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    FastBlaze

    Ultra-Fast MESFET and HEMT Device Simulator

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Introduction to MERCURY TCAD Framework

    The MERCURY framework is an application-specific TCAD toolset designed for FET simulation

    Three Main Foundations of MERCURYFast Simulations (typically less than 1 minute)Accurate Physical Models

    Accessible to all engineers

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    MERCURY Modules

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    Inputparser

    Comprehensive

    material and transportparameter database

    Mocasim

    C-Interpreter

    Core Simulation FastBlaze

    HarmonicBalance

    FastNoise Post Processing

    FastMixedMode

    Automated meshgenerator

    Automatic solutionsection

    Wide selection ofphysical models

    DC IV extraction Small-Signal RF

    extraction

    impedance-field

    calculationcoupled with localnoise servicecalculation

    Multi-frequency

    large signal RFsimulator

    Circuit embedded

    device simulation(large signal)

    Two port extraction Equivalent circuit

    extraction Noise parameterextraction

    FastGiga

    Lattice heatflow equation

    Future

    Future

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    FastBlaze Applications (cont.)

    Analyses possible:

    ID-VDS for various VGSID-VGS for various VDSTransconductancePunchthrough

    Gate capacitanceTime domain waveformsRF two-port parameter extraction (eg. s-parameters)RF parameters as function of frequency and bias

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    How Fast is FastBlaze?

    All timings on a Sun ULTRA10 workstation

    All simulations were on a 0.5 um gate length recessed MESFET or pHEMT. The DC Id-Vd simulations weretaken over the range -2.0V

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    MERCURY Method

    Two phases to MERCURY solution:

    Charge control simulation vertically under the gate, recess and capregions

    Transport simulation across the channel solving Poisson, currentcontinuity, and energy balance equations

    REFERENCESR. Drury & C.M. Snowden, "A quasi-two-dimensional HEMT model for microwave CAD applications", IEEE

    Transactions on Electron Devices, Vol. ED-42, No. 6, pp.1026-1032, 1995

    C.M. Snowden & R.R. Pantoja, "GaAs MESFET Physical Models for Process-Orientated Design", IEEETransactions on Electron Devices, Vol. ED-40, No. 7, pp.1401-1409, 1992

    B. Carnez, A. Cappy, et al. "Noise Modeling in Submicrometer-Gate FET's", IEEE Transactions on Electron

    Devices, Vol. ED-28, No.7, pp.784-789, 1981

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    MERCURY Method

    Solution method is fast because:

    Charge control data stored and accessed directly as a lookup tableCurrent driven allowing integration method for carrier transportScales linearly with number of mesh points (N)

    conventional schemes scale as NHighly efficient Newton solverAutomated IV bias control to minimize the number of solution points

    required

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    MERCURY Method

    The consequences of the MERCURY approach are:

    No need to tradeoff accuracy for speed. Rapid simulation allows useof the most sophisticated models

    Meshing and bias stepping can be automatedInitial guesses and convergence control are taken care of inherentlyTwo-dimensional effects can be modeled such as punchthrough

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    MERCURY Method: Experimentation

    Parameters which can be varied without recalculating the chargecontrolgate lengthrecess or contact lithographytransport models and parametersextrinsic and intrinsic parasiticsgate workfunction

    Parameters which can be varied but do require a new chargecontrol simulation

    epitaxial layer materials or thicknessesdoping and trap densitiesrecess depthtrap occupation models

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    FastBlaze Key Features

    Two different classes of key features:

    Advanced Physical Modelstransport tuned using Monte Carlo Simulation

    User Oriented Featuresgrid generationbias steppingdirect simulation at any bias pointGUI for structure definition

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Automated Grid Generation

    Adaptive mesh refinementuses field solution obtainedfrom very fine mesh (10A)adaptive step size control

    based on Taylor expansion

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    Mesh layout around the gate, automaticallygenerated within MERCURY. Typical meshsize at drain edge of gate 2.8 x 0.6nm.

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Automated Current Driven Bias Stepping

    An automated DC-IV generator only samples biaspoints where needed. This provides a highly efficient

    method to characterize DC performance.

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Integration with VWF Framework

    Code developed in-house to commercial standards

    Seamless integration with DeckBuild and TonyPlotGeneral purpose optimization with optimizerRSM and advanced DOE using the VWF Automation Tools

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Ultra-Fast MESFET and HEMT Device Simulator

    A customized, FastBlaze specific, GUI enables rapid device definition.This includes the geometrical, model and solution description providing

    a straightforward setup of the simulation.

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Advanced Physical Models

    Boltzmann, Fermi and Quantum Statistics

    Energy Balance always usedAdvanced transport models

    Monte Carlo derived velocity and energy and momentum relaxationtimes

    Gate conduction Models (thermionic emission)

    Extrinsic parasitic simulation Interface and bulk traps Integrated with C-interpreter for user defined models

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Quantum Mechanical Simulation

    Self-consistently solves the Schrodinger and Poisson equations inthe charge control

    Solves arbitrary number of bound statesUses highly efficient eigen solver routine to maintain high speedShows wavefront broadening into adjacent layers

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Conduction Band Energy and Eigenspectrum

    The conduction band edge for a delta-doped GaAs/AlGaAs/InGaAs/GaAspHEMT is illustrated together with the first eleven bound-state energy

    levels calculated using the quantum models.

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Mocasim: Monte Carlo Simulator

    A three valley ensemble Monte Carlo simulator

    Calculates bulk electron transport parameters for arbitrary threevalley semiconductors

    velocityenergy relaxation timemomentum relaxation time

    Derives four-dimensional material parameter setapplied fielddoping densitymole fraction(s)lattice temperature

    Used to derive transport parameters for device simulators such asFastBlaze

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Mocasim: Features

    Includes nine scattering mechanisms:Polar optical phonon absorption and emissionAcoustic phonon scatteringEquivalent valley phonon absorption and emissionNon-equivalent valley phonon absorption and emissionImpurity scatteringSelf-scattering

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Monte Carlo Transport Parameters

    The electron velocity for GaAs at 300K is shown as a function of net impurity densityand electric field. The Monte Carlo derived velocity is complemented by both energy

    and momentum relaxation times for a wide range of material systems.

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Material Dependent Transport Parameters

    Velocity-field characteristics for various III-V materials.

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Transport Parameter Comparison

    Comparison of HEMT Id-Vd using correct multi-layer transport models.The AlGaAs transport parameters are derived from Mocasim.

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Hydrogenic Dopant Ionization Comparison

    Effect of incomplete ionization on dopant and carrier densities. Bothtraps and dopant impurities have several occupation statistic models.

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    InGaAs pHEMT Structure

    2D representation of pHEMT structure created in the MERCURY GUI.Definition of epitaxy, doping and recess topography is menu-driven.

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Auto-Generated Mesh for pHEMT

    Mesh is automatically generated and focused in the pHEMT channel.

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    DC Characteristics

    DC characteristics of the pHEMT displayedwith uniform bias steps for clarity.

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Small Signal S-Parameters for a pHEMT

    The time-dependent simulation used for RF evaluation is able to transform directlyto a variety of two-port descriptions. Here the small signal s-parameters for a

    pHEMT including external contact parasitics are displayed up to 25GHz.

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Recessed MESFET Conduction-Band Energy

    Full 2D distributions are provided to allow direct visualization of thecalculated physical parameters. This figure shows the conduction band

    edge for a recessed MESFET structure biased at VDS= 2V.

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Transconductance Variation with Recess Depth

    FastBlaze allows rapid prototyping of device structures in terms oftopographical, epitaxial and doping variations. This figure illustrates

    the effect of increasing recess depth on transconductance.

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    Conclusion

    FastBlaze provides:Ultra high speed simulation MESFETs and HEMTsUses accurate physical modelsMonte Carlo derived parameters for modeling carrier transportPowerful user interface integrated with VWF tools

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    FASTBlaze Ultra-Fast MESFET and HEMT Device Simulator

    MERCURY Speed Comparison

    MERCURY and ATLAS were both used to simulate a planar 0.5 gate length GaAsMESFET on a SUN ULTRA 10 workstation. The total simulation time for an Id-Vdfamily of curves at Vg=0, -0.5V and -1.0V .

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    MERCURY ATLAS Comparison

    ATLAS MERCURY

    Mesh Points 1200 7550 (auto generated)

    CPU Time (s) 1400 49