

Test of primitiveness: Characteristic polynomial of degree n must divide 1 + Xq for q = n, but not for q < n


LFSR as Response AnalyzerLFSR as Response Analyzer Use cyclic redundancy check code (CRCC) generator

(LFSR) for response compacter Test data bits from circuit POs are compacted CRCC divides the PO polynomial by its characteristic

polynomial Leaves remainder of division in LFSR Must initialize LFSR to seed value (usually 0) before

testing After test – compare signature in LFSR with pre-

computed signature of fault-free circuit


Example Modular LFSR Response Analyzer

Example Modular LFSR Response Analyzer

LFSR seed is “00000”


Signature by Logic Simulation

Signature by Logic Simulation

Input bitsInitial State

10001010

X0

010001111

X1

001000010

X2

000100001

X3

000010101

X4

000001010 Signature


Signature by Polynomial Division

Signature by Polynomial Division

X2

X7

X7

+ 1

+ X5

X5

X5

+ X3

+ X3

+ X3

X3

+ X2

+ X2

+ X2

+ X

+ X

+ X + 1

+ 1

X5 + X3 + X + 1Characteristic polynomial

remainder

Input bit stream: 0 1 0 1 0 0 0 1

0 ∙ X0 + 1 ∙ X1 + 0 ∙ X2 + 1 ∙ X3 + 0 ∙ X4 + 0 ∙ X5 + 0 ∙ X6 + 1 ∙ X7

Signature: X0 X1 X2 X3 X4 = 1 0 1 1 0


Multiple-Input Signature Register

(MISR)

Multiple-Input Signature Register

(MISR) Problem with ordinary LFSR response compacter:

Too much hardware if one of these is put on each primary output (PO)

Solution: MISR – compacts all outputs into one LFSR Works because LFSR is linear – obeys

superposition principle Superimpose all responses in one LFSR – final

remainder is XOR sum of remainders of polynomial divisions of each PO by the characteristic polynomial


Modular MISR ExampleModular MISR Example

X0 (t + 1)

X1 (t + 1)

X2 (t + 1)

001

010

110

=X0 (t)

X1 (t)

X2 (t)

d0 (t)

d1 (t)

d2 (t)

+


Aliasing ProbabilityAliasing Probability Aliasing means that faulty signature matches fault-

free signature Aliasing probability ~ 2-n

where n = length of signature register Example 1: n = 4, Aliasing probability = 6.25% Example 2: n = 8, Aliasing probability = 0.39% Example 3: n = 16, Aliasing probability = 0.0015%

Fault-free signature

2n-1 faulty signatures


BIST ArchitecturesBIST Architectures

Test per scan Test per clock


Test Per Scan BISTTest Per Scan BIST

Scan register

Scan register

Comb. logic

Scan register

Comb. logic

Scan register

Comb. logic

PG

RA

BISTControl

logic

PI and PO disabled during test

BIST enable

Go/No-go signature


Test per Clock BISTTest per Clock BIST New fault set tested every clock period Shortest possible pattern length

10 million BIST vectors, 200 MHz test / clock

Test Time = 10,000,000 / 200 x 106 = 0.05 s Shorter fault simulation time than test / scan


Built-in Logic Block Observer (BILBO)

Built-in Logic Block Observer (BILBO)

Combined functionality of D flip-flop, pattern generator, response analyzer, and scan chain


BILBO Serial Scan ModeBILBO Serial Scan Mode B1 B2 = “00” Dark lines show enabled data paths


BILBO LFSR Pattern Generator Mode

BILBO LFSR Pattern Generator Mode

B1 B2 = “01”


BILBO in DFF (Normal) Mode

BILBO in DFF (Normal) Mode

B1 B2 = “10”


BILBO in MISR ModeBILBO in MISR Mode

B1 B2 = “11”


SummarySummary LFSR pattern generator and MISR response analyzer –

preferred BIST methods BIST has overheads: test controller, extra circuit

delay, primary input MUX, pattern generator, response compacter, DFT to initialize circuit and test the test hardware

BIST benefits: At-speed testing for delay and stuck-at faults Drastic ATE cost reduction Field test capability Faster diagnosis during system test Less effort in the design of testing process Shorter test application times

vlsi testing lecture 14: built-in self-test

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