calibre 3dstack - global semiconductor alliance...2012/04/03 · rve results n calibre 3d-ic...
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Calibre 3DSTACK John Ferguson Marketing Director – DRC Applications
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Stacking Chips System View, Configurations and Interfaces
Design development on specific dies — Different design groups — “Commodity” die usage — “Template” design layer used for alignment
Multiple technology nodes Support flexible stacking configurations Easily change configurations Verify interface from one die to another
— Outside layers — Pad alignment
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3DIC Physical Verification Challenge
2D PV Assumes Vertical Depth by Layer — All polygons on the same layer considered “co-planar” and can be
merged
2.5D and 3D Assemblies — Same layer at different die placements — Conflicting layer maps from separate die processes
Need a Method to Treat Each Placement Layer Uniquely
TSV Devices
BM1
M1 TSV Substrate
TSV Devices
BM1
M1 TSV Substrate
TSV Devices
BM1
M1 TSV Substrate
TSV Devices M1 Substrate
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Calibre 3D-IC Verification Flow Maintain standard DRC, LVS, PEX verification processes
— Example for an advanced “SoC” – Logic/GPU verified to TSMC N28 – Memory verified to Micron 3X nm – Analog verified to TSMC N90
Introduce 3D interface verification solution — Consider: offset, rotation, scaling, etc… — Trace connectivity of interposer, 3D assembly
90nm Analog 3X nm memory
3X nm memory
3X nm memory
28nm GPU / µP
Benefits — Minimal disruption to existing verification flows
– Support flexible stacking configurations of multiple dies — Easily change configurations
– Use different process nodes together — Avoids complexity and scalability failure of
“Mega-merge” — Maximum flexibility
90nm Analog
3X nm memory
28nm GPU / µP
Die Interfaces
Chip PV
3D PV
TSMC
Micron
TSMC
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Stacking Chips Pad Alignment
Verify that connections are “correct” Microball connections
— Small chip-chip coupling
Cu-Cu — May need to consider coupling
Microball and pad
Interface Layers
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RVE Results
n
Calibre 3D-IC Verification Flow
Run DRC / LVS / xRC on individual chips nmDRC RVE
Results 1
Design n GDS
SPICE Netlist
Golden Foundry Deck n
Verify 3D-IC stack — Trace die-to-die or die-to-interposer connectivity — Consider: offset, rotation, scaling, etc…
Design 1 GDS
Golden Foundry Deck 1
SPICE Netlist
nmLVS
xACT 3D
3D-IC Rule Deck
Results Calibre
(for 3D-IC) Assem. 3D-IC
Design n GDS
Design 1 GDS
Verified Designs
Design n GDS
Design 1 GDS
CCI to Other
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Calibre 3DSTACK: Verification Flow
Calibre 3DSTACK
Chip N
3DSTACK Rules
Assembly GDS
Chip 1 Chip 1 Chip 1 Chip 1 Chip 1
Spice N
Chip 1 Chip 1 Chip 1 Spice1 Spice1
Layout Assembly
Check
Netlist Assembly
Assembly Extracted
Netlist
Results
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Physical Verification Checks
DRC Checks — Geometric overlap constraints — Center to center alignment — Grid and spacing constraints
LVS Checks — Identify mismatch connections between source and layout — Port/pin label checks — Identify layout ports not in the source
Location Checks — Ensure all expected die to die physical connections exist — Requires “source” with specific pad or bump locations (AIF)
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Physical Alignment Checks: Overlap Requirements
Not highlighted as chip1 pad and chip2 pad are fully coincident (overlap = 100%)
Highlighted as overlap < the constraint (99%)
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Physical Alignment Checks: Center to Center Alignment
Highlighted as center to center spacing between chip1 pad and chip2 pad is <
0.01um
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Connectivity Checks: Interposer Black-Box
Verify connections by matching texts on pads (from layout) with the pin name in source netlist
- No Text Warnings
- Multi Text Warnings
- Floating Text Warnings
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Connectivity Checks: Interposer White-Box
Verify connections by matching the metal layers routing (from layout) with the connection in source netlist
Highlight Nets
Open Pad
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Partnering with TSMC to Continuously Expand 2.5 and 3D Offerings
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Success Stories: Tezzaron
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