twepp paris, 09
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TWEPP Paris, 09
Radiation Tests on the complete systemof the instrumentation electronicsfor the LHC Cryogenicsat the CNGS test facility
Evangelia Gousiou CERN TE CRG
Outline
o Overview of the Cryogenic Instrumentation Electronics
o Radiation tolerance strategy
o CNGS Test Facility
o Test Setup
o Test Results
o Conclusions
Outline
o Overview of the Cryogenic Instrumentation Electronics
o Radiation tolerance strategy
o CNGS Test Facility
o Test Setup
o Test Results
o Conclusions
The Cryogenic Instrumentation Electronics
o ~10.000 electronic boards assembled in ~800 crates, all around the LHC tunnel and
in “protected areas”.
• Conditioners: measure temperature, pressure, He level
• Actuators: AC and DC electrical heaters
o All electronics will be subject to radiation (ionizing, non-ionizing dose and SEE).
o Manufactured mainly with COTS that have been prequalified, since space or
military technologies were incompatible with the project budget.
->-> Replacements foreseen during maintenance campaigns.
Conditioner Channels Architecture
Conditioner card (holds 2 independent channels)
ASIC ADC FPGA MU
X
ASIC ADC FPGATemp.Sensor
Pressure Sensor
ASIC ADC FPGA MU
X
ASIC ADC FPGA
Conditioner Channels Architecture
ASIC ADC FPGA MU
X
ASIC ADC FPGA
Conditioner card (holds 2 independent channels)
ASIC ADC FPGA MU
X
ASIC ADC FPGAM
UX FPGA
WFIP Communication card (for up to 7 cards)
WorldFIPAGENT
SRAM
Temp.Sensor
Pressure Sensor
ASIC ADC FPGA MU
X
ASIC ADC FPGA
Conditioner Channels Architecture
ASIC ADC FPGA MU
X
ASIC ADC FPGA
Conditioner card (holds 2 independent channels)
ASIC ADC FPGA MU
X
ASIC ADC FPGAM
UX FPGA
WFIP Communication card (for up to 7 cards)
WorldFIPAGENT
SRAM
WorldFIP FIELDBUS
Temp.Sensor
Pressure Sensor
ASIC ADC FPGA MU
X
ASIC ADC FPGA
Conditioner Channels Architecture
ASIC ADC FPGA MU
X
ASIC ADC FPGA
Conditioner card (holds 2 independent channels)
ASIC ADC FPGA MU
X
ASIC ADC FPGAM
UX FPGA
WFIP Communication card (for up to 7 cards)
WorldFIPAGENT
SRAM
WorldFIP FIELDBUS
Features for
high accuracy
o Continuously auto-calibrated system: • Comparison with a reference on each measurement for gain drift correction.• Voltage polarity inversion on each measurement for offset correction.• Excitation current inversion for compensation of thermocouple effects.
Features for
high accuracy
Temp.Sensor
Pressure Sensor
Outline
o Overview of the Cryogenic Instrumentation Electronics
o Radiation tolerance strategy
o CNGS Test Facility
o Test Setup
o Test Results
o Conclusions
Radiation tolerance strategy
Components Selection
o Rad-hard ASIC, Voltage Regulator
developed at CERN
o Anti-fuse FPGA
o WorldFIP agent using signal transformer
rather than optical insulators
o Radiation tests on COTS in dedicated test
facilities
Radiation tolerance strategy
Mitigation Techniques
o Triple module redundancy on FPGA logic
o Frequent refreshment of WorldFIP
agent’s SRAM memory to reduce error
probability
o Overdesign of power supplies and thermal dissipators
1s 20ms
Wor
ldF
IP
FIEL
DBUS1s
WorldFIP Communication Card
ConditionerCard
FPGA SRAM
Components Selection
o Rad-hard ASIC, Voltage Regulator
developed at CERN
o Anti-fuse FPGA
o WorldFIP agent using signal transformer
rather than optical insulators
o Radiation tests on COTS in dedicated test
facilities
Radiation Test Campaigns
LHC Tunnel Electronics
o Tests in dedicated test facilities for all the
components (ITN-Portugal, UCL-Belgium,
PSI-Switzerland, CERN-Switzerland).
Protected Areas Electronics
o Radiation levels underestimated-> -> Electronics not designed to stand
radiation.
The test campaign at CNGS aims at
Validating the performance of the complete systems for both cases (tunnel and protected
areas).
Outline
o Overview of the Cryogenic Instrumentation Electronics
o Radiation tolerance strategy
o CNGS Test Facility
o Test Setup
o Test Results
o Conclusions
Why CNGS?
o Tests of complete systems (crates)
o Exposure to LHC-like radiation field
o Good knowledge of radiation levels from simulations and real time
monitoring
o Free of charge!
The CNGS Test Facility
Prot
on B
eam
2nda
ry B
eam
Graphite Target
ParticleShower
.
.
.
Neu
trin
o Be
am
Mai
n Tu
nnel
Serv
ice
Galle
ry
CERN
Gran Sasso(Italy)
Ducts
Graphite Target
ParticleShower
.
.
.
Mai
n Tu
nnel
Serv
ice
Galle
ry
CERN
Ducts
The CNGS Test Facility
DUT
Prot
on B
eam
2nda
ry B
eam
Neu
trin
o Be
am
Gran Sasso(Italy)
Gran Sasso(Italy)
We are provided witho Mains
o WorldFIP Communication
o Real Time Rad Monitors
o 2 x 48pins Connectors
Prot
on B
eam
2nda
ry B
eam
Graphite Target
ParticleShower
.
.
.
Neu
trin
o Be
am
Mai
n Tu
nnel
Serv
ice
Galle
ry
CERN
Ducts
DUT
The CNGS Test Facility
Ctrl Room…
…2km
Outline
o Overview of the Cryogenic Instrumentation Electronics
o Radiation tolerance strategy
o CNGS Test Facility
o Test Setup
o Test Results
o Conclusions
Equipment to Test
o 2 Cryogenic Instrumentation Crates fully equipped with Conditioners, Actuators, Communications and Power Supply Cards:
o 25 Cards (=50 channels) of LHC tunnel electronicso 8 Cards (=16 channels) of “protected areas” electronics
Test Setup
o Testing conditions:
• Fixed loads to conditioner channels
• Fixed set points to actuator channels
• 4 thermometers in different locations
o On line measurements on DUT:
• WorldFIP data as in the LHC control system
• Current Consumption and Voltage Levels
Testing Periods
o 1 month dry run tests to confirm electronics and measurements reliability.
TID (Gy) 18NIEL (n/ cm2) 2.6e+11
>20MeV (h/ cm2) 1.3e+11
TID (Gy) 105NIEL (n/ cm2) 3.6e+12
>20MeV (h/ cm2) 2e+12
+
o 1.5 months at low dose radiation station:
o 1.5 months at high dose radiation station:
Outline
o Overview of the Cryogenic Instrumentation Electronics
o Radiation tolerance strategy
o CNGS Test Facility
o Test Setup
o Test Results
o Conclusions
Protected Areas Electronics
o Cumulative effects failures:
-> Failing component: Solid state relay
->-> Solutions for the LHC: Moving of electronics, shielding of protected areas.
o Same results for 6 channels and reproduced in two different CNGS locations.
TID (Gy) 5
NIEL (n/ cm2) 7e10
0.3
1. AC Heater Actuators Overview
LHC yearsin the worst case
Protected Areas Electronics
1MeV(cm-2) 2e10 4e10 6e10 8e10 1e11 1.2e11 1.4e11
TID (Gy) 2 4 6 8 10
Pow
er o
n lo
ad
Protected Areas Electronics
1MeV(cm-2) 2e10 4e10 6e10 7.3e10 1e11 1.2e11 1.4e11
TID (Gy) 2 4 5 6 8 10
Pow
er o
n lo
ad
Protected Areas Electronics
FPGA
Solid State RelayMains
Set point
Failing Component1. AC Heater Actuators
Protected Areas Electronics
FPGA
Solid State RelayMains
Set point
Failing Component1. AC Heater Actuators
Protected Areas Electronics
o Cumulative effects failures:
-> Failing component: DC-DC converter; plans for tests in dedicated test facilities.
4
o Same results for 12 channels and reproduced in two different CNGS locations.
2. Insulated Temperature Conditioners Overview (I)
TID (Gy) 70
NIEL (n/ cm2) 2e12
LHC yearsin the worst case
Protected Areas Electronics
TID (Gy)
Curr
ent C
onsu
mpti
on (A
)
70
2
o Single Event Upsets:
-> Failing component: Digital Isolator
->-> Mitigation Technique for LHC: soft reset automatically forced by the control system;
No influence on proper operation of the machine.
Protected Areas Electronics
o Same results for 12 channels and reproduced in two different CNGS locations.
Cross Section (/cm2) 2e-9
6
2. Insulated Temperature Conditioners Overview (2)
LHC SEU/ hr in the worst case
Protected Areas Electronics
FPGADigital
Isolation Amplifier
PT100
Analog Isolation Amplifier
measurement • measurement• ctrl signals……………………….. = Sensor Resistance
ASIC
ctrl signal4 wiremeasurement
2. Insulated Temperature
ConditionersSEE occurrence
Protected Areas Electronics
FPGADigital
Isolation Amplifier
50 Ω
Analog Isolation Amplifier
ASIC
100μA 11
5mV 5mV • 5mV• 100μA......................= 50 Ω
2. Insulated Temperature
ConditionersSEE occurrence
Protected Areas Electronics
FPGADigital
Isolation Amplifier
50 Ω
Analog Isolation Amplifier
ASIC
100μA 11
5mV 5mV • 0,5mV• 100μA......................
= 5 Ω
010μA
0,5mV 0,5mV
o A soft remote Reset brings the situation back to normal.
o Cross section calculation:
2. Insulated Temperature
ConditionersSEE occurrence
Tunnel Electronics Overview
o Tunnel electronics have received till now a cumulated dose of:
..and the tests are still ongoing!
o No Single Event Errors!
o Still within specs in output accuracy!
>10
TID (Gy) ~125
NIEL (n/ cm2) ~4e12
LHC yearsin 90% of the cases
51
48TID (Gy)
Resis
tanc
e (Ω
)
Tunnel Electronics
50
Tunnel Electronics
0 10 20 40 60 80 100 120
51
+0.3
%De
sign
Spec
s-0
.3%
48TID (Gy)
Resis
tanc
e (Ω
)
50
Tunnel Electronics Overview
o No SEE!
o Still within specs in output accuracy!
o BUT! Gain drifts already observed and corrected by auto calibration features.
o Tunnel electronics have received till now a cumulated dose of:
..and the tests are still ongoing!>10
TID (Gy) ~125
NIEL (n/ cm2) 4e12
LHC yearsin 90% of the cases
Tunnel ElectronicsSe
nsor
Vol
tage
Refe
renc
e Vo
ltage
Vref = G*I*Rref
Vsens = G*I*Rsens
Tunnel ElectronicsSe
nsor
Vol
tage
Refe
renc
e Vo
ltage
Vref = G*I*Rref
Vsens = G*I*Rsens
Tunnel ElectronicsSe
nsor
Vol
tage
Refe
renc
e Vo
ltage
Vref = G*I*Rref
Vsens = G*I*Rsens
51
48
Vref
Rsens=RrefVsen
50
Outline
o Overview of the Cryogenic Instrumentation Electronics
o Radiation tolerance strategy
o CNGS Test Facility
o Test Setup
o Test Results
o Conclusions
Conclusions
o CNGS testing has provided quantitative knowledge about the
radiation tolerance of our complete system.
o Confirmation of LHC tunnel electronics reliability.
o Identification of protected areas electronics weaknesses.
o First approach of possible solutions.
Conclusions
o CNGS testing has provided valuable knowledge for all our electronics
o Further tests on specific components need to be performed
o Optimism in the case of tunnel electronics
o Multiple solutions for the protected areas electronics problems
oThank you for your attention
o CNGS testing has provided valuable knowledge for all our electronics
o Further tests on specific components need to be performed
o Optimism in the case of tunnel electronics
o Multiple solutions for the protected areas electronics problems
Conclusions
oThank you for your attention
TWEPP Paris, 09
Extras
Voltage & Current Measurements
o In order to probe and gain access to the Current Consumption and Voltage Level signals, modification needed to be done on the Power Supply Card
• The Power Supply Card receives the mains and provides channels of DC Voltage for all the Cards in a Crate
• A 1Ω robust resistance inserted in series in the tracks of the Power Card
IV
1 Ω
Voltage & Current Measurements
o In order to probe and gain access to the Current Consumption and Voltage Level signals, modification needed to be done on the Power Supply Card
• The Power Supply Card receives the mains and provides channels of DC Voltage for all the Cards in a Crate
• A 1Ω robust resistance inserted in series in the tracks of the Power Card
IV
1 Ω
Cryogenic Instrumentation Conditioner Channels Architecture
High Accuracy main featureso Auto-calibrated System: high precision resistor measured every time a variable measurement is
taken and correction of amplifier offset by amplifier input inversion as well as correction of cable TC effects by current inversion.
ASIC ADC FPGA MU
XWorldFIP FIELDBUS
MU
X FPGA
Conditioner Card (holds 2 independent channels)
WFIP Communication Card (holds up to 7 Cards)
WorldFIPAGENT
SRAMASIC ADC FPGA M
UX
ASIC ADC FPGA
Pressure Sensor
PT100
Pressure Sensor
ASIC
ASIC
Cryogenic Instrumentation Conditioner Channels Architecture
High Accuracy main featureso Auto-calibrated System: high precision resistor measured every time a variable measurement is
taken and correction of amplifier offset by amplifier input inversion as well as correction of cable TC effects by current inversion.
ASIC ADC FPGA MU
XWorldFIP FIELDBUS
MU
X FPGA
Conditioner Card (holds 2 independent channels)
WFIP Communication Card (holds up to 7 Cards)
WorldFIPAGENT
SRAMASIC ADC FPGA M
UX
ASIC ADC FPGA
Pressure Sensor
PT100
Pressure Sensor
high precision resistor
ASIC
ASIC
ASIC
Vsens = G*I*Rsens
Conditioner Card (holds 2 independent channels)
ASIC PT100
Cryogenic Instrumentation Conditioner Channels Architecture
High Accuracy main featureso Auto-calibrated System: high precision resistor measured every time a variable measurement is
taken and correction of amplifier offset by amplifier input inversion as well as correction of cable TC effects by current inversion.
ASIC ADC FPGA MU
XWorldFIP FIELDBUS
MU
X FPGA
WFIP Communication Card (holds up to 7 Cards)
WorldFIPAGENT
SRAMASIC ADC FPGA M
UX
FPGA
Pressure Sensor
Pressure Sensor
high precision resistor
Vsens = G*I*Rsens
Vref = G*I*Rref
ASIC
Conditioner Card (holds 2 independent channels)
ASIC PT100
Cryogenic Instrumentation Conditioner Channels Architecture
High Accuracy main featureso Auto-calibrated System: high precision resistor measured every time a variable measurement is
taken and correction of amplifier offset by amplifier input inversion as well as correction of cable TC effects by current inversion.
ASIC ADC FPGA MU
XWorldFIP FIELDBUS
MU
X FPGA
WFIP Communication Card (holds up to 7 Cards)
WorldFIPAGENT
SRAMASIC ADC FPGA M
UX
FPGA
Pressure Sensor
Pressure Sensor
amplifier input inversion
V+sens = Voff + G*I*Rsen
ASIC
Conditioner Card (holds 2 independent channels)
ASIC PT100
Cryogenic Instrumentation Conditioner Channels Architecture
High Accuracy main featureso Auto-calibrated System: high precision resistor measured every time a variable measurement is
taken and correction of amplifier offset by amplifier input inversion as well as correction of cable TC effects by current inversion.
ASIC ADC FPGA MU
XWorldFIP FIELDBUS
MU
X FPGA
WFIP Communication Card (holds up to 7 Cards)
WorldFIPAGENT
SRAMASIC ADC FPGA M
UX
FPGA
Pressure Sensor
Pressure Sensor
amplifier input inversion
V+sens = Voff + G*I*Rsen
V-sens = Voff + G*I*Rsen
ASIC
Conditioner Card (holds 2 independent channels)
ASIC PT100
Cryogenic Instrumentation Conditioner Channels Architecture
High Accuracy main featureso Auto-calibrated System: high precision resistor measured every time a variable measurement is
taken and correction of amplifier offset by amplifier input inversion as well as correction of cable TC effects by current inversion.
ASIC ADC FPGA MU
XWorldFIP FIELDBUS
MU
X FPGA
WFIP Communication Card (holds up to 7 Cards)
WorldFIPAGENT
SRAMASIC ADC FPGA M
UX
FPGA
Pressure Sensor
Pressure Sensor
TC effects
VI+sens = G * (I*Rsens +VTC)
VI-sens = G * (-I*Rsens +VTC)
ASICVTC
+-
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