program of emc compo 201711:10 – 11:20 welcome speech by etu (mikhail shestopalov) 11:20 – 12:20...
TRANSCRIPT
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Tuesday – 4 JULY
5 Building, CONFERENCE HALL
10:00 – 11:00 PARTICIPANT REGISTRATION
11:00 – 11:10 WELCOME SPEECH by EMC Compo TPC (Etienne Sicard)
11:10 – 11:20 WELCOME SPEECH by ETU (Mikhail Shestopalov)
11:20 – 12:20 KEYNOTE SPEECH by Prof. Alex Yakovlev, by Prof. Milos Krstic
(in cooperation with Xin Fan, Milan Babic, Eckhard Grass, Tobias Bjerregaard)
Reducing Switching Noise Effects by Advanced Clock Management
12:20 – 13:00 Technical section «EMC-aware Design and Guidelines»
Lammert Duipmans, Dusan Milosevic, Arnoud van der Wel, Peter Baltus
Identifying EMC-Critical Devices by Monitoring and Classifying Operating Region Transitions
Alexandre Martorell, Jeremy Raoult, Robin Marijon, Laurent Chusseau
EMI Functional Vulnerability Identification in RF Front-Ends
13:00 – 14:00 LUNCH
14:00 – 15:20 Technical section «EMC of Digital ICs»
Chaimae Ghfiri, Alexandre Boyer, Andre Durier, Sonia Ben Dhia
Methodology of Modeling of the Internal Activity of a FPGA for Conducted Emission Prediction Purpose
Paulo R.C. Villa, Roger C. Goerl, Fabian Vargas, Nilberto Heder Medina, Nemitala Added, Vitor A. P. De Aguiar, Eduardo L. A. Macchione, Fernando Aguirre, Marcilei A. G. Da Silveira, Eduardo Bezerra, Leticia Poehls
Analysis of ProASIC3 FPGA SEU-Sensitivity to Combined Effects of Conducted-EMI and TID
Mario Auer and Timucin Karaca Digitally Assisted EMI-Reduction Techniques for Class-D Amplifiers with Digital Control
Bernd Deutschmann, Bernhard Auinger, Gunter Winkler
Spread Spectrum Parameter Optimization to Suppress Certain Frequency Spectral Components
15:20 – 15:40 COFFEE BREAK
15:40 – 16:20 Technical section «Materials for Improved EMC of ICs»
Masahiro Yamaguchi, Yasushi Endo, Peng Fan, Jingyan Ma, Satoshi Tanaka, Yasunori Miyazawa, Makoto Nagata
Analysis of Patterned Magnetic Thin-Film Noise Suppressor for RF IC Chip
Bumhee Bae, Sukjin Kim, Youngkun Kwon, Hyunggeun Kim, Sunkyu Kong, Joungho Kim, Harkbyeong Park
Shielding Effectiveness of Noise Coupling on Analog-to-Digital Converter in Magnetic Field Wireless Power Transfer System
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16:30 – 17:30 Visit to the A. Popov's Laboratory & Apartment Museum
17:30 – 20:00 Welcome reception
Wednesday – 5 JULY
5 Building, CONFERENCE HALL
10:00 – 11:20 Technical section «EMC of Transceiver ICs»
Matthieu Deloge, Jaume Tornila Oliver, Hans Brekelmans, Peter Vermeeren, Gert Jan Bollen, Arnoud van der Wel, Gerald Kwakernaat, Adrien Schoof
A Time-Continuous Bus-Feedback LIN Transceiver in 0.14 мm High-Voltage SOI CMOS
Kohki Taniguchi, Makoto Nagata,
Akihiro Tsukioka,
Daisuke Fujimoto, Noriyuki Miura,
Takao Egami, Rieko Akimoto,
Kenji Niinomi, Terumitsu Komatsu,
Yoshinori Fukuba,
Atsushi Tomishima
Susceptibility Evaluation of CAN Transceiver Circuits with In-Place Waveform Capturing under RF DPI
Kamel Abouda, Adrien Doridant,
Bertrand Vrignon,
Nicolas Baptistat,
Matthieu Aribaud
Improving Electro-Magnetic Susceptibility Performances
of High Side Switches: Case of High Side of LIN
Physical Layers
M. Burak Baran, Hugo Pues,
Kristof Stijnen, Wim Dehaene
EMI Resisting Low-EME SENT Drivers in 0.18мm
CMOS
11:20 – 11:40 COFFEE BREAK
11:40 – 13:00 Technical section «EMC of Power Devices and Systems»
Alexandre Boyer,
Manuel Gonzalez Sentis,
Chaimae Ghfiri, Andre Durier
Modeling Methodology of the Conducted Emission
of a DC-DC Converter Board
Alexandre Boyer,
Manuel Gonzalez Sentis,
Chaimae Ghfiri, Andre Durier
Study of the Thermal Aging Effect on the Conducted
Emission of a Synchronous Buck Converter
Volha Subotskaya,
Emanuele Bodano,
Bernd Deutschmann
Adaptive Current Source Driver for High-Frequency
Boost Converter
Raul Blecic, Josip Bacmaga,
Renaud Gillon, Bart Nauwelaers,
Adrijan Baric
EMC-Oriented Design of Output Stage of Synchronous
Buck Converter
13:00 – 14:00 LUNCH
14:00 – 15:00 KEYNOTE SPEECH by Prof. Victor Luchinin
(in cooperation with Alexey Afanasjev, Anatoly Petrov and Vladimir Ilyin)
Family of Micro Key Based on SiC for Extreme Conditions and Duty
15:00 – 15:20 COFFEE BREAK
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15:20 – 17:00 Technical section «Semiconductor Device Modelling»
Vitaliy Vitko, Andrey Nikitin,
Alexey Ustinov, Boris Kalinikos
Theory of Optoelectronic Oscillators Based on Serially
Coupled Multiple Micro-Ring Resonators
Irina Ustinova, Andrey Nikitin,
Alexey Ustinov, Boris Kalinikos
and Erkki Lahderanta
Logic Gates Based on Multiferroic Microwave
Interferometers
Anatoly Dudin, Ilya Kogan,
Georgiy Yakovlev,
Maria Mironova, Igor Schukov,
Dmitriy Frolov, Vasiliy Zubkov,
Gennadii Glinskii
Simulation and Characterization of
AlGaAs/InGaAs/GaAs pHEMT Structures with Quantum
Wells for SHF Integrated Circuits
Nikita Permiakov,
Anton Evseenkov, Sergey Tarasov,
Alexander Solomonov,
Vyacheslav Moshnikov,
Ivan Lamkin
Detection Methods of Intense Areas and Identification
of the Reasons of HEMT Transistors Failure
Vladimir Tikhomirov,
Aleksandr Gudkov, Victor Petrov,
Svetlana Agasieva, Andrei Zybin,
Viktor Yankevich, Anton Evseenkov
Simulation of Electric Field Distribution in GaN HEMTs
for the Onset of Structure Degradation
17:00 – 19:00 Visit to ETU CMID Research Center Laboratories
Thursday – 6 JULY
5 Building, CONFERENCE HALL
10:00 – 11:00 Technical section «Near Field Scan Methods for ICs»
Bertrand Vrignon, Kamel Abouda,
Adrien Doridant, Nicolas Baptistat
Time-Domain Measurements Using Near Field Scanning
Method for Fast Transient Current Reconstruction
Nicolas Lacrampe,
Sebastien Serpaud,
Alexandre Boyer, Sereirath Tran
Radiated Suceptibility Investigation of Electronic Board
from Near Field Scan Method
Massiva Zouaoui, Etienne Sicard,
Henri Braquet, Ghislain Rudelou,
Emmanuel Marsy
and Gilles Jacquemod
Impact of NFSI on the Clock Circuit of a Gigabit
Ethernet Switch
11:00 – 11:20 COFFEE BREAK
11:20 – 13:00 Technical section «ESD Modelling and Analysis»
Thomas Ungru,
Wolfgang Wilkening, Renato Negra
Influence of ESD on an Integrated Shift Register
in Operation
Niels Lambrecht, Hugo Pues,
Daniel De Zutter,
Dries Vande Ginste
Circuit Modeling of the ISO 10605 Field Coupled
Electrostatic Discharge Test to Design Robust
Automotive Integrated Circuits
Friedrich Zur Nieden,
Lena Zeitlhofler, Kai Esmark,
Reinhold Gartner
Characterization of a 1-Pin Stress ESD Testing Method
for the Analysis of Nanosecond-Range Charging Effects
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Tohlu Matsushima, Mayumi Aoki,
Takashi Hisakado, Osami Wada
Equivalent Circuit Model with Nonlinear Characteristics
of Zener Diode Extracted from SPICE Model for ESD
Simulation
Mario Rotigni, Mauro Merlo,
Martina Cordoni, Paolo Colombo,
Valentino Liberali
Conducted Emissions in a 40 nm CMOS Test Chip: The
Role of ESD Protections
13:00 – 14:00 LUNCH
14:00 – 15:20 Technical section «Measurement and Modelling of IC EMC»
Anna Richelli, Luigi Colalongo,
Lorenzo Toninelli, Ion Rusu,
Jean-Michel Redoute
Measurements of EMI Susceptibility of Precision Voltage
References
Pierre Payet, Jeremy Raoult,
Laurent Chusseau
Disruption of a RF Front-End Subject to a Out-of-Band
Signal
Sebastien Serpaud, Alexandre
Boyer, Chaimae Ghfiri and Andre
Durier
Proposal for Combined Conducted and Radiated
Emission Modeling for Integrated Circuit
Andrea Lavarda,
Bernd Deutschmann, Haerle Dieter
Enhancement of the DPI Method for IC Immunity
Characterization
15:20 – 15:30 COFFEE BREAK
15:30 – 16:30 Poster Session
Alexander Chupakhin,
Volodymyr Pilinsky,
Oleg Petrischev
The method of determination the level of lowfrequency
interference induced by ferromagnetic component
on the PCB
Hyun Ho Park, Keonyoung Seo,
Young-Kun Kwon,
Hark-Byeong Park
Numerical Analysis of Conformal Shields for Chip and
Package Shielding
Binhong Li, Jiantou Gao, Bo Li,
Zhengsheng Han, Jiajun Luo,
Jianfei Wu, Wei Zhu
Impact of DSOI Back-Gate Biasing on Circuit Conducted
Emission
Jianfei Wu, Haiyan Ma, Hongli
Zhang, Binhong Li, H. Wang
and Liming Zheng
DPI Immunity of Bandgap in SI and SOI Technologies
Tvrtko Mandic, Renaud Gillon,
Adrijan Baric
An Experimental Investigation of Four-Port IC-Stripline
Michael Fuchs Design of an EMC Test Board for Analog-to-Digital
Converters
Taras Kustov, Semen Grin,
Sakhaya Burnasheva
Efficiency Improvement Means for Operation of Linear
Photo Detector Controller Based on CCD Line
Shih-Yi Yuan, Jia-Wei Chen,
Ming-Shan Lin, Jian-Li Dong
Application-specific Near Field EMI Estimation on Time-
Sharing Operating System
Valerio M. Salles,
Luiz C. Kretly
Guidelines to Establish Design and Simulation of AC-
Clocked Power Supply in Digital CVSL Circuits:
the Base to Implement Complex Sequential Circuits
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Leslie Bai Test Methods For 2.4GHz ISM Data Transmission
Equipment Compliant with EU Regulations
Bogdan Vasiliev,
Viacheslav Zyrin
Analysis of Electromagnetic Compatibility for Two-Level
Frequency Converter with the Electric Motor and Power
Quality at the Inverter Output
Bogdan Vasiliev, Viacheslav Zyrin Power Flow Research and Electromagnetic Compatibility
between Frequency Converter and Electric Motor
17:00 DEPARTURE TO THE SOCIAL EVENT
18:00 – 21:00 CONFERENCE SOCIAL EVENT
Friday – 7 JULY
5 Building, CONFERENCE HALL
11:00 – 12:00 Technical section «Computational Electromagnetics
for IC level EMC»
Vadim Goncharov, Eugene Fiskin,
Rostislav Yashkardin,
Konstantin Sorokin
Method of Calculating of Random Shaped
Electromagnetic Impulse Flowing through Conducting
Structures
Zhifei Xu, Yang Liu, Blaise Ravelo,
Olivier Maurice
Modified Kron's TAN Modeling of 3D Multilayer PCB
Sergey Miropolsky, Stefan Jahn,
Frank Klotz
EM Field Solver Modelling of the Floating EUT Module
Boards in Automotive EMC Test Setups
12:00 CLOSING SPEECH by Etienne Sicard
12:10 CLOSING SPEECH by Mikhail Shestopalov