087160r-misc rpt 融程-rugged box pc i570eac-xxx...
TRANSCRIPT
EMC
Test Report
Product Name : Rugged BOX PC
Model No. : I570EAC-XXX Serial
Applicant : WinMate Communication INC.
Address : 9F, No. 111-6, Shing-De Rd., San-Chung City,
Taipei, Taiwan, R.O.C.
Date of Receipt : 2008/07/08
Issued Date : 2008/09/19
Report No. : 087160R-MISC
Version : V1.0
The test results relate only to the samples tested.The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by TAF, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
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Test Report Cert i f icat ion Issued Date : 2008/09/19 Report No. : 087160R-MISC
Product Name : Rugged BOX PC
Applicant : WinMate Communication INC.
Address : 9F, No. 111-6, Shing-De Rd., San-Chung City, Taipei, Taiwan, R.O.C.
Manufacturer : WinMate Communication INC.
Model No. : I570EAC-XXX Serial Rated Voltage : DC 24V / 4A
EUT Voltage : DC 24V / 4A
Trade Name : WinMate
Applicable Standard : IEC 60945: 2002-08 Chapter 9 and Chapter 10
DNV 2.4
E 10
Test Result : Complied
Performed Location : Quietek Corporation (Linkou Taiwan Laboratory)
No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo
Shiang, Taipei, 244 Taiwan, R.O.C.
TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789
Documented By :
(Adm. Specialist / Joanne Lin)
Reviewed By :
( Assistant Engineer / Sampras Yen )
Approved By :
( Manager / Vincent Lin )
DNV Review By :
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Laboratory Information
We , QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited/accepted (audited or listed) by the following related bodies in compliance with ISO 17025, EN 45001 and specified testing scopes:
The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation’s Web Site :http://tw.quietek.com/modules/enterprise/services.php?item=100 The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site : http://www.quietek.com/ If you have any comments, Please don’t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory :
No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL:+886-3-592-8858 / FAX:+886-3-592-8859 E-Mail : [email protected]
LinKou Testing Laboratory :
No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : [email protected]
Suzhou (China) Testing Laboratory :
No. 99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., Suzhou,China.TEL : +86-512-6251-5088 / FAX : +86-512-6251-5098 E-Mail : [email protected]
Taiwan R.O.C. : BSMI, NCC, TAF
Germany : TUV Rheinland
Norway : Nemko, DNV
USA : FCC, NVLAP
Japan : VCCI
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TABLE OF CONTENTS Description Page 1. General Information .................................................................................................... 7
1.1. EUT Description ...................................................................................................... 7
1.2. Mode of Operation .................................................................................................. 8
1.3. Tested System Details............................................................................................. 9
1.4. Configuration of Tested System ............................................................................ 10
1.5. EUT Exercise Software ......................................................................................... 11
2. Technical Test ........................................................................................................... 12
2.1. Summary of Test Result ........................................................................................ 12
2.2. List of Test Equipment ........................................................................................... 13
2.3. Measurement Uncertainty ..................................................................................... 16
2.4. Test Environment .................................................................................................. 17
3. Conducted Emission................................................................................................. 18
3.1. Test Specification .................................................................................................. 18
3.2. Test Setup ............................................................................................................. 18
3.3. Limit....................................................................................................................... 18
3.4. Test Procedure ...................................................................................................... 19
3.5. Deviation from Test Standard ................................................................................ 19
3.6. Test Result ............................................................................................................ 20
3.7. Test Photograph .................................................................................................... 24
4. Radiated Emission.................................................................................................... 25
4.1. Test Specification .................................................................................................. 25
4.2. Test Setup ............................................................................................................. 25
4.3. Limit....................................................................................................................... 25
4.4. Test Procedure ...................................................................................................... 26
4.5. Deviation from Test Standard ................................................................................ 26
4.6. Test Result ............................................................................................................ 27
4.7. Test Photograph .................................................................................................... 37
5. Conducted Radio Frequency Disturbance ................................................................ 40
5.1. Test Specification .................................................................................................. 40
5.2. Test Setup ............................................................................................................. 40
5.3. Limit....................................................................................................................... 41
5.4. Test Procedure ...................................................................................................... 41
5.5. Deviation from Test Standard ................................................................................ 41
5.6. Test Result ............................................................................................................ 42
5.7. Test Photograph .................................................................................................... 45
6. Radiated Radio Frequencies .................................................................................... 46
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6.1. Test Specification .................................................................................................. 46
6.2. Test Setup ............................................................................................................. 46
6.3. Limit....................................................................................................................... 46
6.4. Test Procedure ...................................................................................................... 47
6.5. Deviation from Test Standard ................................................................................ 47
6.6. Test Result ............................................................................................................ 48
6.7. Test Photograph .................................................................................................... 49
7. Fast Transient/Burst.................................................................................................. 50
7.1. Test Specification .................................................................................................. 50
7.2. Test Setup ............................................................................................................. 50
7.3. Limit....................................................................................................................... 50
7.4. Test Procedure ...................................................................................................... 51
7.5. Deviation from Test Standard ................................................................................ 51
7.6. Test Result ............................................................................................................ 52
7.7. Test Photograph .................................................................................................... 54
8. Slow Transient/Surge................................................................................................ 55
8.1. Test Specification .................................................................................................. 55
8.2. Test Setup ............................................................................................................. 55
8.3. Limit....................................................................................................................... 55
8.4. Test Procedure ...................................................................................................... 56
8.5. Deviation from Test Standard ................................................................................ 56
8.6. Test Result ............................................................................................................ 57
8.7. Test Photograph .................................................................................................... 58
9. Power Supply Shore Term ........................................................................................ 59
9.1. Test Specification .................................................................................................. 59
9.2. Test Setup ............................................................................................................. 59
9.3. Limit....................................................................................................................... 59
9.4. Test Procedure ...................................................................................................... 60
9.5. Deviation from Test Standard ................................................................................ 60
9.6. Test Result ............................................................................................................ 61
10. Power Supply Failure ............................................................................................ 63
10.1. Test Specification............................................................................................... 63
10.2. Test Setup.......................................................................................................... 63
10.3. Limit ................................................................................................................... 63
10.4. Test Procedure .................................................................................................. 64
10.5. Deviation from Test Standard............................................................................. 64
10.6. Test Result ......................................................................................................... 65
11. Electrostatic Discharge.......................................................................................... 67
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11.1. Test Specification............................................................................................... 67
11.2. Test Setup.......................................................................................................... 67
11.3. Limit ................................................................................................................... 67
11.4. Test Procedure .................................................................................................. 68
11.5. Deviation from Test Standard............................................................................. 68
11.6. Test Result ......................................................................................................... 69
11.7. Test Photograph ................................................................................................ 70
12. Attachment ............................................................................................................ 71
EUT Photograph.................................................................................................... 71
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1. General Information
1.1. EUT Description
Product Name Rugged BOX PC Trade Name WinMate Model No. I570EAC-XXX Serial
Component
M/B Winmate / I570
CPU Intel_Celeron_M_1.0 GHz
HDD Seagate, ST9408413AM 40GB
VGA Card On Board
LAN Card On Board
Sound Card On Board
DDR-RAM T ranscend 1GB
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1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as:
Pre-Test Mode
Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Final Test Mode
Emission Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Immunity Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
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1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord
1 Notebook PC DELL PPT N/A
Non-Shielded, 0.8m, With Core*1
2 Modem ACEEX DM-1414 0102027553 Non-Shielded, 1.8m 3 Modem ACEEX DM-1414 0102027554 Non-Shielded, 1.8m 4 Modem ACEEX DM-1414 0102027541 Non-Shielded, 1.8m 5 Modem ACEEX DM-1414 0102027547 Non-Shielded, 1.8m 6 IPod nano Apple A1199 YM706LSCVQ5 N/A 7 IPod nano Apple A1199 5U7047U8VQ5 N/A 8 IPod nano Apple A1199 7R649LBKVQ5 Non-Shielded, 1.8m 9 IPod nano Apple A1199 YM706KKGVQ5 Non-Shielded, 1.8m 10 Mouse HP M-S69 N/A N/A 11 Keyboard Logitech Y-SAH83 867893-0121 N/A 12 Microph one &
Earphone PCHOME N/A N/A N/A
13 W alkman AIWA HS-TA164 N/A N/A 14 Modem ACEEX DM-1414 0102027554 Non-Shielded, 1.8m 15 Monitor SONY CPD-G500 2702404 Non-Shielded, 1.8m 16
Notebook PC DELL PP04X 2D2ZM1S Non-Shielded, 0.8m, With Core*1
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1.4. Configuration of Tested System
Connection Diagram
Signal Cable Type Signal cable Description
A LAN Cable Non-Shielded, 7m, two PCS.
B RS-232 Cable Shielded, 1.5m, five PCS.
C USB Cable Shielded, 1.2m, four PCS.
D Mouse Cable Shielded, 1.8m
E Microphone & Earphone Cable Non-Shielded, 1.6m
F Keyboard Cable Shielded, 1.8m
G Audio Cable Non-Shielded, 1.6m
H D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded.
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1.5. EUT Exercise Software
1 Setup the EUT and simulators as shown on 1.4. 2 Turn on the power of all equipment. 3 Personal Computer reads data from disk. 4 Personal Computer sends “H” pattern to printer, the printer will print “H” pattern on paper. 5 Personal Computer reads and writes data into and from modem. 6 Personal Computer reads and writes data into and from Notebook. 7 Repeat the above procedure (4) to (6).
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2. Technical Test
2.1. Summary of Test Result
No deviations from the test standards Deviations from the test standards as below description:
Emission
Performed Item Normative References Test
Performed Deviation
Conducted Emission IEC 60945: 2002-08 chapter 9.2
DNV 2.4-3.14.12, E10-No.20 CISPR 16-1, 16-2
Yes No
Radiated Emission IEC 60945: 2002-08 chapter 9.3
DNV 2.4-3.14.11, E10-No.19 CISPR 16-1, 16-2
Yes No
Immunity
Performed Item Normative References Test
Performed Deviation
Conducted radio frequency
disturbance
IEC 60945: 2002-08 chapter 10.3
DNV 2.4-3.14.7, E10-No.16
Yes No
Radiated radio frequencies IEC 60945: 2002-08 chapter 10.4
DNV 2.4-3.14.8
Yes No
Fast transient/burst IEC 60945: 2002-08 chapter 10.5
DNV 2.4-3.14.5, E10-No.17
Yes No
Slow transient/surge IEC 60945: 2002-08 chapter 10.6
DNV 2.4-3.14.6, E10-No.18
Yes No
Power supply shore term
variation
IEC 60945: 2002-08 chapter 10.7
DNV 2.4-3.5, E10-No.4
Yes No
Power supply failure IEC 60945: 2002-08 chapter 10.8
DNV 2.4-3.4, E10-No.3
Yes No
Electrostatic discharge IEC 60945: 2002-08 chapter 10.9
DNV 2.4-3.14.9, E10-No.13
Yes No
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2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS 30 100366 2007/10/18 LISN R&S ENV4200 833209/007 2008/08/12 LISN R&S ENV216 100085 2008/02/14 Pulse Limiter R&S ESH3-Z2 357.88.10.52 2007/09/04 EMI Test Receiver R&S ESCS 30 100366 2007/10/18 LISN R&S ENV4200 833209/007 2008/08/12 DC power supply GW GPR-3030HD N/A N/A DC LISN Schwarzbeck NNBL 8226 8226/168 2008/04/14 DC LISN Schwarzbeck NNBL 8226 8226/169 2008/04/14 Radiated Emission / Site5 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B 2920 2007/09/15 Broadband Horn Antenna Schwarzbeck BBHA9170 208 2008/07/25 EMI Test Receiver R&S ESCS 30 100369 2008/08/15 Horn Antenna Schwarzbeck BBHA9120D 305 2008/08/10 Pre-Amplifier QTK N/A N/A 2008/05/01 Spectrum Analyzer Advantest R3162 100803463 2008/01/03 EMI Test Receiver R&S ESI 26 838786/004 2008/05/25
Pre-Amplifier MITEQ QMF-4D-180400-45-6P 925974 2008/0 1/03
Loop Antenna R&S HFH2-Z2 833799 / 004 2008/07/25 Loop Antenna Teseq HLA6120 26739 2008/07/10 DC power supply GW GPR-3030HD N/A N/A Conducted radio frequency disturbance / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator Schaffner N/A N/A 2008/04/21
Radiated radio frequencies / CB5 Instrument Manufacturer Type No. Serial No Cal. Date
AF-BOX R&S AF-BOX ACCUST 100007 N/A
Audio Analyzer R&S UPL 16 100137 2008/04/23 Bilog Antenna Schaffner Chase CBL6112B 2450 2008/01/03 Broad-Band Antenna Schwarzbeck VULB 9166 1085 2008/08/02 Biconilog Antenna EMCO 3149 00071675 2008/05/29 CMU200 UNIV.RADIOCOMM R&S CMU200 104846 2008/04/23
Directional Coupler A&R DC 6180 22735 N/A Dual Microphone Supply B&K 5935 2426784 2007/08/04 Mouth Simulator B&K 4227 2439692 2007/08/04 Power Amplifier A&R 30S1G3 309453 N/A Power Amplifier A&R 100W10000M7 A285000010 N/A Power Amplifier SCHAFFNER CBA9413B 4020 N/A Power Amplifier AR 75A250A 0325371 N/A Power Meter R&S NRVD(P.M) 100219 2008/04/22 Pre-Amplifier A&R 150A220 23067 N/A Probe Microphone B&K 4182 2278070 2007/08/04
Signal Generator R&S SMY02(9K-2080) 825454/028 2007/0 9/22
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Fast transient/burst / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS 411225 2007/12/01 Slow transient/surge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS 0411225 2007/12/01 Power supply short term variation / SR6 Instrument Manufacturer Type No. Serial No Cal. Date DC power supply GW GPR-3030HD N/A N/A Oscilloscope LeCro y L T322 N/A N/A Power supply failure / SR6 Instrument Manufacturer Type No. Serial No Cal. Date DC power supply GW GPR-3030HD N/A N/A Electrostatic Discharge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date ESD simulator system TESEQ NSG 438 695 2008/01/17 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A
Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A
Schaffner NSG 2050 System Mainframe Instrument Manufacturer Type No. Serial No Cal. Date Burst 4.8KV/16A Generator with CDN Schaffner PNW2 225 200123-098SC 2007/12/28
Damped osc. Wave 100kHz and 1MHz Schaffner PNW2 056 200124-058SC 2007/12/28
Double AC Source Variator Schaffner NSG 642A 30910014938 2007/12/28 Hybrid surge pulse 1.2/50uS Schaffner PNW 2050 20532-514LU 2007/12/28
PQT Generator Schaffner PNW2003 200138-007SC 2008/01/02 Pulse COUPLING NETWORK Schaffner CDN1 31 200124-007SC 2007/12/28
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Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaf fner CAL U100A 20405 2008/04/21 CDN Schaf fner TRA U150 20454 2008/04/21 CDN M016S Schaffner CAL U100A 20410 2008/04/21 CDN M016S Schaffner TRA U150 21167 2008/04/21 CDN T002 Schaffner CAL U100 20491 2008/04/21 CDN T002 Schaffner TRA U150 21169 2008/04/21 CDN T400 Schaffner CAL U100 17735 2008/04/21 CDN T400 Schaffner TRA U150 21166 2008/04/21 Coupling Decoupling Network Schaffner CDN M016S 20822 2008/02/23
Coupling Decoupling Network Schaffner CDN M016S 20823 2008/04/21
Coupling Decoupling Network Schaffner CDN T002 19018 2008/04/21
Coupling Decoupling Network Schaffner CDN T400 21226 2008/04/21
EM-CLAMP Schaf fner KEMZ 801 21024 2008/04/21
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2.3. Measurement Uncertainty Conducted Emission
The measurement uncertainty is evaluated as ± 2.26 dB.
Radiated Emission The measurement uncertainty is evaluated as ± 3.19 dB.
Conducted radio frequency disturbance The immunity test signal from the CS system for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 dB and 2.78 dB.
Radiated radio frequencies The immunity test signal from the RS system for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 dB.
Fast transient/burst The immunity test signal from the EFT/Burst system with the calibrated uncertainty for the waveform of voltage, frequency and timing as being 1.63 % and 2.76%.
Slow transient/surge The immunity test signal from the Surge system the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.
Power supply short term variation The DC power supply system the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.
Power supply failure The DC power supply system the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.
Electrostatic discharge The immunity test signal from the ESD system the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.
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2.4. Test Environment
Performed Item Items Required Actual
Temperature (C) 15-35 25
Conducted Emission Humidity (%RH) 25-75 50
Barometric pressure (mbar) 860-1060 950-1000
Temperature (C) 15-35 25
Radiated Emission Humidity (%RH) 25-75 50
Barometric pressure (mbar) 860-1060 950-1000
Temperature (C) 15-35 24
Conducted radio frequency disturbance
Humidity (%RH) 25-75 54
Barometric pressure (mbar) 860-1060 950-1000
Temperature (C) 15-35 22
Radiated radio frequencies
Humidity (%RH) 25-75 53
Barometric pressure (mbar) 860-1060 950-1000
Temperature (C) 15-35 26
Fast transient/burst Humidity (%RH) 25-75 53
Barometric pressure (mbar) 860-1060 950-1000
Temperature (C) 15-35 25
Slow transient/surge Humidity (%RH) 10-75 54
Barometric pressure (mbar) 860-1060 950-1000
Temperature (C) 15-35 24
Power supply shore term variation
Humidity (%RH) 25-75 54
Barometric pressure (mbar) 860-1060 950-1000
Temperature (C) 15-35 25
Power supply failure Humidity (%RH) 25-75 52
Barometric pressure (mbar) 860-1060 950-1000
Temperature (C) 15-35 25
Electrostatic discharge
Humidity (%RH) 30-60 52
Barometric pressure (mbar) 860-1060 950-1000
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3. Conducted Emission
3.1. Test Specification
According to EMC Standard : IEC 60945, DNV 2.4, E 10 CISPR 16-1, 16-2
3.2. Test Setup
3.3. Limit
Limits
Frequency (MHz)
QP (mV)
QP (dBuV)
0.01 – 0.15 63 – 0.3 96 – 50
0.15 – 0.35 1 – 0.3 60 – 50
0.35 – 30 0.3 50
Remarks: In the above table, the tighter limit applies at the band edges.
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3.4. Test Procedure The EUT and simulators are connected to the main power through a DC line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /5uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement.
Conducted emissions were invested over the frequency range from 10kHz to 0.15MHz using a receiver bandwidth of 200Hz, 0.15MHz to 30MHz using a receiver bandwidth of 9kHz.
3.5. Deviation from Test Standard No deviation.
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3.6. Test Result
Site : SR-1 Time : 2008/09/08 - 11:43
Limit : IEC60945_CLASSB_00M_QP Margin : 0
EUT : Rugged BOX PC Probe : 8226-168 - Line1
Power : DC 24V M/N: Mode 1 (+)
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Site : SR-1 Time : 2008/09/08 - 11:57
Limit : IEC60945_CLASSB_00M_QP Margin : 0
EUT : Rugged BOX PC Probe : 8226-168 - Line1
Power : DC 24V M/N: Mode 1 (+)
Frequency
(MHz) Correct Factor
(dB) Reading Level
(dBuV) Measure Level
(dBuV) Margin
(dB) Limit
(dBuV) Detector Type
1 0.028 5.991 51.620 57.611 -32.475 90.08 6 QUASIPEAK2 0.066 5.971 36.390 42.361 -35.239 77.60 0 QUASIPEAK3 0.290 1.919 33.600 35.519 -17.481 53.00 0 QUASIPEAK4 0.578 1.631 37.020 38.651 -11.349 50.00 0 QUASIPEAK5 * 8.959 0.200 48.170 48.370 -1.630 50.00 0 QUASIPEAK6 14.44 8 0.414 47.68 0 48.094 -1.906 50.00 0 QUASIPEAK
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
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Site : SR-1 Time : 2008/09/08 - 11:59
Limit : IEC60945_CLASSB_00M_QP Margin : 0
EUT : Rugged BOX PC Probe : 8226-169 - Line1
Power : DC 24V M/N: Mode 1 (-)
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Site : SR-1 Time : 2008/09/08 - 12:06
Limit : IEC60945_CLASSB_00M_QP Margin : 0
EUT : Rugged BOX PC Probe : 8226-169 - Line1
Power : DC 24V M/N: Mode 1 (-)
Frequency
(MHz) Correct Factor
(dB) Reading Level
(dBuV) Measure Level
(dBuV) Margin
(dB) Limit
(dBuV) Detector Type
1 0.035 5.987 35.930 41.917 -45.869 87.78 6 QUASIPEAK2 0.049 5.980 39.520 45.500 -37.686 83.18 6 QUASIPEAK3 0.290 1.919 34.380 36.299 -16.701 53.00 0 QUASIPEAK4 1.154 0.850 31.280 32.130 -17.870 50.00 0 QUASIPEAK5 * 8.955 0.200 48.780 48.980 -1.020 50.00 0 QUASIPEAK6 14.73 2 0.417 48.54 0 48.957 -1.043 50.00 0 QUASIPEAK
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
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3.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : Front View of Conducted Test
Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : Back View of Conducted Test
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4. Radiated Emission
4.1. Test Specification
According to EMC Standard : IEC 60945, DNV 2.4, E 10 CISPR 16-1, 16-2
4.2. Test Setup
4.3. Limit
Limits Frequency
(MHz) Distance (m) dBuV/m
0.15 – 0.3 3 80 – 52
0.3 – 30 3 52 – 34
30 – 2000 3 54
156 – 165 3 24
Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna and
the closed point of any part of the device or system.
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4.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 3 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 0.15MHz to30MHz and 156MHz to 165MHz using a receiver bandwidth of 9kHz and 30MHz to2GHz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 3 meters.
4.5. Deviation from Test Standard No deviation.
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4.6. Test Result Site : SITE-5 Time : 2008/09/05 - 11:25
Limit : IEC_60945_150K-30M_00M_QP Margin : 6
EUT : Ruged BOX PC Probe : HLA6120
Power : DC 24V Note : Mode 1
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Site : SITE-5 Time : 2008/09/09 - 10:12
Limit : IEC_60945_150K-30M_00M_QP Margin : 6
EUT : Ruged BOX PC Probe : HLA6120
Power : DC 24V Note : Mode 1
Frequency
(MHz)
Correct Factor
(dB)
Reading Level
(dBuV)
Measure Level
(dBuV/m)
Margin
(dB)
Limit
(dBuV/m)
Detector Type
1 0.286 19.47 8 15.79 2 35.270 -19.343 54.613 QUASIPEAK
2 * 0.661 19.37 1 26.68 9 46.060 -5.721 51.781 QUASIPEAK
3 1.325 19.33 0 18.71 0 38.040 -13.339 51.379 QUASIPEAK
4 1.880 19.392 11.639 31.030 -20.012 51.042 QUASIPEAK
5 6.880 19.472 1.638 21.110 -26.902 48.012 QUASIPEAK
6 20.940 19.530 0.930 20.460 -19.031 39.491 QUASIPEAK
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Report No: 0871 60R-MISC
Page: 29 of 72
Site : SITE-5 Time : 2008/09/05 - 09:48
Limit : IEC_60945_30M-2G_00M_QP Margin : 6
EUT : Ruged BOX PC Probe : 9x6x6- HORIZONTAL
Power : DC 24V Note : Mode 1
Report No: 0871 60R-MISC
Page: 30 of 72
Site : SITE-5 Time : 2008/09/05 - 09:57
Limit : IEC_60945_30M-2G_00M_QP Margin : 6
EUT : Ruged BOX PC Probe : 9x6x6- VERTICAL
Power : DC 24V Note : Mode 1
Report No: 0871 60R-MISC
Page: 31 of 72
Site : SITE-5 Time : 2008/09/09 - 09:21
Limit : IEC60945_3M_QP Margin : 6
Power : DC 24V Probe : 2007_Site5(2921)_3M - HORIZONTAL
EUT : Ruged BOX PC Note : Mode 1
Frequency
(MHz)
Correct Factor
(dB)
Reading Level
(dBuV)
Measure Level
(dBuV/m)
Margin
(dB)
Limit
(dBuV/m)
Detector Type
1 125.000 14.04 1 18.20 0 32.242 -21.758 54.00 0 QUASIPEAK
2 * 158.970 12.422 7.800 20.222 -3.778 24.00 0 QUASIPEAK
3 250.000 15.67 3 18.50 0 34.173 -19.827 54.00 0 QUASIPEAK
4 366.627 19.59 6 10.33 0 29.927 -24.073 54.00 0 QUASIPEAK
5 599.937 24.87 6 20.40 0 45.276 -8.724 54.00 0 QUASIPEAK
6 666.600 25.91 6 20.60 0 46.516 -7.484 54.00 0 QUASIPEAK
7 999.895 29.87 7 12.00 0 41.877 -12.123 54.00 0 QUASIPEAK
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor.
Report No: 0871 60R-MISC
Page: 32 of 72
Site : SITE-5 Time : 2008/09/09 - 09:45
Limit : IEC60945_3M_QP Margin : 6
Power : DC 24V Probe : 2007_Site5(2921)_3M - VERTICAL
EUT : Ruged BOX PC Note : Mode 1
Frequency
(MHz)
Correct Factor
(dB)
Reading Level
(dBuV)
Measure Level
(dBuV/m)
Margin
(dB)
Limit
(dBuV/m)
Detector Type
1 125.000 14.04 1 15.60 0 29.642 -24.358 54.00 0 QUASIPEAK
2 * 159.870 12.404 8.500 20.903 -3.097 24.00 0 QUASIPEAK
3 250.000 15.67 3 10.50 0 26.173 -27.827 54.00 0 QUASIPEAK
4 599.941 24.87 6 19.30 0 44.176 -9.824 54.00 0 QUASIPEAK
5 666.600 25.91 6 17.10 0 43.016 -10.984 54.00 0 QUASIPEAK
6 999.891 29.877 9.500 39.377 -14.623 54.00 0 QUASIPEAK
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor.
Report No: 0871 60R-MISC
Page: 33 of 72
Site : SITE-5 Time : 2008/09/05 - 10:55
Limit : IEC_60945_30M-2G_00M_QP Margin : 6
EUT : Ruged BOX PC Probe : 9120D_1-18G_Horn - HORIZONTAL
Power : DC 24V Note : Mode 1
Report No: 0871 60R-MISC
Page: 34 of 72
Site : SITE-5 Time : 2008/09/05 - 10:50
Limit : IEC_60945_30M-2G_00M_QP Margin : 6
EUT : Ruged BOX PC Probe : 9120D_1-18G_Horn - VERTICAL
Power : DC 24V Note : Mode 1
Report No: 0871 60R-MISC
Page: 35 of 72
Site : SITE-5 Time : 2008/09/09 - 10:26
Limit : IEC_60945_30M-2G_00M_QP Margin : 6
EUT : Ruged BOX PC Probe : 9120D_1-18G_Horn - HORIZONTAL
Power : DC 24V Note : Mode 1
Frequency
(MHz)
Correct Factor
(dB)
Reading Level
(dBuV)
Measure Level
(dBuV/m)
Margin
(dB)
Limit
(dBuV/m)
Detector Type
1 1032.000 -6.530 41.260 34.729 -19.271 54.00 0 PEAK
2 * 1160.000 -6.233 42.930 36.697 -17.303 54.00 0 PEAK
3 1332.000 -5.474 39.860 34.386 -19.614 54.00 0 PEAK
4 1660.000 -4.870 38.310 33.440 -20.560 54.00 0 PEAK
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Report No: 0871 60R-MISC
Page: 36 of 72
Site : SITE-5 Time : 2008/09/09 - 10:32
Limit : IEC_60945_30M-2G_00M_QP Margin : 6
EUT : Ruged BOX PC Probe : 9120D_1-18G_Horn - VERTICAL
Power : DC 24V Note : Mode 1
Frequency
(MHz)
Correct Factor
(dB)
Reading Level
(dBuV)
Measure Level
(dBuV/m)
Margin
(dB)
Limit
(dBuV/m)
Detector Type
1 1032.000 -6.530 41.450 34.919 -19.081 54.00 0 PEAK
2 * 1332.000 -5.474 41.960 36.486 -17.514 54.00 0 PEAK
3 1666.000 -4.856 40.950 36.093 -17.907 54.00 0 PEAK
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Report No: 0871 60R-MISC
Page: 37 of 72
4.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : Front View of Radiated Test-LOOP
Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : Back View of Radiated Test-LOOP
Report No: 0871 60R-MISC
Page: 38 of 72
Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : Front View of Radiated Test
Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : Back View of Radiated Test
Report No: 0871 60R-MISC
Page: 39 of 72
Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : Front View of High Frequency Radiated Test
Report No: 0871 60R-MISC
Page: 40 of 72
5. Conducted Radio Frequency Disturbance
5.1. Test Specification
According to Standard : IEC 60945, DNV 2.4, E 10
5.2. Test Setup CDN Test Mode
EM Clamp Test Mode
Report No: 0871 60R-MISC
Page: 41 of 72
5.3. Limit
Item Environmental Phenomena Units Test Specification
Performance Criteria
Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted
MHz V (rms, Un-modulated) % AM (400Hz & 1kHz)
0.15-80 3,10 80
A
Input DC Power Ports Radio-Frequency Continuous Conducted
MHz V (rms, Un-modulated) % AM (400Hz)
0.15-80 3,10 80
A
Input AC Power Ports Radio-Frequency Continuous Conducted
MHz V (rms, Un-modulated) % AM (400Hz)
0.15-80 3,10 80
A
5.4. Test Procedure
The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3V Level 2, 10V Level 3 2. Radiated Signal AM 80% Modulated with 400Hz for power supply line
AM 80% Modulated with 400Hz & 1kHz for signal line3. Scanning Frequency 0.15MHz – 80MHz
2,3,4,6.2,8.2,12.6,16.5,18.8,22,25MHz for 10V(rms) 4 Dwell Time 2.86 Seconds 5. Frequency step size f 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s or 1% / 3 Seconds Note: Tolerances
Amplitude ±10%
5.5. Deviation from Test Standard No deviation.
Report No: 0871 60R-MISC
Page: 42 of 72
5.6. Test Result Product Rugged BOX PC
Test Item Conducted susceptibility
Test Mode Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Date of Test 2008/09/17 Test Site No.6 Shielded Room
Frequency Range
(MHz)
Voltage Applied dBuV(V)
Inject Method
Tested Port of
EUT
Required Criteria
Performance Criteria
Complied To
Result
DC Power Line (AM 80% Modulated with 400Hz) 0.15~80 3V CDN DC IN A A PASS
2 10V CDN DC IN A A PASS
3 10V CDN DC IN A A PASS
4 10V CDN DC IN A A PASS
6.2 10V CDN DC IN A A PASS
8.2 10V CDN DC IN A A PASS
12.6 10V CDN DC IN A A PASS
16.5 10V CDN DC IN A A PASS
18.8 10V CDN DC IN A A PASS
22 10V CDN DC IN A A PASS
25 10V CDN DC IN A A PASS
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information
EUT stopped operation and could / could not be reset by operator at dBuV(V ) at frequency MHz.
No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test.
Report No: 0871 60R-MISC
Page: 43 of 72
Product Rugged BOX PC
Test Item Conducted susceptibility
Test Mode Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Date of Test 2008/09/17 Test Site No.6 Shielded Room
Frequency Range
(MHz)
Voltage Applied dBuV(V)
Inject Method
Tested Port of
EUT
Required Criteria
Performance Criteria
Complied To
Result
DC Power Line (AM 80% Modulated with 400Hz)
0.15~80 3V CDN LAN IN A A PASS
2 10V CDN LAN IN A A PASS
3 10V CDN LAN IN A A PASS
4 10V CDN LAN IN A A PASS
6.2 10V CDN LAN IN A A PASS
8.2 10V CDN LAN IN A A PASS
12.6 10V CDN LAN IN A A PASS
16.5 10V CDN LAN IN A A PASS
18.8 10V CDN LAN IN A A PASS
22 10V CDN LAN IN A A PASS
25 10V CDN LAN IN A A PASS Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information
EUT stopped operation and could / could not be reset by operator at dBuV(V ) at frequency MHz.
No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test.
Report No: 0871 60R-MISC
Page: 44 of 72
Product Rugged BOX PC
Test Item Conducted susceptibility
Test Mode Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Date of Test 2008/09/17 Test Site No.6 Shielded Room
Frequency Range (MHz)
Voltage Applied dBuV(V)
Inject Method
Tested Port of
EUT
Required Criteria
Performance Criteria
Complied To
Result
Signal Line (AM 80% Modulated with 400Hz & 1kHz)
0.15~80 3V Clamp VGA, PS2, USB, COM Port
A A PASS
2 10V Clamp VGA, PS2, USB, COM Port
A A PASS
3 10V Clamp VGA, PS2, USB, COM Port
A A PASS
4 10V Clamp VGA, PS2, USB,
COM Port A A PASS
6.2 10V Clamp VGA, PS2, USB,
COM Port A A PASS
8.2 10V Clamp VGA, PS2, USB,
COM Port A A PASS
12.6 10V Clamp VGA, PS2, USB,
COM Port A A PASS
16.5 10V Clamp VGA, PS2, USB,
COM Port A A PASS
18.8 10V Clamp VGA, PS2, USB,
COM Port A A PASS
22 10V Clamp VGA, PS2, USB,
COM Port A A PASS
25 10V Clamp VGA, PS2, USB,
COM Port A A PASS
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information
EUT stopped operation and could / could not be reset by operator at dBuV(V ) at frequency MHz.
No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test.
Report No: 0871 60R-MISC
Page: 45 of 72
5.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : Conducted Susceptibility Test Setup
Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : Conducted Susceptibility Test Setup-CDN
Report No: 0871 60R-MISC
Page: 46 of 72
6. Radiated Radio Frequencies
6.1. Test Specification
According to Standard : IEC 60945, DNV 2.4, E 10
6.2. Test Setup
6.3. Limit
Item Environmental Phenomena
Units Test Specification
Performance Criteria
Enclosure Port
Radio-Frequency Electromagnetic Field Amplitude Modulated
MHz V/m(Un-modulated, rms)% AM (400Hz & 1kHz)
80-2000 10 80
A
Report No: 0871 60R-MISC
Page: 47 of 72
6.4. Test Procedure
The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.
All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 10 V/m Level 3 2. Radiated Signal AM 80% Modulated with 400Hz &1kHz 3. Scanning Frequency 80MHz - 2000MHz 4 Dwell Time 2.86 Seconds 5. Frequency step size f 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s or 1% / 3 Seconds
0.5 oct/min for the frequency range 1GHz to 2GHzNote: Tolerances
Electric field strength –0/+6dB
6.5. Deviation from Test Standard
No deviation.
Report No: 0871 60R-MISC
Page: 48 of 72
6.6. Test Result Product Rugged BOX PC
Test Item Radiated susceptibility
Test Mode Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Date of Test 2008/09/17 Test Site Chamber 5
Frequency (MHz)
Position (Angle)
Polarity (H or V)
Field Strength
(V/m)
Required Criteria
Complied To Criteria
(A,B,C) Results
AM 80% Modulated with 400Hz &1kHz 80-2000 FRONT H 10 A A PASS
80-2000 FRONT V 10 A A PASS
80-2000 BACK H 10 A A PASS
80-2000 BACK V 10 A A PASS
80-2000 RIGHT H 10 A A PASS
80-2000 RIGHT V 10 A A PASS
80-2000 LEFT H 10 A A PASS
80-2000 LEFT V 10 A A PASS
80-2000 UP H 10 A A PASS
80-2000 UP V 10 A A PASS
80-2000 DOWN H 10 A A PASS
80-2000 DOWN V 10 A A PASS
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information
There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m
at frequency MHz. No false alarms or other malfunctions were observed during or after the test.
Report No: 0871 60R-MISC
Page: 49 of 72
6.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : Radiated Susceptibility Test Setup
Report No: 0871 60R-MISC
Page: 50 of 72
7. Fast Transient/Burst
7.1. Test Specification
According to Standard : IEC 60945, DNV 2.4, E 10
7.2. Test Setup
7.3. Limit Item Environmental
PhenomenaUnits Test Specification Performance
Criteria I/O and communication ports Fast Transients Common Mode
kV (Peak) Tr/Th ns Rep. Frequency kHz
+1 5/50 5
B
Input AC/DC Power Ports Fast Transients Common Mode
kV (Peak) Tr/Th ns Rep. Frequency kHz
+2 5/50 5
B
Note: Tolerances Burst duration and period ±20% Source impedance ±20% Amplitude ±10%
Report No: 0871 60R-MISC
Page: 51 of 72
7.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m.
7.5. Deviation from Test Standard No deviation.
Report No: 0871 60R-MISC
Page: 52 of 72
7.6. Test Result Product Rugged BOX PC
Test Item Electrical fast transient/burst
Test Mode Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Date of Test 2008/09/17 Test Site No.2 Shielded Room
Inject Line
Polarity Voltage
kV
Inject Time
(Second)
Inject Method
RequiredCriteria
Complied to
Criteria Result
DC Input ± 2kV 60 Direct B B PASS
Report No: 0871 60R-MISC
Page: 53 of 72
Product Rugged BOX PC
Test Item Electrical fast transient/burst
Test Mode Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Date of Test 2008/09/17 Test Site No.2 Shielded Room
Inject Line
Polarity Voltage
kV
Inject Time
(Second)
Inject Method
RequiredCriteria
Complied to
Criteria Result
LAN ± 1kV 60 Clamp B A PASS
PS/2 Port ± 1Kv 60 Clamp B B PASS
USB Port ± 1Kv 60 Clamp B A PASS
COM Port ± 1kV 60 Clamp B A PASS
D-SUB Port ± 1Kv 60 Clamp B A PASS
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information
EUT stopped operation and could / could not be reset by operator at kV of Line .
No false alarms or other malfunctions were observed during or after the test.
Report No: 0871 60R-MISC
Page: 54 of 72
7.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : EFT/B Test Setup
Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : EFT/B Test Setup-Clamp
Report No: 0871 60R-MISC
Page: 55 of 72
8. Slow Transient/Surge
8.1. Test Specification
According to Standard : IEC 60945, DNV 2.4, E 10
8.2. Test Setup
8.3. Limit Item Environmental Phenomena Units Test Specification Performance
Criteria AC/DC Input and Output Power Ports Surges Dif ferential mode Common mode
Tr/Th us kV kV
1.2/50 (8/20) 0.5 1
B
Note: Tolerances Amplitude, open/short circuit ±10%
Report No: 0871 60R-MISC
Page: 56 of 72
8.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min.
8.5. Deviation from Test Standard
No deviation.
Report No: 0871 60R-MISC
Page: 57 of 72
8.6. Test Result Product Rugged BOX PC
Test Item Surge
Test Mode Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Date of Test 2008/09/18 Test Site No.2 Shielded Room
Inject Line
Polarity Angle Voltage
kV
Time Interval
(Second)
Inject Method
Required Criteria
Complied to
Criteria Result
DC Input ± 0 1 kV 60 Direct B A PASS
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information
EUT stopped operation and could / could not be reset by operator at kV of Line .
No false alarms or other malfunctions were observed during or after the test.
Report No: 0871 60R-MISC
Page: 58 of 72
8.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : SURGE Test Setup
Report No: 0871 60R-MISC
Page: 59 of 72
9. Power Supply Shore Term
9.1. Test Specification
According to Standard : IEC 60945, DNV 2.4, E 10
9.2. Test Setup
9.3. Limit
Item Environmental Phenomena
No. Test Specification
Input DC Power Ports
7 +10%, +30% Voltage Dips Voltage deviation (Duration>15min) 8 -10%, -25%
Voltage cyclic variation (≧3cycles)
9 >±5%
Voltage ripple 10 <10%
Report No: 0871 60R-MISC
Page: 60 of 72
9.4. Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. Voltage deviation (continuous) waveform
Voltage cyclic variation
9.5. Deviation from Test Standard No deviation.
Report No: 0871 60R-MISC
Page: 61 of 72
9.6. Test Result Product Rugged BOX PC
Test Item Power Supply Shore Term
Test Mode Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Date of Test 2008/09/08 Test Site No.6 Shielded Room
Voltage Test Specification Test Duration Total
Time Test Result
DC 24V +10%, +30% 5s 15min PASS DC 24V -10%, -25% 5s 15min PASS DC 24V ≧±5% 5s 3 Cycle PASS
Voltage ripple Voltage Test Specification Test Value Test Result DC 24V <10% (2.4Vp-p) 200mVp-p PASS
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information
The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV
of Line .
Report No: 0871 60R-MISC
Page: 62 of 72
9.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : Power Supply Short Term
Report No: 0871 60R-MISC
Page: 63 of 72
10. Power Supply Failure
10.1. Test Specification
According to Standard : IEC 60945, DNV 2.4, E 10
10.2. Test Setup
10.3. Limit
Item Environmental Phenomena
Units Test Specification
Input DC Power Ports
Off 30s V oltage Dips
On 75s
Report No: 0871 60R-MISC
Page: 64 of 72
10.4. Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane. measured 1m*1m min.
- 3 interruptions within a 5-minutes period. - 30 seconds pause between switching off and switching back on.
10.5. Deviation from Test Standard
No deviation.
Report No: 0871 60R-MISC
Page: 65 of 72
10.6. Test Result Product Rugged BOX PC
Test Item Power Supply Failure
Test Mode Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Date of Test 2008/09/08 Test Site No.6 Shielded Room
Voltage Test Specification Test Duration Total
Time Test Result
DC 24V Power off 30s Power On 75s
3 Cycle 5 m PASS
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information
The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV
of Line .
Report No: 0871 60R-MISC
Page: 66 of 72
10.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : Power Supply Failure
Report No: 0871 60R-MISC
Page: 67 of 72
11. Electrostatic Discharge
11.1. Test Specification
According to Standard : IEC 60945, DNV 2.4, E 10
11.2. Test Setup
11.3. Limit
Item Environmental Phenomena
Units Test Specification Performance Criteria
Enclosure Port
Electrostatic Discharge kV(Charge Voltage) ±8 Air Discharge ±6 Contact Discharge
B
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11.4. Test Procedure
Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT.
Indirect application of discharges to the EUT:
Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distan ce 0.1m from, the EUT, with the Discharge Electrode touching th e coupling plane. The four fa ces of t he EUT will be performed with electro static discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point.
11.5. Deviation from Test Standard
No deviation.
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Page: 69 of 72
11.6. Test Result Product Rugged BOX PC
Test Item Electrostatic Discharge
Test Mode Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Date of Test 2008/09/18 Test Site No.3 Shielded Room
Item Amount of Discharge
Voltage Required Criteria
Complied To Criteria (A,B,C)
Results
Air Discharge 10 10
+8kV -8kV
B B
A A
Pass Pass
Contact Discharge 25 25
+6kV -6kV
B B
A A
Pass Pass
Indirect Discharge (HCP)
50 50
+6kV -6kV
B B
A A
Pass Pass
Indirect Discharge (VCP Front)
50 50
+6kV -6kV
B B
A A
Pass Pass
Indirect Discharge (VCP Left)
50 50
+6kV -6kV
B B
A A
Pass Pass
Indirect Discharge (VCP Back)
50 50
+6kV -6kV
B B
A A
Pass Pass
Indirect Discharge (VCP Right)
50 50
+6kV -6kV
B B
A A
Pass Pass
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information
EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.
Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points.
Report No: 0871 60R-MISC
Page: 70 of 72
11.7. Test Photograph Test Mode : Mode 1: Intel (R) Celeron (R) M Processor CPU 1GHz, D-SUB (1600*1200/60Hz)
Description : ESD Test Setup
Report No: 0871 60R-MISC
Page: 71 of 72
12. Attachment EUT Photograph
(1) EUT Photo
(2) EUT Photo
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Page: 72 of 72
(3) EUT Photo
(4) EUT Photo