marpg presentation 9 24-2009
TRANSCRIPT
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Expert Vision for a Changing World
Surface Characterization and Internal Structure of Rubber & Plastics Using
Atomic-Force Microscopy (AFM)
Michael P. Mallamaci, Ph.D.
PolyInsight LLC526 S. Main St., Ste. 414
Akron, Ohio 44311(330) 777-0025
[email protected]://polyinsight.com
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Agenda
• Brief History of PolyInsight• Atomic-Force Microscopy (AFM)
– Surface characterization technique– Internal structure technique
• Using AFM as a Problem Solving Tool– Roughness of multi-polymer extruded film – Morphology of thermoplastic elastomers (TPE)
• Using AFM for Certification/Validation/QA– Measuring sub-micron rubber particle size in
thermoplastic packaging films• Summary / Q & A
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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PolyInsight
• Small team of experts in the physical and chemical structure of rubber and plastics
• Laboratory operation with several microscopes and related sample preparation equipment in-house
• Located in Akron, Ohio at the Akron Global Business Accelerator– Part of NEOinc, The Northeast Ohio Incubator
Collaborative for new entrepreneurs/start-ups– Partnerships with The University of Akron,
and other regional laboratories
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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PolyInsight (cont’d)
• Continuous operation since July 2003• Provide failure analysis, R&D testing,
consulting/expert witness, and product certification services to the rubber and plastics industry
• Developed a portfolio of over 50 clients nationally and overseas
• Medical/Healthcare, Automotive, Industrial Coatings, and Consumer Products
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Atomic-Force Microscopy (AFM)
• High spatial resolution imaging of surface topography
• Similar to stylus profilometry, except 1 nm resolution
• Probe interacts with surface to reveal mechanical properties at high resolution
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Atomic-Force Microscopy (AFM)
Change in amplitudeChange in amplitudeprovides topographyprovides topography
Lag in phase relatedLag in phase relatedto viscoelasticityto viscoelasticity
or material stiffnessor material stiffness
Free amplitude = Free amplitude = AAooDamped amplitude atDamped amplitude atsetpoint S = setpoint S = AAss
AAoo AAssPhase lag
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Atomic-Force Microscopy (AFM)
Veeco Dimension 3000 AFM(large sample sizes)
Veeco MultiMode AFM(highest spatial resolution)
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Surface Characterization via AFM
• The height of surface features can be measured quantitatively with 0.1 nm resolution
• Atomic step heights on crystals, DNA molecules, proteins, semiconductor lithography applications
• Maximum height of features allowed is ~ 6 µm, so surfaces must be “smooth”
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Surface Characterization via AFM
3D Surface Projection 2D Surface Projection
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Surface Characterization via AFM
Roughness Analysis
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Internal Structure
• Classic technique for examining the structure of composite materials is Transmission-Electron Microscopy (TEM)
• Materials must be thinned to ~ 100 nm or less to be electron transparent
• Image contrast is based on either electron diffraction (crystalline materials) or mass-density (amorphous materials)
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Internal Structure of Polymers
• Sample preparation technique for obtaining electron transparent thin sections is cryoultramicrotomy
• Mass-density image contrast is enhanced by using heavy-metal stains, such as RuO2 or OsO4
• TEM offers highest spatial resolution possible at < 0.1 nm, plus chemical ID techniques
• Time-consuming sample preparation ($$$)• Difficulty with complex multi-component systems
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Internal Structure of Polymers via AFM
• Probe interaction with the surface can image “mechanical property” distribution with high spatial resolution (1-5 nm)
• Cryoultramicrotomy must be used to expose the internal structure – cut open in cross-section and look at the surface
• Relies on surface structure being representative of internal structure (just like polished sections)
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Internal Structure of Polymers via AFM
• Incompatible 4 component polymer blend can be imaged– PP (brightest)– PA (round, less
bright)– PE (dark orange)– SEBS (black,
surrounds PA)
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Review of AFM Capabilities
• High spatial resolution imaging of surface structures
• Quantitative measurement of surface roughness
• Imaging of internal structure based on mapping of mechanical properties
• Complex polymer blend morphology can be imaged, no stains required
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Using AFM as a Problem Solving Tool
• Surface morphology of a multi-polymer extruded film– Client experiences “orange peel” film surface
defects– “Nothing Changed”
• Internal structure of thermoplastic elastomers (TPE)– Client experiences flow problems, dimensional
inconsistencies with part– “Nothing Changed”
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Orange Peel Surface Defect for PP/PE/PA films
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Orange Peel Surface Defect for PP/PE/PA films
Good Orange Peel
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Orange Peel Surface Defect for PP/PE/PA films
Good Orange Peel
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Orange Peel Surface Defect for PP/PE/PA films
• Good film surface: even distribution of all three polymer strands on surface
• Orange peel defect: higher levels of exposed PE, large irregular PA domains on surface
• PA supplier suspected, higher amine number for new lot was discovered
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Internal structure of thermoplastic elastomers (TPE)
• TPEs (TPVs) rubber material that can be processed like a thermoplastic and doesn’t need to be cured
• Morphology is rubber “particles” in thermoplastic matrix
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Internal structure of PP/SEBS
• Higher magnification image of PP/SEBS
• Block co-polymer structure for SEBS clearly resolved
• This is the BAD sample!
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Internal structure of PP/SEBS
• Typical TPE composition: plastic + rubber + OIL
• Oily phase segregates to surface created by cryomicrotomy
• This is the GOOD sample
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Internal structure of PP/SEBS1st scan pass 2nd scan pass
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Internal structure of PP/SEBSBefore After
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Internal structure of PP/SEBS
• Oily phase mobility to surface is typical behavior
• Good and Bad samples displayed different “oily phase” behavior – but same blend morphology
• Only AFM could reveal this difference!• Slight difference in oil was not a “drop in
the slot” – oil solubility in the polymer was affected
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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AFM for Certification/Validation/QA
• Typical QA tools can not detect changes in structure which effect ultimate performance – focus on composition and physicals
• Polymer/rubber composites are becoming increasingly complex with performance depending on “nanostructure”
• No adequate QA tools for sub-micron structure exist
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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AFM for Certification/Validation/QA
• Catch problems before they leave the plant
• Reduce returns/recalls/adjustments• Save $$$• Build customer satisfaction / quality
reputation• Unbiased 3rd party laboratory advantages
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Rubber particle size in thermoplastic packaging films
• PE film with TPV rubber particle modifier
• AFM used to image the rubber particles
• Image analysis measures the particle size distribution
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Rubber particle size in thermoplastic packaging films
Particle Size Distribution by Atomic-Force Microscopy
0%
20%
40%
60%
80%
100%
100
200
300
400
500
600
700
800
900
1000
1100
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1300
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Equiv.Diam.(nanometers)
Cum
ulat
ive
% 45 pellet
46 pellet
45 f ilm (good)
46 f ilm (bad)
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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QA tool for particle size distribution
• Large TPV particle fraction: necessary for feel, translucency
• Smaller PSD achieved with higher work screw: films became transparent and had snakeskin defect
• Extruder/blender adjust to dial in proper particle size distribution for PE/TPV blend
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September 24, 2009MidAtlantic Rubber & Plastics GroupFall Technical Meeting
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Summary
• AFM has unique strengths as a high resolution microscopy technique
• Routine use as a problem solving tool is possible: can “see” things that other techniques cannot
• Great potential as a certification/validation/QA tool for today’s complex materials