track g semiconductor test program - testinsight
TRANSCRIPT
May 4, 2011 1
Test Insight
Semiconductors test challenges
May 4, 2011 2
Agenda• Production test management – Any visibility ?
– Do we know what is actually tested in production ?– Is the correct version being used by operations ?
• Challenges and opportunities– Managing ATE program life cycle– Generating ATE programs– Managing ATE program release– Management of test programs structure
• Meeting the Challenges– Closing the loop on the control gap– From test conversion to test program control– Managing collaborative work– Controlling usage of test programs
• Summary
May 4, 2011 3
The control gap
CompanyTest
Programs database
Rev 2.0.52 Acceptance
Alignment
Install – Rev 2.0.49 ?
Fabless in Israel Subcon in Asia
May 4, 2011 4
The control gapDo we actually have 99.9% fault coverage in
Production?
ScanTest
98%coverage
Func.Test
1.99%coverage
On
Total: 99.9% coverage
DUT designTest Plan
Production99.9%
Test developmentTest Development
May 4, 2011 5
So, we have like 99.9% coverage, but now the test engineer is alone on the
tester !
May 4, 2011 6
Before debug
After “debug”
Mask failures
Remove tests
The control gap The weakest point in quality chain is debug
May 4, 2011 7
The bigger picture - challenges
Product Start
Tape Out 1st Silicon Product Ready
Product Ship
ProductEnd
Start
TP
End TP Maintain TP Consolidate TP Debug TP Fill TP
Test Program planning
Multiple Engineers
developing one Program
Debug TP
Pre-siliconDebug
Multiple Engineers
debugging one Program
Manage Program Releases to Production
Add and Remove Tests
(at different locations?)
Get Visibility of
Changes
May 4, 2011 8
Discussion - challengesThings we hear from customers
• How can we enable collaborative test work ?– Split a test program to modules
– Merge multiple sub-programs into a single program
• How do we optimize test program ?– Minimize vector memory size
– Minimize number of primary sets (Re-use)
• How do we educate new test engineers ?– Make sure they follow the company test methodology
• How do we control the structure of test programs ?– Control usage of bin numbers
– Control usage of test methods
May 4, 2011 9
Meeting the Challenges Closing the loop
• Closing the loop on the control gap• From test conversion to test program control• Managing collaborative work• Controlling usage of test programs
A key capability for the closed loop approach is being able to read the ATE program.
Such capability requires a close cooperation with the ATE companies
Analysis
May 4, 2011 10
Meeting the Challenges Enforce company methodology
Product Start
Tape Out 1st Silicon Product Ready
Product Ship
ProductEnd
Start
TP
End TP Maintain TP Consolidate TP Debug TP Fill TP
Test Program planning
(A skeleton)
AnalyseAnd extractA skeleton
Mature TP Skeleton TP
May 4, 2011 11
Test skeleton guiding test development
Structure of entries driven by reusable structures of a test program (e.g. test list, bin list,..)
Unified Bin methodology
Meeting the Challenges Enforce company methodology
May 4, 2011 12
Test Program Compliance Checker Report
12
May 4, 2011 13
ProductEnd
AnalyseSmartMerge
Meeting the Challenges Managing Collaborative work
Product Start
Tape Out 1st Silicon Product Ready
Product Ship
Start
TP
End TP Maintain TP Consolidate TP Debug TP Fill TP
Multiple Engineers
developing one Program
Multiple Engineers
debugging one Program
Add and Remove Tests
(at different locations?)
Split TP Merge TP
May 4, 2011 14
Product Start
Tape Out 1st Silicon Product Ready
Product Ship
ProductEnd
Start
TP
End TP Maintain TP Consolidate TP Debug TP Fill TP
Add and Remove Tests
(at different locations?)
Get Visibility of
Changes
"Golden" Program/Rules
ReportAnalyse
Meeting the Challenges Managing test usage - Releases
May 4, 2011 15
Applying Incremental Changes93k
Single-Test-Suite
TP
MasterTP
Rev. 1
MasterTP
Rev. 2
MergeRules
Changes
SemanticCompare
• allow• reject• ignorechanges onMaster TP
Identify changes
Viewpoint of master TP
Merge
Apply changes
May 4, 2011 16
„tarball”• Pin Config• Test Flow• Levels• Timing
pmfl/burst/binl
Preparing Single-Test-Suite TPs A customer case
DFT Patterns
incl. timing and levels
DFT Patterns
incl. timing and levels
93kSingle-Test-SuiteTPs
incrementalintegration
stpm
.setupTest
ProgramTemplate
MergeRules
prepare_stpfrom DFT
SmarTest Program ManagerN1160A
Rev. 1
Rev. 2
May 4, 2011 17
(Test InsightProduct)
Location of Reference or
Golden Program
Path to test program to be
checked. (Just a pointer)
Report showing differences between Master and Checked
• Version Number?
• Masked vectors
• DC Tests?
• ?
• ?
A report control setup.Define list of
checks
Meeting the Challenges Test Program Analyzer
May 4, 2011 18
Use cases and examples
• Monitoring active test program content– Make sure that the test program in use (at different
sites) matches the reference test program
• Regression test for test engineers – Provide test engineers means to review changes.
– Are the changes recorded in release, the only changes ?
Meeting the Challenges Test Program Analyzer
May 4, 2011 19
Product Start
Tape Out 1st Silicon Product Ready
Product Ship
ProductEnd
Start
TP
End TP Maintain TP Consolidate TP Debug TP Fill TP Debug TP
Pre-siliconDebug
NeutralDatabase
(STIL) DUTModel
SimulationTestBench
Meeting the Challenges Pre-silicon Debug
May 4, 2011 20
Meeting the Challenges Generating Test Vectors
Product Start
Tape Out 1st Silicon Product Ready
Product Ship
ProductEnd
Start
TP
End TP Maintain TP Consolidate TP Debug TP Fill TP
Generating ATE vectors
• Scan • Functional
Simulation
NeutralDatabase
(STIL)DUTModel
SimulationTestBench
ViewEdit
May 4, 2011 21
NeutralDatabase
(STIL)
Meeting the ChallengesMigration between platforms
Product Start
Tape Out 1st Silicon Product Ready
Product Ship
ProductEnd
Start
TP
End TP Maintain TP Consolidate TP Debug TP Fill TP
Process
Generating ATE vectors
• Existing ATE Program
Migrate TP
May 4, 2011 22
SummaryThe ability to read back and analyze the tester binaries, allows
us to close the loop on the control gap while meeting challenges along the test program life cycle –
• Enable collaborative test engineering work by -– Enabling smart split of a test program into modules– Merge multiple sub-programs into a single program
• Capability to optimize test programs – Minimize vector memory size– Minimize number of primary sets
• Allows mechanism for – verification of company test methodology – Control usage of bin numbers– Control usage of test methods
May 4, 2011 23
About TestInsight
• Leading Company providing EDA-Test Development connectivity software.
• OEM Partner with Major ATE Vendors.– Terdayne, Verigy
• Direct Sales Channels
May 4, 2011 24
About TestInsightCustomers Include:
plus others …