Agilent Optical Amplifier Test SolutionsSingle channel amplifier testDWDM amplifier test

Fast, accurate and future-proof

The scalable solution that allows you toadapt testing exactly to you needWith the technology of amplifying opticalsignals under constant pressure to evolve, youneed test solutions that solve the problems oftoday, and those of tomorrow.

To meet these challenges, Agilent offer smodular solutions for single channel opticalamplifier test as well as for DWDM amplifiertest. Both are based on Agilent’s industry-leading optical component test platform that actas the foundation for a range of testapplications available today and many more inthe near future.

Agilent’s optical amplifier (OA) test solutions arefully flexible and expandable, designed to meetyour exact technical requirements and changeand grow as your business priorities shift. Quitesimply, they’re designed to complement yourchanging test environment to help you get toprofit faster.

Agilent’s scalable test solutions for all kinds ofoptical amplifiers range from building blocks toturn-key solutions, easily customized for yourneeds in R&D and manufacturing. They arebased on Agilent’s modular optical componenttest platform 816xB which include compacttunable lasers with excellent stability, distributedfeedback lasers, high power sensors and opticalheads, modular optical switches and

wavelength flat attenuators for high opticalpower levels. Agilent’s family of OpticalSpectrum Analyzers 8614xB simplifies theprocess of characterizing gain and noise figurewith built-in software applications for ISS andTDE method.In short, Agilent’s OA test solutionsgive you the power of choice to meet your testrequirements, resources and budget.

Optical amplifier test solutionsScalable from instruments via building blocks to turnkey systems

The development of new erbium doped amplifiers, ramantechnology and semiconductor optical amplifiers are makingoptical networks work more efficiently than ever. Understandingthe limits of these technologies means that I, like you, can pushphotonics further. If you need to keep pace with innovations orreduce manufacturing cost, take a look at our latest opticalamplifier test solutions. They’re all designed to keep you at thecutting edge today, and in the future.

Manuela Davies, Optical EngineerAgilent Technologies

Agilent’s Optical Amplifier test solutions harnessthe power of industry-leading instrumentationwith Agilent’s combined test know-how andexperience. These flexible solutions are ready tomeet your test needs by providing you withunparalleled advantages:

Just enough testChoose the solution that just meets your testneeds and cut the costs for features you do notneed. Agilent offers the full range frominstruments via building blocks to turn keysystems. We scale your test solution to exactlyyour desired level of integration or the level ofnecessary test parameters.

Flexibility and expandabilitySoftware and hardware for optical amplifier testsolutions are designed to open architecturestandards. Using an open architecture allowsthe system to be expanded to accommodatetest needs. This not only gives you the greatestflexibility, but also significantly reduces your costof test because you can easily and fast adaptyour test set-up to changing environments in aflexible manufacturing floor.

Future-proofingWe’re always looking to develop our OpticalAmplifer Test Solutions to support your evolvingtest needs and keep you at the cutting edge.Our modular architecture allows you to upgradeyour solution to your needs in the future.

Pay as you GrowYou can adapt the test capabilities to yourgrowing requirements by adding new buildingblocks. Agilent’s flexibility protects yourinvestment and thus maximizes your return on it.

Unique service and support Agilent’s expert consulting services support yourquest to stay competitive in the rapidlychanging communications arena. The expertiseof our world-class support team helps youmaximize the return on your technologyinvestment.

Cost-effective Pulse Method simplifies testof EDFAsTraditional time-domain extinction (TDE) methoduses external optical modulators withassociated timing electronics to pulse thesource and gate the detection. These functionscan be realized directly in the sources and OSArespectively. A trigger signal from the self-modulating source can be used to control thetiming of the built-in OSA gating. Built-inmeasurement routines in the instrumentationallow both types of noise figure measurements,ISS (interpolation with source subtraction) orTDE method. Avoiding an external modulator forthe sources offers simplicity and investment costsavings as well as power budget enhancementof the test system.

The heart of each test solution: Agilent’s industry-leading instruments

Building Blocks: fully flexible and expandable test kits

Turnkey systems:• low-cost entry solutions• standard configurations • high-end customization

AdvantagesDirect source modulation supportstransient measurementsThe direct modulation of the test sources,especially synchronously, can also be used tosimulate the sudden adding and dropping ofsome or all of the input channels to measurethe transient response and control of opticalamplifiers. The output response of the amplifiercan be measured with a sufficiently fastdetector, measuring the time response insweeps triggered by the modulated source.

Effective algorithm speeds up polarization-resolved measurementsOptical amplifiers based on planar waveguidetechnologies, especially SOA but also EDWA,raise the need for testing at specific input statesof polarization (SOP). The gain of an SOA cangenerally be expected to be different for thesetwo states making distinct measurementsnecessary. In fact, Mueller-matrix analysis canbe used either to calculate the gain or powerfor the TE and TM states directly, as well asassociating these with the correspondingpolarization settings, or to actually make thoseinstrument settings and measure the TE and TMsignals directly.

Building blocksFully flexible and expandable test kits

DFB laser sources*

81662A • C- and L-band• + 10 dBm output power • power stability typ. ± 0.005 dB• SMSR typ. 45 dB

81663A• C- and L-band• + 13 dBm output power • power stability typ. ± 0.005 dB• SMSR typ. 50 dB

Single channel source kitThe single channel source kit in combinationwith the fundamental kit allows measurement of gain and noise figure of single channelamplifiers.

• 1 - 8163B lightwave multimeter• 1- 81989A compact tunable laser source for

S+C-band or• 81949A compact tunable laser source for

C+L-band

DWDM source kitThe DWDM source kit in combination with thefundamental kit allows measurement of gainand noise figure of DWDM amplifiers.

• 1 - 8166B lightwave multichannel system• 16 - 81662A DFB laser or 81663A DFB laser

Optional:• 1-81989A or 81949A compact tunable laser

*please contact your Agilent Technologies sales representative for high-power options or wavelengths in the O-, E-, or S-band.

Compact tunable laser sourceswith high output power

81989A• S+C-band• +13 dBm output power• power stability typ. ±0.008 dB

81949A• C+L-band• +13 dBm output power• power stability typ ±0.008 dB

86142B / 86146B benchtop spectrumoptical analyzer• Built-in test applications• Relative accuracy ± 0.05 dB• Low PDL ± 0.05 dB• Resolution bandwidth accuracy ± 3%

Fundamental kitThe fundamental kit is the basic instrumentationyou need for optical amplifier test. In combination with one of the source kits itallows measurement of gain, noise figure andpower. The 8614xB optical spectrum analyzerssimplify the process of characterizing gain andnoise figure with built-in software applicationsfor ISS method (interpolation with sourcesubtraction).

By an internal (synchronous) modulation of thesources and an external gating of the 86146BOSA the TDE method (time-domain extinction)is also available. This low-cost pulse methoddoes not require any external modulators andthus reduces the cost.

Fundamental kit components:• 86142B optical spectrum analyzer with ISS,

or 86146B optical spectrum analyzer withISS &TDE

• 8164B lightwave measurement system• 8157xA attenuator • 81630B power sensor• 8159xA/S optical switch

1 8157xA optical attenuatorwith power control:

• High input power up to 2W• Excellent wavelength flatness: ±0.05 dB • Low insertion loss: typ. 0.7 dB

2 8159xA/S modular optical switches: Configurations: 1x2, dual 1x2, 2x2, 1x4

• Excellent repeatability: +/- 0.005 dB• Low insertion loss: 0.8 dB

3 81630B optical power sensor• High input power up to +28 dBm • Low PDL: ± 0.01 dB• Uncertainty ± 3%or

81628B optical headfor input power up to +40 dBm

21 3

Amplifier technologiesTest to the new challenges

Our OA solutions take into account the differentcharacteristics of the device, depending on it’stechnology, and allow optimized testing for theparameters needed in design and productionprocess.

EDFA (Erbium Doped Fiber Amplifier) useserbium doped fiber and is the dominant type. Itcan be positioned at any point in the networkand amplifies in the C- (1530 nm - 1565 nm)and L-band (1565 nm - 1625 nm).

TDFA (Thulium Doped Fiber Amplifier) andPDFA (Praseodymium Doped Fiber Amplifier)are comparable to an EDFA, but are doped withdifferent material, therefore amplifying atdifferent wavelengths.

EDWA (Erbium Doped Waveguide Amplifier) issimilar to an EDFA but with the Erbium in aplanar waveguide instead of a fiber. It can beused for C- and L-band. Because of theirpotential to be smaller and less expensive than

EDFAs they are a well-suited alternative forMetro applications. They can be easilyintegrated with passive components tocompensate for their losses which also is a stepforward to increased functionality of networkcomponents at reduced cost and footprint.

Raman amplifiers are based on the Ramaneffect and can be used with any type of fiber,and at any wavelength, currently of interest forC-, L- and S-band (1460 nm - 1530 nm). Atpresent, Raman amplifiers are mostly deployedas in-line amplifier together with EDFAs asEDFA/Raman hybrid. All-Raman systems mayemerge in the future. Because of their low noisefigure and ability to put gain in the span, Ramanamplifiers will play an important role for 40Gbit/s transmission systems.

SOA (Semiconductor Optical Amplifier) uses asemiconductor chip and is usable at anywavelength. Because SOAs are compact andcost-efficient, they are well suited for Metro

applications and can be easily integrated with atransmitter or a receiver in a line card as a smallbooster or pre-amplifier. A new and promisingapproach is the integration of SOAs with passivecomponents like switches, multiplexers andsplitters to compensate for their losses.

Optical Amplifiers in Metro ApplicationsEven more than in long-haul, metro applicationsare driven by economics. To reduce cost ofamplification, there are low cost EDFAsemerging in the market. Besides a goodpotential for cost effective productionprocesses, SOAs and EDWAs feature also smallfootprint and they are easier to integrate withother components. Metro applications typicallydeal with adding and dropping of channelswhat creates transience that must be controlled.In general, new amplifiers will be more agileand require variable gain control.

F: Fundamental kit

8164B mainframe8157xA attenuator8159xA/S switch81630B power meter86142B OSA (ISS) or86146B (ISS+TDE)

S: Single channelsource kit

8163B mainframe81949A, 81989A,81940A or 81980ACTLS

W: WDM source kit

8166B mainframe81662A, 81663A DFBsOptional: 81949A,81989A, 81940A or81980A CTLS

LSA: 71400C lightwavesignal analyzerPolarization controller:11896A (scrambling)8169A (Mueller method)

Choose what you need todayAnd be equipped to meet the needs of tomorrow

• fundamental kit: – OSA; 86142B (ISS only)• WDM source kit CTLS option of

source kit neded

LSA

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Gain FlatnessGain Noise Figure Power & Gain Tilt Gain Ripple PDG RIN

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SOA

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EDWA

EDFA

SOA

EDWA

EDFA

• fundamental kit – OSA: 86142B (ISS only) or 86146B (ISS+TDE)

• WDM source kit

• fundamental kit – OSA: 86142B (ISS only)• single channel source kit

• fundamental kit – ISS only or ISS+TDE• single channel source kit

DFB

DFB

DFB

TLS

81940A

81577A

DWDMsource bank

81577A

11896A (scrambling)or 8169A (Mueller

method)

81663A

DUT

switches81592A

internal trigger signal of the sources for OSA gating

86146B

81630B

DFB

ATT+PM polcontroller

PM

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By internet, phone or fax, get assistance with all your test and measurement needs

Related literature

Communications Network Test Solutions. Test Innovations that Improve Your Bottom Line, 5988-2360EN

Optical Component Test Solutions, 5988-1930EN

Measuring the Dependence of Optical Amplifiers on Input Power Using an Attenuator, 5988-5260EN

Lightwave Test and Measurement 2002 Catalog, 5988-4183EN

Agilent 8163B Lightwave Multimeter, Agilent 8164B Lightwave Measurement System, Agilent 8166B Lightwave Multichannel System

Technical Specifications, 5988-3924EN

Agilent 81980/40/89/49A Compact Tunable Laser Sources, Technical Specifications, 5988-8518EN

Agilent 81662A DFB Laser, Agilent 81663A DFB Laser, Technical Specifications, 5988-1570EN

Agilent Power Sensor Modules, Technical Specifications, 5988-1569EN

Agilent Optical Attenuators, Technical Specifications, 5988-2696EN

Agilent Agilent 8159xA/S Modular Optical Switches, Technical Specifications, 5988-5071EN

Agilent 8614XB Optical Spectrum Analyzer Family, Technical Specifications, 5980-0177EN

Optical Amplifier Testing with the Interpolated Source-Subtraction and Time-Domain Extinction Techniques, Application Note, 5988-1564EN

Agilent Optical Amplifier Test System, 5988-7760EN

USA(tel) 1 800 452 4844(fax) 1 888 900 8921

Canada(tel) 1 877 894 4414(fax) (905) 282 6495

China(tel) 800 810 0189(fax) 800 820 2816

Japan(tel) (81) 426 56 7832(toll free tel) 0120 421 345(fax) (81) 426 56 7840(toll free fax) 0120 421 678

Other Asia PacificCountries(tel) (65) 375 8100(fax) (65) 836 0252

Taiwan(tel) 0800 047 866(fax) 0800 286 331

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Latin America(tel) (305) 269 7500(fax) (305) 269 7599

Korea(tel) (82 2) 2004 5004(fax) ((82 2) 2004 5115

This information is subject to change without notice.

Visit the Agilent website for more information

www.agilent.com/comms/oa-test

© Agilent Technologies Inc. 2003

Pub no. 5988-5760EN

Publication date: Jan 24th, 2003

C+C